TW543043B - Zinc oxide varistor and method of manufacturing same - Google Patents
Zinc oxide varistor and method of manufacturing same Download PDFInfo
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- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 title claims abstract description 146
- 239000011787 zinc oxide Substances 0.000 title claims abstract description 72
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 42
- 238000000034 method Methods 0.000 claims abstract description 98
- 238000007747 plating Methods 0.000 claims abstract description 49
- 150000003752 zinc compounds Chemical class 0.000 claims abstract description 16
- 239000002253 acid Substances 0.000 claims abstract description 12
- 239000003513 alkali Substances 0.000 claims abstract description 8
- 230000001376 precipitating effect Effects 0.000 claims abstract description 6
- 239000002244 precipitate Substances 0.000 claims abstract description 3
- 150000001875 compounds Chemical class 0.000 claims description 63
- 238000001556 precipitation Methods 0.000 claims description 54
- 238000010304 firing Methods 0.000 claims description 33
- -1 aluminum compound Chemical class 0.000 claims description 22
- 229910052782 aluminium Inorganic materials 0.000 claims description 21
- 239000000843 powder Substances 0.000 claims description 18
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 17
- 239000000203 mixture Substances 0.000 claims description 17
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Inorganic materials [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims description 17
- 239000007772 electrode material Substances 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 15
- 229910000679 solder Inorganic materials 0.000 claims description 14
- 239000002994 raw material Substances 0.000 claims description 12
- 229910052844 willemite Inorganic materials 0.000 claims description 12
- 229910018557 Si O Inorganic materials 0.000 claims description 11
- 150000001622 bismuth compounds Chemical class 0.000 claims description 10
- 229910052697 platinum Inorganic materials 0.000 claims description 9
- 150000003377 silicon compounds Chemical class 0.000 claims description 8
- 229910052709 silver Inorganic materials 0.000 claims description 8
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 7
- 229910052593 corundum Inorganic materials 0.000 claims description 7
- 238000000151 deposition Methods 0.000 claims description 7
- 238000009713 electroplating Methods 0.000 claims description 7
- 229910001845 yogo sapphire Inorganic materials 0.000 claims description 7
- 150000001463 antimony compounds Chemical class 0.000 claims description 6
- 229910052759 nickel Inorganic materials 0.000 claims description 6
- 229910052763 palladium Inorganic materials 0.000 claims description 6
- 229920005989 resin Polymers 0.000 claims description 6
- 239000011347 resin Substances 0.000 claims description 6
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 5
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(III) oxide Inorganic materials O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 claims description 5
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N ZrO2 Inorganic materials O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000002156 mixing Methods 0.000 claims description 3
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 239000004575 stone Substances 0.000 claims description 2
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 claims 1
- 235000010627 Phaseolus vulgaris Nutrition 0.000 claims 1
- 244000046052 Phaseolus vulgaris Species 0.000 claims 1
- 229910052776 Thorium Inorganic materials 0.000 claims 1
- 238000001354 calcination Methods 0.000 claims 1
- 241000894007 species Species 0.000 claims 1
- 238000005245 sintering Methods 0.000 abstract description 7
- 238000011049 filling Methods 0.000 description 11
- 239000011230 binding agent Substances 0.000 description 9
- 239000000126 substance Substances 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 229910052797 bismuth Inorganic materials 0.000 description 8
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 8
- 230000002079 cooperative effect Effects 0.000 description 8
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 239000002245 particle Substances 0.000 description 7
- 229910052681 coesite Inorganic materials 0.000 description 6
- 238000001816 cooling Methods 0.000 description 6
- 229910052906 cristobalite Inorganic materials 0.000 description 6
- 230000008021 deposition Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 229910052909 inorganic silicate Inorganic materials 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- 229910052682 stishovite Inorganic materials 0.000 description 6
- 229910052905 tridymite Inorganic materials 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000011701 zinc Substances 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 230000001737 promoting effect Effects 0.000 description 3
- 230000002378 acidificating effect Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- DOIRQSBPFJWKBE-UHFFFAOYSA-N dibutyl phthalate Chemical compound CCCCOC(=O)C1=CC=CC=C1C(=O)OCCCC DOIRQSBPFJWKBE-UHFFFAOYSA-N 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 229910052500 inorganic mineral Inorganic materials 0.000 description 2
- 230000009545 invasion Effects 0.000 description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 239000011707 mineral Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 229910052596 spinel Inorganic materials 0.000 description 2
- 239000011029 spinel Substances 0.000 description 2
- 239000012085 test solution Substances 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000002173 cutting fluid Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229960002380 dibutyl phthalate Drugs 0.000 description 1
- 238000007606 doctor blade method Methods 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000006193 liquid solution Substances 0.000 description 1
- 235000012054 meals Nutrition 0.000 description 1
- QQZOPKMRPOGIEB-UHFFFAOYSA-N n-butyl methyl ketone Natural products CCCCC(C)=O QQZOPKMRPOGIEB-UHFFFAOYSA-N 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N nickel(II) oxide Inorganic materials [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 238000003303 reheating Methods 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Landscapes
- Thermistors And Varistors (AREA)
- Compositions Of Oxide Ceramics (AREA)
Abstract
Description
543043543043
經濟部智慧財產局員工消費合作社印製 發明所屬之技術領域 本發明係關於一種用以吸收誘導雷突波、靜電突波、 脈衝突波(brust surge)之氧化鋅變阻器及其製造方法。 發明背景 習知之氧化鋅型變阻器係有如下者為人所知。 首先,燒結以氧化鋅為主成分之材料,製作變阻元件。 於已燒結之變阻元件表面上形成第丨外部電極。接著,將其 埋》又於以SiO為主成分之混合物,並加以熱處理。藉此, 於變阻元件之表面上形成具有耐酸性及耐鹼性之z n 2 s i 〇 4 膜。耐酸性及耐鹼性與具有耐鍍性係相同。此時,於第1 外。卩電極上亦形成有Zn2Si〇4膜而產生凹凸。因此,為消除 前述之凹凸且確實取得與外部電路之電性連接,而於第1 外部電極上形成第2外部電極。之後,再於第2外部電極上 進行鍍鎳及鍍焊料。 但,於前述之習知結構中,形成第〗外部電極後需要於 Si02中之再度熱處理程序、附著物之處理程序及形成第2 外部電極之程序。因此而具有製造程序繁複之問題。 故本發明係以提供一種於形成第丨電極後,即,燒結變 阻兀件後無須Si〇2中之再熱處理程序且於變阻元件表面 上設有ZnaSiO4之氧化鋅變阻器為目的。 發明之總結 本發明之氧化鋅變阻器之製造方法係具有·· (a)第1程序,係形成以氧化鋅為主成分之變阻元件 者;及 表、.氏張尺度適用中國國豕標準(Cns)A4規格(210 X 297公釐)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economics Technical Field The present invention relates to a zinc oxide rheostat for absorbing induced lightning surges, electrostatic surges, and pulse surges, and a method for manufacturing the same. BACKGROUND OF THE INVENTION The conventional zinc oxide type varistor is known as follows. First, a material containing zinc oxide as a main component is sintered to produce a variable resistance element. A first external electrode is formed on the surface of the sintered varistor element. Then, it was buried in a mixture containing SiO as the main component and heat-treated. Thereby, a zn 2 s i 〇 4 film having acid resistance and alkali resistance is formed on the surface of the varistor element. Acid and alkali resistance are the same as those with plating resistance. At this time, it is outside the first. A Zn2Si04 film is also formed on the hafnium electrode to cause unevenness. Therefore, a second external electrode is formed on the first external electrode in order to eliminate the aforementioned unevenness and securely obtain an electrical connection with an external circuit. After that, nickel plating and solder plating are performed on the second external electrode. However, in the aforementioned conventional structure, a second heat treatment procedure, an attachment treatment procedure, and a procedure for forming a second external electrode are required in Si02 after forming the external electrode. Therefore, there is a problem that the manufacturing process is complicated. Therefore, the present invention aims at providing a zinc oxide varistor with no ZnaSiO4 on the surface of the varistor element after the formation of the first electrode, that is, after sintering the varistor element, without the need for a reheating process in SiO2. Summary of the Invention The manufacturing method of the zinc oxide varistor of the present invention has the following procedures: (a) the first procedure is to form a varistor element with zinc oxide as the main component; and the scale of the scale is applicable to the Chinese national standard ( Cns) A4 size (210 X 297 mm)
;#11 (請先閱讀背面之注意事項再填寫本頁) · -線' -4- 543043 A7; # 11 (Please read the notes on the back before filling this page) · -line '-4- 043043 A7
543043 五、發明說明( 第4圖係-狀態圖,用以顯示本發明實施型態中添加作 為變阻兀件副成分用之鋁化合物時變阻元件粒徑與析出 膜。 發明之詳細說明 本發明之氧化鋅變阻器之製造方法係具有: (a)第1程序,係形成以氧化鋅為主成分之變阻元件 者;及 (b)第二程序,係培燒前述變阻元件,藉該培燒而燒姓 前述變阻元件,並於前述變阻元件之表面上析出形成㈣ 耐酸性及耐驗性中至少一者之鋅化合物者。 藉此,燒結變阻元件後無須再熱處理程序,而可得變 阻元件表面上具有耐酸性或耐鹼性之膜之氧化鋅變阻器。 耐酸性或耐鹼性之膜於形成電鍍之程序時具有不損傷、不 破損且更不劣化之性質。即,耐酸性或耐驗性之膜具有耐 鍍性。前述之製造方法可於焙燒時在變阻元件表面上形成 具有耐鑛性之膜。結果,可縮短製造程序。若縮短製造程 序則可提高生產性。 前述第1程序中之前述變阻元件更宜含有作副成分用 之鉍化合物及矽化合物。藉此,可藉焙燒及鉍化合物促進 元件表面析出鋅化合物膜。結果,可得具有耐鑛性之氧化 鋅型變阻器。 前述第2程序宜具有一使作鋅化合物用之Zn_Si-0系化 β物析出之知序。藉該程序及培燒而可於變阻元件内部生 成Z.Si-Ο系化合物,進而製得具有耐鍍性之氧化鋅變阻 本紙張尺度顏中_祕準((JNS)A4規格咖x 297公爱)_ ---------------------訂---------線—AW. (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 -6- 經濟部智慧財產局員工消費合作社印製 543043 A7 -------- B7 五、發明說明(4 ) 器。 前述石夕化合物宜具有換算成矽後佔lm〇p/(^l5ni〇1〇/〇 範圍内之添加量。藉此則可不妨礙燒結性,並使變阻器表 面析出具有耐鍍性之Zn-Si-Ο系化合物。 前述第2程序之焙燒溫度宜於1000。(:〜1400 °C範圍 内。藉此可得表面析出具有耐鍍性之Zn-Si-Ο系化合物且具 有所欲電氣特性之氧化鋅變阻器。 前述第1程序中,前述變阻元件更宜含有鋁化合物以作 副成分用。藉此可抑制變阻元件表面之凹凸,減少Zn-Si-〇 系化合物冬非析出部分。 前述銘化合物宜具有3mol%以下之添加量。藉此可抑 制變阻元件表面之凹凸,減少Zn-Si_〇系化合物之非析出部 分。 前述第2程序中,宜於前述鉍化合物設置在前述變阻元 件周邊之狀態下焙燒前述變阻元件。藉此,設置於變阻元 件周邊之鉍化合物將於焙燒時飛散,而於降溫過程中,部 份該飛散之鉍化合物將附著於變阻元件。因此,與變阻元 件内之鉍成分相同,可促進Zn-Si-〇系化合物往表面析出。 前述第2程序之焙燒中,宜具有一可抑制前述變阻元件 之粒成長之速度降溫之步驟。藉此可抑制變阻元件表面之 凹凸’減少Zn-Si-Ο系化合物之非析出部分。 前述石夕化合物宜使用ZnjiO4。藉此,可於焙燒時使 Zn_Si-〇系化合物效率良好地析出於變阻元件表面上。 前述第2程序宜具有將前述變阻元件收納於勒中而一 (請先閱讀背面之注意事項再填寫本頁)543043 V. Description of the invention (Figure 4 is a state diagram, used to show the particle size and precipitation film of the varistor element when an aluminum compound used as a secondary component of the varistor element is added to the embodiment of the present invention. Detailed description of the invention The manufacturing method of the invented zinc oxide varistor has: (a) the first procedure, which forms a varistor element with zinc oxide as the main component; and (b) the second procedure, which is to burn the aforementioned varistor element, by which The varistor element is fired and burned, and a zinc compound is formed on the surface of the varistor element to form at least one of acid resistance and resistance. With this, a heat treatment process is not required after sintering the varistor element. A zinc oxide varistor having an acid-resistant or alkali-resistant film on the surface of the varistor element can be obtained. The acid-resistant or alkali-resistant film has the properties of no damage, no damage and no deterioration during the process of forming electroplating. The acid-resistant or test-resistant film has plating resistance. The aforementioned manufacturing method can form a film with mineral resistance on the surface of the varistor element during firing. As a result, the manufacturing process can be shortened. If the manufacturing process is shortened, it can be improved It is more preferable that the varistor element in the first procedure contains a bismuth compound and a silicon compound as auxiliary components. Thereby, a zinc compound film can be precipitated on the surface of the element by firing and bismuth compound. As a result, it has a resistance Mineral zinc oxide varistor. The aforementioned second procedure should preferably have a known sequence of precipitation of Zn_Si-0-based β-substances used as zinc compounds. Z.Si can be generated inside the varistor element by this procedure and firing. -O-based compounds to produce zinc oxide varistors with plating resistance. This paper has a standard size of _ secret standard ((JNS) A4 size coffee x 297 public love) _ ------------ --------- Order --------- Line—AW. (Please read the notes on the back before filling out this page) Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs-6 Printed by the Consumer Cooperative of the Ministry of Intellectual Property Bureau 543043 A7 -------- B7 V. Description of the invention (4). The aforementioned Shixi compound should have lm0p / (^ l5ni〇1〇) converted to silicon. The amount is in the range of / 0. With this, the Zn-Si-O-based compound having plating resistance can be precipitated on the surface of the varistor without impeding sinterability. The aforementioned second procedure The firing temperature should be 1000. (: ~~ 1400 ° C. This can obtain a zinc oxide varistor with plating resistance of Zn-Si-O-based compounds and the desired electrical characteristics. In the aforementioned first procedure, The varistor element more preferably contains an aluminum compound as a secondary component. This can suppress unevenness on the surface of the varistor element, and reduce the winter non-precipitated portion of the Zn-Si-O-based compound. The foregoing compound should preferably have an additive amount of 3 mol% or less As a result, the unevenness on the surface of the varistor element can be suppressed, and the non-precipitated portion of the Zn-Si_〇-based compound can be reduced. In the aforementioned second procedure, it is preferable that the bismuth compound is fired in a state where the bismuth compound is disposed around the varistor element. element. Thereby, the bismuth compound disposed around the varistor element will be scattered during firing, and during the cooling process, part of the scattered bismuth compound will adhere to the varistor element. Therefore, it is the same as the bismuth component in the varistor element, which can promote the precipitation of Zn-Si-〇-based compounds to the surface. In the firing of the second step, it is preferable to have a step of reducing the temperature of the grain growth of the varistor element. As a result, the unevenness on the surface of the varistor element can be suppressed, and the non-precipitated portion of the Zn-Si-O-based compound can be reduced. The aforementioned stone compound is preferably ZnjiO4. This allows the Zn_Si-O-based compound to be efficiently deposited on the surface of the varistor element during firing. The aforementioned second procedure should preferably include the aforementioned varistor element in Lezhong (Please read the precautions on the back before filling this page)
543043 A7 -------_____ B7 五、發明說明(5 ) 面旋轉前述鞘一面焙燒之步驟。藉此,即使一次大量焙燒 變阻元件時,亦可使熱分布均勻化及焙燒環境之平均化。 結果’可防止具有耐鍍性之鋅化合物析出狀態發生不均。 宜將選自由Al2〇3、MgO、Zr02、ZnO及NiO所構成之 群中至少一種粉末與前述變阻元件一同收納於前述鞘中。 藉此可防止培燒中之變阻元件彼此發生溶融黏著。 前述第1程序宜具有一於形成前述變阻元件前將前述 主成分與副成分混合而製得混合物之步驟及一於其後暫時 培燒前述混合物之步驟。藉該步驟及,可生成欲預先生成 之鋅化合物。因此,焙燒時可使Zn-Si-Ο系化合物效率良好 地析出於變阻元件表面上。 前述第1程序中,前述變阻元件宜更含有作副成分用之 絲化合物及銻化合物;而前述第2程序則具有一析出作為前 述鋅化合物用之Zn-Sb-Ο系化合物之步驟。藉此及暫時培 燒,可於變阻元件内部生成Zn-Sb-Ο系化合物,並藉該 Zn-Sb-Ο系化合物促進變阻元件表面析出膜。結果,可得 具有耐鍍性之氧化鋅型變阻器。 前述銻化合物宜具有換算成Sb後佔lmol%〜l〇m〇i%範 圍内之添加量。録化合物之添加量換算成Sb後佔 1〜lOmol%。藉此,可不致妨礙燒結性而使變阻元件表面析 出具有耐鍍性之Zn-Sb-Ο系化合物。 前述第1程序中,前述變阻元件宜更含有鋁化合物以作 副成分用。藉此可抑制變阻元件表面之凹凸,減少Zn-Si-0 系化合物之非析出部分。 本紙張尺度適用中國國家標準(CNS)A4規格(210 x 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂---------線--- 經濟部智慧財產局員工消費合作社印製 -8- 543043 A7 B7543043 A7 -------_____ B7 V. Description of the invention (5) Rotating the sheath while rotating it. Thereby, even when a large number of varistor elements are fired at one time, the heat distribution can be made uniform and the firing environment can be averaged. As a result, it is possible to prevent unevenness in the precipitation state of the zinc compound having plating resistance. Preferably, at least one powder selected from the group consisting of Al203, MgO, Zr02, ZnO, and NiO is stored in the sheath together with the varistor element. This can prevent the varistor elements from melting and sticking to each other during baking. The aforementioned first procedure preferably includes a step of preparing the mixture by mixing the main component and the sub-component before forming the varistor element, and a step of temporarily firing the mixture after that. By this step, a zinc compound to be formed in advance can be generated. Therefore, the Zn-Si-O-based compound can be efficiently deposited on the surface of the varistor element during firing. In the aforementioned first procedure, the varistor element preferably further includes a silk compound and an antimony compound as auxiliary components, and the aforementioned second procedure includes a step of precipitating a Zn-Sb-O-based compound as the aforementioned zinc compound. With this and temporary burning, a Zn-Sb-O-based compound can be generated inside the varistor element, and the Zn-Sb-0-based compound can be used to promote the precipitation film on the surface of the varistor element. As a result, a zinc oxide type varistor having plating resistance can be obtained. The aforementioned antimony compound preferably has an added amount in the range of 1 mol% to 100% when converted to Sb. The added amount of the recorded compound converted into Sb accounts for 1 to 10 mol%. Thereby, a Zn-Sb-O-based compound having plating resistance can be deposited on the surface of the varistor element without impeding sinterability. In the first procedure, it is preferable that the varistor element further contains an aluminum compound as a secondary component. This can suppress unevenness on the surface of the varistor element and reduce non-precipitated portions of the Zn-Si-0-based compound. This paper size applies to China National Standard (CNS) A4 (210 x 297 mm) (Please read the precautions on the back before filling out this page) Order ---------- Line --- Intellectual Property of the Ministry of Economic Affairs Printed by the Bureau's Consumer Cooperatives -8-543043 A7 B7
經濟部智慧財產局員工消費合作社印製 本發明之氧化鋅變阻器之製造方法,其更宜具有: 、則述變阻疋件安裝外部電極之程序;而前述安裝外部電 5之程序則係於前述焙燒變阻元件之程序後實施。 前述安裳外部電極之程序更宜具有一設置外部電極材 科之步驟及-於前述外部電極材料之表面上以電鍍法 電鍍層之步驟。 前述電鍍層更宜係由鎳層、錫層及焊料層所構成之 中選出之至少一種者。 _形成前述變阻元件之程序更宜具有一用以形成層積變 阻凡件之步驟,該層積變阻元件係於前述變阻元件内部設 有内部電極者。 前述形成變阻元件之程序宜具有一製作多數片狀變阻 材料之步驟、一於各片狀變阻材料之表面上設置内部電極 材料之步驟及一層積設有前述各内部電極材料之前述片狀 變阻材料之步驟。 前述第1程序宜具有下列步驟,即: (i )係將主成分之ΖηΟ、副成分之由Bi2〇3、Sb203、 c〇3〇4、Mn〇2、Ni0、&2〇3及刈(1^〇3)3所構成之群中選出 之至少一種與Si〇2混合後,並調整混合物者;及 (ϋ )係將前述混合物形成為預定之形狀,以形成前述 變阻元件者;The manufacturing method for printing the zinc oxide varistor of the present invention by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs preferably includes: a procedure for installing external electrodes on the varistor element; The procedure of firing the variable resistance element is performed. The foregoing procedure of the Ansang external electrode preferably has a step of providing an external electrode material section and a step of plating a layer on the surface of the external electrode material by electroplating. The aforementioned plating layer is more preferably at least one selected from the group consisting of a nickel layer, a tin layer, and a solder layer. _ The procedure for forming the aforementioned varistor element more preferably has a step for forming a laminated varistor element which is provided with an internal electrode inside the aforementioned varistor element. The aforementioned procedure for forming a varistor element should preferably include a step of manufacturing a plurality of sheet-shaped varistor materials, a step of providing internal electrode materials on the surface of each sheet-shaped varistor material, and a layer of the aforementioned sheet on which the aforementioned internal electrode materials are stacked Step of deforming resistance material. The aforementioned first procedure should preferably have the following steps, namely: (i) is the combination of ZηO of the main component, Bi2O3, Sb203, c0304, Mn〇2, Ni0, & 2〇3 and 刈(1 ^ 〇3) at least one selected from the group consisting of 3 is mixed with SiO2, and the mixture is adjusted; and (ii) the aforementioned mixture is formed into a predetermined shape to form the aforementioned varistor element;
本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公釐) AW.-------^-----------^1 (請先閱讀背面之注意事項再填寫本頁) _ -9- 543043 A7This paper size applies to China National Standard (CNS) A4 (21〇X 297 mm) AW .------- ^ ----------- ^ 1 (Please read the note on the back first (Please fill in this page for matters) _ -9- 543043 A7
^ -------t---------線---Awl (請先閱讀背面之注意事項再填寫本頁) -10- 543043 五、發明說明(8 ) 中至少一種之步驟。 則述第2程序中’前述鋅化合物宜含有Zn_Si-〇系化合 物及Zn-Sb-Ο系化合物中之至少一種。 本發明之氧化鋅變阻器宜具有以氧化鋅為主成分之變 阻元件及形成於前述變阻元件表面上之析出膜;且前述析 出膜具有較前述變阻元件更優異之耐鹼性或耐酸性。藉 此,可於燒結後無須進行熱處理而於變阻元件表面上設置 具有耐鍍性之析出膜。 前述析出膜宜含有Zn_Si_0系化合物及Zn_Sb 〇系化合 物中至少一種。藉此可更提高耐鍍性。 前述變阻元件宜更含有鋁化合物以作副成分用。藉此 可抑制變阻元件表面之凹凸,減少Zn_si_0系化合物之非析 出部分。 “則述變阻70件宜具有設置於前述變阻元件内部之内部 電極及設置於前述變阻元件表面且與前述内部電極電性連 接之外部電極。前述内部電極更宜含有白金。藉此,可使 内部電極之收縮率縮小。更可使鋅化合物由變阻元件内部 析出。因此,析出膜形成後,無須用以使内部電極露出之 程序而可取得與外部電極之電性連接。 别述I阻元件宜具有多數之變阻材料與設置於各個前 述變阻材料内部之内部電極及設置於前述各個變阻元件表 面且與前述内部電極電性連接之外部電極。 " 則述外部電極宜具有外部電極材料及設置於前述外部 電極材料表面之電鍍層。 娜⑵。 X 297公釐) -------訂-------- • · (請先閱讀背面之注意事項再填寫本頁) •線---1 -11- 543043 經濟部智慧財產局員工消費合作社印制衣^ ------- t --------- line --- Awl (Please read the notes on the back before filling this page) -10- 543043 V. At least one of the description of the invention (8) The steps. In the second step, it is preferable that the aforementioned zinc compound contains at least one of a Zn_Si-O-based compound and a Zn-Sb-O-based compound. The zinc oxide varistor of the present invention preferably has a varistor element mainly composed of zinc oxide and a precipitation film formed on the surface of the varistor element; and the precipitation film has better alkali resistance or acid resistance than the varistor element . Thereby, it is possible to provide a deposition film having plating resistance on the surface of the varistor element without performing heat treatment after sintering. The precipitation film preferably contains at least one of a Zn_Si_0-based compound and a Zn_Sb 0-based compound. This can further improve the plating resistance. It is preferable that the varistor element further contains an aluminum compound as a secondary component. This can suppress unevenness on the surface of the varistor element and reduce non-precipitated portions of the Zn_si_0-based compound. "The 70 varistor mentioned above should preferably have an internal electrode disposed inside the varistor element and an external electrode disposed on the surface of the varistor element and electrically connected to the internal electrode. The internal electrode should preferably contain platinum. The shrinkage of the internal electrode can be reduced. The zinc compound can be precipitated from the inside of the varistor element. Therefore, after the precipitation film is formed, the electrical connection with the external electrode can be obtained without the procedure for exposing the internal electrode. The I resistive element should have a plurality of varistor materials and an internal electrode provided inside each of the varistor materials and an external electrode provided on the surface of each of the varistor elements and electrically connected to the internal electrode. &Quot; With external electrode material and plating layer on the surface of the aforementioned external electrode material. Na 。. X 297 mm) ------- Order -------- • (Please read the precautions on the back first (Fill in this page again) • Line --- 1 -11- 543043 Printing of clothing by employees ’cooperatives in the Intellectual Property Bureau of the Ministry of Economic Affairs
i -------tr---------^— (請先閱讀背面之注意事項再填寫本頁) A7 —-------B7__ 五、發明說明(9 ) " "" ^--- 、別述内部電極具有以選自由Pt、Pd及Ag所構成之群中 至^種為主成分之材料;且前述外部電極材料具有選自i ------- tr --------- ^-(Please read the precautions on the back before filling this page) A7 —------- B7__ 5. Description of the invention (9) " " " ^ ---, the other internal electrode has a material selected from the group consisting of Pt, Pd, and Ag as the main component; and the aforementioned external electrode material has a material selected from
Ag該等之合金及含有Ag之樹脂所構成之群中 至^種,别述電錢層具有下層之錄電鍵與上 鍍或錫電鍍中至少兩層。 Μ電 典型之實施例1 效將本發明之典型實施例之氧化鋅變阻器說明如下。 第1圖係作為氧化鋅變阻器之層積片狀變阻器之斷面圖。 第1圖中,以氧化鋅為主成分之變阻元件1於内部具有 以Η為主成分之内部電極3。又,變阻元件i表面上形成有 以ZgiO4為主成分之析出膜2。以Ag為主成分之外部電極 4 «又置於内α卩電極3露出之兩端面上。见層5及焊料層6係設 置於外部電極4上。 第2圖係本典型實施例中層積片狀變阻器之製造程序 圖。 第3圖係一狀態圖,用以顯示本發明實施型態中未添加 作為變阻元件副成分用之鋁化合物時變阻元件粒徑與析出 膜。 第4圖係一狀態圖,用以顯示本發明實施型態中添加作 為變阻元件副成分用之鋁化合物時變阻元件粒徑與析出 膜。即’该第3圖及第4圖係截面圖,用以說明變阻元件1 中因鋁化合物之有無而起之變阻元件1表面之凹凸與析出 膜2之形成狀態。第3圖及第4圖中Zn2Si04係形成於變阻元 件1中。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -12- 543043 Α7 Β7 經濟部智慧財產局員工消費合作社印製 五、發明說明(10 ) 首先,於第2圖之No· 8程序中,將作主成分用之Zn〇 與作副成分用之 Si02、Sb2〇3、c〇3〇4、Mn02、:NiO、Ci*203 及Al(N〇3)3作濕式混合。接著κΝ〇· 9程序中加以乾燥。藉 此製得原料粉末。此時,若矽化合物較少,則無法於變阻 π件1上形成析出膜2 ;而,若矽化合物過多,則將妨礙燒 結性。因此,矽化合物之添加量宜調整為換算成以係 1 〜15mol%,更宜為5〜l〇m〇i%。 又,添加鋁化合物時,可抑制變阻元件丨表面之凹凸且 可使析出膜2之非形成部分減少而更提高耐鍍性。 鋁化合物之添加量係調整為換算成鋁為3m〇1%以下, 且更宜為lmol%以下。藉著添加鋁化合物,可得即使於變 阻元件内部亦可提高耐鑛性之效果。 其次,於第2圖之No. 10程序中進行乾燥粉體之粒徑調 整。 接著,於第2圖之No· 11程序中,放入鞘中並以 800〜l〇〇〇°C之溫度暫時焙燒。 之後,於第2圖之No· 12程序中粉碎至粉體粒徑平均值 為1·〇±〇.5μηι。此時,若粉碎粉之粒徑較小,則可具有優異 之尚溫負荷壽命,並促進ZnjiO4往變阻元件丨表面析出。 接著,於No. 13程序中進行微粉碎。再於N〇 14程序 中充分乾燥。於第No. 15程序中再次粉碎後,為得均句之 生料而除去較大之凝集粉。 其次,於No· 16程序中,將作為溶劑用之乙酸丁酯、 作為可塑劑用之千基鄰苯二酸丁醋與作結合劑用之丁縮醛 h張尺度適財關家標準(CNS)A4規格⑵G χ 297公爱)--------- •13- I -------^---------^--- (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 543043 Α7 _______ Β7 五、發明說明(U ) 樹脂加入前述粉碎粉中再加以混合。藉此製作生料。 接著’於No· 17程序中將生料裏之固形物去除後,以 刮刀(doctor blade)法進行片成形為預定之厚度。之後,於 No· 18程序,裁斷為預定之形狀。 接著於No· 19程序中使將成為内部電極3之Pt糊印刷 為預定之形狀,再進行層積。 此時’内部電極亦可使用由Pt、pd與Ag中至少一種以 上之金屬所構成之電極。 之後,於第No· 20電極中進行正式加壓。接著,於ν〇· 21程序中切斷為預定之形狀。藉此可得變阻元件1。 接著,將該變阻元件1放入結合劑除去用鞘。再將之投 入結合劑除去爐中,以25°C/h之昇溫速度昇溫至4〇〇°c為 止。於該狀態下保持2小時後,更以提高至7〇〇°c之狀態下 保持兩小時。再於No. 22程序中除去結合劑。此係因為使 收納有變阻元件1之鞘旋轉,而使變阻元件1預先持有強度。There are at least two kinds of alloys composed of alloys such as Ag and resins containing Ag, and the electric money layer has at least two layers of the lower recording key and the upper plating or tin plating. Μ 电 Typical Example 1 Effect The zinc oxide varistor of the exemplary embodiment of the present invention will be described below. Fig. 1 is a sectional view of a laminated sheet rheostat as a zinc oxide rheostat. In Fig. 1, a varistor element 1 mainly composed of zinc oxide has an internal electrode 3 mainly composed of rhenium. A precipitation film 2 containing ZgiO4 as a main component is formed on the surface of the varistor element i. The external electrode 4 with Ag as the main component is placed on the exposed ends of the inner α 卩 electrode 3 again. The layer 5 and the solder layer 6 are disposed on the external electrode 4. Fig. 2 is a manufacturing procedure diagram of the laminated chip rheostat in the present exemplary embodiment. Fig. 3 is a state diagram showing the particle size and precipitation film of the varistor element when no aluminum compound is used as a sub-component of the varistor element in the embodiment of the present invention. Fig. 4 is a state diagram showing the particle size and precipitation film of the varistor element when an aluminum compound is added as a secondary component of the varistor element in the embodiment of the present invention. That is, the third and fourth figures are sectional views for explaining the unevenness of the surface of the varistor element 1 and the formation state of the precipitation film 2 due to the presence or absence of an aluminum compound in the varistor element 1. The Zn2Si04 system is formed in the varistor element 1 in FIGS. 3 and 4. This paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm) -12- 543043 Α7 Β7 Printed by the Consumers' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (10) First, in No. 2 · In the 8 program, ZnO used as the main component and Si02, Sb203, c0304, Mn02, NiO, Ci * 203, and Al (N〇3) 3 used as the sub-component are used as the wet method. mixing. It was then dried in the κΝ0.9 procedure. Thus, a raw material powder is prepared. At this time, if there are few silicon compounds, the precipitation film 2 cannot be formed on the varistor π member 1, and if there are too many silicon compounds, the sintering property will be hindered. Therefore, the addition amount of the silicon compound should be adjusted to be converted to 1 to 15 mol%, more preferably 5 to 10 mol%. In addition, when an aluminum compound is added, unevenness on the surface of the varistor element 丨 can be suppressed, and the non-formed portion of the precipitation film 2 can be reduced to further improve the plating resistance. The addition amount of the aluminum compound is adjusted so that it is 3 mol% or less when converted to aluminum, and more preferably 1 mol% or less. By adding an aluminum compound, the effect of improving the ore resistance even inside the varistor element can be obtained. Next, the particle size of the dried powder was adjusted in the No. 10 procedure of FIG. 2. Next, in the No. 11 procedure of FIG. 2, it is put into a sheath and temporarily fired at a temperature of 800 to 1000 ° C. Thereafter, it was pulverized in the No. 12 procedure of Fig. 2 until the average value of the particle size of the powder was 1.0 ± 0.5 μm. At this time, if the particle size of the pulverized powder is small, it can have an excellent temperature load life and promote the precipitation of ZnjiO4 to the surface of the varistor element 丨. Next, fine pulverization was performed in the No. 13 program. Dry thoroughly in the No. 14 procedure. After being pulverized again in the No. 15 procedure, a larger agglomerated powder was removed to obtain a uniform raw meal. Secondly, in the No. 16 program, butyl acetate as a solvent, butyl phthalate as a plasticizer, and butyl acetal as a binder are used. H-scale standards are suitable for households (CNS) ) A4 specifications ⑵ G χ 297 public love) --------- • 13- I ------- ^ --------- ^ --- (Please read the note on the back first Please fill in this page again) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 543043 Α7 _______ B7 V. Description of the invention (U) Resin is added to the above crushed powder and mixed. Use this to make raw materials. Next, after removing the solids in the raw material in the No. 17 procedure, the sheet is formed into a predetermined thickness by a doctor blade method. After that, it is cut into a predetermined shape in the No. 18 program. Next, in a No. 19 program, the Pt paste which becomes the internal electrode 3 is printed into a predetermined shape, and then laminated. In this case, an electrode composed of at least one of Pt, pd, and Ag may be used as the 'internal electrode'. After that, the pressure was applied to the No. 20 electrode. Then, it is cut into a predetermined shape in the ν〇.21 program. Thereby, a variable resistance element 1 can be obtained. Next, the varistor element 1 is placed in a binder removing sheath. It was then put into a binder removal furnace and heated up to 400 ° C at a temperature increase rate of 25 ° C / h. After being held in this state for 2 hours, it was further maintained at a temperature of 700 ° C for two hours. The binder was removed in No. 22 procedure. This is because the sheath containing the varistor element 1 is rotated, so that the varistor element 1 has strength in advance.
No· 23程序中,將結合劑除去完畢之變阻元件1與 Al2〇3粉末一起放入砲彈形之鞘,再投入爐内,於空氣中焙 燒。 茲針對該焙燒程序加以說明。首先,於至8〇(TC為止不 使鞘旋轉之狀態下,以200°C/h之昇溫速度昇溫。之後,以 800 C以上之溫度使勒’開始旋轉。接著,以2〇〇°c /h之昇溫 速度昇溫至最高溫度1000〜140(TC為止,並保持兩小時之 最高溫度。再以100°C/h之降溫速度降溫。 於No· 24程序中進行變阻元件1之去角。接著μΝ〇· 25 本紙張尺度適用中國國家標準(CNS〉A4規格(210 X 297公釐) AW.-------訂---------線—AWI (請先閱讀背面之注意事項再填寫本頁) . -14- 543043 A7 B7 五、發明說明(^ ) 私序中,於露出有内部電極3之端面上形成以^為主成分 之外部電極4。再於亂26程序中將其焊上。此時,外部電 極4係由Pt或Pt_Ag或Ag_pd,甚或分散有Ag之熱硬化性樹 脂所形成。 於No· 27程序及Νο· 28程序中焊上外部電極4,之後進 仃鍍Νι,再進行鍍焊料。藉此,形成沁層5及半田層6。而 依此程序得以完成層積片狀變阻器。又,亦可進行鍍如而 形成Sn層,以取代鍍焊料。 接著,針對形成於變阻元件1表面上之以Zn2Si〇4為主 成分之析出膜加以記載。 訂 氧化鋅係可溶於酸及鹼兩者之兩性物質。因此,氧化 鋅可/合解於係酸性溶液或鹼性溶液之Ni電鍍液及焊料電鍍 液中。藉以Zr^SiO4為主成分之析出膜2披覆變阻元件〗之表 面,可抑制電鍍液侵入變阻元件丨之内部。又,一般以變阻 元件1表面完全露出之狀態進行電解電鍍時,因變阻元件為 半導體,雖會發生電鍍流,但於本電形之實施例中,因以In the No. 23 procedure, the varistor element 1 after the binding agent has been removed is put into a shell-shaped sheath together with the Al203 powder, and then put into a furnace and fired in the air. This roasting procedure is explained. First, the sheath was heated at a temperature of 200 ° C / h without rotating the sheath until 80 ° C. After that, Le 'was started to rotate at a temperature of 800 ° C or higher. Then, 200 ° C / h The temperature rises to a maximum temperature of 1000 ~ 140 ° C, and maintains the maximum temperature for two hours. The temperature is then reduced at a cooling rate of 100 ° C / h. In the No. 24 program, the angle of the varistor element 1 is removed. . Then μN〇 · 25 This paper size applies to Chinese national standard (CNS> A4 size (210 X 297 mm) AW .------- Order --------- Line-AWI (please first Read the notes on the back and fill in this page). -14- 543043 A7 B7 V. Description of the Invention (^) In the private sequence, an external electrode 4 with ^ as the main component is formed on the end surface where the internal electrode 3 is exposed. Weld it in the random 26 procedure. At this time, the external electrode 4 is formed of Pt or Pt_Ag or Ag_pd, or even a thermosetting resin in which Ag is dispersed. The external electrode is welded in the No. 27 procedure and No. 28 procedure. 4. After that, Nm plating is performed, and then solder plating is performed, thereby forming the Qin layer 5 and Handa layer 6. And according to this procedure, the lamellar sheeting can be completed. It is also possible to perform Sn plating to form a Sn layer instead of soldering. Next, a precipitation film mainly composed of Zn2Si04 formed on the surface of the varistor element 1 is described. Zinc oxide is soluble It is an amphoteric substance in both acid and alkali. Therefore, zinc oxide can be dissolved / combined in the Ni plating solution and solder plating solution which are acidic or alkaline solutions. The precipitation film 2 based on Zr ^ SiO4 is coated The surface of the resistive element can prevent the plating solution from entering the interior of the varistor element. Also, when electrolytic plating is generally performed with the surface of the varistor element 1 completely exposed, the electroplating flow occurs because the varistor element is a semiconductor, but In the embodiment of this form, because
Zn^SiO4為主成分之析出膜2係高電阻物質,而可防止電鍍 流。 又,本典型之實施例中,亦添加有作為變阻元件丨之副 成分用之Sb2〇3。因此,藉焙燒亦生成有Zn_Sb_〇系化合物, 而與Zn2Si〇4—同,Zn-Sb-Ο系化合物將逐漸析出於變阻元 件1之表面上。該Zn-Sb-Ο系化合物與Zn2Si〇4相同地具有優 異之耐鍍性。因此,可得不受電鍍性影響之具有優異耐鍍 性之變阻器。 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 x 297公釐 -15- 543043 13 五、發明說明( 未斗加作為變阻元件1之副成分用之Sb化合物 、’不I成Zn-Sb- 〇系化合物,但即使僅有Zn2Si〇4,亦 可製得:有十分實用耐鍍性之層積片狀變阻器。 • U述實&例中’係暫時培燒原料粉末而預先形成 ΖηβΑ,而促進培燒後往變阻元件以面析出,但並不限 ;…亦可使㈣切化合物用之以取代培燒,藉 此可付與别述相同之效果。當然,即使於不使用石夕化合物 之Zn錢或不進行原料粉末之培燒時,亦可於變阻元件工 之表面上形成《Zn2Si()4為主成分之析出膜之。 更如第3圖所示,變阻元件之粒成長於進行時,表面之 凹凸將增A因此於變阻元之表面上將發生有無法形成 析出膜2之部分。但如第4圖所示般,抑制粒成長以抑制表 面之凹凸時,可減少變阻元件1表面析出膜2之非形成部。 若依分析結果,則藉添加作為變阻元件1之副成分用之 1呂化合物,將可增加存在於變阻元们粒界三重點之晶尖石 結構之物質量’而抑制以該物質為開端之粒成長。結果如 第4圖所示,可抑制變阻元件1表面之凹凸,使變阻元件工 鍍 表面之析出膜之非形成部減少,而更為提高料性及電 流之防止效果。 智 慧 財 產 局 員 工 消 費 而 但 又,雖可不添加作變阻元件】之副成分用之銘化合物 於變阻元件i表面上形成以Zn2Si〇4為主成分之析出膜2私 若依前述分析結果’則於添加作變阻元件㈣成分用之銘化 合物時,將可更安定地形成析出膜2。 又,若添加作變阻元件㈣成分用之叙則可使如叫 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公髮 -16-The Zn ^ SiO4-based precipitation film 2 is a high-resistance substance, and can prevent plating flow. In this exemplary embodiment, Sb203 is added as a secondary component of the varistor element. Therefore, a Zn_Sb_〇-based compound is also formed by firing, and like Zn2Si〇4-, a Zn-Sb-O-based compound will gradually precipitate on the surface of the varistor element 1. This Zn-Sb-0-based compound has excellent plating resistance similar to Zn2Si04. Therefore, a varistor having excellent plating resistance without being affected by plating properties can be obtained. This paper size applies Chinese National Standard (CNS) A4 specification (21 × 297 mm-15- 543043 13) V. Description of the invention -Sb- 〇-based compound, but even with only Zn2Si〇4, a laminated sheet varistor with very practical plating resistance can be obtained. ZηβΑ is formed, and it promotes precipitation to the varistor element after the firing, but it is not limited to; ... It is also possible to use a cutting compound instead of firing, thereby achieving the same effect as others. Of course, even if When the Zn compound of the Shixi compound is not used or the raw material powder is not fired, a Zn2Si () 4-based precipitation film can also be formed on the surface of the varistor element. As shown in Figure 3, As the grain growth of the varistor element progresses, the unevenness on the surface will increase A, so a portion on the surface of the varistor where the precipitation film 2 cannot be formed will occur. However, as shown in Figure 4, the grain growth is suppressed to suppress the surface. In the case of unevenness, the non-formed portion of the deposition film 2 on the surface of the varistor element 1 can be reduced. According to the analysis results, the addition of the 1 ru compound used as a side component of the varistor element 1 will increase the mass of the crystal spinel structure existing in the three points of the grain boundary of the varistor element, and inhibit the starting of the substance. The grain grows. As shown in FIG. 4, the unevenness on the surface of the varistor element 1 can be suppressed, the non-formed portion of the deposition film on the surface of the varistor element plating can be reduced, and the material property and the current prevention effect can be further improved. Intellectual Property Bureau employees consume it, but although it may not be added as a secondary component, the inscription compound is used to form a precipitation film with Zn2Si〇4 as the main component on the surface of the variable resistance element i. 2 According to the foregoing analysis results' When adding the compound used as the component of the varistor element, the precipitation film 2 can be formed more stably. In addition, if the compound used as the component of the varistor element is added, the national standard can be applied to the paper size. (CNS) A4 specifications (210 X 297 issued -16-
I 543043 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(M ) 之生成由低溫進行。舉例言之,不存有鉍時,2zn0 + Si〇2 Zi^SiO4之反應雖不於i〇〇〇°c以下發生,但於级存在 下時,1000°C下大部分之Si將成為ZnzSiO4。該現象可以如 下之反應過程進行。I 543043 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. The description of the invention (M) is produced at a low temperature. For example, in the absence of bismuth, the reaction of 2zn0 + Si〇2 Zi ^ SiO4 does not occur below 1000 ° c, but in the presence of a grade, most of Si at 1000 ° C will become ZnzSiO4 . This phenomenon can be carried out in the following reaction process.
Bi2〇3+ Si02 Bi4(Si04)3 Bi4(Si04)3+ 6ZnO Zn2Si04 + 2Bi2〇 絲更將於培燒時而飛散。因此,變阻元件1表面上將存 有更多之鉍。故除可促進Zi^SiO4往變阻元件1表面析出, 亦可使變阻元件附近之ZhSiO4亦移動至表面,減少變阻元 件1表面之析出膜2之非形成部分。 典型之實施例2 本典型實施例2之層積片狀變阻器中,析出膜2係以 Zn-Sb-Ο系化合物為主成分。其他則以與前述典型實施例i 中之層積片狀變阻器相同之方法製作。 首先將作主成分用之ZnO與作副成分用之Bi2〇3、 Sb203、Co304、Mn02、NiO、Cr203及A1(N03)3作濕式混合 (第2圖之8)。接著加以乾燥(第2圖之9)。藉此製得原料粉 末。此時,若銻化合物較少,則無法於變阻元件1上形成析 出膜2 ;而,若銻化合物過多,則將妨礙燒結性。因此,銻 化合物之添加量宜調整為換算成Sb係1〜lOmol%,更宜為 4〜lOmol% 0 以下,與典型之實施例1相同,藉第2圖之No.10程序至 No_21程序製得變阻元件1。 接著,將該變阻元件1放入結合劑除去用鞘。再將之投 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) I------^----I---- --- (請先閱讀背面之注意事項再填寫本頁) -17-Bi2〇3 + Si02 Bi4 (Si04) 3 Bi4 (Si04) 3+ 6ZnO Zn2Si04 + 2Bi2〇 The wire will fly away during firing. Therefore, more bismuth will be stored on the surface of the varistor element 1. Therefore, in addition to promoting the precipitation of Zi ^ SiO4 to the surface of the varistor element 1, ZhSiO4 near the varistor element can also be moved to the surface, reducing the non-formed portion of the precipitation film 2 on the surface of the varistor element 1. Exemplary Embodiment 2 In the laminated chip varistor of Exemplary Embodiment 2, the precipitation film 2 is mainly composed of a Zn-Sb-O compound. Others are fabricated in the same manner as the laminated chip varistor in the foregoing exemplary embodiment i. First, ZnO used as a main component and Bi203, Sb203, Co304, Mn02, NiO, Cr203, and A1 (N03) 3 used as a sub-component were wet-mixed (Figure 8). It is then dried (Figure 2-9). Thus, a raw material powder was prepared. In this case, if the antimony compound is small, the precipitation film 2 cannot be formed on the varistor element 1. If the antimony compound is too large, the sinterability is impaired. Therefore, the addition amount of antimony compound should be adjusted to be converted to Sb based 1 ~ 10 mol%, more preferably 4 ~ 10 mol% 0 or less, which is the same as that of the typical embodiment 1, and it is based on the No. 10 program to No_21 program system in Fig. 2 Got variable resistance element 1. Next, the varistor element 1 is placed in a binder removing sheath. The paper size for this paper is in accordance with China National Standard (CNS) A4 (210 X 297 mm) I ------ ^ ---- I ---- --- (Please read the note on the back first (Fill in this page again) -17-
543043 五、發明說明(15 ) 入結合劑除去爐中,以25°C/h之昇溫速度昇溫至4〇〇〇c為 止。於該狀態下保持2小時後,更以提高至7〇(rc之狀態下 保持兩小時。再除去結合劑(第2圖之22)。藉此程序使變阻 元件1之強度提高。因此,於下一焙燒程序之收納有變阻元 件1之鞘之旋轉中,可防止變阻元件1發生破損。 將結合劑除去完畢之變阻元件1與Al2〇3粉末一起放入 砲彈形之鞘,再投入爐内,於空氣中焙燒(第2圖之23)。 茲針對該焙燒程序加以說明。首先,於至8〇〇°c為止不 使鞘旋轉之狀態下,以200t: /h之昇溫速度昇溫。之後,以 800°C以上之溫度使鞘開始旋轉。接著,以2〇〇x:/h之昇溫 速度昇溫至最高溫度1000〜1400°C為止,並保持兩小時之 最高溫度。再以l〇〇ac/h之降溫速度降溫。 焙稍後進行變阻元件1之去角(第2圖之24)。接著於露 出有内部電極3之端面上形成以Ag為主成分之外部電極 4(第2圖之25)。再將其焊上(第2圖之26)。此時,外部電極4 係由Pt或Pt-Ag或Ag-Pd,甚或分散有Ag之熱硬化性樹脂所 形成。 焊上外部電極4後進行鍍Ni,再進行鍍焊料,藉此形成 Ni層5及半田層6(第2圖之27、28)。而依此程序得以製得層 積片狀變阻器。又,亦可進行鍍Sn而形成Sn層,以取代鑛 焊料。 接著,針對形成於變阻元件1表面上之以Zn-Sb-Ο為主 成分之析出膜加以記載。 氧化鋅係可溶於酸及鹼兩者之兩性物質。因此,氧化 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) -------訂--------- 經濟部智慧財產局員工消費合作社印製 •18- 543043 A7 B7 五、發明說明(16 辞可/合解於係性〉容液或驗性溶液之Ni電鑛液及焊料電鍵 液中。以Zn2Si〇4為主成分之膜較變阻元件!更不易溶解於 酸性及驗性溶液中。因此,藉以Zn2Sb〇4為主成分之析出 膜2披覆變阻元件!之表面,可抑制電鑛液侵入變阻元^ 之内部。又’一般以變阻元件1表面完全露出之狀態進行電 解電鑛時,因變阻元件為半導體,而會發生電鑛流,但於 本電形之實施例中,因以Zn2Si〇4為主成分之析出膜2係高 電阻物質,而可防止電鍍流。 化 即 於前述實施例中’係暫時焙燒原料粉末而預先形成 Zn-Sb-Ο系化合物,而促進焙燒後往變阻元件丨表面析出, 但並不限於此’亦可使用作為錄化合物用之Zn_Sb_〇系 σ物以取代焙燒,藉此可得與前述相同之效果。當然’,、叩 使於不使用錄化合物之Zn-Sb_〇系化合物或不進行原 末之焙燒時,亦可於變阻元件以表面上形成以znsb_心 化合物為主成分之析出膜2。 ' 部 智 慧 員 工 消 費 印 又,本典型實施例2中之析出膜2係被認為以 Zn2.33Sb0.67〇4為主成分者。析出膜2除此之外亦有析出具有 其他結構之Zn-Sb-Ο系化合物之可能性。因此而使用、以 Zn Sb-Ο系化合物為主成分之析出膜2之文字敘述。 於本典型實施例2中,亦可藉抑制變阻元件1之粒成長 而抑制表面之凹凸,以確實減少變阻元们表面析出膜& 非形成部。因此,與典型實施⑴相同,藉添加作為變阻元 件1副成分用之鋁化合物,而增加存在於變阻元件丨之粒界 二重點之由Zn、Sb與0構成之晶尖石結構之物質量,而抑 本紙張尺度家標準(CNS)A_4一規格(2ι〇 χ撕公髮) -19- 543043543043 V. Description of the invention (15) Into the binder removal furnace, heat up to 4,000c at a temperature increasing rate of 25 ° C / h. After being held in this state for 2 hours, it was further increased to 70 (rc for 2 hours. Then the binder was removed (22 in Fig. 2). This procedure increased the strength of the varistor element 1. Therefore, During the rotation of the sheath containing the varistor element 1 in the next firing process, the varistor element 1 can be prevented from being damaged. The varistor element 1 after the binding agent is removed is put into a shell-shaped sheath together with Al203 powder. Put it back into the furnace and bake it in the air (23 of Figure 2). The roasting procedure will be described. First, the temperature is raised to 200 t: / h without rotating the sheath until 800 ° C. The temperature is increased. After that, the sheath starts to rotate at a temperature of 800 ° C or more. Then, the temperature is increased to a maximum temperature of 1000 to 1400 ° C at a temperature increase rate of 200x: / h, and the maximum temperature is maintained for two hours. The temperature is reduced at a cooling rate of 100 ac / h. The cornering of the varistor element 1 is performed after baking (24 of FIG. 2). Then, an external electrode mainly composed of Ag is formed on the end surface on which the internal electrode 3 is exposed. 4 (25 of Fig. 2). Solder it again (26 of Fig. 2). At this time, the external electrode 4 It is formed of Pt or Pt-Ag or Ag-Pd, or even a thermosetting resin in which Ag is dispersed. After the external electrode 4 is welded, Ni plating is performed, and then solder plating is performed to form Ni layer 5 and Handa layer 6 ( 27, 28 of Fig. 2). According to this procedure, a laminated chip varistor can be obtained. In addition, Sn plating can also be performed to form a Sn layer instead of ore solder. Next, the formation on the surface of the varistor element 1 The precipitation film with Zn-Sb-O as the main component is recorded. Zinc oxide is an amphoteric substance that is soluble in both acids and alkalis. Therefore, the paper size for oxidation is applicable to China National Standard (CNS) A4 (210 X 297) (Mm) (Please read the notes on the back before filling out this page) ------- Order --------- Printed by the Employees' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs • 18- 543043 A7 B7 5 、 Explanation of the invention (16 words can be / combined in the system> Ni ores and solder bond solution of the liquid or test solution. The film with Zn2Si〇4 as the main component is more difficult to dissolve in acidic! In the test solution. Therefore, the surface of the precipitating film 2 with Zn2Sb04 as the main component covers the varistor element! Into the varistor element ^. Also, when electrolysis is generally performed in a state where the surface of the varistor element 1 is completely exposed, electric ore current will occur because the varistor element is a semiconductor, but in the embodiment of this electric form Since the Zn2Si04-based precipitation film 2 is a high-resistance substance, it can prevent electroplating flow. In the foregoing embodiment, the Zn-Sb-O-based compound was previously formed by temporarily firing the raw material powder, and promoted. After firing, it is deposited on the surface of the varistor element, but it is not limited to this. A Zn_Sb_0 sigma compound used as a recording compound may be used instead of firing, thereby obtaining the same effect as described above. Of course, when the Zn-Sb_O-based compound is not used or the raw material is not calcined, a precipitation film mainly composed of a znsb_core compound can be formed on the surface of the varistor element 2 . 'Ministry of Wisdom and Staff Consumption In addition, the precipitation film 2 in this exemplary embodiment 2 is considered to be mainly composed of Zn2.33Sb0.67〇4. In addition to the precipitation film 2, there is a possibility that a Zn-Sb-O-based compound having another structure is precipitated. For this reason, the text of the precipitation film 2 containing a Zn Sb-O-based compound as a main component is described. In this exemplary embodiment 2, it is also possible to suppress the unevenness of the surface by suppressing the grain growth of the varistor element 1 to surely reduce the surface precipitation film & non-forming portion of the varistor element. Therefore, as in the typical implementation, by adding an aluminum compound as a secondary component of the varistor element, a substance with a crystalline spinel structure composed of Zn, Sb, and 0 existing in the grain boundary two points of the varistor element 丨 is added. Volume, and this paper size home standard (CNS) A_4 one specification (2ι〇χ tear public hair) -19- 543043
制以該物質為開端之粒成長。 (請先閱讀背面之注意事項再填寫本頁) 又’若添加作變阻元件i副成分用之鉍,則可使 Zn-Sb-Ο系化合物之生成由低溫進行。鉍更將於焙燒時而 飛散。因此,變阻元件〗表面上將存有更多之鉍。此時,宜 於鉍化合物設置於前述變阻元件周邊上之狀態下焙燒前述 變阻元件。因此除可促系化合物往變阻元件又表 面析出外,亦可使變阻元件附近之Zn_Sb-〇系化合物亦移 動至表面。減少變阻元件丨表面之析出膜2之非形成部分。 又,即使不添加作變阻元件1副成分用之鋁化合物亦可 於變阻元件1表面上形成以Zn-Sb_〇系化合物為主成分之 析出膜2,但為使析出膜2之非形成部儘可能減少,以添加 I呂化合物較為理想。 以下’係針對本發明之重點加以說明。 (1) 本發明之析出膜2之作用係於電鑛程序中防止電鍍 液進入電阻元件1内部並防止電鍍流。因此,變阻元件 表面全體宜完全披覆析出膜2。本發明係使將成為析出膜2 之成分由變阻元件1之内部析出。因此,無法以析出膜2完 經濟部智慧財產局員工消費合作社印製 全披覆變阻元件1表面,而如第3圖所示般存有析出膜2之非 形成部。 但析出膜2之非形成部難以成為電鍍程序中電鍍液之 侵入及電鍍流之成因。 (2) 焙燒變阻元件丨時及使鞘旋轉時,係使旋轉軸呈水 平般旋轉,藉此可使變阻元件1與八12〇3均勻混合。因此, 除可促進析出膜2形成外並可防止形成狀態之不均。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) -20- 543043 五、發明說明(18 經濟部智慧財產局員工消費合作社印製 (3) 培燒變阻元件時,雖於鞠中混合Al2〇3,但亦可將 Al2〇3、MgO、Zr〇2、Zn0及Si〇中至少一種之粉末與原料 粉末-起混合。藉此’可由變阻元件卜及收鉍,進而改善高 溫負何奇命。培燒降溫時’ M更可進_步作為接著劑而防 止變阻元件1彼此熔融接合。 使用Al2〇3 ,更可得與添加作為變阻元件i副成分用 之鋁化合物時相同之作用。因此,即使於未添加作為變阻 兀件1副成分用之鋁化合物時,藉與變阻元件丨一起將 收納於鞘中加以焙燒,而可減低變阻元件丨表面之凹凸,減 少析出膜2夂非形成部。 (4) 於前述各實施例中,焙燒變阻元件時,係於8〇〇艺 以上開始鞘之旋轉。不限於此,鞘之旋轉開始溫度宜於700 C〜1000°C之範圍内。且於80(rc附近開始旋轉最為理想, 藉此防止變阻元件丨之破損,並可使預定量之鉍飛散。 又’朝之旋轉係用以使鞘内之環境及溫度均勻而進行 者’若該鞘之旋轉過慢時,難以使溫度分布及環境平均, 若過快,則帶給變阻元件之損傷過大,因此鞘之旋轉宜 〇.5rpm〜5rpm之範圍内。 (5) 最高焙燒溫度未滿…⑽它時,無法形成可防止電 液往變阻元件1之侵入及防止電鍍流之析出膜2。最高焙燒 溫度超過1400X:時,雖可形成析出膜2,但層積片狀變阻器 之電氣特性將劣化或發生脫層。因此,最高培燒溫度可於 1000°c〜1400°C之範圍内,而宜於l〇〇〇°C〜1300°c之範圍。 (6) 為抑制粒成長,而使變阻元件1之結晶粒徑小且均 於 鍍 (請先閱讀背面之注意事項再填寫本頁) I------訂-----1------ 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -21- 經濟部智慧財產局員工消費合作社印製 543043 五、發明說明(^ ) 勻及降低變阻元件1表面之凹凸,進而考慮使覆蓋變阻元件 1表面上析出膜2之非形成部儘可能地縮小等時,焙燒時之 降溫速度宜越快越好。 另一方面,若考慮層積片狀變阻器主要特性之一之壽 命特性時,則降溫速度宜較慢。 因此,為不對層積片狀變阻器之電氣特性帶來不良影 響且儘可能形成可覆蓋變阻元件1表面全體之析出膜2,降 溫速度宜於50°C/h〜400°C/h之範圍内,而更宜於1〇(rc /h〜200°C /h之範圍内。 (7)内部電極3係如典型實施例所示般使用pt、pd&Ag 中至少一種以上之金屬形成者。使用pd*pt為主成分時之 金屬時,焙燒後之變阻元件丨之兩端面成為露出有内部電極 3之狀態。因此,無須進行用以使焙燒後内部電極3露出之 研磨。 前述之理由為,以Pd或Pt為主成分之内部電極3之收縮 率較小。又,為使析出膜2反應變阻元件j内部物質而析出, 以較内邓電極3更以ZnO為主成分之部分收縮率將增大。 又,亦可於焙燒前形成外部電極4。即使以最高焙燒溫 度熱處理過,外部電極4仍需以可發揮外部電極4之機能之 金屬加以形成。 (8)前述各實施例中,變阻元件丨之焙燒係於空氣中進 行。但由進行變化氧氣分壓之實驗結果可知,若越使變阻 元件!周圍之氧氣分壓降低,則可形成月後之析出膜。因 此,可提高耐鍍性。但,於低氧氣分壓下培燒將會使基層 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) I·------ 丨訂---------線---AW1 (請先閱讀背面之注意事項再填寫本頁) -22- 543043Grain growth begins with the substance. (Please read the precautions on the back before filling in this page.) If bismuth is added as a secondary component of the varistor element i, the formation of Zn-Sb-O compounds can be performed at low temperature. Bismuth will also fly away during roasting. Therefore, more bismuth will be stored on the surface of the varistor element. At this time, the varistor element is preferably fired in a state where a bismuth compound is provided on the periphery of the varistor element. Therefore, in addition to promoting the precipitation of the system compound to the varistor element and the surface, the Zn_Sb-O compound near the varistor element can also be moved to the surface. The non-forming portion of the precipitation film 2 on the surface of the varistor element is reduced. In addition, even without adding an aluminum compound as a secondary component of the varistor element 1, a precipitation film 2 having a Zn-Sb_0-based compound as a main component can be formed on the surface of the varistor element 1. It is preferable to reduce the formation portion as much as possible, and to add the compound. The following is a description of the main points of the present invention. (1) The function of the precipitation film 2 of the present invention is to prevent the plating solution from entering the inside of the resistance element 1 and prevent the plating flow during the electric ore process. Therefore, it is desirable that the entire surface of the varistor element is completely covered with the precipitation film 2. In the present invention, a component to be a deposition film 2 is precipitated from the inside of the varistor element 1. Therefore, it is not possible to complete the deposition film 2 with the printed surface of the varistor element 1 covered by the consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, and there is a non-formation portion of the precipitation film 2 as shown in FIG. 3. However, the non-formed portion of the precipitation film 2 is difficult to cause the invasion of the plating solution and the plating flow during the plating process. (2) When the varistor element is fired and the sheath is rotated, the rotation axis is rotated horizontally, so that the varistor element 1 and the 8203 can be uniformly mixed. Therefore, in addition to promoting the formation of the precipitation film 2, unevenness in the formation state can be prevented. This paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 public love) -20- 543043 V. Description of invention (18 Printed by the Consumer Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs (3) When firing varistor elements, although Al2O3 is mixed in Ju, but powder of at least one of Al2O3, MgO, Zr02, Zn0, and Si0 can also be mixed with the raw material powder. By this, bismuth can be obtained by the variable resistance element, It further improves the high temperature and low temperature. When baking and cooling, 'M can be further used as an adhesive to prevent the varistor elements 1 from melting and bonding with each other. Using Al2O3 can also be used as an additional component of the varistor element i The aluminum compound has the same effect. Therefore, even when the aluminum compound used as a secondary component of the varistor element is not added, the varistor element can be reduced by being stored in a sheath and baked together with the varistor element 丨The unevenness on the surface reduces the non-formed portion of the precipitation film. (4) In the foregoing embodiments, when the varistor element is fired, the sheath rotation is started at 800 or more. It is not limited to this, the sheath rotation start temperature It should be in the range of 700 C ~ 1000 ° C. And 80 (rc It is most ideal to start the rotation recently, so as to prevent the varistor element from being damaged, and to allow a predetermined amount of bismuth to be scattered. Also, the "rotating toward the system is used to make the environment and temperature in the sheath uniform." If the sheath is rotated When it is too slow, it is difficult to average the temperature distribution and environment. If it is too fast, the damage to the varistor element will be too large, so the rotation of the sheath should be in the range of 0.5 rpm to 5 rpm. (5) The maximum baking temperature is not full ... ⑽ At this time, it is impossible to form a precipitation film 2 that can prevent the invasion of electro-hydraulic elements to the varistor element 1 and the plating flow. When the maximum baking temperature exceeds 1400X: Although the precipitation film 2 can be formed, the electrical characteristics of the laminated chip varistor will Degradation or delamination occurs. Therefore, the maximum firing temperature may be in the range of 1000 ° C ~ 1400 ° C, but preferably in the range of 1000 ° C ~ 1300 ° c. (6) In order to suppress grain growth, and Make the crystal size of varistor element 1 small and all plated (please read the precautions on the back before filling this page) I ------ Order ----- 1 ------ This paper size Applicable to China National Standard (CNS) A4 specifications (210 X 297 mm) -21- Printed by 543043 V. Description of the Invention (^) When the unevenness of the surface of the varistor element 1 is uniformized and reduced, and the non-forming portion covering the precipitation film 2 on the surface of the varistor element 1 is reduced as much as possible, the temperature during firing is reduced. The speed should be as fast as possible. On the other hand, if the life characteristics of one of the main characteristics of the laminated chip rheostat are considered, the cooling rate should be slower. Therefore, it does not adversely affect the electrical characteristics of the laminated chip rheostat. And as far as possible, a precipitation film 2 covering the entire surface of the varistor element 1 is formed, and the cooling rate is preferably within a range of 50 ° C / h ~ 400 ° C / h, and more preferably 10 (rc / h ~ 200 ° C) / h. (7) The internal electrode 3 is formed using at least one metal of pt, pd & Ag as shown in the exemplary embodiment. When a metal with pd * pt as the main component is used, both ends of the varistor element 丨 after firing are in a state where the internal electrode 3 is exposed. Therefore, it is not necessary to perform polishing for exposing the internal electrode 3 after firing. The foregoing reason is that the shrinkage rate of the internal electrode 3 containing Pd or Pt as a main component is small. In addition, in order to precipitate the precipitation film 2 to react with the substance inside the varistor element j, the shrinkage rate of a portion containing ZnO as a main component more than that of the internal electrode 3 will increase. The external electrode 4 may be formed before firing. Even if heat-treated at the highest firing temperature, the external electrode 4 needs to be formed of a metal capable of exerting the functions of the external electrode 4. (8) In the foregoing embodiments, the firing of the varistor element 丨 is performed in the air. But from the experimental results of changing the oxygen partial pressure, we can see that if the variable resistance element is used more! When the ambient partial pressure of oxygen is reduced, a precipitation film after the month can be formed. Therefore, plating resistance can be improved. However, firing under low oxygen partial pressure will make the basic paper size applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 public love) I · ------ 丨 order ------- --Line --- AW1 (Please read the precautions on the back before filling this page) -22- 543043
五、發明說明(20 片狀變阻器特性降低。此時,可再度於 又%工氣中施以800 〜1000°C之熱處理而恢復為所欲之特性。 (9)前述之典型實施例係針對層積型 ^ 谓1之氧化鋅變阻 器’但不限於此,本發明之氧化鋅變阻器亦可實施為單板 型變阻器,此時,與層積型氧化鋅變阻器相同,均可減少 製造程序。 如前所述,據本發明,乃可於焙燒後無須再度於si〇2 中進行熱處理且可設置以具有耐鍍性之鋅化合物為主成分 之析出膜於變阻器表面上。因此,可縮短製造程序而提高 生產性。更可減低生產成本。 (請先閱讀背面之注意事項再填寫本頁) # 訂---------線--- 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 χ 297公釐) -23- 543043 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(21 ) 1.. .變阻元件 2.. .析出膜 3.. .内部電極 4.. .外部電極 5.. .Ni 層 6.. .焊料層 8…混合 9.. .乾燥 10.. .粒徑調整 11.. .暫時焙燒 12…粉碎 13.. .微粉碎 14…乾燥 15.. .除去凝集粉 16.. .生料化 17.. .片成形 18.. .片裁斷 19…印刷層積 20.. .正式加壓 21…切斷 22.. .除去結合劑 23…焙燒 24…去角 元件標號對照表 25.. .形成外部電極 26.. .焊上外部電極 27.. .鎳層 28.. .焊料層 30.. .Zn2Si〇4 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -24-V. Description of the invention (20 pieces of varistor characteristics are reduced. At this time, heat treatment at 800 ~ 1000 ° C can be performed again in another working gas to restore the desired characteristics. (9) The foregoing typical embodiment is directed to Laminated type ^ Zinc oxide varistor of 1 'but not limited to this, the zinc oxide varistor of the present invention can also be implemented as a single-plate type varistor. At this time, the manufacturing process can be reduced as with the laminated ZnO varistor. As mentioned above, according to the present invention, it is possible to provide a deposition film mainly composed of a zinc compound having plating resistance on the surface of the varistor without the need for heat treatment in SiO 2 after firing. Therefore, the manufacturing process can be shortened. And improve productivity. It can also reduce production costs. (Please read the precautions on the back before filling out this page) # Order --------- Line --- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Paper size applies Chinese National Standard (CNS) A4 specification (21 × χ 297 mm) -23- 543043 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (21) 1. Varistor element 2 .. Precipitation film 3 .. Inside Electrode 4 .. External electrode 5. Ni layer 6. Solder layer 8. Mix 9. Dry 10. Particle size adjustment 11. Temporary firing 12 ... Crush 13 .... Micro-comminute 14 … Dry 15..Remove agglomerated powder 16 ... Green raw material 17 ... Piece forming 18 ... Piece cutting 19..Print lamination 20..Formal pressure 21 .. Agent 23 ... fired 24 ... dehorned component number comparison table 25 ... forming external electrode 26 ... soldering external electrode 27 ... nickel layer 28 ... solder layer 30 ... Zn2Si〇4 (Please read first Note on the back, please fill out this page again) This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) -24-
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JP4788619B2 (en) * | 2007-01-29 | 2011-10-05 | Tdk株式会社 | Varistor element |
JP5402553B2 (en) * | 2008-11-19 | 2014-01-29 | 三菱マテリアル株式会社 | Metal oxide sintered body for thermistor, thermistor element, and method for producing metal oxide sintered body for thermistor |
DE102014112678A1 (en) | 2014-09-03 | 2016-03-03 | Epcos Ag | Electrical component, component arrangement and method for producing an electrical component and a component arrangement |
JP2023035178A (en) | 2021-08-31 | 2023-03-13 | パナソニックIpマネジメント株式会社 | Varistor and method for manufacturing the same |
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JPS6469550A (en) * | 1987-09-07 | 1989-03-15 | Nippon Denso Co | Zno based semiconductor material having negative characteristic |
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