CN114062135B - Rock strain data correction method for high-temperature triaxial tester - Google Patents
Rock strain data correction method for high-temperature triaxial tester Download PDFInfo
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- CN114062135B CN114062135B CN202111351568.4A CN202111351568A CN114062135B CN 114062135 B CN114062135 B CN 114062135B CN 202111351568 A CN202111351568 A CN 202111351568A CN 114062135 B CN114062135 B CN 114062135B
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- 238000000034 method Methods 0.000 title claims abstract description 42
- 239000011435 rock Substances 0.000 title claims abstract description 36
- 238000012937 correction Methods 0.000 title claims abstract description 14
- 238000012360 testing method Methods 0.000 claims abstract description 89
- 238000002474 experimental method Methods 0.000 claims abstract description 29
- 239000000463 material Substances 0.000 claims abstract description 18
- 238000005259 measurement Methods 0.000 claims abstract description 17
- 239000002184 metal Substances 0.000 claims abstract description 10
- 230000003321 amplification Effects 0.000 claims description 7
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 7
- 238000004590 computer program Methods 0.000 claims description 3
- IRLXSDZTLYOBQH-WOUKDFQISA-N [(2r,3s,4r,5r)-3,4-dihydroxy-5-imidazo[2,1-f]purin-3-yloxolan-2-yl]methyl dihydrogen phosphate Chemical compound O[C@@H]1[C@H](O)[C@@H](COP(O)(O)=O)O[C@H]1N1C(N=CN2C=CN=C22)=C2N=C1 IRLXSDZTLYOBQH-WOUKDFQISA-N 0.000 claims description 2
- 238000011161 development Methods 0.000 abstract description 5
- 238000004088 simulation Methods 0.000 abstract description 2
- 235000019738 Limestone Nutrition 0.000 description 7
- 239000006028 limestone Substances 0.000 description 7
- 230000001351 cycling effect Effects 0.000 description 6
- 238000011160 research Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 2
- 230000008602 contraction Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002427 irreversible effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/18—Performing tests at high or low temperatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/022—Environment of the test
- G01N2203/0222—Temperature
- G01N2203/0224—Thermal cycling
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- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention provides a rock strain data correction method of a high-temperature triaxial tester, which quantifies nominal strain component epsilon of a strain gauge component through anisotropy of system temperature of the high-temperature triaxial tester and asynchronism of temperature development of each part amp And epsilon mte The function of correcting thermal strain data of rocks and other materials is realized. The temperature of the wire between the strain gauge assembly and the amplifying circuit is significantly affected by the temperature of the strain gauge plug. Therefore, the invention uses the plug temperature to simulate the temperature of the wire to reflect the unrecoverable characteristic of the temperature of the wire in the experiment, thereby more accurately estimating the first component of the nominal strain of the strain gauge and further more accurately correcting the thermal strain of the rock or other materials. The temperature of the position of the strain gauge assembly in the high-temperature triaxial test machine is different from that of the test piece, and the temperature of the strain gauge is obtained by measurement or simulation and is used for calculating the nominal strain second component of the strain gauge caused by the metal sheet in the strain gauge assembly, so that the thermal strain of rock or other materials can be corrected more accurately.
Description
Technical Field
The invention belongs to the technical field of experimental rock mechanics and material mechanics, and particularly relates to a rock strain data correction method of a high-temperature triaxial tester.
Background
Referring to fig. 1, the measurement of strain of rock or other materials based on a high temperature triaxial tester platform is a common research means in the fields of experimental rock mechanics and material mechanics. The measurement of strain is typically accomplished by a strain gauge assembly mounted on the test piece, see FIG. 2. The dimensional change of the test piece causes a deformation of the strain gauge assembly, thereby causing a change in the resistance of the strain gauge, see fig. 2 and 3, such that the output voltage of the bridge circuit of the strain gauge assembly changes. This output voltage variation is amplified by an amplifying circuit to measure the dimensional variation of the test piece, see fig. 4. Correlating the dimensional change to a reference dimension of the test piece to obtain a test piece strain value epsilon r . In experiments that measure the thermal strain of a rock or other material specimen caused by temperature changes, the strain gauge assembly is affected by the experimental conditions (e.g., temperature), creating a nominal strain and compensating for the strain of the specimen. This nominal strain can lead to misreading of the thermal strain of the test piece.
With reference study (peie)t al 2020) analyzes the source of the nominal strain of the strain gauge assembly caused by temperature. Specifically, in a temperature change experiment based on a high-temperature triaxial tester platform, a wire connecting a strain gauge assembly and an amplifying circuit is subjected to temperature influence to change the resistance of the wire, so that the input resistance of the amplifying circuit is changed, and the actual amplification factor A of the amplifying circuit is further changed ap Deviation from the nominal value A at normal temperature 0 Thus creating a first component epsilon of the nominal strain of the strain gauge amp . On the other hand, the expansion and contraction of the metal sheet bearing the strain gauge in the strain gauge assembly under the temperature changing condition can also change the resistance of the strain gauge, thereby changing the output voltage of the bridge circuit of the strain gauge assembly, and further causing the second component epsilon of the nominal strain of the strain gauge mte . The two components jointly compensate the thermal strain epsilon of the test piece r A measurement epsilon of the strain of the test piece is produced mea . The high-temperature triaxial tester for reference research is internally provided with a thermocouple for measuring the temperature T of a test piece r And using the temperature T r To simulate the temperature T of the wire between the strain gauge and the amplifying circuit ind Thereby calculating the actual amplification factor A in the temperature change experiment ap Further calculate the first component epsilon of nominal strain of the strain gauge amp . At the same time, using the measured specimen temperature T r Estimating a second component epsilon of nominal strain of the strain gauge caused by thermal expansion and cold contraction deformation of the metal sheet in the strain gauge assembly mte . However, the methods in the above-referenced studies have been deficient, particularly in that: (1) Nominal test piece temperature T measured with thermocouple r Insufficient to represent the temperature of the sheet metal in the strain gauge assembly; (2) This method is insufficient to correct the residual value of the test piece strain measured in the temperature cycle test based on the high temperature triaxial tester (fig. 5 to 8). The reasons are stated below.
The applicant research finds that: (1) In a temperature changing or temperature cycling experiment based on a high-temperature triaxial tester, the temperature in a tester system has obvious anisotropy; (2) The temperature development of the various parts in the system is asynchronous (asynchrony); (3) Non-measured specimen temperature T having the most pronounced effect on wire temperature between strain gauge assembly and amplifying circuit r But the guidePlug temperature T at plug of wire-in triaxial tester p . (4) Measured the plug temperature T p The changes in the temperature cycling experiments on the test pieces are not recoverable. Just due to the plug temperature T p Generates a first component epsilon of nominal strain of the irreversible strain gauge assembly amp Thereby creating a residual portion of the test piece strain measurement.
From the foregoing findings, it is found that if the method provided by the reference study is extended, the measured value T of the temperature of the test piece in the temperature-changing (or temperature-cycling) experiment is used r Estimating the temperature T of a wire between a strain gauge assembly and an amplifying circuit ind Thereby estimating a first component epsilon of the nominal strain of the strain gauge assembly amp It is not possible to calculate the residual part of the strain component. Furthermore, neglecting anisotropy of temperature and asynchronism of temperature development of each part in triaxial tester system, and estimating nominal strain second component epsilon caused by metal sheet in strain gauge assembly by using measured temperature of test piece mte The temperature variation experienced by the sheet itself and its development over time are not considered.
Disclosure of Invention
The invention aims to solve the technical problems that: a rock strain data correction method for a high-temperature triaxial tester is provided for correcting thermal strain data of rock or other materials.
The technical scheme adopted by the invention for solving the technical problems is as follows: the rock strain data correction method of the high-temperature triaxial tester comprises the following steps:
s1: carrying out a temperature cycle experiment on a standard test piece with a known thermal expansion coefficient in a high-temperature triaxial tester, wherein the deformation of the standard test piece is kept in an elastic range under the experimental working condition; measuring or simulating the temperature T of the position of a strain gauge assembly in a high-temperature triaxial test machine in the temperature cycle test process of a standard test piece g And strain gauge assembly plug temperature T p The method comprises the steps of carrying out a first treatment on the surface of the Reading the strain gauge assembly to obtain the strain measurement epsilon of the standard test piece mea ；
S2: establishing a finite element model of heat conduction, and using strain gauge set in the temperature cycle experiment process of a standard test pieceTemperature T of the location of the part g And strain gauge assembly plug temperature T p Temperature T of wire between analog strain gauge assembly and amplifying circuit ind And its variation with time; calculating amplification factor A of real-time change in temperature cycle experiment of standard test piece ap And a first component epsilon of nominal strain of the strain gauge assembly amp ；
S3: calculating the actual strain epsilon of the standard test piece by using the thermal expansion coefficient of the standard test piece and the temperature variation rate experienced by the standard test piece st The method comprises the steps of carrying out a first treatment on the surface of the Using strain measurement epsilon of standard test pieces mea First component epsilon of nominal strain of strain gauge assembly amp Actual strain ε of a standard test piece st Calculating the second component epsilon of the nominal strain of the strain gauge assembly mte ：
ε mte ＝ε mea -ε amp -ε st ；
Let T be a For room temperature, calculating the second component epsilon of nominal strain of the strain gauge assembly mte Is the amount of change per unit temperature
S4: carrying out a temperature cycle experiment on a high-temperature triaxial tester by using a test piece to be tested; measuring the temperature T of the position of a strain gauge assembly in a high-temperature triaxial tester in the temperature cycle test process of a test piece to be tested g ' and strain gauge assembly plug temperature T p 'A'; reading the strain gauge assembly to obtain the strain measurement epsilon of the test piece to be tested mea ′；
S5: in a finite element model of heat conduction, the temperature T of the position of the strain gauge component in the temperature cycle experiment process of a test piece to be tested g ' and strain gauge assembly plug temperature T p ' temperature T of wire between analog strain gauge assembly and amplifying circuit ind ' and its variation over time; calculating an amplification factor A of real-time change in a temperature cycle experiment of a test piece to be tested ap ' Strain gauge assembly nominal Strain first component ε amp ′；
S6: according to the variation obtained in step S3Calculating the second component epsilon of the nominal strain of the strain gauge assembly mte ′：
S7: using the strain measurement epsilon of the test piece to be tested obtained in the step S4 mea ' the first component epsilon of nominal strain of the strain gauge assembly obtained in step S5 amp ' the second component epsilon of nominal strain of the strain gauge assembly obtained in step S6 mte ' correcting the actual thermal strain ε of a test piece to be tested r The method comprises the following steps:
ε r ＝ε mea ′-ε amp ′-ε mte ′。
according to the above scheme, in the step S1, the specific steps are as follows:
the specific steps of the temperature cycle experiment are as follows: raising the temperature in the triaxial chamber from T1 to T2, and after the T2 holding time period T, lowering the temperature in the triaxial chamber from T2 to T1, and after the T1 holding time period T;
t1 is 30 ℃, T2 is in the range of 40-200 ℃, and T is in the range of 30-40 hours.
According to the above scheme, in the step S1, the specific steps are as follows:
the strain gauge assembly comprises a lateral strain gauge assembly and an axial strain gauge assembly;
second component epsilon of nominal strain of lateral strain gauge assembly mte side Is the amount of change per unit temperatureThe method comprises the following steps:
second component epsilon of nominal strain of axial strain gauge assembly mte shaft Is the amount of change per unit temperatureThe method comprises the following steps:
according to the above scheme, in the step S1, the specific steps are as follows:
the standard test piece with known thermal expansion coefficient is a metal test piece; the test piece to be tested is a rock or other material test piece.
A computer storage medium having stored therein a computer program executable by a computer processor for performing a method of rock strain data correction for a high temperature triaxial tester.
The beneficial effects of the invention are as follows:
1. according to the rock strain data correction method of the high-temperature triaxial tester, the nominal strain component epsilon of the strain gauge assembly is quantified through the anisotropy of the system temperature of the high-temperature triaxial tester and the asynchronism of the temperature development of each part amp And epsilon mte The function of correcting thermal strain data of rocks and other materials is realized.
2. Because the temperature of the wire between the strain gauge assembly and the amplifying circuit is most obviously affected by the plug temperature of the strain gauge, the invention can more reflect the irrecoverable characteristic of the temperature of the wire in experiments by simulating the temperature of the wire by using the plug temperature, thereby more accurately estimating the first component of the nominal strain of the strain gauge and further more accurately correcting the thermal strain of rocks or other materials.
3. Because the temperature of the position of the strain gauge assembly in the high-temperature triaxial test machine is different from the temperature of the test piece, the temperature of the strain gauge is obtained by measurement or simulation and is used for calculating the nominal strain second component of the strain gauge assembly caused by the metal sheet in the strain gauge assembly, thereby being beneficial to more accurately correcting the thermal strain of rock or other materials.
Drawings
FIG. 1 is a schematic diagram of a high temperature triaxial tester platform according to an embodiment of the present invention.
FIG. 2 is a schematic view of a lateral strain gauge assembly configuration in accordance with an embodiment of the present invention.
Fig. 3 is a schematic view of a strain gauge assembly incorporating a metal sheet and a resistance strain gauge adhered thereto according to an embodiment of the present invention.
FIG. 4 is a functional circuit schematic of a strain gauge assembly according to an embodiment of the present invention.
FIG. 5 is an exemplary illustration of a lateral thermal strain correction for a standard test piece in accordance with an embodiment of the present invention.
FIG. 6 is an exemplary illustration of axial thermal strain correction for a standard test piece in accordance with an embodiment of the present invention.
Fig. 7 is an exemplary diagram of lateral thermal strain correction of a rock specimen in accordance with an embodiment of the present invention.
Fig. 8 is an exemplary view for correcting axial thermal strain of a rock specimen according to an embodiment of the present invention.
Fig. 9 is a flow chart of an embodiment of the present invention.
In the figure: 1. a triaxial pressure chamber sidewall; 2. a test piece; 3. thermocouples (locations); 4. an axial strain gauge assembly; 5. a lateral strain gauge assembly; 6. temperature measurement point positions of strain gauges; 7. temperature measurement points of the strain gauge plug;
21. a test piece; 22. measuring points of the lateral strain gauge assembly; 23. a metal sheet; 24. a resistance strain gauge; 25. the lateral strain gauge assembly is used for measuring the resistance of a triaxial indoor lead of the high-temperature triaxial tester; 26. the wire resistance between the strain gauge and the amplifying circuit; 27. a primary amplifying circuit; 28. a secondary amplifying circuit; 29. a portion of the circuit affected by the triaxial indoor temperature; 30. a portion of the circuit affected by room temperature; 31. a portion of the circuit affected by the actual temperature of the wire; 32. the strain gauge assembly is connected to the plug position of the high-temperature triaxial tester;
41. strain measurement epsilon mea The method comprises the steps of carrying out a first treatment on the surface of the 42. First component epsilon of nominal strain of strain gauge assembly amp The method comprises the steps of carrying out a first treatment on the surface of the 43. Standard test piece strain epsilon st The method comprises the steps of carrying out a first treatment on the surface of the 44. Second component epsilon of nominal strain of strain gauge assembly mte The method comprises the steps of carrying out a first treatment on the surface of the 45. Corrected rock specimen strain ε r 。
Detailed Description
The invention will be described in further detail with reference to the drawings and the detailed description.
Referring to fig. 9, the rock strain data correction method of the high-temperature triaxial tester according to the embodiment of the present invention includes the following steps:
(1) The thermal expansion coefficient is 23.2 mu epsilon DEG C on a high-temperature triaxial tester platform -1 The temperature cycle test was performed by raising the temperature in the triaxial chamber from room temperature of 30 c to the upper temperature limit of 90 c and maintaining it at 90 c for 30 hours, and then lowering the temperature to room temperature of 30 c and maintaining it at 30 c for 30 hours. In the temperature cycling experiment, the upper temperature limit of the triaxial chamber can be set between 40 ℃ and 200 ℃. The deformation of the standard test piece is kept in the elastic range under the experimental working condition. Measuring or simulating the temperature T of the position of a strain gauge assembly in a triaxial test machine in the test g And strain gauge assembly plug temperature T p The method comprises the steps of carrying out a first treatment on the surface of the Reading the strain gauge assembly to obtain the strain measurement epsilon of the standard test piece mea 。
(2) Establishing a finite element model of heat conduction by using the temperature T obtained in the step (1) g 、T p Temperature T of wire between analog strain gauge assembly and amplifying circuit ind And its variation with time; calculating the amplification factor A of real-time change in experiment ap First component epsilon of nominal strain of strain gauge assembly amp See fig. 5 and 6.
(3) Calculating the actual strain epsilon of the standard test piece in the experiment in the step (1) st . Using the strain measurement epsilon of the standard test piece in step (1) mea The first component epsilon of nominal strain of the strain gauge assembly obtained in the step (2) amp Actual strain epsilon of standard test piece st Calculating the second component epsilon of the nominal strain of the strain gauge assembly mte See fig. 5 and 6:
ε mte ＝ε mea -ε amp -ε st ，
let T be a For room temperature, calculating the second component epsilon of nominal strain of the strain gauge assembly mte Is the amount of change per unit temperature
In the lateral strain gauge assembly, the variation is thatIn the axial strain gauge assembly, the variation is +.>
(4) And (3) performing a temperature cycling (temperature changing) experiment on a rock (such as limestone or other materials) test piece on a high-temperature triaxial tester platform. The temperature in the triaxial chamber was raised from room temperature of 30 ℃ to 40 ℃ and maintained at 40 ℃ for 40 hours in the experiment, and then the temperature was lowered to 30 ℃. The deformation of the limestone test piece is kept in an elastic range by the experimental working condition; measuring or simulating the temperature T at the location of a strain gauge assembly in a triaxial test machine in a test specimen of rock (e.g. limestone, or other material) g ' and strain gauge assembly plug temperature T p 'A'; reading the strain gauge assembly to obtain the strain measurement epsilon of the test piece to be tested mea ′。
(5) In the temperature cycling (temperature changing) experiment of rock (such as limestone or other materials) calculated in the step (2), the first component epsilon of nominal strain of the strain gauge assembly amp ' Strain gauge assembly nominal strain second component ε mte ′：
Correcting the actual thermal strain epsilon of a rock (e.g. limestone, or other material) specimen r See fig. 7 and 8:
ε r ＝ε mea ′-ε amp ′-ε mte ′。
rock (e.g. limestone, or other material) test piece heat modified as described aboveStrain is recoverable in temperature cycling experiments; the average value of the thermal strain per unit temperature is 4.3 mu epsilon DEG C -1 Is consistent with the thermal expansion coefficient range of limestone in the literature. The above-described method steps of correcting the thermal strain of a rock specimen are therefore considered to be effective.
The above embodiments are merely for illustrating the design concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement the same, the scope of the present invention is not limited to the above embodiments. Therefore, all equivalent changes or modifications according to the principles and design ideas of the present invention are within the scope of the present invention.
Claims (5)
1. The rock strain data correction method of the high-temperature triaxial tester is characterized by comprising the following steps of: the method comprises the following steps:
s1: carrying out a temperature cycle experiment on a standard test piece with a known thermal expansion coefficient in a high-temperature triaxial tester, wherein the deformation of the standard test piece is kept in an elastic range under the experimental working condition; measuring or simulating the temperature T of the position of a strain gauge assembly in a high-temperature triaxial test machine in the temperature cycle test process of a standard test piece g And strain gauge assembly plug temperature T p The method comprises the steps of carrying out a first treatment on the surface of the Reading the strain gauge assembly to obtain the strain measurement epsilon of the standard test piece mea ；
S2: establishing a finite element model of heat conduction, and using the temperature T of the position of the strain gauge assembly in the temperature cycle experiment process of the standard test piece g And strain gauge assembly plug temperature T p Temperature T of wire between analog strain gauge assembly and amplifying circuit ind And its variation with time; calculating amplification factor A of real-time change in temperature cycle experiment of standard test piece ap And a first component epsilon of nominal strain of the strain gauge assembly amp ；
S3: calculating the actual strain epsilon of the standard test piece by using the thermal expansion coefficient of the standard test piece and the temperature variation rate experienced by the standard test piece st The method comprises the steps of carrying out a first treatment on the surface of the Using strain measurement epsilon of standard test pieces mea First component epsilon of nominal strain of strain gauge assembly amp Actual strain ε of a standard test piece st Calculating strain gauge assembly nominal strainVarying the second component ε mte ：
ε mte ＝ε mea -ε amp -ε st ；
Let T be a For room temperature, calculating the second component epsilon of nominal strain of the strain gauge assembly mte Is the amount of change per unit temperature
S4: carrying out a temperature cycle experiment on a high-temperature triaxial tester by using a test piece to be tested; measuring the temperature T of the position of a strain gauge assembly in a high-temperature triaxial tester in the temperature cycle test process of a test piece to be tested g ' and strain gauge assembly plug temperature T p 'A'; reading the strain gauge assembly to obtain the strain measurement epsilon of the test piece to be tested mea ′；
S5: in a finite element model of heat conduction, the temperature T of the position of the strain gauge component in the temperature cycle experiment process of a test piece to be tested g ' and strain gauge assembly plug temperature T p ' temperature T of wire between analog strain gauge assembly and amplifying circuit ind ' and its variation over time; calculating an amplification factor A of real-time change in a temperature cycle experiment of a test piece to be tested ap ' Strain gauge assembly nominal Strain first component ε amp ′；
S6: according to the variation obtained in step S3Calculating the second component epsilon of the nominal strain of the strain gauge assembly mte ′：
S7: strain of test piece to be tested obtained by step S4Measurement of epsilon mea ' the first component epsilon of nominal strain of the strain gauge assembly obtained in step S5 amp ' the second component epsilon of nominal strain of the strain gauge assembly obtained in step S6 mte ' correcting the actual thermal strain ε of a test piece to be tested r The method comprises the following steps:
ε r ＝ε mea ′-ε amp ′-ε mte ′。
2. the method for correcting rock strain data of high-temperature triaxial tester according to claim 1, characterized by comprising the steps of: in the step S1, the specific steps are as follows:
the specific steps of the temperature cycle experiment are as follows: raising the temperature in the triaxial chamber from T1 to T2, and after the T2 holding time period T, lowering the temperature in the triaxial chamber from T2 to T1, and after the T1 holding time period T;
t1 is 30 ℃, T2 is in the range of 40-200 ℃, and T is in the range of 30-40 hours.
3. The method for correcting rock strain data of high-temperature triaxial tester according to claim 1, characterized by comprising the steps of: in the step S1, the specific steps are as follows:
the strain gauge assembly comprises a lateral strain gauge assembly and an axial strain gauge assembly;
second component epsilon of nominal strain of lateral strain gauge assembly mte side Is the amount of change per unit temperatureThe method comprises the following steps:
second component epsilon of nominal strain of axial strain gauge assembly mte shaft Is the amount of change per unit temperatureThe method comprises the following steps:
4. the method for correcting rock strain data of high-temperature triaxial tester according to claim 1, characterized by comprising the steps of: in the step S1, the specific steps are as follows:
the standard test piece with known thermal expansion coefficient is a metal test piece; the test piece to be tested is a rock or other material test piece.
5. A computer storage medium, characterized by: a computer program executable by a computer processor, the computer program executing the rock strain data correction method of the high-temperature triaxial tester according to any one of claims 1 to 4.
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| CN110160892A (en) * | 2019-07-04 | 2019-08-23 | 四川大学 | A method of anisotropic rock deformation constant is measured with torsion test |
| CN110658082A (en) * | 2019-10-17 | 2020-01-07 | 山东大学 | A system and method for testing the r-value of metal sheet high temperature tensile anisotropy |
| CN111982692A (en) * | 2020-08-24 | 2020-11-24 | 中国科学院武汉岩土力学研究所 | Long-term deformation testing method for rock under different stress components and application thereof |
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