CN116880398B - Fault analysis method, system, electronic equipment and storage medium for instrumentation and control equipment - Google Patents

Abstract

The present application relates to the field of automatic control technology, and provides a fault analysis method, system, electronic device and storage medium for instrumentation and control equipment. The fault analysis method for instrumentation and control equipment includes: obtaining analysis data of the instrumentation and control equipment; inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result; when the fault diagnosis result indicates that the instrumentation and control equipment has a fault, analyzing the system configuration based on the configuration information to obtain a configuration analysis result; and outputting the fault analysis result, which includes the fault diagnosis result and the configuration analysis result. In the above technical scheme, since, when it is determined that the instrumentation and control equipment has a fault based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result including the fault diagnosis result and the configuration analysis result is output, this can help the staff to analyze the cause of the fault, thereby helping to improve the efficiency of fault handling.

Description

Fault analysis method, system, electronic equipment and storage medium for instrumentation and control equipment

Technical Field

The present application relates to the field of automatic control technology, and specifically to a fault analysis method, system, electronic device and storage medium for instrumentation and control equipment.

Background Art

DCS (Distributed Control System) is used in chemical, electric power, nuclear energy and other industries. Since a distributed control system usually contains a large number of instrumentation and control equipment, how to monitor the faults of the instrumentation and control equipment in the system is a problem that needs to be solved.

In order to perform fault monitoring on the instrumentation and control equipment, in the related technology, the operating parameters of the instrumentation and control equipment are analyzed and calculated by a fault monitoring system to determine whether the instrumentation and control equipment has a fault based on the operating parameters, thereby realizing fault monitoring of the instrumentation and control equipment.

However, the failure of instrumentation and control equipment may be caused by a variety of factors. Traditional fault monitoring systems are often unable to determine or eliminate the causes of instrumentation and control equipment failures. This makes it difficult to accurately locate the cause of the failure during the fault handling process, which in turn leads to low fault handling efficiency.

Summary of the invention

In order to help improve the efficiency of fault handling, the present application provides a fault analysis method, system, electronic device and storage medium for instrumentation and control equipment.

In the first aspect, a fault analysis method for instrumentation and control equipment is provided, which is used in a fault analysis platform and adopts the following technical solution:

A fault analysis method for instrumentation and control equipment, used in a fault analysis platform, comprising:

Obtain analytical data from instrumentation and control equipment;

Inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result;

When the fault diagnosis result indicates that the instrumentation and control device has a fault, analyzing the system configuration based on the configuration information to obtain a configuration analysis result, wherein the configuration information is used to indicate the system configuration of the instrumentation and control system to which the instrumentation and control device belongs;

The fault analysis result is output, wherein the fault analysis result includes the fault diagnosis result and the configuration analysis result.

By adopting the above technical scheme, it can help to improve the efficiency of fault handling. When it is determined that there is a fault in the instrumentation and control equipment based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result including the fault diagnosis result and the configuration analysis result is output. This can help the staff to analyze the cause of the fault in combination with the fault diagnosis result and the configuration analysis result in the fault analysis result, so as to determine the corresponding fault handling method, which can help to improve the efficiency of fault handling.

Optionally, the analyzing the system configuration based on the configuration information to obtain the configuration analysis result includes:

determining a causal control logic based on the configuration information;

The system configuration is analyzed based on the causal control logic to obtain the configuration analysis result.

In the above implementation, since the system configuration is analyzed based on the causal control logic in the configuration information, this can help determine whether the causal control logic in the system configuration is abnormal in the event of a device failure, thereby helping to determine the cause of the device failure in combination with the configuration analysis results, and further helping to improve fault handling efficiency.

Optionally, the analyzing the system configuration based on the causal control logic to obtain the configuration analysis result includes:

Get the logic control strategy;

The system configuration is analyzed based on the causal control logic and the logic control strategy to obtain a configuration analysis result.

By adopting the above technical solution, the system configuration can be analyzed based on causal control logic and logical control strategy, which can help discover the unreasonableness in the causal control logic, thereby helping to improve the reference value of the configuration analysis results, and further help to improve the efficiency of fault handling.

Optionally, the analyzing the system configuration based on the configuration information to obtain the configuration analysis result includes:

Determining whether the system configuration is abnormal based on the configuration information;

When it is determined that the system configuration is abnormal, determining an abnormality handling suggestion corresponding to the system configuration;

A configuration analysis result including the exception handling suggestion is generated.

By adopting the above technical solution, when a system configuration abnormality is determined based on the configuration information, the exception handling suggestions corresponding to the system configuration can be determined, and a configuration analysis result including the exception handling suggestions can be generated, and the fault analysis result includes the configuration analysis result. In this way, when handling the fault based on the fault analysis result, the staff can handle the system configuration abnormality together with the exception handling suggestions, which can help improve the reliability of the instrumentation and control system, and can also help improve the efficiency of fault handling.

Optionally, obtaining analysis data of an instrumentation and control device includes:

When it is detected that the configuration information of the instrumentation and control system has changed, configuration variable information is determined, where the configuration variable information is used to indicate the change of the configuration data;

Determining a target instrumentation and control device based on the configuration variable information;

Acquire analysis data corresponding to the target instrumentation and control equipment to perform fault analysis on the target instrumentation and control equipment.

By adopting the above technical scheme, when the system configuration of the instrumentation and control system is monitored to change, the configuration variable information can be determined, and the target instrumentation and control equipment can be determined based on the configuration variable information, and fault analysis can be performed on the target instrumentation and control equipment. This can help to promptly discover equipment failures caused by system configuration changes, thereby helping to promptly handle equipment failures, and also help to improve the stability of the instrumentation and control system.

Optionally, the analysis data includes equipment ledger information, and obtaining the analysis data includes:

Obtaining raw data of the instrumentation and control equipment;

Parsing the raw data to obtain device data of at least one data type;

The equipment data corresponding to the instrumentation and control equipment is integrated and processed based on the data type to obtain the equipment inventory information.

In the above technical scheme, since the analysis data includes equipment ledger information, and the equipment ledger information is obtained by parsing the original data of the instrumentation and control equipment according to the data type, and integrating the parsed equipment data according to the data type, the original data can be processed according to the data type to obtain the ledger information, which can facilitate fault analysis of the instrumentation and control equipment based on the ledger information.

Optionally, the analysis data includes equipment ledger information and equipment status information, and the inputting of the analysis data into a fault diagnosis model to obtain a fault diagnosis result includes:

Inputting the equipment ledger information and the equipment status information into a fault diagnosis model to obtain the fault diagnosis result;

The fault diagnosis model is established based on model data, and the model data includes at least one set of sample data and fault diagnosis results corresponding to the sample data. The sample data includes sample ledger information and sample status information.

In the above technical scheme, since the analysis data includes equipment inventory information and equipment status information, and the sample data used in the process of establishing the fault diagnosis model includes sample inventory information and sample status information, during the fault diagnosis process, the fault diagnosis model can combine the static information and dynamic information of the instrumentation and control equipment to perform fault analysis on the instrumentation and control equipment, which can help improve the accuracy of fault judgment.

In the second aspect, a fault analysis system for instrumentation and control equipment is provided, which adopts the following technical solution:

A fault analysis system for instrumentation and control equipment, the fault analysis system comprising a data acquisition module, a fault analysis module and a data output module;

The data acquisition module is used to acquire data information of the instrumentation and control equipment in the instrumentation and control system, and send the data information to the fault analysis module;

The fault analysis module is used to execute any one of the fault analysis methods for instrumentation and control equipment provided in the first aspect, and send the fault analysis result to the data output module;

The data output module is used to output the fault analysis result.

In a third aspect, an electronic device is provided, which adopts the following technical solution:

An electronic device, comprising:

at least one processor;

Memory;

At least one application, wherein the at least one application is stored in a memory and configured to be executed by at least one processor, and the at least one application is configured to: execute any one of the fault analysis methods for instrumentation and control equipment provided in the first aspect.

In a fourth aspect, a computer-readable storage medium is provided, which adopts the following technical solution:

A computer-readable storage medium stores a computer program, which, when executed in a computer, causes the computer to execute any one of the instrumentation and control equipment fault analysis methods provided in the first aspect.

In summary, the present application includes at least one of the following beneficial technical effects:

1. It can help improve the efficiency of fault handling. When it is determined that the instrumentation and control equipment has a fault based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result including the fault diagnosis result and the configuration analysis result is output. This can help the staff to analyze the cause of the fault by combining the fault diagnosis result and the configuration analysis result in the fault analysis result, so as to determine the corresponding fault handling method, which can help improve the efficiency of fault handling.

2. When the system configuration is abnormal based on the configuration information, the abnormality handling suggestions corresponding to the system configuration are determined, and the configuration analysis results including the abnormality handling suggestions are generated, and the fault analysis results include the configuration analysis results. In this way, when the staff handles the fault based on the fault analysis results, they can handle the system configuration abnormality together with the abnormality handling suggestions, which can help improve the reliability of the instrumentation and control system and also help improve the efficiency of fault handling.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG1 is a schematic diagram of the structure of a fault analysis system for an instrumentation and control device provided in an embodiment of the present application;

FIG2 is a schematic flow chart of a method for analyzing a fault of an instrumentation and control device provided in an embodiment of the present application;

FIG3 is a flow chart of a configuration information analysis method provided in an embodiment of the present application;

FIG4 is a flow chart of another configuration information analysis method provided in an embodiment of the present application;

FIG5 is a schematic diagram of a flow chart of a method for determining a target instrumentation and control device according to an embodiment of the present application;

FIG. 6 is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

Description of reference numerals: 110, data acquisition module; 120, fault analysis module; 130, data output module.

DETAILED DESCRIPTION

In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with Figures 1 to 6 and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

An embodiment of the present application provides a fault analysis system for an instrumentation and control device. Referring to FIG. 1 , the fault analysis system for the instrumentation and control device includes: a data acquisition module 110 , a fault analysis module 120 and a data output module 130 .

The data acquisition module 110 is used to acquire data information of the instrumentation and control equipment and send the data information to the fault analysis module 120 .

The instrumentation and control equipment has a control function. In one example, the instrumentation and control equipment includes an intelligent instrument. In actual implementation, the instrumentation and control equipment also includes other equipment, such as PLC, industrial computer, etc. This embodiment does not limit the type of instrumentation and control equipment.

Optionally, the data information of the instrumentation and control device may be obtained from the instrumentation and control device and/or a control device of an instrumentation and control system to which the instrumentation and control device belongs, wherein the instrumentation and control system may adopt a DCS.

In one example, the data acquisition module 110 can be implemented as a gateway, and accordingly, the data acquisition module 110 is connected to the control device of the instrumentation and control equipment and/or the control device of the instrumentation and control system by signal. In actual implementation, the data acquisition module 110 can also be implemented as other modules that can perform data transmission, and this embodiment does not limit the implementation method of the data acquisition module 110.

The fault analysis module 120 is used to analyze the data information sent by the data acquisition module 110 based on the fault analysis method of the instrumentation and control equipment, and feed back the fault analysis result to the data output module 130 .

The fault analysis module 120 is a module with computing and information transmission functions. Optionally, the fault analysis module 120 can be a server, a personal computer, a microcontroller, etc. This embodiment does not limit the implementation of the fault analysis module 120.

The data output module 130 is used to output the fault analysis result sent by the fault analysis module 120. In one example, the data output module 130 provides a display interface, and the data output module 130 can directly output the fault analysis result through the display interface. In another example, the data output module 130 includes a communication component, and the data output module 130 can send the fault analysis result to other devices through the communication component for display by other devices. This embodiment does not limit the data output method of the data output module 130.

In actual implementation, the fault analysis system may further include other modules, such as a fault database module for recording fault data. This embodiment does not limit the types of modules actually included in the fault analysis system.

An embodiment of the present application provides a fault analysis method for instrumentation and control equipment, which is used in a fault analysis platform. The fault analysis platform can run in a fault analysis module in the fault analysis system shown in FIG. 1 above, or can also run in a control device of the instrumentation and control system, or can also run in other electronic devices, which is not limited in this embodiment.

Referring to FIG2 , the fault analysis method of the instrumentation and control equipment includes the following steps:

Step 201, obtaining analysis data of instrumentation and control equipment.

The analysis data is used to perform fault analysis on the instrumentation and control equipment. Specifically, the analysis data may be obtained from the instrumentation and control equipment, or may be obtained from the instrumentation and control system (eg DCS) to which the instrumentation and control equipment belongs. This embodiment does not limit the data source of the analysis data.

Optionally, the analysis data of the instrumentation and control equipment includes equipment inventory information, which is used to reflect the basic information of the instrumentation and control equipment, i.e., static information. In one example, the equipment inventory information includes the name, model, version, installation time, affiliated system, affiliated controller, affiliated IO card, health index and/or configuration information of the instrumentation and control equipment. Furthermore, the analysis data may also include changes in the equipment inventory information, such as changes in configuration information.

In one example, obtaining analysis data includes: obtaining raw data of instrumentation and control equipment; parsing the raw data to obtain equipment data of at least one data type; and integrating the equipment data corresponding to the instrumentation and control equipment based on the data type to obtain equipment inventory information.

Since the types and/or models of instrumentation and control equipment may differ, the channels for obtaining raw data may also differ, which results in the raw data formats being diverse. Therefore, in the process of parsing the raw data, the parsing method corresponding to the raw data can be determined based on the equipment information of the instrumentation and control equipment and/or the channels for obtaining the raw data. In this way, in the data parsing process, the raw data can be parsed using the parsing method corresponding to the raw data, which can help improve the accuracy of the equipment data obtained by parsing the raw data.

In addition, since the raw data corresponding to different instrumentation and control equipment may contain different contents, the data types of the equipment data obtained by parsing the raw data of different instrumentation and control equipment may also be diverse. Therefore, in the process of integrated processing of the data corresponding to the instrumentation and control equipment, only the equipment data of the specified data type can be integrated according to the actual analysis needs. This can help control the content of the integrated equipment ledger information, and then facilitate the fault analysis of the equipment based on the equipment ledger information. Furthermore, the specified data types corresponding to different types of instrumentation and control equipment can be set separately, so that it is convenient to obtain the analysis data of the instrumentation and control equipment in combination with the actual conditions of different types of instrumentation and control equipment.

In the above technical scheme, since the analysis data includes equipment ledger information, and the equipment ledger information is obtained by parsing the original data of the instrumentation and control equipment according to the data type, and integrating the parsed equipment data according to the data type, the original data can be processed according to the data type to obtain the ledger information, which can facilitate fault analysis of the instrumentation and control equipment based on the ledger information.

In other examples, the equipment inventory information may also be directly obtained from the instrumentation and control equipment or the instrumentation and control system. This embodiment does not limit the method for obtaining the equipment inventory information.

Optionally, the analysis data includes device status information, which is used to indicate the operating status of the instrumentation and control device, that is, dynamic information. In one example, the device status information includes: communication status of the instrumentation and control device, device diagnostic information, fault information and/or alarm information.

In one example, the fault analysis platform can automatically and regularly obtain analysis data of all or a specified part of the instrumentation and control equipment in the instrumentation and control system, which can help to realize automatic inspection of the instrumentation and control equipment, thereby monitoring the actual situation of the instrumentation and control equipment, and further help to detect faults in the instrumentation and control equipment in a timely manner.

In one example, the fault analysis platform obtains analysis data of all or a specified part of the instrumentation and control equipment in the instrumentation and control system one by one, and analyzes the obtained analysis data in turn, which can reduce the computing resources occupied by the fault analysis, thereby avoiding the problem of excessive resources occupied when uniformly obtaining the analysis information of each instrumentation and control equipment and uniformly analyzing the analysis information, and thus can help reduce the requirements of the fault analysis method on equipment performance.

Step 202: Input the analysis data into the fault diagnosis model to obtain the fault diagnosis result.

Among them, the fault diagnosis model is established in advance.

The fault diagnosis result includes whether the instrumentation and control equipment has a fault. Optionally, when the instrumentation and control equipment is diagnosed to have a fault, the diagnosis result may further include the fault type of the instrumentation and control equipment, such as: electromechanical fault, electrical fault, signal fault, and computer fault, etc., so that the equipment fault can be easily processed based on the fault diagnosis result.

Optionally, the fault diagnosis model can be constructed based on a mathematical model, for example, based on a parameter estimation method, a state estimation method or an equivalent space method, or it can be constructed based on a neural network model, or it can be constructed based on other methods. This embodiment does not limit the construction method of the fault diagnosis model.

In one example, the analysis data includes equipment inventory information and equipment status information, and the analysis data is input into a fault diagnosis model to obtain a fault diagnosis result, including: inputting the equipment inventory information and equipment status information into the fault diagnosis model to obtain a fault diagnosis result.

Correspondingly, the fault diagnosis model is established based on the model data, and the model data includes at least one set of sample data and the fault diagnosis results corresponding to the sample data, and the sample data includes sample ledger information and sample status information.

In one instance, the fault diagnosis model is a diagnostic data set constructed based on a large amount of sample data. During the fault diagnosis process, it is possible to determine whether the instrumentation and control equipment has a fault based on the degree of match between the analysis data and the diagnostic data in the diagnostic data set. At the same time, the diagnostic data set can be continuously enriched during use, thereby continuously improving the reliability of the fault diagnosis model.

In the above technical scheme, since the analysis data includes equipment inventory information and equipment status information, and the sample data used in the process of establishing the fault diagnosis model includes sample inventory information and sample status information, during the fault diagnosis process, the fault diagnosis model can combine the static information and dynamic information of the instrumentation and control equipment to perform fault analysis on the instrumentation and control equipment, which can help improve the accuracy of fault judgment.

Furthermore, since the instrumentation and control equipment may have a fault self-detection function, the analysis data may include fault information. At this time, the method of performing fault diagnosis based on the fault diagnosis model includes: determining whether there is fault information in the analysis data; when there is fault information in the analysis data, directly determining the fault diagnosis result based on the fault information, or further verifying the fault information based on other data to determine the fault diagnosis result; when there is no fault information in the analysis data, obtaining the fault diagnosis result based on analyzing the analysis data.

Step 203: When the fault diagnosis result indicates that the instrumentation and control equipment has a fault, the system configuration is analyzed based on the configuration information to obtain a configuration analysis result.

The configuration information is used to indicate the system configuration of the instrumentation and control system to which the instrumentation and control device belongs, and the instrumentation and control system includes at least one instrumentation and control device.

The configuration analysis result is used to indicate whether the system configuration is abnormal. Further, when it is determined that the system configuration is abnormal, the configuration analysis result may also include the abnormal location, such as the point where the abnormality occurs, so that the device failure can be handled based on the configuration analysis result.

In one example, the abnormal conditions that may occur in the system configuration are preset. In one example, the abnormal conditions of the system configuration are set based on the causal control logic between different types of instrumentation and control equipment. For example, when some instrumentation and control equipment that need to be associated with control are not associated with control, it is determined that the system configuration is abnormal; for another example, when the associated control relationship between the instrumentation and control equipment is wrong, it is determined that the system configuration is abnormal.

In one example, the configuration information includes the overall configuration composition, the number of configuration points and/or detailed information of each configuration point.

Correspondingly, the configuration information may be obtained by analyzing the original data obtained from the control device and/or the instrumentation and control device of the instrumentation and control system, for example: determining the configuration information of the instrumentation and control system in combination with the configuration conditions of each instrumentation and control device, or it may be directly obtained from the control device and/or the instrumentation and control device of the instrumentation and control system, for example: the configuration information is recorded in the control device of the instrumentation and control system. This embodiment does not limit the method for obtaining the configuration information.

In one example, the configuration information is dynamically updated. In one example, when the fault diagnosis result indicates that the instrumentation and control equipment is faulty, the configuration information is re-acquired, which can help improve the accuracy of the configuration analysis result. In actual implementation, the configuration information can also be updated regularly or in other ways, and this embodiment does not limit the updating method of the configuration information.

Since equipment failure may be caused by improper system configuration settings of the instrumentation and control system, if the faulty instrumentation and control equipment is simply repaired or replaced during the fault handling process, the cause of the equipment failure cannot be solved from the root, which may cause the instrumentation and control equipment to still be prone to failure. In the above technical solution, when it is determined that the instrumentation and control equipment has failed, the system configuration of the instrumentation and control system to which the instrumentation and control equipment belongs is further analyzed. This can help to identify the cause of the instrumentation and control equipment failure and prompt the staff in the case of abnormal system configuration, thereby helping to reduce the probability of damage to the instrumentation and control equipment due to abnormal system configuration, and thus help to improve the instrumentation and control system and improve the reliability of the instrumentation and control system.

Step 204: output the fault analysis result, which includes the fault diagnosis result and the configuration analysis result.

In one example, the fault analysis platform provides a user interaction interface, and the fault analysis results can be directly output through the user interaction interface.

In one example, the fault analysis platform can output an overall overview of the instrumentation and control system and the instrumentation and control equipment in the instrumentation and control system. Specifically, the fault analysis platform provides an information display interface for displaying the system configuration of the instrumentation and control system, the usage of the instrumentation and control equipment, fault diagnosis results, and configuration analysis results. Furthermore, the information display interface is also used to display data such as the network communication status between the various devices within the instrumentation and control system, the communication status between the instrumentation and control system and third-party devices, and the power management and temperature monitoring information of the instrumentation and control system, which can help to fully understand the overall status information of the instrumentation and control system. In actual implementation, the content displayed on the information display interface can be set according to actual needs, and this embodiment does not limit the content indicated by the information display interface.

In actual implementation, the information display interface can also display the analysis data of the instrumentation and control equipment and the changes in the analysis data, so that the status of the instrumentation and control equipment can be monitored easily.

In another example, outputting the fault analysis result includes: sending the fault analysis result to a target device, wherein the target device may be a device corresponding to an administrator and/or operator of the instrumentation and control device, which can help prompt the staff to handle the fault of the instrumentation and control device in a timely manner.

The implementation principle of the fault analysis method of the instrument and control equipment provided in this embodiment is: obtain the analysis data of the instrument and control equipment; input the analysis data into the fault diagnosis model to obtain the fault diagnosis result; when the fault diagnosis result indicates that the instrument and control equipment has a fault, analyze the system configuration based on the configuration information to obtain the configuration analysis result, and the configuration information is used to indicate the system configuration of the instrument and control system to which the instrument and control equipment belongs; output the fault analysis result, and the fault analysis result includes the fault diagnosis result and the configuration analysis result. By adopting the above technical scheme, it can help to improve the efficiency of fault handling, because when it is determined that the instrument and control equipment has a fault based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result including the fault diagnosis result and the configuration analysis result is output, which can help the staff to analyze the cause of the fault in combination with the fault diagnosis result and the configuration analysis result in the fault analysis result, so that the corresponding fault handling method can be determined, which can help to improve the efficiency of fault handling.

In some implementations, optionally, referring to FIG. 3 , in step 203, analyzing the system configuration based on the configuration information to obtain the configuration analysis result includes the following steps:

Step 301, determining causal control logic based on configuration information.

The causal control logic is used to indicate the association between different instrumentation and control devices in control, and the causal control logic is recorded in the configuration information. In one example, the causal control logic is determined based on the interlocking logic between the instrumentation and control devices.

In one example, determining the causal control logic based on the configuration information includes: determining the causal control logic related to the faulty instrumentation and control device based on the configuration information. This can help reduce the amount of causal control logic used for analysis.

In one example, the causal control logic associated with the instrumentation and control device is determined based on the configuration of the instrumentation and control device.

Further, determining the causal control logic based on the configuration information includes: determining the causal logic strategy related to the faulty instrument and control device and the causal control logic related to the associated instrument and control device of the faulty instrument and control device based on the configuration information.

The associated I&C equipment refers to other I&C equipment that is associated with the I&C equipment. The association between I&C equipment can be determined based on factors such as the type and deployment location of the I&C equipment, or can be pre-set. This embodiment does not limit the method for determining the association between I&C equipment.

Since the causal control logic corresponding to other instrumentation and control equipment besides the instrumentation and control equipment may also affect the working status of the instrumentation and control equipment, analyzing the causal control logic related to the associated instrumentation and control equipment with the faulty instrumentation and control equipment together can help improve the accuracy of the configuration analysis results.

In actual implementation, all causal control logics in the instrumentation and control system may also be determined based on the configuration information. This embodiment does not limit the scope of the causal control logic.

Step 302: Analyze the system configuration based on the causal control logic to obtain a configuration analysis result.

Optionally, the system configuration is analyzed based on the causal control logic to obtain a configuration analysis result, including: obtaining a logic control strategy; and analyzing the system configuration based on the causal control logic and the logic control strategy to obtain a configuration analysis result.

The logic control strategy is preset. In one example, the logic control strategy is extracted from the system configuration design specification and/or the configuration information corresponding to the template instrumentation and control system. In actual implementation, the logic control strategy can be continuously updated and improved during actual use, which can further improve the reference value of the logic control strategy.

In one example, the system configuration is analyzed based on the causal control logic and the logical control strategy to obtain a configuration analysis result, including: for each causal control logic, determining whether the causal control logic complies with the logical control strategy; in the case of a causal control logic that does not comply with the logical control strategy, generating a configuration analysis result corresponding to the configuration abnormality.

Optionally, in the case where there is causal control logic that does not conform to the logical control strategy, the causal control logic that does not conform to the logical control strategy is recorded in the configuration analysis results, which can help adjust the causal control logic that does not conform to the logical control strategy based on the configuration analysis results.

In the above technical solution, since the system configuration can be analyzed based on the causal control logic and the logical control strategy, this can help discover the unreasonableness in the causal control logic, thereby helping to improve the reference value of the configuration analysis results, and further help to improve the efficiency of fault handling.

In actual implementation, the system configuration may be analyzed based on the causal logic in other ways. This embodiment does not limit the way of analyzing the system configuration based on the causal logic.

In the above implementation, since the system configuration is analyzed based on the causal control logic in the configuration information, this can help determine whether the causal control logic in the system configuration is abnormal in the event of a device failure, thereby helping to determine the cause of the device failure in combination with the configuration analysis results, and further helping to improve fault handling efficiency.

In some implementations, optionally, referring to FIG. 4 , in step 203, analyzing the system configuration based on the configuration information to obtain the configuration analysis result includes the following steps:

Step 401: Determine whether there is any abnormality in the system configuration based on the configuration information.

In one example, the manner of determining whether the system configuration is abnormal based on the configuration information refers to the above steps 301 and 302, which will not be described in detail in this embodiment.

In another example, determining whether there is an abnormality in the system configuration based on the configuration information includes: determining whether there is a lack of causal control logic in the system configuration based on the logic control strategy and the configuration information; and determining that there is an abnormality in the system configuration when it is determined that there is a lack of causal control logic in the system configuration.

In actual implementation, whether the system configuration is abnormal may also be determined based on other methods. This embodiment does not limit the method for determining whether the system configuration is abnormal.

Step 402: When it is determined that the system configuration is abnormal, an abnormality handling suggestion corresponding to the system configuration is determined.

In one example, a system configuration anomaly is determined when the causal control logic in the configuration information does not conform to the logical control strategy. At this time, an abnormality handling suggestion corresponding to the system configuration is determined, including: suggesting that the causal control logic that does not conform to the logical control strategy be deleted.

In another example, the system configuration abnormality is determined when the causal control logic is missing in the system configuration. At this time, the abnormality handling suggestion corresponding to the system configuration is determined, including: it is recommended to add causal control logic between the configuration points that lack the causal control logic. Further, the abnormality handling suggestion also includes the type of causal logic that is recommended to be added.

In actual implementation, the exception handling suggestion corresponding to the system configuration may also be determined based on other methods. This embodiment does not limit the method for determining the exception handling suggestion.

Step 403: Generate a configuration analysis result including an exception handling suggestion.

In the above technical scheme, since it is determined whether the system configuration is abnormal in the process of analyzing the system configuration based on the configuration information, and when it is determined that the system configuration is abnormal, the abnormality handling suggestions corresponding to the system configuration are determined, a configuration analysis result including the abnormality handling suggestions is generated, and the fault analysis result includes the configuration analysis result. In this way, the staff can handle the system configuration abnormality together with the abnormality handling suggestions in the process of handling the fault based on the fault analysis result, which can help improve the reliability of the instrumentation and control system, and can also help improve the efficiency of fault handling.

In some implementations, optionally, referring to FIG. 5 , step 101, obtaining analysis data of an instrumentation and control device includes the following steps:

Step 501, when it is detected that the configuration information of the instrumentation and control system has changed, the configuration variable information is determined.

The configuration variable information is used to indicate the change of the system configuration. In one example, the configuration variable information is represented by configuration points.

Optionally, the fault analysis method for instrumentation and control equipment further includes: acquiring real-time configuration information; and comparing the real-time configuration information with reference configuration information to obtain monitoring results.

Among them, the monitoring results are used to indicate whether the configuration information of the instrumentation and control system has changed.

The reference configuration information is maintained by the fault analysis platform. In one example, the reference configuration information is determined by the initial configuration information of the instrumentation and control system or the configuration information obtained by the most recent update.

In one example, comparing the real-time configuration information with the reference configuration information includes: comparing configuration points in the real-time configuration information with configuration points in the reference configuration information.

In one instance, the configuration points in the real-time configuration information are compared with the configuration points in the reference configuration information, including: determining whether the number of configuration points in the real-time configuration information is the same as the number of configuration points in the reference configuration information; when the number of configuration points in the real-time configuration information is different from the number of configuration points in the reference configuration information, determining that the configuration information of the instrumentation and control system has changed.

Furthermore, the configuration points in the real-time configuration information are compared with the configuration points in the reference configuration information, and it also includes: when the number of configuration points in the real-time configuration information is the same as the number of configuration points in the reference configuration information, determining whether the configuration points in the real-time configuration information correspond to the configuration points in the reference configuration information; when the configuration points in the real-time configuration information do not correspond to the configuration points in the reference configuration information, determining that the configuration information of the instrumentation and control system has changed.

Correspondingly, determining the configuration variable information includes: determining newly added and/or deleted configuration points in the real-time configuration information.

In another example, comparing the real-time configuration information with the reference configuration information includes: comparing the causal control logic in the real-time configuration information with the causal control logic in the reference configuration information. Optionally, the comparison method of the causal control logic is the same as the comparison method of the configuration points, which is not repeated in this embodiment.

Correspondingly, determining the configuration variable information includes: determining configuration points corresponding to the newly added and/or deleted causal control logic in the real-time configuration information.

In actual implementation, the configuration changes of the instrumentation and control system can also be monitored in other ways, for example: the configuration changes of the instrumentation and control system are monitored based on the configuration change information transmitted by the control device of the instrumentation and control system. This embodiment does not limit the monitoring method of the configuration information.

Step 502: Determine the target instrumentation and control equipment based on the configuration variable information.

In one example, determining a target instrumentation and control device based on configuration information includes: determining an instrumentation and control device corresponding to a newly added configuration point in real-time configuration information as a target instrumentation and control device, and/or determining an instrumentation and control device corresponding to a configuration point associated with a configuration point deleted in real-time configuration information as a target instrumentation and control device.

In another example, determining the target instrumentation and control device based on the configuration information includes: determining the instrumentation and control device corresponding to the configuration point corresponding to the causal control logic added and/or deleted in the real-time configuration information as the target instrumentation and control device.

In actual implementation, other instrumentation and control devices related to the configuration variable information may also be determined as target instrumentation and control devices. This embodiment does not limit the method for determining the target instrumentation and control devices.

Step 503 , obtaining analysis data corresponding to the target instrumentation and control equipment to perform fault analysis on the target instrumentation and control equipment, that is, executing steps 202 to 204 .

In one example, obtaining analysis data corresponding to the target instrumentation and control equipment includes: obtaining analysis data corresponding to the target instrumentation and control equipment multiple times at preset time intervals, and performing fault analysis on the target instrumentation and control equipment based on the analysis data after each acquisition of the analysis data. Since the impact of system configuration changes on instrumentation and control equipment may accumulate over time, obtaining analysis data corresponding to the target instrumentation and control equipment multiple times at preset time intervals can help accurately analyze the impact of configuration changes on the target instrumentation and control equipment, thereby helping to promptly discover equipment failures caused by system configuration changes.

Since the system configuration of the instrumentation and control system is usually designed according to specifications, changes in the system configuration of the instrumentation and control system may cause changes in the device status of the related instrumentation and control equipment in the instrumentation and control system, and even cause failures in the instrumentation and control equipment. Based on this, in the above implementation, when the system configuration of the instrumentation and control system is monitored to change, the configuration variable information is determined, and the target instrumentation and control equipment is determined based on the configuration variable information, and a failure analysis is performed on the target instrumentation and control equipment, which can help to timely discover equipment failures caused by changes in the system configuration, thereby helping to handle equipment failures in a timely manner, and also helps to improve the stability of the instrumentation and control system.

The embodiment of the present application also provides an electronic device. In one example, the electronic device is the fault analysis module 120 in the fault analysis system of the instrumentation and control equipment shown in FIG1 above. In actual implementation, the electronic device can also be implemented as other devices. The embodiment does not limit the type of electronic device. As shown in FIG6 , the electronic device 600 shown in FIG6 includes: a processor 601 and a memory 603. Among them, the processor 601 and the memory 603 are connected, such as through a bus 602. Optionally, the electronic device 600 may also include a transceiver 604. It should be noted that in actual applications, the transceiver 604 is not limited to one, and the structure of the electronic device 600 does not constitute a limitation on the embodiment of the present application.

Processor 601 may be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It may implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. Processor 601 may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like.

The bus 602 may include a path for transmitting information between the above components. The bus 602 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. The bus 602 may be divided into an address bus, a data bus, etc. For ease of representation, FIG6 only uses one thick line, but does not mean that there is only one bus or one type of bus.

The memory 603 may be a ROM (Read Only Memory) or other types of static storage devices that can store static information and instructions, a RAM (Random Access Memory) or other types of dynamic storage devices that can store information and instructions, or an EEPROM (Electrically Erasable Programmable Read Only Memory), a disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program codes in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto.

The memory 603 is used to store the application code for executing the solution of the present application, and the execution is controlled by the processor 601. The processor 601 is used to execute the application code stored in the memory 603 to implement the contents shown in the above method embodiment.

The electronic device includes, but is not limited to, mobile terminals such as mobile phones, laptop computers, PDAs (personal digital assistants), PADs (tablet computers), etc., and fixed terminals such as digital TVs, desktop computers, etc. It can also be a server, etc. The electronic device shown in FIG6 is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

The embodiment of the present application also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed in a computer, the computer is caused to execute the fault analysis method of the instrumentation and control equipment provided in the above embodiment.

It should be understood that although the steps in the flowchart of the accompanying drawings are shown in sequence according to the instructions of the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise clearly stated in this document, the execution of these steps is not strictly limited in order and can be performed in other orders.

The above are only some implementation methods of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims (8)

1. A fault analysis method for a device controlled by a meter, the method being used in a fault analysis platform and comprising:

Acquiring analysis data of the instrument control equipment;

Inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result;

analyzing the system configuration based on configuration information to obtain a configuration analysis result when the fault diagnosis result indicates that the instrument control equipment has a fault, wherein the configuration information is used for indicating the system configuration of the instrument control system to which the instrument control equipment belongs, and the configuration information is determined based on an association control relation among the instrument control equipment;

outputting a fault analysis result, wherein the fault analysis result comprises the fault diagnosis result and the configuration analysis result;

The system configuration is analyzed based on the configuration information to obtain a configuration analysis result, which comprises the following steps:

Determining cause and effect control logic based on the configuration information, the cause and effect control logic being determined based on interlock logic between the instrument control devices;

Acquiring a logic control strategy, wherein the logic control strategy is extracted from configuration information corresponding to a system configuration design specification and/or a template instrument control system;

analyzing the system configuration based on the causal control logic and the logic control strategy to obtain a configuration analysis result;

The determining causal control logic based on the configuration information comprises: determining causal control logic associated with the faulty instrumentation based on the configuration information and causal control logic associated with an associated instrumentation of the faulty instrumentation;

The system configuration is analyzed based on the causal control logic and the logic control strategy to obtain a configuration analysis result, which comprises the following steps: for each of the cause and effect control logic, determining whether the cause and effect control logic complies with the logic control strategy; and generating a configuration analysis result corresponding to the configuration abnormality under the condition that the causal control logic which does not accord with the logic control strategy exists.

2. The method of claim 1, wherein analyzing the system configuration based on the configuration information to obtain a configuration analysis result comprises:

determining whether the system configuration is abnormal based on the configuration information;

under the condition that the system configuration is determined to be abnormal, determining an abnormality processing suggestion corresponding to the system configuration;

And generating configuration analysis results containing the exception handling suggestions.

3. The method of claim 1, wherein the obtaining analysis data for the controlled device comprises:

under the condition that the change of the configuration information of the instrument control system is monitored, determining configuration variable information, wherein the configuration variable information is used for indicating the change condition of the configuration data;

determining target instrument control equipment based on the configuration variable information;

And acquiring analysis data corresponding to the target instrument control equipment so as to perform fault analysis on the target instrument control equipment.

4. The method of claim 1, wherein the analysis data comprises device ledger information, and the obtaining analysis data comprises:

Acquiring original data of the instrument control equipment;

analyzing the original data to obtain equipment data of at least one data type;

and carrying out integrated processing on the equipment data corresponding to the instrument control equipment based on the data type to obtain the equipment ledger information.

5. The method of claim 1, wherein the analysis data includes equipment ledger information and equipment status information, and wherein the inputting the analysis data into the fault diagnosis model to obtain the fault diagnosis result includes:

Inputting the equipment account information and the equipment state information into a fault diagnosis model to obtain the fault diagnosis result;

the fault diagnosis model is established based on model data, the model data comprises at least one group of sample data and fault diagnosis results corresponding to the sample data, and the sample data comprises sample ledger information and sample state information.

6. A fault analysis system of a meter control device, wherein the fault analysis system comprises a data acquisition module (110), a fault analysis module (120) and a data output module (130);

The data acquisition module (110) is used for acquiring data information of the instrument control equipment in the instrument control system and sending the data information to the fault analysis module (120);

The fault analysis module (120) is configured to perform the fault analysis method of the instrument control device according to any one of claims 1 to 5, and send a fault analysis result to the data output module (130);

the data output module (130) is used for outputting the fault analysis result.

7. An electronic device, the electronic device comprising:

At least one processor;

A memory;

At least one application program, wherein the at least one application program is stored in the memory and configured to be executed by the at least one processor, the at least one application program configured to: a fault analysis method of the instrument control device according to any one of claims 1 to 5 is performed.

8. A computer-readable storage medium having stored thereon a computer program, characterized in that the computer program, when executed in a computer, causes the computer to execute the fault analysis method of the instrument control device according to any one of claims 1 to 5.