CN1043393A - Dielectric loss measurer by optical fibre and microcomputer - Google Patents
Dielectric loss measurer by optical fibre and microcomputer Download PDFInfo
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- CN1043393A CN1043393A CN 89100046 CN89100046A CN1043393A CN 1043393 A CN1043393 A CN 1043393A CN 89100046 CN89100046 CN 89100046 CN 89100046 A CN89100046 A CN 89100046A CN 1043393 A CN1043393 A CN 1043393A
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- 239000013307 optical fiber Substances 0.000 title claims description 13
- 238000005259 measurement Methods 0.000 claims abstract description 17
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Abstract
The present invention is an incorporate dielectric loss tester of being handled the line data processing of going forward side by side by microcomputer 6.Its inside is mainly by standard and measured signal input sampling circuit 1, and standard and measured signal passage 2,3, optical mode are intended transmission system 4, signal combination circuit 5, microcomputer 6, medium decreases and compositions such as capacitance display 7,8 and power-supply system, booster system.Have advantages such as easy to use, simple to operate, that precision is high, anti-electromagnetic interference capability is strong, measurement range is wide.
Description
The present invention is a kind of instrument that electrical equipment (test specimen) dielectric loss is measured of being used for, and also is a kind of instrument that can directly measure capacitance simultaneously.
For the factory inspection of high voltage electric equipment and the preventive trial of operational outfit etc., the medium that normally adopts bridge method to measure insulation of electrical installation decreases the angle at present, and instrument commonly used has QS
1Type (or M
-16 types) Schering bridge, QS
10Type (or QS
3Type, P
525Type) Schering bridge.In the metering circuit, can comprise: test specimen CX, test step-up transformer, standard capacitor and electric bridge.The medium of measuring test specimen CX with the balanced bridge method principle decreases angle or electric capacity.According to another be published in the country invention of Soviet Union council of ministers on July 25th, 1973 and find the NO31 of council communique, certificate of invention is that NO266286 is described; Its difference of measuring the method for capacitance type sensor characteristic is, when tested medium exists the situation of the polarization of several types and penetrability conduction, can determine polarization and loss respectively, its principle is, after the stepped change of survey frequency, and the also stepped variation of the electric capacity of tested module, as tested module is electric capacity product, after frequency shift, need to reach balance with the mould value that is compared again, and will measure new frequency values.Then, under this frequency values of measuring, the polarization of each type is measured,, utilized the relation of being convenient to calculate to try to achieve unknown characteristic according to the data that obtain.
Utilize electric bridge or above-mentioned frequency variation method measuring media decrease the angle and or capacitance value, exist the operation more complicated, use shortcomings such as inconvenient, that precision is low, the anti-electromagnetic field interference performance is low, and range is narrow.
Task of the present invention is that the Insulation Test for electrical equipment provides a kind of precision height, photoconduction microcomputer type dielectric simple to operate, easy to use to decrease analyzer.
The present invention has left normally used principle of balance bridge fully, is that mode with direct measurement electrical angle realizes measurement that medium is decreased.Measuring principle of the present invention is seen Figure 10, shown in Figure 11.When the loop applies alternating voltage U
HThe time, voltage U
RDLLeading voltage U
HAbout 90 ° of (standard capacitance C
NLCapacitive reactance X
CnL〉=resistance R
DL, all intrinsic micro-phase shift errors can be disposed by the microprocessor in this analyzer), so as long as measure voltage V
RDLElectric current I with the test specimen CX that flows through
XBetween phase differential just can calculate medium damage value tg.Measure electric current I simultaneously
XWith electric current I
nRatio also just can calculate the capacitance of test specimen.According to this principle, the present invention is mainly by a standard signal and measured signal input sampling circuit, and a standard channel signal, a measured signal passage, an optical mode plan transmission system, a signal combination circuit, a microprocessor, a medium damage display, a step-up transformer, a high-voltage power supply control circuit, a working power, a high-frequency isolation power supply or a capacitance display or a low-temperature heater are formed.Wherein: standard signal and measured signal input sampling circuit can be made up of some standard signal sample resistances and some measured signal sample resistances, select with the amplitude of the two kinds of signals of opposing; Standard channel signal can be identical with the measured signal channel circuit, each can mainly be followed the tracks of the combined type voltage comparator by a voltage follower, a switch, a low-pass filter, an amplitude comparator and a drift and form, be used for standard signal or measured signal are carried out filtering, amplify and shaping; Optical mode is intended transmission system, can form by a switch, CD-ROM driver, four voltage followers, inverting amplifier, voltage comparator, amplifier, two laser or light emitting diode, two photo-detectors, two optical fiber, make it be used for the on high-tension side current signal of analog transmission test specimen and when the opposition method measuring media is decreased, the low-pressure section and the high-pressure section of this analyzer inside played buffer action; Signal combination circuit can be made up of two d type flip flops, three phase inverters, two rejection gates, a Sheffer stroke gate, is used for the phase differential between examination criteria signal and the measured signal; High-voltage control circuit can be made up of seven rejection gates, two voltage comparators, three controllable silicons, a power transformer, a rectifier, two relays, is used to control high-voltage power supply automatic switching and overcurrent protection; Microprocessor, can be mainly (((Z80A～CTC) and 12K read-only memory, 2K reading writing memory and corresponding integrated package are formed, and it act as handles and data processing automatically to this analyzer for Z80A～PIO), four block count timers for Z80A～CPU), four parallel input and output integrated packages by microprocessor; Display can be used to show that the medium that records decreases data and electric capacity for the light-emitting nixie tube (LED) of storage with lock; Working power can be general civil power step-down, integrated stable voltage circuit, so that the low-voltage supply of this instrument and microprocessor to be provided; Low-temperature heater can be a resistance-type, is used for heating when environment temperature is low, is convenient to this instrument operate as normal; The high-frequency isolation power supply can be general custom circuit, isolation＞10KV, and about 15 kilocycles of oscillation frequency are used for that the high-pressure side electronic loop of test specimen provided working power when this instrument was in opposition method and measures.
The present invention, when test specimen being carried out the opposition method measurement, the high voltage side current of test specimen can be passed through optical fiber to the measured signal channel transfer that is in low-pressure side, also energy self-correcting in the mode of light.In standard and measured signal passage,, make shaping circuit have very high sensitivity again owing to adopted drift combined type comparer.Again owing to adopted the microprocessor manipulation, so have advantages such as easy to use, simple to operate, that precision is high, the anti-electromagnetic field interference performance is strong, measurement range is wide, generally use, be specially adapted to a large amount of site test of electric system without any need for annex and auxiliary connection.
Accompanying drawing 1 is way circuit schematic diagram of the present invention.Shown in the figure: 1, standard signal and measured signal input sampling circuit, 2, standard channel signal, 3, the measured signal passage, 4, optical mode is intended transmission system, 5, signal combination circuit, 6, microprocessor, 7, the capacitance display, 8, medium decreases display, 9, high-voltage power supply control circuit, 10, working power, 11, low-temperature heater, 12, high-frequency isolation power supply, 13, line voltmeter TH, step-up transformer CX, test specimen (external)
Fig. 2 is standard signal and measured signal sample circuit 1 circuit diagram.Shown in the figure: R
1～R
10With R
22～R
24Be measured signal sampling resistor, R
11～R
18Be standard signal sampling resistor, R
H, R
19～R
21Be divider resistance
Fig. 3, Fig. 4 are the circuit diagram of standard channel signal 2, measured signal passage 3.Shown in the figure: 21, voltage follower, 22,24,25,31,32,34,35, switch (being subjected to microcomputer 6 controls), 23,33, low-pass filter, 26,36, comparer, 27,29,37,39, amplifier, 28,38, high speed voltage comparator A
1, A
2, drift combined type comparer (frame of broken lines in)
Fig. 5 is the circuit diagram of optical mode plan transmission system 4.Shown in the figure: 41, switch (be subjected to microcomputer 6 control), 42, CD-ROM driver, 4A
0, 4A
1, 4A
3, 4A
5, voltage follower, 4A
2, inverting amplifier, 4A
4, voltage comparator, 4A
6, amplifier SSJAF, SSJBF, laser instrument or light emitting diode SSJAS, SSJBS, photo-detector L
1, L
2, optical fiber
Fig. 6 is the high-voltage power supply control circuit.Shown in the figure: 90,92,93,94,95,98,99, rejection gate, 91,97, voltage comparator, 96, Sheffer stroke gate, 9G
0, the light lotus root closes controllable silicon, 9G
1, 9G
2, bidirectional triode thyristor, 9CT, current transformer, 9ZL
1, bridge rectifier, 9D
1, the overcurrent pilot lamp, 9J
1, 9J
2, 9J
3, relay, 9R
0, current-limiting resistance, 9R
9, pull-up resistor, 9R
11, sample resistance
Fig. 7 is signal combination circuit.Shown in the figure: 51,52, d type flip flop, 53,54,57, phase inverter, 55,56, rejection gate, 58, with door
Fig. 8, Fig. 9 are this dielectric loss measurer by optical fibre and microcomputer outside drawing.Shown in the figure: K
0, voltage-selected switch, K
1, measurement project and standard capacitance current amplitude selector switch, K
2, tested current amplitude selector switch, K
3, anti-interference Test Switchboard, K
4, battery main switch (220V), K
5, high-voltage switch gear, K
6, heater button, K
7, live testing input voltage amplitude selector switch, D, well heater pilot lamp, D
1, D
2, live testing voltage signal lead-in clamp, V, input voltage monitoring form (220V), 7, dielectric loss display capacitance amount display,
, the working power fuse,
, the high-voltage power supply fuse,
, the heater power source fuse, AN, start button, 14,220 volts of AC Power supply socket, 9D
1, overcurrent protection actuating signal lamp CX(L), the low pressure end CX(H of external test specimen), the high-pressure side Cnw of external test specimen, external standard capacitor end
All identical shown in the circuit among this Fig. 8, Fig. 9 in all electric components and above-mentioned Fig. 1～7.
Figure 10 and Figure 11 are the measuring principle figure and the polar plot of this analyzer.Shown in the figure: R
H, high-pressure side standard signal sample resistance R
n, the standard high-voltage resistance R
2, sample resistance A
L, voltage follower C
NL, standard capacitance
, the low value measuring resistance
Below do the embodiment explanation according to accompanying drawing
The control of the whole high-voltage power supply in this analyzer is the (see figure 6) of being handled through high-voltage power supply control circuit 9 by microcomputer 6.Terminal C in the circuit 9
1, C
2Signal from working power 10(with seeing Fig. 1).Diode 9D
1, 9D
2Constitute all-wave center tap formula rectification circuit, the pulse signal of its output is added on the positive input terminal of voltage comparator 91, by resistance 9R
1, 9R
2The micro-DC potential that the voltage divider of forming is got is added on the negative input end of voltage comparator 91, so the output of comparer 91 only just becomes electronegative potential in AC signal zero crossing moment.If this moment, microcomputer 6 made P
1End is electronegative potential, and then the trigger action of rejection gate 92,93,95 compositions, Sheffer stroke gate 96 outputs become electronegative potential, optically-coupled controllable silicon 9G
OOpen (9R
12Be current-limiting resistance), bidirectional triode thyristor 9G
1Conducting, make the primary side m of step-up transformer TH
1, h
1Charged, high-voltage power supply is open-minded.In order to overcome bidirectional triode thyristor 9G
1The distortion that causes, relay 9J
2Contact analyzer enter proofread and correct and measuring phases before closure, with bidirectional triode thyristor 9G
1Short circuit (contact during the cutoff high power supply, 9J
2Disconnect earlier).Relay 9J
2Manipulation by rejection gate 98,99, triode 9BG
2, current-limiting resistance 9R
8, midget relay 9J
1Carry out in the loop that constitutes, and this loop is subjected to microcomputer 6 output terminal P
3Control.When step-up transformer TH overcurrent, the signal of current transformer 9CT output strengthens, through the whole device 9ZL of bridge-type
1The signal of rectification output also strengthens, when this signal potential surpasses by resistance 9R
5, 9R
6During current potential that voltage divider is got, comparer 97 has positive signal output, one-way SCR 9G
2Triggered and conducting overcurrent pilot lamp 9D
1Bright.Simultaneously, rejection gate 98 outputs become noble potential.Relay 9J
2Outage, rejection gate 94 output potential step-downs, optically-coupled controllable silicon 9G
0Close, whole high-voltage power supply is cut off.9R
4Be the over-current adjusting potentiometer.
This analyzer can carry out positive connection measurement, opposition method measurement, live testing, executes the high-tension electricity test outward, anti-interference method is measured.
Working condition was as follows when positive connection was measured:
This analyzer uses preceding with voltage-selected switch K
0With the test specimen electric current I
XSelector switch K
2Be taken at the appropriate location, functional switch K
1Put in a position (see figure 8).This moment microcomputer 6 can to discern what will carry out be that positive connection is measured.When pressing complete machine start button AN, this analyzer enters measuring phases.By the standard signal sampling resistor R in standard signal and the measured signal input sampling circuit 1
15～R
18The standard sampling voltage of coming
, through contact n
2Deliver to standard channel signal 2(Fig. 3) in voltage follower 21, again through standard capacitor ZC
3, low value measuring resistance 2R
7After the phase shift, export a signal U who is directly proportional with high pressure and on phase place, is ahead of 90 ° of high pressure
RDL, again through switch 22, low-pass filter 23 outputs.Wherein one the road to comparer 26 and by resistance 2R
5, 2R
6The voltage divider of forming compares, and exports the symmetry square wave relevant with input signal amplitude.This square wave is through contact n
7Send microcomputer 6 to handle, differentiate the size of input quantity.Another road is through coupling capacitance 2C
1, resistance 2R
1Deliver to drift tracking mode combination voltage comparer A
1Carry out shaping, the symmetrical square wave signal behind the full line is through contact n
4Feed signals combinational circuit 5.Cross test specimen C
XElectric current I
XMeasured signal sampling resistor R in standard signal and measured signal input sampling circuit 1
6～R
10(by K switch
26Select) generation one and electric current I
XRelevant voltage U
XL(see figure 2), this signal is through contact n
2Deliver in the measured signal passage 3.Measured signal passage 3 is the same substantially with above-mentioned standard channel signal 2 circuit and effect, and the signal of importing is carried out filtering and shaping.The signal one tunnel of same output is through contact X
7Export a symmetry and electric current I
xRelevant square wave send microprocessor 6, and another road is through drift combined tracking voltage comparator A
2Square-wave signal is by contact X after the shaping
4Feed signals combinational circuit 5.Combination voltage comparer A is followed the tracks of in drift
1With A
2Identical.Now with combination voltage comparer A
2For example illustrates its course of work: be subjected to microprocessor 6 before complete machine starts by contact X
4The switch 34 of control in the b position, switch 36 is in a position, because resistance 3R
2Effect, amplifier 37 input end no signals inputs, the positive input of its output terminal and high speed voltage comparator 38 is idiostatic.Establish comparer 38 this moment, and to be output as noble potential be whole A
2), electric capacity 3C
2Through resistance 3R
3Charging, voltage follower 39 output potentials progressively rise, and when this current potential was higher than the current potential of amplifier 37 outputs, it (was A that comparer 38 outputs transfer electronegative potential to
2Output).Electric capacity 3C
2Enter discharge (or reverse charging state, amplifier 39 output potentials progressively descend, when this voltage dropped to the current potential that is lower than amplifier 37 outputs, it (was A that the output of comparer 38 transfers noble potential again to
2Output).Combination voltage comparer A is followed the tracks of in so circulation, voltage drift
2Output one vibration square wave.After instrument started, switch 34 switched to a position, and switch 35 switches to the b position, because resistance 3R
4Resistance is very big, and the time of whole measuring process is very short, electric capacity 3C
2Terminal voltage can think constant.Like this, can make combination voltage comparer A
2Be in sensitive state in measuring phases always.
The effect of signal combination circuit 5 is that the symmetrical square wave signal that above-mentioned two passages 2,3 are sent here is carried out the phase bit comparison, detects the asymmetrical square wave signal relevant with phase differential and send microprocessor 6 to carry out dielectric loss tg
oCalculate.Its entire work process is seen Fig. 6: the power frequency square-wave pulse signal that standard channel signal 2 and measured signal passage 3 are sent here is respectively by contact n
4And X
4Be input to signal combination circuit 5, behind d type flip flop 51 and 52, one times of pulse width broadening.Standard signal outputs to microprocessor 6 by contact t behind reverser 53, be used to monitor the period T of power frequency supply at that time.When d type flip flop 51 outputs become zero, just (open the door) with door 58 output changes.And it is closed the door and must possess two conditions; One, standard signal has sent enabling nulse.Two, trigger 52 output terminals (Q or Q) have upward transition.This purpose is by reverser 54 and 57, rejection gate 55 and 56, differentiating circuit C
51With R
51Or C
52With R
52, d type flip flop 52 realizes.When d type flip flop 52 output terminals (Q or Q) any point change timing, reverser 57 outputs become zero.At this moment, close with door 58.As long as microprocessor 6 is by contact t
xMeasure open hour T with door 58
xWith the period T of power frequency supply at that time, can obtain the phase differential of measured signal electric current and standard signal electric current, thereby try to achieve medium damage value tg
σ
tg
σ＝tg（ (Tx)/(T) ·2π）
Whole measuring process, this analyzer divided for two steps carried out.The first step is a correcting measuring, and switch 32 switches to the b position, and measured signal passage 3 is by contact X
3Introduce a signal identical and carry out the measurement first time, and result's (this value is that 2, the 3 intrinsic phase shifts of two passages are poor) is passed through contact X with standard channel signal 2 receptions
7Deposit microcomputer 6 in.Second step is by contact X
2To introduce (switch 31 switches to the b end, switch 32 switches to a end) from the measured signal of sample circuit 1 and carry out the measurement second time.And measurement result deducted measurement result for the first time, be about to test specimen C
XThe active loss angle send after microcomputer 6 computings with tg
σForm is decreased display 7 at medium and is shown.Simultaneously capacitance power transmission capacity display 8 is shown.
Opposition method is measured, and working condition is as follows:
Before this analyzer uses, voltage-selected switch K
0, electric current I
XSelector switch K
2Place the appropriate location.Functional switch K
1Place the b position.When pressing complete machine start button AN, this analyzer promptly enters the opposition method process of measurement.At this moment; Standard channel signal 2 and input circuit duty thereof are identical with positive connection.But tested standard signal is from test specimen C
XHigh-pressure side H, switch 31,32 be in a position all the time.High-pressure side H standard signal sample resistance (R in the sample circuit 1
11～R
14, by K switch
0B determines the working position) the standard sampling voltage U that obtains
RHThrough contact F
2Delivering to optical mode intends transmission system 4(and sees Fig. 5) voltage follower 4A
0, again via standard capacitance 4C
1With low value measuring resistance 4R
1B who becomes the signal at 90 ° of phasing degree to deliver to switch 41 approximately with high tension voltage of the phase-shift circuit output of forming holds.Test specimen C
XThe flow through resistance R of high voltage side current in sample circuit 1
1～R
5(by K switch
2A selects) back produce one with by test specimen C
XElectric current I
XThe voltage U that is directly proportional
XH, through contact F
1Deliver to a end of switch 41.Whole measuring process is also carried out in two steps.The switch of intending in the transmission system 4 at the calibration phase optical mode 41 switches to b end, voltage follower 4A
1Input and the complete similar high-pressure side standard signal of low-pressure side, it is exported via inverting amplifier 4A
2, voltage follower 4A
3, triode 4BG
1, resistance 4R
4The analog modulator and light source (laser instrument or light emitting diode) SSJF, the optical fiber L that form
1Deliver to be in low-pressure side photo-detector SSJAS(here, resistance 4R
8Be pull-up resistor).The electric signal of detector SSTAS output is through voltage follower 4A
5, capacitance 4C
2, resistance 4R
9, amplifier 4A
6From contact F
4Deliver to a end of the switch 31 in the measured signal passage 3, in this passage 3, carry out correcting measuring.Trimming process is identical with above-mentioned positive connection.In measuring phases, the switch 41 that microcomputer 6 is handled switches to a position, and measured signal is introduced, and carries out the second pacing amount, and data processing is also identical with positive connection.The process of microcomputer 6 control switchs 41 is that the operational order that microcomputer 6 sends is by contact F
3Through CD-ROM driver 42, current-limiting resistance 4R
12, light source (laser instrument or light emitting diode) SSJBF, optical fiber L
2Pass to and be on high-tension side photo-detector SSJBS(4R
5Be pull-up resistor).Then, signal is through comparer 4A
4With resistance 4R
6, 4R
7The voltage that the voltage divider of forming is got compares, as resistance 4R
5On voltage greater than 4R
6On voltage the time, comparer 4A
4Upset, thus reach the purpose of controlling switch 41.
Situation is as follows during live testing:
Before the formal use of this analyzer, voltage-selected switch K
7And I
XSelector switch K
2Be placed on the appropriate location.K
1Be placed on the C position, it is the live testing mode that microcomputer 6 can be judged what will carry out.Standard signal is from outside and test specimen C
XThe low pressure winding of voltage transformer (VT) that is in same bus is (by contact D
2, D
1Introduce).Work as K switch
7When opening, input voltage is 100V ± 20%.Work as K
7When closed, resistance R
21By short circuit, this moment, input voltage was 57V ± 20%.Resistance R
19, R
20, R
21Constitute voltage divider, it is exported through contact n
2Be passed to standard channel signal 2.The import pathway of measured signal and complete machine are proofreaied and correct and are finished identical with above-mentioned positive connection measurement situation.
Situation is as follows when executing high-tension measurement outward:
Carry out the outer high-tension measurement of executing, positive connection that can the analog AC high-tension bridge.The high-tension electricity of executing is produced by external unit.Use a high voltage standard capacitor and test specimen C simultaneously
XParallel connection, measured signal approach and above-mentioned positive connection are identical.But standard signal is the capacitance current that external standard capacitor low pressure end extracts, by C
NWThe end input.Before this analyzer uses, I
XSelector switch K
2With standard capacitance current selected switch K
1Be placed on appropriate location (d or e or f position).Resistance R
22～R
24Be sample resistance, its terminal voltage V
CNW(see figure 2) is proportional to the electric current of the external standard capacitor of flowing through, and this voltage is through contact n
3Introduce standard channel signal 2 from the b end of switch 22.Other measuring processes etc. are identical with above-mentioned positive connection.
Situation was as follows when anti-interference method was tested:
This analyzer is when carrying out anti-interference test, and this function is to test specimen C with internal high pressure source TH
XCarrying out positive and negative connection measures.Measuring principle is identical during with positive and negative connection.As anti-interference Test Switchboard K
3During connection, this analyzer is carried out by anti-external electric field conflicting mode.At this moment each measures once (the promptly common used anti-interference method of paraphase) to this analyzer under positive and negative two kinds of polarity situations of power supply, and two secondary data are handled, and demonstrates medium damage value and the electric capacity that records respectively by display 7,8 at last.The whole process of the implementation of anti-interference mode by in the high-voltage power supply control circuit 9 by relay 9J
0, 9J
3, rejection gate 90, triode 9BG
0Carry out, and pass through contact P by microcomputer 6
2Handle.
Claims (7)
1, a kind of dielectric loss measurer by optical fibre and microcomputer that is provided with step-up transformer TH that is used for the electric insulation test is characterized in that comprising:
Standard signal and measured signal input sampling circuit 1 are used for the amplitude of choice criteria current signal and the amplitude of tested current signal,
A standard channel signal 2 is used for filtering, amplification and shaping to standard signal,
A measured signal passage 3 is used for filtering, amplification and shaping to measured signal,
An optical mode is intended transmission system 4, can analog transmission test specimen C
XOn high-tension side current signal can be when the opposition method measuring media be decreased, and the low-pressure section and the high-pressure section of this analyzer inside played buffer action,
A signal combination circuit 5 is used for the phase differential between examination criteria signal and the measured signal,
A microprocessor 6 can be handled automatically this analyzer, the data that record are carried out computing and processing, can eliminate because of power supply and frequency jitter, external electric field is disturbed, temperature causes measuring error,
A medium decreases display 8, is used to show that the medium that records decreases data,
A high-voltage power supply control circuit 9 is used to control high-voltage power supply automatic switching and overcurrent protection,
A working power 10 can provide whole instrument to comprise the low-voltage supply of microprocessor 6,
A high-frequency isolation power supply 12, test specimen C in the time of being in the opposition method measurement for this instrument
XOn high-tension side electronic loop provides working power,
Or comprise and can the electric capacity that record be shown a capacitance display 7,
Or comprise a low-temperature heater 11, can when environment temperature is low, heat this analyzer.
2, dielectric loss measurer by optical fibre and microcomputer according to claim 1, it is characterized in that said standard channel signal 2 is identical with the circuit of measured signal passage 3, respectively comprise: voltage follower 21(or switch 22(32), a low-pass filter 23(33), amplitude comparator 26(36) and drift follow the tracks of combined type voltage comparator A
1(A
2), wherein combined type voltage comparator A is followed the tracks of in drift
1Or A
2Respectively comprise: two switch 24(34), 25(35) and a comparer 28(38) and two amplifier 27(37), 29(39).
3, photoconduction microcomputer type dielectric loss analyzer according to claim 1 and 2 is characterized in that said optical mode plan transmission system 4 comprises: 42, four voltage follower 4A of 41, one CD-ROM driver of a switch
0, 4A
1, 4A
3, 4A
5, an inverting amplifier 4A
2, a voltage comparator 4A
4, an amplifier 4A
6, two laser instruments or light emitting diode SSJBF, SSJBF, two photo-detector SSJAS, SSJBS, two optical fiber L
1, L
2
4, photoconduction microcomputer type dielectric loss analyzer according to claim 1 and 2 is characterized in that said signal combination circuit 5, comprising: 55,56, one Sheffer stroke gates 58 of 53,54,57, two rejection gates of 51,52, three phase inverters of two d type flip flops.
5, photoconduction microcomputer type medium according to claim 3 decreases analyzer, it is characterized in that said signal combination circuit 5, comprising: 55,56, one Sheffer stroke gates 58 of 53,54,57, two rejection gates of 51,52, three phase inverters of two d type flip flops.
6, dielectric loss measurer by optical fibre and microcomputer according to claim 4 is characterized in that said high-voltage power supply control circuit 9, comprising: 91,97, three controllable silicon 9G of 90,92,93,94,95,98,99, two voltage comparators of seven rejection gates
0, 9G
1, 9G
2, a power transformer 9CT, a rectifier 9ZL
1Two relay 9J
1, 9J
2, 9J
3
7, according to claim 5 or 6 described dielectric loss measurer by optical fibre and microcomputer, it is characterized in that said high-voltage power supply control circuit 9, comprise: 91,97, three controllable silicon 9G of 90,92,93,94,95,98,99, two voltage comparators of seven rejection gates
0, 9G
1, 9G
2, a power transformer 9CT, a rectifier 9ZL
1, two relay 9J
1, 9J
2, 9J
3
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 89100046 CN1020804C (en) | 1988-12-31 | 1988-12-31 | Dielectric loss measurer with light guide and microcomputer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 89100046 CN1020804C (en) | 1988-12-31 | 1988-12-31 | Dielectric loss measurer with light guide and microcomputer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1043393A true CN1043393A (en) | 1990-06-27 |
| CN1020804C CN1020804C (en) | 1993-05-19 |
Family
ID=4853670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 89100046 Expired - Fee Related CN1020804C (en) | 1988-12-31 | 1988-12-31 | Dielectric loss measurer with light guide and microcomputer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1020804C (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100410671C (en) * | 2003-08-09 | 2008-08-13 | 特变电工衡阳变压器有限公司 | Method for on-line monitoring insulating hidden danger of double-pipe for transformer |
| CN102142314A (en) * | 2010-11-26 | 2011-08-03 | 上海思创电器设备有限公司 | Standard capacitor with built-in reverse connection unit for high-voltage medium loss test |
| CN107991536A (en) * | 2017-11-03 | 2018-05-04 | 国家电网公司 | A kind of temperature correction method and equipment of the test of frequency domain dielectric response |
| CN112630542A (en) * | 2020-10-30 | 2021-04-09 | 国网宁夏电力有限公司 | Loss test method, medium and system of filter capacitor |
| CN114859186A (en) * | 2022-04-11 | 2022-08-05 | 江苏邦士医疗科技有限公司 | Device and method for rapidly measuring lowest dielectric strength margin |
-
1988
- 1988-12-31 CN CN 89100046 patent/CN1020804C/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100410671C (en) * | 2003-08-09 | 2008-08-13 | 特变电工衡阳变压器有限公司 | Method for on-line monitoring insulating hidden danger of double-pipe for transformer |
| CN102142314A (en) * | 2010-11-26 | 2011-08-03 | 上海思创电器设备有限公司 | Standard capacitor with built-in reverse connection unit for high-voltage medium loss test |
| CN107991536A (en) * | 2017-11-03 | 2018-05-04 | 国家电网公司 | A kind of temperature correction method and equipment of the test of frequency domain dielectric response |
| CN107991536B (en) * | 2017-11-03 | 2023-06-13 | 国家电网公司 | Temperature correction method and equipment for frequency domain dielectric response test |
| CN112630542A (en) * | 2020-10-30 | 2021-04-09 | 国网宁夏电力有限公司 | Loss test method, medium and system of filter capacitor |
| CN112630542B (en) * | 2020-10-30 | 2022-05-20 | 国网宁夏电力有限公司 | Loss test method, medium and system for filter capacitor |
| CN114859186A (en) * | 2022-04-11 | 2022-08-05 | 江苏邦士医疗科技有限公司 | Device and method for rapidly measuring lowest dielectric strength margin |
| CN114859186B (en) * | 2022-04-11 | 2023-05-09 | 江苏邦士医疗科技有限公司 | Device and method for rapidly measuring minimum dielectric strength margin |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1020804C (en) | 1993-05-19 |
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