TW202304075A - Electrical test apparatus including at least one unit body, an alignment unit connected to the unit body and an outer frame unit for mounting the unit body and the alignment unit - Google Patents
Electrical test apparatus including at least one unit body, an alignment unit connected to the unit body and an outer frame unit for mounting the unit body and the alignment unit Download PDFInfo
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Abstract
Description
本發明是有關於一種電性測試裝置,特別是指一種用於測試電子元件的電性測試裝置。The invention relates to an electrical testing device, in particular to an electrical testing device for testing electronic components.
現今電子元件的電路配置漸趨精密,體積或尺寸也越來越微小,配合待測元件而組裝電性測試裝置時,使多個模組化零件之間形成電性連接的組裝過程中,勢必需要更精準地考量到各個模組化零件的定位以及電性接點之間位置的對準,才能確保組裝的良率,以發揮正常的電性測試功能。Nowadays, the circuit configuration of electronic components is becoming more and more sophisticated, and the volume or size is becoming smaller and smaller. When assembling the electrical test device with the component under test, it is necessary to form an electrical connection between multiple modular parts during the assembly process. It is necessary to consider the positioning of each modular part and the alignment of the electrical contacts more precisely to ensure the assembly yield and to perform normal electrical testing functions.
參閱圖1,為一現有的電性測試裝置1,包含至少一個預先製成而達成模組化的單元體10,及一界定出一供設置該至少一單元體10之安裝空間120的框體12。該至少一單元體10是沿一輔助線L延伸,並具有多個沿一延伸方向E延伸一段預定長度且垂直該延伸方向E而相疊合的基板101,及多個自相鄰之基板101間向外延伸的接觸臂102。每一個基板101具有二分別位於該延伸方向E相反兩端的端部109,及一個一體銜接於該等端部109之間的基部108,該等接觸臂102是設置於每二個相鄰基板101的該等基部108之間。該等接觸臂102可形成電性接點,對應連接待測電子元件或者驅動設備的電連接點,以達成電性測試的目的。Referring to Fig. 1, it is an existing
在組裝本電性測試裝置1的過程中,為了讓以該等基板101相互疊合的該至少一單元體10可確實安裝於該安裝空間120中,該框體12具有二個位於相反側且彼此間隔距離等於該預定長度,並用以對應該等基板101之該等端部109的側邊條121,每一個側邊條121具有多個彼此間隔而呈凹陷狀,且形狀分別對應該等基板101之同側的端部109的卡槽129。藉由使該等基板101的該等端部109分別設置於該等卡槽129,形成組裝時的對準以及定位機制,以確保該至少一單元體10能穩定地安裝於該框體12。In the process of assembling the
然而,由於該至少一單元體10包括多個相互疊合的該等基板101,故每一個基板101都必須準確製成該預定長度,且該等端部109的形狀也都必須精準,才能吻合該二側邊條121之間的長度,並且對應設置於該等卡槽129,甚至在貼合該等基板101時,也必須近乎完美地對齊,才能確保該至少一單元體10能藉由該等卡槽129的定位機制安裝於該框體12。因此,該框體12上的對準定位機制,雖然能由多個方向確保該至少一單元體10的穩定安裝,但在製造各零件難免產生些許公差的情況下,只要有任一個基板101的長度失準,或者任一個端部109的形狀偏差,甚至在疊合該等基板101時對位不夠精準,預先製成的該至少一單元體10都有可能無法安裝於該安裝空間120中,無形之中造成組裝上的良率降低,增加了製造方的無謂負擔。However, since the at least one
因此,本發明之目的,即在提供一種能提供有助於提高組裝良率之對位機制的電性測試裝置。Therefore, the object of the present invention is to provide an electrical testing device that can provide an alignment mechanism that helps to improve assembly yield.
於是,本發明電性測試裝置,包含至少一單元體、一連接於該至少一單元體的對位單元,及一供該至少一單元體與該對位單元安裝的外框單元。Therefore, the electrical testing device of the present invention includes at least one unit body, an alignment unit connected to the at least one unit body, and an outer frame unit for installing the at least one unit body and the alignment unit.
該至少一單元體包括多片沿一第一方向延伸且沿一垂直於該第一方向之第二方向疊合的基板,及多個自疊合之相鄰二基板之間,以一垂直於該第一方向及該第二方向之第三方向向外延伸的接觸臂,每一個基板具有二個在該第一方向上位於相反兩端的端面,及二個在該第二方向上位於相反兩端的表面,定義該至少一單元體在該第二方向相反兩側之基板分別向外顯露的表面為二個待接面。The at least one unit body includes a plurality of substrates extending along a first direction and stacked along a second direction perpendicular to the first direction, and between a plurality of self-stacked adjacent two substrates, with a direction perpendicular to the first direction The contact arms extending outward in the third direction of the first direction and the second direction, each substrate has two end faces located at opposite ends in the first direction, and two end faces located at opposite ends in the second direction The surface of the end defines the exposed surfaces of the substrates on opposite sides of the at least one unit body in the second direction as two surfaces to be connected.
該對位單元包括至少一個連接於該等待接面至少其中之一的輔助件,以在至少其中一個待接面上形成一對位結構。The alignment unit includes at least one auxiliary member connected to at least one of the waiting surfaces to form an alignment structure on at least one of the waiting surfaces.
該外框單元包括一界定出一安裝空間的本體,及至少一個形成於該本體上,且形狀與該對位結構相吻合的配位結構。The outer frame unit includes a main body defining an installation space, and at least one coordination structure formed on the main body and whose shape matches the alignment structure.
本發明之功效在於:因該對位單元的該至少一輔助件是連接於該至少一單元體之基板的表面,在所述表面勢必相對平整的情況下,藉由該至少一輔助件來形成對位結構,不需考量到該至少一單元體的該等基板是否對齊而貼合,對每一個基板的長度規格及該等基板的長度一致性也不需精準要求,仍能藉由所述對位結構與該外框單元之配位結構的對應性確保對位的精準度,並藉此提高組裝的良率。The effect of the present invention is: because the at least one auxiliary member of the alignment unit is connected to the surface of the substrate of the at least one unit body, under the condition that the surface must be relatively flat, the at least one auxiliary member is used to form The alignment structure does not need to consider whether the substrates of the at least one unit are aligned and bonded, and does not require precise requirements for the length specification of each substrate and the length consistency of the substrates, and can still be achieved by the above-mentioned The correspondence between the alignment structure and the coordination structure of the frame unit ensures the accuracy of the alignment, thereby improving the assembly yield.
在本發明被詳細描述之前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are denoted by the same numerals.
參閱圖2,為本發明電性測試裝置之一第一實施例,本第一實施例包含一個單元體2、一連接於該單元體2的對位單元3,及一供該單元體2與該對位單元3安裝的外框單元4。Referring to Fig. 2, it is a first embodiment of the electrical testing device of the present invention, this first embodiment comprises a
該單元體2包括多片沿一第一方向D1延伸且沿一垂直於該第一方向D1之第二方向D2疊合的基板21,及多個自疊合之相鄰二基板21之間,以一垂直於該第一方向D1及該第二方向D2之第三方向D3向外延伸,並用於與電性接點直接接觸的接觸臂22。每一個基板21具有二個在該第一方向D1上位於相反兩端的端面211,及二個在該第二方向D2上位於相反兩端的表面212。其中,所述基板21的該等表面212是在原料出廠時即形成的平整面,相較於將所述基板21之原料切割為特定長度而形成的該等端面211,平整度的呈現勢必較為穩定且較能掌握。The
定義該單元體2在該第二方向D2相反兩側之基板21分別向外顯露的表面212為二個待接面200,該對位單元3包括多個連接於該等待接面200的輔助件31,以在該等待接面200上分別形成二個對位結構300。具體而言,在本第一實施例中,每一個待接面200上連接有二個彼此間隔且沿該第一方向D1之長度不同的輔助件31,以在個別的待接面200藉由該等輔助件31彼此間隔而界定出的空間,形成一個呈凹槽狀的對位結構300。其中,所述的兩個呈凹槽狀的對位結構300,較佳是沿該第二方向D2彼此錯位且位置不對稱,藉此達成辨識安裝方向的防呆效果。Define the exposed
同時參閱圖2與圖3,該外框單元4包括一界定出一安裝空間410的本體41,及二個形成於該本體41上,且形狀分別與該等對位結構300相吻合的配位結構42。每一個本體41具有一圍繞該安裝空間410的內環面411、一自該內環面411向內延伸並用以供該單元體2之該等基板21搭接的搭接面412、一自該搭接面412彎折的凸緣面413,及一銜接於該凸緣面413並以遠離該安裝空間410之方向延伸的外側面414。其中,該搭接面412與該外側面414之間的距離,小於該等接觸臂22遠離該等基板21的長度。而在本第一實施例中,為了使該等配位結構42能配合呈現凹槽狀的該等對位結構300,每一個配位結構42皆是呈現與所述凹槽狀之形狀吻合的凸塊狀。Referring to Fig. 2 and Fig. 3 at the same time, the
參閱圖4並配合圖2,要先說明的是,在實際實施時,為了確保完整組裝,還會配合另一個特徵概與該本體41相同的框體41’,分別藉由該本體41與該框體41’相對組裝於該單元體2的相反兩側。藉由該對位單元3形成的該等對位結構300與該外框單元4的該等配位結構42相互吻合的設計,除了能藉此對準該單元體2安裝於該外框單元4的相對位置,由於該等輔助件31是安裝於原料出廠時即相對平整的該等表面212(待接面200)上,相較於因應每一個端面211而設計對準機制而言,不但不需考量該等端面211的完美對齊,針對加工時難免產生的公差也有較佳的容錯性。Referring to Fig. 4 and in conjunction with Fig. 2, it should be explained that in actual implementation, in order to ensure complete assembly, another frame 41' with the same characteristics as the
參閱圖5並配合圖2,使用本第一實施例檢測一電子元件9時,該電子元件9是沿該第三方向D3,自本第一實施例的其中一側接觸延伸至該等外框單元4以外的該等接觸臂22。該單元體2之該等接觸臂22的分布位置,是對應欲檢測之電子元件9的電性接點。而該單元體2相反於接觸該電子元件9之一側,則可與執行電性測試的驅動設備(圖中未繪示)連接,以針對與該單元體2構成電性連接的該電子元件9執行電性測試,藉由電訊號的傳導正常與否,即可判斷該電子元件9是否為良品。Referring to FIG. 5 and in conjunction with FIG. 2, when using the first embodiment to detect an
值得特別說明的是,通常為了確保該電子元件9是與該單元體2穩定接觸,在執行測試時還會配合另一對該電子元件9施加朝向本第一實施例的加壓設備(圖中未繪示)。為了避免所述加壓設備所施加的外力過大而造成該等接觸臂22的毀損,該等接觸臂22遠離該等基板21的長度與該搭接面412與該外側面414之間距離的差距,即形成一段安全的作動距離,只要該電子元件9壓迫該等接觸臂22而使該等接觸臂22產生所述作動距離的形變量,該電子元件9即會接觸該外側面414而無法繼續朝向該單元體2移動,避免該等接觸臂22產生過大的形變量而受損,藉此形成檢測時的安全保護機制。It is worth noting that, usually in order to ensure that the
參閱圖6,為本第一實施例的另一種實施態樣,其中一個待接面200上只連接單一個輔助件31,形成呈現一凸塊狀的對位結構300,而該外框單元4包括一呈凹槽狀的配位結構42。相較於如圖2所呈現的實施態樣而言,僅是所述對位結構300與所述配位結構42的形狀不同,除此以外即能達成與另一種實施態樣完全相同的功效。值得特別說明的是,在本第一實施例中,雖然該等輔助件31為概呈長方體的形狀,但實際實施時,只要能確實固定於該等表面212(待接面200),亦可採用不同形狀的該等輔助件31來形成不同形狀的對位結構300,而所述配位結構42同樣只要形狀吻合即可,並不以本第一實施例所呈現的型態為限。Referring to FIG. 6 , it is another implementation of the first embodiment, in which only a single
參閱圖7與圖8,為本發明電性測試裝置的一第二實施例,本第二實施例與該第一實施例的差別在於:本第二實施例包含二個單元體2,而該對位單元3還包括一個沿該第二方向D2設置於該等單元體2之間,且用以使該等單元體2與該對位單元3符合該安裝空間410之型態的配搭件32。只要配合該對位單元3的該配搭件32,即可配合檢測需求,更自由地設計該等單元體2的尺寸以及型態。Referring to FIG. 7 and FIG. 8, it is a second embodiment of the electrical testing device of the present invention. The difference between this second embodiment and the first embodiment is that this second embodiment includes two
要另外說明的是,在因應實際的檢測需求或者製造上的限制時,亦可採用三個以上的單元體2,而該等單元體2與該安裝空間410之間的形狀差異,即可藉由連接一個或二個以上的配搭件32來補償的方式,使得該等單元體2與該等配搭件32能符合該安裝空間410的型態而確實安裝,除了能達成與該第一實施例相同的所有功效以外,還能進一步優化因應檢測需求的設計自由度。It should be noted that more than three
綜上所述,本發明電性測試裝置,能藉由將該對位單元3安裝於該至少一單元體2之待接面200的方式,在不需考量到該等基板21是否對齊且能忽略加工公差的情況下,利用所述對位結構300與所述配位結構42的對應性確保對位的精準度,並藉此提高組裝的良率,故確實能達成本發明之目的。In summary, the electrical testing device of the present invention can install the
惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。But what is described above is only an embodiment of the present invention, and should not limit the scope of the present invention. All simple equivalent changes and modifications made according to the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of the present invention.
2:單元體
200:待接面
21:基板
211:端面
212:表面
22:接觸臂
3:對位單元
300:對位結構
31:輔助件
32:配搭件
4:外框單元
41、41’:本體
41’:框體
410:安裝空間
411:內環面
412:搭接面
413:凸緣面
414:外側面
42:配位結構
9:電子元件
D1:第一方向
D2:第二方向
D3:第三方向
2: unit body
200: to be interviewed
21: Substrate
211: end face
212: surface
22: Contact arm
3: Alignment unit
300: Parallel structure
31: Auxiliary parts
32: Matching pieces
4:
本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是一立體分解圖,說明一現有的電性測試裝置; 圖2是一立體分解圖,說明本發明電性測試裝置的一第一實施例; 圖3是一側視角度的示意圖,說明該第一實施例的一單元體組裝於一外框單元的情況; 圖4是一立體圖,說明該第一實施例組裝完成的型態; 圖5是一示意圖,說明使用該第一實施例檢測一電子元件的情況; 圖6是一類似圖2的立體分解圖,說明該第一實施例的另一種實施態樣; 圖7是一立體分解圖,說明本發明電性測試裝置的一第二實施例;及 圖8是一俯視圖,說明該第二實施例組裝完成的情況以及相關功效。 Other features and effects of the present invention will be clearly presented in the implementation manner with reference to the drawings, wherein: Fig. 1 is a three-dimensional exploded view illustrating an existing electrical testing device; Fig. 2 is a three-dimensional exploded view illustrating a first embodiment of the electrical testing device of the present invention; Fig. 3 is a schematic view from a side view, illustrating a situation in which a unit body of the first embodiment is assembled in an outer frame unit; Fig. 4 is a perspective view illustrating the assembled form of the first embodiment; Fig. 5 is a schematic diagram illustrating the situation of using the first embodiment to detect an electronic component; Fig. 6 is a three-dimensional exploded view similar to Fig. 2, illustrating another implementation mode of the first embodiment; Figure 7 is an exploded perspective view illustrating a second embodiment of the electrical testing device of the present invention; and FIG. 8 is a top view illustrating the assembled situation of the second embodiment and related effects.
2:單元體 2: unit body
200:待接面 200: to be interviewed
21:基板 21: Substrate
211:端面 211: end face
212:表面 212: surface
22:接觸臂 22: Contact arm
3:對位單元 3: Alignment unit
300:對位結構 300: Parallel structure
31:輔助件 31: Auxiliary parts
4:外框單元 4: Frame unit
41:本體 41: Ontology
41’:框體 41': frame
410:安裝空間 410: installation space
411:內環面 411: inner annulus
412:搭接面 412: lap surface
413:凸緣面 413: Flange face
414:外側面 414: Outer side
42:配位結構 42: Coordination structure
D1:第一方向 D1: the first direction
D2:第二方向 D2: Second direction
D3:第三方向 D3: Third direction
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