CN112630542B - Loss test method, medium and system for filter capacitor - Google Patents
Loss test method, medium and system for filter capacitor Download PDFInfo
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Abstract
Description
技术领域technical field
本发明涉及滤波电容器技术领域,尤其涉及一种滤波电容器的损耗测试方法、介质及系统。The present invention relates to the technical field of filter capacitors, in particular to a loss testing method, medium and system for filter capacitors.
背景技术Background technique
电容器的额定电流由基波电流与所有谐波电流的均方根值确定,该算法存在以下问题:①电容器元件的介质结构在不同频率下具有不同的介质损耗,将所有谐波以相同的热效应进行折算并不准确;②电容器元件的极板由铝箔卷绕而成,具有分布电感和分布电阻,分布电感和分布电阻使不同频率的电流在电容器元件上有不同的分布,这也导致不同频率的电流下电容器元件的损耗功率不同。The rated current of the capacitor is determined by the root mean square value of the fundamental current and all harmonic currents. The algorithm has the following problems: ① The dielectric structure of the capacitor element has different dielectric losses at different frequencies, and all harmonics have the same thermal effect. The conversion is not accurate; ② The pole plate of the capacitor element is made of aluminum foil and has distributed inductance and distributed resistance. The distributed inductance and distributed resistance make the current of different frequencies have different distributions on the capacitor element, which also leads to different frequencies. The power loss of the capacitor element is different under the current.
因此,简单的以各次谐波电流的均方根值作为滤波电容器的额定电流,得到的滤波电容器的损耗不太准确,无法反应滤波电容器的损耗对选型和设计的影响。Therefore, simply taking the root mean square value of each harmonic current as the rated current of the filter capacitor, the loss of the filter capacitor obtained is not very accurate, and cannot reflect the influence of the loss of the filter capacitor on the selection and design.
发明内容SUMMARY OF THE INVENTION
本发明实施例提供了一种滤波电容器的损耗测试方法、介质及系统,以解决现有技术的得到滤波电容器的损耗不太准确的问题。Embodiments of the present invention provide a method, medium and system for testing the loss of a filter capacitor, so as to solve the problem that the loss of the filter capacitor obtained in the prior art is inaccurate.
第一方面,提供一种滤波电容器的损耗测试方法,包括:搭建滤波电容器单元的损耗测试电路,其中,所述损耗测试电路包括:滤波电容器单元和损耗测试电桥,其中,所述滤波电容器单元包括:滤波电容器元件和连接排,每一所述滤波电容器元件的一极板连接所述连接排的一端,每一所述滤波电容器元件的另一极板焊接有熔丝,所述损耗测试电桥的一端连接所述连接排的另一端,所述损耗测试电桥的另一端连接所述滤波电容器元件的熔丝;在预设频率范围内,测试不同频率对应的所述滤波电容器元件的介质损耗因数;计算同一频率对应的所有所述滤波电容器元件的介质损耗因数的均值;以频率为横坐标,所述介质损耗因数的均值为纵坐标,绘制介质损耗因数曲线;测试得到额定电压下频率50Hz对应的滤波电容器单元的损耗值;采用连接排损耗计算式计算频率50Hz对应的所述连接排的损耗值,其中,所述连接排损耗计算式为PB表示频率50Hz对应的所述连接排的损耗值,PT表示额定电压下频率50Hz对应的所述滤波电容器单元的损耗值,I50表示频率50Hz对应的电流有效值,C表示所述滤波电容器单元的电容值,tan50δ表示频率50Hz对应的所述滤波电容器元件的介质损耗因数,tan50δ通过查询所述介质损耗因数曲线获得;采用滤波电容器损耗计算式计算每一预设频率对应的所述滤波电容器单元的损耗值,其中,所述滤波电容器损耗计算式为Pn表示预设频率fn对应的所述滤波电容器单元的损耗值,表示预设频率fn对应的电流有效值,表示预设频率fn对应的所述滤波电容器元件的介质损耗因数,通过查询所述介质损耗因数曲线获得;计算额定电压下频率50Hz对应的滤波电容器单元的损耗值与所有预设频率对应的所述滤波电容器单元的损耗值的和,得到所述滤波电容器单元的总损耗值。A first aspect provides a loss test method for a filter capacitor, including: building a loss test circuit for a filter capacitor unit, wherein the loss test circuit includes a filter capacitor unit and a loss test bridge, wherein the filter capacitor unit It includes: a filter capacitor element and a connection row, one pole plate of each filter capacitor element is connected to one end of the connection row, the other pole plate of each filter capacitor element is welded with a fuse, and the loss test electric One end of the bridge is connected to the other end of the connection row, and the other end of the loss test bridge is connected to the fuse of the filter capacitor element; within a preset frequency range, the medium of the filter capacitor element corresponding to different frequencies is tested Loss factor; calculate the average value of the dielectric loss factor of all the filter capacitor elements corresponding to the same frequency; take the frequency as the abscissa, and the average value of the dielectric loss factor as the ordinate, draw the dielectric loss factor curve; test to obtain the frequency under the rated voltage The loss value of the filter capacitor unit corresponding to 50Hz; the loss value of the connection bank corresponding to the frequency of 50Hz is calculated using the connection bank loss calculation formula, wherein the connection bank loss calculation formula is: P B represents the loss value of the connecting bar corresponding to a frequency of 50 Hz, P T represents the loss value of the filter capacitor unit corresponding to a frequency of 50 Hz under rated voltage, I 50 represents the effective current value corresponding to a frequency of 50 Hz, and C represents the filter Capacitance value of the capacitor unit, tan 50 δ represents the dielectric loss factor of the filter capacitor element corresponding to a frequency of 50 Hz, and tan 50 δ is obtained by querying the dielectric loss factor curve; the filter capacitor loss calculation formula is used to calculate the corresponding value of each preset frequency The loss value of the filter capacitor unit, wherein, the filter capacitor loss calculation formula is P n represents the loss value of the filter capacitor unit corresponding to the preset frequency f n , represents the rms value of the current corresponding to the preset frequency f n , represents the dielectric loss factor of the filter capacitor element corresponding to the preset frequency f n , Obtained by querying the dielectric loss factor curve; calculating the sum of the loss value of the filter capacitor unit corresponding to the frequency of 50Hz under the rated voltage and the loss values of the filter capacitor units corresponding to all preset frequencies, to obtain the total value of the filter capacitor unit. loss value.
第二方面,提供一种计算机可读存储介质,所述计算机可读存储介质上存储有计算机程序指令;所述计算机程序指令被处理器执行时实现如上述第一方面实施例所述的滤波电容器的损耗测试方法。In a second aspect, a computer-readable storage medium is provided, where computer program instructions are stored on the computer-readable storage medium; when the computer program instructions are executed by a processor, the filter capacitors according to the embodiments of the first aspect are implemented loss test method.
第三方面,提供一种滤波电容器的损耗测试系统,包括:如上述第二方面实施例所述的计算机可读存储介质。A third aspect provides a loss testing system for a filter capacitor, comprising: the computer-readable storage medium according to the embodiment of the second aspect.
这样,本发明实施例,以更细致的数学物理模型为依据,考虑了滤波电容器在不同频率下的发热损耗不同,更符合实际情况,对高压滤波电容器发热损耗量的校验结果也更加准确,以此为依据,进行产品设计、选型与应用更加合理,有利于提高高压滤波电容器设备的可靠性。In this way, the embodiment of the present invention, based on a more detailed mathematical and physical model, takes into account the different heating losses of the filter capacitor at different frequencies, which is more in line with the actual situation, and the verification result of the heating loss of the high-voltage filter capacitor is also more accurate. Based on this, product design, selection and application are more reasonable, which is beneficial to improve the reliability of high-voltage filter capacitor equipment.
附图说明Description of drawings
为了更清楚地说明本发明实施例的技术方案,下面将对本发明实施例的描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。In order to illustrate the technical solutions of the embodiments of the present invention more clearly, the following briefly introduces the drawings that are used in the description of the embodiments of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention. , for those of ordinary skill in the art, other drawings can also be obtained from these drawings without creative labor.
图1是本发明实施例的滤波电容器的损耗测试方法的流程图;1 is a flowchart of a method for testing loss of a filter capacitor according to an embodiment of the present invention;
图2是本发明实施例的滤波电容器的损耗测试电路的示意图;2 is a schematic diagram of a loss test circuit of a filter capacitor according to an embodiment of the present invention;
图3是本发明一具体实施例的介质损耗因数曲线的示意图。FIG. 3 is a schematic diagram of a dielectric loss factor curve according to a specific embodiment of the present invention.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获取的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
本发明公开了一种滤波电容器的损耗测试方法。如图1所示,该损耗测试方法包括如下的步骤:The invention discloses a loss testing method of a filter capacitor. As shown in Figure 1, the loss test method includes the following steps:
步骤S1:搭建滤波电容器单元的损耗测试电路。Step S1: Build a loss test circuit of the filter capacitor unit.
其中,如图2所示,损耗测试电路包括:滤波电容器单元和损耗测试电桥4。滤波电容器单元包括:滤波电容器元件1和连接排3。滤波电容器单元包括的多个滤波电容器元件1均相同。每一滤波电容器元件1的一极板连接连接排3的一端。每一滤波电容器元件1的另一极板焊接有熔丝2。损耗测试电桥4的一端连接连接排3的另一端。损耗测试电桥4的另一端连接滤波电容器元件1的熔丝2。滤波电容器元件1按照现有的正常工艺制备得到,并按照正常工艺打包,焊接熔丝2。熔丝2的另一侧不焊接连接排3。然后将滤波电容器1、熔丝2、连接排3整体进行真空浸渍处理。Wherein, as shown in FIG. 2 , the loss test circuit includes: a filter capacitor unit and a
步骤S2:在预设频率范围内,测试不同频率对应的滤波电容器元件的介质损耗因数。Step S2: within a preset frequency range, test the dielectric loss factor of the filter capacitor elements corresponding to different frequencies.
具体的,如图2所示,损耗测试电桥4的另一端每次连接一个滤波电容器元件1的熔丝2以进行测试。介质损耗因数即元件损耗角正切tanδ。预设频率范围和测试的频率可根据实际情况确定。在本发明一具体的实施例中,测试的频率为50Hz的整数倍,且相邻两个频率之间的间隔相同,例如,50Hz、100Hz、150Hz、200Hz……。Specifically, as shown in FIG. 2 , the other end of the
步骤S3:计算同一频率对应的所有滤波电容器元件的介质损耗因数的均值。Step S3: Calculate the average value of the dielectric loss factors of all filter capacitor elements corresponding to the same frequency.
例如,滤波电容器元件为15个,则计算同一频率的15个滤波电容器元件的介质损耗因数的均值。For example, if there are 15 filter capacitor elements, the average value of the dielectric loss factor of the 15 filter capacitor elements at the same frequency is calculated.
步骤S4:以频率为横坐标,介质损耗因数的均值为纵坐标,绘制介质损耗因数曲线。Step S4: Using the frequency as the abscissa and the mean value of the dielectric loss factor as the ordinate, draw a dielectric loss factor curve.
步骤S5:测试得到额定电压下频率50Hz对应的滤波电容器单元的损耗值。Step S5: Test to obtain the loss value of the filter capacitor unit corresponding to the frequency of 50 Hz under the rated voltage.
该值可通过采用现有仪器设备直接测试的方法得到。一般的,可测量三台相同的滤波电容器单元的损耗值,取其平均值作为滤波电容器单元的损耗值。该值包括滤波电容器元件损耗和连接排损耗。This value can be obtained by direct testing with existing equipment. Generally, the loss value of three identical filter capacitor units can be measured, and the average value is taken as the loss value of the filter capacitor unit. This value includes filter capacitor element losses and connection bank losses.
步骤S6:采用连接排损耗计算式计算频率50Hz对应的连接排的损耗值。Step S6: Calculate the loss value of the connection bank corresponding to the frequency of 50 Hz by using the connection bank loss calculation formula.
具体的,连接排损耗计算式为:Specifically, the calculation formula of connection row loss is:
其中,PB表示频率50Hz对应的连接排的损耗值。PT表示额定电压下频率50Hz对应的滤波电容器单元的损耗值。I50表示频率50Hz对应的电流有效值,其为测量PT时加载的电流。C表示滤波电容器单元的电容值,在滤波电容器单元出厂时已经标定。tan50δ表示频率50Hz对应的滤波电容器元件的介质损耗因数,tan50δ通过查询介质损耗因数曲线获得,即在介质损耗因数曲线中查询横坐标为50Hz时对应的纵坐标的值。Among them, PB represents the loss value of the connection bar corresponding to the frequency of 50Hz. P T represents the loss value of the filter capacitor unit corresponding to a frequency of 50 Hz under the rated voltage. I 50 represents the rms value of the current corresponding to a frequency of 50 Hz, which is the current loaded when measuring PT . C represents the capacitance value of the filter capacitor unit, which has been calibrated when the filter capacitor unit leaves the factory. tan 50 δ represents the dielectric loss factor of the filter capacitor element corresponding to a frequency of 50 Hz, and tan 50 δ is obtained by querying the dielectric loss factor curve, that is, querying the value of the ordinate when the abscissa is 50 Hz in the dielectric loss factor curve.
步骤S7:采用滤波电容器损耗计算式计算每一预设频率对应的滤波电容器单元的损耗值。Step S7: Calculate the loss value of the filter capacitor unit corresponding to each preset frequency by using the filter capacitor loss calculation formula.
具体的,滤波电容器损耗计算式为:Specifically, the calculation formula for the loss of the filter capacitor is:
其中,Pn表示预设频率fn对应的滤波电容器单元的损耗值。Ifn表示预设频率fn对应的电流有效值,为预先设定值,与滤波电容器的使用工况有关。表示预设频率fn对应的滤波电容器元件的介质损耗因数,通过查询介质损耗因数曲线获得。其他参数如前文所述,在此不再赘述。Wherein, P n represents the loss value of the filter capacitor unit corresponding to the preset frequency f n . I fn represents the effective value of the current corresponding to the preset frequency f n , which is a preset value and is related to the working conditions of the filter capacitor. represents the dielectric loss factor of the filter capacitor element corresponding to the preset frequency f n , Obtained by querying the dielectric loss factor curve. Other parameters are as described above and will not be repeated here.
步骤S8:计算额定电压下频率50Hz对应的滤波电容器单元的损耗值与所有预设频率对应的滤波电容器单元的损耗值的和,得到滤波电容器单元的总损耗值。Step S8: Calculate the sum of the loss value of the filter capacitor unit corresponding to the frequency of 50 Hz under the rated voltage and the loss values of the filter capacitor units corresponding to all preset frequencies to obtain the total loss value of the filter capacitor unit.
具体的, specific,
其中,P表示待测的滤波电容器的总损耗值。例如,预设频率可以是250Hz、350Hz、550Hz、750Hz,具体根据滤波电容器运行的工况确定,一般在设计滤波电容器时已经确定了。Among them, P represents the total loss value of the filter capacitor to be measured. For example, the preset frequency may be 250Hz, 350Hz, 550Hz, or 750Hz, which is specifically determined according to the operating conditions of the filter capacitor, which is generally determined when designing the filter capacitor.
下面以一具体实施例对本发明的技术方案做进一步的说明。The technical solution of the present invention will be further described below with a specific embodiment.
对于一台型号为AAM11.6-22.04-1W的滤波电容器单元,各次谐波电流的电流有效值如表1所示。For a filter capacitor unit whose model is AAM11.6-22.04-1W, the RMS current of each harmonic current is shown in Table 1.
表1各次谐波电流的电流有效值Table 1 Current effective value of each harmonic current
待测的滤波电容器单元包括的滤波电容器元件的数量为15个。滤波电容器元件的电容值为11.2uF,滤波电容器单元的电容量可根据其包括的滤波电容器元件的连接形式由滤波电容器元件的电容值计算得到。预设频率范围为50Hz~5000Hz。每隔50Hz测试一次滤波电容器元件的介质损耗因数。计算同一频率下15个滤波电容器元件的介质损耗因数的均值后,绘制得到如图3所示的介质损耗因数曲线。在额定电压下测试得到频率50Hz对应的待测的滤波电容器单元的损耗值PT=462.5W。在图3的介质损耗因数曲线中查询50Hz对应的tan50δ=0.0011。计算连接排的损耗值PB=117W。在图3的介质损耗因数曲线中查询每一预设频率250Hz、350Hz、550Hz、750Hz对应的介质损耗因数,获取每一预设频率250Hz、350Hz、550Hz、750Hz对应的电流有效值,以及,计算得到的滤波电容器的总损耗值如表2所示。The number of filter capacitor elements included in the filter capacitor unit to be tested is 15. The capacitance value of the filter capacitor element is 11.2uF, and the capacitance of the filter capacitor unit can be calculated from the capacitance value of the filter capacitor element according to the connection form of the filter capacitor element it includes. The preset frequency range is 50Hz~5000Hz. The dielectric dissipation factor of the filter capacitor element is tested every 50Hz. After calculating the average value of the dielectric loss factor of 15 filter capacitor elements at the same frequency, draw the dielectric loss factor curve as shown in Figure 3. The loss value P T =462.5W of the filter capacitor unit to be tested corresponding to the frequency of 50Hz is obtained by testing at the rated voltage. In the dielectric loss factor curve in Fig. 3, query tan 50 δ=0.0011 corresponding to 50 Hz. Calculate the loss value P B =117W of the connection bar. Query the dielectric loss factor corresponding to each preset frequency 250Hz, 350Hz, 550Hz, 750Hz in the dielectric loss factor curve in Figure 3, obtain the current RMS value corresponding to each preset frequency 250Hz, 350Hz, 550Hz, 750Hz, and calculate The resulting total loss values of the filter capacitors are shown in Table 2.
表2每一预设频率对应的参数值Table 2 Parameter values corresponding to each preset frequency
采用现有技术的电流均方根方法核算的该电容器单元的总容量为763.6kvar,通常按照现有的工频损耗进行计算,电容器单元工频损耗角正切为0.0015,总损耗值为1165W,小于本发明实施例的方法得到的损耗值。由于现有技术的方法未考虑滤波电容器单元的损耗随频率的变化,导致在高频下损耗增加未被计入,因此本发明实施例的方法比现有技术的方法更加准确。The total capacity of the capacitor unit calculated by the current root mean square method of the prior art is 763.6kvar, which is usually calculated according to the existing power frequency loss. The power frequency loss tangent of the capacitor unit is 0.0015, and the total loss value is 1165W, which is less than The loss value obtained by the method of the embodiment of the present invention. Since the method of the prior art does not consider the change of the loss of the filter capacitor unit with frequency, resulting in that the increase of the loss at high frequency is not taken into account, the method of the embodiment of the present invention is more accurate than the method of the prior art.
本发明实施例还公开了一种计算机可读存储介质,该计算机可读存储介质上存储有计算机程序指令;该计算机程序指令被处理器执行时实现如上述实施例所述的滤波电容器的损耗测试方法。An embodiment of the present invention also discloses a computer-readable storage medium, where computer program instructions are stored on the computer-readable storage medium; when the computer program instructions are executed by a processor, the loss test of the filter capacitor described in the foregoing embodiment is implemented method.
本发明实施例还公开了一种滤波电容器的损耗测试系统,包括:如上述实施例所述的计算机可读存储介质。An embodiment of the present invention also discloses a loss testing system for a filter capacitor, comprising: the computer-readable storage medium described in the above-mentioned embodiments.
综上,本发明实施例,以更细致的数学物理模型为依据,考虑了滤波电容器在不同频率下的发热损耗不同,更符合实际情况,对高压滤波电容器发热损耗量的校验结果也更加准确,以此为依据,进行产品设计、选型与应用更加合理,有利于提高高压滤波电容器设备的可靠性。In summary, the embodiment of the present invention is based on a more detailed mathematical and physical model, and considers the different heating losses of the filter capacitors at different frequencies, which is more in line with the actual situation, and the verification results of the heating losses of the high-voltage filter capacitors are also more accurate. , based on this, the product design, selection and application are more reasonable, which is conducive to improving the reliability of high-voltage filter capacitor equipment.
以上所述,仅为本发明的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本发明的保护范围之内。因此,本发明的保护范围应以权利要求的保护范围为准。The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention. should be included within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.
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