CN110690168A - A method of manufacturing a liquid crystal display panel - Google Patents
A method of manufacturing a liquid crystal display panel Download PDFInfo
- Publication number
- CN110690168A CN110690168A CN201910911010.3A CN201910911010A CN110690168A CN 110690168 A CN110690168 A CN 110690168A CN 201910911010 A CN201910911010 A CN 201910911010A CN 110690168 A CN110690168 A CN 110690168A
- Authority
- CN
- China
- Prior art keywords
- layer
- insulating layer
- basis
- organic insulating
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 22
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 239000010410 layer Substances 0.000 claims abstract description 203
- 229910052751 metal Inorganic materials 0.000 claims abstract description 45
- 239000002184 metal Substances 0.000 claims abstract description 45
- 238000000034 method Methods 0.000 claims abstract description 19
- 239000004065 semiconductor Substances 0.000 claims abstract description 14
- 239000011229 interlayer Substances 0.000 claims abstract description 8
- 238000002425 crystallisation Methods 0.000 claims abstract description 6
- 230000008025 crystallization Effects 0.000 claims abstract description 6
- 238000005530 etching Methods 0.000 claims description 19
- 238000000151 deposition Methods 0.000 claims description 11
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims description 9
- 238000004380 ashing Methods 0.000 claims description 8
- 239000002253 acid Substances 0.000 claims description 6
- 239000011810 insulating material Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 5
- 238000005229 chemical vapour deposition Methods 0.000 claims description 4
- 239000004020 conductor Substances 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 235000006408 oxalic acid Nutrition 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 2
- 230000003647 oxidation Effects 0.000 abstract description 2
- 238000007254 oxidation reaction Methods 0.000 abstract description 2
- 238000002834 transmittance Methods 0.000 abstract 1
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 238000000844 transformation Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0231—Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/451—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs characterised by the compositions or shapes of the interlayer dielectrics
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
Landscapes
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Abstract
本发明提供一种液晶显示面板的制造方法,从底层到顶层依序形成公共电极层、遮光层、有机绝缘层、半导体层、栅极绝缘层、栅极、层间绝缘层、源极和漏极、第一绝缘层和像素电极层;有机绝缘层对遮光层的金属进行保护,在去掉像素区域内的第一金属层后,有机绝缘层和公共电极层同时进行烘烤,使得机绝缘层和公共电极层同时进行结晶化,以此保护有机绝缘层下方的遮光层,避免遮光层在烘烤时产生氧化,同时能保证像素区域的公共电极层结晶后有良好的透光率和电阻率。本发明液晶显示面板为减掩膜版设计,与现有9道掩膜版工艺相比减少为7道掩膜版,可以节约成本,同时保留TFT器件的电性优势。
The present invention provides a method for manufacturing a liquid crystal display panel. From the bottom layer to the top layer, a common electrode layer, a light shielding layer, an organic insulating layer, a semiconductor layer, a gate insulating layer, a gate electrode, an interlayer insulating layer, a source electrode and a drain electrode are sequentially formed. electrode, the first insulating layer and the pixel electrode layer; the organic insulating layer protects the metal of the light-shielding layer, after removing the first metal layer in the pixel area, the organic insulating layer and the common electrode layer are baked at the same time, so that the organic insulating layer Simultaneous crystallization with the common electrode layer to protect the light-shielding layer under the organic insulating layer, avoid oxidation of the light-shielding layer during baking, and ensure that the common electrode layer in the pixel area has good light transmittance and resistivity after crystallization . The liquid crystal display panel of the present invention has a mask-reduced design, which is reduced to 7 masks compared with the existing 9-channel mask process, which can save costs and at the same time retain the electrical advantages of TFT devices.
Description
技术领域technical field
本发明涉及液晶面板的技术领域,尤其涉及一种液晶显示面板的制造方法。The present invention relates to the technical field of liquid crystal panels, and in particular, to a method for manufacturing a liquid crystal display panel.
背景技术Background technique
顶栅的TFT器件具有较小的Cgs(栅极和漏极之间的电容)和Cgd(栅极和源极之间的电容),相对于常规的底栅的TFT器件具有较小的功耗和较好的器件稳定性,被广泛用于OLED补偿电路和低功耗显示器件中。但是顶栅的TFT器件的工艺需要9道Mask(掩膜版),有明显的成本劣势。Top-gate TFT devices have smaller Cgs (capacitance between gate and drain) and Cgd (capacitance between gate and source), and have lower power consumption compared to conventional bottom-gate TFT devices and good device stability, it is widely used in OLED compensation circuits and low-power display devices. However, the process of the top-gate TFT device requires 9 masks, which has obvious cost disadvantages.
发明内容SUMMARY OF THE INVENTION
本发明的目的在于提供一种节约成本、保持TFT器件的电性优势的液晶显示面板的制造方法。The purpose of the present invention is to provide a method for manufacturing a liquid crystal display panel that saves costs and maintains the electrical advantages of a TFT device.
本发明提供一种液晶显示面板的制造方法,包括如下步骤:The present invention provides a method for manufacturing a liquid crystal display panel, comprising the following steps:
S1:在基板上依序沉积公共电极层和第一金属层的叠层结构;S1: sequentially depositing a stack structure of a common electrode layer and a first metal layer on the substrate;
S2:首先在步骤S1的基础上沉积一层有机绝缘层;然后采用半透掩膜版对有机绝缘层进行曝光并形成位于像素区域内的第一凹槽区域、位于端子区域的接触孔位置内的第二凹槽区域以及位于像素区域和端子区域之间的连接区域内的第一开孔;S2: First, deposit an organic insulating layer on the basis of step S1; then use a semi-transparent mask to expose the organic insulating layer to form a first groove area in the pixel area and a contact hole in the terminal area. the second groove area and the first opening in the connection area between the pixel area and the terminal area;
S3:首先,在步骤S2的基础上,进行第一次刻蚀并刻蚀掉位于第一开孔下的第一金属层;然后进行第二次刻蚀并刻蚀掉位于第一开孔下的公共电极层;S3: First, on the basis of step S2, perform the first etching and etch away the first metal layer under the first opening; then perform the second etching and etch away the first metal layer under the first opening the common electrode layer;
S4:在步骤S3的基础上对有机绝缘层进行第一次灰化处理,使得去除第一凹槽区域内的有机绝缘层和第二凹槽区域内的有机绝缘层;S4: performing a first ashing treatment on the organic insulating layer on the basis of step S3, so that the organic insulating layer in the first groove region and the organic insulating layer in the second groove region are removed;
S5:在步骤S4的基础上分别对像素区域和端子区域进行刻蚀并分别去除像素区域和端子区域内的第一金属层;S5: on the basis of step S4, the pixel area and the terminal area are respectively etched, and the first metal layer in the pixel area and the terminal area are respectively removed;
S6:在步骤S5的基础上对有机绝缘层和公共电极层一同进行烘烤,同时进行有机绝缘层和公共电极层进行的结晶化;S6: on the basis of step S5, the organic insulating layer and the common electrode layer are baked together, and the crystallization of the organic insulating layer and the common electrode layer is performed simultaneously;
S7:在步骤S5的基础上,首先形成顶栅结构的TFT器件,然后形成与TFT器件的漏极连接的像素电极。S7: On the basis of step S5, a TFT device with a top gate structure is formed first, and then a pixel electrode connected to the drain electrode of the TFT device is formed.
优选地,所述步骤S2中,半透掩膜版分别在像素区域和端子区域为半透区域,半透掩膜版在像素区域和端子区域之间的连接区域为全透区域。Preferably, in the step S2, the semi-transparent mask is respectively a semi-transparent area in the pixel area and the terminal area, and the connection area of the semi-transparent mask between the pixel area and the terminal area is a fully-transparent area.
优选地,还包括位于步骤S6和S7之间的步骤S61:Preferably, step S61 between steps S6 and S7 is also included:
S61:在步骤S6的基础上对有机绝缘层进行第二次灰化处理,去除超过第一金属层两侧的有机绝缘层,第一金属层形成位于有机绝缘层下方的遮光层。S61 : performing a second ashing treatment on the organic insulating layer on the basis of step S6 , removing the organic insulating layer beyond both sides of the first metal layer, and forming the light shielding layer under the organic insulating layer on the first metal layer.
优选地,步骤S7包括如下步骤:Preferably, step S7 includes the following steps:
S71:在步骤S61的基础上采用化学气相沉积法成膜形成一层缓冲层;S71: On the basis of step S61, chemical vapor deposition is used to form a film to form a buffer layer;
S72:在步骤S71的基础上形成半导体层;S72: forming a semiconductor layer on the basis of step S71;
S73:在步骤S72的基础上依序沉积绝缘材料层和第二金属层并分别对绝缘材料层和第二金属层进行刻蚀形成位于半导体上的栅极绝缘层和位于栅极绝缘层上的栅极;S73: sequentially depositing an insulating material layer and a second metal layer on the basis of step S72, and etching the insulating material layer and the second metal layer respectively to form a gate insulating layer on the semiconductor and a gate insulating layer on the gate insulating layer grid;
S74:在步骤S73的基础上首先沉积一层层间绝缘层,然后对层间绝缘层进行刻蚀形成位于端子区域内且公共电极层上的第二开孔;S74: On the basis of step S73, first deposit an interlayer insulating layer, and then etch the interlayer insulating layer to form a second opening located in the terminal area and on the common electrode layer;
S75:在步骤S74的基础上沉积第三金属层并对第三金属层进行刻蚀形成位于第二开孔内的源极和漏极,其中源极和漏极分别位于半导体的两侧;S75: depositing a third metal layer on the basis of step S74 and etching the third metal layer to form a source electrode and a drain electrode located in the second opening, wherein the source electrode and the drain electrode are located on both sides of the semiconductor respectively;
S76:在步骤S75的基础上沉积第一绝缘层并对第一绝缘层进行刻蚀形成位于漏极上方的第三开孔;S76: on the basis of step S75, depositing a first insulating layer and etching the first insulating layer to form a third opening above the drain;
S77:在步骤S76的基础上采用透明导电材料沉积形成像素电极层,像素电极层通过第三开孔与漏极接触。S77: On the basis of step S76, a transparent conductive material is used to deposit and form a pixel electrode layer, and the pixel electrode layer is in contact with the drain electrode through the third opening.
优选地,步骤S75中,源极与公共电极层接触。Preferably, in step S75, the source electrode is in contact with the common electrode layer.
优选地,步骤S71中,缓冲层包裹在公共电极层、第一金属层、有机绝缘层和开孔外。Preferably, in step S71, the buffer layer is wrapped around the common electrode layer, the first metal layer, the organic insulating layer and the opening.
优选地,步骤S3中,采用无氟铜酸进行第一次刻蚀,采用草酸进行第二次刻蚀。Preferably, in step S3, fluorine-free cupric acid is used for the first etching, and oxalic acid is used for the second etching.
优选地,步骤S5中,采用采用无氟铜酸分别对像素区域和端子区域进行刻蚀。Preferably, in step S5, fluorine-free cupric acid is used to etch the pixel region and the terminal region respectively.
优选地,所述第一金属层的材料为铜或铝或合金材料。Preferably, the material of the first metal layer is copper or aluminum or an alloy material.
本发明液晶显示面板为减掩膜版设计,与现有9道掩膜版工艺相比减少为7道掩膜版,可以节约成本,同时保留TFT器件的电性优势。The liquid crystal display panel of the present invention has a mask-reduced design, and is reduced to 7 masks compared with the existing 9-mask process, which can save costs and at the same time retain the electrical advantages of TFT devices.
附图说明Description of drawings
图1至图13为本发明液晶显示面板的制造步骤的示意图。1 to 13 are schematic diagrams illustrating the manufacturing steps of the liquid crystal display panel of the present invention.
具体实施方式Detailed ways
下面结合附图和具体实施例,进一步阐明本发明,应理解这些实施例仅用于说明本发明而不用于限制本发明的范围,在阅读了本发明之后,本领域技术人员对本发明的各种等价形式的修改均落于本申请所附权利要求所限定的范围。Below in conjunction with the accompanying drawings and specific embodiments, the present invention will be further clarified. It should be understood that these embodiments are only used to illustrate the present invention and not to limit the scope of the present invention. Modifications of equivalent forms all fall within the scope defined by the appended claims of this application.
为使图面简洁,各图中只示意性地表示出了与本发明相关的部分,它们并不代表其作为产品的实际结构。另外,以使图面简洁便于理解,在有些图中具有相同结构或功能的部件,仅示意性地绘示了其中的一个,或仅标出了其中的一个。在本文中,“一个”不仅表示“仅此一个”,也可以表示“多于一个”的情形。In order to keep the drawings concise, the drawings only schematically show the parts related to the present invention, and they do not represent its actual structure as a product. In addition, in order to make the drawings concise and easy to understand, in some drawings, only one of the components having the same structure or function is schematically shown, or only one of them is marked. As used herein, "one" not only means "only one", but also "more than one".
本发明揭示一种液晶显示面板的制造方法,包括如下步骤:The present invention discloses a method for manufacturing a liquid crystal display panel, comprising the following steps:
S1:如图1所示,在基板10上沉积公共电极层20和第一金属层30的叠层结构;S1: As shown in FIG. 1 , depositing a stacked structure of the
其中,公共电极层20采用透明导电材料形成的,第一金属层30的材料为铜或铝等单层金属或多层金属。The
S2:如图2所示,首先在步骤S1的基础上沉积一层有机绝缘层40;然后采用半透掩膜版(图未示)对有机绝缘层40进行曝光,半透掩膜版分别在像素区域101和端子区域102的接触孔位置为半透区域,半透掩膜版在像素区域101和端子区域102之间的连接区域103为全透区域,通过半透掩膜版对有机绝缘层40进行曝光形成位于像素区域101内的第一凹槽区域41、位于端子区域102内的第二凹槽区域42以及位于连接区域103内的第一开孔43,第一开孔43位于第一金属层30的上方;S2: As shown in FIG. 2, first, a layer of
其中,通过连接区域103使得靠近端子区域101的公共电极层20作为TFT器件的遮光区域,靠近像素区域101的公共电极层20用来提供公共电压,端子区域101的公共电极层20和靠近像素区域101的公共电极层20连接在一起会导致TFT器件的特性异常。The
其中,步骤S2为第一道掩膜版工艺。Wherein, step S2 is the first mask process.
S3:如图3(a)所示,首先,在步骤S2的基础上,采用无氟铜酸进行第一次刻蚀并刻蚀掉位于第一开孔43下的第一金属层30;然后采用草酸进行第二次刻蚀并刻蚀掉位于第一开孔43下的公共电极层20,即通过两次刻蚀使得第一开孔43位于基板10上;S3: As shown in FIG. 3(a), first, on the basis of step S2, fluorine-free cupric acid is used for the first etching and the
S4:如图4所示,在步骤S3的基础上对有机绝缘层40进行第一次灰化处理(Ashing),使得去除第一凹槽区域41内的有机绝缘层40和第二凹槽区域42内的有机绝缘层40;S4: As shown in FIG. 4 , on the basis of step S3, perform a first ashing treatment (Ashing) on the
S5:如图5所示,在步骤S4的基础上采用无氟铜酸分别对像素区域101和端子区域102进行刻蚀并分别去除像素区域101和端子区域102内的第一金属层30;S5: As shown in FIG. 5, on the basis of step S4, fluorine-free cupric acid is used to etch the
S6:在步骤S5的基础上对有机绝缘层40和公共电极层20一同进行烘烤,同时进行有机绝缘层40和公共电极层20进行的结晶化,这样可以节省一次烘烤制程,在有机绝缘层40的保护,有机绝缘层40下的第一金属层30不会被氧化;S6: On the basis of step S5, the
S7:在步骤S6的基础上,首先形成顶栅结构的TFT器件,然后形成与TFT器件的漏极连接的像素电极。S7: On the basis of step S6, a TFT device with a top-gate structure is formed first, and then a pixel electrode connected to the drain electrode of the TFT device is formed.
通过上述步骤形成本发明液晶显示面板。The liquid crystal display panel of the present invention is formed through the above steps.
其中,液晶显示面板的制造方法,还包括位于步骤S6和S7之间的步骤S61:Wherein, the manufacturing method of the liquid crystal display panel further includes step S61 between steps S6 and S7:
S61:在步骤S6的基础上对有机绝缘层40进行第二次灰化处理(Ashing),去除超过第一金属层30两侧的有机绝缘层40,第一金属层30形成位于有机绝缘层40下方的遮光层31,消除有机绝缘层40的UnderCut(底切);S61: on the basis of step S6, perform a second ashing treatment (Ashing) on the
其中,遮光层31作为半导体60的遮光金属层。The
其中,步骤S7包括如下步骤:Wherein, step S7 includes the following steps:
S71:如图7所示,在步骤S61的基础上采用CVD(化学气相沉积法)低速成膜形成一层缓冲层50,缓冲层50的厚度不小于半导体层20和第一金属层30的厚度之和;S71 : as shown in FIG. 7 , on the basis of step S61 , a
其中,缓冲层50包裹在公共电极层20、第一金属层30、有机绝缘层40和开孔43外。The
S72:如图8所示,在步骤S71的基础上形成由金属氧化物材料形成的半导体层60;S72: As shown in FIG. 8, on the basis of step S71, a
其中,半导体层60的材料也可以非晶硅、多晶硅等;步骤S72为第二道掩膜版工艺。Wherein, the material of the
S73:如图9所示,在步骤S72的基础上依序沉积绝缘材料层和第二金属层并分别对绝缘材料层和第二金属层进行刻蚀形成位于半导体60上的栅极绝缘层70和位于栅极绝缘层70上的栅极80;S73 : as shown in FIG. 9 , sequentially depositing an insulating material layer and a second metal layer on the basis of step S72 and etching the insulating material layer and the second metal layer respectively to form a
其中,步骤S73为第三道掩膜版工艺。Wherein, step S73 is the third mask process.
S74:如图10(a)所示,在步骤S73的基础上首先沉积一层层间绝缘层90,如图10(b)所示,然后对层间绝缘层91进行刻蚀形成位于端子区域102内且公共电极层20上的第二开孔91;S74: As shown in FIG. 10(a), on the basis of step S73, an
其中,步骤S74为第四道掩膜版工艺。Wherein, step S74 is the fourth mask process.
S75:如图11所示,在步骤S74的基础上沉积第三金属层并对第三金属层进行刻蚀形成位于第二开孔91内的源极111和漏极112,其中源极111和漏极112分别位于半导体60的两侧;源极111与公共电极层20接触,有助于TFT器件的电性稳定性;S75: As shown in FIG. 11, on the basis of step S74, a third metal layer is deposited and the third metal layer is etched to form a
其中,步骤S75为第五道掩膜版工艺。Wherein, step S75 is the fifth mask process.
S76:如图12所示,在步骤S75的基础上沉积第一绝缘层120并对第一绝缘层120进行刻蚀形成位于漏极112上方的第三开孔121;S76 : as shown in FIG. 12 , on the basis of step S75 , depositing a first insulating
其中,步骤S76为第六道掩膜版工艺。Wherein, step S76 is the sixth mask process.
S77:如图13所示,在步骤S76的基础上采用透明导电材料沉积形成像素电极层130,像素电极层130通过第三开孔121与漏极112接触。S77 : as shown in FIG. 13 , on the basis of step S76 , a transparent conductive material is used to deposit and form the
其中,步骤S77为第七道掩膜版工艺。Wherein, step S77 is the seventh mask process.
本发明从底层到顶层依序形成公共电极层20、遮光层31、有机绝缘层40、半导体层60、栅极绝缘层70、栅极80、层间绝缘层90、源极111和漏极112、第一绝缘层120和像素电极层130。The present invention sequentially forms the
公共电极层20和遮光层31采用连续成膜的方式形成,然后采用半透掩膜版(图未示)对有机绝缘层40进行曝光、刻蚀和剥离后,像素区域101外为公共电极层20和遮光层31的双层结构,像素区域101内为公共电极层20的单层结构。The
本发明采用有机绝缘层40对遮光层31的金属进行保护,在去掉像素区域101内的第一金属层30后,有机绝缘层40和公共电极层40同时进行烘烤,使得机绝缘层40和公共电极层40同时进行结晶化,以此保护有机绝缘层40下方的遮光层31,避免遮光层31在烘烤时产生氧化,同时能保证像素区域101的公共电极层40结晶后有良好的透光率和电阻率。In the present invention, the organic insulating
本发明源极与公共电极层接触,有助于TFT器件的电性稳定性。The source electrode of the present invention is in contact with the common electrode layer, which contributes to the electrical stability of the TFT device.
本发明液晶显示面板为减掩膜版设计,与现有9道掩膜版工艺相比减少为7道掩膜版,可以节约成本,同时保留TFT器件的电性优势。The liquid crystal display panel of the present invention has a mask-reduced design, and is reduced to 7 masks compared with the existing 9-mask process, which can save costs and at the same time retain the electrical advantages of TFT devices.
以上详细描述了本发明的优选实施方式,但是本发明并不限于上述实施方式中的具体细节,在本发明的技术构思范围内,可以对本发明的技术方案进行多种等同变换(如数量、形状、位置等),这些等同变换均属于本发明的保护范围。The preferred embodiments of the present invention are described in detail above, but the present invention is not limited to the specific details of the above-mentioned embodiments. Within the scope of the technical concept of the present invention, various equivalent transformations (such as quantity, shape, etc.) can be performed on the technical solutions of the present invention. , position, etc.), these equivalent transformations all belong to the protection scope of the present invention.
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910911010.3A CN110690168A (en) | 2019-09-25 | 2019-09-25 | A method of manufacturing a liquid crystal display panel |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910911010.3A CN110690168A (en) | 2019-09-25 | 2019-09-25 | A method of manufacturing a liquid crystal display panel |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110690168A true CN110690168A (en) | 2020-01-14 |
Family
ID=69110615
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910911010.3A Pending CN110690168A (en) | 2019-09-25 | 2019-09-25 | A method of manufacturing a liquid crystal display panel |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110690168A (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103235455A (en) * | 2013-03-25 | 2013-08-07 | 南京中电熊猫液晶显示科技有限公司 | Liquid crystal display panel and manufacturing method thereof |
CN105590896A (en) * | 2016-03-01 | 2016-05-18 | 深圳市华星光电技术有限公司 | Manufacturing method of array substrate and manufactured array substrate |
CN105742292A (en) * | 2016-03-01 | 2016-07-06 | 深圳市华星光电技术有限公司 | Manufacturing method for array substrate and array substrate manufactured by same |
JP2016186898A (en) * | 2015-03-27 | 2016-10-27 | 日本精機株式会社 | Organic el panel and method for manufacturing the same |
US9965122B2 (en) * | 2015-12-28 | 2018-05-08 | Lg Display Co., Ltd. | Display device with light shield |
-
2019
- 2019-09-25 CN CN201910911010.3A patent/CN110690168A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103235455A (en) * | 2013-03-25 | 2013-08-07 | 南京中电熊猫液晶显示科技有限公司 | Liquid crystal display panel and manufacturing method thereof |
JP2016186898A (en) * | 2015-03-27 | 2016-10-27 | 日本精機株式会社 | Organic el panel and method for manufacturing the same |
US9965122B2 (en) * | 2015-12-28 | 2018-05-08 | Lg Display Co., Ltd. | Display device with light shield |
CN105590896A (en) * | 2016-03-01 | 2016-05-18 | 深圳市华星光电技术有限公司 | Manufacturing method of array substrate and manufactured array substrate |
CN105742292A (en) * | 2016-03-01 | 2016-07-06 | 深圳市华星光电技术有限公司 | Manufacturing method for array substrate and array substrate manufactured by same |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US9236405B2 (en) | Array substrate, manufacturing method and the display device thereof | |
CN104685635B (en) | Semiconductor device | |
CN100517075C (en) | A method for manufacturing an array substrate of a thin film transistor liquid crystal display | |
CN208507683U (en) | Electrostatic discharge protective circuit, array substrate and display device | |
WO2016195039A1 (en) | Active matrix substrate and method for manufacturing same, display device using active matrix substrate | |
CN102646632A (en) | Array substrate, manufacturing method thereof, and display device | |
CN103811417B (en) | How to make pixel structure | |
CN105070684B (en) | Preparation method of array substrate, array substrate and display device | |
CN102629609A (en) | Array substrate and manufacturing method thereof, liquid crystal panel, and display device | |
CN102456619B (en) | Array substrate, manufacturing method thereof, and liquid crystal display | |
CN103715267A (en) | TFT, TFT array substrate, manufacturing method of TFT array substrate and display device | |
JP2007157916A (en) | TFT substrate and manufacturing method of TFT substrate | |
CN114488638A (en) | Array substrate capable of avoiding active layer opening over-etching and manufacturing method thereof | |
TW201626580A (en) | Semiconductor device and method of manufacturing same | |
CN104090401B (en) | Array base palte and preparation method thereof, display device | |
CN101093844A (en) | Baseplate structure of thin film transistor device array, and preparation method | |
CN104779302A (en) | Thin film transistor and manufacturing method, array substrate and display device thereof | |
CN111312731B (en) | Array substrate, preparation method thereof and display panel | |
CN110867457B (en) | A high capacitance array substrate and manufacturing method thereof | |
CN107968097A (en) | A kind of display device, display base plate and preparation method thereof | |
CN111584509A (en) | Display panel, method for producing the same, and display device | |
TW201639173A (en) | Display device | |
CN106935660B (en) | Thin film transistor and manufacturing method thereof, array substrate and display device | |
CN110416313A (en) | Thin film transistor substrate and manufacturing method thereof | |
CN107799466A (en) | TFT substrate and preparation method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20200827 Address after: No.7 Tianyou Road, Qixia District, Nanjing City, Jiangsu Province Applicant after: NANJING CEC PANDA LCD TECHNOLOGY Co.,Ltd. Address before: Nanjing Crystal Valley Road in Qixia District of Nanjing City Tianyou 210033 Jiangsu province No. 7 Applicant before: NANJING CEC PANDA FPD TECHNOLOGY Co.,Ltd. Applicant before: NANJING CEC PANDA LCD TECHNOLOGY Co.,Ltd. Applicant before: Nanjing East China Electronic Information Technology Co.,Ltd. |
|
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200114 |