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CN110690168A - A method of manufacturing a liquid crystal display panel - Google Patents

A method of manufacturing a liquid crystal display panel Download PDF

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Publication number
CN110690168A
CN110690168A CN201910911010.3A CN201910911010A CN110690168A CN 110690168 A CN110690168 A CN 110690168A CN 201910911010 A CN201910911010 A CN 201910911010A CN 110690168 A CN110690168 A CN 110690168A
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layer
insulating layer
basis
organic insulating
area
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易志根
郑帅
潘明超
殷大山
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Nanjing CEC Panda LCD Technology Co Ltd
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Nanjing CEC Panda LCD Technology Co Ltd
Nanjing Huadong Electronics Information and Technology Co Ltd
Nanjing CEC Panda FPD Technology Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • H10D86/021Manufacture or treatment of multiple TFTs
    • H10D86/0231Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • H10D86/021Manufacture or treatment of multiple TFTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/451Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs characterised by the compositions or shapes of the interlayer dielectrics
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

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Abstract

本发明提供一种液晶显示面板的制造方法,从底层到顶层依序形成公共电极层、遮光层、有机绝缘层、半导体层、栅极绝缘层、栅极、层间绝缘层、源极和漏极、第一绝缘层和像素电极层;有机绝缘层对遮光层的金属进行保护,在去掉像素区域内的第一金属层后,有机绝缘层和公共电极层同时进行烘烤,使得机绝缘层和公共电极层同时进行结晶化,以此保护有机绝缘层下方的遮光层,避免遮光层在烘烤时产生氧化,同时能保证像素区域的公共电极层结晶后有良好的透光率和电阻率。本发明液晶显示面板为减掩膜版设计,与现有9道掩膜版工艺相比减少为7道掩膜版,可以节约成本,同时保留TFT器件的电性优势。

The present invention provides a method for manufacturing a liquid crystal display panel. From the bottom layer to the top layer, a common electrode layer, a light shielding layer, an organic insulating layer, a semiconductor layer, a gate insulating layer, a gate electrode, an interlayer insulating layer, a source electrode and a drain electrode are sequentially formed. electrode, the first insulating layer and the pixel electrode layer; the organic insulating layer protects the metal of the light-shielding layer, after removing the first metal layer in the pixel area, the organic insulating layer and the common electrode layer are baked at the same time, so that the organic insulating layer Simultaneous crystallization with the common electrode layer to protect the light-shielding layer under the organic insulating layer, avoid oxidation of the light-shielding layer during baking, and ensure that the common electrode layer in the pixel area has good light transmittance and resistivity after crystallization . The liquid crystal display panel of the present invention has a mask-reduced design, which is reduced to 7 masks compared with the existing 9-channel mask process, which can save costs and at the same time retain the electrical advantages of TFT devices.

Description

一种液晶显示面板的制造方法A method of manufacturing a liquid crystal display panel

技术领域technical field

本发明涉及液晶面板的技术领域,尤其涉及一种液晶显示面板的制造方法。The present invention relates to the technical field of liquid crystal panels, and in particular, to a method for manufacturing a liquid crystal display panel.

背景技术Background technique

顶栅的TFT器件具有较小的Cgs(栅极和漏极之间的电容)和Cgd(栅极和源极之间的电容),相对于常规的底栅的TFT器件具有较小的功耗和较好的器件稳定性,被广泛用于OLED补偿电路和低功耗显示器件中。但是顶栅的TFT器件的工艺需要9道Mask(掩膜版),有明显的成本劣势。Top-gate TFT devices have smaller Cgs (capacitance between gate and drain) and Cgd (capacitance between gate and source), and have lower power consumption compared to conventional bottom-gate TFT devices and good device stability, it is widely used in OLED compensation circuits and low-power display devices. However, the process of the top-gate TFT device requires 9 masks, which has obvious cost disadvantages.

发明内容SUMMARY OF THE INVENTION

本发明的目的在于提供一种节约成本、保持TFT器件的电性优势的液晶显示面板的制造方法。The purpose of the present invention is to provide a method for manufacturing a liquid crystal display panel that saves costs and maintains the electrical advantages of a TFT device.

本发明提供一种液晶显示面板的制造方法,包括如下步骤:The present invention provides a method for manufacturing a liquid crystal display panel, comprising the following steps:

S1:在基板上依序沉积公共电极层和第一金属层的叠层结构;S1: sequentially depositing a stack structure of a common electrode layer and a first metal layer on the substrate;

S2:首先在步骤S1的基础上沉积一层有机绝缘层;然后采用半透掩膜版对有机绝缘层进行曝光并形成位于像素区域内的第一凹槽区域、位于端子区域的接触孔位置内的第二凹槽区域以及位于像素区域和端子区域之间的连接区域内的第一开孔;S2: First, deposit an organic insulating layer on the basis of step S1; then use a semi-transparent mask to expose the organic insulating layer to form a first groove area in the pixel area and a contact hole in the terminal area. the second groove area and the first opening in the connection area between the pixel area and the terminal area;

S3:首先,在步骤S2的基础上,进行第一次刻蚀并刻蚀掉位于第一开孔下的第一金属层;然后进行第二次刻蚀并刻蚀掉位于第一开孔下的公共电极层;S3: First, on the basis of step S2, perform the first etching and etch away the first metal layer under the first opening; then perform the second etching and etch away the first metal layer under the first opening the common electrode layer;

S4:在步骤S3的基础上对有机绝缘层进行第一次灰化处理,使得去除第一凹槽区域内的有机绝缘层和第二凹槽区域内的有机绝缘层;S4: performing a first ashing treatment on the organic insulating layer on the basis of step S3, so that the organic insulating layer in the first groove region and the organic insulating layer in the second groove region are removed;

S5:在步骤S4的基础上分别对像素区域和端子区域进行刻蚀并分别去除像素区域和端子区域内的第一金属层;S5: on the basis of step S4, the pixel area and the terminal area are respectively etched, and the first metal layer in the pixel area and the terminal area are respectively removed;

S6:在步骤S5的基础上对有机绝缘层和公共电极层一同进行烘烤,同时进行有机绝缘层和公共电极层进行的结晶化;S6: on the basis of step S5, the organic insulating layer and the common electrode layer are baked together, and the crystallization of the organic insulating layer and the common electrode layer is performed simultaneously;

S7:在步骤S5的基础上,首先形成顶栅结构的TFT器件,然后形成与TFT器件的漏极连接的像素电极。S7: On the basis of step S5, a TFT device with a top gate structure is formed first, and then a pixel electrode connected to the drain electrode of the TFT device is formed.

优选地,所述步骤S2中,半透掩膜版分别在像素区域和端子区域为半透区域,半透掩膜版在像素区域和端子区域之间的连接区域为全透区域。Preferably, in the step S2, the semi-transparent mask is respectively a semi-transparent area in the pixel area and the terminal area, and the connection area of the semi-transparent mask between the pixel area and the terminal area is a fully-transparent area.

优选地,还包括位于步骤S6和S7之间的步骤S61:Preferably, step S61 between steps S6 and S7 is also included:

S61:在步骤S6的基础上对有机绝缘层进行第二次灰化处理,去除超过第一金属层两侧的有机绝缘层,第一金属层形成位于有机绝缘层下方的遮光层。S61 : performing a second ashing treatment on the organic insulating layer on the basis of step S6 , removing the organic insulating layer beyond both sides of the first metal layer, and forming the light shielding layer under the organic insulating layer on the first metal layer.

优选地,步骤S7包括如下步骤:Preferably, step S7 includes the following steps:

S71:在步骤S61的基础上采用化学气相沉积法成膜形成一层缓冲层;S71: On the basis of step S61, chemical vapor deposition is used to form a film to form a buffer layer;

S72:在步骤S71的基础上形成半导体层;S72: forming a semiconductor layer on the basis of step S71;

S73:在步骤S72的基础上依序沉积绝缘材料层和第二金属层并分别对绝缘材料层和第二金属层进行刻蚀形成位于半导体上的栅极绝缘层和位于栅极绝缘层上的栅极;S73: sequentially depositing an insulating material layer and a second metal layer on the basis of step S72, and etching the insulating material layer and the second metal layer respectively to form a gate insulating layer on the semiconductor and a gate insulating layer on the gate insulating layer grid;

S74:在步骤S73的基础上首先沉积一层层间绝缘层,然后对层间绝缘层进行刻蚀形成位于端子区域内且公共电极层上的第二开孔;S74: On the basis of step S73, first deposit an interlayer insulating layer, and then etch the interlayer insulating layer to form a second opening located in the terminal area and on the common electrode layer;

S75:在步骤S74的基础上沉积第三金属层并对第三金属层进行刻蚀形成位于第二开孔内的源极和漏极,其中源极和漏极分别位于半导体的两侧;S75: depositing a third metal layer on the basis of step S74 and etching the third metal layer to form a source electrode and a drain electrode located in the second opening, wherein the source electrode and the drain electrode are located on both sides of the semiconductor respectively;

S76:在步骤S75的基础上沉积第一绝缘层并对第一绝缘层进行刻蚀形成位于漏极上方的第三开孔;S76: on the basis of step S75, depositing a first insulating layer and etching the first insulating layer to form a third opening above the drain;

S77:在步骤S76的基础上采用透明导电材料沉积形成像素电极层,像素电极层通过第三开孔与漏极接触。S77: On the basis of step S76, a transparent conductive material is used to deposit and form a pixel electrode layer, and the pixel electrode layer is in contact with the drain electrode through the third opening.

优选地,步骤S75中,源极与公共电极层接触。Preferably, in step S75, the source electrode is in contact with the common electrode layer.

优选地,步骤S71中,缓冲层包裹在公共电极层、第一金属层、有机绝缘层和开孔外。Preferably, in step S71, the buffer layer is wrapped around the common electrode layer, the first metal layer, the organic insulating layer and the opening.

优选地,步骤S3中,采用无氟铜酸进行第一次刻蚀,采用草酸进行第二次刻蚀。Preferably, in step S3, fluorine-free cupric acid is used for the first etching, and oxalic acid is used for the second etching.

优选地,步骤S5中,采用采用无氟铜酸分别对像素区域和端子区域进行刻蚀。Preferably, in step S5, fluorine-free cupric acid is used to etch the pixel region and the terminal region respectively.

优选地,所述第一金属层的材料为铜或铝或合金材料。Preferably, the material of the first metal layer is copper or aluminum or an alloy material.

本发明液晶显示面板为减掩膜版设计,与现有9道掩膜版工艺相比减少为7道掩膜版,可以节约成本,同时保留TFT器件的电性优势。The liquid crystal display panel of the present invention has a mask-reduced design, and is reduced to 7 masks compared with the existing 9-mask process, which can save costs and at the same time retain the electrical advantages of TFT devices.

附图说明Description of drawings

图1至图13为本发明液晶显示面板的制造步骤的示意图。1 to 13 are schematic diagrams illustrating the manufacturing steps of the liquid crystal display panel of the present invention.

具体实施方式Detailed ways

下面结合附图和具体实施例,进一步阐明本发明,应理解这些实施例仅用于说明本发明而不用于限制本发明的范围,在阅读了本发明之后,本领域技术人员对本发明的各种等价形式的修改均落于本申请所附权利要求所限定的范围。Below in conjunction with the accompanying drawings and specific embodiments, the present invention will be further clarified. It should be understood that these embodiments are only used to illustrate the present invention and not to limit the scope of the present invention. Modifications of equivalent forms all fall within the scope defined by the appended claims of this application.

为使图面简洁,各图中只示意性地表示出了与本发明相关的部分,它们并不代表其作为产品的实际结构。另外,以使图面简洁便于理解,在有些图中具有相同结构或功能的部件,仅示意性地绘示了其中的一个,或仅标出了其中的一个。在本文中,“一个”不仅表示“仅此一个”,也可以表示“多于一个”的情形。In order to keep the drawings concise, the drawings only schematically show the parts related to the present invention, and they do not represent its actual structure as a product. In addition, in order to make the drawings concise and easy to understand, in some drawings, only one of the components having the same structure or function is schematically shown, or only one of them is marked. As used herein, "one" not only means "only one", but also "more than one".

本发明揭示一种液晶显示面板的制造方法,包括如下步骤:The present invention discloses a method for manufacturing a liquid crystal display panel, comprising the following steps:

S1:如图1所示,在基板10上沉积公共电极层20和第一金属层30的叠层结构;S1: As shown in FIG. 1 , depositing a stacked structure of the common electrode layer 20 and the first metal layer 30 on the substrate 10;

其中,公共电极层20采用透明导电材料形成的,第一金属层30的材料为铜或铝等单层金属或多层金属。The common electrode layer 20 is formed of a transparent conductive material, and the material of the first metal layer 30 is a single-layer metal such as copper or aluminum or a multi-layer metal.

S2:如图2所示,首先在步骤S1的基础上沉积一层有机绝缘层40;然后采用半透掩膜版(图未示)对有机绝缘层40进行曝光,半透掩膜版分别在像素区域101和端子区域102的接触孔位置为半透区域,半透掩膜版在像素区域101和端子区域102之间的连接区域103为全透区域,通过半透掩膜版对有机绝缘层40进行曝光形成位于像素区域101内的第一凹槽区域41、位于端子区域102内的第二凹槽区域42以及位于连接区域103内的第一开孔43,第一开孔43位于第一金属层30的上方;S2: As shown in FIG. 2, first, a layer of organic insulating layer 40 is deposited on the basis of step S1; then a semi-transparent mask (not shown) is used to expose the organic insulating layer 40, and the semi-transparent mask is respectively The position of the contact hole between the pixel area 101 and the terminal area 102 is a semi-transparent area, and the connection area 103 between the pixel area 101 and the terminal area 102 of the semi-transparent mask is a fully-transparent area. 40 Perform exposure to form a first groove area 41 in the pixel area 101, a second groove area 42 in the terminal area 102, and a first opening 43 in the connection area 103, and the first opening 43 is located in the first above the metal layer 30;

其中,通过连接区域103使得靠近端子区域101的公共电极层20作为TFT器件的遮光区域,靠近像素区域101的公共电极层20用来提供公共电压,端子区域101的公共电极层20和靠近像素区域101的公共电极层20连接在一起会导致TFT器件的特性异常。The common electrode layer 20 close to the terminal area 101 is used as a light-shielding area of the TFT device through the connection area 103, the common electrode layer 20 close to the pixel area 101 is used to provide a common voltage, and the common electrode layer 20 of the terminal area 101 and the area close to the pixel area are used to provide a common voltage. The connection of the common electrode layers 20 of 101 together may result in abnormal characteristics of the TFT device.

其中,步骤S2为第一道掩膜版工艺。Wherein, step S2 is the first mask process.

S3:如图3(a)所示,首先,在步骤S2的基础上,采用无氟铜酸进行第一次刻蚀并刻蚀掉位于第一开孔43下的第一金属层30;然后采用草酸进行第二次刻蚀并刻蚀掉位于第一开孔43下的公共电极层20,即通过两次刻蚀使得第一开孔43位于基板10上;S3: As shown in FIG. 3(a), first, on the basis of step S2, fluorine-free cupric acid is used for the first etching and the first metal layer 30 located under the first opening 43 is etched away; then Use oxalic acid to perform the second etching and etch away the common electrode layer 20 located under the first opening 43, that is, make the first opening 43 located on the substrate 10 through two etchings;

S4:如图4所示,在步骤S3的基础上对有机绝缘层40进行第一次灰化处理(Ashing),使得去除第一凹槽区域41内的有机绝缘层40和第二凹槽区域42内的有机绝缘层40;S4: As shown in FIG. 4 , on the basis of step S3, perform a first ashing treatment (Ashing) on the organic insulating layer 40, so that the organic insulating layer 40 and the second groove area in the first groove area 41 are removed the organic insulating layer 40 within 42;

S5:如图5所示,在步骤S4的基础上采用无氟铜酸分别对像素区域101和端子区域102进行刻蚀并分别去除像素区域101和端子区域102内的第一金属层30;S5: As shown in FIG. 5, on the basis of step S4, fluorine-free cupric acid is used to etch the pixel area 101 and the terminal area 102 respectively and remove the first metal layer 30 in the pixel area 101 and the terminal area 102 respectively;

S6:在步骤S5的基础上对有机绝缘层40和公共电极层20一同进行烘烤,同时进行有机绝缘层40和公共电极层20进行的结晶化,这样可以节省一次烘烤制程,在有机绝缘层40的保护,有机绝缘层40下的第一金属层30不会被氧化;S6: On the basis of step S5, the organic insulating layer 40 and the common electrode layer 20 are baked together, and the crystallization of the organic insulating layer 40 and the common electrode layer 20 is carried out at the same time, so that a baking process can be saved. For the protection of the layer 40, the first metal layer 30 under the organic insulating layer 40 will not be oxidized;

S7:在步骤S6的基础上,首先形成顶栅结构的TFT器件,然后形成与TFT器件的漏极连接的像素电极。S7: On the basis of step S6, a TFT device with a top-gate structure is formed first, and then a pixel electrode connected to the drain electrode of the TFT device is formed.

通过上述步骤形成本发明液晶显示面板。The liquid crystal display panel of the present invention is formed through the above steps.

其中,液晶显示面板的制造方法,还包括位于步骤S6和S7之间的步骤S61:Wherein, the manufacturing method of the liquid crystal display panel further includes step S61 between steps S6 and S7:

S61:在步骤S6的基础上对有机绝缘层40进行第二次灰化处理(Ashing),去除超过第一金属层30两侧的有机绝缘层40,第一金属层30形成位于有机绝缘层40下方的遮光层31,消除有机绝缘层40的UnderCut(底切);S61: on the basis of step S6, perform a second ashing treatment (Ashing) on the organic insulating layer 40, remove the organic insulating layer 40 beyond the two sides of the first metal layer 30, and form the first metal layer 30 on the organic insulating layer 40. The lower light shielding layer 31 eliminates the UnderCut (undercut) of the organic insulating layer 40;

其中,遮光层31作为半导体60的遮光金属层。The light shielding layer 31 serves as the light shielding metal layer of the semiconductor 60 .

其中,步骤S7包括如下步骤:Wherein, step S7 includes the following steps:

S71:如图7所示,在步骤S61的基础上采用CVD(化学气相沉积法)低速成膜形成一层缓冲层50,缓冲层50的厚度不小于半导体层20和第一金属层30的厚度之和;S71 : as shown in FIG. 7 , on the basis of step S61 , a buffer layer 50 is formed by low-speed CVD (chemical vapor deposition) film formation, and the thickness of the buffer layer 50 is not less than the thickness of the semiconductor layer 20 and the first metal layer 30 Sum;

其中,缓冲层50包裹在公共电极层20、第一金属层30、有机绝缘层40和开孔43外。The buffer layer 50 is wrapped around the common electrode layer 20 , the first metal layer 30 , the organic insulating layer 40 and the opening 43 .

S72:如图8所示,在步骤S71的基础上形成由金属氧化物材料形成的半导体层60;S72: As shown in FIG. 8, on the basis of step S71, a semiconductor layer 60 formed of a metal oxide material is formed;

其中,半导体层60的材料也可以非晶硅、多晶硅等;步骤S72为第二道掩膜版工艺。Wherein, the material of the semiconductor layer 60 can also be amorphous silicon, polycrystalline silicon, etc.; step S72 is the second mask process.

S73:如图9所示,在步骤S72的基础上依序沉积绝缘材料层和第二金属层并分别对绝缘材料层和第二金属层进行刻蚀形成位于半导体60上的栅极绝缘层70和位于栅极绝缘层70上的栅极80;S73 : as shown in FIG. 9 , sequentially depositing an insulating material layer and a second metal layer on the basis of step S72 and etching the insulating material layer and the second metal layer respectively to form a gate insulating layer 70 on the semiconductor 60 and a gate 80 on the gate insulating layer 70;

其中,步骤S73为第三道掩膜版工艺。Wherein, step S73 is the third mask process.

S74:如图10(a)所示,在步骤S73的基础上首先沉积一层层间绝缘层90,如图10(b)所示,然后对层间绝缘层91进行刻蚀形成位于端子区域102内且公共电极层20上的第二开孔91;S74: As shown in FIG. 10(a), on the basis of step S73, an interlayer insulating layer 90 is first deposited, as shown in FIG. 10(b), and then the interlayer insulating layer 91 is etched to form a layer located in the terminal area the second opening 91 in 102 and on the common electrode layer 20;

其中,步骤S74为第四道掩膜版工艺。Wherein, step S74 is the fourth mask process.

S75:如图11所示,在步骤S74的基础上沉积第三金属层并对第三金属层进行刻蚀形成位于第二开孔91内的源极111和漏极112,其中源极111和漏极112分别位于半导体60的两侧;源极111与公共电极层20接触,有助于TFT器件的电性稳定性;S75: As shown in FIG. 11, on the basis of step S74, a third metal layer is deposited and the third metal layer is etched to form a source electrode 111 and a drain electrode 112 located in the second opening 91, wherein the source electrode 111 and the drain electrode 112 are formed. The drain electrodes 112 are respectively located on both sides of the semiconductor 60; the source electrodes 111 are in contact with the common electrode layer 20, which contributes to the electrical stability of the TFT device;

其中,步骤S75为第五道掩膜版工艺。Wherein, step S75 is the fifth mask process.

S76:如图12所示,在步骤S75的基础上沉积第一绝缘层120并对第一绝缘层120进行刻蚀形成位于漏极112上方的第三开孔121;S76 : as shown in FIG. 12 , on the basis of step S75 , depositing a first insulating layer 120 and etching the first insulating layer 120 to form a third opening 121 located above the drain electrode 112 ;

其中,步骤S76为第六道掩膜版工艺。Wherein, step S76 is the sixth mask process.

S77:如图13所示,在步骤S76的基础上采用透明导电材料沉积形成像素电极层130,像素电极层130通过第三开孔121与漏极112接触。S77 : as shown in FIG. 13 , on the basis of step S76 , a transparent conductive material is used to deposit and form the pixel electrode layer 130 , and the pixel electrode layer 130 is in contact with the drain electrode 112 through the third opening 121 .

其中,步骤S77为第七道掩膜版工艺。Wherein, step S77 is the seventh mask process.

本发明从底层到顶层依序形成公共电极层20、遮光层31、有机绝缘层40、半导体层60、栅极绝缘层70、栅极80、层间绝缘层90、源极111和漏极112、第一绝缘层120和像素电极层130。The present invention sequentially forms the common electrode layer 20 , the light shielding layer 31 , the organic insulating layer 40 , the semiconductor layer 60 , the gate insulating layer 70 , the gate electrode 80 , the interlayer insulating layer 90 , the source electrode 111 and the drain electrode 112 from the bottom layer to the top layer. , the first insulating layer 120 and the pixel electrode layer 130 .

公共电极层20和遮光层31采用连续成膜的方式形成,然后采用半透掩膜版(图未示)对有机绝缘层40进行曝光、刻蚀和剥离后,像素区域101外为公共电极层20和遮光层31的双层结构,像素区域101内为公共电极层20的单层结构。The common electrode layer 20 and the light shielding layer 31 are formed by continuous film formation, and then the organic insulating layer 40 is exposed, etched and peeled off by using a semi-transparent mask (not shown in the figure), and the common electrode layer is outside the pixel area 101 20 and the light-shielding layer 31 have a double-layer structure, and the pixel region 101 has a single-layer structure of the common electrode layer 20 .

本发明采用有机绝缘层40对遮光层31的金属进行保护,在去掉像素区域101内的第一金属层30后,有机绝缘层40和公共电极层40同时进行烘烤,使得机绝缘层40和公共电极层40同时进行结晶化,以此保护有机绝缘层40下方的遮光层31,避免遮光层31在烘烤时产生氧化,同时能保证像素区域101的公共电极层40结晶后有良好的透光率和电阻率。In the present invention, the organic insulating layer 40 is used to protect the metal of the light shielding layer 31. After removing the first metal layer 30 in the pixel area 101, the organic insulating layer 40 and the common electrode layer 40 are baked at the same time, so that the organic insulating layer 40 and the common electrode layer 40 are baked at the same time. The common electrode layer 40 is simultaneously crystallized, so as to protect the light shielding layer 31 under the organic insulating layer 40, avoid oxidation of the light shielding layer 31 during baking, and ensure that the common electrode layer 40 of the pixel region 101 has good transparency after crystallization. light rate and resistivity.

本发明源极与公共电极层接触,有助于TFT器件的电性稳定性。The source electrode of the present invention is in contact with the common electrode layer, which contributes to the electrical stability of the TFT device.

本发明液晶显示面板为减掩膜版设计,与现有9道掩膜版工艺相比减少为7道掩膜版,可以节约成本,同时保留TFT器件的电性优势。The liquid crystal display panel of the present invention has a mask-reduced design, and is reduced to 7 masks compared with the existing 9-mask process, which can save costs and at the same time retain the electrical advantages of TFT devices.

以上详细描述了本发明的优选实施方式,但是本发明并不限于上述实施方式中的具体细节,在本发明的技术构思范围内,可以对本发明的技术方案进行多种等同变换(如数量、形状、位置等),这些等同变换均属于本发明的保护范围。The preferred embodiments of the present invention are described in detail above, but the present invention is not limited to the specific details of the above-mentioned embodiments. Within the scope of the technical concept of the present invention, various equivalent transformations (such as quantity, shape, etc.) can be performed on the technical solutions of the present invention. , position, etc.), these equivalent transformations all belong to the protection scope of the present invention.

Claims (9)

1.一种液晶显示面板的制造方法,其特征在于,包括如下步骤:1. A method for manufacturing a liquid crystal display panel, comprising the steps of: S1:在基板上依序沉积公共电极层和第一金属层的叠层结构;S1: sequentially depositing a stack structure of a common electrode layer and a first metal layer on the substrate; S2:首先在步骤S1的基础上沉积一层有机绝缘层;然后采用半透掩膜版对有机绝缘层进行曝光并形成位于像素区域内的第一凹槽区域、位于端子区域的接触孔位置内的第二凹槽区域以及位于像素区域和端子区域之间的连接区域内的第一开孔;S2: First, deposit an organic insulating layer on the basis of step S1; then use a semi-transparent mask to expose the organic insulating layer to form a first groove area in the pixel area and a contact hole in the terminal area. the second groove area and the first opening in the connection area between the pixel area and the terminal area; S3:首先,在步骤S2的基础上,进行第一次刻蚀并刻蚀掉位于第一开孔下的第一金属层;然后进行第二次刻蚀并刻蚀掉位于第一开孔下的公共电极层;S3: First, on the basis of step S2, perform the first etching and etch away the first metal layer under the first opening; then perform the second etching and etch away the first metal layer under the first opening the common electrode layer; S4:在步骤S3的基础上对有机绝缘层进行第一次灰化处理,使得去除第一凹槽区域内的有机绝缘层和第二凹槽区域内的有机绝缘层;S4: performing a first ashing treatment on the organic insulating layer on the basis of step S3, so that the organic insulating layer in the first groove region and the organic insulating layer in the second groove region are removed; S5:在步骤S4的基础上分别对像素区域和端子区域进行刻蚀并分别去除像素区域和端子区域内的第一金属层;S5: on the basis of step S4, the pixel area and the terminal area are respectively etched, and the first metal layer in the pixel area and the terminal area are respectively removed; S6:在步骤S5的基础上对有机绝缘层和公共电极层一同进行烘烤,同时进行有机绝缘层和公共电极层进行的结晶化;S6: on the basis of step S5, the organic insulating layer and the common electrode layer are baked together, and the crystallization of the organic insulating layer and the common electrode layer is performed simultaneously; S7:在步骤S5的基础上,首先形成顶栅结构的TFT器件,然后形成与TFT器件的漏极连接的像素电极。S7: On the basis of step S5, a TFT device with a top gate structure is formed first, and then a pixel electrode connected to the drain electrode of the TFT device is formed. 2.根据权利要求1所述的液晶显示面板,其特征在于:所述步骤S2中,半透掩膜版分别在像素区域和端子区域为半透区域,半透掩膜版在像素区域和端子区域之间的连接区域为全透区域。2 . The liquid crystal display panel according to claim 1 , wherein in the step S2 , the semi-transparent mask is respectively a semi-transparent area in the pixel area and the terminal area, and the semi-transparent mask is in the pixel area and the terminal area. 3 . The connection area between the areas is a fully transparent area. 3.根据权利要求1所述的液晶显示面板,其特征在于:还包括位于步骤S6和S7之间的步骤S61:3. The liquid crystal display panel according to claim 1, further comprising a step S61 between steps S6 and S7: S61:在步骤S6的基础上对有机绝缘层进行第二次灰化处理,去除超过第一金属层两侧的有机绝缘层,第一金属层形成位于有机绝缘层下方的遮光层。S61 : performing a second ashing treatment on the organic insulating layer on the basis of step S6 , removing the organic insulating layer beyond both sides of the first metal layer, and forming the light shielding layer under the organic insulating layer on the first metal layer. 4.根据权利要求3所述的液晶显示面板,其特征在于:步骤S7包括如下步骤:4. The liquid crystal display panel according to claim 3, wherein step S7 comprises the following steps: S71:在步骤S61的基础上采用化学气相沉积法成膜形成一层缓冲层;S71: On the basis of step S61, chemical vapor deposition is used to form a film to form a buffer layer; S72:在步骤S71的基础上形成半导体层;S72: forming a semiconductor layer on the basis of step S71; S73:在步骤S72的基础上依序沉积绝缘材料层和第二金属层并分别对绝缘材料层和第二金属层进行刻蚀形成位于半导体上的栅极绝缘层和位于栅极绝缘层上的栅极;S73: sequentially depositing an insulating material layer and a second metal layer on the basis of step S72, and etching the insulating material layer and the second metal layer respectively to form a gate insulating layer on the semiconductor and a gate insulating layer on the gate insulating layer grid; S74:在步骤S73的基础上首先沉积一层层间绝缘层,然后对层间绝缘层进行刻蚀形成位于端子区域内且公共电极层上的第二开孔;S74: On the basis of step S73, first deposit an interlayer insulating layer, and then etch the interlayer insulating layer to form a second opening located in the terminal area and on the common electrode layer; S75:在步骤S74的基础上沉积第三金属层并对第三金属层进行刻蚀形成位于第二开孔内的源极和漏极,其中源极和漏极分别位于半导体的两侧;S75: depositing a third metal layer on the basis of step S74 and etching the third metal layer to form a source electrode and a drain electrode located in the second opening, wherein the source electrode and the drain electrode are located on both sides of the semiconductor respectively; S76:在步骤S75的基础上沉积第一绝缘层并对第一绝缘层进行刻蚀形成位于漏极上方的第三开孔;S76: on the basis of step S75, depositing a first insulating layer and etching the first insulating layer to form a third opening above the drain; S77:在步骤S76的基础上采用透明导电材料沉积形成像素电极层,像素电极层通过第三开孔与漏极接触。S77: On the basis of step S76, a transparent conductive material is used to deposit and form a pixel electrode layer, and the pixel electrode layer is in contact with the drain electrode through the third opening. 5.根据权利要求4所述的液晶显示面板,其特征在于:步骤S75中,源极与公共电极层接触。5 . The liquid crystal display panel of claim 4 , wherein in step S75 , the source electrode is in contact with the common electrode layer. 6 . 6.根据权利要求4所述的液晶显示面板,其特征在于:步骤S71中,缓冲层包裹在公共电极层、第一金属层、有机绝缘层和开孔外。6 . The liquid crystal display panel according to claim 4 , wherein in step S71 , the buffer layer is wrapped around the common electrode layer, the first metal layer, the organic insulating layer and the opening. 7 . 7.根据权利要求4所述的液晶显示面板,其特征在于:步骤S3中,采用无氟铜酸进行第一次刻蚀,采用草酸进行第二次刻蚀。7 . The liquid crystal display panel according to claim 4 , wherein in step S3 , fluorine-free cupric acid is used for the first etching, and oxalic acid is used for the second etching. 8 . 8.根据权利要求4所述的液晶显示面板,其特征在于:步骤S5中,采用采用无氟铜酸分别对像素区域和端子区域进行刻蚀。8 . The liquid crystal display panel according to claim 4 , wherein in step S5 , fluorine-free cupric acid is used to etch the pixel region and the terminal region respectively. 9 . 9.根据权利要求1所述的液晶显示面板,其特征在于:所述第一金属层的材料为铜或铝或合金材料。9 . The liquid crystal display panel according to claim 1 , wherein the material of the first metal layer is copper or aluminum or an alloy material. 10 .
CN201910911010.3A 2019-09-25 2019-09-25 A method of manufacturing a liquid crystal display panel Pending CN110690168A (en)

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