TWI564986B - Carry-out method of object, exchange method of object, object holding apparatus, exposure apparatus, flat-panel display manufacturing method, and device manufacturing method - Google Patents
Carry-out method of object, exchange method of object, object holding apparatus, exposure apparatus, flat-panel display manufacturing method, and device manufacturing method Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67736—Loading to or unloading from a conveyor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
- B65G49/064—Transporting devices for sheet glass in a horizontal position
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
本發明係關於物體之搬出方法、物體之更換方法、物體保持裝置、曝光裝置、平面顯示器之製造方法以及元件製造方法,詳言之,係關於將物體保持裝置上之物體與物體支承構件一起從前述物體保持裝置搬出之物體之搬出方法、包含前述物體之搬出方法之前述物體保持裝置上之物體之更換方法、具備用以搬出前述物體之搬出裝置之至少一部之物體保持裝置、具備前述物體保持裝置之曝光裝置、使用前述曝光裝置之平面顯示器之製造方法、以及使用前述曝光裝置之元件製造方法。 The present invention relates to an object carrying-out method, an object replacing method, an object holding device, an exposure device, a flat display display manufacturing method, and a component manufacturing method, and more particularly, relating to an object on an object holding device together with an object supporting member a method for removing an object carried out by the object holding device, a method for replacing an object on the object holding device including the method for carrying out the object, and an object holding device including at least one part for carrying out the unloading device of the object, and the object An exposure apparatus for a holding device, a method of manufacturing a flat display using the above exposure apparatus, and a method of manufacturing an element using the exposure apparatus described above.
一直以來,於製造液晶顯示元件、半導體元件(積體電路)等電子元件(微元件)之微影製程,主要係使用步進重複(step & repeat)方式之投影曝光裝置(所謂之步進機)、或步進掃描(step & scan)方式之投影曝光裝置(所謂之掃描步進機(亦稱為掃描機))等。 Conventionally, a lithography process for manufacturing electronic components (microcomponents) such as a liquid crystal display element or a semiconductor element (integrated circuit) is mainly a step-and-repeat projection exposure apparatus (a so-called stepping machine). ), or a step-and-scan type projection exposure apparatus (so-called scanning stepper (also called a scanner)).
作為此種曝光裝置,已知有將曝光對象物之玻璃板或晶圓(以下,統稱為「基板」)使用既定基板搬送裝置對基板載台裝置進行搬入及搬出者(例如,參照專利文獻1)。 As such an exposure apparatus, it is known that a glass plate or a wafer (hereinafter collectively referred to as "substrate") of an object to be exposed is carried in and out of the substrate stage device using a predetermined substrate transfer device (for example, refer to Patent Document 1) ).
此處,於曝光裝置,當對基板載台裝置所保持之基板進行之曝光處理結束時,即將該基板從基板載台上搬出,並將另一基板搬送至基板載台上,據以連續進行對複數個 基板之曝光處理。因此,在對複數個基板連續進行曝光處理時,最好是能迅速的進行基板從基板載台裝置之搬出。 Here, in the exposure apparatus, when the exposure processing for the substrate held by the substrate stage apparatus is completed, the substrate is carried out from the substrate stage, and the other substrate is transferred to the substrate stage, and the continuous operation is performed. For plural Exposure processing of the substrate. Therefore, when the exposure processing is continuously performed on a plurality of substrates, it is preferable that the substrate can be quickly carried out from the substrate stage device.
[專利文獻1]美國專利第6,559,928號說明書 [Patent Document 1] US Patent No. 6,559,928
本發明有鑒於上述情事,其第1觀點係一種物體之搬出方法,包含:使保持有用以保持物體之物體保持構件與用於該物體之搬送之物體支承構件的物體保持裝置,朝向從該物體保持構件上搬出該物體之物體搬出位置移動;以及在該物體保持裝置到達該物體搬出位置前,開始將該物體從該物體保持構件上搬出之搬出動作。 The present invention has been made in view of the above circumstances, and a first aspect thereof is a method for carrying out an object, comprising: an object holding device for holding an object holding member for holding an object and an object supporting member for transporting the object, facing the object The object carrying-out position is moved by the holding member, and the object holding device is moved out of the object holding member before the object holding device reaches the object carrying-out position.
根據此方法,由於係在物體保持裝置到達物體搬出位置之前開始物體之搬出動作,因此能迅速進行物體保持構件上之物體之搬出動作。 According to this method, since the object carrying operation is started before the object holding device reaches the object carrying-out position, the object carrying-out operation on the object holding member can be quickly performed.
本發明第2觀點,係一種在物體保持裝置上之物體之更換方法,包含:實施本發明第1觀點之物體之搬出方法之動作;在該物體保持裝置到達該物體搬出位置前,使被支承於另一物體支承構件之另一物體待機於既定待機位置之動作;在該物體保持裝置位於該物體搬出位置之狀態下,將該物體與支承該物體之該物體支承構件從該物體保持裝置搬出之動作;以及將位於該待機位置之該另一物體與支承該另一物體之該另一物體支承構件一起搬入該物體保持裝置上之動作。 According to a second aspect of the present invention, a method for replacing an object on an object holding device includes: an operation of carrying out an object carrying out method according to the first aspect of the present invention; and supporting the object holding device before reaching the object carrying-out position The other object supporting the other object supporting member moves in a predetermined standby position; and the object holding member and the object supporting member supporting the object are carried out from the object holding device in a state where the object holding device is located at the object carrying-out position; And an action of loading the other object located at the standby position with the other object supporting member supporting the other object into the object holding device.
本發明第3觀點,係一種物體保持裝置,具備:保持物體與用於搬送該物體之物體支承構件之物體保持構件;以及將該物體保持構件所保持之該物體與支承該物體之該物體支承構件一起從該物體保持構件上搬出之搬出裝置之之至少一部分。 According to a third aspect of the present invention, an object holding device includes: an object holding member that holds an object and an object supporting member for transporting the object; and the object held by the object holding member and the object supporting the object At least a portion of the unloading device with which the members are carried out from the object holding member.
本發明第4觀點,係一種曝光裝置,包含:本發明第3觀點之物體保持裝置;以及於該物體使用能量束形成既定圖案之圖案形成裝置。 A fourth aspect of the present invention provides an exposure apparatus comprising: the object holding device according to the third aspect of the present invention; and a pattern forming device that forms a predetermined pattern using the energy beam in the object.
本發明第5觀點,係一種曝光裝置,係藉由能量束使物體曝光以於該物體形成圖案,包含:物體保持裝置,具有用以保持該物體與用於搬送該物體之物體支承構件的物體保持構件、與將該物體保持構件所保持之該物體與用以支承該物體之該物體支承構件一起從該物體保持構件上搬出的搬出裝置之至少一部;以及圖案形成裝置,使用能量束於該物體形成既定圖案。 A fifth aspect of the present invention is an exposure apparatus for exposing an object by an energy beam to form a pattern on the object, comprising: an object holding device having an object for holding the object and an object supporting member for transporting the object a holding member, at least one portion of a carrying device that carries out the object held by the object holding member from the object holding member together with the object supporting member for supporting the object; and a pattern forming device that uses an energy beam The object forms a predetermined pattern.
本發明第6觀點,係一種平面顯示器之製造方法,包含:使用本發明第4或第5觀點之曝光裝置使該物體曝光之動作;以及使曝光後之該物體顯影之動作。 According to a sixth aspect of the invention, there is provided a method of manufacturing a flat panel display comprising: an operation of exposing the object using an exposure apparatus according to the fourth or fifth aspect of the invention; and an operation of developing the object after exposure.
本發明第7觀點,係一種元件製造方法,包含:使用本發明第4或第5觀點之曝光裝置使該物體曝光之動作;以及使曝光後之該物體顯影之動作。 According to a seventh aspect of the invention, there is provided a device manufacturing method comprising: an operation of exposing the object using an exposure apparatus according to the fourth or fifth aspect of the invention; and an operation of developing the object after exposure.
以下,使用圖1~圖8(C)說明第1實施形態。 Hereinafter, the first embodiment will be described with reference to Figs. 1 to 8(C).
圖1中概略顯示了第1實施形態之液晶曝光裝置10之構成。液晶曝光裝置10,係以用於例如液晶顯示裝置(平面顯示器)等之矩形(方型)玻璃基板P(以下,僅稱為基板P)為曝光對象物之投影曝光裝置。 The configuration of the liquid crystal exposure apparatus 10 of the first embodiment is schematically shown in Fig. 1 . The liquid crystal exposure device 10 is a projection exposure device in which a rectangular (square) glass substrate P (hereinafter, simply referred to as a substrate P) such as a liquid crystal display device (planar display) is used as an exposure target.
液晶曝光裝置10,包含:照明系IOP、保持光罩M之光罩載台MST、投影光學系PL、用以保持表面(圖1中朝向+Z側之面)塗有光阻劑(感應劑)之基板P之基板載台裝置PST、基板搬入裝置50、與外部裝置之間進行基板之收授之埠部60a、以及此等之控制系等。以下,將曝光時光罩M與基板P相對投影光學系PL分別被掃描之方向設為X軸方向、水平面內與X軸正交之方向為Y軸方向、與X軸及Y軸正交之方向為Z軸方向,並將繞X軸、Y軸及Z軸旋轉之方向分別設為θ x、θ y及θ z方向來進行說明。此外,將於X軸、Y軸及Z軸方向之位置分別設為X位置、Y位置及Z位置來進行說明。 The liquid crystal exposure apparatus 10 includes an illumination system IOP, a mask stage MST holding the mask M, a projection optical system PL, and a surface (the surface facing the +Z side in FIG. 1) coated with a photoresist (sensing agent). The substrate stage device PST of the substrate P, the substrate carrying device 50, and the top portion 60a for receiving the substrate between the external device and the like, and the like. Hereinafter, the direction in which the exposure mask M and the substrate P are scanned with respect to the projection optical system PL is defined as the X-axis direction, the direction orthogonal to the X-axis in the horizontal plane is the Y-axis direction, and the direction orthogonal to the X-axis and the Y-axis. The directions in the Z-axis direction and the directions around the X-axis, the Y-axis, and the Z-axis are defined as θ x , θ y , and θ z directions, respectively. In addition, the positions of the X-axis, the Y-axis, and the Z-axis direction are assumed to be the X position, the Y position, and the Z position, respectively.
照明系IOP具有與例如美國專利第6,552,775號說明書等所揭示之照明系相同之構成。亦即,照明系IOP使從未圖示之光源(例如水銀燈)射出之光分別經由未圖示之反射鏡、分色鏡、遮簾、濾波器、各種透鏡等,作為曝光用照明光(照明光)IL照射光罩M。照明光IL,係使用例如i線(波長365nm)、g線(波長436nm)、h線(波長405nm)等之光(或上述i線、g線、h線之合成光)。 The illumination system IOP has the same configuration as the illumination system disclosed in, for example, the specification of U.S. Patent No. 6,552,775. In other words, the illumination system IOP emits light emitted from a light source (for example, a mercury lamp) (not shown) via an unillustrated mirror, a dichroic mirror, a blind, a filter, various lenses, or the like as an illumination light for exposure (illumination) Light) IL illuminates the mask M. For the illumination light IL, for example, an i-line (wavelength: 365 nm), a g-line (wavelength: 436 nm), an h-line (wavelength: 405 nm), or the like (or the above-described i-line, g-line, and h-line combined light) is used.
於光罩載台MST,例如以真空吸附方式吸附保持有於 其圖案面形成有電路圖案等之光罩M。光罩載台MST被搭載於裝置本體(機體)之一部分之鏡筒平台16上,例如以包含線性馬達之光罩載台驅動系(未圖示)以既定長行程被驅動於掃描方向(X軸方向),並適當的被微驅動於Y軸方向及θ z方向。光罩載台MST於XY平面內之位置資訊(含θ z方向之旋轉資訊)係以包含未圖示之雷射干涉儀之光罩干涉儀系統加以求出。 The reticle stage MST is adsorbed and held by, for example, vacuum adsorption. A mask M having a circuit pattern or the like is formed on the pattern surface. The mask stage MST is mounted on the barrel stage 16 of a part of the apparatus body (body), and is driven in the scanning direction by a predetermined length stroke, for example, by a mask stage driving system (not shown) including a linear motor. The axis direction) is appropriately micro-driven in the Y-axis direction and the θ z direction. The position information (including the rotation information in the θ z direction) of the mask stage MST in the XY plane is obtained by a mask interferometer system including a laser interferometer (not shown).
投影光學系PL配置在光罩載台MST之下方、以鏡筒平台16加以支承。投影光學系PL具有與例如美國專利第6,552,775號說明書所揭之投影光學系相同之構成。亦即,投影光學系PL包含光罩M之圖案像投影區域被配置成鋸齒狀之複數個投影光學系(多透鏡投影光學系),能發揮與具有以Y軸方向為長邊方向之長方形狀單一像場之投影光學系相同之功能。本實施形態中,複數個投影光學系係分別使用例如兩側遠心之等倍系且形成正立像者。 The projection optical system PL is disposed below the mask stage MST and supported by the barrel stage 16. The projection optical system PL has the same configuration as the projection optical system disclosed in the specification of U.S. Patent No. 6,552,775. In other words, the projection optical system PL includes a plurality of projection optical systems (multi-lens projection optical systems) in which the pattern image of the mask M is arranged in a zigzag pattern, and has a rectangular shape with a longitudinal direction in the Y-axis direction. The projection optics of a single image field have the same function. In the present embodiment, each of the plurality of projection optical systems is formed by using, for example, a double-centered telecentric system and forming an erect image.
因此,當以來自照明系IOP之照明光IL照明光罩M上之照明區域時,即藉由通過光罩M之照明光IL,透過投影光學系PL將該照明區域內之光罩M之電路圖案之投影像(部分正立像),形成在基板P上與照明區域共軛之照明光IL之照射區域(曝光區域)。接著,藉由光罩載台MST與基板載台裝置PST之同步驅動,相對照明區域(照明光IL)使光罩M移動於掃描方向,並相對曝光區域(照明光IL)使基板P移動於掃描方向,據以進行基板P上之1個照射區域之掃描曝光,將形成於光罩M之圖案轉印至照射區域。亦即, 本實施形態係藉由照明系IOP及投影光學系PL於基板P上形成光罩M之圖案,藉由照明光IL照射基板P上之感應層(光阻層)之曝光於基板P上形成該圖案。 Therefore, when the illumination area on the reticle M is illuminated by the illumination light IL from the illumination system IOP, that is, by the illumination light IL passing through the reticle M, the circuit of the reticle M in the illumination area is transmitted through the projection optical system PL. The pattern projection image (partial erect image) forms an irradiation region (exposure region) of the illumination light IL conjugated to the illumination region on the substrate P. Then, by the synchronous driving of the mask stage MST and the substrate stage device PST, the mask M is moved in the scanning direction with respect to the illumination area (illumination light IL), and the substrate P is moved relative to the exposure area (illumination light IL). In the scanning direction, scanning exposure of one irradiation region on the substrate P is performed, and the pattern formed on the mask M is transferred to the irradiation region. that is, In the present embodiment, the pattern of the mask M is formed on the substrate P by the illumination system IOP and the projection optical system PL, and the exposure layer (photoresist layer) on the substrate P is irradiated onto the substrate P by the illumination light IL. pattern.
基板載台裝置PST具備平台12及配置在平台12上方之基板載台20a。 The substrate stage device PST includes a stage 12 and a substrate stage 20a disposed above the stage 12.
平台12係由俯視(從+Z側觀察)矩形之板狀構件構成,其上面被加工成非常高之平面度。平台12被搭載於裝置本體之一部分之基板載台架台13上。包含基板載台架台13之裝置本體係搭載在設置於無塵室之地面11上之防振裝置14上,據此,上述光罩載台MST、投影光學系PL等即相對地面11在振動上分離。 The platform 12 is formed of a rectangular plate-like member in plan view (viewed from the +Z side), and the upper surface thereof is processed to a very high flatness. The stage 12 is mounted on a substrate stage stand 13 of a part of the apparatus body. The apparatus including the substrate stage gantry 13 is mounted on the vibration isolating device 14 provided on the floor 11 of the clean room, whereby the reticle stage MST, the projection optical system PL, and the like are vibrated with respect to the ground 11 Separation.
基板載台20a,具備:X粗動載台23X、搭載在X粗動載台23X上與X粗動載台23X一起構成所謂龍門(gantry)式XY雙軸載台裝置之Y粗動載台23Y、配置在Y粗動載台23Y之+Z側(上方)之微動載台21、保持基板P之基板保持具30a、以及在平台12上從下方支承微動載台21之重量消除裝置26等。 The substrate stage 20a includes an X coarse movement stage 23X, and a Y coarse movement stage which is mounted on the X coarse motion stage 23X and the X coarse movement stage 23X to constitute a so-called gantry type XY biaxial stage apparatus. 23Y, a fine movement stage 21 disposed on the +Z side (upper side) of the Y coarse movement stage 23Y, a substrate holder 30a holding the substrate P, and a weight eliminating device 26 for supporting the fine movement stage 21 from below on the stage 12 .
X粗動載台23X由俯視以Y軸方向為長邊方向之矩形構件構成,其中央部形成有以Y軸方向為長邊方向之長孔狀開口部(未圖示)。X粗動載台23X係搭載在與裝置本體分離設置在地面11上延伸於X軸方向之未圖示的導件上,例如在曝光時之掃描動作、基板更換動作時等時以包含線性馬達等之X載台驅動系以既定行程驅動於X軸方向。 The X coarse movement stage 23X is formed of a rectangular member having a longitudinal direction in the Y-axis direction in plan view, and a long hole-shaped opening portion (not shown) having a longitudinal direction in the Y-axis direction is formed in a central portion thereof. The X coarse movement stage 23X is mounted on a guide (not shown) that is provided on the floor 11 and extends in the X-axis direction, and includes a linear motor, for example, during a scanning operation during exposure or a substrate replacement operation. The X stage drive is driven in the X-axis direction with a predetermined stroke.
Y粗動載台23Y係由俯視矩形之構件構成,其中央部 形成有開口部(未圖示)。Y粗動載台23Y係透過Y線性導引裝置25搭載在X粗動載台23X上,例如在曝光時之Y步進動作時等以包含線性馬達等之Y載台驅動系在X粗動載台23X上以既定行程驅動於Y軸方向。又,Y粗動載台23Y則藉由Y線性導引裝置25之作用而與X粗動載台23X一體移動於X軸方向。 The Y coarse movement stage 23Y is composed of a member having a rectangular shape in plan view, and a central portion thereof An opening (not shown) is formed. The Y coarse movement stage 23Y is mounted on the X coarse motion stage 23X through the Y linear guide device 25, and is, for example, a Y stage drive system including a linear motor or the like in the Y step operation during exposure. The stage 23X is driven in the Y-axis direction with a predetermined stroke. Further, the Y coarse movement stage 23Y is moved integrally with the X coarse motion stage 23X in the X-axis direction by the action of the Y linear guide device 25.
微動載台21係由俯視大致正方形之低高度長方體狀構件構成。微動載台21,係以包含由固定於Y粗動載台23Y之固定子與固定於微動載台21之可動子構成之複數個音圈馬達(或線性馬達)的微動載台驅動系,相對Y粗動載台23Y被微驅動於6自由度方向(X軸、Y軸、Z軸、θ x、θ y、θ z方向)。複數個音圈馬達中,包含將微動載台21微驅動於X軸方向之複數個(圖1中係於圖面深度方向重疊)X音圈馬達29x、將微動載台21微驅動於Y軸方向之複數個Y音圈馬達(未圖示)、以及將微動載台21微驅動於Z軸方向之複數個(例如配置在對應微動載台21之四個角部之位置)之Z音圈馬達29z。 The fine movement stage 21 is constituted by a rectangular parallelepiped member having a substantially square shape in plan view. The fine movement stage 21 is a micro-motion stage drive system including a plurality of voice coil motors (or linear motors) composed of a stator fixed to the Y coarse movement stage 23Y and a movable body fixed to the fine movement stage 21, The Y coarse movement stage 23Y is micro-driven in the six-degree-of-freedom direction (X-axis, Y-axis, Z-axis, θ x, θ y, and θ z directions). The plurality of voice coil motors include a plurality of (in FIG. 1 overlapped in the depth direction of the drawing) X-coil motor 29x that micro-drives the micro-motion stage 21 in the X-axis direction, and micro-drives the micro-motion stage 21 to the Y-axis. a plurality of Y-coil motors (not shown) in the direction, and a Z-voice coil that micro-drives the fine movement stage 21 in the Z-axis direction (for example, at positions corresponding to the four corners of the micro-motion stage 21) Motor 29z.
又,微動載台21藉由透過上述複數個音圈馬達被Y粗動載台23Y誘導,而與Y粗動載台23Y一起沿XY平面以既定行程往X軸方向及/或Y軸方向移動。微動載台21之XY平面內之位置資訊係以基板干涉儀系統加以求出,此基板干涉儀系統包含對透過反射鏡座24固定於微動載台21之移動鏡(包含具有與X軸正交之反射面的X移動鏡22x、及具有與Y軸正交之反射面的Y移動鏡(未圖示))照射測距 光束之未圖示之干涉儀(包含使用X移動鏡22x測量微動載台21之X位置的X干涉儀、與使用Y移動鏡測量微動載台21之Y位置的Y干涉儀)。關於微動載台驅動系及基板干涉儀系統之構成,例如已揭露於美國專利出願公開第2010/0018950號說明書。 Further, the fine movement stage 21 is induced by the Y coarse movement stage 23Y through the plurality of voice coil motors, and moves along the XY plane along the Y-axis direction and/or the Y-axis direction along the XY plane together with the Y coarse motion stage 23Y. . The position information in the XY plane of the fine movement stage 21 is obtained by a substrate interferometer system including a moving mirror fixed to the fine movement stage 21 to the transmission mirror mount 24 (including having an orthogonal to the X axis) The X moving mirror 22x of the reflecting surface and the Y moving mirror (not shown) having the reflecting surface orthogonal to the Y axis illuminate the ranging An interferometer (not shown) (including an X interferometer that measures the X position of the fine movement stage 21 using the X moving mirror 22x and a Y interferometer that measures the Y position of the fine movement stage 21 using the Y moving mirror). The configuration of the micro-motion stage drive system and the substrate interferometer system is disclosed, for example, in the specification of U.S. Patent Application Serial No. 2010/0018950.
基板保持具30a由以X軸方向為長邊方向之俯視矩形之低高度長方體狀構件構成,固定在微動載台21之上面上。於基板保持具30a之上面形成有未圖示之複數個孔部。基板保持具30a連接於設置在外部之真空裝置,可藉由上述真空裝置吸附保持基板P。關於基板保持具30a之構成,留待後敘。 The substrate holder 30a is composed of a low-height rectangular parallelepiped member having a rectangular shape in the longitudinal direction of the X-axis direction, and is fixed to the upper surface of the fine movement stage 21. A plurality of holes (not shown) are formed on the upper surface of the substrate holder 30a. The substrate holder 30a is connected to a vacuum device provided outside, and the substrate P can be adsorbed and held by the vacuum device. The configuration of the substrate holder 30a will be described later.
重量消除裝置26係由延伸於Z軸方向之一支柱狀構件構成(亦稱為心柱),透過稱為調平裝置27之裝置從下方支承微動載台21之中央部。重量消除裝置26插入X粗動載台23X及Y粗動載台23Y各個之開口部內。重量消除裝置26透過安裝在其下面部之複數個空氣軸承26a隔著微小間隙懸浮在平台12上。重量消除裝置26在其Z軸方向之重心高度位置透過複數個連結裝置26b連接於Y粗動載台23Y,藉由被Y粗動載台23Y牽引而與該Y粗動載台23Y一起在平台12上移動於Y軸方向及/或X軸方向。 The weight eliminating device 26 is constituted by a column-like member extending from the Z-axis direction (also referred to as a stem), and is supported by a device called a leveling device 27 to support the central portion of the fine movement stage 21 from below. The weight eliminating device 26 is inserted into each of the openings of the X coarse movement stage 23X and the Y coarse motion stage 23Y. The weight eliminating device 26 is suspended on the platform 12 via a plurality of air bearings 26a mounted on the lower portion thereof with a small gap therebetween. The weight eliminating device 26 is connected to the Y coarse movement stage 23Y through a plurality of coupling devices 26b at a position of the center of gravity of the Z-axis direction, and is pulled by the Y coarse movement stage 23Y together with the Y coarse movement stage 23Y on the platform. 12 moves in the Y-axis direction and/or the X-axis direction.
重量消除裝置26具有例如未圖示之空氣彈簧,藉由空氣彈簧產生之鉛直方向向上之力消除(抵銷)微動載台21、調平裝置27、基板保持具30a等之重量(鉛直方向向下之力),據此減輕微動載台驅動系所具有之複數個音圈馬達之 負荷。調平裝置27從下方將微動載台21支承為能相對XY平面擺動(傾斜動作)。調平裝置27透過未圖示之空氣軸承將重量消除裝置26從下方以非接觸方式加以支承。包含調平裝置27、連結裝置26b等,關於重量消除裝置26之詳細構成及動作已揭露於例如美國專利公開第2010/0018950號說明書等。 The weight eliminating device 26 has, for example, an air spring (not shown), and the force in the vertical direction by the air spring is eliminated (offset) by the weight of the fine movement stage 21, the leveling device 27, the substrate holder 30a, etc. (vertical direction) Under the force), according to this, reduce the number of voice coil motors of the micro-motion stage drive system load. The leveling device 27 supports the fine movement stage 21 from below to be swingable (tilting motion) with respect to the XY plane. The leveling device 27 supports the weight eliminating device 26 in a non-contact manner from below by an air bearing (not shown). The leveling device 27, the connecting device 26b, and the like are included, and the detailed configuration and operation of the weight eliminating device 26 are disclosed, for example, in the specification of US Patent Publication No. 2010/0018950.
此時,於液晶曝光裝置10,基板P往基板保持具30a之搬入(load)及基板P從基板保持具30a之搬出(unload),係將基板P裝載於圖2(A)及圖2(B)所示之稱為基板托盤40a之構件上後進行。 At this time, in the liquid crystal exposure apparatus 10, the loading of the substrate P into the substrate holder 30a and the unloading of the substrate P from the substrate holder 30a are performed by loading the substrate P in FIG. 2(A) and FIG. 2 ( B) is shown as being referred to as a member of the substrate tray 40a.
基板托盤40a,如圖2(A)所示,具有複數個支承構件41、連結構件42、複數個補強構件43等。支承構件41由延伸於X軸方向之棒狀構件構成,與長邊方向正交之剖面(YZ剖面)形狀為矩形。複數個支承構件41係於Y軸方向以大致均等間隔彼此平行的配置。如圖5所示,支承構件41之長邊方向尺寸係設定為較基板P之X軸方向尺寸略長,基板托盤40a使用複數個支承構件41從下方支承基板P。於複數個支承構件41各個之上面形成有未圖示之複數個微小孔部,可透過該複數個孔部吸附保持基板P。又,圖2(A)、圖4、圖5等所示之本第1實施形態之基板托盤40a,舉例而言具有3支支承構件41,但支承構件41之支數不限於此,例如可視基板P之大小、厚度(易彎曲度)等適當的加以變更。 As shown in FIG. 2(A), the substrate tray 40a includes a plurality of support members 41, a connection member 42, a plurality of reinforcing members 43, and the like. The support member 41 is formed of a rod-shaped member extending in the X-axis direction, and has a rectangular cross section (YZ cross section) orthogonal to the longitudinal direction. The plurality of support members 41 are arranged in parallel with each other at substantially equal intervals in the Y-axis direction. As shown in FIG. 5, the dimension of the longitudinal direction of the support member 41 is set to be slightly longer than the dimension of the substrate P in the X-axis direction, and the substrate tray 40a supports the substrate P from below using a plurality of support members 41. A plurality of minute holes (not shown) are formed on each of the plurality of support members 41, and the substrate P can be adsorbed and held through the plurality of holes. Further, the substrate tray 40a of the first embodiment shown in FIG. 2(A), FIG. 4, FIG. 5 and the like has three support members 41, for example, but the number of the support members 41 is not limited thereto, for example, visible. The size, thickness (flexibility) of the substrate P, and the like are appropriately changed.
於複數個支承構件41各個之+X側端部,如圖2(B)所 示,安裝有具有從-X側往+X側漸細之錐面的錐狀(taper)構件44a(圓錐梯形構件)。此外,於複數個支承構件41各個之-X側端部,安裝有具有從+X側往-X側漸細之錐面的錐狀構件44b。 On the +X side end of each of the plurality of support members 41, as shown in Fig. 2(B) A taper member 44a (conical trapezoidal member) having a tapered surface that tapers from the -X side to the +X side is attached. Further, a tapered member 44b having a tapered surface which tapers from the +X side to the -X side is attached to the -X side end portion of each of the plurality of support members 41.
連結構件42,由圖2(A)及圖2(B)可知,由延伸於Y軸方向之XZ剖面為矩形之棒狀構件構成。連結構件42,其下部嵌合於形成在複數個支承構件41各個之+X側端部近旁上面之凹部,將複數個支承構件41彼此連結。複數個補強構件43由分別延伸於Y軸方向之XZ剖面為矩形之棒狀構件構成,其厚度被設定為較支承構件41薄。於複數個支承構件41之各個,如圖2(B)所示,其上面於X軸方向以既定間隔形成有凹部,補強構件43嵌合於該複數個凹部之各個。補強構件43嵌合之凹部之深度,係設定為補強構件43之上面較支承構件41之上面位於-Z側(或相同Z位置)。基板托盤40a藉由複數個支承構件41之長邊方向中間部以複數個補強構件43加以彼此連接,而提昇了全體之剛性。 As shown in FIGS. 2(A) and 2(B), the connecting member 42 is formed of a rod-shaped member having a rectangular XZ cross section extending in the Y-axis direction. The connecting member 42 has a lower portion fitted to a concave portion formed on the upper side of the +X side end portion of each of the plurality of supporting members 41, and connects the plurality of supporting members 41 to each other. The plurality of reinforcing members 43 are formed of a rod-shaped member having a rectangular XZ cross section extending in the Y-axis direction, and the thickness thereof is set to be thinner than the supporting member 41. As shown in FIG. 2(B), each of the plurality of support members 41 has a concave portion formed at a predetermined interval in the X-axis direction, and the reinforcing member 43 is fitted to each of the plurality of concave portions. The depth of the concave portion in which the reinforcing member 43 is fitted is set such that the upper surface of the reinforcing member 43 is located on the -Z side (or the same Z position) than the upper surface of the supporting member 41. The substrate tray 40a is connected to each other by a plurality of reinforcing members 43 at the intermediate portion in the longitudinal direction of the plurality of support members 41, thereby increasing the rigidity of the entire body.
又,複數個支承構件41(本實施形態中,例如為3支)中,中央之支承構件41在其下面之-X側端部近旁具有長方體狀之突起45a。關於突起45a之功能留待後敘。 Further, in the plurality of support members 41 (for example, three in the present embodiment), the central support member 41 has a rectangular parallelepiped projection 45a near the -X side end portion of the lower surface. The function of the protrusion 45a is left to be described later.
如圖3所示,於基板保持具30a之上面(基板裝載面)對應上述基板托盤40a之複數個支承構件41(參照圖2(A)),延伸於X軸之X槽31x於Y軸方向以既定間隔形成有複數條(本第1實施形態中,例如為3條)。X槽31x於基板保持具30a之+X側及-X側之各側面開口。複數個X 槽31x於Y軸方向之間隔,與圖2(A)所示之基板托盤40a之複數個支承構件41於Y軸方向之間隔大致一致。如圖4(A)所示,在基板P被裝載於基板保持具30a上之狀態下,於X槽31x內收容基板托盤40a之支承構件41。又,基板保持具30a於X軸方向之長度被設定為較支承構件41於X軸方向之長度短,在基板托盤40a與基板保持具30a組合之狀態下,連結構件42係位於基板保持具30a之外側(較基板保持具30a之+X側端部更為+X側),錐狀構件44a、44b分別突出於基板保持具30a之外側。 As shown in FIG. 3, a plurality of support members 41 (see FIG. 2(A)) corresponding to the substrate tray 40a on the upper surface (substrate mounting surface) of the substrate holder 30a are extended to the X-axis Xx of the X-axis in the Y-axis direction. A plurality of strips are formed at predetermined intervals (for example, three in the first embodiment). The X groove 31x is open on each of the +X side and the -X side of the substrate holder 30a. Multiple X The interval between the grooves 31x in the Y-axis direction substantially coincides with the interval between the plurality of support members 41 of the substrate tray 40a shown in Fig. 2(A) in the Y-axis direction. As shown in FIG. 4(A), in a state where the substrate P is mounted on the substrate holder 30a, the support member 41 of the substrate tray 40a is housed in the X groove 31x. Further, the length of the substrate holder 30a in the X-axis direction is set to be shorter than the length of the support member 41 in the X-axis direction, and the connection member 42 is positioned in the substrate holder 30a in a state where the substrate tray 40a is combined with the substrate holder 30a. The outer side (more on the +X side than the +X side end of the substrate holder 30a), the tapered members 44a and 44b respectively protrude from the outer side of the substrate holder 30a.
回到圖3,於基板保持具30a之上面,對應上述基板托盤40a之複數個補強構件43(參照圖2(A)),延伸於Y軸方向之Y槽31y於X軸方向以既定間隔形成有複數條(本第1實施形態中,例如為3條)。複數個Y槽31y於X軸方向之間隔,與圖2(A)所示之基板托盤40a之複數個補強構件43於X軸方向之間隔大致一致,如圖4(A)所示,在基板托盤40a與基板保持具30a組合之狀態下,於Y槽31y內收容基板托盤40a之補強構件43。 Referring back to Fig. 3, on the upper surface of the substrate holder 30a, a plurality of reinforcing members 43 corresponding to the substrate tray 40a (see Fig. 2(A)), Y grooves 31y extending in the Y-axis direction are formed at predetermined intervals in the X-axis direction. There are a plurality of strips (for example, three in the first embodiment). The interval between the plurality of Y grooves 31y in the X-axis direction is substantially the same as the interval between the plurality of reinforcing members 43 of the substrate tray 40a shown in FIG. 2(A) in the X-axis direction, as shown in FIG. 4(A), on the substrate. In a state where the tray 40a is combined with the substrate holder 30a, the reinforcing member 43 of the substrate tray 40a is housed in the Y groove 31y.
回到圖3,複數個X槽31x中、除中央之X槽31x外之其他X槽31x(本第1實施形態中,係+Y側及-Y側之2條X槽31x)內,分別收容複數個(本第1實施形態中,一條X槽31x於X軸方向以既定間隔,收容例如3個)托盤導引裝置32。托盤導引裝置32,如圖4(B)所示,具有被收容在形成於用以規定X槽31x之底面之凹部33內的Z致動器34、以及被Z致動器34在X槽31x內驅動於於上下(Z軸) 方向的導件35。Z致動器34之種類並無特別限定,但可使用例如將水平方向之力轉換為垂直方向之力的凸輪裝置、進給螺桿裝置、空氣致動器等。複數個托盤導引裝置32各個之Z致動器34,係藉由未圖示之主控制裝置被同步驅動。導件35由與XY平面平行之板狀構件構成,從下方支承基板托盤40a之支承構件41。於導件35上面形成有複數個未圖示之微小孔部,可從該孔部噴出加壓氣體(例如、空氣),隔著微小間隙懸浮支承支承構件41。此外,導件35可使用上述孔部(或另一孔部)吸附保持裝載於其上面上之支承構件41。 Referring back to Fig. 3, in the X slots 31x of the plurality of X slots 31x, except for the X slots 31x of the center X slots 31x (in the first embodiment, the two X slots 31x on the +Y side and the -Y side), respectively In the first embodiment, in the first embodiment, one X-slot 31x accommodates, for example, three at a predetermined interval in the X-axis direction. As shown in FIG. 4(B), the tray guide 32 has a Z actuator 34 housed in a recess 33 formed in a bottom surface for defining the X slot 31x, and a Z actuator 34 in the X slot. Drive up and down (Z axis) in 31x Directional guide 35. The type of the Z actuator 34 is not particularly limited, and for example, a cam device that converts a force in the horizontal direction into a force in the vertical direction, a feed screw device, an air actuator, or the like can be used. The Z actuators 34 of the plurality of tray guides 32 are synchronously driven by a main control unit (not shown). The guide 35 is composed of a plate-like member parallel to the XY plane, and supports the support member 41 of the substrate tray 40a from below. A plurality of micro-hole portions (not shown) are formed on the upper surface of the guide member 35, and a pressurized gas (for example, air) can be ejected from the hole portion, and the support member 41 can be suspended and supported via a small gap. Further, the guide member 35 can adsorb and hold the support member 41 mounted thereon on the above-described hole portion (or another hole portion).
回到圖3,複數個X槽31x中、於中央之X槽31x內收容有基板搬出裝置70a。基板搬出裝置70a具有X行進導件71及按壓構件72a。X行進導件71由延伸於X軸方向之構件構成,被固定在用以規定X槽31x之底面。X行進導件71之長邊(X軸)方向尺寸設定為較基板保持具30a之X軸方向尺寸長,其長邊方向兩端部分別突出於基板保持具30a之外側。按壓構件72a,如圖7(A)所示,由XZ剖面L字形之構件構成,平行於XY平面之部分以可滑動於X軸方向之方式卡合於X行進導件71,以既定行程在X行進導件71上被驅動於X軸方向。用以驅動按壓構件72a之驅動裝置之種類無特別限定,可使用例如由X行進導件71所具有之固定子與按壓構件72a所具有之可動子構成之X線性馬達、或由X行進導件71所具有之進給螺桿與按壓構件72a所具有之螺帽構成之進給螺桿裝置等。 Referring back to Fig. 3, the substrate carrying device 70a is housed in the X slot 31x in the center among the plurality of X slots 31x. The substrate carrying-out device 70a has an X traveling guide 71 and a pressing member 72a. The X traveling guide 71 is constituted by a member extending in the X-axis direction, and is fixed to a bottom surface for defining the X groove 31x. The long side (X-axis) direction dimension of the X traveling guide 71 is set to be longer than the X-axis direction dimension of the substrate holder 30a, and both end portions in the longitudinal direction thereof protrude from the outside of the substrate holder 30a. As shown in FIG. 7(A), the pressing member 72a is formed of an L-shaped member having an XZ cross section, and the portion parallel to the XY plane is engaged with the X traveling guide 71 so as to be slidable in the X-axis direction, with a predetermined stroke. The X traveling guide 71 is driven in the X-axis direction. The type of the driving means for driving the pressing member 72a is not particularly limited, and for example, an X linear motor composed of a stator having the X traveling guide 71 and a movable member of the pressing member 72a, or an X traveling guide can be used. A feed screw device or the like which has a feed screw and a nut having a pressing member 72a.
基板搬入裝置50,如圖1所示,具有第1搬送單元51a與第2搬送單元51b。第1搬送單元51a配置在後述埠部60a之上方,第2搬送單元51b則配置成在第1搬送單元51a之-X側、當為進行基板P之更換而基板載台20a移動至與埠部60a相鄰接之位置(平台12之+X側端部近旁上之位置。以下,稱基板更換位置)時,位於基板保持具30a之上方。又,基板更換位置亦可如後述般稱為將被保持於基板保持具30a(基板載台20a)之基板P從基板保持具30a(基板載台20a)上搬出之基板搬出位置(物體搬出位置)。 As shown in FIG. 1, the substrate loading device 50 includes a first transport unit 51a and a second transport unit 51b. The first transfer unit 51a is disposed above the crotch portion 60a, and the second transfer unit 51b is disposed on the -X side of the first transfer unit 51a, and the substrate stage 20a is moved to the crotch portion when the substrate P is replaced. The position adjacent to 60a (the position on the vicinity of the +X side end of the stage 12, hereinafter referred to as the substrate replacement position) is located above the substrate holder 30a. In addition, the substrate replacement position can be referred to as a substrate carry-out position (object removal position) in which the substrate P held by the substrate holder 30a (substrate stage 20a) is carried out from the substrate holder 30a (substrate stage 20a). ).
第1搬送單元51a,如圖5所示,具有一對X行進導件52、與一對X行進導件52對應設置之一對X滑件53及架設在一對X滑件53間之保持構件54a。一對X行進導件52分別由延伸於X軸方向之構件構成,其長邊方向尺寸被設定為較基板P之X軸方向尺寸略長。一對X行進導件52係於Y軸方向以既定間隔(較基板P之Y軸方向尺寸略寬之間隔)配置成彼此平行。一對X滑件53分別以能滑動於X軸方向之方式卡合於對應之X行進導件52,以未圖示之致動器(例如進給螺桿裝置、線性馬達、皮帶驅動裝置等)沿X行進導件52以既定行程加以同步驅動。 As shown in FIG. 5, the first transport unit 51a has a pair of X traveling guides 52, a pair of X sliders 53 corresponding to the pair of X traveling guides 52, and a holding between the pair of X sliders 53. Member 54a. Each of the pair of X traveling guides 52 is formed of a member extending in the X-axis direction, and its longitudinal direction dimension is set to be slightly longer than the dimension of the substrate P in the X-axis direction. The pair of X traveling guides 52 are disposed in parallel with each other at a predetermined interval (a space which is slightly wider than the dimension of the substrate P in the Y-axis direction) in the Y-axis direction. The pair of X sliders 53 are respectively engaged with the corresponding X traveling guides 52 so as to be slidable in the X-axis direction, and are not shown (for example, a feed screw device, a linear motor, a belt drive device, etc.) The X-travel guide 52 is driven synchronously with a predetermined stroke.
保持構件54a由延伸於Y軸方向之構件構成,在朝向-X側之面部形成有複數個凹部55a。複數個凹部55a係於Y軸方向以既定間隔(與基板托盤40a之複數個錐狀構件44a於Y軸方向之間隔大致相同之間隔)形成有複數個。凹部55a由從-X側朝+X側漸窄之錐面加以規定,保持構件54a, 係透過基板托盤40a之複數個錐狀構件44a分別挿入複數個凹部55a內,據以保持基板托盤40a之+X側端部。上述一對X行進導件52、一對X滑件53及保持構件54a被未圖示之Z致動器以既定行程驅動於Z軸方向。又,亦可作成不變更一對X行進導件52及一對X滑件53之Z位置,而僅使保持構件54a可相對一對X行進導件52移動於Z軸方向。第2搬送單元51b之構成,除被基板托盤40a之錐狀構件44b挿入之複數個凹部55b係形成在保持構件54b之+X側面部外,與上述第1搬送單元51a相同,因此省略其說明。 The holding member 54a is constituted by a member extending in the Y-axis direction, and a plurality of concave portions 55a are formed on the surface facing the -X side. The plurality of concave portions 55a are formed in plural at a predetermined interval (at substantially the same interval from the interval between the plurality of tapered members 44a of the substrate tray 40a in the Y-axis direction) in the Y-axis direction. The concave portion 55a is defined by a tapered surface that is tapered from the -X side toward the +X side, and the holding member 54a is A plurality of tapered members 44a that have passed through the substrate tray 40a are inserted into a plurality of recessed portions 55a, thereby holding the +X side end portions of the substrate tray 40a. The pair of X traveling guides 52, the pair of X sliders 53, and the holding member 54a are driven in the Z-axis direction by a Z actuator (not shown) with a predetermined stroke. Further, the Z position of the pair of X traveling guides 52 and the pair of X sliders 53 may be changed, and only the holding member 54a may be moved in the Z-axis direction with respect to the pair of X traveling guides 52. In the configuration of the second transport unit 51b, the plurality of concave portions 55b inserted by the tapered member 44b of the substrate tray 40a are formed on the +X side surface portion of the holding member 54b, and are the same as the first transport unit 51a. Therefore, the description thereof is omitted. .
基板搬入裝置50,可在以第1搬送單元51a之保持構件54a及第2搬送單元51b之保持構件54b保持基板托盤40a之狀態,同步驅動複數個X滑件53,據以使基板托盤40a沿XY平面(水平面)在埠部60a之上方、與基板更換位置之上方之間移動。又,基板搬入裝置50,可藉由將第1搬送單元51a與第2搬送單元51b同步驅動於Z軸方向,據以在埠部60a之上方、或基板更換位置之上方區域分別使基板托盤40a上下動。 In the substrate loading device 50, the plurality of X sliders 53 can be synchronously driven while the substrate tray 40a is held by the holding member 54a of the first transport unit 51a and the holding member 54b of the second transport unit 51b, so that the substrate tray 40a is driven along The XY plane (horizontal plane) moves between the top portion 60a and the upper portion of the substrate replacement position. Further, the substrate loading device 50 can drive the first transfer unit 51a and the second transfer unit 51b in the Z-axis direction in synchronization with each other, and the substrate tray 40a can be respectively disposed above the crotch portion 60a or above the substrate replacement position. Move up and down.
接著,針對使用基板搬入裝置50將基板P搬入基板保持具30a之搬入動作,使用圖6(A)~圖6(C)加以說明。又,圖6(A)~圖6(C)中,為簡化說明,基板載台20a中除基板保持具30a以外之構件、基板搬入裝置50中除保持構件54a、54b以外之構件之圖示,分別加以省略。如圖6(A)所示,被保持於保持構件54a、54b之基板托盤40a,被搬送至位於基板更換位置之基板保持具30a上方。基板載台20a 之y位置係被定位成基板托盤40a之複數個支承構件41(參照圖2(A))之Y位置、與複數個X槽31x之Y位置大致一致。於基板保持具30a,複數個托盤導引裝置32各個之導件35,被定位成其上面較基板保持具30a之上面位於+Z側(從基板保持具30a之上面突出)。又,基板搬出裝置70a之按壓構件72a位在其可動範圍之最-X側位置、基板保持具30a之外側。X行進導件71之長度係設定為基板搬入時按壓構件72a與基板托盤40a不會接觸。 Next, the loading operation of loading the substrate P into the substrate holder 30a by using the substrate loading device 50 will be described with reference to FIGS. 6(A) to 6(C). In addition, in FIGS. 6(A) to 6(C), for the sake of simplification of description, members other than the substrate holder 30a in the substrate stage 20a, and members other than the holding members 54a and 54b in the substrate loading device 50 are illustrated. , omitted separately. As shown in FIG. 6(A), the substrate tray 40a held by the holding members 54a and 54b is conveyed to the upper side of the substrate holder 30a at the substrate replacement position. Substrate stage 20a The y position is substantially equal to the Y position of the plurality of support members 41 (see FIG. 2(A)) positioned in the substrate tray 40a and the Y positions of the plurality of X grooves 31x. In the substrate holder 30a, the guides 35 of the plurality of tray guides 32 are positioned such that they are positioned on the +Z side (projecting from the upper surface of the substrate holder 30a) above the substrate holder 30a. Further, the pressing member 72a of the substrate carrying-out device 70a is positioned at the most X-side position of the movable range and outside the substrate holder 30a. The length of the X traveling guide 71 is set such that the pressing member 72a does not come into contact with the substrate tray 40a when the substrate is loaded.
從圖6(A)所示之狀態起,未圖示之主控制裝置藉由將保持構件54a、54b分別驅動於-Z方向(參照圖6(A)之箭頭),據以使基板托盤40a降下。據此,如圖6(B)所示,基板托盤40a即被交至複數個托盤導引裝置32上,被吸附保持於複數個導件35。主控制裝置,在基板托盤40a被裝載於複數個托盤導引裝置32之導件35上之狀態下,將保持構件54a、54b分別驅動於從基板托盤40a離開之方向(參照圖6(B)之箭頭)後,如圖6(C)所示,驅動於上方(參照圖6(C)之箭頭)。 From the state shown in FIG. 6(A), the main control unit (not shown) drives the holding members 54a and 54b in the -Z direction (see the arrow of FIG. 6(A)), whereby the substrate tray 40a is driven. lower. Accordingly, as shown in FIG. 6(B), the substrate tray 40a is delivered to a plurality of tray guides 32, and is adsorbed and held by the plurality of guides 35. In the state in which the substrate tray 40a is mounted on the guides 35 of the plurality of tray guides 32, the main control device drives the holding members 54a and 54b in the direction away from the substrate tray 40a (refer to FIG. 6(B). After the arrow), as shown in FIG. 6(C), it is driven upward (refer to the arrow of FIG. 6(C)).
又,於基板保持具30a,如圖6(C)所示,複數個導件35被同步驅動於-Z方向(參照圖6(C)之箭頭),據此,基板托盤40a及降下,基板P被裝載於基板保持具30a之上面上。又,複數個導件35,在將基板P裝載於基板保持具30a之上面上後,亦進一步被驅動於-Z方向。據此,基板托盤40a與基板P之下面即分離,基板P被吸附保持於基板保持具30a。 Further, in the substrate holder 30a, as shown in FIG. 6(C), a plurality of guides 35 are synchronously driven in the -Z direction (see an arrow in FIG. 6(C)), whereby the substrate tray 40a and the substrate are lowered. P is mounted on the upper surface of the substrate holder 30a. Further, the plurality of guides 35 are further driven in the -Z direction after the substrate P is mounted on the upper surface of the substrate holder 30a. Thereby, the substrate tray 40a is separated from the lower surface of the substrate P, and the substrate P is adsorbed and held by the substrate holder 30a.
回到圖1,埠部60a具有架台61及複數個托盤導引裝置62(圖1中係重疊於紙面深度方向而被遮蔽。參照圖3)。架台61係設在地面11上、平台12之+X側位置,與基板載台裝置PST一起被收容在未圖示之腔室(chamber)內。 Referring back to Fig. 1, the dam portion 60a has a gantry 61 and a plurality of tray guides 62 (which are covered in the depth direction of the paper in Fig. 1 and are shielded. See Fig. 3). The gantry 61 is provided on the floor 11 and at the +X side of the stage 12, and is housed in a chamber (not shown) together with the substrate stage device PST.
複數個(本實施形態中,例如為2台)之托盤導引裝置62,如圖3所示,係於Y軸方向以既定間隔搭載在架台61上。又,本實施形態之埠部60a,例如具有2台托盤導引裝置62,但複數個托盤導引裝置62之台數不限於此,例如可視基板托盤40a之支承構件41(圖3中未圖示。參照圖2(A))之支數適當的加以變更。具體而言,係對應複數個支承構件41中、除了具有突起45a(參照圖2(B))之支承構件41(本第1實施形態中為中央之支承構件41)外之其他支承構件41,托盤導引裝置62被設置在架台61上。本實施形態中,例如2台托盤導引裝置62於Y軸方向之間隔,如圖5所示,與基板托盤40a之最+Y側之支承構件41與最-Y側之支承構件41間之間隔大致一致。 As shown in FIG. 3, the plurality of tray guides 62 (for example, two in the present embodiment) are mounted on the gantry 61 at predetermined intervals in the Y-axis direction. Further, the crotch portion 60a of the present embodiment has, for example, two tray guiding devices 62, but the number of the plurality of tray guiding devices 62 is not limited thereto, for example, the supporting member 41 of the substrate tray 40a (not shown in FIG. 3) The number of the reference Fig. 2(A)) is appropriately changed. Specifically, the support members 41 other than the support members 41 having the projections 45a (see FIG. 2(B)) (the central support members 41 in the first embodiment) are associated with the plurality of support members 41, The tray guide 62 is disposed on the gantry 61. In the present embodiment, for example, the interval between the two tray guides 62 in the Y-axis direction is as shown in FIG. 5 between the support member 41 on the most +Y side of the substrate tray 40a and the support member 41 on the most-Y side. The intervals are roughly the same.
托盤導引裝置62,如圖1所示,具有由延伸於X軸方向之板狀構件構成之基座63、在基座63上於X軸方向以既定間隔搭載之複數個(例如3台)Z致動器64、以及被Z致動器64驅動於上下(Z軸)方向之複數個導件65等。基座63,被由固定在架台61上面之複數個X線性導件66與固定在基座63下面、滑動自如地卡合於X線性導件66之X滑件67構成之X線性導引裝置,直進引導於X軸方向。此外,基座63,被未圖示之X致動器(例如進給螺桿裝置、線性馬 達等)以既定行程驅動於X軸方向。Z致動器64之種類無特別限定,可使用例如凸輪裝置、進給螺桿裝置、空氣致動器等。複數個托盤導引裝置62各個之Z致動器64係藉由未圖示之主控制裝置加以同步驅動。導件65由平行於XY平面之板狀構件構成,於其上面上裝載基板托盤40a之支承構件41(參照圖2(A))。於導件65之上面形成有未圖示之複數個微小孔部,藉由從該孔部噴出加壓氣體(例如空氣),而能隔著微小間隙懸浮支承基板托盤40a。 As shown in FIG. 1, the tray guide 62 has a susceptor 63 composed of a plate-like member extending in the X-axis direction, and a plurality of (for example, three) mounted on the susceptor 63 at a predetermined interval in the X-axis direction. The Z actuator 64 and a plurality of guides 65 and the like that are driven by the Z actuator 64 in the up and down (Z axis) direction. The pedestal 63 is composed of a plurality of X linear guides 66 fixed to the upper surface of the gantry 61 and an X linear guide 67 fixed to the lower surface of the pedestal 63 and slidably engaged with the X linear guide 66 of the X linear guide 66. , straight forward guides the X-axis direction. Further, the base 63 is an X actuator (not shown) (for example, a feed screw device, a linear horse) 达, etc.) is driven in the X-axis direction with a predetermined stroke. The type of the Z actuator 64 is not particularly limited, and for example, a cam device, a feed screw device, an air actuator, or the like can be used. The Z actuators 64 of the plurality of tray guides 62 are synchronously driven by a main control unit (not shown). The guide 65 is composed of a plate-like member parallel to the XY plane, and a support member 41 of the substrate tray 40a is mounted on the upper surface thereof (see FIG. 2(A)). A plurality of micro hole portions (not shown) are formed on the upper surface of the guide member 65, and by pressing a pressurized gas (for example, air) from the hole portion, the substrate tray 40a can be suspended and supported via a small gap.
接著,針對使用基板搬出裝置70a將基板托盤40a及基板托盤40a上所裝載之基板P從基板保持具30a交至埠部60a之搬送動作(基板搬出動作),使用圖7(A)及圖7(B)加以說明。又,圖7(A)及圖7(B)中,為簡化說明,基板載台20a中除基板保持具30a外之構件、埠部60a中之架台61之一部分之圖示,分別加以省略。從基板保持具30a搬出基板P時,於基板保持具30a,如圖7(A)所示,在解除基板P之吸附保持後,同步驅動複數個托盤導引裝置32將複數個導件35驅動於+Z方向。據此,基板托盤40a即上昇,基板P被複數個支承構件41從下方支承。又,主控制裝置在基板P被支承於基板托盤40a後,亦進一步使複數個導件35移動於+Z方向。據此,基板P與基板托盤40a一體的往+Z方向移動,基板P之下面從基板保持具30a之上面分離。此時,主控制裝置使基板P從基板保持具30a分離,且以使複數個補強構件43之下面較基板保持具30a之上面位於+Z側所需之最小行程驅動導件35。因此,基板托盤40a 之複數個支承構件41即成為其下半部被收容在X槽31x內之狀態。 Next, the transfer operation (substrate unloading operation) of transferring the substrate P loaded on the substrate tray 40a and the substrate tray 40a from the substrate holder 30a to the crotch portion 60a by using the substrate unloading device 70a, using FIGS. 7(A) and 7 (B) Explain. In addition, in FIGS. 7(A) and 7(B), in order to simplify the description, the components other than the substrate holder 30a and the portion of the gantry 61 in the crotch portion 60a of the substrate stage 20a are omitted. When the substrate P is carried out from the substrate holder 30a, the substrate holder 30a is driven by the plurality of tray guides 32 to drive the plurality of tray guides 35 synchronously after the substrate P is sucked and held as shown in Fig. 7(A). In the +Z direction. As a result, the substrate tray 40a rises, and the substrate P is supported by the plurality of support members 41 from below. Further, after the substrate P is supported by the substrate tray 40a, the main control device further moves the plurality of guides 35 in the +Z direction. As a result, the substrate P moves integrally with the substrate tray 40a in the +Z direction, and the lower surface of the substrate P is separated from the upper surface of the substrate holder 30a. At this time, the main control device separates the substrate P from the substrate holder 30a, and drives the guide 35 with the minimum stroke required for the lower surface of the plurality of reinforcing members 43 to be located on the +Z side of the upper surface of the substrate holder 30a. Therefore, the substrate tray 40a The plurality of support members 41 are in a state in which the lower half thereof is housed in the X groove 31x.
又,於埠部60a,複數個托盤導引裝置62被驅動於-X方向(基板載台20a側),將基座63之-X側端部定位在從架台61往-X側突出之位置。此外,控制複數個Z致動器64,使複數個導件65之Z位置與基板保持具30a內之複數個導件35之Z位置大致相同(或略-Z側)。 Further, in the crotch portion 60a, a plurality of tray guiding devices 62 are driven in the -X direction (on the substrate stage 20a side), and the -X side end portion of the susceptor 63 is positioned at a position protruding from the gantry 61 toward the -X side. . Further, a plurality of Z actuators 64 are controlled such that the Z positions of the plurality of guides 65 are substantially the same as the Z positions of the plurality of guides 35 in the substrate holder 30a (or slightly - Z side).
接著,於基板保持具30a,基板搬出裝置70a之按壓構件72a被驅動於+X方向。按壓構件72a之Z位置(高度)係被設定為為搬出基板P而基板托盤40a在基板保持具30a內被支承於複數個托盤導引裝置32之狀態下,抵接於突起45a。因此,當按壓構件72a被驅動於+X方向時,如圖7(B)所示,基板托盤40a即被按壓構件72a按壓,與按壓構件72a一體的移動於+X方向。此外,於埠部60a,與往+X方向移動之基板托盤40a連動,將托盤導引裝置62驅動於+X方向。 Next, in the substrate holder 30a, the pressing member 72a of the substrate unloading device 70a is driven in the +X direction. The Z position (height) of the pressing member 72a is set to be in contact with the projection 45a in a state in which the substrate P is carried out and the substrate tray 40a is supported by the plurality of tray guiding devices 32 in the substrate holder 30a. Therefore, when the pressing member 72a is driven in the +X direction, as shown in FIG. 7(B), the substrate tray 40a is pressed by the pressing member 72a, and moves integrally with the pressing member 72a in the +X direction. Further, the dam portion 60a is driven in the +X direction in conjunction with the substrate tray 40a moving in the +X direction.
此時,基板保持具30a側之導件35及埠部60a側之導件65分別對支承構件41之下面噴出加壓氣體,以懸浮支承基板托盤40a。因此,能將基板托盤40a(基板P)以高速、且低發塵從基板保持具30a搬出至埠部60a。又,由於是以高速搬出基板P,因此,基板托盤40a問避免基板P之位置偏移,亦可是吸附保持基板P(可僅是藉由摩擦力之保持)。此外,亦可將限制基板P在基板托盤40a上之移動之限制構件(例如,從支承構件41突出之銷狀構件等)設在基板托 盤40a。又,由於基板托盤40a係被懸浮支承,因此為了避免以按壓構件72a按壓基板托盤40a時基板托盤40a與按壓構件72a分離,例如可於按壓構件72a設置吸附保持突起45a之吸附裝置(例如真空吸附裝置、磁氣吸附裝置等)。或者,亦可設置例如使按壓構件72a與基板托盤40a機械性卡合之機構(例如,鎖銷(lock pin)等)。再者,亦可例如利用導件35之吸附保持機能使-Z方向之輕負荷(制動力)作用於基板托盤40a,據以防止按壓構件72a與突起45a分離。 At this time, the guide 35 on the substrate holder 30a side and the guide 65 on the side of the flange portion 60a respectively eject pressurized gas to the lower surface of the support member 41 to suspend and support the substrate tray 40a. Therefore, the substrate tray 40a (substrate P) can be carried out from the substrate holder 30a to the crotch portion 60a at a high speed and with low dust generation. Further, since the substrate P is carried out at a high speed, the substrate tray 40a can avoid the positional deviation of the substrate P, and the adsorption holding substrate P can be held only by the frictional force. Further, a regulating member that restricts movement of the substrate P on the substrate tray 40a (for example, a pin-shaped member protruding from the supporting member 41, etc.) may be provided on the substrate holder. Disk 40a. Further, since the substrate tray 40a is suspended and supported, in order to prevent the substrate tray 40a from being separated from the pressing member 72a when the pressing member 72a is pressed against the substrate tray 40a, for example, an adsorption device (for example, vacuum suction) in which the adsorption holding projection 45a is provided to the pressing member 72a can be provided. Device, magnetic gas adsorption device, etc.). Alternatively, for example, a mechanism (for example, a lock pin or the like) that mechanically engages the pressing member 72a and the substrate tray 40a may be provided. Further, for example, the suction holding device of the guide 35 can apply a light load (braking force) in the -Z direction to the substrate tray 40a, thereby preventing the pressing member 72a from being separated from the projection 45a.
進一步的,本第1實施形態中,基板P之搬出係以基板保持具30a所具有之基板搬出裝置70a進行,但亦可與此並用而於埠部60a設置保持基板托盤40a移動於+X方向之另一基板搬出裝置,在基板托盤40a之移動途中從使用基板搬出裝置70a之基板搬出動作切換為使用上述另一基板搬出裝置之基板搬出動作。此場合,可縮短按壓構件72a之行程。又,由於基板托盤40a係被懸浮支承,因此亦可使被按壓構件72a按壓(被賦予+X方向之推力)之基板托盤40a藉由慣性從導件35上移動至導件65上。此場合亦能縮短按壓構件72a之行程。 Further, in the first embodiment, the substrate P is carried out by the substrate carrying device 70a included in the substrate holder 30a, but it may be used in combination with the holding portion of the substrate tray 40a in the +X direction. The other substrate unloading device switches from the substrate unloading operation using the substrate unloading device 70a to the substrate unloading operation using the other substrate unloading device during the movement of the substrate tray 40a. In this case, the stroke of the pressing member 72a can be shortened. Further, since the substrate tray 40a is suspended and supported, the substrate tray 40a pressed by the pressing member 72a (the thrust applied to the +X direction) can be moved from the guide 35 to the guide 65 by inertia. Also in this case, the stroke of the pressing member 72a can be shortened.
以上述方式構成之液晶曝光裝置10(參照圖1),係在未圖示之主控制裝置之管理下,藉由未圖示之光罩裝載器進行光罩M往光罩載台MST上之裝載、並藉由基板搬入裝置50進行基板P往基板保持具30a上之裝載。之後,由主控制裝置使用未圖示之對準檢測系實施對準測量,此對準測量結束後,對設定在基板P上之複數個照射區域逐次進行 步進掃描(step & scan)方式之曝光動作。由於此曝光動作與一直以來進行之步進掃描方式之曝光動作相同,因此省略其詳細說明。接著,結束曝光處理之基板被從基板保持具30a搬出,並藉由將下一個將被曝光之另一基板搬送至基板保持具30a,以進行基板保持具30a上之基板更換,據以對複數片基板連續進行曝光動作等。 In the liquid crystal exposure apparatus 10 (see FIG. 1) configured as described above, the mask M is attached to the mask stage MST by a mask loader (not shown) under the management of a main control unit (not shown). Loading and loading of the substrate P onto the substrate holder 30a is performed by the substrate loading device 50. Thereafter, the main control device performs the alignment measurement using an alignment detection system (not shown). After the alignment measurement is completed, the plurality of illumination regions set on the substrate P are successively performed. Exposure action in step & scan mode. Since this exposure operation is the same as the exposure operation of the step-and-scan method which has been conventionally performed, detailed description thereof will be omitted. Then, the substrate on which the exposure process is completed is carried out from the substrate holder 30a, and the other substrate to be exposed next is transferred to the substrate holder 30a to perform substrate replacement on the substrate holder 30a. The sheet substrate is continuously subjected to an exposure operation or the like.
接著,針對在液晶曝光裝置10之基板保持具30a上之基板更換動作,使用圖8(A)~圖8(C)加以說明。又,圖8(A)~圖8(C)中為簡化說明,於基板載台20a除基板保持具30a以外之構件、於基板搬入裝置50除保持構件54a、54b以外之構件、於埠部60a則係架台61之部分圖示皆分別予以省略。本第1實施形態中,在基板保持具30a上之基板更換動作時,如圖8(A)~圖8(C)所示,係使用二個基板托盤40a(為方便起見,稱為基板托盤40a1、40a2)進行基板P之搬送。二個基板托盤40a1、40a2係實質上相同之物。以下之基板更換動作,係在未圖示之主控制裝置之管理下進行。 Next, the substrate replacement operation on the substrate holder 30a of the liquid crystal exposure apparatus 10 will be described with reference to FIGS. 8(A) to 8(C). In addition, in FIGS. 8(A) to 8(C), members other than the substrate holder 30a on the substrate stage 20a and members other than the holding members 54a and 54b in the substrate loading device 50 are used in the crotch portion. In the case of 60a, part of the illustration of the gantry 61 is omitted. In the first embodiment, in the substrate replacement operation on the substrate holder 30a, as shown in Figs. 8(A) to 8(C), two substrate trays 40a are used (for convenience, the substrate is referred to as a substrate). The trays 40a 1 and 40a 2 ) convey the substrate P. The two substrate trays 40a 1 and 40a 2 are substantially identical. The following substrate replacement operation is performed under the management of a main control device (not shown).
如圖8(A)所示,從基板保持具30a搬出之已結束曝光處理之基板P1被裝載在一基板托盤40a1上,該基板托盤40a1被基板保持具30a之複數個托盤導引裝置32從下方支承。相對於此,下一片預定進行曝光處理之另一基板P2則被裝載在另一基板托盤40a2上。此外,基板托盤40a2係被保持在保持構件54a、54b,當基板保持具30a位於基板更換位置之情形時,位於該基板保持具30a上方。 FIG 8 (A), the unloaded from the substrate holder 30a of the exposure process has been completed the substrate P 1 is loaded on a substrate tray 40a 1, 40a 1 of the substrate by the substrate holder tray having a plurality of trays 30a of the guide The device 32 is supported from below. On the other hand, the other substrate P 2 which is to be subjected to exposure processing in the next sheet is loaded on the other substrate tray 40a 2 . Further, the substrate tray 40a 2 is held by the holding members 54a, 54b, and is positioned above the substrate holder 30a when the substrate holder 30a is at the substrate replacement position.
此時,主控制裝置在對設定於基板P1上之複數個照射 區域中、最後一個照射區域之曝光處理結束後,使基板載台20a從投影光學系PL(參照圖1)之下方移動至基板更換位置(與埠部60a相鄰接之位置)。接著,主控制裝置,如圖8(A)所示,在基板載台20a之移動中、亦即在到達基板更換位置之前,控制基板保持具30a內之複數個托盤導引裝置32使基板托盤40a1上昇以使基板P1從基板保持具30a之上面離開,並進一步控制基板搬出裝置70a,使用按壓構件72a使基板托盤40a1往+X側(埠部60a側)移動。如以上所述,本第1實施形態中,基板載台20a往基板更換位置之移動動作與基板P1之搬出動作係部分同時(亦即,在基板載台20a往基板更換位置之定位前,進行基板P1之搬出動作)進行。 At this time, the main control means is set on a plurality of shot areas on the substrate P, the final process after the exposure of one shot area of the substrate below the table 20a from the projection optical system PL (refer to FIG. 1) to move The substrate replacement position (the position adjacent to the crotch portion 60a). Next, as shown in FIG. 8(A), the main control device controls a plurality of tray guides 32 in the substrate holder 30a to move the substrate tray during the movement of the substrate stage 20a, that is, before reaching the substrate replacement position. 40a 1 P 1 rises to the substrate from the substrate holder 30a having left the above, the substrate carry-out and further control means 70a, 72a of the substrate using the pressing member toward the pallet 40a 1 + X side (port portion 60a side). As described above, according to the first embodiment, the operation of moving the substrate and the substrate exchange position of the substrate P to the unloading station 20a of a simultaneous operation system part (i.e., before the substrate is positioned in the exchange position of the station 20a to the substrate, The substrate P 1 is carried out.
以下,基板P1之搬出即從圖8(A)所示狀態,以前述圖7(A)及圖7(B)所示順序進行。亦即,支承基板P1之基板托盤40a1被基板保持具30a內之基板搬出裝置70a進一步驅動向+X側,將該基板托盤40a1交至埠部60a之托盤導引裝置62。 Or less, i.e., the substrate unloaded from P 1 of FIG. 8 (A) the state shown in the FIG. 7 (A) and FIG. 7 (B) shown in order. That is, the support substrate 1 tray 40a of the substrate P by the substrate holder 1 within a substrate carry-out device 30a 70a driven further in the + X side, the substrate tray 40a to a port cross-section 60a of the tray guide 62.
接著,如圖8(B)所示,以前述圖6(A)~圖6(C)所示順序,進行將原本在基板保持具30a上方預先待機之基板P2對基板保持具30a之搬入。並如圖8(C)所示,於基板載台20a,X粗動載台23X及/或Y粗動載台23Y(於圖8(C)中皆未圖示。參照圖1)適當的被驅動,進行對保持在基板保持具30a之基板P2之曝光動作。又,與基板P2之曝光動作並行,於埠部60a則將曝光完成之基板P1從基板托盤40a1上搬送至外部裝置(例如,塗布顯影裝置),並將另一基板 P3裝載至基板托盤40a1上。在上述埠部60a之基板更換動作,係使用例如未圖示之機械臂、設於埠部60a之未圖示之頂銷(lift pin)裝置等進行。 Then, as shown in FIG. 8(B), in the order shown in FIG. 6(A) to FIG. 6(C), the substrate P 2 which is previously placed on the substrate holder 30a in advance is carried into the substrate holder 30a. . As shown in Fig. 8(C), the substrate stage 20a, the X coarse movement stage 23X and/or the Y coarse movement stage 23Y (not shown in Fig. 8(C). See Fig. 1) It is driven to perform an exposure operation on the substrate P 2 held by the substrate holder 30a. In addition, the substrate P with the exposure operation 2 of the parallel port to a portion 60a of the substrate then exposure is completed. 1 P is conveyed to an external device (e.g., coating and developing apparatus) from the substrate tray 40a 1, and the other to load the substrate P 3 On the substrate tray 40a 1 . The substrate replacement operation of the crotch portion 60a is performed by, for example, a mechanical arm (not shown), a lift pin device (not shown) provided on the crotch portion 60a, or the like.
以下,雖未圖示,支承基板P3之基板托盤40a1被保持於保持構件54a、54b,並被搬送至圖8(A)所示位置(基板更換位置之上方)。一般而言,由於在埠部60a之基板P1、P3之更換動作及使用基板搬入裝置50之基板托盤40a1之搬送動作較對基板P2之曝光動作早結束,因此,主控制裝置可在對基板P2之曝光動作結束、基板保持具30a移動到基板更換位置之前,使基板P3位於基板更換位置之上方。如以上所述,本第1實施形態,由於係使用二個基板托盤40a1、40a2,因此能縮短基板保持具30a上之基板更換之週期時間。 The following, although not shown, the supporting substrate 3 of the substrate P tray 40a 1 is held by the holding member 54a, 54b, and is conveyed to FIG. 8 (A) as shown in position (over the exchange position of the substrate). In general, since the replacement operation of the substrates P 1 and P 3 in the crotch portion 60 a and the transfer operation of the substrate tray 40 a 1 using the substrate loading device 50 are earlier than the exposure operation on the substrate P 2 , the main control device can be Before the exposure operation of the substrate P 2 is completed and the substrate holder 30a is moved to the substrate replacement position, the substrate P 3 is positioned above the substrate replacement position. As described above, in the first embodiment, since the two substrate trays 40a 1 and 40a 2 are used , the cycle time of substrate replacement on the substrate holder 30a can be shortened.
以上說明之本第1實施形態,由於基板保持具30a具備基板搬出裝置70a,因此可在曝光動作結束後、基板保持具30a到達基板更換位置之前,開始基板P之搬出動作。故能縮短基板保持具30a上之基板更換週期時間,增加美單位時間之基板P之處理片數。相對於此,在基板搬出裝置設在基板載台20a外部(例如埠部60a)之場合,為開始基板搬出動作,必須將基板保持具30a定位在基板更換位置,因此與本第1實施形態相較,基板搬出動作較耗費時間。 In the first embodiment described above, since the substrate holder 30a includes the substrate unloading device 70a, the substrate P can be ejected after the exposure operation is completed and before the substrate holder 30a reaches the substrate replacement position. Therefore, the substrate replacement cycle time on the substrate holder 30a can be shortened, and the number of processed substrates of the substrate P per unit time can be increased. On the other hand, when the substrate carrying device is provided outside the substrate stage 20a (for example, the crotch portion 60a), the substrate holder 30a must be positioned at the substrate replacement position in order to start the substrate unloading operation. In comparison, the substrate unloading operation takes time.
接近,使用圖9(A)~圖11(C)說明第2實施形態。本第2實施形態之液晶曝光裝置,除基板保持具30b、埠部60b(分 別參照圖10)及基板托盤40b(參照圖9(A))之構成外,與上述第1實施形態之液晶曝光裝置10(參照圖1)相同,因此,以下僅說明相異點,針對與上述第1實施形態具有相同構成、功能之要件,賦予與上述第1實施形態相同符號並省略其說明。 The second embodiment will be described with reference to Figs. 9(A) to 11(C). In the liquid crystal exposure apparatus of the second embodiment, the substrate holder 30b and the crotch portion 60b are divided. The liquid crystal exposure apparatus 10 (see FIG. 1) of the first embodiment is the same as the configuration of the substrate tray 40b (see FIG. 9(A)), and therefore, only the differences will be described below. The first embodiment has the same configuration and function, and the same reference numerals are given to the first embodiment, and the description thereof is omitted.
上述第1實施形態之基板托盤40a(參照圖2(A))係使用例如3支(奇數支)支承構件41從下方支承基板,相對於此,圖9(A)所示之第2實施形態之基板托盤40b,具有例如4支(偶數支)支承構件41。又,上述第1實施形態之基板托盤40a(參照圖2(A)),例如係以3支補強構件43將複數個支承構件41之長邊方向中間部加以彼此連接,相對於此,圖9(A)所示之第2實施形態之基板托盤40b,則進一步具有將複數個支承構件41之-X側端部近旁加以彼此連接之補強構件43(合計例如有4支補強構件43)。又,基板托盤40b不具有如上述第1實施形態之基板托盤40a般之突起45a(參照圖2(B))。 In the substrate tray 40a (see FIG. 2(A)) of the first embodiment, the substrate is supported from below by using, for example, three (odd-numbered) support members 41. In contrast, the second embodiment shown in FIG. 9(A) is used. The substrate tray 40b has, for example, four (even-numbered) support members 41. Further, in the substrate tray 40a (see FIG. 2(A)) of the first embodiment, the intermediate portions of the plurality of support members 41 in the longitudinal direction are connected to each other by, for example, three reinforcing members 43. Further, the substrate tray 40b of the second embodiment shown in (A) further includes reinforcing members 43 for connecting the -X side end portions of the plurality of support members 41 to each other (for example, four reinforcing members 43 in total). Further, the substrate tray 40b does not have the projection 45a like the substrate tray 40a of the above-described first embodiment (see FIG. 2(B)).
如圖10所示,於基板保持具30b之上面,對應上述基板托盤40b(圖10中未圖示。參照圖9(A))之例如4支支承構件41及例如4支補強構件43之各個,形成有複數個X槽31x、Y槽31y。在基板保持具30b與基板托盤40b組合之狀態下,複數個支承構件41、補強構件43之各個係收容在對應之X槽31x、Y槽31y內。不過,如圖11(A)所示,最-X側之補強構件43則位在基板保持具30b之外側。回到圖10,於複數個X槽31x內分別收容有複數個托盤導引 裝置32。此外,於基板保持具30b上面之Y軸方向中央部形成有另一X槽73x。於X槽73x內收容有基板搬出裝置70b。又,X槽73x係為收容基板搬出裝置70b而形成,基板托盤40b之支承構件41並不被收容。再者,於埠部60b,在架台61上對應例如4支支承構件41,搭載有例如4個托盤導引裝置62。 As shown in FIG. 10, on the upper surface of the substrate holder 30b, for example, each of the four support members 41 and, for example, four reinforcing members 43 corresponding to the substrate tray 40b (not shown in FIG. 10, see FIG. 9(A)). A plurality of X slots 31x and Y slots 31y are formed. In a state where the substrate holder 30b is combined with the substrate tray 40b, each of the plurality of support members 41 and the reinforcing members 43 is housed in the corresponding X groove 31x and Y groove 31y. However, as shown in Fig. 11(A), the reinforcing member 43 on the most-X side is located on the outer side of the substrate holder 30b. Returning to FIG. 10, a plurality of tray guides are respectively accommodated in the plurality of X slots 31x. Device 32. Further, another X groove 73x is formed in the central portion of the upper surface of the substrate holder 30b in the Y-axis direction. The substrate unloading device 70b is housed in the X groove 73x. Further, the X-groove 73x is formed to accommodate the substrate unloading device 70b, and the support member 41 of the substrate tray 40b is not housed. Further, in the crotch portion 60b, for example, four support members 41 are supported on the gantry 61, and for example, four tray guides 62 are mounted.
基板搬出裝置70b具有X行進導件71及按壓基板托盤40b之按壓構件72b。按壓構件72b,如圖11(A)所示,具有平行於XY平面之板狀構件構成、在X行進導件71上被驅動於X軸方向之X滑動部72b1與例如透過鉸鏈裝置一端連接於X滑動部72b1、由板狀構件構之按壓部72b2。基板搬出裝置70b具有未圖示之致動器,以該致動器適當地控制X滑動部72b1與按壓部72b2間之角度。 The substrate unloading device 70b has an X traveling guide 71 and a pressing member 72b that presses the substrate tray 40b. The pressing member 72b, as shown in FIG 11 (A), the plate-shaped member parallel to the XY plane configuration, the slide portion is driven in the X direction of the X axis 72b 1 is connected to, for example, through a hinge means at one end of the X-guide 71 travels The X sliding portion 72b 1 and the pressing portion 72b 2 of the plate member. The substrate unloading device 70b includes an actuator (not shown), and the angle between the X sliding portion 72b 1 and the pressing portion 72b 2 is appropriately controlled by the actuator.
以下,使用圖11(A)~圖11(C)說明使用基板搬出裝置70b之基板更換動作。本第2實施形態,亦與上述第1實施形態同樣的,係使用2個基板托盤40b(圖11(A)~圖11(C)中,為基板托盤40b1、40b2)。從圖11(A)所示之基板保持具30b與基板托盤40b1組合之狀態,將基板P1與基板托盤40b1一起從基板保持具30b搬出時,如圖11(B)所示,X滑動部72b1與按壓部72b2間之角度,例如為90°,與上述第1實施形態同樣的,藉由按壓構件72b按壓基板托盤40b1來進行基板P1之搬出。此時,按壓構件72b係按壓基板托盤40b1所具有之複數個補強構件43中最-X側之補強構件43。因此,按壓構件72b之高度(Z軸)方向尺寸係設定為較 上述第1實施形態略長。 Hereinafter, the substrate replacement operation using the substrate unloading device 70b will be described with reference to FIGS. 11(A) to 11(C). In the second embodiment, as in the first embodiment, two substrate trays 40b (the substrate trays 40b 1 and 40b 2 in Figs. 11(A) to 11(C)) are used. When the substrate holder state 30b of the tray 40b 1 composition from FIG 11 (A) of FIG substrate, the substrate P 1 and the substrate holder tray 40b 1 30b unloaded from the substrate together, as shown in FIG 11 (B) shown, X a sliding portion 72b and the angle of the pressing portion 72b of Room 2, for example 90 °, with the first embodiment of the same, by the pressing member 72b presses the tray 40b of the substrate 1 to the substrate P unloaded 1. At this time, the pressing member 72b presses the substrate tray system 40b 1 has a plurality of the reinforcing member 43 of the reinforcement member 43 most -X side. Therefore, the height (Z-axis) direction dimension of the pressing member 72b is set to be slightly longer than the above-described first embodiment.
又,本第2實施形態中,基板保持具30b上之基板P之更換,亦與上述第1實施形態同樣的,在板P1被從保持具30b上搬出後,如11(C)所示,被支承在托盤40b2之另一基板P2即被未圖示之基板搬入裝置搬入基板保持具30b上來進行。 Further, the second embodiment of this aspect, the substrate on the substrate holder 30b P replacement, the above-described first embodiment are also the same shape, a rear plate P is unloaded from the holder 30b, such as 11 (C) shown in FIG. The other substrate P 2 supported by the tray 40b 2 is carried by the substrate carrying device (not shown) into the substrate holder 30b.
在基板P2之搬入動作結束,如圖11(C)所示,基板搬出裝置70b之按壓構件72b受未圖示之致動器之控制而成為X滑動部72b1與按壓部72b2間之角度成為鈍角(較基板搬出時更張開的狀態),於此狀態下,於X行進導件71上被驅動於-X方向。此處,X滑動部72b1與壓部72b2間之角度係被設定為在被複數個托盤導引裝置32支承之基板托盤40b2位於最-Z側之狀態下(基板P2被裝載在基板保持具30b之上面上,與基板托盤40b2分離之狀態)不接觸於補強構件43。 When the loading operation of the substrate P 2 is completed, as shown in FIG. 11(C), the pressing member 72b of the substrate carrying device 70b is controlled by an actuator (not shown) to be between the X sliding portion 72b 1 and the pressing portion 72b 2 . The angle becomes an obtuse angle (a state in which it is more open than when the substrate is carried out), and in this state, it is driven in the -X direction on the X traveling guide 71. Here, the angle between the X sliding portion 72b 1 and the pressing portion 72b 2 is set such that the substrate tray 40b 2 supported by the plurality of tray guiding devices 32 is located on the most-Z side (the substrate P 2 is loaded on the substrate P 2 ) The upper surface of the substrate holder 30b is separated from the substrate tray 40b 2 ) without contacting the reinforcing member 43.
以上說明之第2實施形態中,即使是在基板P被裝載於基板保持具30b上之狀態(例如含曝光中),亦能使按壓構件72b回到(復歸)(圖11(A)所示之初期位置(可按壓基板托盤40b之位置)。因此,可在搬出基板P後,立刻開始另一基板P之搬入動作(相對於此,上述第1實施形態中必須等待使按壓構件72a回到初期位置之復歸)。 In the second embodiment described above, even when the substrate P is mounted on the substrate holder 30b (for example, during exposure), the pressing member 72b can be returned (returned) (shown in FIG. 11(A)). In the initial position (the position of the substrate tray 40b can be pressed), the loading operation of the other substrate P can be started immediately after the substrate P is carried out. (In contrast, in the first embodiment, it is necessary to wait for the pressing member 72a to return. The return of the initial position).
又,於基板保持具30b,由於基板搬出裝置70b被收容在X槽73x(非用於基板托盤40b之收容的專用槽)內,因此基板托盤40b於基板保持具30b,所有的支承構件41被托 盤導引裝置32從下方支承,且於埠部60b,所有的支承構件41被托盤導引裝置62從下方支承。因此,基板托盤40b及基板P之撓曲受到抑制。 Further, in the substrate holder 30b, since the substrate carrying device 70b is housed in the X groove 73x (a dedicated groove not used for housing the substrate tray 40b), the substrate tray 40b is placed on the substrate holder 30b, and all the support members 41 are Support The disk guide 32 is supported from below, and in the crotch portion 60b, all the support members 41 are supported by the tray guide 62 from below. Therefore, the deflection of the substrate tray 40b and the substrate P is suppressed.
此外,按壓構件72b雖係作成按壓部72b2可相對X滑動部72b1旋轉之構成,但按壓構件72b之構成只要是能在可按壓基板托盤40b之狀態、與不接觸基板托盤40b而能往X軸方向移動之狀態間可轉換的話並不限於此,例如按壓構件72b(或基板搬出裝置70b全體)亦可構成為能於Z軸方向移動(上下動)。又,亦可將圖3等所示之上述第1實施形態之基板搬出裝置70a作成與本第2實施形態之基板搬出裝置70b相同之構成。 Further, the pressing member 72b, although based creating 72b 2 relative X slidable portion pressing portion configured 72b. 1 swiveling, but the pressing member constituting 72b of long as it is in the state depressible substrate tray 40b of, and not in contact with the substrate tray 40b and can go The switching member 72b (or the entire substrate carrying device 70b) may be configured to be movable in the Z-axis direction (up and down), for example, when the state in which the X-axis direction is shifted is not limited thereto. In addition, the substrate carrying-out device 70a of the first embodiment shown in FIG. 3 and the like can be configured in the same manner as the substrate carrying-out device 70b of the second embodiment.
接著,使用圖12說明第3實施形態。本第3實施形態之液晶曝光裝置之構成,除基板保持具30c外與上述第2實施形態之液晶曝光裝置相同(包含基板托盤40b(圖12中未圖示。參照圖9(A))、埠部60b),因此於以下說明中僅說明相異點,針對與上述第1及第2實施形態具有相同構成、功能之要件,則賦予和上述第1及第2實施形態相同之符號並省略其說明。 Next, a third embodiment will be described using FIG. The liquid crystal exposure apparatus of the third embodiment is the same as the liquid crystal exposure apparatus of the second embodiment except for the substrate holder 30c (including the substrate tray 40b (not shown in FIG. 12, see FIG. 9(A)). In the following description, only the different points are described in the following description, and the same components and functions as those in the first and second embodiments are given the same reference numerals as in the first and second embodiments, and the description is omitted. Its description.
上述第2實施形態中,如圖10所示,在基板保持具30b中央用以收容基板搬出裝置70b之X槽73x,係與用以收容基板托盤40b(圖10中未圖示。參照圖9(A))之複數個支承構件41的X槽31x分別形成,相對於此,本第3實施形態,如圖12所示,於基板保持具30c,係例如在4條X槽31x 中、從+Y側起之第1條X槽31x與第2條X槽31x之間及第3條X槽31x與第4條X槽31x之間,分別形成有用以收容基板搬出裝置70c之X槽73x。因此,基板保持具30c具有2台在Y軸方向分離之基板搬出裝置70c。基板搬出裝置70c,除了在按壓構件72c之與基板托盤(圖12中未圖示)抵接部分具有半球狀之壓抵構件(圖12中未圖示)外,與上述第2實施形態相同。又,關於基板更換動作亦與上述第2實施形態相同,因此省略其說明。 In the second embodiment, as shown in FIG. 10, the X-groove 73x for accommodating the substrate unloading device 70b in the center of the substrate holder 30b is for accommodating the substrate tray 40b (not shown in FIG. 10; see FIG. In the third embodiment, as shown in FIG. 12, the substrate holder 30c is, for example, in four X-slots 31x, as shown in FIG. 12, in the X-slot 31x of the plurality of support members 41. Between the first X slot 31x and the second X slot 31x from the +Y side, and between the third X slot 31x and the fourth X slot 31x, a substrate for carrying out the substrate unloading device 70c is formed. X slot 73x. Therefore, the substrate holder 30c has two substrate carrying-out devices 70c that are separated in the Y-axis direction. The substrate carrying-out device 70c is the same as the second embodiment except that the pressing member 72c has a hemispherical pressing member (not shown in FIG. 12) in contact with the substrate tray (not shown in FIG. 12). Further, the substrate replacement operation is also the same as that of the second embodiment described above, and thus the description thereof will be omitted.
根據本第3實施形態,由於具有例如2台基板搬出裝置70c,因此能輕易的抑制在基板搬出時之基板托盤及基板往θ z方向(yawing方向)之移動。又,由於使基板托盤移動之推力獲得提昇,因此能更順暢且迅速的進行基板托盤之搬出。此外,按壓構件72c亦可不具有半球狀之壓抵構件(對基板托盤可以是點接觸亦可以是面接觸)。 According to the third embodiment, since the two substrate carrying devices 70c are provided, for example, the movement of the substrate tray and the substrate in the θ z direction (yawing direction) during the substrate unloading can be easily suppressed. Moreover, since the thrust for moving the substrate tray is improved, the substrate tray can be carried out more smoothly and quickly. Further, the pressing member 72c may not have a hemispherical pressing member (the substrate tray may be in point contact or in surface contact).
其次,使用圖13說明第4實施形態。本第4實施形態之液晶曝光裝置之構成,除基板保持具30d外,與上述第1實施形態之液晶曝光裝置10(參照圖1)相同(包含基板托盤40a),因此以下之說明中僅說明相異點,針對與上述第1實施形態具有相同構成、功能之要件,則賦予與上述第1實施形態相同符號並省略其說明。 Next, a fourth embodiment will be described using FIG. The liquid crystal exposure apparatus of the fourth embodiment is the same as the liquid crystal exposure apparatus 10 (see FIG. 1) of the first embodiment (including the substrate tray 40a) except for the substrate holder 30d. Therefore, only the following description will be explained. In the first embodiment, the same components as those in the above-described first embodiment are denoted by the same reference numerals, and the description thereof will not be repeated.
如圖13所示,基板保持具30d具有包含繩索驅動裝置74及按壓構件72a之基板搬出裝置70d。繩索驅動裝置74包含繩索741、複數個滑輪742等。於繩索741之中間部分 連接了按壓構件72a。繩索741之一部分與按壓構件72a一起插入形成在基板保持具30d上面之X槽31x內。又,圖13中雖未圖示,但X槽31x係在基板保持具30d上面於Y軸方向以既定間隔形成有例如3條,繩索741插入其中位在中央之X槽31x內,其他X槽31x內則收容複數個托盤導引裝置32。又,於基板保持具30d下面之Y軸方向之中央部形成有另一X槽743,於該X槽743內插入繩索741之其他部分。複數個滑輪742係在基板保持具30d之+X側及-X側端面分別於上下方向分離、安裝有例如各2個(共4個)。於複數個滑輪742之各個,捲掛有繩索741。於複數個滑輪742中之一個,連接有未圖示之致動器(例如旋轉馬達),藉由連接該致動器之滑輪742被旋轉驅動,按壓構件72a即在X槽31x內以既定行程移動於X軸方向。使用基板搬出裝置70d之基板搬出動作與上述第1實施形態相同,因此省略其說明。 As shown in FIG. 13, the substrate holder 30d has a substrate carrying device 70d including a rope driving device 74 and a pressing member 72a. The rope drive unit 74 includes a rope 74 1 , a plurality of pulleys 74 2 , and the like. A pressing member 72a is connected to an intermediate portion of the rope 74 1 . One portion of the cord 74 1 is inserted into the X groove 31x formed on the substrate holder 30d together with the pressing member 72a. In addition, although not shown in FIG. 13, the X-groove 31x is formed, for example, three at a predetermined interval in the Y-axis direction on the substrate holder 30d, and the rope 74 1 is inserted into the X-slot 31x at the center thereof, and the other X A plurality of tray guides 32 are accommodated in the slots 31x. Further, another X groove 74 3 is formed in a central portion of the lower surface of the substrate holder 30d in the Y-axis direction, and the other portion of the rope 74 1 is inserted into the X groove 74 3 . The plurality of pulleys 74 2 are separated from the +X side and the -X side end surface of the substrate holder 30 d in the vertical direction, for example, two (four in total). A rope 74 1 is wound around each of the plurality of pulleys 74 2 . An actuator (not shown) (for example, a rotary motor) is connected to one of the plurality of pulleys 74 2 and is rotationally driven by a pulley 74 2 that is connected to the actuator. The pressing member 72a is in the X slot 31x. The predetermined stroke moves in the X-axis direction. The substrate carrying-out operation using the substrate unloading device 70d is the same as that of the above-described first embodiment, and thus the description thereof will be omitted.
根據本第4實施形態之基板搬出裝置70d,與使用例如進給螺桿裝置等之情形相較,能將按壓構件72a以更高速驅動於X軸方向,將基板迅速地從基板保持具30d搬出。此外,若能將按壓構件72a牽引於+X方向及-X方向的話,可取代繩索741而使用、皮帶(有齒無齒皆可)、鏈條等。又,繩索741之材質並無特別限定,可以是例如鋼索、亦可以是合成樹脂製。又,使滑輪旋轉之致動器等基板搬出裝置70d之一部分,可以設在基板保持具30d以外之構件(例如Y粗動載台23Y(圖13中未圖示。參照圖1))。此場合,可使基 板保持具30d輕量化而提昇基板之位置控制性。按壓構件72a可以是如上述第2實施形態般之可動式(參照圖11(A)等)。此外,基板搬出裝置70d可以是如上述第3實施形態般,於Y軸方向分離設置複數個。再者,亦可設置將按壓構件72a往X軸方向引導之導件。 According to the substrate carrying device 70d of the fourth embodiment, the pressing member 72a can be driven at a higher speed in the X-axis direction than the feeding screw device 70d, and the substrate can be quickly carried out from the substrate holder 30d. Further, if the pressing member 72a can be pulled in the +X direction and the -X direction, it can be used instead of the rope 74 1 , a belt (with or without teeth), a chain, or the like. Further, the material of the rope 74 1 is not particularly limited, and may be, for example, a steel cord or a synthetic resin. Further, a part of the substrate carrying device 70d such as an actuator that rotates the pulley may be provided in a member other than the substrate holder 30d (for example, the Y coarse movement stage 23Y (not shown in FIG. 13).). In this case, the substrate holder 30d can be made lighter and the positional controllability of the substrate can be improved. The pressing member 72a may be of a movable type as in the second embodiment described above (see FIG. 11(A) and the like). Further, the substrate carrying-out device 70d may be provided in plural in the Y-axis direction as in the third embodiment described above. Further, a guide for guiding the pressing member 72a in the X-axis direction may be provided.
其次,使用圖14(A)及圖14(B)說明第5實施形態。本第5實施形態之液晶曝光裝置之構成,除基板保持具30e、基板托盤40e(圖14(A)中未圖示。參照圖14(B))外,與上述第1實施形態之液晶曝光裝置10(參照圖1)相同,因此以下之說明中僅說明相異點,針對與上述第1實施形態具有相同構成、功能之要件,則賦予與上述第1實施形態相同符號並省略其說明。 Next, a fifth embodiment will be described with reference to Figs. 14(A) and 14(B). In addition to the substrate holder 30e and the substrate tray 40e (not shown in FIG. 14(A), see FIG. 14(B)), the liquid crystal exposure apparatus according to the fifth embodiment is exposed to the liquid crystal of the first embodiment. The device 10 (see FIG. 1) is the same as the first embodiment, and the same reference numerals are given to the above-described first embodiment, and the description thereof will be omitted.
用於第5實施形態之液晶曝光裝置之基板托盤40e,與上述第1實施形態(參照圖2(A))同樣的具有複數(例如3支)支承構件41,但其下面不具有突起45a(參照圖2(B))之點,與上述第1實施形態不同。又,於基板保持具30e之上面形成有與上述複數(例如3支)支承構件41對應之複數(例如3條)X槽31x,於該所有X槽31x內收容有複數(例如於X軸方向既定間隔之3個)托盤導引裝置32,基板托盤40e之複數個支承構件41,全部在基板保持具30e之X槽31x內被托盤導引裝置32從下方支承。又,雖未圖示,第5實施形態之埠部具有與上述複數(例如3支)支承構件41對應之複數(例如3台)托盤導引裝置62(參照圖1)。 The substrate tray 40e used in the liquid crystal exposure apparatus of the fifth embodiment has a plurality of (for example, three) support members 41 similar to the above-described first embodiment (see FIG. 2(A)), but has no projections 45a on its lower surface. Referring to Fig. 2(B)), it is different from the above-described first embodiment. Further, a plurality of (for example, three) X slots 31x corresponding to the plurality of (for example, three) support members 41 are formed on the upper surface of the substrate holder 30e, and a plurality of X slots 31x are accommodated in the X slots 31x (for example, in the X-axis direction). The tray guiding device 32 of the predetermined interval, and the plurality of supporting members 41 of the substrate tray 40e are all supported by the tray guiding device 32 from below in the X groove 31x of the substrate holder 30e. Further, although not shown, the crotch portion of the fifth embodiment has a plurality of (for example, three) tray guiding devices 62 (see FIG. 1) corresponding to the plurality of (for example, three) supporting members 41.
如圖14(B)所示,基板保持具30e所具有之基板搬出裝置70e,具備一對滾輪裝置75。在基板保持具30e之+X側端部近旁之中央之X槽31x之+Y側及-Y側分別形成有凹部753,一對滾輪裝置75以一方在+Y側之凹部753內、另一方在-Y側之凹部753內,夾著中央之X槽31x之狀態被收容。一對滾輪裝置75,分別具有被旋轉馬達751及旋轉馬達751旋轉驅動之滾輪752。滾輪752之Z位置係設定為在為搬出基板P(圖14(B)中未圖示。參照圖1)而使基板托盤40e之補強構件43之下面位在較基板保持具30e上面更+Z側之狀態下,亦能夾著該基板托盤40e之支承構件41的位置。於基板搬出裝置70e,當在一對滾輪752間插入支承構件41之狀態下,一對滾輪752彼此分別往相反方向旋轉時,由於該一對滾輪752之各個與支承構件41間之摩擦力,使得基板托盤40e相對基板保持具30e往+X方向移動,從基板保持具30e被送出至未圖示之埠部。使用基板搬出裝置70e之基板搬出動作,由於與上述第1實施形態相同,因此省略其說明。 As shown in FIG. 14(B), the substrate carrying device 70e included in the substrate holder 30e is provided with a pair of roller devices 75. A concave portion 75 3 is formed on the +Y side and the -Y side of the X groove 31x at the center of the +X side end portion of the substrate holder 30e, and the pair of roller devices 75 are in the concave portion 75 3 on the +Y side. The other side is housed in the recessed portion 75 3 on the -Y side in a state in which the central X slot 31x is interposed. The pair of roller devices 75 each have a roller 75 2 that is rotationally driven by a rotary motor 75 1 and a rotary motor 75 1 . The Z position of the roller 75 2 is set such that the lower surface of the reinforcing member 43 of the substrate tray 40e is higher than the substrate holder 30e in order to carry out the substrate P (not shown in FIG. 14(B). See FIG. 1). In the state of the Z side, the position of the support member 41 of the substrate tray 40e can also be sandwiched. The substrate carry-out device 70e, in the state where the insertion of the support member 41 of 752 between a pair of rollers, a pair of rollers 752 separately from each other to rotate in opposite directions, since 41 between the pair of rollers of each support member 752 of the The frictional force causes the substrate tray 40e to move in the +X direction with respect to the substrate holder 30e, and is sent out from the substrate holder 30e to a crotch portion (not shown). Since the substrate carrying-out operation using the substrate unloading device 70e is the same as that of the above-described first embodiment, the description thereof will be omitted.
根據本第5實施形態之基板搬出裝置70e,能在小型輕量之同時將基板托盤40e迅速地從基板保持具30e搬出。又,由於沒有在搬出基板托盤40e時於X軸方向以既定行程移動之構件(例如上述第1實施形態之按壓構件72a(參照圖3)),而無需使該構件在基板托盤40e之搬出後回到初期位置之動作,因此能迅速地進行基板更換動作。此外,於基板保持具30e(及未圖示之埠部),能在所有複數個支承構 件41被從下方支承之狀態下進行基板托盤40e之搬出,因此能抑制基板P(圖14(A)及圖14(B)中未圖示。參照圖1)之撓曲。 According to the substrate unloading device 70e of the fifth embodiment, the substrate tray 40e can be quickly carried out from the substrate holder 30e while being small and lightweight. In addition, since there is no member that moves in the X-axis direction at a predetermined stroke when the substrate tray 40e is carried out (for example, the pressing member 72a (see FIG. 3) of the first embodiment), it is not necessary to carry the member out after the substrate tray 40e is carried out. By returning to the initial position, the substrate replacement operation can be performed quickly. Further, in the substrate holder 30e (and the crotch portion not shown), all of the plurality of support structures can be used. Since the substrate 41 is carried out from the lower side, the substrate tray 40e is carried out. Therefore, the deflection of the substrate P (not shown in FIGS. 14(A) and 14(B). See FIG. 1) can be suppressed.
又,若能於滾輪裝置75設置將滾輪752彈壓向支承構件41之彈壓構件較佳,如據此,能抑制滾輪752與支承構件41間之滑動。此外,亦可將一對滾輪752作成可分別於Y軸方向微驅動。如此,在將支承構件41挿入X槽31x時,可使一對滾輪752確實的從支承構件41退避、以及在基板托盤40e之搬出時確實的以一對滾輪752夾著支承構件41。又,基板搬出裝置70e可於Y軸方向分離設置複數個(例如對應最+Y側及最-Y側之X槽31x)。進一步的,亦可在埠部設置與一對滾輪裝置75(參照圖14(A)及圖14(B))具有相同構成之一對滾輪裝置(未圖示)。 Further, if the roller device 75 is provided in the roller 752 to the biasing member biasing the support member 41 of the preferred, as a result, can suppress the sliding of the roller 41 and the support member 752. Further, the pair of rollers 75 2 may be made to be micro-driven in the Y-axis direction. As described above, when the support member 41 is inserted into the X-groove 31x, the pair of rollers 75 2 can be surely retracted from the support member 41, and the support member 41 can be surely sandwiched by the pair of rollers 75 2 when the substrate tray 40e is carried out. Further, the substrate carrying-out device 70e can be provided in plural in the Y-axis direction (for example, the X-slot 31x corresponding to the most +Y side and the most-Y side). Further, a pair of roller devices (not shown) having the same configuration as the pair of roller devices 75 (see FIGS. 14(A) and 14(B)) may be provided in the crotch portion.
其次,使用圖15(A)~圖16說明第6實施形態。本第6實施形態之液晶曝光裝置之構成,除基板保持具30f(圖15(A)中未圖示。參照圖15(B))、基板托盤40f、埠部60f(圖15(A)及圖15(B)中未圖示。參照圖16)外,與上述第1實施形態之液晶曝光裝置10(參照圖1)相同,因此以下之說明中僅說明相異點,針對與上述第1實施形態具有相同構成、功能之要件,則賦予與上述第1實施形態相同符號並省略其說明。 Next, a sixth embodiment will be described with reference to Figs. 15(A) to 16 . In the liquid crystal exposure apparatus of the sixth embodiment, the substrate holder 30f (not shown in FIG. 15(A). See FIG. 15(B)), the substrate tray 40f, and the crotch portion 60f (FIG. 15(A) and 15(B) is not shown. Referring to FIG. 16), it is the same as the liquid crystal exposure apparatus 10 (see FIG. 1) of the first embodiment. Therefore, only the difference is described in the following description, and the first aspect is described. In the embodiment, the same components as those in the first embodiment are denoted by the same reference numerals, and their description is omitted.
上述第1~第5實施形態,基板搬出裝置係分別設於基板保持具,相對於此,本第6實施形態,如圖15(B)所示, 係由基板保持具30f所具有之一對X固定子76與基板托盤40f所具有之一對X可動子45f構成之一對X線性馬達70f,來發揮基板搬出裝置之功能。 In the above-described first to fifth embodiments, the substrate carrying device is provided in the substrate holder, and the sixth embodiment is as shown in Fig. 15(B). One of the pair of X holders 76 and one of the pair of X movable members 45f of the substrate holder 30f, which is provided by the substrate holder 30f, constitutes a pair of X linear motors 70f, and functions as a substrate carrying device.
如圖15(A)所示,基板托盤40f,與上述第1實施形態(參照圖2(A))同樣的,具有複數(例如3支)支承構件41。在例如3支支承構件41中之中央的支承構件41之+Y側及-Y側之各面部,分別安裝有包含於X軸方向以既定間隔排列之複數個永久磁石的X可動子45f。X可動子45f,除了支承構件41之兩端部近旁外設置在大致全體。又,上述中央之支承構件41,不具有如上述第1實施形態之基板托盤40a般之突起45a(參照圖2(B))。 As shown in Fig. 15(A), the substrate tray 40f has a plurality of (for example, three) support members 41 similarly to the above-described first embodiment (see Fig. 2(A)). For example, the X movable member 45f including a plurality of permanent magnets arranged at predetermined intervals in the X-axis direction is attached to each of the +Y side and the -Y side of the support member 41 at the center of the three support members 41. The X movable member 45f is provided substantially in the entirety except for the vicinity of both end portions of the support member 41. Further, the center support member 41 does not have the projection 45a like the substrate tray 40a of the first embodiment (see Fig. 2(B)).
如圖16所示,於基板保持具30f之上面,形成有對應上述複數(例如3支)支承構件41之複數(例如3條)X槽31x。於所有的X槽31x內收容複數(例如於X軸方向以既定間隔之3個)托盤導引裝置32,基板托盤40f之複數個支承構件41(圖16中未圖示。參照圖15(B)),全部在基板保持具30f之X槽31x內被托盤導引裝置32從下方支承。此外,於基板保持具30f之+X側端部近旁、例如3條X槽31x中用以規定中央之X槽31x之一對對向面部,分別如圖15(B)所示,收容了包含線圈單元之X固定子76。又,圖15(B)相當於圖16之B-B線剖面圖(不過,圖16中未顯示基板托盤40f)。一對X固定子76各自之Z位置係設定為為搬出基板P(圖15(B)中未圖示。參照圖1)而使基板托盤40f之補強構件43下面位在較基板保持具30f之上面更+Z側 之狀態下,與安裝在該基板托盤40f之支承構件41之X可動子45f對向的位置。 As shown in FIG. 16, a plurality of (for example, three) X-grooves 31x corresponding to the plurality (for example, three) of the support members 41 are formed on the upper surface of the substrate holder 30f. A plurality of tray guides 32 (for example, three at a predetermined interval in the X-axis direction) and a plurality of support members 41 of the substrate tray 40f are accommodated in all the X slots 31x (not shown in Fig. 16). See Fig. 15 (B). )), all of which are supported by the tray guide 32 from below in the X groove 31x of the substrate holder 30f. Further, in the vicinity of the +X side end portion of the substrate holder 30f, for example, one of the three X grooves 31x for defining the center of the X groove 31x is opposite to the facing surface, as shown in Fig. 15(B), respectively. X holder 76 of the coil unit. 15(B) corresponds to a cross-sectional view taken along line B-B of FIG. 16 (however, the substrate tray 40f is not shown in FIG. 16). The Z position of each of the pair of X stators 76 is set so as to carry out the substrate P (not shown in FIG. 15(B). See FIG. 1), and the reinforcing member 43 of the substrate tray 40f is positioned below the substrate holder 30f. Above +Z side In the state, it is opposed to the X movable member 45f of the support member 41 of the substrate tray 40f.
又,如圖16所示,埠部60f具有對應上述複數(例如3支)支承構件41(圖16中未圖示。參照圖15(A))之複數(例如3台)托盤導引裝置62。並且在例如3台托盤導引裝置62中之中央的托盤導引裝置62之基座63之-X側端部近旁,安裝有一對X固定子68。一對X固定子68之各個,與X固定子76同樣的包含線圈單元。一對X固定子68係以較上述基板托盤40f之支承構件41於Y軸方向之尺寸(寬度)較大之間隔於Y軸方向分離配置,其Z位置被設定為在複數個導件65上搭載支承構件41之狀態下,與安裝在該支承構件41之X可動子45f(圖16中未圖示。參照圖15(A))之Z位置大致相同(與X可動子45f對向)。 Further, as shown in FIG. 16, the crotch portion 60f has a plurality of (for example, three) tray guiding devices 62 corresponding to the plurality of (for example, three) supporting members 41 (not shown in FIG. 16 and referring to FIG. 15(A)). . Further, a pair of X stators 68 are mounted in the vicinity of the -X side end of the base 63 of the tray guide 62 in the center of, for example, the three tray guides 62. Each of the pair of X stators 68 includes a coil unit similarly to the X stator 76. The pair of X stators 68 are disposed apart from each other in the Y-axis direction at a larger dimension (width) than the support member 41 of the substrate tray 40f in the Y-axis direction, and the Z position is set to be on the plurality of guides 65. In the state in which the support member 41 is mounted, it is substantially the same as the Z position of the X movable member 45f (not shown in FIG. 16 (see FIG. 15(A)) attached to the support member 41 (opposite to the X movable member 45f).
本第6實施形態中,在從基板保持具30f搬出基板托盤40f時,係適當的使用由基板保持具30f之一對X固定子76與基板托盤40f之一對X可動子45f構成之一對X線性馬達70f、以及由埠部60f之一對X固定子68與基板托盤40f之一對X可動子45f構成之另一對X線性馬達之合計4個X線性馬達來作為基板搬出裝置。關於基板搬出動作,由於與上述第1實施形態相同,因此省略其說明。 In the sixth embodiment, when the substrate tray 40f is carried out from the substrate holder 30f, one pair of the X holder 76 and one of the substrate tray 40f and the X movable member 45f is appropriately used by one of the substrate holders 30f. The X linear motor 70f and the total of four X linear motors of the other pair of X linear motors, which are formed by one of the dam portions 60f, one of the X stator 68 and one of the substrate trays 40f and the X movable member 45f, are used as the substrate unloading device. Since the substrate carrying-out operation is the same as that of the above-described first embodiment, the description thereof will be omitted.
本第6實施形態,由於能以非接觸方式從基板保持具30f高速地搬出基板托盤40f,因此能防止發塵(產生塵屑)。又,於基板保持具30f及埠部60f,可在複數個支承構件41全部被從下方支承之狀態下進行基板托盤40f之搬出,因此 能抑制基板P(圖15(A)~圖16中未圖示。參照圖1)之撓曲。此外,X線性馬達可如上述第3實施形態般,於Y軸方向分離設置複數個(例如對應最+Y側及最-Y側之支承構件41)。 In the sixth embodiment, since the substrate tray 40f can be carried out at a high speed from the substrate holder 30f in a non-contact manner, dust generation (dust generation) can be prevented. Further, in the substrate holder 30f and the crotch portion 60f, the substrate tray 40f can be carried out while the plurality of support members 41 are all supported from below. The deflection of the substrate P (not shown in Fig. 15 (A) to Fig. 16 and referring to Fig. 1) can be suppressed. Further, as in the third embodiment described above, the X linear motor can be provided in plural in the Y-axis direction (for example, the support member 41 corresponding to the most +Y side and the most-Y side).
其次,使用圖17(A)及圖17(B)說明第7實施形態。本第7實施形態之液晶曝光裝置之構成,除基板保持具30g、基板托盤40g、埠部60g外,與上述第1實施形態之液晶曝光裝置10(參照圖1)相同,因此以下僅針對相異點加以說明,而與上述第1實施形態具有相同構成、功能之要件,則賦予與上述第1實施形態相同符號並省略其說明。 Next, a seventh embodiment will be described with reference to Figs. 17(A) and 17(B). The liquid crystal exposure apparatus of the seventh embodiment is the same as the liquid crystal exposure apparatus 10 (see FIG. 1) of the first embodiment except for the substrate holder 30g, the substrate tray 40g, and the crotch portion 60g. In the first embodiment, the same components as those in the above-described first embodiment are denoted by the same reference numerals, and the description thereof is omitted.
上述第1~第6實施形態中,基板保持具30a~30f(分別參照圖1~圖16)具有基板搬出裝置(或基板搬出裝置之一部分),相對於此,本第7實施形態中,如圖17(A)所示,在基板保持具30g之外部、基板保持具30g之+Y側及-Y側分別配置有基板搬出裝置70g。例如2個基板搬出裝置70g各個之構成除按壓構件72g之Z軸方向尺寸被設定為略長之點外,與上述第1實施形態之基板搬出裝置70a(參照圖3)相同。 In the above-described first to sixth embodiments, the substrate holders 30a to 30f (see FIGS. 1 to 16 respectively) have a substrate carrying device (or a part of the substrate unloading device), whereas in the seventh embodiment, As shown in Fig. 17(A), the substrate unloading device 70g is disposed outside the substrate holder 30g and on the +Y side and the -Y side of the substrate holder 30g. For example, the configuration of each of the two substrate carrying-out devices 70g is the same as that of the substrate carrying-out device 70a (see FIG. 3) of the above-described first embodiment except that the dimension of the pressing member 72g in the Z-axis direction is set to be slightly longer.
如圖17(A)所示,基板托盤40g具有複數(例如5支)支承構件41。此外,上述第1實施形態之基板托盤40a(參照圖2(A))係透過例如3支補強構件43將複數個支承構件41之長邊方向中間部加以彼此連接,相對於此,基板托盤40g進一步具有將複數個支承構件41之-X側端部加以彼此連 結之補強構件45g。又,基板托盤40g不具有如上述第1實施形態之基板托盤40a般之突起45a(參照圖2(B))。 As shown in FIG. 17(A), the substrate tray 40g has a plurality of (for example, five) support members 41. In the substrate tray 40a (see FIG. 2(A)) of the first embodiment, the intermediate portions of the plurality of support members 41 in the longitudinal direction are connected to each other by, for example, three reinforcing members 43. In contrast, the substrate tray 40g is connected to each other. Further having the -X side ends of the plurality of support members 41 connected to each other A reinforcing member 45g is formed. Further, the substrate tray 40g does not have the projection 45a like the substrate tray 40a of the above-described first embodiment (see FIG. 2(B)).
又,上述複數個補強構件43、45g中最-X側之補強構件45g,其長邊方向尺寸較其他補強構件43長,其尺寸,如圖17(A)所示,被設定為在基板托盤40g被收容在基板保持具30g內之狀態下,其-Y側端部從基板保持具30g之-Y側端部往-Y側突出、且+Y側之端部從基板保持具30g之+Y側端部往+Y側突出。基板托盤40g,如圖17(B)所示,藉由補強構件45g之+Y側端部近旁被配置在基板保持具30g之+Y側之基板搬出裝置70g之按壓構件72g按壓、且補強構件45g之-Y側端部近旁被配置在基板保持具30g之-Y側之基板搬出裝置70g之按壓構件72g按壓,而從基板保持具30g搬出。 Further, among the plurality of reinforcing members 43 and 45g, the reinforcing member 45g on the most-X side has a longer longitudinal dimension than the other reinforcing members 43, and the size thereof is set to be on the substrate tray as shown in Fig. 17(A). 40g is accommodated in the substrate holder 30g, and the -Y side end portion protrudes from the -Y side end portion of the substrate holder 30g toward the -Y side, and the +Y side end portion is supported from the substrate holder 30g+ The Y-side end protrudes toward the +Y side. As shown in Fig. 17 (B), the substrate tray 40g is pressed by the pressing member 72g of the substrate carrying device 70g disposed on the +Y side of the substrate holder 30g by the +Y side end portion of the reinforcing member 45g, and the reinforcing member is pressed. The 45-g-Y-side end portion is pressed by the pressing member 72g of the substrate carrying-out device 70g disposed on the -Y side of the substrate holder 30g, and is carried out from the substrate holder 30g.
此處,第7實施形態之基板載台20g之基板保持具30g與圖1所示之上述第1實施形態同樣的,係配置在Y粗動載台23Y(圖17(A)及圖17(B)中未圖示)之上方。而如圖17(A)及圖17(B)所示之、例如2個基板搬出裝置70g之各個,係透過未圖示之支承構件安裝於Y粗動載台23Y,對基板保持具30g成機械性的(及振動上)分離。關於使用例如2個基板搬出裝置70g之基板搬出動作,由於與上述第1實施形態相同,因此省略其說明。又,埠部60g及未圖示之基板搬入裝置,除了係對應例如具有5支支承構件41之基板托盤40g而構成之點外,由於其功能與上述第1實施形態相同,因此省略其說明。 Here, the substrate holder 30g of the substrate stage 20g of the seventh embodiment is disposed on the Y coarse movement stage 23Y similarly to the first embodiment shown in Fig. 1 (Fig. 17(A) and Fig. 17 ( Above B) is not shown). As shown in Fig. 17 (A) and Fig. 17 (B), for example, each of the two substrate carrying devices 70g is attached to the Y coarse movement stage 23Y via a support member (not shown), and the substrate holder 30g is formed. Mechanical (and vibrating) separation. The substrate carrying-out operation using, for example, the two substrate carrying-out devices 70g is the same as that of the above-described first embodiment, and thus the description thereof will be omitted. In addition, the shank portion 60g and the substrate loading device (not shown) are configured similarly to the substrate tray 40g having five support members 41, and the functions thereof are the same as those of the above-described first embodiment, and thus the description thereof will be omitted.
本第7實施形態中,例如2台基板搬出裝置70g之各個係配置在基板保持具30g之外部,因此,無需於基板保持具30g形成用以收容基板搬出裝置70g之槽等,能抑制基板保持具30g之剛性降低。又,由於能以較大面積吸附保持基板P,因此能提昇基板P之平坦度。此外,由於能使基板保持具30g輕量化、且驅動按壓構件72g時之反力不會作用於基板保持具30g,因此能提昇基板保持具30g(基板P)之位置控制性。再者,由於基板搬出裝置70g係配置在基板保持具30g之外部,因此維修保養性亦佳。 In the seventh embodiment, for example, each of the two substrate carrying devices 70g is disposed outside the substrate holder 30g. Therefore, it is not necessary to form a groove for accommodating the substrate carrying device 70g in the substrate holder 30g, and the substrate holding can be suppressed. With a rigidity of 30g reduced. Moreover, since the substrate P can be adsorbed and held with a large area, the flatness of the substrate P can be improved. In addition, since the substrate holder 30g can be made lighter and the reaction force when the pressing member 72g is driven does not act on the substrate holder 30g, the positional controllability of the substrate holder 30g (substrate P) can be improved. Further, since the substrate carrying-out device 70g is disposed outside the substrate holder 30g, the maintenance property is also excellent.
又,藉由使用複數個Z音圈馬達29z(參照圖1)將基板保持具30g微驅動於+Z方向,使例如2台基板搬出裝置70g分別位於基板托盤40g之補強構件45g之-Z側,那麼在基板保持具30g上裝載有基板P之狀態下,按壓構件72g亦能通過補強構件45g之下方。據此,即能獲得與上述第2實施形態相同之效果、亦即在基板搬出後迅速地進行另一基板之搬入。又,亦可作成使例如2台基板搬出裝置70g能分別在Y粗動載台23Y上上下動。 Further, by using a plurality of Z voice coil motors 29z (see FIG. 1), the substrate holder 30g is micro-driven in the +Z direction, and for example, two substrate carrying devices 70g are respectively positioned on the -Z side of the reinforcing member 45g of the substrate tray 40g. Then, in a state in which the substrate P is placed on the substrate holder 30g, the pressing member 72g can pass under the reinforcing member 45g. According to this, it is possible to obtain the same effect as the second embodiment described above, that is, to carry out the loading of another substrate quickly after the substrate is carried out. Further, for example, two substrate carrying-out devices 70g can be moved up and down on the Y-stacking stage 23Y, respectively.
又,若作成按壓構件72g不吸附(僅抵接)補強構件45g之構成的話,與上述第3實施形態同樣的,能容易的抑制基板托盤40g及基板P之θ z方向(yawing方向)之移動。又,在按壓構件72g是吸附保持補強構件45g之情形時,基板搬出裝置70g可以在基板保持具30g之外側僅設置一個。此外,按壓構件72g,可與上述第4實施形態同樣的以繩索等加以牽引。又,亦可將如上述第5實施形態之基板搬出 裝置70e(參照圖14(A))般之滾輪裝置75,與本第7實施形態同樣的設置在基板保持具之外側。此外,亦可與上述第6實施形態同樣的,於基板托盤安裝可動子,將X固定子配置在基板保持具之外側。 In addition, when the pressing member 72g is configured to prevent (only abutting) the reinforcing member 45g, the movement of the substrate tray 40g and the substrate P in the θ z direction (yawing direction) can be easily suppressed as in the third embodiment. . Further, when the pressing member 72g is the adsorption holding reinforcing member 45g, the substrate carrying-out device 70g may be provided only on the outer side of the substrate holder 30g. Further, the pressing member 72g can be pulled by a rope or the like similarly to the above-described fourth embodiment. Further, the substrate of the fifth embodiment can be carried out The roller device 75 similar to the device 70e (see Fig. 14(A)) is provided on the outer side of the substrate holder in the same manner as in the seventh embodiment. Further, similarly to the sixth embodiment, the movable member may be attached to the substrate tray, and the X stator may be disposed outside the substrate holder.
其次,使用圖18及圖19說明第8實施形態。本第8實施形態之液晶曝光裝置之構成,除埠部60h外,與上述第7實施形態之液晶曝光裝置(包含基板保持具30g、基板托盤40g)相同,因此僅針對相異點加以說明,與上述第7實施形態具有相同構成、功能之要件,則賦予與上述第7實施形態相同符號並省略其說明。 Next, an eighth embodiment will be described with reference to Figs. 18 and 19 . The liquid crystal exposure apparatus of the eighth embodiment is the same as the liquid crystal exposure apparatus (including the substrate holder 30g and the substrate tray 40g) of the seventh embodiment except for the dam portion 60h. Therefore, only the differences will be described. The components having the same configurations and functions as those in the seventh embodiment are denoted by the same reference numerals as in the seventh embodiment, and the description thereof will be omitted.
如圖18所示,埠部60h,於架台61之-X側具有托盤導引裝置62h。托盤導引裝置62h包含搭載在未圖示之地面上之基座63h、與搭載在基座63h上之導件65h。又,本第8實施形態中,搭載在架台61上之複數個托盤導引裝置62不往X軸方向移動。導件65h係由延伸於Y軸方向之構件構成,其長邊方向尺寸被設定為較基板托盤40g(及基板P)於Y軸方向之長度(寬度)長(寬幅)。導件65h係設置在與架台61上其他導件65相同高度位置,與導件65同樣的,可從其上面噴出加壓氣體以懸浮支承基板托盤40g。據此,在為了將基板托盤40g從基板保持具30g交至埠部60h而使基板載台20g移動至基板更換位置時,從基板保持具30g之+X側端部突出之基板托盤40g即被導件65h從下方支承。因此,能抑制基板托盤40g及基板P之撓曲。 As shown in Fig. 18, the crotch portion 60h has a tray guiding device 62h on the -X side of the gantry 61. The tray guide device 62h includes a base 63h mounted on a floor (not shown) and a guide 65h mounted on the base 63h. Further, in the eighth embodiment, the plurality of tray guides 62 mounted on the gantry 61 are not moved in the X-axis direction. The guide 65h is composed of a member extending in the Y-axis direction, and its longitudinal dimension is set to be longer (wider) than the length (width) of the substrate tray 40g (and the substrate P) in the Y-axis direction. The guide 65h is provided at the same height position as the other guides 65 on the gantry 61. Similarly to the guide 65, pressurized gas can be ejected from above to suspend and support the substrate tray 40g. When the substrate tray 20g is moved from the substrate holder 30g to the crotch portion 60h to move the substrate stage 20g to the substrate replacement position, the substrate tray 40g protruding from the +X side end portion of the substrate holder 30g is The guide 65h is supported from below. Therefore, the deflection of the substrate tray 40g and the substrate P can be suppressed.
此處,例如在基板P設定有複數個照射區域之情形時,通常,最後一個進行曝光處理之照射區域,為減少基板P之總移動量,係設定在基板P之+Y側、或-Y側。因此,在對最後一個照射區域之曝光處理結束後之基板載台20g在朝向基板更換位置移動時,不僅會往X軸方向移動亦會往Y軸方向移動(相對X軸移動於斜方向)。相對於此,本第8實施形態,由於導件65h於Y軸方向之尺寸係設定為較基板托盤40g於Y軸方向之尺寸長,因此即使是在基板載台20g相對X軸移動於斜方向之情形時,基板托盤40g之從基板保持具30g之+X側端部突出之部分亦會被導件65h從下方支承。如此,能更迅速地搬出基板P。 Here, for example, when a plurality of irradiation regions are set on the substrate P, generally, the last irradiation region for performing the exposure processing is set on the +Y side of the substrate P, or -Y in order to reduce the total amount of movement of the substrate P. side. Therefore, when the substrate stage 20g after the end of the exposure processing in the last irradiation region is moved toward the substrate replacement position, it moves not in the X-axis direction but also in the Y-axis direction (moving in the oblique direction with respect to the X-axis). On the other hand, in the eighth embodiment, since the dimension of the guide 65h in the Y-axis direction is set to be longer than the dimension of the substrate tray 40g in the Y-axis direction, the substrate stage 20g is moved in the oblique direction with respect to the X-axis. In other cases, the portion of the substrate tray 40g that protrudes from the +X side end portion of the substrate holder 30g is also supported by the guide 65h from below. In this way, the substrate P can be carried out more quickly.
使用圖19具體說明如後。於基板P上設定有例如6個照射區域,其中之最後一個照射區域係被設定在基板P之+Y側且+X側之照射區域S6。又,對照射區域S6之曝光動作開始前之基板P之中心係位於位置CP1,該曝光動作結束時之基板P之中心則係位於位置CP2。此外,圖19中省略了基板托盤40a、基板搬出裝置70g、托盤導引裝置62、62h等(分別參照圖18)之圖示。 The details will be described later using FIG. For example, six irradiation regions are set on the substrate P, and the last one of the irradiation regions is set on the +Y side of the substrate P and the irradiation region S 6 on the +X side. Further, the center of the substrate P before the start of the exposure operation in the irradiation region S 6 is located at the position CP 1 , and the center of the substrate P at the end of the exposure operation is located at the position CP 2 . In addition, in FIG. 19, illustration of the board|substrate tray 40a, the board|substrate carrying-out apparatus 70g, the tray guide apparatus 62 and 62h, and FIG.
又,第8實施形態中,在基板載台20g到達基板更換位置之前,以未圖示之基板搬出裝置70g(參照圖18)開始基板P(及未圖示之基板托盤40g)之搬出動作。據此,基板P(及未圖示之基板托盤40g)即從基板保持具30g之+X側端部突出,而托盤導引裝置62h之導件65h(圖19中未圖示。參照圖18)較架台61上之導件65先從下方支承該突出部分。 In the eighth embodiment, before the substrate stage 20g reaches the substrate replacement position, the substrate carrying device 70g (see FIG. 18) (not shown) starts the loading operation of the substrate P (and the substrate tray 40g (not shown)). As a result, the substrate P (and the substrate tray 40g (not shown) protrudes from the +X side end portion of the substrate holder 30g, and the guide 65h of the tray guide 62h (not shown in FIG. 19. See FIG. The guide 65 on the gantry 61 first supports the protruding portion from below.
此外,本第8實施形態中,可以基板P之中心依序通過圖19之位置CP1→CP2→CP3之方式進行基板載台20g之位置控制。亦即,假設埠部60h不具有托盤導引裝置62h(圖19中未圖示。參照圖18)之情形時,由於在基板P之搬出時基板托盤40g(圖19中未圖示。參照圖18)係與X軸方向平行移動,因此必須進行基板載台20g之Y位置控制以使架台61上之複數個托盤導引裝置62(圖19中未圖示。參照圖18)於Y軸方向之位置、與基板托盤40g(圖19中未圖示。參照圖18)所具有之複數個支承構件41於Y軸方向之位置大致一致,此場合,即必須以基板P之中心依序通過圖19中之位置CP1→CP2→CP4→CP3之方式進行基板載台20g之位置控制。 Further, in the eighth embodiment, the position of the substrate stage 20g can be controlled in such a manner that the center of the substrate P passes through the positions CP 1 → CP 2 → CP 3 in Fig. 19 in order. In other words, when the crotch portion 60h does not have the tray guiding device 62h (not shown in Fig. 19, see Fig. 18), the substrate tray 40g is not shown in Fig. 19 when the substrate P is unloaded. 18) is moved in parallel with the X-axis direction. Therefore, it is necessary to control the Y position of the substrate stage 20g so that a plurality of tray guiding devices 62 (not shown in FIG. 19, see FIG. 18) on the gantry 61 are in the Y-axis direction. The position and the plurality of support members 41 included in the substrate tray 40g (not shown in Fig. 19, see Fig. 18) substantially coincide with each other in the Y-axis direction. In this case, it is necessary to sequentially pass the center of the substrate P. The position control of the substrate stage 20g is performed in the manner of position CP 1 → CP 2 → CP 4 → CP 3 in 19.
相對於此,本第8實施形態中,由於係與基板載台20g之Y位置無關的基板托盤40g(圖19中未圖示。參照圖18)之+X側端部近旁被導件65h(圖19中未圖示。參照圖18)支承,因此能使基板載台20g從最終照射區域之曝光處理結束時之位置(位置CP2)直接移動至基板更換位置(位置CP3),迅速地進行基板P之搬出動作。又,本第8實施形態中之輔助性的托盤導引裝置62h及基板P之搬出方法亦能適用於上述第1~第7實施形態。不過,在基板P從基板保持具之突出量較小之情形時(在基板更換位置亦不會接觸托盤導引裝置62之情形),即使不具有輔助性的托盤導引裝置62h,亦可使基板載台20a~20f從最終照射區域之曝光處理結束時之位置直接移動至基板更換位置。 On the other hand, in the eighth embodiment, the substrate tray 40g (not shown in FIG. 19 (see FIG. 18) is adjacent to the Y position of the substrate stage 20g (see FIG. 18). Although not shown in Fig. 19. Referring to Fig. 18), the substrate stage 20g can be directly moved from the position (position CP 2 ) at the end of the exposure processing of the final irradiation region to the substrate replacement position (position CP 3 ), and rapidly The substrate P is carried out. Further, the auxiliary tray guiding device 62h and the substrate P carrying method in the eighth embodiment can be applied to the above-described first to seventh embodiments. However, when the amount of protrusion of the substrate P from the substrate holder is small (in the case where the substrate replacement position does not contact the tray guiding device 62), even if the auxiliary tray guiding device 62h is not provided, The substrate stages 20a to 20f are directly moved from the position at the end of the exposure processing of the final irradiation region to the substrate replacement position.
又,液晶曝光裝置之構成不限於上述第1~第8實施形態所說明者,可適當的加以變更。例如,托盤導引裝置32、62之導件35、65之各個,雖係以非接觸(懸浮)支承基板托盤40a~40g,但不限於此,亦可例如使用球等轉動體以低摩擦進行接觸支承。此外,托盤導引裝置32、62之各個,可構成為使用導件35、65將基板托盤40a~40g直進引導於X軸方向。 Further, the configuration of the liquid crystal exposure apparatus is not limited to those described in the first to eighth embodiments, and can be appropriately changed. For example, each of the guides 35 and 65 of the tray guides 32 and 62 supports the substrate trays 40a to 40g in a non-contact (suspended) manner, but is not limited thereto, and may be performed with low friction, for example, using a rotating body such as a ball. Contact support. Further, each of the tray guiding devices 32 and 62 may be configured to guide the substrate trays 40a to 40g in the X-axis direction by using the guides 35 and 65.
又,照明光可以是ArF準分子雷射光(波長193nm)、KrF準分子雷射光(波長248nm)等之紫外光、或F2雷射光(波長157nm)等之真空紫外光。此外,作為照明光,亦可使用例如將從DFB半導體雷射或光纖雷射發出之紅外線帶或可見光帶之單一波長雷射光以例如摻雜有鉺(或鉺及鐿兩者)之光纖放大器加以増幅,使用非線性光學結晶加以波長轉換為紫外光之諧波。再者,亦可使用固體雷射(波長:355nm、266nm)等。 Further, the illumination light may be ultraviolet light such as ArF excimer laser light (wavelength 193 nm), KrF excimer laser light (wavelength 248 nm), or vacuum ultraviolet light such as F 2 laser light (wavelength 157 nm). Further, as the illumination light, for example, a single-wavelength laser light of an infrared band or a visible light band emitted from a DFB semiconductor laser or a fiber laser may be used, for example, an optical fiber amplifier doped with germanium (or both germanium and germanium). The amplitude is converted to the harmonics of ultraviolet light using nonlinear optical crystallization. Further, a solid laser (wavelength: 355 nm, 266 nm) or the like can also be used.
又,上述各實施形態,雖係針對投影光學系PL是具備複數支投影光學單元之多透鏡方式之投影光學系的情形作了說明,但投影光學單元之支數不限於此,只要是一支以上即可。此外,不限於多透鏡方式之投影光學系,亦可以是例如使用歐夫那(Ofner)型大型反射鏡的投影光學系等。又,上述實施形態中雖係針對作為投影光學系PL使用投影倍率為等倍者之情形作了說明,但不限於此,投影光學系可以是縮小系及放大系之任一種。 Further, in each of the above embodiments, the case where the projection optical system PL is a multi-lens projection optical system including a plurality of projection optical units has been described, but the number of projection optical units is not limited thereto, and only one is More than that. Further, it is not limited to the multi-lens type projection optical system, and may be, for example, a projection optical system using an OFNER type large-sized mirror. In the above-described embodiment, the case where the projection magnification is equal to the projection optical system PL is described. However, the present invention is not limited thereto, and the projection optical system may be either a reduction system or an amplification system.
又,上述實施形態中,雖係使用在光透射性之光罩基 板上形成有既定遮光圖案(或相位圖案、減光圖案)之光透射型光罩,但亦可取代此光罩,使用例如美國專利第6,778,257號說明書所揭示之根據待曝光圖案之電子資料,來形成透射圖案或反射圖案、或發光圖案之電子光罩(可變成形光罩),例如使用非發光型影像顯示元件(亦稱空間光調變器)之一種之DMD(Digital Micro-mirror Device))的可變成形光罩。 Further, in the above embodiment, the light transmissive mask base is used. A light-transmitting type reticle having a predetermined light-shielding pattern (or a phase pattern, a light-reducing pattern) is formed on the board, but the reticle may be replaced with an electronic material according to a pattern to be exposed, such as disclosed in the specification of US Pat. No. 6,778,257. An electronic mask (variable shaping mask) for forming a transmission pattern or a reflection pattern or a light-emitting pattern, for example, a DMD (Digital Micro-mirror Device) using a non-light-emitting type image display element (also referred to as a spatial light modulator) )) Variable shaped reticle.
又,作為曝光裝置,特別是對使尺寸(包含外徑、對角線、一邊之至少一個)為500mm以上之基板、例如液晶顯示元件等平板顯示器(FPD)用大型基板曝光之曝光裝置尤其有效。 Further, as an exposure apparatus, in particular, an exposure apparatus for exposing a substrate having a size (including at least one of an outer diameter, a diagonal, and one side) of 500 mm or more, or a large-sized substrate such as a liquid crystal display element (FPD), is particularly effective. .
又,作為上述曝光裝置,可適用於步進重複(step & repeat)方式之曝光裝置、步進接合(step & stitch)方式之曝光裝置。 Further, the exposure apparatus can be applied to an exposure apparatus of a step & repeat method and an exposure apparatus of a step & stitch type.
又,曝光裝置之用途並不限於將液晶顯示元件圖案轉印至方型玻璃板之液晶用曝光裝置,亦可廣泛適用於例如半導體製造用之曝光裝置、用以製造薄膜磁頭、微機器及DNA晶片等之曝光裝置。此外,不僅是半導體元件元件等之微元件,本發明亦能適用於為製造用於光曝光裝置、EUV曝光裝置、X線曝光裝置及電子線曝光裝置等之光罩或標線片,而將電路圖案轉印至玻基板或矽晶圓等之曝光裝置。再者,曝光對象之物體不限於玻璃板,亦可以是例如晶圓、陶瓷基板、薄膜構件或光罩基板(mask blank)等其他物體。又,曝光對象物是平板顯示器用基板之情形時,該基板之 厚度並無特別限定,例如亦包含薄膜狀(具可撓性之片狀構件)者。 Further, the use of the exposure apparatus is not limited to a liquid crystal exposure apparatus for transferring a liquid crystal display element pattern to a square glass plate, and can be widely applied to, for example, an exposure apparatus for semiconductor manufacturing, for manufacturing a thin film magnetic head, a micromachine, and DNA. An exposure device such as a wafer. Further, the present invention can be applied not only to micro-elements such as semiconductor element elements, but also to manufacturing photomasks or reticle for use in a photo-exposure device, an EUV exposure device, an X-ray exposure device, and an electron beam exposure device. The circuit pattern is transferred to an exposure device such as a glass substrate or a germanium wafer. Further, the object to be exposed is not limited to a glass plate, and may be another object such as a wafer, a ceramic substrate, a film member, or a mask blank. Further, when the object to be exposed is a substrate for a flat panel display, the substrate is The thickness is not particularly limited, and for example, it is also a film-like (flexible sheet member).
此外,不僅是曝光裝置,對例如用於既定物體之檢査之物體檢査裝置等、對物體進行既定處理之物體處置裝置,皆能適用上述第1~第8實施形態所說明之基板(物體)之更換方法。 In addition, the substrate (object) described in the first to eighth embodiments can be applied to an object handling device that performs predetermined processing on an object such as an object inspection device for inspection of a predetermined object. Replacement method.
液晶顯示元件(或半導體元件)等之電子元件,係經由進行元件之功能性能設計的步驟、依據此設計步驟製作光罩(或標線片)的步驟、製作玻璃基板(或晶圓)的步驟、以上述各實施形態之曝光裝置及其曝光方法將光罩(標線片)圖案轉印至玻璃基板的微影步驟、使經曝光之玻璃基板顯影的顯影步驟、將殘存抗蝕劑之部分以外部分之露出構件以蝕刻加以去除的蝕刻步驟、去除完成蝕刻而無需之抗蝕劑的抗蝕劑去除步驟、元件組裝步驟、檢査步驟等加以製造。此場合,由於在微影步驟係使用上述實施形態之曝光裝置實施前述曝光方法,於玻璃基板上形成元件圖案,因此能以良好生產性製造高積體度之元件。 An electronic component such as a liquid crystal display element (or a semiconductor element) is a step of fabricating a photomask (or a reticle) according to the design of the functional performance of the component, and a step of fabricating a glass substrate (or wafer) In the exposure apparatus and the exposure method thereof according to the above embodiments, the photomask (reticle) pattern is transferred to the lithography step of the glass substrate, the development step of developing the exposed glass substrate, and the remaining resist portion The exposed portions of the other portions are etched by etching, the resist removal step of removing the etching is completed, the resist removal step of the resist, the component assembly step, the inspection step, and the like are performed. In this case, since the exposure method is carried out by using the exposure apparatus of the above-described embodiment in the lithography step, the element pattern is formed on the glass substrate, so that a high-complexity element can be manufactured with good productivity.
此外,援用上述說明所引用之關於曝光裝置之所有公報、國際公開公報、美國專利及美國專利申請公開說明書之揭示作為本說明書記載之一部分。 In addition, the disclosures of all publications, the International Publications, the U.S. Patent, and the U.S. Patent Application Publications, which are incorporated herein by reference, are incorporated by reference.
如以上之說明,本發明之物體之搬出方法適合從物體保持裝置上搬出物體。又,本發明之物體之更換方法適合對物體保持裝置所保持之物體進行更換。又,本發明之物 體保持裝置適合迅速地進行物體之搬出。又,本發明之曝光裝置適合使物體曝光。此外,本發明之平面顯示器之製造方法適合平面顯示器之製造。又,本發明之元件製造方法適合微元件之製造。 As described above, the object carrying out method of the present invention is suitable for carrying out an object from the object holding device. Further, the method of replacing the object of the present invention is suitable for replacing an object held by the object holding device. Also, the present invention The body holding device is suitable for quickly moving out objects. Further, the exposure apparatus of the present invention is suitable for exposing an object. Further, the method of manufacturing a flat panel display of the present invention is suitable for the manufacture of a flat panel display. Further, the component manufacturing method of the present invention is suitable for the manufacture of microcomponents.
10‧‧‧液晶曝光裝置 10‧‧‧Liquid exposure device
11‧‧‧無塵室之地面 11‧‧‧The ground of the clean room
12‧‧‧平台 12‧‧‧ platform
13‧‧‧基板載台架台 13‧‧‧Substrate carrier
14‧‧‧防振裝置 14‧‧‧Anti-vibration device
16‧‧‧鏡筒平台 16‧‧‧Mirror platform
20a、20g‧‧‧基板載台 20a, 20g‧‧‧ substrate carrier
21‧‧‧微動載台 21‧‧‧Micro-motion stage
22x‧‧‧X移動鏡 22x‧‧‧X moving mirror
23X‧‧‧X粗動載台 23X‧‧‧X coarse moving stage
23Y‧‧‧Y粗動載台 23Y‧‧‧Y coarse moving stage
24‧‧‧反射鏡座 24‧‧‧Mirror mount
25‧‧‧Y線性導引裝置 25‧‧‧Y linear guide
26‧‧‧重量消除裝置 26‧‧‧Weight elimination device
26a‧‧‧空氣軸承 26a‧‧‧Air bearing
26b‧‧‧連結裝置 26b‧‧‧Linking device
27‧‧‧調平裝置 27‧‧‧ Leveling device
29x‧‧‧X音圈馬達 29x‧‧‧X voice coil motor
29z‧‧‧Z音圈馬達 29z‧‧‧Z voice coil motor
30a~30g‧‧‧基板保持具 30a~30g‧‧‧Substrate holder
31x‧‧‧X槽 31x‧‧‧X slot
31y‧‧‧Y槽 31y‧‧‧Y slot
32、62、62h‧‧‧托盤導引裝置 32, 62, 62h‧‧‧Tray guide
33‧‧‧凹部 33‧‧‧ recess
34、64‧‧‧Z致動器 34, 64‧‧‧Z actuators
35、65、65h‧‧‧導件 35, 65, 65h‧‧‧ Guides
40a、40b、40e、40f、40g‧‧‧基板托盤 40a, 40b, 40e, 40f, 40g‧‧‧ substrate tray
41‧‧‧支承構件 41‧‧‧Support members
42‧‧‧連結構件 42‧‧‧Connected components
43‧‧‧補強構件 43‧‧‧Reinforcing components
44a、44b‧‧‧錐狀構件 44a, 44b‧‧‧Cone members
45a‧‧‧突起 45a‧‧‧ Protrusion
45f‧‧‧X可動子 45f‧‧‧X movable
45‧‧‧補強構件 45‧‧‧Reinforcing components
50‧‧‧基板搬入裝置 50‧‧‧Substrate loading device
51a、51b‧‧‧第1、第2搬送單元 51a, 51b‧‧‧1st and 2nd transport units
52‧‧‧X行進導件 52‧‧‧X travel guide
53‧‧‧X滑件 53‧‧‧X slider
54a、54b‧‧‧保持構件 54a, 54b‧‧‧ holding components
55a、55b‧‧‧凹部 55a, 55b‧‧‧ recess
60a、60b、60f、60g、60h‧‧‧埠部 60a, 60b, 60f, 60g, 60h‧‧‧埠
61‧‧‧架台 61‧‧‧ 台台
63、63h‧‧‧基座 63, 63h‧‧‧ base
66‧‧‧X線性導件 66‧‧‧X linear guide
67‧‧‧X滑件 67‧‧‧X slider
70a、70b、70c、70d、70g‧‧‧基板搬出裝置 70a, 70b, 70c, 70d, 70g‧‧‧ substrate carrying out device
70f‧‧‧X線性馬達 70f‧‧‧X linear motor
71‧‧‧X行進導件 71‧‧‧X travel guide
72a、72b、72c、72g‧‧‧按壓構件 72a, 72b, 72c, 72g‧‧‧ ‧ pressing members
72b1‧‧‧X滑動部 72b 1 ‧‧‧X sliding part
72b2‧‧‧按壓部 72b 2 ‧‧‧ Pressing Department
73x‧‧‧X槽 73x‧‧‧X slot
741‧‧‧繩索 74 1 ‧‧‧ rope
742‧‧‧滑輪 74 2 ‧‧‧ pulley
743‧‧‧X槽 74 3 ‧‧‧X slot
76‧‧‧X固定子 76‧‧‧X fixator
IL‧‧‧照明光 IL‧‧‧Lights
IOP‧‧‧照明系 IOP‧‧‧Lighting Department
M‧‧‧光罩 M‧‧‧Photo Mask
MST‧‧‧光罩載台 MST‧‧‧Photomask stage
P‧‧‧基板 P‧‧‧Substrate
PL‧‧‧投影光學系 PL‧‧‧Projection Optics
PST‧‧‧基板載台裝置 PST‧‧‧Substrate stage device
圖1係概略顯示第1實施形態之液晶曝光裝置之構成的圖。 Fig. 1 is a view schematically showing the configuration of a liquid crystal exposure apparatus according to a first embodiment.
圖2(A)係用於圖1之液晶曝光裝置之基板托盤的俯視圖、圖2(B)係圖2(A)之基板托盤的側視圖。 2(A) is a plan view of a substrate tray used in the liquid crystal exposure apparatus of FIG. 1, and FIG. 2(B) is a side view of the substrate tray of FIG. 2(A).
圖3係圖1之液晶曝光裝置所具有之基板保持具及埠部的俯視圖。 Fig. 3 is a plan view showing a substrate holder and a flange portion of the liquid crystal exposure apparatus of Fig. 1.
圖4(A)係顯示基板保持具與基板托盤之組合狀態的俯視圖、圖4(B)係圖4(A)之A-A線剖面圖。 4(A) is a plan view showing a state in which the substrate holder and the substrate tray are combined, and FIG. 4(B) is a cross-sectional view taken along line A-A of FIG. 4(A).
圖5係圖1之液晶曝光裝置所具有之基板搬入裝置的俯視圖。 Fig. 5 is a plan view showing a substrate carrying device included in the liquid crystal exposure apparatus of Fig. 1.
圖6(A)~圖6(C)係用以說明基板搬入動作的圖(其1~其3)。 6(A) to 6(C) are diagrams for explaining the substrate loading operation (1 to 3).
圖7(A)及圖7(B)係用以說明基板搬出動作的圖(其1及其2)。 7(A) and 7(B) are views for explaining the substrate unloading operation (1 and 2).
圖8(A)~圖8(C)係用以說明基板保持具上之基板更換動作的圖(其1~其3)。 8(A) to 8(C) are views for explaining the substrate replacement operation on the substrate holder (1 to 3).
圖9(A)係第2實施形態之基板托盤的俯視圖、圖9(B)係圖9(A)之基板托盤的側視圖。 Fig. 9(A) is a plan view of the substrate tray of the second embodiment, and Fig. 9(B) is a side view of the substrate tray of Fig. 9(A).
圖10係第2實施形態之基板保持具及埠部的俯視圖。 Fig. 10 is a plan view showing a substrate holder and a crotch portion according to the second embodiment.
圖11(A)~圖11(C)係用以說明第2實施形態之基板搬出動作的圖(其1~其3)。 11(A) to 11(C) are views for explaining the substrate unloading operation of the second embodiment (the first to third aspects thereof).
圖12係第3實施形態之基板保持具及埠部的俯視圖。 Fig. 12 is a plan view showing a substrate holder and a crotch portion according to a third embodiment;
圖13係第4實施形態之基板保持具的剖面圖。 Figure 13 is a cross-sectional view showing a substrate holder according to a fourth embodiment.
圖14(A)係第5實施形態之基板保持具的俯視圖、圖14(B)係顯示圖14(A)之基板保持具與基板托盤之組合狀態的圖。 Fig. 14 (A) is a plan view of the substrate holder of the fifth embodiment, and Fig. 14 (B) is a view showing a state of combination of the substrate holder of Fig. 14 (A) and the substrate tray.
圖15(A)係第6實施形態之基板托盤的俯視圖、圖15(B)係顯示圖15(A)之基板托盤與第6實施形態之基板保持具之組合狀態的圖。 Fig. 15(A) is a plan view of the substrate tray of the sixth embodiment, and Fig. 15(B) is a view showing a state in which the substrate tray of Fig. 15(A) and the substrate holder of the sixth embodiment are combined.
圖16係第6實施形態之基板保持具及埠部的俯視圖。 Fig. 16 is a plan view showing a substrate holder and a crotch portion according to a sixth embodiment.
圖17(A)係第7實施形態之基板托盤、基板保持具及埠部的俯視圖、圖17(B)係用以說明第7實施形態中之基板搬出動作的圖。 17(A) is a plan view of a substrate tray, a substrate holder, and a dam portion according to a seventh embodiment, and FIG. 17(B) is a view for explaining a substrate unloading operation in the seventh embodiment.
圖18係第8實施形態之埠部的俯視圖。 Fig. 18 is a plan view showing a crotch portion of the eighth embodiment.
圖19係用以說明在第8實施形態之基板搬出時之基板之動作的圖。 Fig. 19 is a view for explaining the operation of the substrate when the substrate is carried out in the eighth embodiment.
20a‧‧‧基板載台 20a‧‧‧Substrate stage
30a‧‧‧基板保持具 30a‧‧‧Substrate holder
31x‧‧‧X槽 31x‧‧‧X slot
32、62‧‧‧托盤導引裝置 32, 62‧‧‧Tray guide
34、64‧‧‧Z致動器 34, 64‧‧‧Z actuators
35、65‧‧‧導件 35, 65‧‧‧ Guides
40a‧‧‧基板托盤 40a‧‧‧Substrate tray
41‧‧‧支承構件 41‧‧‧Support members
43‧‧‧補強構件 43‧‧‧Reinforcing components
45a‧‧‧突起 45a‧‧‧ Protrusion
60a‧‧‧埠部 60a‧‧‧埠
61‧‧‧架台 61‧‧‧ 台台
63‧‧‧基座 63‧‧‧Base
70a‧‧‧基板搬出裝置 70a‧‧‧Substrate removal device
71‧‧‧X行進導件 71‧‧‧X travel guide
72a‧‧‧按壓構件 72a‧‧‧ Pressing members
P‧‧‧基板 P‧‧‧Substrate
Claims (27)
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JP2011107789A JP5741834B2 (en) | 2011-05-13 | 2011-05-13 | Object carry-out method, object exchange method, object holding apparatus, exposure apparatus, flat panel display manufacturing method, and device manufacturing method |
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TW201301429A TW201301429A (en) | 2013-01-01 |
TWI564986B true TWI564986B (en) | 2017-01-01 |
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TW101116832A TWI564986B (en) | 2011-05-13 | 2012-05-11 | Carry-out method of object, exchange method of object, object holding apparatus, exposure apparatus, flat-panel display manufacturing method, and device manufacturing method |
TW105137060A TWI632635B (en) | 2011-05-13 | 2012-05-11 | Object conveying device and method, exposure device and method, manufacturing method of flat display, and component manufacturing method |
TW107122816A TWI693662B (en) | 2011-05-13 | 2012-05-11 | Method for manufacturing object conveying device, exposure device, flat panel display, and component manufacturing method |
TW109111374A TW202030827A (en) | 2011-05-13 | 2012-05-11 | Substrate-replacement method |
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TW105137060A TWI632635B (en) | 2011-05-13 | 2012-05-11 | Object conveying device and method, exposure device and method, manufacturing method of flat display, and component manufacturing method |
TW107122816A TWI693662B (en) | 2011-05-13 | 2012-05-11 | Method for manufacturing object conveying device, exposure device, flat panel display, and component manufacturing method |
TW109111374A TW202030827A (en) | 2011-05-13 | 2012-05-11 | Substrate-replacement method |
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KR (2) | KR102238208B1 (en) |
CN (2) | CN103534788B (en) |
TW (4) | TWI564986B (en) |
WO (1) | WO2012157230A1 (en) |
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JP5741834B2 (en) * | 2011-05-13 | 2015-07-01 | 株式会社ニコン | Object carry-out method, object exchange method, object holding apparatus, exposure apparatus, flat panel display manufacturing method, and device manufacturing method |
CN105775742B (en) * | 2016-03-28 | 2018-04-17 | 东莞市鼎胜网印设备有限公司 | Automatic material feeding and taking machine and automatic material feeding and taking method thereof |
CN105824200B (en) * | 2016-05-31 | 2017-08-29 | 京东方科技集团股份有限公司 | A kind of substrate support structure and exposure machine |
JP6723889B2 (en) * | 2016-09-28 | 2020-07-15 | 株式会社荏原製作所 | Plating equipment |
WO2019064576A1 (en) * | 2017-09-29 | 2019-04-04 | 株式会社ニコン | Substrate handing device, exposure device, method for producing flat panel display, device production method, substrate handling method, and exposure method |
JP7205966B2 (en) * | 2018-06-29 | 2023-01-17 | 川崎重工業株式会社 | Substrate transfer device and its operation method |
CN109384062B (en) * | 2018-09-19 | 2020-02-18 | 武汉华星光电技术有限公司 | Exposure machine and method for conveying substrate by exposure machine |
US10901328B2 (en) * | 2018-09-28 | 2021-01-26 | Applied Materials, Inc. | Method for fast loading substrates in a flat panel tool |
JP7285648B2 (en) * | 2019-01-31 | 2023-06-02 | 株式会社Screenホールディングス | Conveying device, exposure device, and conveying method |
CN118062576B (en) * | 2024-04-25 | 2024-06-21 | 肇庆南玻节能玻璃有限公司 | Flexible conveying system applied to glass production |
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- 2012-05-11 TW TW101116832A patent/TWI564986B/en active
- 2012-05-11 TW TW105137060A patent/TWI632635B/en active
- 2012-05-11 WO PCT/JP2012/003081 patent/WO2012157230A1/en active Application Filing
- 2012-05-11 TW TW107122816A patent/TWI693662B/en active
- 2012-05-11 KR KR1020137032877A patent/KR102097123B1/en active Active
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Also Published As
Publication number | Publication date |
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TW202030827A (en) | 2020-08-16 |
TW201301429A (en) | 2013-01-01 |
CN103534788A (en) | 2014-01-22 |
TWI632635B (en) | 2018-08-11 |
TW201711127A (en) | 2017-03-16 |
CN103534788B (en) | 2016-12-14 |
KR102238208B1 (en) | 2021-04-08 |
JP5741834B2 (en) | 2015-07-01 |
CN106873313B (en) | 2020-03-03 |
TWI693662B (en) | 2020-05-11 |
KR20200037441A (en) | 2020-04-08 |
KR102097123B1 (en) | 2020-04-03 |
KR20140043750A (en) | 2014-04-10 |
TW201838077A (en) | 2018-10-16 |
CN106873313A (en) | 2017-06-20 |
WO2012157230A1 (en) | 2012-11-22 |
JP2012237913A (en) | 2012-12-06 |
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