DE10196595T1 - Vorrichtung und Halbleiter-Prüfvorrichtung - Google Patents

Vorrichtung und Halbleiter-Prüfvorrichtung

Info

Publication number: DE10196595T1
Authority: DE; Germany
Prior art keywords: semiconductor test; test device; semiconductor; test
Prior art date: 2000-08-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

DE10196595T

Other languages

English (en)

Other versions

DE10196595B4 (de

Inventor

Koji Asami

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Advantest Corp

Original Assignee

Advantest Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-08-30

Filing date

2001-08-30

Publication date

2003-07-17

2001-08-30 Application filed by Advantest Corp filed Critical Advantest Corp

2003-07-17 Publication of DE10196595T1 publication Critical patent/DE10196595T1/de

2009-05-14 Application granted granted Critical

2009-05-14 Publication of DE10196595B4 publication Critical patent/DE10196595B4/de

2021-08-31 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0626—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by filtering
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
- H03M1/0836—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of phase error, e.g. jitter
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
- H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Theoretical Computer Science (AREA)
Analogue/Digital Conversion (AREA)

DE10196595T 2000-08-30 2001-08-30 Digitalisierungsvorrichtung und Halbleiter-Prüfvorrichtung Expired - Fee Related DE10196595B4 (de)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
JP2000-260271		2000-08-30
JP2000260271A JP4560187B2 (ja)	2000-08-30	2000-08-30	インターリーブａｄ変換方式波形ディジタイザ装置
PCT/JP2001/007466 WO2002018966A1 (fr)	2000-08-30	2001-08-30	Numeriseur et instrument de test semiconducteur

Publications (2)

Publication Number	Publication Date
DE10196595T1 true DE10196595T1 (de)	2003-07-17
DE10196595B4 DE10196595B4 (de)	2009-05-14

Family

ID=18748309

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE10196595T Expired - Fee Related DE10196595B4 (de)	2000-08-30	2001-08-30	Digitalisierungsvorrichtung und Halbleiter-Prüfvorrichtung

Country Status (4)

Country	Link
US (1)	US6700515B2 (de)
JP (1)	JP4560187B2 (de)
DE (1)	DE10196595B4 (de)
WO (1)	WO2002018966A1 (de)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB2390447A (en) *	2002-07-02	2004-01-07	Hewlett Packard Co	Fault prediction in logical networks
WO2004072668A1 (en) *	2003-02-13	2004-08-26	Mcgill Iniversity	Mixed-signal-device testing
US6836227B2 (en) *	2003-02-25	2004-12-28	Advantest Corporation	Digitizer module, a waveform generating module, a converting method, a waveform generating method and a recording medium for recording a program thereof
WO2005082060A2 (en)	2004-02-25	2005-09-09	Xplore Technologies Corporation	Apparatus providing multi-mode digital input
JP3947185B2 (ja) *	2004-06-01	2007-07-18	株式会社アドバンテスト	アナログディジタル変換方法、及びアナログディジタル変換装置
US7038602B1 (en) *	2004-10-30	2006-05-02	Agilent Technologies, Inc.	Method for correcting periodic sampling errors
US7053804B1 (en) *	2004-11-18	2006-05-30	Analog Devices, Inc.	Phase-error reduction methods and controllers for time-interleaved analog-to-digital systems
US8266196B2 (en) *	2005-03-11	2012-09-11	Qualcomm Incorporated	Fast Fourier transform twiddle multiplication
US8229014B2 (en) *	2005-03-11	2012-07-24	Qualcomm Incorporated	Fast fourier transform processing in an OFDM system
US7183953B2 (en) *	2005-03-31	2007-02-27	Teradyne, Inc.	Calibrating automatic test equipment containing interleaved analog-to-digital converters
TWI282216B (en) *	2005-04-13	2007-06-01	Realtek Semiconductor Corp	Correlation circuit for time-interleaved ADC and method thereof
US7292166B2 (en) *	2005-05-26	2007-11-06	Advantest Corporation	Analog/digital converter and program therefor
US7460043B2 (en) *	2005-06-03	2008-12-02	General Electric Company	Analog-to-digital converter compensation system and method
JP4895551B2 (ja) *	2005-08-10	2012-03-14	株式会社アドバンテスト	試験装置および試験方法
EP1999606A4 (de) *	2006-02-22	2011-09-21	Univ Akron	Verschachteltes verfahren zur parallelen implementierung der schnellen fourier-transformation
US7495591B2 (en) *	2006-06-30	2009-02-24	Agilent Technologies, Inc.	Performing a signal analysis based on digital samples in conjunction with analog samples
US7541958B2 (en) *	2006-12-30	2009-06-02	Teradyne, Inc.	Error reduction for parallel, time-interleaved analog-to-digital converter
US7538708B2 (en) *	2006-12-30	2009-05-26	Teradyne, Inc.	Efficient, selective error reduction for parallel, time-interleaved analog-to-digital converter
US7817076B2 (en) *	2007-08-16	2010-10-19	Olympus Ndt	Multiple mode digitization system for a non-destructive inspection instrument
JP2009272683A (ja)	2008-04-30	2009-11-19	Toshiba Corp	無線通信装置
WO2010090209A1 (ja) *	2009-02-05	2010-08-12	日本電気株式会社	Ｆｆｔ演算装置と電力演算方法
US8031101B2 (en) *	2009-02-12	2011-10-04	Quantenna Communications, Inc.	Spur cancellation
US8305921B2 (en)	2009-04-03	2012-11-06	Quantenna Communications, Inc.	Channel selection and interference suppression
JP4999885B2 (ja) *	2009-06-05	2012-08-15	株式会社アドバンテスト	アナログ信号処理装置、方法、プログラム、記録媒体
CN102323498B (zh) *	2011-06-09	2013-09-18	国网电力科学研究院	多级分段式高精度数据采样方法
JP5742556B2 (ja) *	2011-07-29	2015-07-01	富士通セミコンダクター株式会社	Ａｄｃ
US9026390B2 (en) *	2011-09-06	2015-05-05	Tektronix, Inc.	Interleaved RF triggering on a test and measurement instrument
US9886419B2 (en) *	2012-07-26	2018-02-06	Tektronix, Inc.	System for improving probability of transient event detection
JP6377335B2 (ja) *	2013-10-28	2018-08-22	日本電産サンキョー株式会社	検出装置におけるデータ検出方法および検出装置
TWI524768B (zh) *	2014-12-03	2016-03-01	晨星半導體股份有限公司	頻率解交錯與時間解交錯電路與方法以及數位電視之接收電路
TWI685208B (zh) *	2018-12-07	2020-02-11	財團法人工業技術研究院	位置編碼裝置與方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4563750A (en) *	1983-03-04	1986-01-07	Clarke William L	Fast Fourier transform apparatus with data timing schedule decoupling
US4816750A (en) *	1987-01-16	1989-03-28	Teradyne, Inc.	Automatic circuit tester control system
US4763105A (en) *	1987-07-08	1988-08-09	Tektronix, Inc.	Interleaved digitizer array with calibrated sample timing
JPH072978U (ja) *	1993-06-10	1995-01-17	横河電機株式会社	Ｆｆｔ解析装置
JPH075213A (ja) *	1993-06-18	1995-01-10	Advantest Corp	デジタル・スペクトラムアナライザの測定値補正装置
JP3352500B2 (ja)	1993-06-21	2002-12-03	積水化学工業株式会社	光重合性組成物及び熱硬化性接着シート
EP1080431B1 (de) *	1998-05-18	2003-05-21	Acqiris	Datenerfassungssystem mit einer schaltung zum umformen eines hochfrequenten analogen eingangssignals in eine anzahl von numerischen signalen

2000
- 2000-08-30 JP JP2000260271A patent/JP4560187B2/ja not_active Expired - Fee Related
2001
- 2001-08-30 DE DE10196595T patent/DE10196595B4/de not_active Expired - Fee Related
- 2001-08-30 WO PCT/JP2001/007466 patent/WO2002018966A1/ja active Application Filing
2003
- 2003-02-26 US US10/374,199 patent/US6700515B2/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
US6700515B2 (en)	2004-03-02
WO2002018966A1 (fr)	2002-03-07
US20030128141A1 (en)	2003-07-10
DE10196595B4 (de)	2009-05-14
JP4560187B2 (ja)	2010-10-13
JP2002071723A (ja)	2002-03-12

Publication	Publication Date	Title
DE10196595T1 (de)	2003-07-17	Vorrichtung und Halbleiter-Prüfvorrichtung
DE19983903T1 (de)	2002-02-28	IC-Sockel und IC-Testgerät
DE60130065D1 (de)	2007-10-04	Elektronisches Bauteil und Halbleitervorrichtung
DE60019913D1 (de)	2005-06-09	Halbleiterbauelement und Herstellungsverfahren
DE60227302D1 (de)	2008-08-07	Photovoltaisches Element und photovoltaische Vorrichtung
DE60119418D1 (de)	2006-06-14	Gesichtsbildaufnehmendes Erkennungsgerät und Passprüfungsgerät
DE60131511D1 (de)	2008-01-03	Halbleiterverarbeitungsmodul und Vorrichtung
DE60030931D1 (de)	2006-11-09	Halbleiteranordnung und Herstellungsverfahren dafür
DE60109616D1 (de)	2005-04-28	Immunoassay und immunoassayvorrichtung
DE60128768D1 (de)	2007-07-19	Polierverfahren und vorrichtung
DE60030208D1 (de)	2006-10-05	Waferinspektionsvorrichtung
DE19980453T1 (de)	2000-03-30	Halbleiterbauelement-Testgerät
DE60100579D1 (de)	2003-09-18	Bilderzeugungsverfahren und Gerät
DE60140143D1 (de)	2009-11-19	Halbleiterbauelement und tragbare elektronische vorrichtung
DE50112910D1 (de)	2007-10-04	Navigationsverfahren und -vorrichtung
DE60234299D1 (de)	2009-12-24	FFS-Verfahren und Vorrichtung
HK1053012B (zh)	2010-01-15	半導體器件及其形成方法
DE60111433D1 (de)	2005-07-21	Lötverfahren und Lötvorrichtung
DE60230840D1 (de)	2009-03-05	Halbleiteranordnung und Herstellungsverfahren dafür
DE60043938D1 (de)	2010-04-15	Halbleiterscheibepolierverfahren und vorrichtung
DE60142141D1 (de)	2010-07-01	Halbleiterbauelement
DE60229938D1 (de)	2009-01-02	ENTWICKLUNGSEINRICHTUNG UND BILDformungsgerät
DE60142600D1 (de)	2010-09-02	Entwicklungsverfahren und -vorrichtung
DE60238229D1 (de)	2010-12-23	Sendevorrichtung und sendeverfahren
DE10191585B8 (de)	2009-07-02	Halbleitervorrichtung

Legal Events

Date	Code	Title	Description
2004-05-19	8110	Request for examination paragraph 44
2009-11-12	8364	No opposition during term of opposition
2012-06-14	R119	Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee	Effective date: 20120301