WO2004005976A1 - 低屈折率層を有する減反射フィルム - Google Patents
低屈折率層を有する減反射フィルム Download PDFInfo
- Publication number
- WO2004005976A1 WO2004005976A1 PCT/JP2003/008535 JP0308535W WO2004005976A1 WO 2004005976 A1 WO2004005976 A1 WO 2004005976A1 JP 0308535 W JP0308535 W JP 0308535W WO 2004005976 A1 WO2004005976 A1 WO 2004005976A1
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- WIPO (PCT)
- Prior art keywords
- refractive index
- layer
- index layer
- reflection film
- low
- Prior art date
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- -1 polysiloxane Polymers 0.000 claims abstract description 63
- 229920001296 polysiloxane Polymers 0.000 claims abstract description 53
- 239000011347 resin Substances 0.000 claims abstract description 53
- 229920005989 resin Polymers 0.000 claims abstract description 53
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 44
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 44
- 239000003431 cross linking reagent Substances 0.000 claims abstract description 38
- 239000003505 polymerization initiator Substances 0.000 claims abstract description 31
- 239000002994 raw material Substances 0.000 claims abstract description 30
- 239000010410 layer Substances 0.000 claims description 289
- 238000000576 coating method Methods 0.000 claims description 35
- 239000000758 substrate Substances 0.000 claims description 32
- 239000000463 material Substances 0.000 claims description 25
- 239000002245 particle Substances 0.000 claims description 21
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 10
- 239000012790 adhesive layer Substances 0.000 claims description 8
- 229910000831 Steel Inorganic materials 0.000 claims description 6
- 239000000178 monomer Substances 0.000 claims description 6
- 239000010959 steel Substances 0.000 claims description 6
- 210000002268 wool Anatomy 0.000 claims description 6
- 239000004205 dimethyl polysiloxane Substances 0.000 claims description 4
- 235000013870 dimethyl polysiloxane Nutrition 0.000 claims description 4
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 claims description 4
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims description 3
- 230000037390 scarring Effects 0.000 abstract 1
- 239000010408 film Substances 0.000 description 69
- 239000011248 coating agent Substances 0.000 description 26
- 239000007788 liquid Substances 0.000 description 22
- 238000005299 abrasion Methods 0.000 description 18
- 238000004519 manufacturing process Methods 0.000 description 15
- 239000010419 fine particle Substances 0.000 description 14
- 230000000694 effects Effects 0.000 description 10
- 239000003999 initiator Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 9
- 238000002360 preparation method Methods 0.000 description 9
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 8
- 238000002834 transmittance Methods 0.000 description 8
- 229910010272 inorganic material Inorganic materials 0.000 description 7
- 239000011147 inorganic material Substances 0.000 description 7
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 239000010409 thin film Substances 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 238000010030 laminating Methods 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 229920000139 polyethylene terephthalate Polymers 0.000 description 5
- 239000005020 polyethylene terephthalate Substances 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 4
- 229920000178 Acrylic resin Polymers 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 4
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 239000007822 coupling agent Substances 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 4
- 229910052753 mercury Inorganic materials 0.000 description 4
- 239000011368 organic material Substances 0.000 description 4
- 229940059574 pentaerithrityl Drugs 0.000 description 4
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- 239000004925 Acrylic resin Substances 0.000 description 3
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000012299 nitrogen atmosphere Substances 0.000 description 3
- 150000003377 silicon compounds Chemical group 0.000 description 3
- 238000012719 thermal polymerization Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 150000004703 alkoxides Chemical class 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052787 antimony Inorganic materials 0.000 description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 2
- 229910000410 antimony oxide Inorganic materials 0.000 description 2
- 238000009125 cardiac resynchronization therapy Methods 0.000 description 2
- 229910000420 cerium oxide Inorganic materials 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- RTOLVRQCDHIQQA-UHFFFAOYSA-N hexane;prop-2-enoic acid Chemical compound OC(=O)C=C.CCCCCC RTOLVRQCDHIQQA-UHFFFAOYSA-N 0.000 description 2
- 230000001771 impaired effect Effects 0.000 description 2
- 229910003437 indium oxide Inorganic materials 0.000 description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 2
- 239000002346 layers by function Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 125000002816 methylsulfanyl group Chemical group [H]C([H])([H])S[*] 0.000 description 2
- 239000012788 optical film Substances 0.000 description 2
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 2
- VTRUBDSFZJNXHI-UHFFFAOYSA-N oxoantimony Chemical compound [Sb]=O VTRUBDSFZJNXHI-UHFFFAOYSA-N 0.000 description 2
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 2
- 150000002978 peroxides Chemical class 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 229920001707 polybutylene terephthalate Polymers 0.000 description 2
- 229920000515 polycarbonate Polymers 0.000 description 2
- 239000004417 polycarbonate Substances 0.000 description 2
- 230000000379 polymerizing effect Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 2
- 229910001887 tin oxide Inorganic materials 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- JNELGWHKGNBSMD-UHFFFAOYSA-N xanthone Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3OC2=C1 JNELGWHKGNBSMD-UHFFFAOYSA-N 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- 229910001928 zirconium oxide Inorganic materials 0.000 description 2
- WWMFRKPUQJRNBY-UHFFFAOYSA-N (2,3-dimethoxyphenyl)-phenylmethanone Chemical compound COC1=CC=CC(C(=O)C=2C=CC=CC=2)=C1OC WWMFRKPUQJRNBY-UHFFFAOYSA-N 0.000 description 1
- BEQKKZICTDFVMG-UHFFFAOYSA-N 1,2,3,4,6-pentaoxepane-5,7-dione Chemical compound O=C1OOOOC(=O)O1 BEQKKZICTDFVMG-UHFFFAOYSA-N 0.000 description 1
- WGGLDBIZIQMEGH-UHFFFAOYSA-N 1-bromo-4-ethenylbenzene Chemical compound BrC1=CC=C(C=C)C=C1 WGGLDBIZIQMEGH-UHFFFAOYSA-N 0.000 description 1
- JOGFTFKRKDIQEK-UHFFFAOYSA-N 1-propoxynaphthalene Chemical compound C1=CC=C2C(OCCC)=CC=CC2=C1 JOGFTFKRKDIQEK-UHFFFAOYSA-N 0.000 description 1
- GKZPEYIPJQHPNC-UHFFFAOYSA-N 2,2-bis(hydroxymethyl)propane-1,3-diol prop-2-enoic acid Chemical compound OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OCC(CO)(CO)CO GKZPEYIPJQHPNC-UHFFFAOYSA-N 0.000 description 1
- KWVGIHKZDCUPEU-UHFFFAOYSA-N 2,2-dimethoxy-2-phenylacetophenone Chemical compound C=1C=CC=CC=1C(OC)(OC)C(=O)C1=CC=CC=C1 KWVGIHKZDCUPEU-UHFFFAOYSA-N 0.000 description 1
- WMYINDVYGQKYMI-UHFFFAOYSA-N 2-[2,2-bis(hydroxymethyl)butoxymethyl]-2-ethylpropane-1,3-diol Chemical compound CCC(CO)(CO)COCC(CC)(CO)CO WMYINDVYGQKYMI-UHFFFAOYSA-N 0.000 description 1
- OWYWGLHRNBIFJP-UHFFFAOYSA-N Ipazine Chemical compound CCN(CC)C1=NC(Cl)=NC(NC(C)C)=N1 OWYWGLHRNBIFJP-UHFFFAOYSA-N 0.000 description 1
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- 229930182556 Polyacetal Natural products 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- 241001648319 Toronia toru Species 0.000 description 1
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 1
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 1
- MPIAGWXWVAHQBB-UHFFFAOYSA-N [3-prop-2-enoyloxy-2-[[3-prop-2-enoyloxy-2,2-bis(prop-2-enoyloxymethyl)propoxy]methyl]-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(COC(=O)C=C)(COC(=O)C=C)COCC(COC(=O)C=C)(COC(=O)C=C)COC(=O)C=C MPIAGWXWVAHQBB-UHFFFAOYSA-N 0.000 description 1
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- XTKDAFGWCDAMPY-UHFFFAOYSA-N azaperone Chemical compound C1=CC(F)=CC=C1C(=O)CCCN1CCN(C=2N=CC=CC=2)CC1 XTKDAFGWCDAMPY-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000012933 diacyl peroxide Substances 0.000 description 1
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 239000001023 inorganic pigment Substances 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000004611 light stabiliser Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 125000005641 methacryl group Chemical group 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 239000012860 organic pigment Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- UZLYXNNZYFBAQO-UHFFFAOYSA-N oxygen(2-);ytterbium(3+) Chemical compound [O-2].[O-2].[O-2].[Yb+3].[Yb+3] UZLYXNNZYFBAQO-UHFFFAOYSA-N 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920001643 poly(ether ketone) Polymers 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 239000004431 polycarbonate resin Substances 0.000 description 1
- 229920005668 polycarbonate resin Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920006324 polyoxymethylene Polymers 0.000 description 1
- 229920005990 polystyrene resin Polymers 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 238000000985 reflectance spectrum Methods 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 125000005373 siloxane group Chemical group [SiH2](O*)* 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 229910003454 ytterbium oxide Inorganic materials 0.000 description 1
- 229940075624 ytterbium oxide Drugs 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/046—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by electromagnetic means
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/033—Pointing devices displaced or positioned by the user, e.g. mice, trackballs, pens or joysticks; Accessories therefor
- G06F3/0354—Pointing devices displaced or positioned by the user, e.g. mice, trackballs, pens or joysticks; Accessories therefor with detection of 2D relative movements between the device, or an operating part thereof, and a plane or surface, e.g. 2D mice, trackballs, pens or pucks
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31652—Of asbestos
- Y10T428/31663—As siloxane, silicone or silane
Definitions
- the present invention relates to an anti-reflection film, and more particularly to an anti-reflection film which is excellent in pen sliding resistance, scratch resistance and abrasion resistance and is suitable for a touch panel.
- Touch panels are known as devices that are placed on the display surface of various types of display devices, such as liquid crystal display devices and power source ray tubes (CRTs), and that input information by touching the screen.
- display devices such as liquid crystal display devices and power source ray tubes (CRTs)
- CRTs power source ray tubes
- a typical type of the touch panel there is a resistive touch panel including two transparent electrode substrates in which conductive layers provided on the respective touch panels are opposed to each other.
- a conventional transparent electrode substrate for a resistive touch panel is made of a glass or thermoplastic polymer substrate and a metal oxide such as indium oxide or zinc oxide containing tin oxide laminated on the substrate. And a transparent conductive layer.
- a conventional transparent electrode substrate reflection occurs at many layer interfaces. Reflection from multiple layers has the disadvantage of reducing the light transmission of the transparent electrode substrate and consequently the visibility of the display device.
- the anti-reflection film is effective for preventing the visibility of the display device from being lowered.
- the conventional antireflection film has an antireflection layer formed by laminating a plurality of thin films having a thickness of 1 im or less. Since the wavelength of light whose reflection is prevented changes according to the thickness of the thin film, there is a problem that even a slight scratch or abrasion can be noticeable.
- JP-A-2002-520230 discloses a cured conductive layer and a transparent conductive thin film made of an indium tin composite oxide laminated on a transparent plastic film substrate. A transparent conductive film having the same is disclosed.
- Japanese Patent Application Laid-Open No. 8-127286 discloses a multilayer resin layer and an inorganic material laminated on a base material. An antireflection sheet having a thin film layer is known.
- 2003-719190 discloses a transparent substrate, and a lower coating film made of a resin composition containing an ionizing radiation-curable resin formed on at least one surface of the transparent substrate;
- An abrasion-resistant substrate formed of an ionizing radiation curable resin and formed on an undercoat film and having a refractive index lower than the refractive index of the undercoat film is disclosed.
- a transparent conductive thin film providing the upper surface is formed on the cured material layer by sputtering of an indium oxide composite oxide. You. For this reason, the upper surface of the transparent conductive thin film has relatively low resistance to sliding friction of the input van (hereinafter referred to as pen sliding resistance) and resistance to scratches and abrasion (scratch resistance and abrasion resistance). It was low.
- the inventors of the present application have conducted intensive studies to achieve the above object, and found that the composition of the anti-reflection layer, in particular, the composition of the low-refractive index layer that provides the surface of the anti-reflection film, was optimized for pen resistance.
- the present inventors have found that an antireflection film excellent in mobility and the like can be obtained, and completed the present invention.
- a low refractive index layer for an anti-reflection film formed from a raw material containing silicon oxide, a crosslinking agent, a polymerization initiator, and a polysiloxane resin.
- the main components of the raw material are silicon oxide and a crosslinking agent.
- the amount of the polymerization initiator is 1 to 10% by weight, and the amount of the polysiloxane resin is 1 to 5% by weight, based on the sum of the silicon oxide and the crosslinking agent.
- the anti-reflection layer includes a high refractive index layer and a low refractive index layer disposed on the high refractive index layer.
- the low refractive index layer is formed from a raw material containing silicon oxide, a crosslinking agent, a polymerization initiator, and a polysiloxane resin.
- the amount of the polymerization initiator is 1 to 10% by weight, and the amount of the polysiloxane resin is 1 to 5% by weight, based on the total amount of the silicon oxide and the crosslinking agent.
- the low refractive index layer is formed from a raw material including silicon oxide, a crosslinking agent, a polymerization initiator, and a polysiloxane resin.
- silicon oxide and a cross-linking agent are main components, and a polymerization initiator and a polysiloxane resin are contained in specific ratios.
- Silicon oxide (S i 0 2) is a low refractive index material, it is possible to form the low refractive index layer lower by connexion refractive index in the use of fine particles of silicon oxide. Further, silicon oxide has a function of increasing the bonding force between other components in the low refractive index layer and improving the strength of the low refractive index layer.
- the average particle size of the silicon oxide fine particles does not greatly exceed the thickness of the low refractive index layer, and it is particularly preferable that the average particle size be 0.1 xm or less. If the average particle size of the silicon oxide particles is larger than the thickness of the low refractive index layer, scattering occurs, and the optical performance of the low refractive index layer is reduced.
- the surface of the silicon oxide particles can be modified with various force coupling agents.
- various coupling agents include silicon compounds substituted with an organic compound, metal alkoxides such as aluminum, titanium, zirconium, and antimony, and organic acids.
- a reactive group such as a (meth) acryloyl group since the surface hardness of the low refractive index layer can be improved.
- the amount of silicon oxide is preferably 50 to 95% by weight, more preferably 60 to 90% by weight, based on the total amount of silicon oxide as a main component and a crosslinking agent. / 0 .
- the proportion of silicon oxide is less than 50% by weight, it is difficult to obtain a low-refractive index layer having sufficient strength.
- the proportion exceeds 95% by weight the crosslinking density is low and the curing is insufficient.
- a low refractive index layer is obtained.
- the crosslinking agent is blended to improve the surface hardness, strength and scratch resistance of the low refractive index layer.
- the crosslinking agent forms a crosslinked structure in the low refractive index layer.
- cross-linking agent examples include polyethylene glycol di (meth) atalylate, diethylene glycol di (meth) atalylate, glycerol di (meth) atalylate, trimethylolpropane tri (meth) atalylate, pentaerythritol tri (meth) ately , Dipentaerythritol tonolepenta (meth) acrylate, dipentaerythritol hexa (meth) acrylate, ditrimethylolpropane tetra.
- the type of the cross-linking agent is not particularly limited. However, it is possible to form a dense three-dimensional network structure in the low-refractive-index layer to further enhance the surface hardness, strength, and scratch resistance of the low-refractive-index layer.
- the amount of the crosslinking agent is preferably 5 to 50% by weight, more preferably 10 to 40% by weight, based on the total amount of the main components silicon oxide and crosslinking agent.
- the proportion of the crosslinking agent is less than 5% by weight, the surface hardness of the low refractive index layer becomes insufficient.
- the proportion of the crosslinking agent exceeds 50% by weight, the low refractive index layer tends to have poor pen sliding resistance and scratch resistance.
- the polymerization initiator used in the present invention is cured by polymerizing a crosslinking agent.
- examples of the polymerization initiator include 2,2-dimethoxy-2-phenylacetophenone, acetophenone, benzophenone, xanthone, and 3-methyl ⁇ / acetophenone.
- 2-Hydroxy 2-methinolepronone 1-one 2-hydroxy 2-methyl 1-phenylene-propane 1-1-one, 2-methyl-1- 1 [4- (methylthio) phenyl] -12-morpho Linopropane-one-one, other photopolymerization initiators such as thioxanthone-based conjugates, ketone peroxide, peroxyketal, hydrated peroxide, dialkyl peroxide, diacyl peroxide, Thermal polymerization initiators such as peroxydicarbonate are exemplified.
- the photopolymerization initiator may be used alone or in combination of two or more.
- the amount of the polymerization initiator is from 1 to 10% by weight, preferably from 3 to 7% by weight, based on the total amount of the silicon oxide and the crosslinking agent.
- the amount of the polymerization initiator is less than 1% by weight, it is difficult to obtain a low refractive index layer having a sufficient strength.
- the amount of the polymerization initiator exceeds 10% by weight, the refractive index of the low refractive index layer increases. The antireflection performance decreases.
- the polysiloxane resin used in the present invention mainly improves pen sliding resistance on the surface of the low refractive index layer due to its sliding property, and further improves wear resistance.
- a polysiloxane resin include polyamino-modified polysiloxane, polyepoxy-modified polysiloxane, polyalcohol-modified polysiloxane, polyphenol-modified polysiloxane, polymercapto-modified polysiloxane, polyester-modified polysiloxane, and polyether.
- Modified polysiloxane is exemplified. Among them, polyester-modified polysiloxane and polyether-modified polysiloxane are preferable from the viewpoint of improving the strength of the low refractive index layer.
- polyester-modified polysiloxane or polyether-modified are more preferable, and polyester-modified polysiloxane or polyether-modified.
- polyester-modified dimethylpolysiloxane / polyether-modified dimethylpolysiloxane is particularly preferred.
- polysiloxane resins include, for example, polysiloxane resin (trade name: VXL4930) manufactured by Vianova Resin, polysiloxane resin (trade name: BYK306) manufactured by BYK Chemie, and Kusumoto Kasei Co., Ltd. There is a polysiloxane resin (trade name: Dispalon 1751 N).
- the compounding amount of the polysiloxane resin is 1 to 5% by weight, preferably 1.5 to 4% by weight, based on the total amount of the silicon oxide and the crosslinking agent. If the amount of the siloxane resin is less than 1% by weight, the scratch resistance and pen sliding resistance of the low refractive index layer deteriorate. On the other hand, when the content of the polysiloxane resin exceeds 5% by weight, the wear resistance of the low refractive index layer deteriorates.
- the raw material of the low-refractive-index layer may be any of the above-mentioned compounds in a range not impairing the effects of the present invention. You may mix additives other than a thing. Additives are, for example, inorganic or organic pigments, polymers, polymerization inhibitors, antioxidants, dispersants, surfactants, light stabilizers, leveling agents.
- the low refractive index layer can be formed in the shape of ⁇ 3 ⁇ 4, and the manufacturing cost of the MSIt film can be reduced.
- a method for forming the low refractive index layer will be described. Before forming the low-refractive-index layer, a substrate on which a functional layer is laminated is prepared. The raw material of the low refractive index layer is applied on the functional layer according to an appropriate application method such as a wet coating method. The low refractive index layer is formed by heating the raw material or curing it by irradiation with active energy rays such as ultraviolet rays or electron beams.
- the curing reaction using active energy rays is preferably performed in an atmosphere of an inert gas such as nitrogen or argon.
- the active energy ray source include a high-pressure mercury lamp, a halogen lamp, a xenon lamp, a nitrogen laser, an electron beam accelerator, and a radioactive element.
- the amount of irradiation with the energy radiation source is preferably integrated exposure amount at an ultraviolet wavelength of 3 6 5 nm is 5 0 ⁇ 5 0 0 O m J Bruno cm 2.
- the irradiation amount is less than 50 mJcm 2 , the curing is insufficient, and the surface hardness of the low refractive index layer decreases.
- the amount of irradiation exceeds 5 0 0 O mj Z cm 2 , there is a tendency that the low refractive index layer decreases the transparency and coloration.
- a known thermal polymerization initiator is added to the above-mentioned raw materials in advance. After the application of the raw materials, the raw materials can be heated to a temperature higher than the thermal decomposition temperature of the thermal polymerization initiator to harden the raw materials and form a low refractive index layer.
- the anti-reflection film of the present invention comprises a substrate, at least one intermediate layer including a hard coat layer laminated on the substrate, and an anti-reflection layer laminated on the intermediate layer.
- the antireflection layer includes a high refractive index layer and a low refractive index layer laminated on the high refractive index layer.
- the low refractive index layer is formed from the above-mentioned raw materials.
- the refractive index of the substrate is preferably in the range of 1.45 to 1.70, and its thickness is
- a transparent resin film having a thickness of 10 to 500 ⁇ m is preferred in terms of transparency and workability.
- “Toru “Min” means that the light transmittance is 30% or more.
- the light transmittance is more preferably 50% or more, and further preferably 80% or more.
- the base material examples include polyethylene terephthalate (PET), polybutylene terephthalate (PBT), polyethylene naphthalate (PEN), polycarbonate (PC), polyimide, polyarylate, polyacrylate, polyetherketone, polysulfone, and polyethersulfate. Phong and polyetherenoimide are preferred. Particularly, polyethylene terephthalate (PET) and polycarbonate (PC) are preferable in terms of availability and cost.
- the hard coat layer is provided between the substrate and the anti-reflection layer.
- the type of material and the refractive index of the hard coat layer are not particularly limited.
- Examples of the material of the hard coat layer include a cured product of a monofunctional (meth) acrylate, a polyfunctional (meth) acrylate, and a reactive silicon compound such as tetraethoxysilane.
- (meth) acryl refers to both methacryl and acryl, for example, (meth) atalylate refers to both methacrylate and acrylate.
- the composition is a polymerized and cured product of a composition containing an ultraviolet-curable polyfunctional (meth) acrylate.
- the refractive index of the base material and the refractive index of the hard coat layer are significantly different, the appearance is impaired by interference, so that an interference preventing layer may be provided between them.
- the hard coat layer preferably has an antiglare effect.
- a hard coat layer having irregularities exhibits an antiglare effect.
- the type and refractive index of the material for forming the unevenness on the hard coat layer are not limited as long as the effects of the present invention are not impaired.
- a hard coat layer having an antiglare property can be obtained by forming a hard coat layer using resin particles such as acrylic, polystyrene, and polycarbonate resins by a known method.
- the resin particles may be used alone or in combination of two or more.
- the particle size of the resin particles is preferably 1 to 5 ⁇ .
- the method of forming the hard coat layer is not particularly limited, and when an organic material is used, the hard coat layer can be formed by a general wet coating method such as a single-coat method or a die coat method. In this case, after application, the composition can be appropriately cured by heating, or cured by irradiating active energy rays such as ultraviolet rays and electron beams to form a hard coat layer.
- the hard coat layer is preferably a thickness of 2 ⁇ 2 5 ⁇ ⁇ . 2 ⁇ not thick When it becomes full, the surface hardness of the anti-reflection film decreases, and it becomes difficult to obtain an anti-reflection film having sufficient hardness. On the other hand, a hard coat layer having a thickness exceeding 25 ⁇ ⁇ ⁇ lowers the bending resistance of the antireflection film.
- the total thickness may be 2 to 25 im, and the thickness of each layer is not particularly limited, and may be different for each layer.
- the anti-reflection layer has a low refractive index instead of a multilayer structure including both the low refractive index layer and the high refractive index layer.
- a single-layer structure formed of only layers may be used.
- the multi-layer structure anti-reflection layer examples include, for example, a two-layer structure including a high refractive index layer and a low refractive index layer, a medium refractive index layer, a high refractive index layer, and a low refractive index layer in order from the side close to the transparent resin film as the base material.
- examples include a three-layer structure including a refractive index layer, and a four-layer structure including a high refractive index layer, a low refractive index layer, a high refractive index layer, and a low refractive index layer.
- the anti-reflection layer preferably has a two-layer structure.
- the refractive index of the low-refractive-index layer is lower than that of the layer immediately below (ie, the layer on the side closer to the substrate).
- the refractive index of the low refractive index layer is preferably in the range of 1.3 to 1.5.
- the refractive index of the low refractive index layer is less than 1.3, it becomes difficult to form a low reflection layer having sufficient hardness.
- the refractive index of the low refractive index layer exceeds 1.5, the antireflection effect of the antireflection layer tends to be insufficient.
- the refractive index of the high refractive index layer is higher than that of the low refractive index layer laminated directly on top of it.
- the refractive index of the high refractive index layer is preferably in the range of 1.6 to 2.4.
- the refractive index of the high refractive index layer is less than 1.6, it is difficult to obtain a sufficient anti-reflection effect.
- the refractive index of the high refractive index layer exceeds 2.4, the coating method is used. It tends to be difficult to form an anti-reflection layer.
- the difference in refractive index between the high refractive index layer and the low refractive index layer is preferably 0.1 or more. In this case, the anti-reflection layer exhibits a sufficient anti-reflection effect.
- the refractive index of the middle refractive index layer is lower than that of the high refractive index layer, and that of the low refractive index layer. If it is higher than that, the refractive index of the middle refractive index layer is not particularly limited. Although it depends on the type and shape of the substrate and the structure of the anti-reflection layer, the optical thickness of each layer of the anti-reflection layer is preferably equal to or less than 1/4 of the wavelength of visible light. For example, in order to reduce the reflection of visible light (wavelength 400 to 800 nm), the optical thickness (nxd) of each layer of the anti-reflection layer is
- n is the refractive index of each layer
- d is the thickness of each layer.
- the materials of the high refractive index layer and the medium refractive index layer are not particularly limited, and inorganic materials and organic materials can be used.
- the inorganic material include zinc oxide, titanium oxide, cerium oxide, aluminum oxide, silane oxide, tantalum oxide, yttrium oxide, ytterbium oxide, zirconium oxide, antimony oxide, and indium tin oxide (hereinafter also referred to as ITO).
- ITO indium tin oxide
- tin oxide, antimony oxide, indium tin oxide, and titanium oxide, cerium oxide, zinc oxide, and zirconium oxide are preferable from the viewpoint of conductivity and antistatic ability, and from the viewpoint of high refractive index.
- the shape of the inorganic material is, for example, fine particles.
- the organic material for example, a material obtained by polymerizing and curing a composition containing a polymerizable monomer having a refractive index of 1.6 to 1.8 can be used.
- the polymerizable monomer having a refractive index of 1.6 to 1.8 include 2-vininolephthalene, 4-bromostyrene, and 9-vininoleanthracene.
- Fine particles of an inorganic material and an organic material may be used in combination.
- a polymerizable monomer other than a polymerizable monomer having a refractive index of 1.6 to 1.8, or a composition containing these polymers can be used as a binder for wet coating.
- the average particle size of the fine particles of the inorganic material preferably does not greatly exceed the thickness of the layer, and is particularly preferably 0.1 ⁇ m or less. When the average particle diameter of the inorganic material fine particles is larger than the thickness of the related layer, scattering occurs and the optical performance of the high refractive index layer or the medium refractive index layer tends to decrease.
- the surface of the fine particles can be modified with various coupling agents.
- the various coupling agents include organically substituted silicon compounds, metal alkoxides such as aluminum, titanium, zirconium, and antimony, and organic acid salts.
- Conventionally known methods can be used for forming the high refractive index layer and the medium refractive index layer. For example, dry coating methods such as vapor deposition, sputtering, chemical vapor deposition (CVD), and ion plating, dip coating, and roll coating , Gravure coat, die coat and the like.
- a method that can be formed continuously is preferable from the viewpoint of productivity.
- An adhesive layer may be provided on the lower surface of the base material, that is, on the surface opposite to the surface on which the intermediate layer is laminated.
- the low refractive index layer is the uppermost layer of the antireflection film
- the adhesive layer is the lowermost layer of the antireflection film.
- the material of the adhesive layer is not particularly limited, and examples thereof include an acryl adhesive, an ultraviolet curable adhesive, and a thermosetting adhesive.
- One or more materials having these functions may be included in the material of the adhesive layer for the purpose of blocking light in a specific wavelength range, improving contrast, or correcting color tone. For example, when the transmitted light color of the anti-reflection film is unfavorable, such as a yellow color, the color tone of the transmitted light can be corrected by adding a dye.
- the surface of the low-refractive-index layer is not visibly scratched after being reciprocated 50,000 times with a predetermined pen with a load of 300 g for 50,000 times. Further, it is preferable that the surface of the low-refractive-index layer be rubbed 50 times with a load of 250 g using a predetermined steel wool, and that no visually observable scratch is formed on the surface.
- Such an anti-reflection film having a low-refractive-index layer that is hardly damaged is preferable for use in a touch panel.
- the anti-reflection film of the present invention can be used for reducing reflection.
- it is used to suppress reflection on the surface of the display panel of an electronic image display device.
- the electronic image display device include a CRT, a plasma display panel (PDP), and a liquid crystal display device. It is used in direct contact with a display panel of an electronic image display device or indirectly through an adhesive layer.
- the low-refractive-index layer for the anti-reflection film is formed by irradiating a raw material obtained by mixing a silicon oxide, a cross-linking agent, a polymerization initiator and a siloxane resin with ultraviolet rays and curing the material.
- Silicon oxide and a crosslinking agent are the main components.
- the raw material contains 1 to 10% by weight of a polymerization initiator and 1 to 5% by weight of a polysiloxane resin, based on the total amount of the silicon oxide and the crosslinking agent.
- the anti-reflection film is made of a transparent resin film such as polyethylene terephthalate. It is formed by laminating an intermediate layer including a hard coat layer on a medium (substrate) and laminating an anti-reflection layer on the intermediate layer.
- the anti-reflection layer includes a high-refractive-index layer provided on a side closer to the substrate and a low-refractive-index layer provided on a side farther from the substrate.
- an intermediate layer hard coat layer
- an anti-reflection layer high-refractive index layer, low-refractive index layer
- the low refractive index layer is formed from the above-mentioned raw materials.
- the low refractive index layer has a relatively low refractive index and a high strength. Since a crosslinked structure is formed in the low refractive index layer by the crosslinking agent polymerized and cured by the polymerization initiator, the strength and surface hardness of the low refractive index layer are improved. Therefore, the surface of the low refractive index layer is prevented from being damaged. Further, since the polysiloxane resin has a siloxane group, the surface of the low refractive index layer has good slipperiness. Even if the input pen is repeatedly slid, the change in the slipperiness is small, resulting in wear. Excellent durability against
- the low refractive index layer is formed from a raw material containing silicon oxide, a crosslinking agent, a polymerization initiator, and a polysiloxane resin as essential components. Silicon oxide and a crosslinking agent are the main components.
- the polymerization initiator is added in an amount of 1 to 10% by weight, and the polysiloxane resin is added in an amount of 1 to 5% by weight, based on the total amount of the silicon oxide and the crosslinking agent.
- the action of each component improves the three characteristics of pen sliding resistance, scratch resistance and abrasion resistance on the surface of the low refractive index layer.
- the anti-reflection film has an anti-reflection layer laminated on at least one or more intermediate layers including a hard coat layer.
- the anti-reflection layer includes a high refractive index layer and a low refractive index layer laminated in the order closer to the substrate. Since the low refractive index layer is formed from the above-described raw materials, the pen sliding resistance, scratch resistance, and abrasion resistance on the surface of the anti-reflection film are improved.
- the refractive index of the high refractive index layer is 1.6 to 2.4, and the refractive index of the low refractive index layer is 1.3 to 2.4. Since the difference between the refractive indices of the high refractive index layer and the low refractive index layer is 0.1 or more, the anti-reflection film effectively reduces the reflection of light.
- the base material is a transparent resin film having a thickness of 10 to 500 m, the light transmittance and handleability of the anti-reflection film are excellent.
- the antireflection film can be adhered to a display panel of an electronic image display device such as a plasma display panel. If there is no adhesive layer, the anti-reflection film has a low-refractive index layer with excellent pen sliding resistance so that the base material is in direct contact with the display panel of the electronic image display device. Even after reciprocating 50,000 times with a load of 300 g, no visible scratches are formed.
- the anti-reflection film has a low-refractive-index layer having excellent scratch resistance, even if it is rubbed 50 times with a load of 250 g using a steel wool, no scratch that can be visually confirmed is formed.
- the anti-reflection layer is made by the pet coating method, its formation is ⁇ T? Therefore, the film can be applied to the ⁇ (surface).
- the anti-reflection film of one embodiment is useful as a film to be attached to a touch panel for inputting with a hand or a pen or a display panel of an electronic image display device.
- the anti-reflection film is disposed on the touch panel or the display panel of the electronic image display device, the reflection that makes the display difficult to see is reduced and the image is less likely to be scratched. It is displayed clearly.
- the surface hardness of the anti-reflection film is appropriate for input with a hand or a pen, and the operational feeling of a touch panel or an electronic image display device is improved.
- % is% by weight unless otherwise specified.
- n M is the refractive index of the acrylic resin plate.
- Minimum or maximum reflectance M ⁇ n 2 f
- the specular reflectance photometer (trade name: U-Best, manufactured by JASCO Corporation) was used to measure the + 5 ° and 15 ° specular reflectance of the low refractive index layer. From the reflection spectrum obtained, The minimum reflectance (%) of the low refractive index layer was read. If hard coat interference was observed in the spectrum, the center values at the top and bottom were read.
- the total light transmittance (%) of the low refractive index layer was measured using a haze meter (trade name: NDH2000, manufactured by Nippon Denshoku Industries Co., Ltd.).
- a predetermined load 250 g was applied to steel wool (# 0000), and the surface of the anti-reflection film sample (upper surface of the low refractive index layer) was rubbed back and forth 50 times, and the state of the surface was observed.
- the anti-reflection film sample was attached to a 2 mm thick glass plate using a transparent pressure-sensitive adhesive sheet (trade name: Non-Carrier, manufactured by Lintec Corporation, double-sided pressure-sensitive adhesive type) so that the low refractive layer was the uppermost layer.
- a transparent pressure-sensitive adhesive sheet (trade name: Non-Carrier, manufactured by Lintec Corporation, double-sided pressure-sensitive adhesive type) so that the low refractive layer was the uppermost layer.
- a polyacetal pen having a spherical tip with a radius of 0.8 mm was attached to an eraser tester (manufactured by Honko Seisakusho), and the pen tip was moved linearly while making contact with the surface of the low refractive index layer.
- Dispersion of silicon oxide fine particles (trade name: XBA-ST, manufactured by Nissan Chemical Industries, Ltd., average particle size: 10 to 50 nm) 90%, main component consisting of 10% of dipentaerythritol hexaatalate 10% 0 parts by weight, 5 parts by weight of photopolymerization initiator (trade name: I RGACU RE 907, manufactured by Chipa Geigy Co., Ltd.) and 2 parts by weight of polysiloxane resin (product name: VXL 4930, manufactured by Vianova Resin) Were mixed to prepare a coating liquid (L-12) for a low refractive index layer.
- the refractive index of the cured polymer of L-12 was 1.49.
- Production Example 6 (Preparation of coating liquid for low refractive index layer (L-1 3)) Dispersion of silicon oxide fine particles (trade name: XBA-ST, manufactured by Nissan Chemical Industries, Ltd., average particle size: 10 to 50 nm) 90%, 100 parts by weight of a main component comprising dipentaerythritol hexaatalate 10%, 5 parts by weight of a photopolymerization initiator (trade name: I RGACU RE 907, manufactured by Ciba Geigy Corporation) and 2 parts by weight of a polyether-modified polysiloxane resin (trade name: BYK306, manufactured by BYK Chemi Co.) A coating liquid for a low refractive index layer (L-13) was prepared. The refractive index of the polymerized cured product of L-3 was 1.49. Production Example 7 (Preparation of coating liquid for low refractive index layer (L-1-4))
- Dispersion of silicon oxide fine particles (trade name: XBA-ST, manufactured by Nissan Chemical Industries, Ltd., average particle size: 10 to 50 nm) 90%, 100 parts by weight of a main component consisting of dipentaerythritol hexaacrylate, 10%, and light 5 parts by weight of polymerization initiator (trade name: I RGACU RE 907, manufactured by Ciba Geigy Co., Ltd.) and 2 parts by weight of polysiloxane resin (trade name: Dispalon 1751N, manufactured by Kusumoto Kasei Co., Ltd.) A coating solution (L-4) was prepared.
- the refractive index of the polymerized cured product of L-4 was 1.49
- a low refractive index layer coating liquid (L-15) was prepared in the same manner as in Production Example 5, except that the addition amount of the polysiloxane resin was changed from 2 parts by weight to 0.5 part by weight.
- the refractive index of the polymerized product of L-15 was 1.49.
- Production Example 9 Preparation of coating liquid for low refractive index (L-6))
- a low refractive index coating liquid (L-16) was prepared in the same manner as in Production Example 6, except that the addition amount of the polysiloxane resin was changed from 2 parts by weight to 7 parts by weight.
- the refractive index of the cured polymer of L-16 was 1.49. Examples 1 to 4
- PET film with a thickness of 188 ⁇ (trade name: A4100, Toyobo Co., Ltd.
- the coating liquid HC-1 for hard coat prepared in Production Example 1 was applied thereon by a bar coater to a dry film thickness of about 4 ⁇ m. This, then cured by irradiation with ultraviolet rays in irradiation amount of 4 0 O mj / cm 2 at 1 2 OW high pressure mercury lamp using the ultraviolet irradiation apparatus (Iwasaki electric Co., Ltd.), hard-coated PET film Was made.
- the coating liquids H-1 and H-2 for the high refractive index layers prepared in Production Examples 2 and 3 were dried with a dip coater (manufactured by Sugiyama Motori Kagaku Kiki Co., Ltd.), and the optical film thickness was 55 Coating was performed so that a layer of about 0 nm was obtained. This was cured by irradiating it with ultraviolet rays at a dose of 40 OmJ / cm2 from a 12 OW high-pressure mercury lamp under a nitrogen atmosphere using an ultraviolet irradiation apparatus (manufactured by Iwasaki Electric Co., Ltd.).
- the low refractive index layer coating liquids L1 to L-4 prepared in Production Examples 5 to 7 each have a dry film thickness of 5500 nm and a minimum reflectance of 5 nm. After being prepared and applied as shown, it was cured to produce an anti-reflection film.
- An anti-reflection film was produced in the same manner as in Example 1, except that L-1, L-5 and L-16 were used as the coating liquid for the low refractive index layer.
- the anti-reflection films of Examples 1 to 4 were excellent in optical performance from the minimum reflectance and the total light transmittance. In addition, all three items relating to pen sliding resistance, scratch resistance and abrasion resistance were excellent, and the surface hardness was high.
- Comparative Examples 1 and 4 the optical performance was at the same level as that of the examples, but the sliding resistance and the scratch resistance were inferior to those of the examples because no polysiloxane resin was used.
- the abrasion resistance of Comparative Example 2 was inferior to that of the Examples.
- Comparative example 3 was inferior to the example in abrasion resistance.
- An acrylic pressure-sensitive adhesive sheet (product name: "Non-Carrier”, manufactured by Lintec Corporation) is uniformly applied to the substrate side of the anti-reflection film manufactured in Example 1 where the low refractive index layer is not formed by a hand roller. I matched. Then, it was stuck on the surface of an image display plate of a television as an electronic image display plate via an adhesive sheet. The TV provided clearer images than before the bonding.
- the raw material of the low refractive index layer may contain a fluororesin in order to improve the surface slipperiness.
- the reflection of the antireflection film may be suppressed by forming a layer having a higher refractive index than the high refractive index layer as the hard coat layer.
- an antireflection film having an antiglare effect may be formed.
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Abstract
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Application Number | Priority Date | Filing Date | Title |
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AU2003244210A AU2003244210A1 (en) | 2002-07-05 | 2003-07-04 | Reduced-reflection film having low-refractive-index layer |
US10/516,000 US20050227090A1 (en) | 2002-07-05 | 2003-07-04 | Reduced-reflection film having low-refractive-index layer |
KR1020047019686A KR100694002B1 (ko) | 2002-07-05 | 2003-07-04 | 저굴절률층을 갖는 반사방지필름 |
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PCT/JP2003/008535 WO2004005976A1 (ja) | 2002-07-05 | 2003-07-04 | 低屈折率層を有する減反射フィルム |
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US (1) | US20050227090A1 (ja) |
JP (1) | JP4496726B2 (ja) |
KR (1) | KR100694002B1 (ja) |
CN (1) | CN100334469C (ja) |
AU (1) | AU2003244210A1 (ja) |
TW (1) | TW200402440A (ja) |
WO (1) | WO2004005976A1 (ja) |
Cited By (1)
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WO2006129973A1 (en) * | 2005-06-02 | 2006-12-07 | Lg Chem, Ltd. | Coating composition for film with low refractive index and film prepared therefrom |
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FR2900828A1 (fr) * | 2006-05-09 | 2007-11-16 | Jean Louis Dulucq | Procede de traitement du surfaces optiques, notamment d'objectifs et solutions adaptees de traitement |
WO2009145564A2 (ko) * | 2008-05-29 | 2009-12-03 | 주식회사 코오롱 | 보호필름 |
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JP2010079053A (ja) * | 2008-09-26 | 2010-04-08 | Sumitomo Osaka Cement Co Ltd | 低屈折率膜、反射防止膜、透明部材、蛍光ランプ |
JP2010169963A (ja) * | 2009-01-23 | 2010-08-05 | Nof Corp | 反射防止フィルム |
JP5272807B2 (ja) * | 2009-03-04 | 2013-08-28 | 凸版印刷株式会社 | 低屈折率コーティング剤、反射防止フィルム、偏光板、透過型液晶ディスプレイ |
JP5778553B2 (ja) * | 2011-11-14 | 2015-09-16 | 日東電工株式会社 | 透明耐熱難燃フィルム |
JP6233042B2 (ja) * | 2013-02-01 | 2017-11-22 | 日油株式会社 | インモールド成形用反射防止フィルム及びそれを用いた成形物 |
JP6225661B2 (ja) * | 2013-11-20 | 2017-11-08 | 大日本印刷株式会社 | タッチパネル用ハードコートフィルム、及び、タッチパネル |
KR101540562B1 (ko) * | 2014-02-10 | 2015-07-30 | 코닝정밀소재 주식회사 | 커버기판 및 이를 포함하는 터치패널 |
JP6225053B2 (ja) * | 2014-03-20 | 2017-11-01 | 富士フイルム株式会社 | 感光性積層体、転写材料、パターン化された感光性積層体及びその製造方法、タッチパネル、並びに画像表示装置 |
JP6488622B2 (ja) * | 2014-10-02 | 2019-03-27 | 日油株式会社 | インサート成形用反射防止フィルム及びそれを用いた樹脂成形品 |
JP2023167531A (ja) | 2022-05-12 | 2023-11-24 | デクセリアルズ株式会社 | 光学積層体及び物品 |
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- 2003-07-04 TW TW92118277A patent/TW200402440A/zh not_active IP Right Cessation
- 2003-07-04 CN CNB038127768A patent/CN100334469C/zh not_active Expired - Lifetime
- 2003-07-04 WO PCT/JP2003/008535 patent/WO2004005976A1/ja active Application Filing
- 2003-07-04 US US10/516,000 patent/US20050227090A1/en not_active Abandoned
- 2003-07-04 AU AU2003244210A patent/AU2003244210A1/en not_active Abandoned
- 2003-07-04 KR KR1020047019686A patent/KR100694002B1/ko not_active Expired - Fee Related
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US7709551B2 (en) | 2005-06-02 | 2010-05-04 | Lg Chem, Ltd. | Coating composition for film with low refractive index and film prepared therefrom |
Also Published As
Publication number | Publication date |
---|---|
TWI321142B (ja) | 2010-03-01 |
US20050227090A1 (en) | 2005-10-13 |
CN100334469C (zh) | 2007-08-29 |
JP4496726B2 (ja) | 2010-07-07 |
CN1659452A (zh) | 2005-08-24 |
JP2004086196A (ja) | 2004-03-18 |
TW200402440A (en) | 2004-02-16 |
KR100694002B1 (ko) | 2007-03-13 |
AU2003244210A1 (en) | 2004-01-23 |
KR20050016503A (ko) | 2005-02-21 |
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