TWI422717B - Clean bench and method of producing raw material for single crystal silicon - Google Patents
Clean bench and method of producing raw material for single crystal silicon Download PDFInfo
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- TWI422717B TWI422717B TW097133745A TW97133745A TWI422717B TW I422717 B TWI422717 B TW I422717B TW 097133745 A TW097133745 A TW 097133745A TW 97133745 A TW97133745 A TW 97133745A TW I422717 B TWI422717 B TW I422717B
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B28/00—Production of homogeneous polycrystalline material with defined structure
- C30B28/12—Production of homogeneous polycrystalline material with defined structure directly from the gas state
- C30B28/14—Production of homogeneous polycrystalline material with defined structure directly from the gas state by chemical reaction of reactive gases
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/08—Etching
- C30B33/12—Etching in gas atmosphere or plasma
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Description
本發明有關用於根據大小或品質挑選多晶矽的清潔台,該多晶矽係作為製造單晶矽時被熔融的原料,及單晶矽原料的製法,其包括該多晶矽的清潔程序。The present invention relates to a cleaning station for selecting polycrystalline germanium according to size or quality, which is a raw material to be melted when a single crystal crucible is produced, and a method for producing a single crystal germanium raw material, which comprises a cleaning procedure of the polycrystalline germanium.
一般而言,在製造作為單晶矽原料的多晶矽時,將受熱的矽晶種棒暴露於包括氯矽烷氣體及氫氣之原料氣體。多晶矽係由該矽晶種棒沈積為圓柱形,且壓碎為適當大小的碎塊或切成預定長度的棒子,藉以提供單晶矽的原料。將該多晶矽,單晶矽的原料,包裝且送至單晶矽製造工廠。包裝之前,根據大小或品質以人工挑選該多晶矽。此挑選方法係,例如,在清潔台中進行,如日本審查中的專利申請案,初次申請編號2005-279576,所例示的。該清潔台包括經過供應空氣的高效能過濾器供應空氣至形成在工作台上之工作空間的吹風器及自該工作空間吸取空氣的吸氣孔。該工作空間以清潔空氣經過該吹風器及吸氣孔持續供應,以致能高度保持該工作台上的清潔度。因此,在挑選多晶矽時,此程序防止雜質黏附於該多晶矽且經由清潔空氣的吹拂除去多晶矽本身的粒子。結果,可改善所製造的單晶矽品質。In general, in the production of polycrystalline germanium as a single crystal germanium raw material, the heated twin seeded rod is exposed to a raw material gas including chlorodecane gas and hydrogen. The polycrystalline lanthanum is deposited into a cylindrical shape by the twin seeding rod, and is crushed into pieces of an appropriate size or cut into rods of a predetermined length to provide a raw material of single crystal ruthenium. The raw material of the polycrystalline germanium and single crystal germanium is packaged and sent to a single crystal crucible manufacturing plant. Prior to packaging, the polysilicon is manually selected based on size or quality. This selection method is, for example, carried out in a cleaning station, as exemplified in the patent application filed in Japanese Patent Application No. 2005-279576. The cleaning station includes a blower that supplies air through a high-performance filter that supplies air to a work space formed on the workbench and an air intake hole that draws air from the work space. The workspace is continuously supplied with clean air through the blower and the suction port so as to maintain a high degree of cleanliness on the table. Therefore, in the selection of polysilicon, this procedure prevents impurities from adhering to the polysilicon and removes particles of the polysilicon itself via blowing of clean air. As a result, the quality of the produced single crystal germanium can be improved.
附帶地,在清潔台中進行多晶矽大小及品質的挑選時,若粒子帶電,該粒子將以靜電黏附於該多晶矽。由此, 該粒子將無法被清潔空氣吹拂除去。所需要的除去效應將無法達成。Incidentally, when the size and quality of the polycrystalline silicon are selected in the cleaning station, if the particles are charged, the particles will adhere to the polycrystalline silicon by static electricity. thus, The particles will not be removed by the clean air. The required removal effect will not be achieved.
因此,本發明的目的在於提供能預防粒子黏附於多晶矽以維持所製造的單晶矽品質的清潔台,用於根據大小及品質挑選多晶矽的清潔台,及單晶矽原料的製法。Accordingly, an object of the present invention is to provide a cleaning station capable of preventing particles from adhering to polycrystalline silicon to maintain the quality of the produced single crystal germanium, a cleaning station for selecting polycrystalline germanium according to size and quality, and a method for preparing a single crystal germanium raw material.
本發明運用下述內容以達到上述目的。The present invention uses the following to achieve the above object.
換言之,本發明的清潔台包括:工作台,多晶矽係放在其上;及箱形部分,其包括側板以環繞該工作台上方之工作空間正面以外的三側,及頂板,其覆蓋該工作空間上側,其中:供應孔係形成在該箱形部分的頂板中,其供應清潔空氣至該工作台的上表面;提供游離器,其將自該等供應孔供應至該工作空間的清潔空氣游離化且除去該工作台上的靜電;且吸氣孔係形成在該箱形部分的側板,其自該工作空間吸取空氣。In other words, the cleaning station of the present invention comprises: a work table on which a polysilicon system is placed; and a box portion including a side plate to surround three sides other than the front surface of the work space above the work table, and a top plate covering the work space An upper side, wherein: a supply hole is formed in a top plate of the box-shaped portion, which supplies clean air to an upper surface of the table; and a freezer is provided that frees clean air supplied from the supply holes to the work space And removing static electricity on the workbench; and the suction holes are formed in the side plates of the box-shaped portion, which sucks air from the work space.
根據上述的清潔台,經由被正面以外的三側所環繞的工作台上之供應孔供應清潔空氣,且經由該吸氣孔吸取該工作台上側周圍的空氣,藉以使該工作台上側保持清潔。因此,使該工作台上所放置的多晶矽可保持高純度。結果,由作為原料的多晶矽所製造之單晶矽的品質不變壞。According to the cleaning station described above, the cleaning air is supplied through the supply holes on the table surrounded by the three sides other than the front surface, and the air around the upper side of the table is sucked through the suction holes, thereby keeping the upper side of the table clean. Therefore, the polysilicon placed on the stage can be kept at a high purity. As a result, the quality of the single crystal germanium produced from the polycrystalline germanium as a raw material did not deteriorate.
再者,在根據本發明的清潔台中,清潔空氣被游離器游離化後被噴在該工作台上。該清潔空氣包括正及負離子。由此,當多晶矽的粒子帶電時,該清潔空氣的正及負離 子與該粒子的靜電中和。因此,該粒子上的靜電被消除。該粒子,自彼除去靜電,失去黏附力,且由此其不會黏附至該多晶矽且被該清潔空氣的流動吸至該吸氣孔。然後,自該加工台表面除去該粒子。結果,該粒子可輕易被消除。因此,可維持以作為原料之多晶矽所製造的單晶矽的高品質。Further, in the cleaning station according to the present invention, the clean air is released by the freezer and is sprayed on the table. The clean air includes positive and negative ions. Thus, when the particles of the polycrystalline silicon are charged, the positive and negative ions of the clean air The child is electrostatically neutralized with the particles. Therefore, the static electricity on the particles is eliminated. The particles, from which they are electrostatically removed, lose their adhesion and thus do not adhere to the polysilicon and are attracted to the suction holes by the flow of the clean air. The particles are then removed from the surface of the processing station. As a result, the particles can be easily eliminated. Therefore, the high quality of the single crystal germanium produced by the polycrystalline silicon as a raw material can be maintained.
再者,含有正及負離子的清潔空氣可被該游離器供應至該工作台上側以除去該多晶矽上之粒子的靜電,藉以輕易地消除該粒子。結果,作為原料之多晶矽所製造的單晶矽的品質可被改善。Furthermore, clean air containing positive and negative ions can be supplied to the upper side of the table by the freezer to remove static electricity from the particles on the polycrystalline silicon, thereby easily eliminating the particles. As a result, the quality of the single crystal germanium produced by the polycrystalline silicon as a raw material can be improved.
也可能該清潔台進一步包含連通該等吸氣孔與該等供應孔之間的連通途徑;供應該清潔空氣至該工作空間的吹風器;及自該吹風器所供應的清潔空氣除去粒子的過濾器,其中該過濾器及吹風器係被提供在該連通途徑中。It is also possible that the cleaning station further comprises a communication path connecting the suction holes and the supply holes; a blower supplying the clean air to the work space; and filtering of particles removed from the clean air supplied by the blower The filter and the blower are provided in the communication path.
在此情形中,經過該吸氣孔所吸取的空氣係透過該過濾器純化且透過該供應孔被該吹風器傳送至該加工台,藉以循環該空氣。因此,該工作台上側可保持相當清潔。In this case, the air sucked through the suction hole is purified through the filter and transmitted to the processing station through the supply hole through the supply hole, thereby circulating the air. Therefore, the upper side of the table can be kept quite clean.
也可能該過濾器包含:被設置於該吹風器的上游側用於除去具有大於預定大小之直徑的粒子之第一過濾器;及被設置於該吹風器的下游側用於除去通過該第一過濾器的粒子之第二過濾器。It is also possible that the filter comprises: a first filter disposed on an upstream side of the blower for removing particles having a diameter greater than a predetermined size; and a downstream side disposed on the blower for removing the first pass The second filter of the particles of the filter.
在此,若該粒子,其隨著被吸至該吸氣孔的空氣一起自該工作台上側被除去,直接進入該吹風器,其可能阻礙該吹風器的驅動。在本發明中,無論如何,該除去粒子的 過濾器係被提供至連通該吸氣孔與該吹風器之間的連通途徑。由此,因為該粒子可自被傳送至該吹風器的空氣完全被該除去粒子的過濾器除去,其並不會阻礙該吹風器的驅動。再者,透過該高效過濾器將自該吹風器傳送的空氣導引至該供應孔,且由此非常清潔的空氣可被供應至該工作台上側。Here, if the particles are removed from the upper side of the table along with the air sucked into the suction holes, they directly enter the blower, which may hinder the driving of the blower. In the present invention, in any case, the particle-removing A filter is provided to communicate the communication between the suction port and the blower. Thus, because the particles are completely removed from the airborne filter by the air delivered to the blower, it does not impede the drive of the blower. Furthermore, the air delivered from the blower is guided to the supply hole through the high efficiency filter, and thus the very clean air can be supplied to the upper side of the table.
本發明之製造單晶矽原料的方法包括:經由與包括氯矽烷氣體及氫氣之原料氣體的反應沈積柱狀多晶矽;將該柱狀多晶矽壓碎為多個多晶矽小塊或將該柱狀多晶矽切成具有預定長度的棒狀多晶矽;利用酸清洗該多晶矽以除去黏附於其表面的雜質;將該經清洗的多晶矽浸入純水浴中以自其表面除去殘留的酸;藉由放在乾燥器中乾燥自該純水浴取出的多晶矽;及自已經乾燥的多晶矽表面除去靜電而清潔該多晶矽,其中,在該清潔程序中,該多晶矽係在上述清潔台的工作台上藉由暴露於該清潔空氣而被清潔。The method for producing a single crystal germanium raw material of the present invention comprises: depositing a columnar polycrystalline silicon by reaction with a raw material gas including a chlorodecane gas and hydrogen; crushing the columnar polycrystalline silicon into a plurality of polycrystalline tantalum small pieces or cutting the columnar polycrystalline tantalum Forming a rod-shaped polycrystalline crucible having a predetermined length; cleaning the polycrystalline crucible with an acid to remove impurities adhering to the surface thereof; immersing the washed polycrystalline crucible in a pure water bath to remove residual acid from the surface thereof; drying in a desiccator a polycrystalline germanium taken out from the pure water bath; and the polycrystalline germanium is cleaned by removing static electricity from the surface of the dried polycrystalline crucible, wherein in the cleaning process, the polycrystalline germanium is exposed on the work surface of the cleaning station by exposure to the clean air clean.
本發明之製造單晶矽原料之方法包括:經由與包括氯矽烷氣體及氫氣之原料氣體的反應沈積柱狀多晶矽;將該柱狀多晶矽壓碎為多個多晶矽小塊或將該柱狀多晶矽切成具有預定長度的棒狀多晶矽;利用酸清洗該多晶矽以除去黏附於其表面的雜質;將該經清洗的多晶矽浸入純水浴中以自該多晶矽表面除去殘留的酸;藉由放在乾燥器中乾燥自該純水浴取出的多晶矽;及自已經乾燥的多晶矽表面除去靜電而清潔該多晶矽,其中,在該清潔程序中,該多晶矽係暴露於清潔空氣以除去靜電,即藉由將該多晶矽放在 工作台上同時朝該多晶矽供應經游離的清潔空氣且將該清潔空氣排至該工作台側邊。The method for producing a single crystal germanium raw material according to the present invention comprises: depositing a columnar polycrystalline silicon through reaction with a raw material gas including a chlorodecane gas and hydrogen; crushing the columnar polycrystalline silicon into a plurality of polycrystalline tantalum small pieces or cutting the columnar polycrystalline tantalum Forming a rod-shaped polycrystalline crucible having a predetermined length; cleaning the polycrystalline crucible with an acid to remove impurities adhering to the surface thereof; immersing the washed polycrystalline crucible in a pure water bath to remove residual acid from the surface of the polycrystalline crucible; by placing in a desiccator Drying the polycrystalline germanium removed from the pure water bath; and cleaning the polycrystalline germanium from the surface of the dried polycrystalline germanium, wherein the polycrystalline germanium is exposed to clean air to remove static electricity during the cleaning process, ie by placing the polycrystalline germanium At the same time, the cleaned air is supplied to the polysilicon at the same time and the clean air is discharged to the side of the table.
根據上述製造單晶矽原料的方法,可藉由經游離的清潔空氣自該多晶矽表面除去粒子。由此,可將該多晶矽的品質改善為單晶矽的原料。According to the above method of producing a single crystal germanium raw material, particles can be removed from the surface of the polycrystalline silicon by free clean air. Thereby, the quality of the polycrystalline silicon can be improved to a raw material of single crystal germanium.
本發明的具體例現在將參照圖形予以描述。Specific examples of the invention will now be described with reference to the drawings.
第1圖為根據本發明之例示具體例的清潔台單元正視圖,且第2圖為例示該清潔台單元中的空氣流動之側面斷面圖。如第1圖所示的清潔台單元30包括兩個肩並肩提供的清潔台1,其具有相互對稱提供於彼內的組成零件。各個清潔台1概要地包括工作台2,其上面提供工作空間3,及箱子(箱形部分)4。該箱子4包括被配置於該工作台2及該工作空間3(在第2圖的右側上)之側面的側板8a、相對於該二清潔台1相互毗鄰的情形配置的側板8b,及覆蓋該等側板8a及8b之上側的頂板16。1 is a front elevational view of a cleaning station unit according to an exemplary embodiment of the present invention, and FIG. 2 is a side cross-sectional view illustrating air flow in the cleaning station unit. The cleaning table unit 30 as shown in Fig. 1 includes two cleaning stations 1 provided side by side, which have constituent parts that are symmetrically provided in each other. Each of the cleaning stations 1 schematically includes a work table 2 on which a work space 3 and a box (box portion) 4 are provided. The case 4 includes a side plate 8a disposed on a side surface of the work table 2 and the work space 3 (on the right side of FIG. 2), and a side plate 8b disposed adjacent to the two cleaning tables 1, and covering the same The top plate 16 on the upper side of the side plates 8a and 8b.
該工作台2包括水平提供且具有預定高度的工作區2a。作業員根據大小及品質自正面(第2圖的左側)伸進去挑選該工作區2a上的多晶矽。再者,提供工作台連通途徑5以允許該工作表面2a與接近該箱子4之側板8a的工作台2之連通下側表面2b。該工作台連通途徑5開在該工作表面2a的一部分上,且該開啟部分為工作台吸氣孔2c。藉由網覆蓋該工作台吸氣孔2c。The work table 2 includes a work area 2a that is horizontally provided and has a predetermined height. The operator extends in from the front (the left side of Fig. 2) according to the size and quality to select the polysilicon on the work area 2a. Further, a table communication path 5 is provided to allow the work surface 2a to communicate with the lower side surface 2b of the table 2 close to the side plate 8a of the case 4. The table communication path 5 is opened on a portion of the work surface 2a, and the opening portion is a table suction hole 2c. The table suction hole 2c is covered by the net.
該箱子4,如上所述,包括環繞該工作台2及工作空間3側面的側板8a及8b,及從頂部覆蓋該側板8a及8b的頂板16。將該箱子4形成為內部中空的。該箱子4利用與該工作台2之兩個側面平行的側板8a及8b依垂直方向延伸。此外,該箱子4,如第2圖所示,包括垂直延伸部分4a,其中吹風器11(述於後文)係配置於其上方內側部分中,及配置在該垂直延伸部分4a上方以經由該頂板16自頂部覆蓋該工作空間3的上延伸部分4b。The case 4, as described above, includes side plates 8a and 8b surrounding the table 2 and the side of the work space 3, and a top plate 16 covering the side plates 8a and 8b from the top. The case 4 is formed to be hollow inside. The case 4 extends in the vertical direction by side plates 8a and 8b parallel to the two side faces of the table 2. Further, the case 4, as shown in Fig. 2, includes a vertically extending portion 4a in which a blower 11 (described later) is disposed in an upper inner portion thereof and disposed above the vertically extending portion 4a to pass therethrough The top plate 16 covers the upper extension portion 4b of the work space 3 from the top.
在該工作台2後面之側板8a的垂直延伸部分4a內部,如第2圖所示,為上下延伸的連通途徑7。在該工作台2之下側表面2b及該側板8a下部中形成連接部分9以連通該連通途徑7與該工作台連通途徑5。再者,將吸氣孔10a形成在該垂直延伸部分4a之側板8a中的工作台2上側周圍,且使該工作空間3與該連通途徑7連通。而且,將吸氣孔10b形成在面朝該清潔台單元30側面之側板8b中的工作台2上側周圍,且使該工作空間3與該連通途徑7連通。Inside the vertically extending portion 4a of the side plate 8a behind the table 2, as shown in Fig. 2, is a communication path 7 extending up and down. A connecting portion 9 is formed in the lower side surface 2b of the table 2 and the lower portion of the side plate 8a to communicate the communication path 7 with the table communication path 5. Further, the suction hole 10a is formed around the upper side of the table 2 in the side plate 8a of the vertically extending portion 4a, and the working space 3 is communicated with the communication path 7. Further, the suction hole 10b is formed around the upper side of the table 2 in the side plate 8b facing the side of the cleaning table unit 30, and the working space 3 is communicated with the communication path 7.
將該垂直延伸部分4a之上方內側部分中所提供的吹風器11配置成與分開該垂直延伸部分4a與該上延伸部分4b的隔壁12接觸。該吹風器11在該垂直延伸部分4a之連通途徑7中吸取空氣且傳送該空氣至該上延伸部分4b。此外,在該連通途徑7中之吹風器11與該等吸氣孔10a、10b之間(該吹風器11的上游側)提供除去粒子的過濾器(第一過濾器)13。將透過該等吸氣孔10a、10b及該工作台吸氣孔2c所吸取的空氣經過該除去粒子的過濾器13傳送至該 吹風器11。該除去粒子的過濾器13可,例如,除去具有約10 μm或更大之直徑的粒子。The hair dryer 11 provided in the upper inner portion of the vertically extending portion 4a is disposed in contact with the partition wall 12 separating the vertically extending portion 4a from the upper extending portion 4b. The blower 11 draws air in the communication path 7 of the vertically extending portion 4a and conveys the air to the upper extension portion 4b. Further, a filter (first filter) 13 for removing particles is provided between the blower 11 in the communication path 7 and the suction holes 10a, 10b (the upstream side of the blower 11). The air sucked through the suction holes 10a, 10b and the table suction hole 2c is sent to the filter through the particle removing filter 13 Hair dryer 11. The particle-removing filter 13 can, for example, remove particles having a diameter of about 10 μm or more.
經由該隔壁12將該上延伸部分4b與該垂直延伸部分4a形成為單獨本體。在該隔壁12下與該隔壁12下部相距預定距離(該吹風器11的下游側)之上延伸部分4b中提供具有平板形的高效過濾器(第二過濾器)15。在本具體例中,該高效過濾器15係由可大舉除去通過的空氣中所包括之粒子(具有,例如,0.3 μm或更大之直徑範圍)的HEPA過濾器構成以獲得約100%的清潔度。經過該吹風器11傳送至該上延伸部分4b中的空氣經過該高效過濾器15變成清潔空氣。The upper extension portion 4b and the vertically extending portion 4a are formed as separate bodies via the partition wall 12. A high-efficiency filter (second filter) 15 having a flat plate shape is provided in the extending portion 4b above the partition wall 12 at a predetermined distance from the lower portion of the partition wall 12 (the downstream side of the blower 11). In the present embodiment, the high-efficiency filter 15 is constituted by a HEPA filter which can largely remove particles included in the passing air (having, for example, a diameter range of 0.3 μm or more) to obtain about 100% of cleaning. degree. The air sent to the upper extension portion 4b through the blower 11 passes through the high efficiency filter 15 to become clean air.
將多個孔提供於該上延伸部分之頂板16中以覆蓋該工作空間3。該多個孔為供應清潔空氣至該工作空間3的供應孔16a。將通過該高效過濾器15的空氣透過該頂板16的多個供應孔16a均勻供應至末端的工作空間3下部。在該頂板16下側(該工作空間3的一側)上提供多個照明器17(在本具體例中4個),例如螢光燈。在規律間隔下依水平方向配置該照明器17以照亮該工作台2的整個工作表面2a。A plurality of holes are provided in the top plate 16 of the upper extension to cover the work space 3. The plurality of holes are supply holes 16a for supplying clean air to the work space 3. The air passing through the high efficiency filter 15 is uniformly supplied to the lower portion of the working space 3 at the end through the plurality of supply holes 16a of the top plate 16. A plurality of illuminators 17 (four in this embodiment), such as fluorescent lamps, are provided on the lower side of the top plate 16 (on one side of the working space 3). The illuminator 17 is arranged in a horizontal direction at regular intervals to illuminate the entire working surface 2a of the table 2.
在該頂板16下側(該工作空間3之一側)上提供游離器20同時配置多個照明器17。在該游離器20上提供多個噴嘴20a(在本具體例中8個)且面朝下。該游離器20藉由透過該等噴嘴20a所供應的電暈放電等用於將一部分清潔空氣游離化為正性或負性,該空氣經過該頂板16的供應孔16a被供應至該工作空間3。該游離器20可為不同類型的傳統游離 器,除了電暈放電以外該游離器可藉由各種不同的方法,例如使用UV射線、輕X射線及輻射材料將清潔空氣游離化。A freezer 20 is provided on the lower side of the top plate 16 (one side of the working space 3) while a plurality of illuminators 17 are disposed. A plurality of nozzles 20a (eight in this specific example) are provided on the freezer 20 and face down. The freezer 20 is used to dissipate a part of the clean air into positive or negative by a corona discharge or the like supplied through the nozzles 20a, and the air is supplied to the working space 3 through the supply hole 16a of the top plate 16. . The free device 20 can be a different type of conventional free In addition to corona discharge, the freezer can free clean air by a variety of different methods, such as using UV rays, light X-rays, and radiant materials.
其後,將描述使用上述清潔台單元30製備用於單晶矽材料的多晶矽之方法。Hereinafter, a method of preparing a polycrystalline germanium for a single crystal germanium material using the above-described cleaning stage unit 30 will be described.
該方法包括經由與包括氯矽烷氣體及氫氣之原料氣體的反應沈積柱狀多晶矽;將該柱狀多晶矽壓碎為多個多晶矽小塊或將該柱狀多晶矽切成具有預定長度的棒狀多晶矽;利用酸清洗該多晶矽以除去黏附於其表面的雜質;將該經清洗的多晶矽浸入純水浴中以自其表面除去殘留的酸;藉由放在乾燥器中乾燥自該純水浴取出的多晶矽;自已經乾燥的多晶矽表面除去靜電而清潔該多晶矽;及包裝該多晶矽以供運送至製造單晶矽的工廠。The method includes depositing a columnar polycrystalline silicon by reaction with a raw material gas including a chlorodecane gas and hydrogen; crushing the columnar polycrystalline silicon into a plurality of polycrystalline tantalum pieces or cutting the columnar polycrystalline silicon into a rod-shaped polycrystalline crucible having a predetermined length; The polycrystalline silicon is washed with an acid to remove impurities adhering to the surface thereof; the washed polycrystalline silicon is immersed in a pure water bath to remove residual acid from the surface thereof; and the polycrystalline germanium taken out from the pure water bath is dried by being placed in a desiccator; The dried polycrystalline germanium surface is cleaned of static electricity to clean the polycrystalline germanium; and the polycrystalline germanium is packaged for transport to a factory that manufactures single crystal germanium.
首先,在該矽沈積程序中,根據所謂的西門子法(Siemens process),如第3圖所示,將反應器40中所配置的矽晶種棒41加熱,例如,藉由電流加熱,至高溫。接著,經過原料氣體供應管42將原料氣體供應至該反應器40內與該矽晶種棒41接觸,藉以經由還原反應沈積多晶矽R以在該矽晶種棒41周圍形成柱狀物。該反應器40中剩餘的氣體經由氣體排放管43排至外界。First, in the crucible deposition process, according to the so-called Siemens process, as shown in Fig. 3, the twin seeding rod 41 disposed in the reactor 40 is heated, for example, by current heating to high temperature. . Next, the material gas is supplied into the reactor 40 through the raw material gas supply pipe 42 to be in contact with the twin seeding rod 41, whereby the polycrystalline silicon R is deposited via a reduction reaction to form a pillar around the twin seeding rod 41. The gas remaining in the reactor 40 is discharged to the outside via the gas discharge pipe 43.
在壓碎程序中,藉由熱衝擊,例如,加熱及快速冷卻,壓碎該矽沈積程序中所製造的柱狀多晶矽R。然後,藉由鎚子敲擊該柱狀多晶矽R以便壓碎,藉以形成第4圖所示之多晶矽的小塊C。In the crushing process, the columnar polycrystalline silicon R produced in the crucible deposition process is crushed by thermal shock, for example, heating and rapid cooling. Then, the columnar polycrystalline silicon R is tapped by a hammer to be crushed, thereby forming a small block C of the polycrystalline silicon shown in Fig. 4.
在切削程序中,使用鑽石切割器將該柱狀多晶矽R切成預定長度,藉以形成棒狀多晶矽C。In the cutting process, the columnar polycrystalline crucible R is cut into a predetermined length using a diamond cutter to form a rod-shaped polycrystalline crucible C.
在清潔程序中,使用包括硝酸及氫氟酸的清潔溶液清潔呈棒狀的多晶矽小塊以除去黏附於其表面的雜質。在浸漬程序中,將已經完全被清潔的多晶矽浸入純水浴中以除去剩餘的酸。In the cleaning procedure, a rod-shaped polycrystalline crucible is cleaned using a cleaning solution including nitric acid and hydrofluoric acid to remove impurities adhering to the surface thereof. In the impregnation procedure, the polysilicon that has been completely cleaned is immersed in a pure water bath to remove the remaining acid.
在乾燥程序中,將已經浸漬過的多晶矽放在真空乾燥器中以自其表面除去水分。In the drying procedure, the already impregnated polycrystalline germanium is placed in a vacuum desiccator to remove moisture from its surface.
在清潔程序中,使用上述清潔台單元30使該多晶矽與游離化清潔空氣接觸自該多晶矽表面除去粒子。首先,將該多晶矽放在該清潔台1之工作台2上。接著,當自該工作台2供應游離化清潔空氣時,自該工作台2一側吸取空氣然後排放。因此,該多晶矽及該工作台2的表面係暴露於清潔空氣以除去靜電,所以粒子與空氣流動一起排放。In the cleaning procedure, the polysilicon is contacted with the free clean air to remove particles from the surface of the polysilicon using the cleaning station unit 30 described above. First, the polysilicon is placed on the table 2 of the cleaning station 1. Next, when the cleaned air is supplied from the table 2, air is taken from the side of the table 2 and then discharged. Therefore, the surface of the polysilicon and the stage 2 is exposed to clean air to remove static electricity, so the particles are discharged together with the air flow.
下文中以多晶矽的小塊C描述清潔程序。如第5圖所示,將聚乙烯薄片52舖在聚乙烯碟51上,且將多個多晶矽小塊C放在該薄片52上。將該碟51放在該清潔台1之工作台2上且自該清潔台1上方供應游離化清潔空氣。在此狀況下,檢查個別多晶矽小塊C的大小或外觀而挑選且放在聚乙烯包裝袋53中。The cleaning procedure is described below in the small block C of polycrystalline germanium. As shown in Fig. 5, a polyethylene sheet 52 is laid on the polyethylene dish 51, and a plurality of polycrystalline crumbs C are placed on the sheet 52. The dish 51 is placed on the table 2 of the cleaning station 1 and free clean air is supplied from above the cleaning table 1. In this case, the size or appearance of the individual polycrystalline crumbs C is checked and selected and placed in the polyethylene package 53.
在根據本具體例之清潔台單元30的清潔台1中,該吹風器11經過高效過濾器15供應該清潔空氣至該工作空間3。將透過被提供到該工作空間3下部及該工作台吸氣孔2c中之吸氣孔10a、10b所吸取的空氣經過該工作台連通途 徑5及連通途徑7傳送至該吹風器11,藉以執行空氣循環。由此,被供應至該工作空間3的空氣由於配置於該工作空間3之前的高效過濾器15而具有約100%的清潔度,且由此可將該工作空間3保持得非常清潔。因此,所挑選的多晶矽總是在清潔環境中以致不會與雜質混合以保持高純度。因此,可預防使用作為原料的多晶矽所製造之單晶矽品質變差。In the cleaning table 1 of the cleaning table unit 30 according to the present specific example, the hair dryer 11 supplies the cleaning air to the work space 3 via the high efficiency filter 15. The air sucked through the suction holes 10a, 10b provided to the lower portion of the working space 3 and the suction opening 2c of the table passes through the table. The path 5 and the communication path 7 are transmitted to the blower 11 to perform air circulation. Thereby, the air supplied to the work space 3 has a cleanliness of about 100% due to the high efficiency filter 15 disposed before the work space 3, and thus the work space 3 can be kept very clean. Therefore, the selected polycrystalline germanium is always in a clean environment so as not to be mixed with impurities to maintain high purity. Therefore, it is possible to prevent deterioration of the quality of the single crystal crucible produced by using polycrystalline germanium as a raw material.
在本具體例中,藉由配置在該頂板16下側(該工作空間3之一側)上的游離器20將透過該供應孔16a所供應的清潔空氣部分游離化。該清潔空氣包括正及負離子,且由此若該粒子帶電以該多晶矽粒子的靜電電性中和該正及負離子,藉以除去靜電。靜電被除去的粒子將喪失黏附力。因此,該粒子不會黏附於該多晶矽且會被該清潔空氣流動吸至該等吸氣孔10a、10b或該工作台吸氣孔2c。結果,該粒子係自該工作台2的表面及該工作空間3被除去。如上所述,由於靜電自該粒子被除去以致該粒子可自該工作台2輕易被消除。因此,由作為原料之多晶矽所製造的單晶矽可保持其高品質。In this embodiment, the clean air supplied through the supply hole 16a is partially dissipated by the freezer 20 disposed on the lower side of the top plate 16 (one side of the working space 3). The clean air includes positive and negative ions, and thereby the static electricity is neutralized if the particles are charged to neutralize the positive and negative ions by the electrostatic properties of the polycrystalline silicon particles. Particles that are removed by static electricity will lose adhesion. Therefore, the particles do not adhere to the polysilicon and are sucked by the clean air to the suction holes 10a, 10b or the table suction holes 2c. As a result, the particles are removed from the surface of the table 2 and the working space 3. As described above, since the static electricity is removed from the particles, the particles can be easily eliminated from the stage 2. Therefore, the single crystal germanium produced from the polycrystalline silicon as a raw material can maintain its high quality.
若該多晶矽粒子,其係自該工作台2的表面及該工作空間3與被吸至該等吸氣孔10a、10b或該工作台吸氣孔2c的空氣一起被除去,直接進入該吹風器11,該吹風器11可能無法適當被驅動。在本具體例中,無論如何,將除去粒子的過濾器13提供在該連通途徑7的吸氣孔10a、10b與該吹風器11之間。由此,該粒子可自被該除去粒子的過濾器 13傳送至該吹風器11的空氣完全被除去。結果,該吹風器11可適當地被驅動而沒有麻煩,且空氣可重複地循環。If the polycrystalline silicon particles are removed from the surface of the table 2 and the working space 3 together with the air sucked into the suction holes 10a, 10b or the table suction holes 2c, directly enter the hair dryer 11. The blower 11 may not be properly driven. In this specific example, the filter 13 for removing particles is provided between the suction holes 10a, 10b of the communication path 7 and the blower 11 in any case. Thereby, the particles can be self-filtered by the particles The air delivered to the blower 11 is completely removed. As a result, the hair dryer 11 can be appropriately driven without trouble, and the air can be repeatedly circulated.
在包裝程序中,將該多晶矽,藉此純化,包裝在被傳送至製造單晶矽的工廠之聚乙烯袋中。將此多晶矽提供作為單晶矽的原料。如上所述,該多晶矽表面已經藉由該清潔程序在該清潔台中純化,且由此可製造高品質單晶矽。In the packaging process, the polycrystalline crucible is thereby purified and packaged in a polyethylene bag that is transferred to a factory that manufactures single crystal crucibles. This polycrystalline germanium is supplied as a raw material of single crystal germanium. As described above, the polycrystalline silicon surface has been purified in the cleaning station by the cleaning procedure, and thereby high quality single crystal germanium can be produced.
儘管上文已經描述運用根據本發明之一具體例的清洗台1之清潔台單元30,但是本發明並不限於此。很顯然熟悉此技藝者可在本發明的範圍以內完成不同的修飾及變更。Although the cleaning station unit 30 using the cleaning station 1 according to an embodiment of the present invention has been described above, the present invention is not limited thereto. It is apparent to those skilled in the art that various modifications and changes can be made within the scope of the invention.
儘管該等具體例已經配合清潔多晶矽小塊而例示,但是根據本發明之作為單晶矽原料的多晶矽可任意將柱狀多晶矽壓碎為多晶矽小塊或將其切成具有預定長度的棒狀多晶矽而製備。有關棒狀多晶矽,在該清潔程序中,例如,可將棒子逐個放在該薄片52上檢查外觀同時暴露於清潔空氣,然後逐個放入包裝袋中。Although the specific examples have been exemplified in connection with cleaning the small pieces of polycrystalline silicon, the polycrystalline silicon as the raw material of the single crystal germanium according to the present invention can optionally crush the columnar polycrystalline silicon into small pieces of polycrystalline silicon or cut into rod-shaped polycrystalline silicon having a predetermined length. And prepared. Regarding the rod-shaped polysilicon, in the cleaning procedure, for example, the rods may be placed one by one on the sheet 52 to check the appearance while being exposed to the clean air, and then placed one by one in the package.
儘管本發明的具體例已經在上文中描述且例示,但是應該了解的是這些為本發明的示範且不得認為限制。增加、刪除、取代及其他修飾可被完成而不會悖離本發明的精神或範圍。因此,不得認為本發明受到前述說明所限制,且僅受到後附申請專利範圍的範圍所限制。Although specific examples of the invention have been described and illustrated in the foregoing, it should be understood that these are exemplary of the invention and are not considered as limiting. Additions, deletions, substitutions, and other modifications may be made without departing from the spirit or scope of the invention. Therefore, the invention is not to be considered as limited by the foregoing description, and is only limited by the scope of the appended claims.
1‧‧‧清潔台1‧‧‧cleaning station
2‧‧‧工作台2‧‧‧Workbench
2a‧‧‧工作區2a‧‧‧Workspace
2b‧‧‧下側表面2b‧‧‧lower surface
2c‧‧‧工作台吸氣孔2c‧‧‧Worktop suction hole
3‧‧‧工作空間3‧‧‧Workspace
4‧‧‧箱子4‧‧‧ box
4a‧‧‧垂直延伸部分4a‧‧‧ Vertical extension
4b‧‧‧上延伸部分4b‧‧‧Upper extension
5‧‧‧工作台連通途徑5‧‧‧Workbench connectivity
7‧‧‧連通途徑7‧‧‧Connected pathways
8a‧‧‧側板8a‧‧‧ side panels
8b‧‧‧側板8b‧‧‧ side panels
9‧‧‧連接部分9‧‧‧Connected section
10a‧‧‧吸氣孔10a‧‧‧ suction holes
10b‧‧‧吸氣孔10b‧‧‧ suction holes
11‧‧‧吹風器11‧‧‧Blowers
12‧‧‧隔壁12‧‧‧ next door
13‧‧‧除去粒子的過濾器13‧‧‧ Filters to remove particles
15‧‧‧高效過濾器15‧‧‧High efficiency filter
16‧‧‧頂板16‧‧‧ top board
16a‧‧‧供應孔16a‧‧‧Supply hole
17‧‧‧照明器17‧‧‧ illuminators
20‧‧‧游離器20‧‧‧ Freezer
20a‧‧‧噴嘴20a‧‧‧Nozzles
30‧‧‧清潔台單元30‧‧‧ cleaning station unit
40‧‧‧反應器40‧‧‧Reactor
41‧‧‧矽晶種棒41‧‧‧矽晶棒
42‧‧‧原料氣體供應管42‧‧‧Material gas supply pipe
43‧‧‧氣體排放管43‧‧‧ gas discharge pipe
51‧‧‧聚乙烯碟51‧‧‧polyethylene dish
52‧‧‧聚乙烯薄片52‧‧‧Polyethylene sheet
53‧‧‧聚乙烯包裝袋53‧‧‧Polyethylene bags
R‧‧‧多晶矽R‧‧‧ Polysilicon
C‧‧‧多晶矽小塊C‧‧‧polycrystalline small pieces
第1圖為根據本發明之具體例的清潔台概略構形。Fig. 1 is a schematic configuration of a cleaning station according to a specific example of the present invention.
第2圖為例示根據本發明之例示具體例的清潔台單元中的空氣流動之側面斷面圖。Fig. 2 is a side sectional view showing the flow of air in the cleaning table unit according to an exemplary embodiment of the present invention.
第3圖為例示製造單晶矽原料時用於沈積程序的反應器之概略斷面圖。Fig. 3 is a schematic cross-sectional view showing a reactor for a deposition process when a single crystal germanium raw material is produced.
第4圖為例示被壓碎為小塊自該反應器取出的棒狀多晶矽正面圖。Fig. 4 is a front view showing a rod-shaped polycrystalline crucible taken out from the reactor by being crushed into small pieces.
第5圖為例示在第1圖之清潔台的工作台上清潔多晶矽小塊的範例圖。Fig. 5 is a view showing an example of cleaning a polycrystalline crucible on the stage of the cleaning station of Fig. 1.
1‧‧‧清潔台1‧‧‧cleaning station
2‧‧‧工作台2‧‧‧Workbench
2a‧‧‧工作區2a‧‧‧Workspace
2b‧‧‧下側表面2b‧‧‧lower surface
2c‧‧‧工作台吸氣孔2c‧‧‧Worktop suction hole
3‧‧‧工作空間3‧‧‧Workspace
4‧‧‧箱子4‧‧‧ box
4a‧‧‧垂直延伸部分4a‧‧‧ Vertical extension
4b‧‧‧上延伸部分4b‧‧‧Upper extension
5‧‧‧工作台連通途徑5‧‧‧Workbench connectivity
7‧‧‧連通途徑7‧‧‧Connected pathways
8a‧‧‧側板8a‧‧‧ side panels
8b‧‧‧側板8b‧‧‧ side panels
9‧‧‧連接部分9‧‧‧Connected section
10a‧‧‧吸氣孔10a‧‧‧ suction holes
10b‧‧‧吸氣孔10b‧‧‧ suction holes
11‧‧‧吹風器11‧‧‧Blowers
12‧‧‧隔壁12‧‧‧ next door
13‧‧‧除去粒子的過濾器13‧‧‧ Filters to remove particles
15‧‧‧高效過濾器15‧‧‧High efficiency filter
16‧‧‧頂板16‧‧‧ top board
16a‧‧‧供應孔16a‧‧‧Supply hole
17‧‧‧照明器17‧‧‧ illuminators
20‧‧‧游離器20‧‧‧ Freezer
20a‧‧‧噴嘴20a‧‧‧Nozzles
30‧‧‧清潔台單元30‧‧‧ cleaning station unit
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2007229211 | 2007-09-04 | ||
JP2008168497A JP4941415B2 (en) | 2007-09-04 | 2008-06-27 | Clean bench |
Publications (2)
Publication Number | Publication Date |
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TW200918694A TW200918694A (en) | 2009-05-01 |
TWI422717B true TWI422717B (en) | 2014-01-11 |
Family
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TW097133745A TWI422717B (en) | 2007-09-04 | 2008-09-03 | Clean bench and method of producing raw material for single crystal silicon |
Country Status (4)
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JP (1) | JP4941415B2 (en) |
KR (1) | KR101424288B1 (en) |
CN (2) | CN101385986B (en) |
TW (1) | TWI422717B (en) |
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DE102010040836A1 (en) * | 2010-09-15 | 2012-03-15 | Wacker Chemie Ag | Process for producing thin silicon rods |
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CN102864952B (en) * | 2012-09-26 | 2014-12-31 | 深圳市华星光电技术有限公司 | Clean room and cleaning units thereof |
CN103050381A (en) * | 2012-12-26 | 2013-04-17 | 镇江市港南电子有限公司 | Airflow flushing method of wafer |
CN104525287B (en) * | 2013-04-08 | 2016-04-27 | 南通大学 | A kind of clean work station |
CN105934408A (en) * | 2014-02-14 | 2016-09-07 | 德山株式会社 | Device for producing cleaned crushed product of polycrystalline silicon blocks, and method for producing cleaned crushed product of polycrystalline silicon blocks using same |
KR101627532B1 (en) * | 2014-04-22 | 2016-06-07 | (주)동양케미칼 | a clean hood with the funtion of blocking the micro particles |
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CN104786202B (en) * | 2015-04-29 | 2016-03-30 | 成都蒲江珂贤科技有限公司 | The multiplex electrician's workbench of antistatic |
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JP2017213493A (en) * | 2016-05-31 | 2017-12-07 | ヤマト科学株式会社 | Low airflow draft chamber |
DE102017208329A1 (en) * | 2017-05-17 | 2018-11-22 | Ejot Gmbh & Co. Kg | Non-contact cleaning device |
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KR102322492B1 (en) * | 2019-12-31 | 2021-11-08 | 주식회사 유라코퍼레이션 | Particle removal device and clean bench including the same |
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CN116328452B (en) * | 2023-05-29 | 2023-08-08 | 通威微电子有限公司 | Purifying and dedusting equipment |
CN116899311B (en) * | 2023-09-12 | 2023-12-01 | 山西广宇化工新材料科技有限公司 | Sewage prefilter and filtering method |
KR102715132B1 (en) * | 2024-03-05 | 2024-10-07 | 권석 | Workbench for PCB mounting |
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- 2008-09-02 CN CN201310248647.1A patent/CN103341368B/en active Active
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Also Published As
Publication number | Publication date |
---|---|
TW200918694A (en) | 2009-05-01 |
CN101385986B (en) | 2013-07-24 |
CN103341368B (en) | 2016-04-13 |
KR101424288B1 (en) | 2014-07-31 |
JP2009078961A (en) | 2009-04-16 |
CN103341368A (en) | 2013-10-09 |
CN101385986A (en) | 2009-03-18 |
KR20090024632A (en) | 2009-03-09 |
JP4941415B2 (en) | 2012-05-30 |
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