[go: up one dir, main page]

DE3685078D1 - Speicherpruefgeraet. - Google Patents

Speicherpruefgeraet.

Info

Publication number
DE3685078D1
DE3685078D1 DE8686110848T DE3685078T DE3685078D1 DE 3685078 D1 DE3685078 D1 DE 3685078D1 DE 8686110848 T DE8686110848 T DE 8686110848T DE 3685078 T DE3685078 T DE 3685078T DE 3685078 D1 DE3685078 D1 DE 3685078D1
Authority
DE
Germany
Prior art keywords
test device
memory test
memory
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686110848T
Other languages
English (en)
Inventor
Ikuo Kawaguchi
Yoshihiko Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP60197839A external-priority patent/JPH0752216B2/ja
Priority claimed from JP60197840A external-priority patent/JPS6258499A/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE3685078D1 publication Critical patent/DE3685078D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
DE8686110848T 1985-09-09 1986-08-06 Speicherpruefgeraet. Expired - Lifetime DE3685078D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP60197839A JPH0752216B2 (ja) 1985-09-09 1985-09-09 タイミング発生装置
JP60197840A JPS6258499A (ja) 1985-09-09 1985-09-09 メモリ試験装置

Publications (1)

Publication Number Publication Date
DE3685078D1 true DE3685078D1 (de) 1992-06-04

Family

ID=26510603

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686110848T Expired - Lifetime DE3685078D1 (de) 1985-09-09 1986-08-06 Speicherpruefgeraet.

Country Status (3)

Country Link
US (1) US4788684A (de)
EP (1) EP0218830B1 (de)
DE (1) DE3685078D1 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3752280T2 (de) * 1986-07-30 2000-02-03 Hitachi, Ltd. Mustergenerator
JPS6450148A (en) * 1987-08-20 1989-02-27 Nec Corp Memory resetting circuit
JP2604606B2 (ja) * 1987-11-24 1997-04-30 株式会社アドバンテスト 回路試験装置
JP2613411B2 (ja) * 1987-12-29 1997-05-28 株式会社アドバンテスト メモリ試験装置
GB2214314B (en) * 1988-01-07 1992-01-02 Genrad Ltd Automatic circuit tester
JPH01184700A (ja) * 1988-01-11 1989-07-24 Advantest Corp メモリ試験装置
US5287511A (en) * 1988-07-11 1994-02-15 Star Semiconductor Corporation Architectures and methods for dividing processing tasks into tasks for a programmable real time signal processor and tasks for a decision making microprocessor interfacing therewith
US5263143A (en) * 1988-07-11 1993-11-16 Star Semiconductor Corporation Real time probe device for internals of signal processor
US5062109A (en) * 1988-09-02 1991-10-29 Advantest Corporation Memory tester
EP0418521A3 (en) * 1989-09-20 1992-07-15 International Business Machines Corporation Testable latch self checker
US5101409A (en) * 1989-10-06 1992-03-31 International Business Machines Corporation Checkboard memory self-test
US5113399A (en) * 1989-10-16 1992-05-12 Rockwell International Corporation Memory test methodology
JP2831767B2 (ja) * 1990-01-10 1998-12-02 株式会社アドバンテスト 半導体メモリ試験装置
US5138619A (en) * 1990-02-15 1992-08-11 National Semiconductor Corporation Built-in self test for integrated circuit memory
JPH045583A (ja) * 1990-04-23 1992-01-09 Ando Electric Co Ltd データログ回路
JP2906073B2 (ja) * 1990-04-26 1999-06-14 キヤノン株式会社 Ｄｃテスト用回路を含むｌｓｉ
US5717697A (en) * 1990-06-27 1998-02-10 Texas Instruments Incorporated Test circuits and methods for integrated circuit having memory and non-memory circuits by accumulating bits of a particular logic state
US5276833A (en) * 1990-07-02 1994-01-04 Chips And Technologies, Inc. Data cache management system with test mode using index registers and CAS disable and posted write disable
JP2964644B2 (ja) * 1990-12-10 1999-10-18 安藤電気株式会社 高速パターン発生器
US5392294A (en) * 1991-03-08 1995-02-21 International Business Machines Corporation Diagnostic tool and method for locating the origin of parasitic bit faults in a memory array
US5751728A (en) * 1991-11-12 1998-05-12 Nec Corporation Semiconductor memory IC testing device
US5406132A (en) * 1992-01-21 1995-04-11 Advantest Corporation Waveform shaper for semiconductor testing devices
US5216672A (en) * 1992-04-24 1993-06-01 Digital Equipment Corporation Parallel diagnostic mode for testing computer memory
US5448668A (en) * 1993-07-08 1995-09-05 Perelson; Alan S. Method of detecting changes to a collection of digital signals
US5475815A (en) * 1994-04-11 1995-12-12 Unisys Corporation Built-in-self-test scheme for testing multiple memory elements
US5612965A (en) * 1994-04-26 1997-03-18 Unisys Corporation Multiple memory bit/chip failure detection
US5490115A (en) * 1994-07-29 1996-02-06 Cypress Semiconductor Corp. Method and apparatus for writing to memory cells in a minimum number of cycles during a memory test operation
US5506959A (en) * 1994-08-04 1996-04-09 Telecommunication Research Laboratories Method and apparatus for testing electronic memories for the presence of multiple cell coupling faults
JP3216449B2 (ja) * 1994-10-31 2001-10-09 安藤電気株式会社 半導体メモリの故障自己診断装置
US5666371A (en) * 1995-02-24 1997-09-09 Unisys Corporation Method and apparatus for detecting errors in a system that employs multi-bit wide memory elements
US5701313A (en) * 1995-02-24 1997-12-23 Unisys Corporation Method and apparatus for removing soft errors from a memory
US5784382A (en) * 1995-03-01 1998-07-21 Unisys Corporation Method and apparatus for dynamically testing a memory within a computer system
US5511164A (en) * 1995-03-01 1996-04-23 Unisys Corporation Method and apparatus for determining the source and nature of an error within a computer system
KR100243314B1 (ko) 1995-04-07 2000-02-01 윤종용 임시 디펙트 리스트를 이용한 에러 로그 방법
JP3106947B2 (ja) * 1996-02-28 2000-11-06 日本電気株式会社 不揮発性半導体記憶装置
JP3558252B2 (ja) * 1997-11-10 2004-08-25 株式会社アドバンテスト 半導体メモリ試験装置
US6141767A (en) * 1998-04-03 2000-10-31 Sony Corporation Method of and apparatus for verifying reliability of contents within the configuration ROM of IEEE 1394-1995 devices
US6851076B1 (en) * 2000-09-28 2005-02-01 Agilent Technologies, Inc. Memory tester has memory sets configurable for use as error catch RAM, Tag RAM's, buffer memories and stimulus log RAM
US6829728B2 (en) * 2000-11-13 2004-12-07 Wu-Tung Cheng Full-speed BIST controller for testing embedded synchronous memories
JP2003030000A (ja) * 2001-07-17 2003-01-31 Mitsubishi Electric Corp 自己診断回路のテストパターン発生回路及び発生方法
JP4873533B2 (ja) * 2005-12-15 2012-02-08 富士通株式会社 高速シリアル転送デバイス試験方法、プログラム及び装置
KR101199771B1 (ko) * 2005-12-19 2012-11-09 삼성전자주식회사 모드별 논리적 어드레스를 설정하는 반도체 메모리 테스트장치 및 방법
US8386829B2 (en) * 2009-06-17 2013-02-26 Macronix International Co., Ltd. Automatic internal trimming calibration method to compensate process variation
US8874958B2 (en) * 2010-11-09 2014-10-28 International Business Machines Corporation Error detection in a mirrored data storage system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414665A (en) * 1979-11-21 1983-11-08 Nippon Telegraph & Telephone Public Corp. Semiconductor memory device test apparatus
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
FR2474226B1 (fr) * 1980-01-22 1985-10-11 Thomson Csf Dispositif de test pour enregistreur numerique multipiste
US4495603A (en) * 1980-07-31 1985-01-22 Varshney Ramesh C Test system for segmented memory
JPS59180898A (ja) * 1983-03-31 1984-10-15 Hitachi Ltd 不良ビット救済方法

Also Published As

Publication number Publication date
EP0218830A2 (de) 1987-04-22
US4788684A (en) 1988-11-29
EP0218830A3 (en) 1989-04-05
EP0218830B1 (de) 1992-04-29

Similar Documents

Publication Publication Date Title
DE3685078D1 (de) Speicherpruefgeraet.
DE3667857D1 (de) Volumenunabhaengige testvorrichtung.
DE3688933D1 (de) Speichervorrichtung.
DE3584319D1 (de) Ic-testeinrichtung.
DE3776271D1 (de) Messfuehlervorrichtung.
DE3687461D1 (de) Entwicklungsgeraet.
ATA89484A (de) Mikrohaertepruefeinrichtung
DE68912458D1 (de) Speicherprüfgerät.
DE3676505D1 (de) Messgeraet.
DE3885594D1 (de) Speicherprüfgerät.
DE3672397D1 (de) Haltevorrichtung.
DE3669644D1 (de) Epiliergeraet.
DE3678618D1 (de) Entwicklungsvorrichtung.
DE3668484D1 (de) Lagervorrichtung.
DE3781143D1 (de) Pruefungsgeraet.
DE3580948D1 (de) Ultraschall-pruefeinrichtung.
DE3675325D1 (de) Kaltverfestigungsvorrichtung.
DE3685465D1 (de) Verbindungsvorrichtung.
NO863584D0 (no) Betraktningsanordning.
DE3682336D1 (de) Diagnostisches testgeraet.
DE3675418D1 (de) Entwicklungsvorrichtung.
DE3672759D1 (de) Entschichtungsvorrichtung.
DE3678533D1 (de) Maehvorrichtung.
FI860551A0 (fi) Gas-luft-avskiljare.
DE3762924D1 (de) Korrosionspruefgeraet.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee