WO2006016486A1 - 薬液供給システム - Google Patents
薬液供給システム Download PDFInfo
- Publication number
- WO2006016486A1 WO2006016486A1 PCT/JP2005/013919 JP2005013919W WO2006016486A1 WO 2006016486 A1 WO2006016486 A1 WO 2006016486A1 JP 2005013919 W JP2005013919 W JP 2005013919W WO 2006016486 A1 WO2006016486 A1 WO 2006016486A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- supply
- chemical
- chemical liquid
- pump
- discharge
- Prior art date
Links
- 239000000126 substance Substances 0.000 title claims abstract description 169
- 239000007788 liquid Substances 0.000 title claims abstract description 62
- 238000007599 discharging Methods 0.000 claims description 6
- 230000008859 change Effects 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 abstract description 18
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 238000010276 construction Methods 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 13
- 238000009434 installation Methods 0.000 description 8
- 239000012528 membrane Substances 0.000 description 6
- 230000008901 benefit Effects 0.000 description 4
- 239000000428 dust Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000004043 responsiveness Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000003749 cleanliness Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
- F04B43/02—Machines, pumps, or pumping installations having flexible working members having plate-like flexible members, e.g. diaphragms
- F04B43/06—Pumps having fluid drive
- F04B43/073—Pumps having fluid drive the actuating fluid being controlled by at least one valve
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
- F04B43/12—Machines, pumps, or pumping installations having flexible working members having peristaltic action
- F04B43/14—Machines, pumps, or pumping installations having flexible working members having peristaltic action having plate-like flexible members
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04F—PUMPING OF FLUID BY DIRECT CONTACT OF ANOTHER FLUID OR BY USING INERTIA OF FLUID TO BE PUMPED; SIPHONS
- F04F1/00—Pumps using positively or negatively pressurised fluid medium acting directly on the liquid to be pumped
- F04F1/06—Pumps using positively or negatively pressurised fluid medium acting directly on the liquid to be pumped the fluid medium acting on the surface of the liquid to be pumped
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/2931—Diverse fluid containing pressure systems
- Y10T137/3115—Gas pressure storage over or displacement of liquid
- Y10T137/3124—Plural units
Definitions
- the present invention relates to a chemical solution supply system for inhaling and discharging a chemical solution by a pump and dropping the discharged chemical solution.
- the present invention relates to a chemical solution supply system suitable for use in a chemical solution use process of a semiconductor manufacturing apparatus such as a chemical solution coating process such as a photoresist solution.
- a chemical solution supply system as disclosed in Patent Document 1 has been proposed in order to apply a predetermined amount of a chemical solution such as a photoresist solution to a semiconductor wafer.
- a flexible tube is interposed in the flow channel of the chemical solution in the pump, and an elastically deformable bellows is provided outside the flexible tube.
- the bellows has a small bellows portion and a large bellows portion with different inner diameters arranged side by side in the axial direction of the flexible tube, and there is no space between the bellows and the flexible tube.
- An incompressible medium is enclosed.
- the small bellows part is expanded and the large bellows part is contracted by the motor actuator assembled integrally with the pump, and the volume of the flexible tube is reduced via the incompressible medium, and the chemical solution is discharged.
- the small bellows part is contracted and the large bellows part is expanded, the volume of the flexible tube is increased through the incompressible medium, and the chemical solution is inhaled.
- the motor actuator is expensive and complicates the system configuration.
- the heat generated at the time of operation has a large amount of heat, and there is a risk of damaging a semiconductor wafer disposed in the vicinity of the pump so that the chemical liquid can be supplied by the pump.
- Patent Document 2 a technique for solving the above problem is disclosed in Patent Document 2, for example.
- a diaphragm that separates a pump chamber for filling the pump with a chemical solution and a pressurizing chamber (working chamber) is used.
- the volume of the pump chamber is increased in order to inhale the chemical solution.
- the air pressure in the pressurization chamber of the pump is lowered by a regulator, and the diaphragm is deformed to the anti-pump chamber side.
- the chemical solution supply system uses a motor with a large calorific value! Therefore, there is no possibility of damaging the semiconductor wafer due to heat.
- the pump is equipped with a spring for deforming the diaphragm to the anti-pump chamber side, it becomes a problem in miniaturizing the pump.
- Patent Document 1 Japanese Patent Laid-Open No. 10-61558
- Patent Document 2 Japanese Patent Laid-Open No. 11-343978
- the present invention relates to a discharge pump for dripping a tip-nozzle chemical solution, which prevents heat generation during operation and eliminates an urging means for operating the variable volume member to the side opposite to the pump chamber.
- the main purpose is to provide a chemical solution supply system that can be realized.
- the chemical solution supply system according to the present invention is configured as follows. That is,
- the pump chamber filled with the chemical and the working chamber are partitioned by a variable volume member, and the volume of the pump chamber is reduced by supplying the working gas to the working chamber to reduce the volume of the pump chamber.
- a discharge pump for discharging the chemical liquid based on
- An open / close-type discharge-side shutoff valve provided between the discharge pump and the tip nozzle; a first state in which the working gas having a set pressure is supplied to the working chamber; and a first state in which the working chamber is opened to the atmosphere.
- Chemical supply means for supplying the chemical liquid to the discharge pump with a positive pressure
- An open / close-type supply-side shut-off valve provided between the discharge pump and the chemical solution supply means; When discharging the chemical liquid, the supply side shut-off valve is switched to the closed position, the discharge side shut-off valve is switched to the open position, and the switching means is switched to the first state.
- the supply-side shut-off valve When the discharge pump is filled with the chemical solution, the supply-side shut-off valve is switched to the open position, the discharge-side shut-off valve is switched to the closed position, and the switching means is switched to the second state so that the chemical solution by the chemical solution supply means Control means for controlling the both shut-off valves and the switching means for starting supply;
- the downsizing of the discharge pump has advantages in the following points.
- the downsizing of the discharge pump can make the installation space for the discharge pump more narrow than ever.
- the discharge pump is arranged in the vicinity of the semiconductor wafer in order to improve the accuracy of the discharge amount of the chemical solution.
- the installation space including this semiconductor wafer requires the highest level of cleanliness. Considering the cost of cleaning, it is required to make such a space as narrow as possible.
- the above configuration can greatly reduce the cost because the installation space can be narrowed.
- the discharge pump can be installed closer to the tip nozzle than ever before.
- the working chamber is evacuated to drive the volume variable member to the working chamber side to expand the volume of the pump chamber so that the pump itself performs the chemical solution suction operation.
- Conceivable It is not necessary to incorporate a spring or the like into the pump even with a powerful configuration It becomes. However, vacuuming is artificially creating a harsh state, so various problems may occur, such as the need for a structure that can withstand such conditions.
- a spring or the like is not required and a discharge pump can be reduced in size by providing a separate chemical supply means and supplying a chemical to the discharge pump. is there.
- the filter when the filter is provided between the discharge pump and the chemical liquid supply container, the chemical liquid in the pump chamber becomes negative pressure when the working chamber is vacuumed to perform the chemical liquid suction operation. Then, a pressure difference occurs between the front and back of the filter due to the pressure loss of the filter, and bubbles that damage the dropping target are generated.
- the chemical liquid having a positive pressure is supplied from the chemical liquid supply means to the discharge pump, it is possible to prevent generation of bubbles when the chemical liquid passes through the filter.
- the other end of the chemical liquid supply pipe is disposed in the chemical liquid in the chemical liquid supply container, and the chemical liquid supply means is the control means.
- the chemical liquid supply means is the control means.
- a chemical supply command from a configuration in which a pressurized gas at a set pressure is supplied to the space above the chemical solution inside the sealed chemical solution supply container and the chemical solution is sent out at a positive pressure.
- a pressurized gas having a set pressure is supplied to the space above the chemical solution inside the chemical solution supply container in response to a command for starting the supply of the chemical solution with the control means, and the discharge pump is thereby supplied from the chemical solution supply container.
- the chemical is sent out.
- the pressure in the space above the chemical solution becomes the supply pressure of the chemical solution as it is.
- This supply pressure is a positive pressure compared to the atmospheric pressure.
- the pressure in the space above the chemical liquid is set to the set pressure almost simultaneously with the supply of the pressurized gas, so that the supply pressure can be set to the set pressure with high responsiveness to the chemical liquid supply start command.
- the supply pressure can be maintained constant, and thus the supply of the chemical solution can be easily controlled. Furthermore, when the chemical solution supply system is not in operation, no chemical solution supply command is issued from the control means. Therefore, when the chemical solution supply container is replaced, the space above the chemical solution is pressurized. Therefore, the pressurized gas does not inadvertently leak the chemical supply container force.
- one end is connected to a discharge pump.
- the other end of the chemical solution supply pipe is placed in the chemical solution in the chemical solution supply container, and the chemical solution supply means constantly supplies pressurized gas at a set pressure to the space above the chemical solution inside the sealed chemical solution supply container to positively supply the chemical solution.
- the pressure is sent out.
- the pressurized gas having a set pressure is constantly supplied to the space above the chemical solution inside the chemical solution supply container, and thereby the chemical solution is sent from the chemical solution supply container to the discharge pump. At this time, the pressure in the space above the chemical solution becomes the supply pressure of the chemical solution as it is.
- This supply pressure is positive compared to atmospheric pressure.
- the pressure in the space above the chemical solution is set to the set pressure almost simultaneously with the supply of the pressurized gas, so that the supply pressure can be set to the set pressure with high responsiveness to the start command for supplying the chemical solution.
- the supply pressure can be kept constant, so that the control of the chemical solution supply becomes easy.
- the control burden on the control means can be reduced.
- FIG. 1 is a circuit explanatory diagram showing an entire circuit in an embodiment of a chemical solution supply system.
- FIG. 2 is a time chart showing an operation sequence in one embodiment of the chemical liquid supply system.
- the chemical solution supply system includes a discharge pump 11 for discharging the chemical solution. Although the internal structure of the discharge pump 11 is not shown, a space is formed inside it.
- the internal space is partitioned into a working chamber in which air pressure acts and a pump chamber filled with a chemical solution by a flexible membrane such as a diaphragm constituting a variable volume member.
- a flexible membrane such as a diaphragm constituting a variable volume member.
- a supply pipe 12 is connected to a supply port (not shown) provided on the chemical solution supply side of the discharge pump 11.
- the other end of the supply pipe 12 is led into a resist solution R as a chemical solution of the resist bottle 15 through a supply side valve 13 and a filter 14.
- the resist bottle 15 forms a chemical supply container.
- the supply side valve 13 is an inexpensive air operated valve that can be simply switched between an open position and a closed position, and constitutes a supply side shut-off valve.
- the filter 14 removes dust and the like when the resist solution R passes through the supply pipe 12.
- a pressure pipe 16 is inserted into the resist bottle 15, and one end thereof is disposed in a space (upper layer space) 15a above the resist solution R.
- the upper space 15a in the resist bottle 15 is sealed.
- a first switching valve 17 which is a two-position three-port electromagnetic switching valve.
- One of the remaining two ports of the first switching valve 17 is open to the atmosphere, and the other is connected to the air source 19 via the pressure control valve 18.
- the electromagnetic solenoid provided in the first switching valve 17 is OFF, the inside of the pressurizing pipe 16 is atmospheric. Released.
- the electromagnetic solenoid is ON, the pressure pipe 16 is communicated with the air source 19 via the pressure control valve 18.
- Air compressed by a compressor or the like is supplied from the air source 19, and the compressed air is set to a pressure set by the pressure control valve 18, and then the compressed air having the set pressure is supplied to the first switching valve 17. Yes. Therefore, when the electromagnetic solenoid of the first switching valve 17 is turned on, the compressed air set to the set pressure by the pressure control valve 18 is supplied to the upper space 15 a in the resist bottle 15.
- the chemical solution supply means includes the first switching valve 17, the pressure control valve 18, and the like.
- a discharge pipe 21 is connected to a discharge port (not shown) provided on the chemical liquid discharge side of the discharge pump 11.
- the other end of the discharge pipe 21 is a tip nozzle.
- the tip nozzle is directed downward and is arranged so that the resist solution R is dropped at the center position of the semiconductor wafer 47 placed on the rotating plate 46.
- a discharge side shutoff valve 22 is interposed in the middle of the discharge pipe 21 leading to the tip nozzle.
- the discharge side shutoff valve 22 is the air operated valve described above.
- the resist solution R in the resist bottle 15 is guided along the flow path to the tip nozzle of the discharge pipe 21 via the supply pipe 12, the pump chamber in the discharge pump 11 and the discharge pipe 21. It is becoming like that. In order to improve the accuracy of the discharge amount of the resist solution R, it is preferable to shorten the discharge pipe 21. Accordingly, the discharge pump 11 and the discharge side shut-off valve 22 are arranged in the vicinity of the rotating plate 46 on which the semiconductor wafer 47 is placed.
- the discharge pump 11 is provided with a supply / discharge port (not shown) communicating with the working chamber, and an air pipe 25 is connected to the supply / discharge port.
- the air piping 25 is connected to a second switching valve 26 which is a two-position three-port electromagnetic switching valve.
- the second switching valve 26 constitutes switching means. One of the remaining two ports of the second switching valve 26 is open to the atmosphere, and the other is connected to an air source 28 via an electropneumatic regulator 27.
- the air piping 25 is opened to the atmosphere when the electromagnetic solenoid provided in the second switching valve 26 is OFF, and the air piping 25 is communicated with the air source 28 via the electropneumatic regulator 27 when the electromagnetic solenoid is ON.
- the supply side valve 13, the first switching valve 17, the second switching valve 26, the electropneumatic regulator 27, and the discharge side shut-off valve 22 are connected to a controller 29 including a microcomputer or the like.
- the controller 29 constitutes a control means. Then, the electromagnetic solenoids of the first switching valve 17 and the second switching valve 26 are turned ON / OFF by a signal from the controller 29.
- the supply side valve 13 and the discharge side shut-off valve 22 are individually turned ON / OFF by the controller 29 to control the open / close state thereof. Further, a signal for setting the pressure of the compressed air is sent from the controller 29 to the electropneumatic regulator 27.
- the first command signal from the controller 29 sets the compressed air of the air source 28 to the pressure set by the electropneumatic regulator 27 , and the compressed air of the set pressure is supplied to the second switching valve 26. ing.
- the supply side valve 13 is switched to the closed position.
- the supply pipe 12 is closed at the position of the supply side valve 13.
- the fifth command signal from the controller 29 is set to the OFF level, and the first switching valve 17 is switched to the closed position.
- the pressurization to the upper space 15a in the resist bottle 15 is stopped.
- the supply of the resist solution R is stopped in a state in which the pump chamber of the discharge pump 11 is filled with the resist solution R.
- the supply and filling of the resist solution R will be described later.
- the electromagnetic solenoid of the second switching valve 26 is turned ON by the fourth command signal from the controller 29, and the second switching valve 26 is switched to the open position. Then, the compressed air having the set pressure supplied to the second switching valve 26 flows into the working chamber. Thereby, the flexible membrane presses the pump chamber by the pressure in the working chamber, so that the pressure in the working chamber becomes the discharge pressure of the resist solution R filled in the pump chamber as it is.
- the discharge-side shut-off valve 22 is switched to the open position. .
- the discharge pipe 21 is opened, and the resist solution R is dropped from the tip nozzle of the discharge pipe 21 based on the pressure in the pump chamber.
- the third command signal from the controller 29 is turned OFF at the timing t3 when a predetermined dropping time has elapsed.
- the discharge-side shutoff valve 22 is switched to the closed position. As a result, the discharge pipe 17 is closed, and the dropping operation of the resist solution R is completed.
- the second command signal and the fifth command signal from the controller 29 are also turned ON.
- the supply side valve 13 is switched to the open position, and the supply pipe 12 is opened.
- the fifth command signal is turned ON, the first switching valve 17 is switched to the open position.
- the compressed air having the set pressure supplied to the first switching valve 17 is supplied to the upper layer space 15 a in the resist bottle 15. Since the upper space 15a is sealed, when compressed air is supplied, the pressure in the upper space 15a becomes the set pressure of the atmospheric pressure compressed air, which pressurizes the resist solution R.
- the pressure in the upper space 15a becomes the supply pressure of the resist solution R in the supply pipe 12 as it is.
- This supply pressure is a positive pressure compared to the atmospheric pressure. Since the supply pipe 12 is open, the resist solution R is supplied and filled into the pump chamber of the discharge pump 11 while dust and the like are removed by the filter 14 at this supply pressure. Since the pump chamber is filled with the resist solution R by such pressure and pressure feeding, it is not necessary to provide a chemical solution suction mechanism in the discharge pump 11 itself. Therefore, the discharge pump 11 itself can be downsized.
- the positive pressure resist chemical R is pressurized and fed into the pump chamber of the discharge pump 11. For this reason, it is not necessary to adopt a configuration in which the flexible film of the discharge pump 11 is driven to the working chamber side by using a spring or the like to perform the suction operation of the resist liquid R as in the prior art. This eliminates the electric motor so that the semiconductor wafer 47 is not damaged by heat, and the discharge pump 11 itself can be further downsized.
- the installation space of the discharge pump 11 can be made narrower than ever.
- the discharge pump 11 is disposed in the vicinity of the rotating plate 46 on which the semiconductor wafer 47 is placed.
- the installation space including the rotating plate 46 is required to have the highest level of cleanliness. The power required to make such a space as small as possible when considering the cost of taring, can greatly contribute to cost reduction in that the installation space described above can be reduced.
- the downsizing of the discharge pump 11 makes it possible to install the discharge pump 11 closer to the tip nozzle than ever before.
- the working chamber is evacuated to drive the flexible membrane to the working chamber side to expand the volume of the pump chamber, and the pump itself performs a chemical solution suction operation. It is possible to do this. It is not necessary to incorporate a spring or the like into the discharge pump 11 even with a powerful configuration. However, the construction of evacuating the working chamber is artificially harsh Since it creates a state, various problems may occur, such as the need for a structure that can withstand it. In this regard, according to the present embodiment, when a separate pressurizing and pressure feeding means is provided and the resist solution R is supplied to the discharge pump 11 by this, the spring or the like is not required with a very simple configuration, and the discharge is performed. There is an advantage that the pump 11 can be downsized.
- the resist solution R in the pump chamber becomes negative pressure. Then, a pressure difference occurs between the front and rear of the filter 14 due to the pressure loss of the filter 14, and bubbles that damage the semiconductor wafer 47 are generated.
- the resist liquid R having a positive pressure is supplied to the discharge pump 11, it is possible to prevent bubbles from being generated when the resist liquid R passes through the filter 14.
- the resist solution R is used as the chemical solution.
- the target for dropping the chemical solution is based on the semiconductor wafer 47. Accordingly, the chemical solution and the target for dropping the chemical solution may be other than that.
- a pressure sensor is provided between the discharge pump 11 and the discharge side shut-off valve 22, and the discharge pump 1
- the electropneumatic regulator 27 is operated in accordance with the amount of deviation between the set pressure of compressed air (equivalent to the discharge pressure) and the hydraulic pressure signal of the pressure sensor force based on the first command signal from the controller 29. Compressed air is adjusted so that the pressure becomes the set pressure.
- the discharge pressure can be easily controlled. It can be carried out.
- the resist solution R is supplied and filled into the pump chamber of the discharge pump 11 by pressurizing and feeding the upper space 15a of the resist bottle 15, but instead, a motor or the like is used.
- the resist solution R may be supplied by arranging a pump using this actuator on the supply side. Even with a powerful configuration, the effects of downsizing the discharge pump 11 and preventing foaming can be obtained. However, such a pump has a problem that the time lag until the power discharge pressure is set to the set pressure upon receiving the drive signal is large, and there is a problem that it is difficult to control the pump discharge pressure (supply pressure) to be constant. . With such viewpoint power, it is preferable to supply by pressure and pressure feeding according to the above embodiment.
- the first switching valve 17 and the pressure control valve 18 are replaced with a manual valve (for manually switching the upper space 15a to the open state), a fixed regulator, and the like.
- the upper space 15a may be pressurized. In this way, there is an advantage that the control burden can be reduced compared to the case of the above embodiment.
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Reciprocating Pumps (AREA)
- Coating Apparatus (AREA)
- Devices For Dispensing Beverages (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020077005377A KR101132118B1 (ko) | 2004-08-09 | 2005-07-29 | 약액 공급 시스템 |
US11/659,727 US7988429B2 (en) | 2004-08-09 | 2005-07-29 | Chemical liquid supply system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004232071A JP4541069B2 (ja) | 2004-08-09 | 2004-08-09 | 薬液供給システム |
JP2004-232071 | 2004-08-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006016486A1 true WO2006016486A1 (ja) | 2006-02-16 |
Family
ID=35839259
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/013919 WO2006016486A1 (ja) | 2004-08-09 | 2005-07-29 | 薬液供給システム |
Country Status (5)
Country | Link |
---|---|
US (1) | US7988429B2 (ja) |
JP (1) | JP4541069B2 (ja) |
KR (1) | KR101132118B1 (ja) |
CN (1) | CN101018950A (ja) |
WO (1) | WO2006016486A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8033801B2 (en) * | 2006-11-24 | 2011-10-11 | Ckd Corporation | Liquid chemical supply system and liquid chemical supply control device |
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JP4697882B2 (ja) * | 2006-05-19 | 2011-06-08 | 東京エレクトロン株式会社 | 処理液供給装置及び処理液供給方法並びに処理液供給用制御プログラム |
JP4445987B2 (ja) | 2007-09-06 | 2010-04-07 | 日本ピラー工業株式会社 | 流体機器と継手との接続構造 |
JP4932665B2 (ja) * | 2007-10-16 | 2012-05-16 | 東京エレクトロン株式会社 | 処理液供給ユニット、液処理装置、処理液供給方法および記憶媒体 |
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JP5741549B2 (ja) * | 2012-10-09 | 2015-07-01 | 東京エレクトロン株式会社 | 処理液供給方法、処理液供給装置及び記憶媒体 |
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US10302077B2 (en) * | 2015-06-11 | 2019-05-28 | Ckd Corporation | Liquid supply system and method for controlling liquid supply system |
JP6626322B2 (ja) * | 2015-11-27 | 2019-12-25 | Ckd株式会社 | 気体圧駆動機器、及びその制御方法 |
JP6920133B2 (ja) * | 2017-08-23 | 2021-08-18 | 株式会社Screenホールディングス | 処理液供給装置 |
CN113187741B (zh) * | 2021-04-29 | 2022-12-02 | 长鑫存储技术有限公司 | 液体回吸系统及回吸方法 |
CN118391236A (zh) * | 2024-06-28 | 2024-07-26 | 宁波润华全芯微电子设备有限公司 | 一种光刻胶恒压泵 |
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JP3863292B2 (ja) | 1998-05-29 | 2006-12-27 | シーケーディ株式会社 | 液体供給装置 |
US6062442A (en) * | 1998-11-03 | 2000-05-16 | United Microelectronics Corp. | Dispense system of a photoresist coating machine |
US6206240B1 (en) * | 1999-03-23 | 2001-03-27 | Now Technologies, Inc. | Liquid chemical dispensing system with pressurization |
US6460404B1 (en) * | 2000-10-12 | 2002-10-08 | Chartered Semiconductor Manufacturing Ltd. | Apparatus and method for detecting bad edge bead removal in a spin-on-glass coater tool |
US6879876B2 (en) * | 2001-06-13 | 2005-04-12 | Advanced Technology Materials, Inc. | Liquid handling system with electronic information storage |
KR100393289B1 (ko) * | 2001-06-26 | 2003-07-31 | 주식회사 실리콘 테크 | 포토레지스트 토출 감시장치 |
JP4902067B2 (ja) | 2001-08-07 | 2012-03-21 | シーケーディ株式会社 | 液体供給装置 |
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2004
- 2004-08-09 JP JP2004232071A patent/JP4541069B2/ja not_active Expired - Lifetime
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2005
- 2005-07-29 WO PCT/JP2005/013919 patent/WO2006016486A1/ja active Application Filing
- 2005-07-29 CN CNA2005800267524A patent/CN101018950A/zh active Pending
- 2005-07-29 KR KR1020077005377A patent/KR101132118B1/ko active Active
- 2005-07-29 US US11/659,727 patent/US7988429B2/en active Active
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JPH03114565A (ja) * | 1989-09-29 | 1991-05-15 | Hitachi Ltd | 流動体供給装置およびその制御方法 |
JPH07324680A (ja) * | 1994-05-30 | 1995-12-12 | Hitachi Ltd | 流動体供給方法および装置 |
JPH0883759A (ja) * | 1994-09-09 | 1996-03-26 | Tokyo Electron Ltd | 処理装置 |
JP2002327617A (ja) * | 2001-03-02 | 2002-11-15 | Haldor Topsoe As | SCRNOx排出量を低減する方法及びそのための装置 |
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US8033801B2 (en) * | 2006-11-24 | 2011-10-11 | Ckd Corporation | Liquid chemical supply system and liquid chemical supply control device |
Also Published As
Publication number | Publication date |
---|---|
CN101018950A (zh) | 2007-08-15 |
US7988429B2 (en) | 2011-08-02 |
JP4541069B2 (ja) | 2010-09-08 |
JP2006049756A (ja) | 2006-02-16 |
KR101132118B1 (ko) | 2012-04-05 |
KR20070051880A (ko) | 2007-05-18 |
US20070267065A1 (en) | 2007-11-22 |
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