CN103164320B - Inspection system, inspection information collect device - Google Patents

Abstract

The present invention provides an inspection system and an inspection information collection device, which can shorten the inspection time of the inspected object compared with the case where the inspection order of the inspected items of the inspected object is fixed. The inspection system (10) includes an inspection device and an external device (14), and the inspection device has: a storage unit for storing a plurality of inspection programs for inspecting an object to be inspected; a receiving unit for receiving at least inspection items and an inspection sequence set Setting information; the execution unit executes the inspection program corresponding to the inspection item according to the inspection sequence; the inspection result sending unit sends the inspection result of the inspection item executed by the execution unit, and the external device has: the inspection setting information sending unit sends the inspection setting The set information is sent to the inspection device; the summary unit is used to summarize the inspection results sent from the inspection device; the sorting unit is used to sort the inspection order of the inspection items in the order of the failure rate from high to low according to the summary results of the summary unit.

Description

Inspection system, inspection information collection device

technical field

The invention relates to an inspection system and an inspection information collection device.

Background technique

Patent Document 1 describes a management system that manages a processing device for a substrate, and is characterized in that a management system for substrates processed by the processing device is installed on the factory side where the processing device is installed. The inspection device for inspection is provided with a host computer that acquires inspection information of the substrates inspected by the inspection device via a network on the supplier side of the processing device.

Patent Document 2 describes an equipment management system that includes: a host computer; a plurality of equipment controlled by the host computer to perform predetermined processing; and an inspection unit that checks equipment that has passed the current process Products that have undergone prescribed processing are inspected, and the device management system is characterized in that each of the above-mentioned devices includes a sensor unit that monitors the status of each device during product processing, and when the sensor unit detects that the device or the product is abnormal or when the result of checking the product by the above-mentioned inspection unit is that the product deviates from the predetermined standard range, stop the equipment of the current project or notify the abnormal state.

prior art literature

Patent Document 1: Japanese Unexamined Patent Publication No. 2003-7605

Patent Document 2: Japanese Patent Application Laid-Open No. 4-354663

Contents of the invention

An object of the present invention is to provide an inspection system, an inspection information collection device, and an inspection information collection program that can shorten the inspection time of an inspection object compared to a case where the inspection order of inspection items of the inspection object is fixed.

In order to achieve the above object, the inspection system of the first aspect of the present invention includes an inspection device and an inspection information collection device, the inspection device has: a storage unit, which stores a plurality of inspection programs for inspecting the object to be inspected; a receiving unit, which receives inspection setting information in which at least an inspection item and an inspection order are set; an execution unit that executes the inspection program corresponding to the inspection item in accordance with the inspection order; and an inspection result sending unit that transmits the The inspection results of the inspection items performed by the unit, the inspection information summarizing device has: an inspection setting information sending unit that sends the inspection setting information to the inspection device; summarizing the inspection results sent by the device; and a sorting unit, which sorts the inspection sequence of the inspection items in descending order of unqualified rate according to the summarizing results of the summarizing unit.

According to the second aspect of the present invention, the sorting unit sorts the inspection order in such a manner that, in the case of re-inspection of the inspected object, an inspection error occurred in a previous inspection. Qualified inspection items start to perform inspections.

According to the third aspect of the present invention, a plurality of the inspection devices are provided for one inspection information collection device.

According to a fourth aspect of the present invention, the inspection information collection device includes: an inspection setting information sending unit that sends the inspection setting information to an inspection device that has a storage unit that stores a plurality of an inspection program; a receiving unit that receives the inspection setting information in which at least an inspection item and an inspection order are set; an execution unit that executes an inspection program corresponding to the inspection item in accordance with the inspection order; and inspection result transmission a unit that transmits inspection results of inspection items performed by the execution unit; a summarizing unit that summarizes inspection results of the inspection items sent from the inspection device; and a sorting unit that summarizes The summary results of the inspection items are sorted in descending order of the unqualified rate.

According to the fifth aspect of the present invention, the inspection information aggregation program causes a computer to function as each unit constituting the inspection information aggregation device according to the fourth aspect of the present invention.

According to the first, fourth, and fifth aspects of the present invention, there is an effect that the inspection time of the inspection object can be shortened compared with the case where the inspection order of the inspection items of the inspection object is fixed.

According to the second aspect of the present invention, there is an effect that when re-inspecting an inspection object, the re-inspection time of the inspection object can be shortened compared to the case where the inspection is performed from the beginning.

According to the third aspect of the present invention, there is an effect that the efficiency of summarizing inspection results can be improved compared to the case where the inspection information summarization device is provided for each of a plurality of inspection apparatuses.

Description of drawings

Figure 1 is a structural diagram of the inspection system.

Fig. 2 is a schematic configuration diagram of the inspection device.

FIG. 3 is a diagram showing storage contents of a nonvolatile memory of the inspection device.

Fig. 4 is a schematic configuration diagram of an external device.

FIG. 5 is a flowchart of processing executed by the inspection device.

FIG. 6 is a flowchart of processing executed by an external device.

Symbol Description

10 Checking the system

12 Inspection device

14 External device (check information summary device)

16 network

18 computers

18D non-volatile memory

20 Operation Department

22 Display

40 computers

42 Operation Department

44 Display

48 hard drives

detailed description

Next, embodiments of the present invention will be described.

[check system]

A schematic configuration of an inspection system 10 according to the present embodiment is illustrated in FIG. 1 . As shown in FIG. 1 , the inspection system 10 has a configuration in which a plurality of inspection devices 12 and an external device 14 serving as an inspection information collection device are connected to each other via a network 16 .

(check device)

The schematic configuration of the inspection device 12 is illustrated in FIG. 2 . As shown in FIG. 2 , the inspection device 12 is configured to include a computer 18 .

The computer 18 has a CPU (Central Processing Unit) 18A, a ROM (Read Only Memory) 18B, a RAM (Random Access Memory) 18C, a nonvolatile memory 18D, and an input/output interface (I/O) respectively connected as execution units through a bus 18F. O) Structure of 18E.

The I/O 18E is connected to an operation unit 20 including operation buttons and the like for performing inspection-related operations, a display unit 22 including a liquid crystal display for performing inspection-related displays, etc. A network communication interface (I/F) 24 for data communication with the external device 14 as a receiving unit and an inspection result sending unit, and a connection interface (I/F) 26 for connecting with the inspected object F, etc.

In the present embodiment, the inspection object F is, for example, a printed wiring board mounted with a control circuit responsible for controlling electronic equipment such as an image forming apparatus, but the type of the inspection object F is not limited thereto.

The nonvolatile memory 18D as a storage means is constituted by, for example, an EEPROM whose storage content can be rewritable. As shown in FIG. 3 , a control program PO described later and a plurality of inspection programs P1 , P2 , P3 . The multiple inspection programs are set according to each inspection item of the inspected object F in the following manner, that is, for example, inspection program P1 corresponds to inspection item 1, inspection program P2 corresponds to inspection item 2, and so on. In addition, when there are multiple kinds of inspection objects F, a plurality of inspection programs corresponding to a plurality of inspection items are stored for each type of inspection objects F. FIG.

(check information summary device)

FIG. 4 exemplifies the schematic configuration of the external device 14 as an inspection information collection device. As shown in FIG. 4 , the external device 14 is configured to include a computer 40 , for example, a general personal computer is used.

The computer 40 has a structure in which a CPU 40A, a ROM 40B, a RAM 40C, a nonvolatile memory 40D, and an input/output interface (I/O) 40E are respectively connected via a bus 40F.

To the I/O 40E are connected an operation unit 42 including a keyboard, a mouse, etc., a display unit 44 including a liquid crystal display, etc., and an inspection setting information transmission unit for performing data communication with the inspection device 12 via the network 16. A network communication interface (I/F) 46, and a hard disk 48 for storing various information such as control programs described later and inspection result information of the object F to be inspected.

In addition, the control program mentioned later is prestored in the hard disk 48 as an example in this embodiment, and it executes by reading this prestored program by CPU 40A. In addition, the program may be recorded on a recording medium such as a CD-ROM, and the program may be read by a CD-ROM drive or the like to be executed.

[Check the action of the system]

Next, as the operation of this embodiment, the processing executed by the inspection device 12 and the external device 14 will be described with reference to a flowchart.

(check the operation of the device)

First, the processing executed by the inspection device 12 will be described with reference to the flowchart shown in FIG. 5 . In addition, the process shown in FIG. 5 is executed in such a way that the operator connects the object F to be inspected to the connection I/F 26 of the inspection device 12, and operates the operation unit 20 to instruct to start the inspection of the object F to be inspected. Accordingly, the control program PO stored in the nonvolatile memory 18D is read by the CPU 18A and executed. More specifically, when the inspected object F is a printed wiring board on which electronic components are mounted (mounted), when the operator uses the board inspection device (in-circuit tester) described in Japanese Patent Application No. 2011-175979, for example, , functional tester) when the printed wiring board is installed, the probes come into contact with the fillet or the like of the electronic components of the printed wiring board. The probes of the substrate inspection device are electrically connected to the inspection device 12 through the connection I/F 26. Therefore, when the operator operates the operation part 20 of the inspection device 12 to start inspection (execute the control program PO), the inspection device 12 performs electronic inspection. Operation inspection of components, etc.

As shown in FIG. 5 , in step 100 , the identification code of the inspection target F is transmitted from the network communication I/F 24 to the external device 14 via the network 16 . An example of the identification code of the inspection object F is an identification code including at least one of numerals and symbols indicating the type (model name) of the inspection object F and the serial number. In addition, regarding the factory serial number, a unique serial number is attached to each inspection target F.

The identification code is obtained from the control circuit by sending a request signal requesting the identification code of the inspection object F to the control circuit, for example, if it is stored in advance in a control circuit mounted on the inspection object F.

In addition, when the identification code is printed on the inspection target F, it can also be acquired by reading the printed identification code with a reading unit not shown.

In step 102, it is judged whether or not the test setting information in which at least the test items and the test order have been set has been received from the external device 14 via the network 16 and the network communication I/F 24, and if the test setting information is received, transfer to Step 102, if the checker setting information is not received, wait until the checker setting information is received. Note that specific processing executed by the external device 14 will be described later.

In step 104 , an inspection program corresponding to the inspection item of the current inspection order is read from the nonvolatile memory 18D based on the inspection order set by the inspection setting information, and is executed by the CPU 18A. If the object F to be inspected is a printed wiring board, the inspection program is, for example, a program for checking the power supply voltage of a circuit mounted on a printed wiring board, a program for checking whether there is an error in the transmission and reception of signals, a program for checking wiring Programs for disconnection, programs for checking the normal operation of electronic components, etc., but the types of inspection programs are not limited to these.

In step 106, it is judged whether the inspection result of the executed inspection program is an inspection failure.

In step 108, it is judged whether all the inspection programs set by the inspection setting information have been executed, and if all the inspection programs have been executed, the process goes to step 110; Returning to step 104, the same processing as above is repeated.

In step 110 , the inspection results of the executed inspection items are transmitted from the network communication I/F 24 to the external device 14 via the network 16 together with the identification code of the object F to be inspected.

(Check the operation of the information summary device)

Next, with reference to the flowchart shown in FIG. 6 , the processing executed by the external device 14 as the test information collecting device will be described. In addition, the processing shown in FIG. 6 is executed in such a way that the operator operates the operation unit 42 to instruct start of inspection, and the CPU 40A reads and executes the control program stored in the hard disk 48 .

In step 200 , it is judged whether the external device 14 has received the identification code of the inspection object F from the inspection device 12 via the network 16 and the network communication I/F 46 . When the external device 14 receives the identification code of the inspected object F, transfer to step 202, and wait until the identification code of the inspected object F is received if the identification code of the inspected object F is not received. .

In step 202 , it is judged whether the last inspection result of the inspected object F related to the received identification code is stored in the hard disk 48 . In other words, it is tantamount to judging whether or not there is an inspection item that failed the inspection in the previous inspection of the object F related to the received identification code, and this time it is a re-inspection.

And, when the last inspection result is stored in the hard disk 48, and this time is under the situation of re-examination, transfer to step 204; , transfer to step 206.

In step 204, set the inspection order (sorting unit) with the inspection item that failed in the last inspection result as the first inspection item, and send the inspection setting information including the inspection item and inspection order to Check device 12. For example, when there are 10 inspection items and the previous inspections were performed in the order of inspection items 1 to 10, when a failure occurs in inspection item 3, inspection item 3 is set as the first inspection item, Inspection setting information in which the inspection order of the inspection items 3 to 10 is set is transmitted to the inspection device 12 . Thereby, the inspection of the inspection items 1 and 2 in which no failure was found in the previous inspection is omitted, and the inspection is performed starting from the inspection item 3 .

On the other hand, in step 206, the inspection order is set (sorting means) by the CPU 40A in descending order of the defect rate calculated from the summarizing results of the inspection results in step 210 (summarizing means) described later, Inspection setting information including the inspection items and inspection order is transmitted from the network communication I/F 46 to the inspection device 12 via the network 16 . For example, in the summary results of the inspection results in step 210, the unqualified rate (NG occurrence rate) of each inspection item from high to low is inspection item 5 (8%), inspection item 3 (5%), inspection item In the case of 2 (3%), inspection item 1 (1%), and inspection items 6 to 10 (0%), the inspection setting information set in this order as the inspection order is transmitted to the inspection device 12 . In addition, among all the inspection items, the inspection order of the inspection items may be fixed depending on the inspection content. In this case, the inspection order is set without changing the fixed order. For example, in the above example, the order of failure rate of each inspection item from high to low is inspection item 5, 3, 1, 6-10, but when inspection items 1-3 are predetermined to be inspected in this order In the case of , the inspection items 1 to 3 are handled as one inspection item whose inspection order is fixed, and the inspection order becomes the order of inspection items 5, 1, 2, 3, and 6 to 10. In this case, the failure rate when the inspection items 1 to 3 are handled as one inspection item is the maximum failure rate of the inspection items 1 to 3 . That is, in the above example, since the failure rate (5%) of the inspection item 3 is the largest, the failure rate of the inspection items 1 to 3 is handled as 5%.

In step 208, it is judged whether the inspection result of each inspection item of the inspected object F has been received via the network 16 and the network communication I/F 46, and if the inspection result is received, it is transferred to step 210; In the case of a result, wait until the check result is received.

In step 210, the inspection results received via the network 16 and the network communication I/F 46 are associated with the identification symbols and stored in the hard disk 48, and according to the inspection results received this time and past inspection results by the CPU 40A, according to Inspection results of inspection objects F with a plurality of serial numbers are aggregated for each model name (summary unit). For example, the defect rate of each inspection item for a predetermined period from now to the past, the average value of the inspection time of each inspection item, and the like are collected and stored in the hard disk 48 .

In step 212 , the summarized inspection results are displayed on the display unit 44 . For example, the defective rate and the like for each day are displayed on the display unit 44 in the form of a Pareto chart.

In step 214, it is judged whether or not the operator has instructed to end the inspection by operating the operation unit 42. If the operator has instructed to end the inspection, this routine is terminated. If not, the procedure returns to step 200 and is repeated. Perform the same processing as above.

As described above, in this embodiment, the inspection setting information in which the inspection order of the inspection items is sorted in descending order of the inspection failure rate calculated from the summary of past inspection results is sent to the inspection department. The device 12 performs the inspection of the object F to be inspected. That is, inspections are performed sequentially from inspection items that are likely to fail. As a result, the time until inspection failure is found is shortened, and the overall inspection time is shortened.

In addition, when a re-inspection is performed due to a failure in the previous inspection, the inspection items that were not found to be unsatisfactory in the previous inspection are omitted, and inspections are performed starting from the inspection items that were found to be unsatisfactory in the previous inspection. Therefore, the inspection time for the re-inspection is shortened compared to the case where the inspection is re-inspected from the first inspection item. In particular, in the case of failures in inspections where analysis and repairs are completed in a short period of time, such as contact failures, the re-inspection is performed starting from the inspection item that failed the inspection, thereby further shortening the re-inspection. The inspection time of the inspection. In addition, in the case of failure of an inspection that requires long-term repair, such as a disconnection of wiring, it is not necessary to start the inspection from the inspection item that failed in the previous inspection when performing a re-inspection. , but executes the check from the initial check item.

In addition, the configurations of the inspection device 12 and the external device 14 described in this embodiment (see FIGS. 2 and 3 ) are examples, and it is of course possible to delete unnecessary parts or add new ones without departing from the gist of the present invention. part.

For example, in this embodiment, a case where a plurality of inspection devices 12 are used for one external device 14 is exemplified, but only one inspection device 12 may be used.

In addition, the processing flow of the control program (see FIG. 4 and FIG. 5 ) described in this embodiment is also an example, and it is of course possible to delete unnecessary steps or add new steps within the range not departing from the gist of the present invention. Or change the processing order.

Claims (4)

1. a kind of inspection system it is characterised in that

This inspection system includes check device and inspection information collects device,

Described check device has：Memory element, it stores the multiple inspection programs for checking multiple inspected objects；Receive Unit, it receives the inspection set information at least setting inspection project and checks sequence；Performance element, it is according to described inspection Sequentially, execute described inspection program corresponding with described inspection project；And inspection result transmitting element, it sends by described The inspection result of the described inspection project of performance element execution,

Described inspection information collects device to be had：Collection unit, it enters to the described inspection result sending from described check device Row collects；Sequencing unit, the situation of the inspected object of enforcement initial examination in checking the plurality of inspected object Under, this sequencing unit according in the plurality of inspected object of described collection unit having been carried out check described tested Check the summarized results of the described inspection result of elephant, with the described inspection to described inspection project for the disqualification rate order from high to low Look into order to be ranked up, the feelings of the described inspected object that the enforcement in checking the plurality of inspected object is reexamined Under condition, this sequencing unit there occurs, according in checking in last time, the content checking underproof inspection project, suitable to described inspection Sequence be ranked up so that from this last time inspection in there occurs inspection underproof inspection project or initial inspection project from the beginning of Execute inspection；And checking set information transmitting element, it will set the described checks sequence being sorted by described sequencing unit Described inspection set information be sent to described check device.

2. inspection system according to claim 1 it is characterised in that

All described inspection projects have in the case of securing the inspection project of described checks sequence, with for this check item The mode that mesh does not change fixing checks sequence is ranked up to the checks sequence of described all described inspection projects.

3. inspection system according to claim 1 and 2 it is characterised in that

Collect device for a described inspection information, possess multiple described check devices.

4. a kind of inspection information collect device it is characterised in that

This inspection information collects device and includes：

Collection unit, it collects to the inspection result sending from check device, and this check device has：Memory element, its Store the multiple inspection programs for checking multiple inspected objects；Receiving unit, its receive at least set inspection project and The inspection set information of checks sequence；Performance element, it executes inspection corresponding with described inspection project according to described checks sequence Look into program；And inspection result transmitting element, the described inspection knot of the inspection project that its transmission is executed by described performance element Really；

Sequencing unit, in the case of the inspected object of enforcement initial examination in checking the plurality of inspected object, This sequencing unit is examined according to having been carried out the described of inspection in the plurality of inspected object of described collection unit The summarized results of the described inspection result of object, with the described inspection to described inspection project for the disqualification rate order from high to low Order is ranked up, the situation of the described inspected object that the enforcement in checking the plurality of inspected object is reexamined Under, this sequencing unit there occurs, according in checking in last time, the content checking underproof inspection project, to described checks sequence It is ranked up so that there occurs that the underproof inspection project of inspection or initial inspection project start to hold from this last time inspection Row checks；And

Check set information transmitting element, it will set the described inspection of the described checks sequence being sorted by described sequencing unit Set information is sent to described check device.