[go: up one dir, main page]

JP2002246207A - Voltage nonlinear resistor and porcelain composition - Google Patents

Voltage nonlinear resistor and porcelain composition

Info

Publication number
JP2002246207A
JP2002246207A JP2001040847A JP2001040847A JP2002246207A JP 2002246207 A JP2002246207 A JP 2002246207A JP 2001040847 A JP2001040847 A JP 2001040847A JP 2001040847 A JP2001040847 A JP 2001040847A JP 2002246207 A JP2002246207 A JP 2002246207A
Authority
JP
Japan
Prior art keywords
atomic
compound
voltage
amount
terms
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001040847A
Other languages
Japanese (ja)
Other versions
JP3822798B2 (en
Inventor
Noriyuki Kozu
典之 神津
Masanori Nagano
将典 長野
Akihisa Matsuda
明久 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiyo Yuden Co Ltd
Original Assignee
Taiyo Yuden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiyo Yuden Co Ltd filed Critical Taiyo Yuden Co Ltd
Priority to JP2001040847A priority Critical patent/JP3822798B2/en
Publication of JP2002246207A publication Critical patent/JP2002246207A/en
Application granted granted Critical
Publication of JP3822798B2 publication Critical patent/JP3822798B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Thermistors And Varistors (AREA)
  • Inorganic Insulating Materials (AREA)
  • Compositions Of Oxide Ceramics (AREA)

Abstract

PROBLEM TO BE SOLVED: To solve a problem in which it is hard to manufacture varistors that are excellent in loading service life characteristics and kept high in uniformity. SOLUTION: This varistor is formed of ZnO as a main component, and Pr, Co, Cr, Al or Ga or In, Si, and (Ca+Sr) are added as auxiliary components to the main component, where Si and (Ca+Sr) amount to 0.001 to 0.5 atom % and 0.01 to 0.5 atom %, respectively, and the ratio Ca/Sr is set at 0 to 50.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は過電圧保護素子用抵
抗体として好適な酸化亜鉛(Zn0)を主成分とした電
圧非直線性抵抗体及び抵抗体磁器組成物に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a voltage non-linear resistor and a resistor ceramic composition containing zinc oxide (Zn0) as a main component and suitable as a resistor for an overvoltage protection element.

【0002】[0002]

【従来の技術】Zn0を主成分とした電圧非直線性抵抗
体は、一般に制限電圧が低く、電圧比直線係数が大きい
などの特徴を有し、半導体素子のような過電流耐量の小
さなもので構成される電子機器の過電圧保護を目的とす
るバリスタとして広く用いられている。
2. Description of the Related Art A voltage non-linear resistor mainly composed of Zn0 has characteristics such as a low limiting voltage and a large voltage ratio linear coefficient. It is widely used as a varistor for the purpose of overvoltage protection of electronic devices configured.

【0003】Zn0を主成分とする電圧非直線性抵抗体
には、特性改善のために種々の副成分が添加される。特
公平1−25205号公報には、Zn0を主成分とし
て、これに副成分として 少なくとも1種類の希土類元素を総量で 0.08〜5.0原子%、 Coを 0.1〜10.0原子%、 Mg,Caの少なくとも1種類を 0.01〜5.0原子%、 K,Cs,Rbの少なくとも1種類を総量で0.01〜1.0原子%、 Crを 0.01〜1.0原子%、 Bを 0.0005〜0.1原子%、 Al,GA,Inの少なくとも1種を総量で0.0001〜0.05原子%、 添加し、長波尾サージ耐量の改善を図ることが開示され
ている。
Various non-linear components are added to a voltage non-linear resistor mainly composed of Zn0 to improve characteristics. Japanese Patent Publication No. 1-25205 discloses that Zn0 is a main component, and at least one kind of rare earth element as a subcomponent is 0.08 to 5.0 atomic% in total, and 0.1 to 10.0 atomic% of Co. %, At least one of Mg and Ca is 0.01 to 5.0 atomic%, at least one of K, Cs and Rb is 0.01 to 1.0 atomic% in total, and Cr is 0.01 to 1.0 atomic%. 0 at%, B at 0.0005 to 0.1 at%, and at least one of Al, GA, and In at a total amount of 0.0001 to 0.05 at% to improve long wave tail surge resistance. Is disclosed.

【0004】また、特開平9−326305号公報に
は、Zn0を主成分とし、これに副成分として 少なくとも1種の希土類元素を総量で0.08〜5.0原子%、 Coを 0.1〜10.0原子%、 Caを 0.1〜0.5原子%、 K,Cs,Rbのうち少なくとも1種を 0.01〜1.0原子%、 Crを 0.1〜0.6原子%、 Al,Ga,Inのうち少なくとも1種を総量で0.0
004〜0.03原子%、添加したもの及び上記成分に
更にB(ボロン)を0.0005〜0.1原子%、添加
し、許容電力の増大を図ることが開示されている。
Japanese Patent Application Laid-Open No. 9-326305 discloses that Zn0 is used as a main component, and at least one rare earth element is added as a subcomponent in a total amount of 0.08 to 5.0 atomic% and Co is added in a content of 0.1 to 0.1 atomic%. 0.1 to 0.5 at%, 0.1 to 0.5 at% of Ca, 0.01 to 1.0 at% of at least one of K, Cs, and Rb, 0.1 to 0.6 at% of Cr %, At least one of Al, Ga, and In in a total amount of 0.0
It is disclosed that B (boron) is further added in an amount of 0.0005 to 0.1 atomic% to 004 to 0.03 atomic% in addition to the above-mentioned components and the above components to increase the allowable power.

【0005】[0005]

【発明が解決しようとする課題】ところで、上記2つの
公報に開示される副成分には、K(カリウム)及びB
(ボロン)が含まれている。K及びBは、電圧非直線性
抵抗体の製造時に、これ等の酸化物又は焼成過程で酸化
物になることができる化合物で供給される。しかし、K
及びBの酸化物は、融点が低いし、焼成工程中で飛散し
やすいので、特性のバラツキが必然的に大きくなる。
The secondary components disclosed in the above two publications include K (potassium) and B
(Boron). K and B are supplied in the form of these oxides or compounds that can become oxides during the firing process during the manufacture of the voltage non-linear resistor. But K
Since the oxides of B and B have a low melting point and are liable to be scattered during the firing step, the variability of the characteristics is inevitably increased.

【0006】そこで、本発明の目的は、電気的特性のバ
ラツキを抑えて製造することができ、且つ課電寿命特性
における漏れ電流変化が少なく且つ非対称劣化が少ない
電圧非直線抵抗体及びこのための磁器組成物を提供する
ことにある。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a voltage non-linear resistor which can be manufactured while suppressing variations in electrical characteristics, has a small change in leakage current and a small asymmetrical deterioration in the service life characteristics, and a voltage non-linear resistor. It is to provide a porcelain composition.

【0007】[0007]

【課題を解決するための手段】上記課題を解決し、上記
目的を達成するための本発明は、ZnO(酸化亜鉛)を
主成分として、これに副成分として、Pr(プラセオジ
ム)を0.05〜3.00原子%、Co(コバルト)を
0.1〜5.0原子%、Cr(クロム)を0.01〜
0.50原子%、Al(アルミニウム)とGa(ガリウ
ム)とIn(インジウム)との内の少なくとも1種を
0.001〜0.020原子%、Si(珪素)を0.0
01〜0.500原子%が、及びCa+Sr(但し、C
a/Srが0〜50)を0.01〜0.50原子%添加
されていることを特徴とする電圧非直線抵抗体に係わる
ものである。
In order to solve the above-mentioned problems and to achieve the above-mentioned object, the present invention comprises ZnO (zinc oxide) as a main component and Pr (praseodymium) as a sub-component at 0.05%. 3.00 atomic%, Co (cobalt) 0.1-5.0 atomic%, Cr (chromium) 0.01-
0.50 atomic%, at least one of Al (aluminum), Ga (gallium) and In (indium) is 0.001 to 0.020 atomic%, and Si (silicon) is 0.0
01 to 0.500 atomic%, and Ca + Sr (however, C
a / Sr of 0 to 50) is added in an amount of 0.01 to 0.50 atomic%.

【0008】上記抵抗体を得るための組成物は、ZnO
(酸化亜鉛)を主成分として、これに副成分としてPr
化合物をPr(プラセオジム)に換算して0.05〜
3.00原子%、Co化合物をCo(コバルト)に換算
して0.1〜5.0原子%、Cr化合物をCr(クロ
ム)に換算して0.01〜0.50原子%、Al化合物
とGa化合物とIn化合物との内の少なくとも1種をA
l(アルミニウム)とGa(ガリウム)とIn(インジ
ウム)とにそれぞれ換算して0.001〜0.020原
子%、Si化合物をSi(珪素)に換算して0.001
〜0.500原子%が、及びCa化合物+Sr化合物を
Ca+Sr(但し、Ca/Srが0〜50)に換算して
0.01〜0.50原子%添加されているものであるこ
とが望ましい。
[0008] The composition for obtaining the resistor is ZnO
(Zinc oxide) as a main component, and Pr as a subcomponent.
The compound is converted to Pr (praseodymium) of 0.05 to
3.00 atomic%, Co compound is converted to Co (cobalt), 0.1 to 5.0 atomic%, Cr compound is converted to Cr (chromium), 0.01 to 0.50 atomic%, Al compound And at least one of Ga compound and In compound is A
0.001 to 0.020 atomic% in terms of l (aluminum), Ga (gallium) and In (indium), and 0.001 in terms of Si compound in terms of Si (silicon).
It is desirable that the amount is 0.01 to 0.50 atomic% in terms of Ca + Sr (where Ca / Sr is 0 to 50) and the Ca compound + Sr compound is added in an amount of 0.01 to 0.50 atomic%.

【0009】[0009]

【発明の効果】各請求項の発明は次の効果を有する。 (1) 飛散しやすいK(カリウム)及びB(ボロン)
を含まないので、量産時における電圧非直線抵抗体の特
性のバラツキを抑えることができる。 (2) K,Bを含まないが、Si及びM(Ca,S
r)を所定範囲で含むために諸電気特性の低下を防ぎ、
且つ課電寿命特性における漏れ電流変化の抑制及び非対
称劣化の抑制を達成することができる。本発明に従う副
成分によって課電寿命特性が向上する理由は明確ではな
いが、本発明に従う副成分が焼結体の3重点に偏析して
いることが認められ、結晶粒内に入り難い元素であるこ
とに起因しているものと考えられる。このように副成分
の元素が粒界近傍に存在すると、格子間Znイオンのマ
イグレーションが抑制されると考えられる。上記のマイ
グレーションは特性劣化に関与すると考えられるので、
本発明によれば特性劣化が少なくなる。
The invention of each claim has the following effects. (1) K (potassium) and B (boron) that are easily scattered
, The variation in the characteristics of the voltage nonlinear resistor during mass production can be suppressed. (2) Not containing K and B, but containing Si and M (Ca, S
r) is included in a predetermined range to prevent the deterioration of various electrical properties,
In addition, it is possible to achieve the suppression of the leakage current change and the suppression of the asymmetrical deterioration in the charging life characteristic. Although it is not clear why the subcomponent according to the present invention improves the application life characteristics, it is recognized that the subcomponent according to the present invention is segregated at the triple point of the sintered body, and is an element hard to enter the crystal grains. This is probably due to something. It is considered that the presence of the subcomponent element near the grain boundary suppresses the migration of interstitial Zn ions. Since the above migration is considered to be related to characteristic deterioration,
According to the present invention, characteristic deterioration is reduced.

【0010】[0010]

【実施形態及び実施例】次に、表1〜表5及び図1を参
照して本発明の実施形態及び実施例及び比較例を説明す
る。なお、各表には原子%で示された副成分の組成比
と、CaとSrの比と、諸特性が示されている。なお、
△V1μAの欄の+は正方向時の特性、−は負方向時の特
性を示す。
Embodiments and Examples Next, embodiments and examples of the present invention and comparative examples will be described with reference to Tables 1 to 5 and FIG. In each table, the composition ratio of the sub-component shown in atomic%, the ratio of Ca and Sr, and various characteristics are shown. In addition,
In the column of ΔV 1 μA , + indicates the characteristic in the positive direction, and-indicates the characteristic in the negative direction.

【0011】本発明及び比較例に従う電圧非直線抵抗体
を得るために、主成分としての酸化亜鉛Zn0粉末と、
副成分としてのPr(プラセオジム)、Co(コバル
ト)、Cr(クロム)、Al(アルムニウム)又はGa
(ガリウム)又はIn(インジウム)、Si(珪素)、
Ca(カルシウム)、Sr(ストロンチウム)の各化合
物を用意した。副成分の各化合物は、酸化プラセオジム
Pr611と、酸化コバルトCo34と、酸化クロムC
23と、酸化アルミニウムAl23又は酸化ガリウム
Ga23又は酸化インジウムIn23と、酸化珪素Si
2と、炭酸カルシウムCaCO3と、炭酸ストロンチウ
ムSrCO3とした。即ち、本発明に従う非直線抵抗体
を得るために主成分としてのZn0に、副成分としての
Pr611をPrに換算して0.05〜3.00原子
%、Co34をCoに換算して0.1〜5.0原子%、
Cr23をCrに換算して0.01〜0.50原子%、
Al23又はGa23又はIn23をAl又はGa又は
Inに換算して0.001〜0.020原子%、SiO
2をSiに換算して0.001〜0.500原子%、C
aCO3+SrCO3をCa+Srに換算して0.01〜
0.50原子%添加した多数の磁器組成物即ち磁器材料
を表1〜表4に示すように用意した。また、表1〜表5
に示す比較例の磁器材料も同様に用意した。なお、表1
〜表5における副成分の原子%(金属元素又はSiの百
分率換算)は、Znの原子の数を100とし、このZn
の原子の数に対するPr,Co、Cr、Al又はGa又
はIn,Ca,Srの原子の数の比で示されている。例
えば、試料番号2の金属元素及びSiの組成は、次の化
学式即ち組成式で示すことができる。Zn100Pr0.02
Co2.0Cr0.2Al0.005Si0.2Ca0.2Sr0.2表1〜
表5の試料にはZn0が示されていないが、Znは10
0原子%である。表1〜表5の*印が付けられている試
料番号は比較例を示す。
In order to obtain a voltage non-linear resistor according to the present invention and a comparative example, zinc oxide Zn0 powder as a main component,
Pr (praseodymium), Co (cobalt), Cr (chromium), Al (aluminium) or Ga as a subcomponent
(Gallium) or In (indium), Si (silicon),
Each compound of Ca (calcium) and Sr (strontium) was prepared. Each of the sub-component compounds is praseodymium oxide Pr 6 O 11 , cobalt oxide Co 3 O 4, and chromium oxide C
r 2 O 3 , aluminum oxide Al 2 O 3 or gallium oxide Ga 2 O 3 or indium oxide In 2 O 3 and silicon oxide Si
O 2 , calcium carbonate CaCO 3, and strontium carbonate SrCO 3 were used. That is, the Zn0 as the main component to obtain a non-linear resistor according to the present invention, from 0.05 to 3.00 atomic% Pr 6 O 11 as a secondary component in terms of Pr, the Co 3 O 4 Co 0.1 to 5.0 atomic% in terms of
Cr 2 O 3 is converted to Cr to 0.01 to 0.50 atomic%,
Al 2 O 3 or a Ga 2 O 3 or In 2 O 3 in terms of Al or Ga, or an In 0.001 to 0.020 atomic%, SiO
2 converted to Si, 0.001 to 0.500 atomic%, C
aCO 3 + SrCO 3 is converted to Ca + Sr from 0.01 to
Numerous porcelain compositions, i.e., porcelain materials, to which 0.50 at% was added were prepared as shown in Tables 1 to 4. Tables 1 to 5
The porcelain material of the comparative example shown in FIG. Table 1
The atomic% (in terms of percentage of metal element or Si) of the subcomponents in Table 5 is 100 with the number of Zn atoms being 100.
Is shown as a ratio of the number of atoms of Pr, Co, Cr, Al or Ga or In, Ca, Sr to the number of atoms of. For example, the composition of the metal element and Si of Sample No. 2 can be represented by the following chemical formula, that is, the composition formula. Zn 100 Pr 0.02
Co 2.0 Cr 0.2 Al 0.005 Si 0.2 Ca 0.2 Sr 0.2
Although Zn0 is not shown in the sample of Table 5, Zn is 10
0 atomic%. Sample numbers marked with * in Tables 1 to 5 indicate comparative examples.

【0012】[0012]

【表1】 [Table 1]

【0013】[0013]

【表2】 [Table 2]

【0014】[0014]

【表3】 [Table 3]

【0015】[0015]

【表4】 [Table 4]

【0016】[0016]

【表5】 [Table 5]

【0017】次に、各試料の磁器材料に有機バインダ
ー、有機溶剤及び有機可塑剤を加え、ボールミルで24
時間混合し、スラリーを作成した。次に、各スラリーを
使用してドクタープレード法により厚さ30μmのセラ
ミックグリーンシートを作成し、このシート上にパラジ
ウムペーストから成る導電性ペーストをスクリーン印刷
し、内部電極用導体層を形成した。次に、対の内部電極
が得られるように2枚のグリーンシートを重ね、更に上
下にダミーのグリーンシートを重ねた積層体を形成し、
これらを加熱、圧着した後に所定のチップ形状になるよ
うに切断してグリーンチップとした。このグリーンチッ
プを300℃で3時間の条件で脱バインダーを行った後
に1200℃で2時間焼成し焼結体を得た。図1は、第
1、第2及び第3の層1,2,3で示されている焼結体
と第1及び第2の内部電極4,5と第1及び第2の外部
端子電極6,7とからなるバリスタ(電圧非直線抵抗体
素子)を示す。第1及び第2の内部電極4,5間に配置
された電圧非直線抵抗体から成る第1の層1は、第1及
び第2の内部電極4,5に電圧が印加された時に非直線
性抵抗を示す。この例では第2及び第3の層2,3も電
圧非直線抵抗体であるが、これ等の一部又は全部を電圧
非直線性を有さない磁器とすること、又は第2及び第3
の層2,3を省くこともできる。第1及び第2の外部端
子電極6,7は各焼結体の端面にAgを主体とした電極
ペーストを塗布し、800℃で焼き付けることによって
形成されている。第1及び第2の外部端子電極6,7は
第1及び第2の内部電極4,5に電気的に接続されてい
る。
Next, an organic binder, an organic solvent and an organic plasticizer were added to the porcelain material of each sample, and the mixture was subjected to a ball mill.
Mix for hours to make a slurry. Next, a ceramic green sheet having a thickness of 30 μm was formed by a doctor blade method using each slurry, and a conductive paste composed of a palladium paste was screen-printed on the sheet to form a conductor layer for an internal electrode. Next, two green sheets are overlapped so that a pair of internal electrodes can be obtained, and a stacked body in which dummy green sheets are further stacked vertically is formed.
After these were heated and pressed, they were cut into a predetermined chip shape to obtain a green chip. After debinding the green chip at 300 ° C. for 3 hours, the green chip was fired at 1200 ° C. for 2 hours to obtain a sintered body. FIG. 1 shows a sintered body represented by first, second and third layers 1, 2, 3 and first and second internal electrodes 4 and 5, and first and second external terminal electrodes 6. , 7 are varistors (voltage non-linear resistor elements). The first layer 1 made of a voltage non-linear resistor disposed between the first and second internal electrodes 4 and 5 is non-linear when a voltage is applied to the first and second internal electrodes 4 and 5. Sexual resistance. In this example, the second and third layers 2 and 3 are also voltage non-linear resistors, but part or all of them may be made of porcelain having no voltage non-linearity.
Layers 2 and 3 can be omitted. The first and second external terminal electrodes 6 and 7 are formed by applying an electrode paste mainly composed of Ag to the end face of each sintered body and baking the paste at 800 ° C. The first and second external terminal electrodes 6 and 7 are electrically connected to the first and second internal electrodes 4 and 5, respectively.

【0018】本発明に従う焼結体は、Zn0に対して特
許請求の範囲で特定した割合でPr、Co、Cr、Al
又はGa又はIn、Si、Ca+Sr又はSrを含む磁
器抵抗体である。なお、副成分の各元素は、焼成後の焼
結体にそれぞれの酸化物の形で含まれている。
The sintered body according to the present invention contains Pr, Co, Cr, Al at a ratio specified in the claims to Zn0.
Or, it is a porcelain resistor containing Ga or In, Si, Ca + Sr or Sr. Each element of the subcomponent is contained in the sintered body after firing in the form of an oxide.

【0019】各試料の特性は、図1に示すように構成さ
れた各試料のバリスタの外部電極6,7間に1mAを流
した時の厚さ1mm当りのバリスタ電圧V1mA(V/m
m)と、10mAを流した時の厚さ1mm当りのバリス
タ電圧V10mA(V/mm)とを測定し、次式によって非
直線係数αを求めた。 α=log(10/1)/log(V10mA/V1mA
The characteristics of each sample are as follows. The varistor voltage V 1mA per 1 mm thickness (V / m) when 1 mA flows between the external electrodes 6 and 7 of the varistor of each sample configured as shown in FIG.
m) and the varistor voltage V 10 mA (V / mm) per 1 mm thickness when 10 mA was passed, and the nonlinear coefficient α was determined by the following equation. α = log (10/1) / log ( V10mA / V1mA )

【0020】課電寿命特性を測定するために、各試料の
バリスタに対してVlmAの90%にあたる直流定電圧を
85℃の乾燥空気中で500時間通電し、通電前後で1
μAの電流を流した時の電極間電圧VlμAの変化率△V
lμAを求めた。なお、電流を正方向(+方向)に流した
場合と、逆方向(−方向)に流した場合の両方での△V
lμAを求めた。
In order to measure the charging life characteristics, a dc constant voltage equivalent to 90% of VlmA was applied to the varistor of each sample in dry air at 85 ° C. for 500 hours.
Rate of change of electrode voltage V lμA when μA current is applied ΔV
lμA was determined. It should be noted that ΔV in both the case where the current flows in the forward direction (+ direction) and the case where the current flows in the reverse direction (− direction).
lμA was determined.

【0021】表1〜表5から明らかなように、本発明に
従う組成のバリスタは、非直線係数αが20以上、バリ
スタ電圧V1mAが400(V/mm)以上、課電寿命特
性即ち漏れ電流変化率ΔV1μAが+10%〜−10%内
の目標特性を有する。また、本発明によれば、漏れ電流
変化率ΔV1μAの極性による差が小さくなる。即ち非対
称劣化が小さくなる。また、量産時におけるバリスタ間
の特性のバラツキが小さくなる。
As is clear from Tables 1 to 5, the varistors having the composition according to the present invention have a non-linear coefficient α of 20 or more, a varistor voltage V 1 mA of 400 (V / mm) or more, and a service life characteristic, that is, a leakage current. The rate of change ΔV 1 μA has a target characteristic within + 10% to −10 %. Further, according to the present invention, the difference due to the polarity of the leakage current change rate ΔV 1 μA is reduced. That is, asymmetric deterioration is reduced. Further, variations in characteristics between varistors during mass production are reduced.

【0022】試料番号2〜4から明らかなように、Pr
が0.05〜3.0原子%の範囲であれば、上記目標特
性が得られるが、試料番号1及び5に示すようにPrが
0,02原子%及び4.0原子%になると、α及びΔV
1μAが目標特性から外れる。従って、Prの好ましい量
は0.05〜3.0原子%である。
As is clear from Sample Nos. 2 to 4, Pr
Is within the range of 0.05 to 3.0 atomic%, the above-mentioned target characteristics can be obtained. However, when Pr becomes 0.02 atomic% and 4.0 atomic% as shown in sample numbers 1 and 5, α And ΔV
1 μA deviates from the target characteristic. Therefore, the preferred amount of Pr is 0.05 to 3.0 atomic%.

【0023】試料番号7及び8から明らかなようにCo
が0.1及び5.0原子%の場合には目標特性を得ること
ができるが、試料番号6及び9に示すようにCoが0.
05及び6.0原子%となると、α及びΔV1μAが目標
特性から外れる。従って、Coの好ましい量は0.1〜
5.0原子%である。
As is clear from Sample Nos. 7 and 8, Co
Is 0.1 and 5.0 atomic%, the target characteristics can be obtained. However, as shown in Sample Nos. 6 and 9, Co is 0.1 atomic%.
At 05 and 6.0 atomic%, α and ΔV 1 μA deviate from the target characteristics. Therefore, the preferred amount of Co is 0.1 to
5.0 atomic%.

【0024】試料番号11及び12から明らかなよう
に、Crが0.01及び0.5原子%の場合には目標特性
が得られるが、試料番号10及び13から明らかなよう
にCrが0.005及び0.6の場合はすべての項目を目
標特性に収めることができない。従って、Crの好まし
い量は0.01〜0.5原子%である。
As is apparent from Sample Nos. 11 and 12, the target characteristics can be obtained when Cr is 0.01 and 0.5 atomic%. In the case of 005 and 0.6, not all items can be included in the target characteristics. Therefore, the preferred amount of Cr is 0.01 to 0.5 atomic%.

【0025】試料番号15、16、32、33、34、
37、38,39から明らかなようにAl又はGa又はI
nが0.001〜0.02原子%の場合には、目標特性
が得られるが、試料番号14,17,31,35,3
6,40から明らかなようにこれ等が0.0005及び
0.003原子%の場合には、全ての項目を目標特性に
することができない。従って,Al,Ga又はInの好まし
い量は0.001〜0.02原子%である。
Sample Nos. 15, 16, 32, 33, 34,
As is clear from 37, 38 and 39, Al or Ga or I
When n is 0.001 to 0.02 atomic%, target characteristics can be obtained, but sample numbers 14, 17, 31, 35, 3
As is clear from FIGS. 6 and 40, when these are 0.0005 and 0.003 atomic%, not all items can be set as target characteristics. Therefore, the preferred amount of Al, Ga or In is 0.001 to 0.02 atomic%.

【0026】試料番号19,20から明らかなように、
Siが0.001及び0.5原子%の場合には目標特性
が得られるが、試料番号18,21に示すようにSiが
0.0005及び0.6原子%になると全ての項目を目
標特性に収めることができない。従って、Siの好まし
い量は0.001〜0.5原子%である。
As is clear from sample numbers 19 and 20,
When Si is 0.001 and 0.5 at%, the target characteristics are obtained. However, as shown in Sample Nos. 18 and 21, when Si becomes 0.0005 and 0.6 at%, all the items are set to the target characteristics. Can not fit. Therefore, the preferable amount of Si is 0.001 to 0.5 atomic%.

【0027】試料番号23,24,25,26,27,
28から明らかなように,Ca+Srが0.01〜0.
5原子%であり、且つCaとSrとの比Ca/Srが5
0以下の場合には、目標特性を得ることができるが、試
料番号22,29,30に示すように、上記条件を外れ
ると全ての項目を目標特性に収めることができない。従
って、Ca+Srの好ましい量は0.001〜0.5原
子%である。
Sample numbers 23, 24, 25, 26, 27,
As is clear from FIG.
5 atomic% and the ratio Ca / Sr of Ca and Sr is 5
When the value is 0 or less, the target characteristics can be obtained. However, as shown in Sample Nos. 22, 29 and 30, if the above conditions are not satisfied, all items cannot be included in the target characteristics. Therefore, the preferred amount of Ca + Sr is 0.001 to 0.5 atomic%.

【0028】上記表には示されていないが、試料番号1
6のAl0.02原子%の代りにAl0.005原子%
+Ga0.005原子%+In0.005%とし、この
他は試料番号16と同一にしたバリスタを作り、特性を
測定したところ、資料番号16とほぼ同一の特性が得ら
れた。また、AlとGaとInとの合計又はこれ等から
任意に選択された2つの合計を0.001〜0.02原
子%の範囲に収めたバリスタを作り、これ等の特性を測
定したところ、目標特性が得られた。また、同一組成の
多数のバリスタを作り、特性のバラツキを求めたとこ
ろ、本発明に従うもののバラツキは本発明の範囲外のも
のよりも小さかった。
Although not shown in the above table, sample No. 1
0.005 atomic% of Al instead of 0.02 atomic% of Al
A varistor identical to that of Sample No. 16 was prepared, and the characteristics were measured. The same characteristics as those of Reference No. 16 were obtained. Further, a varistor in which the sum of Al, Ga, and In or the sum of two arbitrarily selected from them was contained in the range of 0.001 to 0.02 atomic% was produced, and these characteristics were measured. The target characteristics were obtained. Further, when a number of varistors having the same composition were made and the variation in the characteristics was determined, the variation according to the present invention was smaller than that outside the scope of the present invention.

【0029】[0029]

【変形例】本発明は上述の実施形態に限定されるもので
はなく、例えば次の変形が可能なものである。 (1) 副成分を各元素の酸化物又は炭酸物とは別の化
合物又は元素単体で供給することができる。 (2) バリスタの構造を図1とは異なる構造にすること
ができる。例えば板状の電圧非直線抵抗体の一方の主面
と他方の主面に電極を設けてバリスタとすることができ
る。
[Modifications] The present invention is not limited to the above-described embodiment, and for example, the following modifications are possible. (1) The auxiliary component can be supplied as a compound different from the oxide or carbonate of each element or the element alone. (2) The structure of the varistor can be different from that of FIG. For example, an electrode may be provided on one main surface and the other main surface of a plate-shaped voltage non-linear resistor to form a varistor.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態に従うバリスタを示す断面
図である。
FIG. 1 is a sectional view showing a varistor according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 電圧非直線抵抗体層 4,5 内部電極 6,7 外部端子電極 1 voltage non-linear resistor layer 4,5 internal electrode 6,7 external terminal electrode

───────────────────────────────────────────────────── フロントページの続き (72)発明者 松田 明久 東京都台東区上野6丁目16番20号 太陽誘 電株式会社内 Fターム(参考) 4G030 AA08 AA09 AA11 AA22 AA28 AA32 AA34 AA36 AA37 BA04 5E034 CA08 CB01 DA10 DC01 DE07 EA09 5G303 AA10 AB14 BA12 CA01 CB01 CB06 CB09 CB10 CB26 CB30 CB32 CB38 CB42  ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Akihisa Matsuda 6-16-20 Ueno, Taito-ku, Tokyo Taiyo Denki Co., Ltd. F-term (reference) 4G030 AA08 AA09 AA11 AA22 AA28 AA32 AA34 AA36 AA37 BA04 5E034 CA08 CB01 DA10 DC01 DE07 EA09 5G303 AA10 AB14 BA12 CA01 CB01 CB06 CB09 CB10 CB26 CB30 CB32 CB38 CB42

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ZnO(酸化亜鉛)を主成分として、こ
れに副成分として、Pr(プラセオジム)を0.05〜
3.00原子%、Co(コバルト)を0.1〜5.0原
子%、Cr(クロム)を0.01〜0.50原子%、A
l(アルミニウム)とGa(ガリウム)とIn(インジ
ウム)との内の少なくとも1種を0.001〜0.02
0原子%、Si(珪素)を0.001〜0.500原子
%が、及びCa+Sr(但し、Ca/Srが0〜50)
を0.01〜0.50原子%添加されていることを特徴
とする電圧非直線抵抗体。
1. ZnO (zinc oxide) as a main component and Pr (praseodymium) as an auxiliary component in an amount of 0.05 to
3.00 atomic%, Co (cobalt) 0.1 to 5.0 atomic%, Cr (chromium) 0.01 to 0.50 atomic%, A
at least one of l (aluminum), Ga (gallium) and In (indium) is 0.001 to 0.02
0 atomic%, 0.001 to 0.500 atomic% of Si (silicon), and Ca + Sr (Ca / Sr is 0 to 50)
Is added in an amount of 0.01 to 0.50 atomic%.
【請求項2】 ZnO(酸化亜鉛)を主成分として、こ
れに副成分としてPr化合物をPr(プラセオジム)に
換算して0.05〜3.00原子%、Co化合物をCo
(コバルト)に換算して0.1〜5.0原子%、Cr化
合物をCr(クロム)に換算して0.01〜0.50原
子%、Al化合物とGa化合物とIn化合物との内の少
なくとも1種をAl(アルミニウム)とGa(ガリウ
ム)とIn(インジウム)とにそれぞれ換算して0.0
01〜0.020原子%、Si化合物をSi(珪素)に
換算して0.001〜0.500原子%が、及びCa化
合物+Sr化合物をCa+Sr(但し、Ca/Srが0
〜50)に換算して0.01〜0.50原子%添加され
ていることを特徴とする電圧非直線抵抗体磁器組成物。
2. A Zn compound (ZnO) as a main component, and a Pr compound as a sub-component thereof in an amount of 0.05 to 3.00 atomic% in terms of Pr (praseodymium).
(Cobalt) in terms of 0.1 to 5.0 atom%, Cr compound in terms of Cr (chromium) 0.01 to 0.50 atom%, of Al compound, Ga compound and In compound. At least one kind is converted into Al (aluminum), Ga (gallium), and In (indium), respectively, and 0.0
01 to 0.020 atomic%, 0.001 to 0.500 atomic% of Si compound in terms of Si (silicon), and Ca + Sr compound of Ca + Sr (where Ca / Sr is 0
To 50), wherein the composition is added in an amount of from 0.01 to 0.50 atomic%.
JP2001040847A 2001-02-16 2001-02-16 Voltage nonlinear resistor and porcelain composition Expired - Fee Related JP3822798B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001040847A JP3822798B2 (en) 2001-02-16 2001-02-16 Voltage nonlinear resistor and porcelain composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001040847A JP3822798B2 (en) 2001-02-16 2001-02-16 Voltage nonlinear resistor and porcelain composition

Publications (2)

Publication Number Publication Date
JP2002246207A true JP2002246207A (en) 2002-08-30
JP3822798B2 JP3822798B2 (en) 2006-09-20

Family

ID=18903371

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001040847A Expired - Fee Related JP3822798B2 (en) 2001-02-16 2001-02-16 Voltage nonlinear resistor and porcelain composition

Country Status (1)

Country Link
JP (1) JP3822798B2 (en)

Cited By (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20070063453A (en) * 2005-12-14 2007-06-19 티디케이가부시기가이샤 Varistors and Varistor Manufacturing Method
JP2008028029A (en) * 2006-07-19 2008-02-07 Tdk Corp Varistor, and light-emitting device
DE102008026710A1 (en) 2007-06-13 2008-12-24 Tdk Corp. Electronic component made of ceramic
DE102008031663A1 (en) 2007-07-10 2009-01-29 Tdk Corp. Ceramic connection for non-linear resistors, electronic component and multi-layer chip varistor
DE102008033664A1 (en) 2007-07-19 2009-01-29 Tdk Corp. varistor
US7507356B2 (en) 2007-03-30 2009-03-24 Tdk Corporation Voltage non-linear resistance ceramic composition and voltage non-linear resistance element
US7639470B2 (en) 2005-12-14 2009-12-29 Tdk Corporation Varistor element
US7649435B2 (en) 2005-04-14 2010-01-19 Tdk Corporation Multilayer chip varistor
US7683753B2 (en) 2007-03-30 2010-03-23 Tdk Corporation Voltage non-linear resistance ceramic composition and voltage non-linear resistance element
US7705708B2 (en) 2005-04-01 2010-04-27 Tdk Corporation Varistor and method of producing the same
US7705709B2 (en) 2006-03-27 2010-04-27 Tdk Corporation Varistor and light-emitting apparatus
EP2073222A3 (en) * 2007-12-20 2010-04-28 TDK Corporation Varistor
US7754109B2 (en) 2007-03-02 2010-07-13 Tdk Corporation Varistor element
US7791449B2 (en) 2006-03-27 2010-09-07 Tdk Corporation Varistor and light-emitting apparatus
WO2010089279A3 (en) * 2009-02-03 2010-10-14 Epcos Ag Varistor ceramic, multi-layer structural element comprising said varistor ceramic, production method for said varistor ceramic
KR100999830B1 (en) 2005-12-30 2010-12-10 모토로라 인코포레이티드 Capacitance laminates and printed circuit board devices and methods
US7911317B2 (en) 2008-09-16 2011-03-22 Tdk Corporation Multilayer chip varistor and electronic component
US7932807B2 (en) 2008-03-28 2011-04-26 Tdk Corporation Varistor
US7932806B2 (en) 2007-03-30 2011-04-26 Tdk Corporation Varistor and light emitting device
JP2011219283A (en) * 2010-04-05 2011-11-04 Tdk Corp Nonlinear voltage resistor ceramic composition and electronic component
JP2011233863A (en) * 2010-04-05 2011-11-17 Tdk Corp Voltage nonlinear resistor porcelain composition and electronic component
US8125307B2 (en) 2008-01-25 2012-02-28 Tdk Corporation Aggregate substrate, production method of aggregate substrate, and varistor
US8508325B2 (en) 2010-12-06 2013-08-13 Tdk Corporation Chip varistor and chip varistor manufacturing method
US8525634B2 (en) 2011-08-29 2013-09-03 Tdk Corporation Chip varistor
US8552831B2 (en) 2011-08-29 2013-10-08 Tdk Corporation Chip varistor
TWI474345B (en) * 2009-02-03 2015-02-21 Epcos Ag Varistor ceramic, multilayer component comprising the varistor ceramic, and production method for the varistor ceramic
US9142340B2 (en) 2012-12-17 2015-09-22 Tdk Corporation Chip varistor
US9242902B2 (en) 2010-04-05 2016-01-26 Tdk Corporation Nonlinear resistor ceramic composition and electronic component

Cited By (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7705708B2 (en) 2005-04-01 2010-04-27 Tdk Corporation Varistor and method of producing the same
US7649435B2 (en) 2005-04-14 2010-01-19 Tdk Corporation Multilayer chip varistor
KR20070063453A (en) * 2005-12-14 2007-06-19 티디케이가부시기가이샤 Varistors and Varistor Manufacturing Method
US7639470B2 (en) 2005-12-14 2009-12-29 Tdk Corporation Varistor element
KR100999830B1 (en) 2005-12-30 2010-12-10 모토로라 인코포레이티드 Capacitance laminates and printed circuit board devices and methods
US7791449B2 (en) 2006-03-27 2010-09-07 Tdk Corporation Varistor and light-emitting apparatus
US7705709B2 (en) 2006-03-27 2010-04-27 Tdk Corporation Varistor and light-emitting apparatus
JP2008028029A (en) * 2006-07-19 2008-02-07 Tdk Corp Varistor, and light-emitting device
US7754109B2 (en) 2007-03-02 2010-07-13 Tdk Corporation Varistor element
US7683753B2 (en) 2007-03-30 2010-03-23 Tdk Corporation Voltage non-linear resistance ceramic composition and voltage non-linear resistance element
US7932806B2 (en) 2007-03-30 2011-04-26 Tdk Corporation Varistor and light emitting device
US7507356B2 (en) 2007-03-30 2009-03-24 Tdk Corporation Voltage non-linear resistance ceramic composition and voltage non-linear resistance element
DE102008026710A1 (en) 2007-06-13 2008-12-24 Tdk Corp. Electronic component made of ceramic
US7969277B2 (en) 2007-07-10 2011-06-28 Tdk Corporation Nonlinear resistor ceramic composition, electronic component, and multilayer chip varistor
DE102008031663A1 (en) 2007-07-10 2009-01-29 Tdk Corp. Ceramic connection for non-linear resistors, electronic component and multi-layer chip varistor
US7994893B2 (en) 2007-07-19 2011-08-09 Tdk Corporation Varistor
DE102008033664A1 (en) 2007-07-19 2009-01-29 Tdk Corp. varistor
KR101015035B1 (en) * 2007-07-19 2011-02-16 티디케이가부시기가이샤 Varistor
KR101013017B1 (en) * 2007-12-20 2011-02-10 티디케이가부시기가이샤 Varistor
EP2073222A3 (en) * 2007-12-20 2010-04-28 TDK Corporation Varistor
US8044761B2 (en) 2007-12-20 2011-10-25 Tdk Corporation Varistor
US8125307B2 (en) 2008-01-25 2012-02-28 Tdk Corporation Aggregate substrate, production method of aggregate substrate, and varistor
US7932807B2 (en) 2008-03-28 2011-04-26 Tdk Corporation Varistor
US7911317B2 (en) 2008-09-16 2011-03-22 Tdk Corporation Multilayer chip varistor and electronic component
US8487735B2 (en) 2009-02-03 2013-07-16 Epcos Ag Varistor ceramic, multilayer component comprising the varistor ceramic, and production method for the varistor ceramic
WO2010089279A3 (en) * 2009-02-03 2010-10-14 Epcos Ag Varistor ceramic, multi-layer structural element comprising said varistor ceramic, production method for said varistor ceramic
TWI474345B (en) * 2009-02-03 2015-02-21 Epcos Ag Varistor ceramic, multilayer component comprising the varistor ceramic, and production method for the varistor ceramic
JP2011233863A (en) * 2010-04-05 2011-11-17 Tdk Corp Voltage nonlinear resistor porcelain composition and electronic component
JP2011219283A (en) * 2010-04-05 2011-11-04 Tdk Corp Nonlinear voltage resistor ceramic composition and electronic component
US9242902B2 (en) 2010-04-05 2016-01-26 Tdk Corporation Nonlinear resistor ceramic composition and electronic component
US8508325B2 (en) 2010-12-06 2013-08-13 Tdk Corporation Chip varistor and chip varistor manufacturing method
US8525634B2 (en) 2011-08-29 2013-09-03 Tdk Corporation Chip varistor
US8552831B2 (en) 2011-08-29 2013-10-08 Tdk Corporation Chip varistor
US9142340B2 (en) 2012-12-17 2015-09-22 Tdk Corporation Chip varistor

Also Published As

Publication number Publication date
JP3822798B2 (en) 2006-09-20

Similar Documents

Publication Publication Date Title
JP3822798B2 (en) Voltage nonlinear resistor and porcelain composition
JP4915153B2 (en) Multilayer varistor
JP4893371B2 (en) Varistor element
JPH1070012A (en) Varistor manufacturing method
JP3399349B2 (en) Laminated varistor and method of manufacturing the same
JPS6243326B2 (en)
JP2004022976A (en) Stacked voltage nonlinear resistor and method of manufacturing the same
TW201606813A (en) Voltage nonlinear resistive element and method for manufacturing the same
JP4184172B2 (en) Voltage nonlinear resistor ceramic composition, electronic component and multilayer chip varistor
JPH11340090A (en) Manufacturing method of grain boundary insulated multilayer ceramic capacitor
JP2976250B2 (en) Manufacturing method of multilayer varistor
JP5715961B2 (en) Varistor ceramic, multilayer component including varistor ceramic, and method for producing varistor ceramic
JPH05283209A (en) Laminated varistor
JP2666605B2 (en) Stacked varistor
JP3757794B2 (en) Semiconductor porcelain for thermistor and chip type thermistor using the same
JP2004342745A (en) Voltage nonlinear resistor
JPH0714702A (en) Multilayer semiconductor ceramic having positive temperature-resistance characteristics
WO2020213320A1 (en) Laminated varistor
JP2625178B2 (en) Varistor manufacturing method
JPH0373121B2 (en)
JP2707707B2 (en) Grain boundary insulating semiconductor ceramic capacitor and method of manufacturing the same
JP2737280B2 (en) Ceramic capacitor and method of manufacturing the same
JPH10149904A (en) Varistor manufacturing method
JP2962056B2 (en) Voltage non-linear resistor
WO2012111385A1 (en) Positive temperature-coefficient thermistor

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20050524

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20050818

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20051014

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20060614

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20060623

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090630

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100630

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100630

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110630

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120630

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130630

Year of fee payment: 7

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees