DE3584319D1 - Ic-testeinrichtung. - Google Patents

Ic-testeinrichtung.

Info

Publication number: DE3584319D1
Authority: DE; Germany
Prior art keywords: test device; test
Prior art date: 1984-06-29
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE8585107996T

Other languages

English (en)

Inventor

Hiroshi Sato

Yoshihito Kobayashi

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Advantest Corp

Original Assignee

Advantest Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1984-06-29

Filing date

1985-06-27

Publication date

1991-11-14

1984-06-29 Priority claimed from JP9884784U external-priority patent/JPS6115203U/ja

1984-06-29 Priority claimed from JP9884384U external-priority patent/JPS6115218U/ja

1984-06-29 Priority claimed from JP9884884U external-priority patent/JPS6113996U/ja

1985-06-27 Application filed by Advantest Corp filed Critical Advantest Corp

1991-11-14 Application granted granted Critical

1991-11-14 Publication of DE3584319D1 publication Critical patent/DE3584319D1/de

2005-06-28 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

Engineering & Computer Science (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Testing Of Individual Semiconductor Devices (AREA)

DE8585107996T 1984-06-29 1985-06-27 Ic-testeinrichtung. Expired - Fee Related DE3584319D1 (de)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
JP9884784U JPS6115203U (ja)	1984-06-29	1984-06-29	Ｉｃ用マガジン収納装置
JP9884384U JPS6115218U (ja)	1984-06-29	1984-06-29	Ｉｃ用マガジン搬送装置
JP9884884U JPS6113996U (ja)	1984-06-29	1984-06-29	Ｉｃ用マガジン収納装置

Publications (1)

Publication Number	Publication Date
DE3584319D1 true DE3584319D1 (de)	1991-11-14

Family

ID=27308779

Family Applications (2)

Application Number	Title	Priority Date	Filing Date
DE8585107996T Expired - Fee Related DE3584319D1 (de)	1984-06-29	1985-06-27	Ic-testeinrichtung.
DE3587858T Expired - Lifetime DE3587858D1 (de)	1984-06-29	1985-06-27	IC-Testvorrichtung.

Family Applications After (1)

Application Number	Title	Priority Date	Filing Date
DE3587858T Expired - Lifetime DE3587858D1 (de)	1984-06-29	1985-06-27	IC-Testvorrichtung.

Country Status (3)

Country	Link
US (2)	US4715501A (de)
EP (2)	EP0382264B1 (de)
DE (2)	DE3584319D1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3539965A1 (de) *	1985-11-11	1987-05-14	Ueberreiter Ekkehard	Vorrichtung zum pruefen und sortieren von elektronischen bauelementen
JPH0833433B2 (ja) *	1987-11-30	1996-03-29	東京エレクトロン株式会社	プローブ装置
US4941795A (en) *	1988-11-21	1990-07-17	At&T Bell Laboratories	Component insertion machine apparatus
US4950120A (en) *	1989-02-27	1990-08-21	Burndy Corporation	Apparatus and method for feeding card edge connectors and connector magazines
DE4023772A1 (de) *	1989-08-31	1991-03-14	Gold Star Electronics	Vorrichtung zum beschicken und entladen von huelsen fuer ein ic-pruefgeraet
US5116185A (en) *	1990-05-01	1992-05-26	Lsi Logic Corp.	Vibratory tube-to-tube transfer system
JP2921937B2 (ja) *	1990-07-18	1999-07-19	東京エレクトロン株式会社	Ｉｃ検査装置
JP3006064B2 (ja) *	1990-10-01	2000-02-07	株式会社アドバンテスト	Ｉｃ試験装置
JPH069027A (ja) *	1991-06-13	1994-01-18	Tenryu Technic:Kk	スティックフィーダ
US5313156A (en) *	1991-12-04	1994-05-17	Advantest Corporation	Apparatus for automatic handling
US5307011A (en) *	1991-12-04	1994-04-26	Advantest Corporation	Loader and unloader for test handler
US5319353A (en) *	1992-10-14	1994-06-07	Advantest Corporation	Alarm display system for automatic test handler
TW287235B (de) *	1994-06-30	1996-10-01	Zenshin Test Co
DE19581661C2 (de) *	1994-09-22	1998-11-26	Advantest Corp	Ic-Aufnahmeschalen-Lagervorrichtung und Montagevorrichtung für diese
US5538141A (en) *	1994-09-27	1996-07-23	Intel Corporation	Test flow assurance using memory imprinting
JPH08306765A (ja) *	1995-04-28	1996-11-22	Advantest Corp	ハンドラ装置用トレイ装着台
US6024526A (en) *	1995-10-20	2000-02-15	Aesop, Inc.	Integrated prober, handler and tester for semiconductor components
WO1997017619A1 (fr) *	1995-11-06	1997-05-15	Advantest Corporation	Transporteur, changeur de position et dispositif de prelevement pour circuits integres
JP3063602B2 (ja) *	1995-12-22	2000-07-12	日立電子エンジニアリング株式会社	Ｉｃデバイスの移載装置
CA2202788A1 (en) *	1997-04-15	1998-10-15	Sylvain Rodier	Automatic input and output tube handlers for use with an electronic component processing machine
JP3591679B2 (ja) *	1997-04-17	2004-11-24	株式会社アドバンテスト	Ｉｃ用トレイ取出装置及びｉｃ用トレイ収納装置
US5831856A (en) *	1997-07-21	1998-11-03	Behavior Tech Computer Corp.	DRAM testing apparatus
US6112940A (en) *	1998-01-16	2000-09-05	Micron Electronics, Inc.	Vertical magazine apparatus for integrated circuit device dispensing, receiving or storing
US6135291A (en)	1998-01-16	2000-10-24	Micron Electronics, Inc.	Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning
US5931630A (en) *	1998-01-26	1999-08-03	Harmony Technology Corp.	Material feeding apparatus for use in a surface mounting system
US6039526A (en) *	1998-05-11	2000-03-21	Vanguard International Semiconductor Corporation	Automatic plug pulling machine for IC tubes
US6607071B1 (en) *	1998-10-19	2003-08-19	Mirae Corporation	Sealed test chamber for module IC handler
US6476628B1 (en) *	1999-06-28	2002-11-05	Teradyne, Inc.	Semiconductor parallel tester
US6310486B1 (en) *	1999-10-01	2001-10-30	Teradyne, Inc.	Integrated test cell
WO2001027976A1 (en) *	1999-10-13	2001-04-19	Vladimir Nikolaevich Davydov	Semiconductor device processing and sorting apparatus and method of handling
US6719518B2 (en) *	2001-10-15	2004-04-13	Anadigics, Inc.	Portable tube holder apparatus
TW544076U (en) *	2002-02-08	2003-07-21	Chi Yhei Tech Internat Co Ltd	IC supplying machine
TWI271832B (en) *	2005-10-07	2007-01-21	King Yuan Electronics Co Ltd	Feeding apparatus
WO2011058644A1 (ja) *	2009-11-13	2011-05-19	株式会社データンク	フラッシュメモリ自動供給装置
WO2011058643A1 (ja) *	2009-11-13	2011-05-19	株式会社データンク	フラッシュメモリ用マガジン
US8981807B2 (en)	2010-07-27	2015-03-17	Intest Corporation	Positioner system and method of positioning
RU2680161C1 (ru) *	2018-04-27	2019-02-18	Публичное акционерное общество "Радиофизика"	Способ тестирования гис свч

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE213338C (de) *
US1292635A (en) *	1918-10-02	1919-01-28	George D Parker	Tray-stacker.
US1652698A (en) *	1926-12-13	1927-12-13	William F Boettger	Stacking device
US3308977A (en) *	1965-10-04	1967-03-14	Ibm	Automatic tray handler
US3587852A (en) *	1969-05-19	1971-06-28	Honeywell Inc	Control apparatus
US3758122A (en) *	1969-11-05	1973-09-11	Victor Company Of Japan	Automatic cassette changing and playing apparatus
US3844423A (en) *	1972-12-08	1974-10-29	Hartman Metal Fab Inc	Pallet accumulator
US4170290A (en) *	1977-02-28	1979-10-09	Motorola, Inc.	Lift and feed mechanism for high speed integrated circuit handler
US4124132A (en) *	1977-05-18	1978-11-07	Sola Basic Industries, Inc.	Magazine apparatus for semiconductor processing device
US4234418A (en) *	1978-06-23	1980-11-18	Contrel Corporation	Dip-handling apparatus
JPS5722570A (en) *	1980-07-02	1982-02-05	Fujitsu Ltd	Automatic handling tool for parts
US4423815A (en) *	1981-08-10	1984-01-03	Contrel Corporation	Component sorting apparatus
JPS5834800U (ja) *	1981-08-31	1983-03-07	株式会社日立国際電気	マガジン等の供給装置
US4500246A (en) *	1983-03-01	1985-02-19	Universal Instruments Corporation	Indexed feed of electronic component supply tubes
US4618305A (en) *	1983-11-23	1986-10-21	Daymarc Corporation	Automatic feed apparatus and process for integrated circuits stored in tubes
JPS61246676A (ja) *	1985-04-24	1986-11-01	Nec Corp	Ｉｃのハンドリング装置
JPS61246675A (ja) *	1985-04-25	1986-11-01	Toshiba Seiki Kk	電子部品の測定装置
US4647269A (en) *	1985-07-01	1987-03-03	Micro Component Technology, Inc.	Automatic integrated circuit transportation tube elevating and tilting device

1985
- 1985-06-27 US US06/749,274 patent/US4715501A/en not_active Expired - Fee Related
- 1985-06-27 DE DE8585107996T patent/DE3584319D1/de not_active Expired - Fee Related
- 1985-06-27 EP EP90105386A patent/EP0382264B1/de not_active Expired - Lifetime
- 1985-06-27 EP EP85107996A patent/EP0166448B1/de not_active Expired - Lifetime
- 1985-06-27 DE DE3587858T patent/DE3587858D1/de not_active Expired - Lifetime
1987
- 1987-06-02 US US07/056,779 patent/US4760924A/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
EP0382264A2 (de)	1990-08-16
EP0166448A3 (en)	1987-06-10
EP0382264B1 (de)	1994-06-15
US4760924A (en)	1988-08-02
EP0166448A2 (de)	1986-01-02
US4715501A (en)	1987-12-29
EP0382264A3 (de)	1991-04-10
DE3587858D1 (de)	1994-07-21
EP0166448B1 (de)	1991-10-09

Publication	Publication Date	Title
DE3584319D1 (de)	1991-11-14	Ic-testeinrichtung.
DE3685078D1 (de)	1992-06-04	Speicherpruefgeraet.
DE3584066D1 (de)	1991-10-17	Kraftmessvorrichtung.
DE3481084D1 (de)	1990-02-22	Untersuchungsgeraet.
ATA89484A (de)	1989-10-15	Mikrohaertepruefeinrichtung
DE3667857D1 (de)	1990-02-01	Volumenunabhaengige testvorrichtung.
DE3576747D1 (de)	1990-04-26	Entwicklungsgeraet.
DE3586909D1 (de)	1993-02-04	Testverfahren.
DE3776271D1 (de)	1992-03-05	Messfuehlervorrichtung.
DE3581975D1 (de)	1991-04-11	Testverfahren.
DE3586024D1 (de)	1992-06-17	Pruefstreifenablesevorrichtung.
DE3586254D1 (de)	1992-07-30	Testverfahren.
DE3577754D1 (de)	1990-06-21	Verbindungsvorrichtung.
DE3583127D1 (de)	1991-07-11	Fixiervorrichtung.
DE3584799D1 (de)	1992-01-16	Halbleitervorrichtung.
DE3583889D1 (de)	1991-10-02	Befestigungselement-pruefvorrichtung.
DE3581370D1 (de)	1991-02-21	Halbleitervorrichtung.
FI850047L (fi)	1985-07-06	Hushaolls- eller koeksapparat.
DE3483249D1 (de)	1990-10-25	Vereinfachte pruefvorrichtung.
DE3781143D1 (de)	1992-09-17	Pruefungsgeraet.
IT8523114A0 (it)	1985-12-06	Dispositivo dinamometrico.
DE3586568D1 (de)	1992-10-08	Halbleitereinrichtung.
DE3580948D1 (de)	1991-01-31	Ultraschall-pruefeinrichtung.
IT8521478A0 (it)	1985-07-09	Dispositivo di prova per fusibili.
DE3762924D1 (de)	1990-06-28	Korrosionspruefgeraet.

Legal Events

Date	Code	Title	Description
1992-11-05	8364	No opposition during term of opposition
1995-06-08	8339	Ceased/non-payment of the annual fee