Hef 4069
Hef 4069
Hef 4069
DATA SHEET
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HEF4069UB
gates
Hex inverter
Product specification January 1995
File under Integrated Circuits, IC04
Philips Semiconductors Product specification
HEF4069UB
Hex inverter
gates
DESCRIPTION
The HEF4069UB is a general purpose hex inverter. Each
of the six inverters is a single stage.
January 1995 2
Philips Semiconductors Product specification
HEF4069UB
Hex inverter
gates
AC CHARACTERISTICS
VSS = 0 V; Tamb = 25 °C; CL = 50 pF; input transition times ≤ 20 ns
VDD
TYPICAL FORMULA FOR P (µW)
V
Dynamic power 5 600 fi + ∑ (foCL) × VDD2 where
dissipation per 10 4 000 fi + ∑ (foCL) × VDD2 fi = input freq. (MHz)
package (P) 15 22 000 fi + ∑ (foCL) × VDD2 fo = output freq. (MHz)
CL = load capacitance (pF)
∑ (foCL) = sum of outputs
VDD = supply voltage (V)
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Philips Semiconductors Product specification
HEF4069UB
Hex inverter
gates
January 1995 4
Philips Semiconductors Product specification
HEF4069UB
Hex inverter
gates
APPLICATION INFORMATION
Some examples of applications for the HEF4069UB are shown below.
In Fig.7 an astable relaxation oscillator is given. The oscillation frequency is mainly determined by R1C1, provided
R1 << R2 and R2C2 << R1C1.
(a)
(b)
V DD + V ST 2 V DD – V ST
T 1 = R1C1 In ----------------------------- and T 2 = R1C1 In ---------------------------------- where
V ST V DD – V ST
VST is the signal threshold level of the inverter. The period is fairly independent
of VDD, VST and temperature. The duty factor, however, is influenced by VST.
Fig.7 (a) Astable relaxation oscillator using two HEF4069UB inverters; the diodes may be BAW62; C2 is a
parasitic capacitance. (b) Waveforms at the points marked A, B, C and D in the circuit diagram.
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Philips Semiconductors Product specification
HEF4069UB
Hex inverter
gates
Fig.8 Crystal oscillator for frequencies up to 10 MHz, using two HEF4069UB inverters.
Fig.9 Voltage gain (VO/VI) as a function of supply Fig.10 Supply current as a function of supply voltage.
voltage.
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Philips Semiconductors Product specification
HEF4069UB
Hex inverter
gates
Fig.12 Test set-up for measuring forward transconductance gfs = dio/dvi at vo is constant (see also graph
Fig.13).
A : average,
B : average + 2 s,
C : average − 2 s, where:
‘s’ is the observed standard
deviation.
Fig.13 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C.
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