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TW201343728A - Method of manufacturing adhesive composition, adhesive composition, and adhesive film - Google Patents

Method of manufacturing adhesive composition, adhesive composition, and adhesive film Download PDF

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TW201343728A
TW201343728A TW102103991A TW102103991A TW201343728A TW 201343728 A TW201343728 A TW 201343728A TW 102103991 A TW102103991 A TW 102103991A TW 102103991 A TW102103991 A TW 102103991A TW 201343728 A TW201343728 A TW 201343728A
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wafer
adhesive composition
resin
support
adhesive
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TWI571482B (en
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Hirofumi Imai
Toshiyuki Ogata
Atsushi Kubo
Takahiro Yoshioka
Takuya Noguchi
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Tokyo Ohka Kogyo Co Ltd
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Abstract

This invention provides an adhesive composition which can prevent the occurrence of residues on a wafer through solvent dissolution and cleaning after bonding of the wafer with a wafer support. The manufacturing method for the adhesive composition used for bonding the wafer with the wafer support comprises a purification step for removing an adhesion resister contained in the adhesive composition.

Description

接著劑組成物的製造方法、接著劑組成物及接著薄膜 Method for producing a subsequent composition, an adhesive composition, and an adhesive film

本發明係關於接著劑組成物之製造方法、接著劑組成物及接著薄膜。 The present invention relates to a method for producing an adhesive composition, an adhesive composition, and an adhesive film.

隨著行動電話、數位AV設備及IC卡等之高功能化,藉由使搭載之半導體矽晶片(以下稱為晶片)小型化及薄型化,使封裝內之矽高積體化之要求增高。例如,使以CSP(晶片尺寸封裝)或MCP(多晶片封裝)為代表之複數個晶片單一封裝化之積體電路中要求薄型化。為實現封裝內之晶片高積體化,須使晶片厚度薄至25~150μm之範圍。 With the increase in functionality of mobile phones, digital AV devices, and IC cards, the semiconductor wafers (hereinafter referred to as wafers) to be mounted have been miniaturized and thinned, and the demand for high integration in the package has increased. For example, an integrated circuit in which a plurality of wafers represented by CSP (wafer size package) or MCP (multi-chip package) are packaged in a single package is required to be thinned. In order to achieve high integration of the wafer in the package, the thickness of the wafer must be as thin as 25 to 150 μm.

然而,成為晶粒之基底的半導體晶圓(以下稱為晶圓)由於係藉由研削而變薄,故其強度變弱,晶圓容易出現龜裂或翹曲。另外,因薄板化使強度變弱而難以自動搬運晶圓,故必須以人力搬運,使其作業繁複。 However, since a semiconductor wafer (hereinafter referred to as a wafer) which is a base of a crystal grain is thinned by grinding, the strength thereof is weak, and the wafer is likely to be cracked or warped. In addition, since the strength is weakened by the thinning, it is difficult to automatically carry the wafer, and it is necessary to carry it by hand, and the work is complicated.

因此,已開發出藉由將稱為支撐板之由玻璃 、硬質塑膠等所構成之板貼合於待研削之晶圓上,而保持晶圓強度,防止龜裂發生及晶圓翹曲的晶圓處理系統。由於藉由晶圓處理系統可維持晶圓之強度,故可使經薄板化之半導體晶圓之搬運自動化。 Therefore, it has been developed by a glass that will be called a support plate. A wafer processing system in which a plate made of a hard plastic or the like is attached to a wafer to be ground while maintaining wafer strength and preventing cracking and wafer warpage. Since the strength of the wafer can be maintained by the wafer processing system, the handling of the thinned semiconductor wafer can be automated.

晶圓處理系統中,晶圓與支撐板係使用黏著膠帶、熱可塑性樹脂、接著劑等貼合。接著,使貼附支撐板之晶圓薄板化後,在切割晶圓之前自基板剝離支撐板。於該晶圓與支撐板之貼合使用接著劑時,係使接著劑溶解而自支撐板剝離晶圓。 In the wafer processing system, the wafer and the support plate are bonded together using an adhesive tape, a thermoplastic resin, an adhesive, or the like. Next, after the wafer to which the support plate is attached is thinned, the support plate is peeled off from the substrate before the wafer is diced. When an adhesive is used for bonding the wafer to the support plate, the adhesive is dissolved to peel the wafer from the support plate.

其中,近年來已開發出烴系接著劑作為上述接著劑(專利文獻1、2)。 Among them, hydrocarbon-based adhesives have been developed as the above-mentioned adhesives in recent years (Patent Documents 1 and 2).

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

[專利文獻1]特表2009-529065(2009年8月13日公開) [Patent Document 1] Special Table 2009-529065 (published on August 13, 2009)

[專利文獻2]特表2010-506406(2010年2月25日公開) [Patent Document 2] Special Table 2010-506406 (publicized on February 25, 2010)

然而,以往技術之烴系接著劑中使用之材料大多為粒狀者,成型為粒狀之步驟中使用之膠著防止劑( 滑劑)將會含於接著劑中。此種含膠著防止劑之接著劑使用於晶圓與晶圓之支撐體之接著中時,使用後即使以溶劑溶解洗淨,在洗淨後之晶圓上仍會產生殘留物。晶圓上產生此種殘留物時,導致基板之電特性或良率下降。 However, the materials used in the hydrocarbon-based adhesives of the prior art are mostly granular, and the adhesion preventing agent used in the step of molding into a granular form ( The slip agent) will be included in the adhesive. When such an adhesive containing an anti-adhesive agent is used in the subsequent step of the support of the wafer and the wafer, even if it is washed by solvent dissolution after use, a residue remains on the cleaned wafer. When such a residue is generated on the wafer, the electrical characteristics or yield of the substrate are lowered.

本發明係鑑於上述問題點而完成者,其主要目的係提供接著劑組成物之製造方法以及該接著劑組成物,將該接著劑組成物使用於晶圓與該晶圓之支撐體之接著後,以溶劑溶解且洗淨時,可防止晶圓上產生殘留物。 The present invention has been made in view of the above problems, and its main object is to provide a method for producing an adhesive composition and the adhesive composition, which is used after a wafer and a support of the wafer. When dissolved in a solvent and washed, residues on the wafer can be prevented.

為解決上述課題,本發明之用以使晶圓與該晶圓之支撐體接著的接著劑組成物之製造方法之特徵為包含去除接著劑組成物中所含膠著防止劑之純化步驟。 In order to solve the above problems, the method for producing an adhesive composition for adhering a wafer to a support of the wafer of the present invention is characterized by comprising a purification step of removing the adhesion preventing agent contained in the adhesive composition.

本發明之用以使晶圓與該晶圓之支撐體接著的接著劑組成物之特徵為源自膠著防止劑之金屬成分之含量相對於總固體重量為10ppb以上2ppm以下。 The adhesive composition for adhering the wafer to the support of the wafer of the present invention is characterized in that the content of the metal component derived from the adhesion preventing agent is 10 ppb or more and 2 ppm or less based on the total solid weight.

本發明之用以使晶圓與該晶圓之支撐體接著的接著薄膜之特徵為在薄膜上形成由本發明之用於使晶圓與該晶圓的支撐體接著之接著劑組成物所成之接著層。 The adhesive film of the present invention for adhering the wafer to the support of the wafer is characterized in that the film is formed on the film by the adhesive composition of the present invention for supporting the wafer and the support of the wafer. Then the layer.

本發明之用於使晶圓與該晶圓之支撐體接著之接著劑組成物之製造方法包含去除接著劑組成物中所含之膠著防止劑之純化步驟。為此,可製造使用於晶圓與晶 圓之支撐體之接著後,以溶劑溶解並洗淨時防止晶圓上產生殘留物之接著劑組成物。又,可提供使用於晶圓與該晶圓之支撐體之接著後,以溶劑溶解並洗淨時防止晶圓上產生殘留物之接著劑組成物。 The method for producing an adhesive composition for adhering a wafer to a support of the wafer of the present invention comprises a purification step of removing the adhesion preventing agent contained in the adhesive composition. For this purpose, it can be fabricated and used in wafers and crystals. After the round support, the binder composition which prevents residue on the wafer is dissolved and washed in a solvent. Further, it is possible to provide an adhesive composition for preventing a residue from occurring on the wafer after being dissolved in a solvent and washed after the wafer and the support of the wafer.

[接著劑組成物] [Binder composition]

本發明之接著劑組成物為去除了膠著防止劑之接著劑組成物,源自膠著防止劑之金屬成分之含量相對於接著劑組成物之總固體重量為10ppb以上、2ppm以下。本發明之接著劑組成物亦可包含烴樹脂或彈性體。 The adhesive composition of the present invention is an adhesive composition having the adhesion preventing agent removed, and the content of the metal component derived from the adhesion preventing agent is 10 ppb or more and 2 ppm or less based on the total solid weight of the adhesive composition. The adhesive composition of the present invention may also contain a hydrocarbon resin or an elastomer.

本發明之接著劑組成物包含用於賦予接著性之樹脂。該樹脂較好包含由烴樹脂以及彈性體選出之至少一種。 The adhesive composition of the present invention contains a resin for imparting adhesion. The resin preferably contains at least one selected from the group consisting of a hydrocarbon resin and an elastomer.

(烴樹脂) (hydrocarbon resin)

烴樹脂具有烴骨架,為使單體成分聚合而成之樹脂。烴樹脂列舉為例如環烯烴聚合物(以下亦稱為「樹脂A」)、以及由萜烯系樹脂、松脂系樹脂及石油系樹脂所組成群組選出之至少一種樹脂(以下亦稱為「樹脂B」)。 The hydrocarbon resin has a hydrocarbon skeleton and is a resin obtained by polymerizing a monomer component. The hydrocarbon resin is exemplified by, for example, a cycloolefin polymer (hereinafter also referred to as "resin A"), and at least one resin selected from the group consisting of a terpene resin, a rosin resin, and a petroleum resin (hereinafter also referred to as "resin." B").

環烯烴聚合物為使單體成分的環烯烴單體聚合而成之樹脂。環烯烴列舉為例如降冰片烯、降冰片二烯等二環體、二環戊二烯、羥基二環戊二烯等三環體、四環 十二碳烯等四環體、環戊二烯三聚物等五環體、四環戊二烯等七環體、或該等多環體之烷基(甲基、乙基、丙基、丁基等)取代體、烯基(乙烯基等)取代體、亞烷基(亞乙基等)取代體、芳基(苯基、甲苯基、萘基等)取代體等。樹脂(A)可為僅使該等環烯烴單體中之一種聚合而成者,亦可為使兩種以上共聚合而成者。 The cycloolefin polymer is a resin obtained by polymerizing a cycloolefin monomer of a monomer component. The cycloolefin is exemplified by a tricyclic ring such as norbornene or norbornadiene, a tricyclic ring such as dicyclopentadiene or hydroxydicyclopentadiene, or a tetracyclic ring. a pentacyclic ring such as a tetracyclic ring such as dodecene or a cyclopentadienyl trimer; a heptacyclic ring such as tetracyclopentadiene or an alkyl group of the polycyclic ring (methyl, ethyl, propyl, or the like). a butyl group or the like, a substituent, an alkenyl group (vinyl group) or the like, an alkylene group (such as an ethylene group), a aryl group (phenyl group, a tolyl group, a naphthyl group or the like), or the like. The resin (A) may be one obtained by polymerizing only one of the cycloolefin monomers, or may be one obtained by copolymerizing two or more kinds.

另外,樹脂(A)中所含單體成分並不限於環烯 烴單體者,亦可含有可與該環烯烴單體共聚合之其他單體。其他單體列舉為例如直鏈狀或分支鏈狀之烯單體,該等烯單體列舉為例如乙烯、丙烯、1-丁烯、異丁烯及1-己烯等之α-烯烴。又,烯單體可僅使用一種,亦可組合兩種以上使用。 In addition, the monomer component contained in the resin (A) is not limited to cycloolefin The hydrocarbon monomer may also contain other monomers copolymerizable with the cycloolefin monomer. The other monomer is exemplified by, for example, a linear or branched chain olefin monomer, and the olefin monomers are exemplified by α-olefins such as ethylene, propylene, 1-butene, isobutylene, and 1-hexene. Further, the olefin monomers may be used alone or in combination of two or more.

樹脂(A)之分子量並無特別限制,例如以凝膠 滲透層析儀(GPC)以聚苯乙烯換算值所測定之重量平均分子量(Mw)為50,000~200,000,更好為50,000~150,000。若樹脂(A)之重量平均分子量在上述範圍內,則成膜後難以發生龜裂,可獲得對特定溶劑之溶解性。 The molecular weight of the resin (A) is not particularly limited, for example, a gel The weight average molecular weight (Mw) measured by a permeation chromatography (GPC) in terms of polystyrene is 50,000 to 200,000, more preferably 50,000 to 150,000. When the weight average molecular weight of the resin (A) is within the above range, cracking hardly occurs after film formation, and solubility in a specific solvent can be obtained.

又,構成樹脂(A)之單體成分,就高耐熱性(低 熱分解性.熱重量減少性)之觀點而言,較好其5莫耳%以上為環烯烴單體,更好10莫耳%以上為環烯烴單體,又更好為20莫耳%以上。上限並無特別限制,但就溶解性及以溶液之經時安定性之觀點而言,較好為80莫耳%以下,更好為70莫耳%以下。至於其他單體,在含有直鏈狀或分支鏈狀之烯單體時,就溶解性及柔軟性之觀點而言 ,相對於構成樹脂(A)之單體成分全體較好為10~90莫耳%,更好為20~85莫耳%,最好為30~80莫耳%。 Further, the monomer component constituting the resin (A) has high heat resistance (low Thermal decomposition. From the viewpoint of the thermogravimetric reduction, it is preferably 5 mol% or more of a cycloolefin monomer, more preferably 10 mol% or more of a cycloolefin monomer, more preferably 20 mol% or more. The upper limit is not particularly limited, but is preferably 80 mol% or less, more preferably 70 mol% or less from the viewpoint of solubility and stability with respect to the solution. As for other monomers, in the case of a linear or branched chain olefin monomer, from the viewpoint of solubility and flexibility The total amount of the monomer components constituting the resin (A) is preferably from 10 to 90 mol%, more preferably from 20 to 85 mol%, most preferably from 30 to 80 mol%.

單體成分之聚合方法及聚合條件並無特別限 制,只要使用過去習知之方法進行即可。 The polymerization method and polymerization conditions of the monomer components are not particularly limited The system can be carried out by using a conventional method.

可作為樹脂(A)使用之市售品列舉為例如三井 化學公司製造之「APEL(商品名)」、POLYPLASTIC公司製造之「TOPAS(商品名)」、日本ZEON公司製造之「ZEONOR(商品名)」及「ZEONEX(商品名)」、以及JSR公司製造之「ARTON(商品名)」。 A commercially available product which can be used as the resin (A) is exemplified as, for example, Mitsui. "APEL (trade name)" manufactured by Chemicals Co., "TOPAS (trade name)" manufactured by POLYPLASTIC, "ZEONOR (trade name)" and "ZEONEX (trade name)" manufactured by Japan ZEON Co., Ltd., and JSR company "ARTON (trade name)".

樹脂(B)係由如上述之萜烯系樹脂、松脂系樹 脂及石油系樹脂所組成群組選出之至少一種樹脂。萜烯系樹脂列舉為例如萜烯樹脂、萜烯酚樹脂、改質萜烯樹脂、氫化萜烯樹脂及氫化萜烯酚樹脂等。松脂系樹脂列舉為例如松脂、松脂酯、氫化松脂、氫化松脂酯、聚合松脂、聚合松脂酯及改質松脂等。石油系樹脂列舉為例如脂肪族或芳香族石油樹脂、氫化石油樹脂、改質石油樹脂、脂環族石油樹脂及香豆酮.茚石油樹脂等。該等中,尤其以氫化萜烯樹脂及氫化萜烯酚樹脂較佳。 The resin (B) is a terpene resin or a rosin tree as described above. At least one resin selected from the group consisting of a fat and a petroleum resin. The terpene-based resin is exemplified by, for example, a terpene resin, a terpene phenol resin, a modified terpene resin, a hydrogenated terpene resin, and a hydrogenated terpene phenol resin. The rosin-based resin is exemplified by, for example, rosin, rosin ester, hydrogenated rosin, hydrogenated rosin ester, polymerized rosin, polymerized rosin ester, and modified rosin. Petroleum resin is exemplified by, for example, an aliphatic or aromatic petroleum resin, a hydrogenated petroleum resin, a modified petroleum resin, an alicyclic petroleum resin, and a coumarone.茚 petroleum resin, etc. Among these, a hydrogenated terpene resin and a hydrogenated terpene phenol resin are preferable.

樹脂(B)之分子量並無特別限制,但例如以 GPC而以聚苯乙烯換算值測定之重量平均分子量(Mw)為300~10,000,較好為500~5,000。樹脂(B)之重量平均分子量若在上述範圍內,則成膜後難以發生龜裂,且獲得高的耐熱性(熱分解性.對昇華性之耐性)。 The molecular weight of the resin (B) is not particularly limited, but for example, The weight average molecular weight (Mw) measured by polystyrene in terms of GPC is 300 to 10,000, preferably 500 to 5,000. When the weight average molecular weight of the resin (B) is within the above range, cracking hardly occurs after film formation, and high heat resistance (thermal decomposition property, resistance to sublimation property) is obtained.

又,亦可混合樹脂(A)與樹脂(B)使用。樹脂 (A)之含量較好為烴樹脂全體之40重量份以上,更好為60重量份以上。樹脂(A)之含量為烴樹脂全體之40重量份以上時,可發揮柔軟性及高的耐熱性(低熱分解性)。 Further, the resin (A) and the resin (B) may be used in combination. Resin The content of the (A) is preferably 40 parts by weight or more, more preferably 60 parts by weight or more based on the total of the hydrocarbon resin. When the content of the resin (A) is 40 parts by weight or more based on the total amount of the hydrocarbon resin, flexibility and high heat resistance (low thermal decomposition property) can be exhibited.

(彈性體) (elastomer)

本發明之接著劑組成物較好包含彈性體。本發明之接著劑組成物中所含之彈性體較好包含苯乙烯單位作為主鏈之構成單位。具體而言,該苯乙烯單位之含量較好為15重量%以上,50重量%以下之範圍,重量平均分子量較好為10,000以上,200,000以下之範圍。 The adhesive composition of the present invention preferably comprises an elastomer. The elastomer contained in the adhesive composition of the present invention preferably contains a styrene unit as a constituent unit of the main chain. Specifically, the content of the styrene unit is preferably 15% by weight or more and 50% by weight or less, and the weight average molecular weight is preferably in the range of 10,000 or more and 200,000 or less.

本說明書中所謂「構成單位」意指構成聚合 物之構造中,起因於一分子之單體之構造。本說明書中所謂「苯乙烯單位」為聚合苯乙烯時聚合物中所含源自該苯乙烯之構成單位,該「苯乙烯單位」亦可具有取代基。取代基列舉為例如碳數1~5之烷基、碳數1~5之烷氧基、碳數1~5之烷氧基烷基、乙醯氧基、羧基等。 The term "constituting unit" as used in this specification means a constituent polymerization. In the structure of matter, it is caused by the structure of a single molecule. In the present specification, the "styrene unit" is a constituent unit derived from the styrene contained in the polymer when the styrene is polymerized, and the "styrene unit" may have a substituent. The substituent is, for example, an alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxyalkyl group having 1 to 5 carbon atoms, an ethoxy group, a carboxyl group or the like.

若苯乙烯單位之含量為14重量%以上,50重 量%以下之範圍,且彈性體之重量平均分子量為10,000以上、200,000以下之範圍,則容易溶解於後述之烴系溶劑中,故可更容易且迅速地去除。且,藉由使苯乙烯單位之含量及重量平均分子量為上述範圍,可發揮對於將晶圓供給於光阻微影步驟中時所暴露之光阻溶劑(例如PGMEA、PGME等)、酸(氫氟酸等)、鹼(TMAH等)之優異耐性。 If the content of the styrene unit is 14% by weight or more, 50 weight When the weight average molecular weight of the elastomer is in the range of 10,000 or more and 200,000 or less, it is easily dissolved in a hydrocarbon solvent to be described later, so that it can be removed more easily and quickly. Further, by setting the content of the styrene unit and the weight average molecular weight to the above range, it is possible to exhibit a photoresist (for example, PGMEA, PGME, etc.) and an acid (hydrogen) which are exposed when the wafer is supplied to the photoresist lithography step. Excellent resistance to fluoric acid, etc., alkali (TMAH, etc.).

苯乙烯單位之含量較好為17重量%以上,且 更好為40重量%以下。 The content of the styrene unit is preferably 17% by weight or more, and More preferably, it is 40% by weight or less.

重量平均分子量之較佳範圍為20,000以上,且更好之範圍為150,000以下。 The weight average molecular weight is preferably in the range of 20,000 or more, and more preferably in the range of 150,000 or less.

至於彈性體,只要苯乙烯單位含量為14重量%以上、50重量%以下之範圍,彈性體之重量平均分子量為10,000以上,200,000以下之範圍,則可使用各種彈性體。例如,可使用聚苯乙烯-聚(乙烯/丙烯)嵌段共聚物(SEP)、苯乙烯-異戊二烯-苯乙烯嵌段共聚物(SIS)、苯乙烯-丁二烯-苯乙烯嵌段共聚物(SBS)、苯乙烯-丁二烯-丁烯-苯乙烯嵌段共聚物(SBBS)、乙烯-丙烯三聚物(EPT)、及該等之氫化物、苯乙烯-乙烯-丁烯-苯乙烯嵌段共聚物(SEBS)、苯乙烯-乙烯-丙烯-苯乙烯嵌段共聚物(苯乙烯-異戊二烯-苯乙烯嵌段共聚物)(SEPS)、苯乙烯-乙烯-乙烯-丙烯-苯乙烯嵌段共聚物(SEEPS)、苯乙烯嵌段為反應交聯型的苯乙烯-乙烯-乙烯-丙烯-苯乙烯嵌段共聚物(SeptonV9461(Kuraray公司製造))、苯乙烯嵌段為反應交聯型的苯乙烯-乙烯-丁烯-苯乙烯嵌段共聚物(具有反應性之聚苯乙烯系硬質嵌段之Septon V9827(Kuraray公司製造))等之苯乙烯單位之含量及重量平均分子量在上述範圍者。 As for the elastomer, various elastomers can be used as long as the styrene unit content is in the range of 14% by weight or more and 50% by weight or less, and the weight average molecular weight of the elastomer is in the range of 10,000 or more and 200,000 or less. For example, polystyrene-poly(ethylene/propylene) block copolymer (SEP), styrene-isoprene-styrene block copolymer (SIS), styrene-butadiene-styrene can be used. Segment copolymer (SBS), styrene-butadiene-butene-styrene block copolymer (SBBS), ethylene-propylene terpolymer (EPT), and hydrides, styrene-ethylene-butyl Alkene-styrene block copolymer (SEBS), styrene-ethylene-propylene-styrene block copolymer (styrene-isoprene-styrene block copolymer) (SEPS), styrene-ethylene- Ethylene-propylene-styrene block copolymer (SEEPS), styrene block is a reaction crosslinked type styrene-ethylene-ethylene-propylene-styrene block copolymer (Septon V9461 (Kuraray)), styrene The block is a styrene unit of a reaction-crosslinked type styrene-ethylene-butylene-styrene block copolymer (Septon V9827 (manufactured by Kuraray Co., Ltd.) having a reactive polystyrene-based hard block) And the weight average molecular weight is in the above range.

又,彈性體中以氫化物更佳。若為氫化物則對熱之安定性提高,不易引起分解或聚合等之變質。又,就對烴系溶劑之溶解性及對光阻溶劑之耐性之觀點而言亦更佳。 Further, the hydride is more preferable in the elastomer. In the case of a hydride, the stability to heat is improved, and it is less likely to cause deterioration such as decomposition or polymerization. Further, it is also preferable from the viewpoints of solubility in a hydrocarbon solvent and resistance to a photoresist solvent.

另外,彈性體中較好為兩端係苯乙烯之嵌段 聚合物。係因為藉由於兩末端嵌段熱安定性高的苯乙烯可顯示更高之耐熱性。 In addition, the elastomer is preferably a block of styrene at both ends. polymer. This is because the styrene having high thermal stability due to both end blocks can exhibit higher heat resistance.

更具體而言,更好為苯乙烯及共軛二烯之嵌 段共聚物的氫化物。可提高對熱之安定性,不易引起分解或聚合等之變質。且,藉由兩末端嵌段有熱安定性高的苯乙烯而可顯示高的耐熱性。而且,就對烴系溶劑之溶解性及對光阻溶劑之耐性之觀點而言亦更佳。 More specifically, it is better to embed styrene and conjugated diene a hydride of the segment copolymer. It can improve the stability of heat, and it is not easy to cause deterioration of decomposition or polymerization. Further, high heat resistance can be exhibited by the styrene having high thermal stability at both end blocks. Further, it is also preferable from the viewpoints of solubility in a hydrocarbon solvent and resistance to a photoresist solvent.

可作為本發明之接著劑組成物中所含彈性體 使用之市售品列舉為例如Kuraray公司製造之「Septon(商品名)」、Kuraray公司製造之「HYBRAR(商品名)」、旭化成公司製造「TUFTEC(商品名)」、JSR公司製造「DYNARON(商品名)」等。 It can be used as an elastomer contained in the composition of the adhesive of the present invention. Commercial products to be used are, for example, "Septon (trade name)" manufactured by Kuraray Co., Ltd., "HYBRAR (trade name)" manufactured by Kuraray Co., Ltd., "TUFTEC (trade name)" manufactured by Asahi Kasei Co., Ltd., and "DYNARON" manufactured by JSR Corporation. Name)" and so on.

本發明之接著劑組成物中所含彈性體之含量 為,例如以接著劑組成物總量作為100重量份,較好為10重量份以上、80重量份以下,更好為20重量份以上、60重量份以下。 The content of the elastomer contained in the adhesive composition of the present invention For example, the total amount of the adhesive composition is 100 parts by weight, preferably 10 parts by weight or more and 80 parts by weight or less, more preferably 20 parts by weight or more and 60 parts by weight or less.

另外,彈性體亦可混合複數種。亦即,本發 明之接著劑組成物亦可含複數種之彈性體。只要複數種彈性體中之至少一種含有苯乙烯單位作為主鏈之構成單位且該苯乙烯單位含量為14重量%以上、50重量%以下之範圍,重量平均分子量為10,000以上、200,000以下之範圍,則屬本發明之範疇。另外,本發明之接著劑組成物中,含複數種彈性體時,混合之結果,亦可調整為苯乙烯單位 之含量成為上述範圍。例如,以重量比1比1混合苯乙烯單位之含量為30重量%之Kuraray公司製造之Septon(商品名)之Septon 8007,與苯乙烯單位之含量為13重量%之Septon(商品名)之Septon 2063時,相對於接著劑組成物中所含彈性體全體,苯乙烯含量成為21~22重量%,成為14重量%以上。又,例如以1比1混合苯乙烯單位為10重量%者與60重量%者時成為35重量%,而在上述範圍內。本發明亦可為如此形態。又,本發明之接著劑組成物中所含複數種彈性體最好全部以上述範圍包含苯乙烯單位,且為上述範圍之重量平均分子量。 In addition, the elastomer may be mixed in a plurality of types. That is, this hair The adhesive composition of the present invention may also contain a plurality of elastomers. When at least one of the plurality of elastomers contains a styrene unit as a constituent unit of the main chain and the styrene unit content is in a range of 14% by weight or more and 50% by weight or less, the weight average molecular weight is in the range of 10,000 or more and 200,000 or less. It is within the scope of the invention. Further, in the composition of the adhesive of the present invention, when a plurality of elastomers are contained, the result of mixing may be adjusted to a styrene unit. The content is in the above range. For example, Septon 8007 of Septon (trade name) manufactured by Kuraray Co., Ltd. having a styrene unit content of 1:1 by weight in a weight ratio of 1 to 1, and Septon (trade name) of Septon having a styrene unit content of 13% by weight. At 2063, the styrene content is 21 to 22% by weight, and 14% by weight or more, based on the entire elastomer contained in the adhesive composition. Further, for example, when the styrene unit is mixed in a ratio of 1 to 1, 10% by weight and 60% by weight in the case of 60% by weight, it is within the above range. The invention may also be in this form. Further, it is preferable that all of the plurality of elastomers contained in the adhesive composition of the present invention contain styrene units in the above range, and have a weight average molecular weight in the above range.

(溶劑) (solvent)

本發明之接著劑組成物較好包含溶解烴樹脂或彈性體之溶劑。該種溶劑例如可使用非極性烴系溶劑、極性及無極性之石油系溶劑等。 The adhesive composition of the present invention preferably contains a solvent which dissolves the hydrocarbon resin or the elastomer. As such a solvent, for example, a nonpolar hydrocarbon solvent, a polar and nonpolar hydrocarbon solvent, or the like can be used.

較好溶劑可含縮合多環式烴。藉由使溶劑含 縮合多環式烴,可避免以液狀形態(尤其於低溫)儲存接著劑組成物時可能產生之白濁化,可提高製品之安定性。 Preferred solvents may contain condensed polycyclic hydrocarbons. By making the solvent contain By condensing a polycyclic hydrocarbon, it is possible to avoid white turbidity which may occur when the adhesive composition is stored in a liquid form (especially at a low temperature), and the stability of the product can be improved.

烴系溶劑列舉為直鏈狀、分支狀或環狀之烴 。列舉為例如己烷、庚烷、辛烷、壬烷、甲基辛烷、癸烷、十一烷、十二烷、十三烷等直鏈狀烴、碳數3至15之分支狀烴;對-薄荷烷、鄰-薄荷烷、間-薄荷烷、二苯基薄荷烷、α-萜品烯、β-萜品烯、γ-萜品烯、1,4-萜品、1,8-萜品、冰片烷(bornane)、降冰片烷、蒎烷(pinane)、α- 蒎烯、β-蒎烯、側柏烷(thujane)、α-側柏酮、β-側柏酮、蒈烷(carane)、長葉烯(longifolene)等。 The hydrocarbon solvent is exemplified by a linear, branched or cyclic hydrocarbon. For example, it is a linear hydrocarbon such as hexane, heptane, octane, decane, methyl octane, decane, undecane, dodecane or tridecane, or a branched hydrocarbon having 3 to 15 carbon atoms; P -menthane, o-menthane, m-menthane, diphenyl menthane, α -terpinene, β -terpinene, γ -terpinene, 1,4-product, 1,8- Products, bornane, norbornane, pinane, alpha-pinene, beta-pinene, thujane, alpha-terbinone, beta-terbinone, decane (carane), longifolene, and the like.

另外,石油系溶劑列舉為例如環己烷、環庚烷、環辛烷、萘、十氫萘、四氫萘等。 Further, the petroleum solvent is exemplified by, for example, cyclohexane, cycloheptane, cyclooctane, naphthalene, decalin, tetrahydronaphthalene or the like.

又,所謂縮合多環式烴為兩個以上之單環可彼此僅供給一個各環之邊的縮合環之烴,較好使用兩個單環縮合而成之烴。 Further, the condensed polycyclic hydrocarbon is a hydrocarbon in which two or more single rings are supplied to each other only to the condensed ring of each ring, and it is preferred to use a hydrocarbon obtained by condensing two single rings.

該種烴列舉為5員環及6員環之組合,或兩個6員環之組合。組合5員環及6員環之烴列舉為例如茚、戊搭烯、茚滿、四氫茚等,組合兩個6員環之烴列舉為例如萘、四氫萘(tetraline)及十氫萘(decaline)等。 The hydrocarbons are listed as a combination of a 5-membered ring and a 6-membered ring, or a combination of two 6-membered rings. The hydrocarbons combining the 5-membered ring and the 6-membered ring are exemplified by, for example, anthracene, pentene, indane, tetrahydroanthracene, etc., and the hydrocarbons combining the two 6-membered rings are exemplified by, for example, naphthalene, tetraline, and decalin. (decaline) and so on.

另外,溶劑含上述縮合多環式烴時,溶劑中所含成分可僅為上述縮合多環式烴,亦可例如含有飽和脂肪族烴等其他成分。該情況下,縮合多環式烴之含量較好為烴系溶劑全體之40重量份以上,更好為60重量份以上。縮合多環式烴之含量為烴系溶劑全體之40重量份以上時,可對上述樹脂發揮高的溶解性。縮合多環式烴與飽和脂肪族烴之混合比若在上述範圍內,則可緩和縮合多環式烴之臭味。 Further, when the solvent contains the condensed polycyclic hydrocarbon, the component contained in the solvent may be only the condensed polycyclic hydrocarbon, and may contain other components such as a saturated aliphatic hydrocarbon. In this case, the content of the condensed polycyclic hydrocarbon is preferably 40 parts by weight or more, and more preferably 60 parts by weight or more based on the total of the hydrocarbon-based solvent. When the content of the condensed polycyclic hydrocarbon is 40 parts by weight or more of the total of the hydrocarbon-based solvent, the resin can exhibit high solubility. When the mixing ratio of the condensed polycyclic hydrocarbon and the saturated aliphatic hydrocarbon is within the above range, the odor of the condensed polycyclic hydrocarbon can be alleviated.

上述飽和脂肪族烴列舉為例如己烷、庚烷、辛烷、壬烷、甲基辛烷、癸烷、十一碳烷、十二碳烷、十三碳烷等直鏈狀之烴、碳數3至15之分支狀烴、對-薄荷烷、鄰-薄荷烷、間-薄荷烷、二苯基薄荷烷、1,4-萜品、1,8-萜品、冰片烷(bornane)、降冰片烷、蒎烷(pinane)、側 柏烷(thujane)、蒈烷(carane)、長葉烯(longifolene)等。 The above saturated aliphatic hydrocarbon is exemplified by a linear hydrocarbon such as hexane, heptane, octane, nonane, methyl octane, decane, undecane, dodecane or tridecane, and carbon. a branched hydrocarbon of from 3 to 15, p-menthane, o-menthane, m-menthane, diphenylmethane, 1,4-deuterate, 1,8-fluorene, bornane, Norbornane, pinane, side Thujane, carane, longifolene, and the like.

又,本發明之接著劑組成物中之溶劑含量只 要依據使用該接著劑組成物而成膜之接著層厚度適當調整即可,但例如以接著劑組成物之全量為100重量份時,較好為20重量份以上、90重量份以下之範圍。若溶劑之含量在上述範圍內,則黏度調整變容易。 Further, the solvent content in the adhesive composition of the present invention is only The thickness of the adhesive layer formed by using the adhesive composition may be appropriately adjusted. For example, when the total amount of the adhesive composition is 100 parts by weight, the range is preferably 20 parts by weight or more and 90 parts by weight or less. When the content of the solvent is within the above range, the viscosity adjustment becomes easy.

(熱聚合抑制劑) (thermal polymerization inhibitor)

本發明之接著劑組成物亦可含有熱聚合抑制劑。熱聚合抑制劑具有防止因熱引起自由基聚合反應之功能。具體而言,熱聚合抑制劑顯示對自由基之高的反應性,故比單體更優先反應而抑制單體之聚合。含此種熱聚合抑制劑之接著劑組成物在高溫環境下(尤其在250℃~350℃)下之聚合反應受到抑制。 The adhesive composition of the present invention may also contain a thermal polymerization inhibitor. The thermal polymerization inhibitor has a function of preventing radical polymerization caused by heat. Specifically, since the thermal polymerization inhibitor exhibits high reactivity with respect to radicals, it is more preferentially reacted than the monomer to suppress polymerization of the monomer. The polymerization composition containing such a thermal polymerization inhibitor is inhibited in a high temperature environment (especially at 250 ° C to 350 ° C).

例如半導體製造步驟中,有包含使支撐體所 接著之晶圓在250℃下加熱1小時之高溫製程之情況。此時,因高溫引起接著劑組成物聚合時,對於在高溫製程後自晶圓剝離支撐板(support plate)之剝離液的溶解性低,而無法良好地自晶圓剝離支撐板。然而,含有熱聚合抑制劑之本發明之接著劑組成物抑制了因熱造成之氧化及隨之而來之聚合反應,故即使經歷高溫製程亦可容易地剝離支撐板,可抑制殘留物產生。 For example, in the semiconductor manufacturing step, there is included The wafer was then heated at 250 ° C for 1 hour in a high temperature process. At this time, when the adhesive composition is polymerized due to high temperature, the solubility of the peeling liquid from the wafer peeling support plate after the high-temperature process is low, and the support plate cannot be favorably peeled off from the wafer. However, the adhesive composition of the present invention containing a thermal polymerization inhibitor suppresses oxidation due to heat and the subsequent polymerization reaction, so that the support plate can be easily peeled off even after a high-temperature process, and the generation of residue can be suppressed.

熱聚合抑制劑只要可有效防止因熱造成之自 由基聚合反應則無特別限制,但以具有酚之熱聚合抑制劑 較佳。據此,在大氣下高溫處理後仍可確保良好之溶解性。該種熱聚合抑制劑可使用受阻酚系之抗氧化劑,例如,焦棓酚、苯醌、氫醌、亞甲基藍、第三丁基兒茶酚、單苄基醚、甲基氫醌、戊基醌、戊氧基氫醌、正丁基酚、苯酚、氫醌單丙基醚、4,4’-(1-甲基亞乙基)雙(2-甲基酚)、4,4'-(1-甲基亞乙基)雙(2,6-二甲基酚)、4,4’-[1-[4-(1-(4-羥基苯基)-1-甲基乙基)苯基]亞乙基]雙酚、4,4’,4”-亞乙基參(2-甲基酚)、4,4’,4”-亞乙基參酚、1,1,3-參(2,5-二甲基-4-羥基苯基)-3-苯基丙烷、2,6-二-第三丁基-4-甲基酚、2,2'-亞甲基雙(4-甲基-6-第三丁基酚)、4,4’-亞丁基雙(3-甲基-6-第三丁基酚)、4,4’-硫基雙(3-甲基-6-第三丁基酚)、3,9-雙[2-(3-(3-第三丁基-4-羥基-5-甲基苯基)-丙醯氧基)-1,1-二甲基乙基]-2,4,8,10-四氧雜螺(5,5)十一烷、三乙二醇-雙-3-(3-第三丁基-4-羥基-5-甲基苯基)丙酸酯、正辛基-3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯、季戊四醇肆[3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯](商品名IRGANOX1010,日本汽巴公司製造)、參(3,5-二-第三丁基羥基苄基)異氰尿酸酯、硫基二伸乙基雙[3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯]。熱聚合抑制劑可僅使用一種,亦可組合兩種以上使用。 The thermal polymerization inhibitor can effectively prevent self-induced heat The radical polymerization reaction is not particularly limited, but a thermal polymerization inhibitor having a phenol Preferably. Accordingly, good solubility can be ensured after high temperature treatment in the atmosphere. The thermal polymerization inhibitor may use a hindered phenol-based antioxidant such as pyrogallol, benzoquinone, hydroquinone, methylene blue, t-butylcatechol, monobenzyl ether, methylhydroquinone, amyl hydrazine. , pentyloxyhydroquinone, n-butylphenol, phenol, hydroquinone monopropyl ether, 4,4'-(1-methylethylidene) bis(2-methylphenol), 4,4'-( 1-methylethylidene bis(2,6-dimethylphenol), 4,4'-[1-[4-(1-(4-hydroxyphenyl)-1-methylethyl)benzene Ethylene]bisphenol, 4,4',4"-ethylene thiophene (2-methylphenol), 4,4',4"-ethylene phenol, 1,1,3-parameter (2,5-Dimethyl-4-hydroxyphenyl)-3-phenylpropane, 2,6-di-t-butyl-4-methylphenol, 2,2'-methylene double (4 -methyl-6-tert-butylphenol), 4,4'-butylene bis(3-methyl-6-tert-butylphenol), 4,4'-thiobis(3-methyl- 6-tert-butylphenol), 3,9-bis[2-(3-(3-t-butyl-4-hydroxy-5-methylphenyl)-propenyloxy)-1,1- Dimethylethyl]-2,4,8,10-tetraoxaspiro(5,5)undecane, triethylene glycol-bis-3-(3-tert-butyl-4-hydroxy-5 -Methylphenyl)propionate, n-octyl-3-(3,5-di-t-butyl-4-hydroxyphenyl)propionate, pentaerythritol 肆[3-(3, 5-di-t-butyl-4-hydroxyphenyl)propionate] (trade name: IRGANOX1010, manufactured by Ciba, Japan), ginseng (3,5-di-t-butylhydroxybenzyl) isocyanuric acid Acid ester, thiodiethylidene bis[3-(3,5-di-t-butyl-4-hydroxyphenyl)propionate]. The thermal polymerization inhibitor may be used singly or in combination of two or more.

熱聚合抑制劑之含量只要依據烴樹脂或彈性 體之種類、以及接著劑組成物之用途及使用環境適當決定即可,例如以烴樹脂或彈性體之量作為100重量份時,較好為0.1重量份以上、10重量份以下。若使熱聚合抑制劑 之含量在上述範圍內,可良好地發揮抑制因熱造成之聚合之效果,在高溫製程後,可進一步抑制接著劑組成物對剝離液之溶解性的下降。 The content of the thermal polymerization inhibitor is as long as it depends on the hydrocarbon resin or elasticity. The type of the body, the use of the adhesive composition, and the use environment may be appropriately determined. For example, when the amount of the hydrocarbon resin or the elastomer is 100 parts by weight, it is preferably 0.1 part by weight or more and 10 parts by weight or less. Thermal polymerization inhibitor When the content is within the above range, the effect of suppressing polymerization by heat can be satisfactorily exhibited, and after the high-temperature process, the decrease in the solubility of the adhesive composition to the peeling liquid can be further suppressed.

又,本發明之接著劑組成物亦可為含有由溶 解熱聚合抑制劑,且用於使烴樹脂或彈性體溶解之溶劑不同之組成所成之添加溶劑之構成。添加溶劑並無特別限制,可使用使接著劑組成物中所含成分溶解之有機溶劑。 Further, the adhesive composition of the present invention may also be dissolved An anti-heat polymerization inhibitor and a composition for adding a solvent to a composition in which a solvent for dissolving a hydrocarbon resin or an elastomer is different. The solvent to be added is not particularly limited, and an organic solvent which dissolves the components contained in the adhesive composition can be used.

有機溶劑只要是例如使接著劑組成物之各成 分溶解,而成均勻溶液即可,可使用任意一種或組合兩種以上使用。 The organic solvent is, for example, a composition of an adhesive composition. The solution may be dissolved in a homogeneous solution, and any one or a combination of two or more may be used.

有機溶劑之具體例列舉為例如具有氧原子、 羰基或乙醯氧基等作為極性基之萜烯溶劑,列舉為例如香葉醇(geraniol)、橙花醇(nerol)、沉香醇(linalool)、檸香醛(citral)、香茅醇(citronellol)、薄荷醇、異薄荷醇、新薄荷醇、α-松油醇、β-松油醇、γ-松油醇、松油-1-醇、松油-4-醇、二氫松香醇乙酸酯、1,4-桉油醇(cineol)、1,8-桉油醇、龍腦、香芹酮、紫羅蘭酮、側柏酮、樟腦。另外,可列舉為γ-丁內酯等內酯類;丙酮、甲基乙基酮、環己酮(CH)、甲基正戊基酮、甲基異戊基酮、2-庚酮等酮類;乙二醇、二乙二醇、丙二醇、二丙二醇等多元醇類;乙二醇單乙酸酯、二乙二醇單乙酸酯、丙二醇單乙酸酯、或二丙二醇單乙酸酯等之具有酯鍵之化合物,上述多元醇類或上述具有酯鍵之化合物之單甲基醚、單乙基醚、單丙基醚、單丁基醚等之單烷基醚或單苯基醚等之具有醚鍵之化合物等之 多元醇類之衍生物(該等中以丙二醇單甲基醚乙酸酯(PGMEA)、丙二醇單甲基醚(PGME)較佳)、如二噁烷之環式醚類,或乳酸甲酯、乳酸乙酯(EL)、乙酸甲酯、乙酸乙酯、乙酸丁酯、丙酸甲酯、丙酸乙酯、甲氧基丙酸甲酯、乙氧基丙酸乙酯等酯類;苯甲醚、乙基苄基醚、甲苯基甲基醚、二苯基醚、二苄基醚、苯乙醇、丁基苯基醚等之芳香族系有機溶劑等。 Specific examples of the organic solvent are exemplified by having an oxygen atom, for example. A terpene solvent which is a polar group such as a carbonyl group or an ethoxylated group, and is exemplified by, for example, geraniol, nerol, linalool, citral, citronellol. ), menthol, isomenthol, neomenthol, alpha-terpineol, beta-terpineol, gamma-terpineol, terpineol-1-ol, terpineol-4-ol, dihydrogeninol B Acid esters, 1,4- oleol, 1,8-nonyl oleyl alcohol, borneol, carvone, ionone, flavonoids, camphor. Further, examples thereof include lactones such as γ-butyrolactone; and ketones such as acetone, methyl ethyl ketone, cyclohexanone (CH), methyl n-amyl ketone, methyl isoamyl ketone, and 2-heptanone. Polyols such as ethylene glycol, diethylene glycol, propylene glycol, dipropylene glycol; ethylene glycol monoacetate, diethylene glycol monoacetate, propylene glycol monoacetate, or dipropylene glycol monoacetate a compound having an ester bond, a monoalkyl ether or a monophenyl ether of the above polyol or a monomethyl ether, monoethyl ether, monopropyl ether or monobutyl ether of the above compound having an ester bond a compound having an ether bond, etc. a derivative of a polyhydric alcohol (preferably propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monomethyl ether (PGME)), a cyclic ether such as dioxane, or methyl lactate, Ethyl lactate (EL), methyl acetate, ethyl acetate, butyl acetate, methyl propionate, ethyl propionate, methyl methoxypropionate, ethyl ethoxy propionate, etc.; An aromatic organic solvent such as ether, ethylbenzyl ether, tolyl methyl ether, diphenyl ether, dibenzyl ether, phenethyl alcohol or butylphenyl ether.

添加溶劑之含量只要依據熱聚合抑制劑之種 類等適當決定即可,例如將熱聚合抑制劑設為1重量份時,添加溶劑較好為1重量份以上、50重量份以下,更好為1~30重量份,最好為1~15重量份。若熱聚合抑制劑之含量在上述範圍內,則可充分溶解熱聚合抑制劑。 The content of the added solvent is as long as it depends on the kind of the thermal polymerization inhibitor The type of the thermal polymerization inhibitor may be appropriately determined. For example, when the thermal polymerization inhibitor is used in an amount of 1 part by weight, the solvent is preferably 1 part by weight or more and 50 parts by weight or less, more preferably 1 to 30 parts by weight, still more preferably 1 to 15 parts by weight. Parts by weight. When the content of the thermal polymerization inhibitor is within the above range, the thermal polymerization inhibitor can be sufficiently dissolved.

(其他成分) (other ingredients)

本發明之接著劑組成物,在不損及本發明之本質特性之範圍內,亦可進一步含有混合性之其他物質。例如,可使用改良接著劑性能用之附加樹脂、可塑劑、接著輔助劑、安定劑、著色劑及界面活性劑等之慣用各種添加劑。 The adhesive composition of the present invention may further contain other substances in combination within a range not impairing the essential characteristics of the present invention. For example, various additives such as an additional resin for improving the performance of the adhesive, a plasticizer, an auxiliary agent, a stabilizer, a colorant, and a surfactant can be used.

(接著劑組成物之調製方法) (modulation method of the composition of the adhesive)

調整膠著防止劑之含量之前之接著劑組成物之調製方法並無特別限制,只要使用習知方法即可,例如可藉由使烴樹脂或彈性體溶解於溶劑中,使用既有之攪拌裝置攪拌各組成,而獲得接著劑組成物。 The method for preparing the adhesive composition before adjusting the content of the adhesion preventing agent is not particularly limited as long as a conventional method can be used, for example, by dissolving a hydrocarbon resin or an elastomer in a solvent, stirring using an existing stirring device. Each composition was obtained to obtain an adhesive composition.

又,接著劑組成物中添加熱聚合抑制劑時, 較好添加使熱聚合抑制劑預先溶解於用以溶解該熱聚合抑制劑之添加溶劑中者。 Further, when a thermal polymerization inhibitor is added to the adhesive composition, It is preferred to add a thermal polymerization inhibitor in advance in an additive solvent for dissolving the thermal polymerization inhibitor.

接著,可將如此般調製之接著劑組成物供給 於後述之本發明之接著劑組成物之製造方法中之純化步驟,而獲得本發明之接著劑組成物。又,即使為後述之本發明之接著劑組成物之製造方法以外之方法,只要是可去除膠著防止劑之方法,則仍可製造本發明之接著劑組成物。 Then, the thus prepared adhesive composition can be supplied The adhesive composition of the present invention is obtained by a purification step in the method for producing an adhesive composition of the present invention to be described later. Further, even if it is a method other than the method for producing an adhesive composition of the present invention to be described later, the adhesive composition of the present invention can be produced as long as it is a method of removing the adhesion preventing agent.

(膠著防止劑) (adhesive preventive agent)

純化步驟中,自接著劑組成物去除之膠著防止劑亦稱為滑劑,為在使接著劑組成物中使用之樹脂(烴樹脂、彈性體)成型為顆粒狀時,該樹脂組成物中所含有者。其結果,使用該樹脂調製接著劑組成物時,成為最終在接著劑組成物中含有膠著防止劑。商業上可取得之樹脂大多數以顆粒狀供給,故大多接著劑組成物中均含有膠著防止劑。 In the purification step, the adhesion preventing agent removed from the adhesive composition is also referred to as a slip agent, and is a resin composition in which the resin (hydrocarbon resin, elastomer) used in the adhesive composition is formed into a pellet form. Included. As a result, when the adhesive composition is prepared using the resin, the adhesion preventive agent is finally contained in the adhesive composition. Commercially available resins are mostly supplied in the form of granules, so most of the adhesive composition contains a sticking inhibitor.

膠著防止劑之例列舉為例如滑石 (Mg3Si4O10(OH)2)、水滑石(Mg6Al2(CO3)(OH)16.4H2O、Mg6Fe2(CO3)(OH)16.4H2O、Mg6Mn2(CO3)(OH)16.4H2O)等之鹽礦物、硬脂酸鉛、硬脂酸鋅、硬脂酸鈣、硬脂酸鎂等硬脂酸鹽、液體鏈烷、鏈烷蠟等鏈烷類、硬脂酸、硬脂酸醯胺、油酸醯胺、亞甲基雙硬脂酸醯胺、伸乙基雙硬脂酸醯胺、芥酸醯胺等脂肪酸醯胺。 Examples of the adhesion preventing agent are exemplified by, for example, talc (Mg 3 Si 4 O 10 (OH) 2 ), hydrotalcite (Mg 6 Al 2 (CO 3 ) (OH) 16 .4H 2 O, Mg 6 Fe 2 (CO 3 ). (OH) 16 .4H 2 O, Mg 6 Mn 2 (CO 3 )(OH) 16 .4H 2 O), etc., salt minerals, lead stearate, zinc stearate, calcium stearate, magnesium stearate And other alkanes such as stearates, liquid alkanes, paraffin waxes, stearic acid, decylamine stearate, decyl oleate, decyl methylene bis-stearate, ethyl bis-stearic acid A fatty acid guanamine such as guanamine or erucylamine.

本發明之接著劑組成物減低了接著劑組成物 中所含之膠著防止劑之量。接著劑組成物中所含膠著防止劑之量可由源自膠著防止劑之金屬成分之含量予以表示。源自膠著防止劑之金屬成分列舉為例如鈉、鎂、鋁、鉀、鈣、鉻、錳、鐵、鎳、銅、鉛、鋅等。 The adhesive composition of the present invention reduces the adhesive composition The amount of the adhesion preventing agent contained in the product. The amount of the adhesion preventing agent contained in the subsequent composition can be expressed by the content of the metal component derived from the adhesion preventing agent. The metal component derived from the adhesion preventing agent is exemplified by, for example, sodium, magnesium, aluminum, potassium, calcium, chromium, manganese, iron, nickel, copper, lead, zinc, or the like.

本發明之接著劑組成物之源自膠著防止劑之金屬成分之含量相對於接著劑組成物之總固體重量為10ppb以上、2ppm以下。 The content of the metal component derived from the adhesion preventing agent of the adhesive composition of the present invention is 10 ppb or more and 2 ppm or less based on the total solid weight of the adhesive composition.

接著劑組成物中源自所含膠著防止劑之金屬成分之含量,相對於接著劑組成物之總固體重量若為2ppm以下,則使用該接著劑組成物接著晶圓與支撐體,且溶解洗淨後,亦不會在晶圓上產生殘留物故較佳。又,接著劑組成物中源自所含膠著防止劑之金屬成分之含量之下限值雖希望為[0],但實質上只要為金屬成分之檢測極限值(一般為10ppb)即可。因此,接著劑組成物中源自所含膠著防止劑之金屬成分之含量之下限值相對於接著劑組成物之總固體重量為10ppb。 In the subsequent composition, the content of the metal component derived from the adhesion preventing agent is 2 ppm or less based on the total solid weight of the adhesive composition, and the adhesive composition is used next to the wafer and the support, and the solution is dissolved and washed. After the net, it is not preferable to produce residue on the wafer. Further, the lower limit of the content of the metal component derived from the gel-preventing agent contained in the adhesive composition is preferably [0], but may be substantially the detection limit value (generally 10 ppb) of the metal component. Therefore, the lower limit of the content of the metal component derived from the contained adhesion preventing agent in the adhesive composition was 10 ppb with respect to the total solid weight of the adhesive composition.

接著劑組成物中源自所含膠著防止劑之金屬成分之含量可藉由例如以ICP-MS(感應耦合電漿質量分析法)進行之接著劑組成物中之金屬成分之定量化而求得。具體而言,含接著劑組成物之溶液中,以上述方法測定其金屬含量之測定結果換算為相對於接著劑組成物之總固體重量之值,可算出接著劑組成物中之源自膠著防止劑之金屬成分之含量作為接著劑組成物中之含有濃度。 The content of the metal component derived from the adhesion preventive agent contained in the subsequent composition can be determined by, for example, quantifying the metal component in the adhesive composition by ICP-MS (inductively coupled plasma mass spectrometry). . Specifically, in the solution containing the adhesive composition, the measurement result of the metal content measured by the above method is converted into a value relative to the total solid weight of the adhesive composition, and the gel-preventing prevention in the adhesive composition can be calculated. The content of the metal component of the agent is used as the concentration in the composition of the adhesive.

又,本發明之接著劑組成物之源自接著劑組 成物所含之膠著防止劑之金屬成分中,含最多之金屬成分的含量只要相對於接著劑組成物之總固體重量為10ppb以上、2ppm以下即可。 Further, the adhesive composition of the present invention is derived from the adhesive group In the metal component of the adhesion preventing agent contained in the product, the content of the metal component containing the most is 10 ppb or more and 2 ppm or less with respect to the total solid weight of the adhesive composition.

(接著劑組成物之用途) (Use of the adhesive composition)

本發明之接著劑組成物係用於接著晶圓與該晶圓之支撐體。 The adhesive composition of the present invention is used to support the wafer and the support of the wafer.

支撐體為例如在晶圓薄化之步驟中發揮支撐晶圓之角色,且利用本發明之接著劑組成物接著於晶圓上。一實施形態中,支撐體係以例如其膜厚為500~1000μm之玻璃或矽形成。 The support is, for example, a role of supporting the wafer in the step of thinning the wafer, and the composition of the adhesive of the present invention is applied to the wafer. In one embodiment, the support system is formed, for example, of glass or ruthenium having a film thickness of 500 to 1000 μm.

又,一實施形態中,於支撐體上設置貫穿支撐體厚度方向之孔。透過該孔使溶解接著劑組成物之溶劑流入支撐體與晶圓之間,藉此可容易地分離支撐體與基板。 Further, in one embodiment, a hole penetrating the thickness direction of the support body is provided on the support. The solvent that dissolves the adhesive composition flows between the support and the wafer through the hole, whereby the support and the substrate can be easily separated.

又,其他實施形態中,支撐體與晶圓間亦可介隔接著層以外之反應層。反應層係藉由吸收透過支撐體照射之光而變質,藉由對反應層照射光等使反應層變質,可使支撐體與晶圓容易地分離。該情況下,支撐體較好使用未設置貫穿厚度方向之孔之支撐體。 Further, in another embodiment, a reaction layer other than the adhesion layer may be interposed between the support and the wafer. The reaction layer is deteriorated by absorbing light irradiated through the support, and the reaction layer is degraded by irradiating light or the like to the reaction layer, whereby the support and the wafer can be easily separated. In this case, it is preferable to use a support body which is not provided with a hole penetrating in the thickness direction.

照射於反應層之光只要依據可吸收反應層之波長,適當地使用例如YAG雷射、紅寶石雷射、玻璃雷射、YVO4雷射、LD雷射、光纖雷射等固體雷射、色素雷射等液體雷射,CO2雷射、準分子雷射、Ar雷射、He-Ne 雷射等氣體雷射、半導體雷射、自由電子雷射等雷射光,或者非雷射光即可。反應層所吸收之所有光之波長並不限於該等,例如可為600nm以下之波長之光。 The light irradiated to the reaction layer is suitably used as a solid laser such as a YAG laser, a ruby laser, a glass laser, a YVO 4 laser, an LD laser, a fiber laser, or the like, depending on the wavelength of the absorbable reaction layer. Laser lasers such as CO 2 lasers, excimer lasers, Ar lasers, He-Ne lasers, semiconductor lasers, free electron lasers, or non-laser light. The wavelength of all light absorbed by the reaction layer is not limited to these, and may be, for example, light having a wavelength of 600 nm or less.

反應層亦可含例如藉由光等而分解之光吸收 劑。光吸收劑可使用例如石墨粉、鐵、鋁、銅、鎳、鈷、錳、鉻、鋅、碲等微粒子金屬粉末,黑色氧化鈦等金屬氧化物粉末、碳黑、或芳香族二胺系金屬錯合物、脂肪二胺系金屬錯合物、芳香族二硫醇系金屬錯合物、巰基酚系金屬錯合物、方酸鎓系化合物、菁系色素、次甲基系色素、萘醌系色素、蒽醌系色素等染料或顏料。該種反應層可藉由例如與黏結劑樹脂混合,塗佈於支撐體上而形成。又,亦可使用具有光吸收基之樹脂。 The reaction layer may also contain light absorption which is decomposed by, for example, light or the like. Agent. As the light absorbing agent, for example, a fine metal powder such as graphite powder, iron, aluminum, copper, nickel, cobalt, manganese, chromium, zinc or bismuth, a metal oxide powder such as black titanium oxide, carbon black, or an aromatic diamine metal can be used. Complex, fatty diamine metal complex, aromatic dithiol metal complex, nonylphenol metal complex, squaraine compound, cyanine dye, methine dye, naphthoquinone A dye or pigment such as a pigment or an anthraquinone dye. Such a reaction layer can be formed by, for example, mixing with a binder resin and coating it on a support. Further, a resin having a light absorbing group can also be used.

又,亦可使用藉由電漿CVD法形成之無機膜 或有機膜作為反應層。無機膜可使用例如金屬膜。又,有機膜可使用氟碳膜。該反應膜可於例如支撐體上以電漿CVD法形成。 Further, an inorganic film formed by a plasma CVD method can also be used. Or an organic film as a reaction layer. As the inorganic film, for example, a metal film can be used. Further, as the organic film, a fluorocarbon film can be used. The reaction film can be formed, for example, by a plasma CVD method on a support.

本發明之接著劑組成物較好地適用於在與支 撐體接著後供給於薄化步驟中之晶圓與支撐體之接著。如上述,該支撐體係在晶圓薄化時保持晶圓之強度。本發明之接著劑組成物係較好地應用於該晶圓與支撐體之接著。 The adhesive composition of the present invention is preferably suitable for use in The support is then supplied to the wafer and the support in the thinning step. As described above, the support system maintains the strength of the wafer as the wafer is thinned. The adhesive composition of the present invention is preferably applied to the wafer and the support.

又,本發明之接著劑組成物較好使用於與支 撐體接著後供給於電極形成步驟中之晶圓與支撐體之接著。 Moreover, the adhesive composition of the present invention is preferably used in the support The support is then supplied to the wafer and the support in the electrode formation step.

若接著劑組成物中若含膠著防止劑,則源自 膠著防止劑之金屬成分會殘留在晶圓上,對形成有電極之晶圓之電特性造成不良影響。另一方面,本發明之接著劑組成物由於去除了膠著防止劑,故使晶圓與支撐體接著、經溶解並洗淨後,不會在晶圓上產生殘留物。因此,若在晶圓與支撐體之接著中使用本發明之接著劑組成物,則使設置有電極等之電元件的晶圓電特性,尤其是連接特性良好。 If the adhesive composition contains a gel inhibitor, it is derived from The metal component of the adhesion preventive agent remains on the wafer, adversely affecting the electrical characteristics of the wafer on which the electrode is formed. On the other hand, since the adhesive composition of the present invention removes the adhesion preventing agent, the wafer and the support are subsequently dissolved, washed, and no residue is generated on the wafer. Therefore, when the adhesive composition of the present invention is used in the subsequent step of the wafer and the support, the electrical characteristics of the wafer provided with the electrode or the like, in particular, the connection characteristics are excellent.

依據本發明之接著劑組成物,使用於晶圓與 該晶圓之支撐體之接著後,可防止以溶劑溶解並洗淨時之於晶圓上殘留物之發生。 An adhesive composition according to the present invention, used in wafers and Subsequent to the support of the wafer, the occurrence of residues on the wafer when dissolved and washed by the solvent can be prevented.

(由接著劑組成物形成之接著劑層之去除) (Removal of the adhesive layer formed by the adhesive composition)

以本發明之接著劑組成物接著之晶圓與支撐體於藉由使上述反應層變質等而分離後,去除接著劑層時,若使用使接著劑組成物溶解之溶劑則可輕易地去除。另外,未使用上述反應層等,而藉由以晶圓與支撐體接著之狀態下將溶劑直接供給於接著劑層,即可容易地使接著劑層溶解而去除該接著劑層,使晶圓與支撐體分離。該情況下,為了提高溶劑對接著劑層之供給效率,更好於支撐體上設置貫穿孔。 The adhesive composition of the present invention is subsequently separated from the support by degrading the reaction layer or the like, and when the adhesive layer is removed, the solvent can be easily removed by using a solvent which dissolves the adhesive composition. Further, by using the above reaction layer or the like without supplying the solvent directly to the adhesive layer in a state in which the wafer and the support are next, the adhesive layer can be easily dissolved to remove the adhesive layer, and the wafer can be removed. Separated from the support. In this case, in order to improve the supply efficiency of the solvent to the adhesive layer, it is more preferable to provide a through hole in the support.

[接著劑組成物之製造方法] [Method of Manufacturing Adhesive Composition]

本發明之用於使晶圓與該晶圓之支撐體接著之接著劑組成物之製造方法包含去除接著劑組成物中所含膠著防止 劑之純化步驟。另外,本發明之接著劑組成物之製造方法在上述純化步驟中,較好使源自上述接著劑組成物中所含膠著防止劑之金屬成分之含量相對於上述接著劑組成物之總固體重量為2ppm以下。又,源自接著劑組成物中所含膠著防止劑之金屬成分之含量之下限值雖期望為「0」,但實質上只要是金屬成分之檢測極限值(一般為10ppb)即可。 The manufacturing method for the adhesive composition of the present invention for supporting the wafer and the support of the wafer comprises removing the adhesive contained in the adhesive composition The purification step of the agent. Further, in the method for producing an adhesive composition of the present invention, in the above purification step, the content of the metal component derived from the adhesion preventing agent contained in the adhesive composition is preferably relative to the total solid weight of the adhesive composition. It is 2 ppm or less. In addition, the lower limit of the content of the metal component of the adhesion preventing agent contained in the adhesive composition is desirably "0", but it is only required to be a detection limit value (generally 10 ppb) of the metal component.

(純化步驟) (purification step)

純化步驟中,作為去除接著劑組成物中所含膠著防止劑之方法具體而言列舉為(1)過濾接著劑組成物去除膠著防止劑之方法。 In the purification step, the method of removing the adhesion preventing agent contained in the adhesive composition is specifically exemplified by (1) a method of removing the adhesion preventing agent by filtering the adhesive composition.

過濾接著劑組成物以去除膠著防止劑之方法中,首先使接著劑組成物通過孔徑0.01~10μm之過濾器(較好為0.1~10μm),自溶液去除膠著防止劑。過濾器之孔徑可依據接著劑組成物中所含膠著防止劑之種類適當選擇。亦即,過濾器只要為可過濾該膠著防止劑之孔徑即可。 In the method of filtering the adhesive composition to remove the adhesion preventing agent, first, the adhesive composition is passed through a filter having a pore diameter of 0.01 to 10 μm (preferably 0.1 to 10 μm) to remove the adhesion preventing agent from the solution. The pore diameter of the filter can be appropriately selected depending on the kind of the adhesion preventing agent contained in the adhesive composition. That is, the filter may be any pore size that can filter the adhesion preventing agent.

過濾器之材質列舉為例如聚丙烯、尼龍(聚醯胺)、聚四氟乙烯(PTFE)等。孔徑只要自0.01~10μm,較好自0.1~10μm適當選擇即可。 The material of the filter is exemplified by, for example, polypropylene, nylon (polyamide), polytetrafluoroethylene (PTFE), or the like. The pore diameter may be appropriately selected from 0.01 to 10 μm, preferably from 0.1 to 10 μm.

又,至於上述純化步驟(1)之前處理步驟(2),亦可將接著劑組成物中使用之樹脂溶解於溶劑中而成之樹脂溶液滴加於對該樹脂溶液為弱溶劑之例如水、醇中,使樹脂再沉澱(析出)。該醇較好為碳數1~4之醇,列舉為例 如甲醇、乙醇、1-丙醇、2-丙醇、1-丁醇、2-丁醇等。使樹脂溶解之溶劑列舉為上述之對-薄荷烷等萜烯系溶劑,上述環己烷、十氫萘等石油系溶劑。接著藉由自分散有上述膠著防止劑之溶液取出沉澱之樹脂,自樹脂去除膠著防止劑。使用如此已去除膠著防止劑之樹脂調製接著劑組成物。接著,以上述純化步驟(1)進一步純化接著劑組成物,可製造已去除膠著防止劑之接著劑組成物。 Further, as for the treatment step (2) before the purification step (1), the resin solution obtained by dissolving the resin used in the adhesive composition in a solvent may be added dropwise to the resin solution as a weak solvent such as water. In the alcohol, the resin is reprecipitated (precipitated). The alcohol is preferably an alcohol having 1 to 4 carbon atoms, which is exemplified as an example. For example, methanol, ethanol, 1-propanol, 2-propanol, 1-butanol, 2-butanol, and the like. The solvent in which the resin is dissolved is exemplified by a terpene solvent such as p-menthane or a petroleum solvent such as cyclohexane or decalin. Then, the precipitated resin is taken out from the solution in which the above-mentioned adhesion preventing agent is dispersed, and the adhesion preventing agent is removed from the resin. The adhesive composition is prepared using the resin from which the adhesion preventing agent has been removed. Next, the adhesive composition is further purified by the above purification step (1), and an adhesive composition having the adhesion preventing agent removed can be produced.

於溶液中沉澱之樹脂可藉由過濾、僅去除上 澄液(傾析)、離心分離、樹脂再沉澱等方法,自溶液取出。 The resin precipitated in the solution can be filtered and removed only The liquid solution (decanting), centrifugation, resin reprecipitation, etc. are taken out from the solution.

又,作為上述純化步驟(1)之前處理步驟(2)亦 可為洗淨顆粒狀之樹脂而去除膠著防止劑。首先,邊將顆粒狀之樹脂在水、醇(較好為碳數1~4之醇)等弱溶劑中攪拌邊洗淨,使附著於顆粒狀樹脂表面上之膠著防止劑脫離。接著,以例如孔徑10~200μm之網目較粗的網篩過濾器過濾分散有顆粒之溶液,而自樹脂去除脫離之膠著防止劑。使用如此已去除膠著防止劑之樹脂調製接著劑組成物。 接著,以上述純化步驟(1)進一步純化接著劑組成物,可製造已去除膠著防止劑之接著劑組成物。 Further, as the purification step (1), the treatment step (2) is also The adhesion preventing agent can be removed by washing the granular resin. First, the granular resin is washed with a weak solvent such as water or an alcohol (preferably an alcohol having 1 to 4 carbon atoms) while stirring to remove the adhesion preventing agent adhering to the surface of the particulate resin. Next, the solution in which the particles are dispersed is filtered by, for example, a mesh filter having a relatively large mesh size of 10 to 200 μm, and the release preventing agent is removed from the resin. The adhesive composition is prepared using the resin from which the adhesion preventing agent has been removed. Next, the adhesive composition is further purified by the above purification step (1), and an adhesive composition having the adhesion preventing agent removed can be produced.

又,與上述以水、醇等進行之洗淨相同,將 顆粒狀之樹脂浸漬於氫氟酸等酸中溶解去除膠著防止劑之以酸進行洗淨之方法亦可溶解去除膠著防止劑。 Moreover, it is the same as the above washing with water, alcohol, etc. The granulated resin is immersed in an acid such as hydrofluoric acid to dissolve and remove the adhesion preventing agent, and the acid can be washed to remove the adhesion preventing agent.

又,亦可使用風力篩選機(噴射分離機),以風 力將較輕之膠著防止劑集塵,僅回收較重之顆粒,藉此自 樹脂去除膠著防止劑。 Also, a wind screening machine (jet separation machine) can be used to wind The force will be lighter and the anti-collection agent will collect dust, and only the heavier particles will be recovered. The resin removes the adhesion preventing agent.

且,作為上述純化步驟(1)之前述處理步驟(2) ,亦可在將樹脂浸漬於溶液中之狀態下,以超音波洗淨而去除膠著防止劑。浸漬樹脂之溶液列舉為弱溶劑。至於弱溶劑列舉為例如二醇醚類的丙二醇單甲基醚乙酸酯、丙二醇單甲基醚、碳數1~5之低級醇的甲醇、乙醇、丙醇等。 藉由使用該等弱溶劑,樹脂本身雖實質上不溶解,但可藉由使樹脂膨潤而去除膠著防止劑。再者,使樹脂浸漬於溶液中之溫度較好為20度以上、50度以下。超音波洗淨時間較好為5分鐘以上、60分鐘以下。使用此種已去除膠著防止劑之樹脂調製接著劑組成物。接著,藉由以上述純化步驟(1)進一步純化接著劑組成物,可製造已去除膠著防止劑之接著劑組成物。 And, as the above-mentioned processing step (2) of the above purification step (1) Alternatively, the adhesion preventing agent may be removed by ultrasonic cleaning while immersing the resin in the solution. The solution impregnated with the resin is exemplified as a weak solvent. The weak solvent is exemplified by, for example, glycol ether propylene glycol monomethyl ether acetate, propylene glycol monomethyl ether, methanol having a carbon number of 1 to 5, methanol, ethanol, propanol or the like. By using these weak solvents, the resin itself is substantially insoluble, but the adhesion preventing agent can be removed by swelling the resin. Further, the temperature at which the resin is immersed in the solution is preferably 20 degrees or more and 50 degrees or less. The ultrasonic cleaning time is preferably 5 minutes or longer and 60 minutes or shorter. The adhesive composition is prepared using such a resin from which the adhesion preventing agent has been removed. Next, by further purifying the adhesive composition by the above purification step (1), an adhesive composition having the adhesion preventing agent removed can be produced.

以將樹脂浸漬於溶液中之狀態進行超音波洗 淨時,只要使用習知之超音波洗淨機即可。 Ultrasonic washing in a state where the resin is immersed in a solution For the net, just use the conventional ultrasonic cleaning machine.

如上述,去除接著劑組成物中所含膠著防止 劑之方法可分別單獨進行,亦可組合複數種方法進行。亦即,亦可提供使藉由使膠著防止劑沉澱去除之方法而去除樹脂中所含膠著防止劑之接著劑組成物,再進行過濾而去除膠著防止劑之方法。 As described above, the adhesion prevention contained in the adhesive composition is removed. The methods of the agents may be carried out separately or in combination with a plurality of methods. In other words, a method of removing the adhesion preventing agent by removing the adhesion preventing agent contained in the resin by a method of precipitating and removing the adhesion preventing agent, and then removing the adhesion preventing agent may be provided.

使上述樹脂再沉澱(析出)時,或洗淨樹脂時, 以網目較粗之網篩過濾器過濾後,亦可藉由使之溶解於對-薄荷烷等萜烯系溶劑、環己烷、十氫萘等石油系溶劑中,而回收樹脂。過濾接著劑組成物去除膠著防止劑時, 係以過濾獲得之溶液作為接著劑組成物。 When the resin is reprecipitated (precipitated) or when the resin is washed, After filtering through a mesh filter having a relatively large mesh size, the resin may be recovered by dissolving it in a terpene solvent such as p-menthane, a petroleum solvent such as cyclohexane or decalin. When the adhesive composition is filtered to remove the adhesion preventing agent, The solution obtained by filtration was used as an adhesive composition.

依據本發明之接著劑組成物之製造方法,由 於以純化步驟去除接著劑組成物中所含之膠著防止劑,故可製造於使用於使晶圓與晶圓之支撐體接著後,可防止以溶劑溶解洗淨時之於晶圓上殘留物產生之接著劑組成物。 且,可提供使用於晶圓與該晶圓之支撐體之接著後,防止以溶劑溶解並洗淨時之於晶圓上殘留物產生之接著劑組成物。 a method for producing an adhesive composition according to the present invention, The removal of the adhesion preventing agent contained in the adhesive composition by the purification step can be performed by using the support for the wafer and the wafer to prevent the residue on the wafer from being washed and dissolved in the solvent. The resulting adhesive composition. Further, an adhesive composition for preventing the generation of residues on the wafer when dissolved in a solvent and washed after the support of the wafer and the wafer can be provided.

又,以利用本發明之接著劑組成物之製造方 法而去除膠著防止劑為對象之接著劑組成物、及使用本發明之接著劑組成物使晶圓與支撐體接著之層合體之製造方法、於該層合體之晶圓上形成電極之電極形成方法、自該層合體之晶圓剝離支撐體之剝離方法、剝離支撐體並洗淨晶圓之洗淨方法均屬本發明之範疇。 Further, in order to use the manufacturer of the adhesive composition of the present invention A method for removing an adhesion preventing agent as a target, and a method for producing a laminate in which a wafer and a support are bonded using the adhesive composition of the present invention, and an electrode for forming an electrode on a wafer of the laminate The method, the stripping method of the wafer stripping support from the laminate, the method of stripping the support, and the cleaning of the washed wafer are all within the scope of the present invention.

[接著薄膜] [Next film]

本發明之接著劑組成物可依據用途採用各種利用形態。例如,可使用直接以液狀塗佈於半導體晶圓等被加工體上而形成接著劑層之方法,亦可使用本發明之接著薄膜,亦即預先於可撓性薄膜等之薄膜上形成包含上述任一種接著劑組成物之接著劑層後,經乾燥,將該薄膜(接著薄膜)貼附於被加工體上之方法(接著薄膜法)。 The adhesive composition of the present invention can be used in various utilization forms depending on the use. For example, a method of directly applying a liquid to a workpiece such as a semiconductor wafer to form an adhesive layer may be used, and the adhesive film of the present invention may be used, that is, a film formed on a film such as a flexible film may be used in advance. After the adhesive layer of any of the above-mentioned adhesive compositions is dried, the film (subsequent film) is attached to the object to be processed (following the film method).

如此,本發明之接著劑薄膜為在薄膜上具備 含有上述任一種接著劑組成物之接著劑層。 Thus, the adhesive film of the present invention is provided on the film An adhesive layer containing any of the above-described adhesive compositions.

接著薄膜亦可於接著劑層上進而被覆保護薄 膜而使用。該情況下,剝離接著劑層上之保護薄膜,且於被加工體上重疊露出之接著劑層後,自接著劑層剝離上述薄膜,藉此可於被加工體上容易地設置接著劑層。 The film can then be coated on the adhesive layer and then covered with a protective film. Use as a film. In this case, after the protective film on the adhesive layer is peeled off and the exposed adhesive layer is superimposed on the workpiece, the film is peeled off from the adhesive layer, whereby the adhesive layer can be easily provided on the workpiece.

因此,若使用該接著薄膜,相較於直接於被 加工體上塗佈接著劑組成物形成接著劑層之情況,可形成膜厚均勻性及表面平滑性良好之接著劑層。 Therefore, if the adhesive film is used, it is compared to the direct When the adhesive composition is applied to the processed body to form an adhesive layer, an adhesive layer having good film thickness uniformity and surface smoothness can be formed.

至於接著薄膜之製造中使用之上述薄膜只要 是可自該薄膜剝離製膜於薄膜上之接著劑層,並將接著劑層轉印於保護基板或晶圓等之被處理面上之脫模薄膜即可,並無特別限制。列舉為例如由膜厚15~125μm之聚對苯二甲酸乙二酯、聚乙烯、聚丙烯、聚碳酸酯及聚氯化乙烯等之合成樹脂薄膜所成之可撓性薄膜。上述薄膜亦可視需要施以脫模處理以使容易轉印。 As for the above film used in the manufacture of the film, The release film which is formed by peeling off the film on the film from the film and transferring the adhesive layer to the surface to be processed such as a protective substrate or a wafer is not particularly limited. For example, it is a flexible film made of a synthetic resin film of polyethylene terephthalate having a film thickness of 15 to 125 μm, polyethylene, polypropylene, polycarbonate, or polyvinyl chloride. The above film may also be subjected to a release treatment as needed to facilitate transfer.

於上述薄膜上形成接著劑層之方法列舉為依 據期望之接著劑層之膜厚或均勻性使用適當、習知之方法,以使薄膜上之接著劑層之乾燥膜厚成為10~1000μm之方式,塗佈本發明之接著劑組成物之方法。 The method of forming an adhesive layer on the above film is listed as The film thickness or uniformity of the desired adhesive layer is applied to the adhesive composition of the present invention by a suitable and conventional method so that the dried film thickness of the adhesive layer on the film is 10 to 1000 μm.

又,使用保護薄膜時,作為保護薄膜只要可 自接著劑層剝離即無限制,較好為例如聚對苯二甲酸乙二酯膜、聚丙烯膜及聚乙烯膜。另外,各保護薄膜較好塗覆或熱貼合矽。其理由為使自接著劑層之剝離變容易。保護薄膜之厚度並無特別限制,但較好為15~125μm。其理由為可確保具備有保護薄膜之接著薄膜的柔軟性。 Moreover, when a protective film is used, as a protective film, The peeling from the adhesive layer is not limited, and is preferably, for example, a polyethylene terephthalate film, a polypropylene film, or a polyethylene film. In addition, each of the protective films is preferably coated or heat bonded to the crucible. The reason for this is that the peeling from the adhesive layer is facilitated. The thickness of the protective film is not particularly limited, but is preferably 15 to 125 μm. The reason for this is that the flexibility of the adhesive film having the protective film can be ensured.

接著薄膜之使用方法並無特別限制,例如使 用保護薄膜時,列舉為將其剝離後,於被加工體上重疊露出之接著劑層,且自薄膜上(形成接著劑層之面之背面)移動加熱輥,而將接著劑層熱壓著於被加工體表面之方法。 此時,自接著薄膜剝離之保護薄膜若以依序捲繞輥等之輥捲成輥狀,則可保存再利用。 The method of using the film is not particularly limited, for example, When the protective film is used, the adhesive layer is superposed on the object to be peeled off, and the heat roller is moved from the film (the back surface of the surface on which the adhesive layer is formed), and the adhesive layer is heat-pressed. The method of the surface of the body to be processed. At this time, the protective film peeled off from the film can be stored and reused by winding a roll such as a roll or the like in a roll shape.

[實施例] [Examples]

[接著劑組成物之調製] [Preparation of the composition of the adhesive]

實施例1~10及比較例1~4中使用之樹脂(烴樹脂或彈性體)、聚合抑制劑、主溶劑、添加溶劑示於下述表1及2。又,表2中之「份」均為重量份。 The resins (hydrocarbon resin or elastomer), polymerization inhibitor, main solvent, and added solvent used in Examples 1 to 10 and Comparative Examples 1 to 4 are shown in Tables 1 and 2 below. In addition, the "parts" in Table 2 are all parts by weight.

烴樹脂係使用POLYPLASTIC公司製之「 TOPAS(商品名)8007X10,Mw=95,000,Mw/Mn=1.9,m:n=35:65(莫耳比)」(以下稱為COC A),及三井化學公司製之「APEL(商品名)8008T COC,Mw=100,000,Mw/Mn=2.1,m:n=80:20(莫耳比)」(以下稱為COC 1)。 Hydrocarbon resin is made by POLYPLASTIC. TOPAS (trade name) 8007X10, Mw=95,000, Mw/Mn=1.9, m:n=35:65 (Morby) (hereinafter referred to as COC A), and "APEL (trade name) manufactured by Mitsui Chemicals Co., Ltd.) 8008T COC, Mw = 100,000, Mw / Mn = 2.1, m: n = 80: 20 (mole ratio)" (hereinafter referred to as COC 1).

至於彈性體係使用Kuraray公司製之Septon( 商品名)之HG252(SEEPS-OH:聚苯乙烯-聚(乙烯-乙烯/丙烯)嵌段-聚苯乙烯末端羥基改質)、HG253、及Septon8007(SEBS:聚苯乙烯-聚(乙烯/丁烯)嵌段-聚苯乙烯)、以及旭化成公司製之TUFTEC(商品名)之H1051(SEBS,氫化苯乙烯系熱可塑性彈性體)、及 H1053(SEBS,氫化苯乙烯系熱可塑性彈性體)。又,本實施例中之「氫化」為使苯乙烯與丁二烯之嵌段共聚物之雙鍵經氫化而成之聚合物。 As for the elastic system, Sepatum (made by Kuraray) is used. Trade name) HG252 (SEEPS-OH: polystyrene-poly(ethylene-ethylene/propylene) block-polystyrene terminal hydroxyl modification), HG253, and Septon8007 (SEBS: polystyrene-poly(ethylene/butyl) (A) block-polystyrene), H1051 (SEBS, hydrogenated styrene-based thermoplastic elastomer) of TUFTEC (trade name) manufactured by Asahi Kasei Corporation, and H1053 (SEBS, hydrogenated styrene thermoplastic elastomer). Further, the "hydrogenation" in the present embodiment is a polymer obtained by hydrogenating a double bond of a block copolymer of styrene and butadiene.

使用之彈性體中之苯乙烯含量與彈性體之重量平均分子量示於下表1。 The styrene content in the elastomer used and the weight average molecular weight of the elastomer are shown in Table 1 below.

又,作為熱聚合抑制劑係使用BASF公司製 造之「IRGANOX(商品名)1010」。且,主溶劑係使用以下述化學式(I)表示之十氫萘。且,使用乙酸丁酯作為添加溶劑。 Further, as a thermal polymerization inhibitor, BASF Corporation was used. "IRGANOX (trade name) 1010". Further, as the main solvent, decalin represented by the following chemical formula (I) is used. Further, butyl acetate was used as an additive solvent.

實施例1之接著劑組成物之調製係如下進行 。首先,使表2所示之樹脂100重量份溶解於主溶劑255重量份中。接著以相對於彈性體100重量份,使熱聚合抑制劑成為1重量份、乙酸丁酯成為45重量份之方式添加加入有熱聚合抑制劑之乙酸丁酯溶液。使用孔徑1μm之 PTFE過濾器(PALL公司製)過濾如此獲得之接著劑組成物。以ICP-MS(Agilent科技股份有限公司製,製品名:7500cs)測定所得接著劑組成物中源自膠著防止劑之金屬成分之含量(金屬含量)。 The preparation of the adhesive composition of Example 1 was carried out as follows . First, 100 parts by weight of the resin shown in Table 2 was dissolved in 255 parts by weight of the main solvent. Then, a butyl acetate solution to which a thermal polymerization inhibitor is added is added so that the thermal polymerization inhibitor becomes 1 part by weight and the butyl acetate becomes 45 parts by weight with respect to 100 parts by weight of the elastomer. Use aperture 1μm A PTFE filter (manufactured by PALL Co., Ltd.) was used to filter the thus obtained adhesive composition. The content (metal content) of the metal component derived from the adhesion preventing agent in the obtained adhesive composition was measured by ICP-MS (manufactured by Agilent Technology Co., Ltd., product name: 7500 cs).

又,針對接著劑組成物,藉由測定濁度,確 認膠著防止劑去除效果。濁度係使用SHIMADZU UV-3600測定。 Moreover, by measuring the turbidity for the adhesive composition, Adhesives prevent the removal effect. Turbidity was determined using SHIMADZU UV-3600.

接著劑組成物中之金屬成分之含量係以鈉、 鎂、鋁、鉀、鈣、鉻、錳、鐵、鎳及銅10種元素中,於接著劑組成物中含量最多之金屬成分之含量予以表示。接著劑組成物中之金屬含量示於表2。且,實施例2~4及6,亦以同樣方法獲得接著劑組成物。實施例5及7係在使接著劑樹脂成分浸漬在23℃之甲醇中之狀態下以三合一馬達(THREE-ONE MOTOR)攪拌.洗淨後同樣經過濾而進行膠著防止劑之去除,實施例8中,除了以接著劑樹脂成分之十氫萘溶解液(10wt%濃度)作為弱溶劑,滴加於水/甲醇(重量比2/8)使接著劑樹脂成分再沉澱後同樣過濾而進行膠著防止劑之去除以外,於以與實施例1相同方法獲得接著劑組成物。且,實施例9中,係使用風力篩選機(噴射分離機(ACO公司製造,Jet Separator CFS)),自接著劑樹脂成分集塵膠著防止劑後,同樣進行過濾而進行膠著防止劑之去除以外,餘以與實施例1相同方法獲得接著劑組成物。 The content of the metal component in the composition of the subsequent agent is sodium, Among the ten elements of magnesium, aluminum, potassium, calcium, chromium, manganese, iron, nickel and copper, the content of the metal component having the highest content in the adhesive composition is shown. The metal content in the subsequent composition is shown in Table 2. Further, in Examples 2 to 4 and 6, an adhesive composition was obtained in the same manner. Examples 5 and 7 were stirred by a three-in-one motor (THREE-ONE MOTOR) while the adhesive resin component was immersed in methanol at 23 °C. After washing, the adhesion preventing agent was also removed by filtration. In Example 8, except that the decalin solution (10% by weight concentration) of the adhesive resin component was used as a weak solvent, it was added dropwise to water/methanol (weight ratio 2). /8) An adhesive composition was obtained in the same manner as in Example 1 except that the adhesive resin component was reprecipitated and filtered in the same manner to remove the adhesion preventing agent. Further, in the ninth embodiment, a wind-screening machine (jet separation machine (Jet Separator CFS) manufactured by ACO Co., Ltd.) was used, and after the binder resin component was collected as a dust-preventing agent, the same was carried out by filtration to remove the adhesion preventing agent. The adhesive composition was obtained in the same manner as in Example 1.

實施例10係使接著劑樹脂成分在35℃浸漬於 丙二醇單甲基醚乙酸酯之狀態,於超音波洗淨機中(AIWA醫科工業製,型號:AU-70C,振盪輸出:100W,頻率:28kHz)洗淨30分鐘,去除膠著防止劑後,同樣過濾而進行以外,於以與實施例1相同方法獲得接著劑組成物。 In Example 10, the adhesive resin component was immersed at 35 ° C. The state of propylene glycol monomethyl ether acetate was washed in an ultrasonic cleaner (AIWA Medical Industry, model: AU-70C, oscillation output: 100 W, frequency: 28 kHz) for 30 minutes to remove the adhesion preventing agent. The adhesive composition was obtained in the same manner as in Example 1 except that the filtration was carried out.

對於實施例5、7~10之樹脂進行上述特定之 處理後,使用處理後之樹脂調製接著劑組成物。此處,實施例5、7、9、10係對顆粒直接處理。實施例8係使顆粒溶解一次後,進行再沉澱處理。 For the resin of Example 5, 7-10, the above specific After the treatment, the treated resin was used to prepare the adhesive composition. Here, Examples 5, 7, 9, and 10 directly treat the particles. In Example 8, after the particles were dissolved once, a reprecipitation treatment was carried out.

實施例1~10之各接著劑組成物中之金屬含量 ,相對於接著劑組成物之總固體重量均為10ppb以上,2ppm以下。且,接著劑組成物之濁度亦全部為5%以下而為良好。 Metal content in each of the adhesive compositions of Examples 1 to 10. The total solid weight relative to the adhesive composition is 10 ppb or more and 2 ppm or less. Further, the turbidity of the adhesive composition was also preferably 5% or less.

比較例1~4中,除了過濾接著劑組成物並測 定金屬含量以外,餘以與實施例1相同方法,獲得接著劑組成物。 In Comparative Examples 1 to 4, in addition to filtering the adhesive composition and measuring The adhesive composition was obtained in the same manner as in Example 1 except for the predetermined metal content.

[接著劑層之形成] [Formation of adhesive layer]

將各接著劑組成物旋轉塗佈於12吋Si晶圓上,在100℃、160℃、200℃下各燒結5分鐘,形成接著劑層(膜厚50μm)。 Each of the adhesive compositions was spin-coated on a 12 Å Si wafer, and each was sintered at 100 ° C, 160 ° C, and 200 ° C for 5 minutes to form an adhesive layer (film thickness: 50 μm).

於其一支撐體上設置隨後藉由照射雷射而變 質使支撐體與晶圓剝離之反應層。至於反應層係藉由以流量400sccm、壓力700mTorr、高頻電力2500W及成膜溫度240℃之條件下,使用C4F8作為反應氣體之CVD法, 在支撐板(12吋玻璃,厚度700μm)上形成氟碳膜(1μm)。 A reaction layer which is subsequently deformed by irradiation with a laser to peel the support from the wafer is disposed on one of the supports. As for the reaction layer, a CVD method using C 4 F 8 as a reaction gas under the conditions of a flow rate of 400 sccm, a pressure of 700 mTorr, a high-frequency power of 2,500 W, and a film formation temperature of 240 ° C, in a support plate (12 吋 glass, thickness: 700 μm) A fluorocarbon film (1 μm) was formed thereon.

[層合體之薄化處理] [Thinning treatment of laminate]

使用晶圓與支撐體之層合體,進行晶圓之薄化處理、光微影處理等。 The laminate of the wafer and the support is used to perform thinning of the wafer, photolithography, and the like.

[接著劑層之洗淨] [cleaning of the adhesive layer]

照射532nm雷射使晶圓與支撐體分離。以對-薄荷烷噴霧洗淨經去除支撐體之晶圓,去除接著劑層。顯微鏡觀察去除接著劑層後之晶圓表面,確認殘留物之產生。結果示於表2。又,表2中顯示「○」之結果係表示未確認到殘留物,顯示「△」之結果係表示確認有小或少量之殘留物,顯示「×」之結果係表示確認到大的或大量殘留物。 Irradiation of the 532 nm laser separates the wafer from the support. The wafer on which the support was removed was washed with a p-menthane spray to remove the adhesive layer. The surface of the wafer after removing the adhesive layer was observed under a microscope to confirm the generation of residue. The results are shown in Table 2. Further, in Table 2, the result of "○" indicates that no residue was confirmed, and the result of "△" indicates that a small or small amount of residue was confirmed, and the result of "x" indicates that large or large amount of residue was confirmed. Things.

如表2所示,實施例中洗淨後之晶圓未發生 殘留物,比較例中洗淨後之晶圓表面上確認到1~100μm之結晶物之殘留物。另外,比較例中關於接著劑組成物之濁度均超過5%。 As shown in Table 2, the wafer after cleaning in the example did not occur. Residue, the residue of crystals of 1 to 100 μm was confirmed on the surface of the wafer after washing in the comparative example. Further, in the comparative examples, the turbidity of the adhesive composition was more than 5%.

本發明並不限於上述實施形態,可在申請專 利範圍所示之範圍中進行各種變更,關於適當組合實施形態所揭示之技術手段所得之實施形態亦包含在本發明之技術範圍中。 The present invention is not limited to the above embodiment, and can be applied for Various modifications are possible in the range indicated by the scope of the invention, and embodiments obtained by appropriately combining the technical means disclosed in the embodiments are also included in the technical scope of the present invention.

[產業上之可利用性] [Industrial availability]

本發明之製造方法、接著劑組成物及接著薄膜可較好地利用於例如經微細化之半導體裝置之製造步驟中。 The production method, the adhesive composition, and the adhesive film of the present invention can be preferably used in, for example, a manufacturing step of a miniaturized semiconductor device.

Claims (12)

一種用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其特徵為包含去除接著劑組成物中所含膠著防止劑之純化步驟。 A method for producing a composition for bonding a wafer to a support of the wafer, characterized by comprising a purification step of removing an adhesion preventing agent contained in the adhesive composition. 如請求項1之用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其中上述純化步驟中,源自上述接著劑組成物中所含膠著防止劑之金屬成分之含量相對於上述接著劑組成物之總固體重量為2ppm以下。 The method for producing an adhesive composition for causing a wafer and a support of the wafer according to claim 1, wherein the purification step is derived from a metal component of the adhesion preventing agent contained in the adhesive composition. The content is 2 ppm or less based on the total solid weight of the above-mentioned adhesive composition. 如請求項1或2之用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其中於上述純化步驟中,過濾含上述接著劑組成物之溶液。 A method of producing an adhesive composition for replenishing a wafer and a support of the wafer according to claim 1 or 2, wherein in the above purification step, the solution containing the above-described adhesive composition is filtered. 如請求項3之用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其中於上述純化步驟之前,於包含形成上述接著劑組成物之樹脂的樹脂溶液中,使該樹脂再沉澱後,上述接著劑組成物中含有自該樹脂溶液取出之樹脂。 A method for producing a binder composition for causing a wafer and a support of the wafer according to claim 3, wherein, before the purifying step, in a resin solution containing a resin forming the above-mentioned adhesive composition, After the resin is reprecipitated, the above-mentioned adhesive composition contains a resin taken out from the resin solution. 如請求項3之用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其中於上述純化步驟之前,於溶液中洗淨形成上述接著劑組成物之樹脂後,上述接著劑組成物中含有由含該樹脂之溶液取出之樹脂。 The method for producing a binder composition for causing a wafer and a support of the wafer according to claim 3, wherein, after the step of purifying, the resin forming the adhesive composition is washed in the solution, The subsequent composition contains a resin taken out from the solution containing the resin. 如請求項3之用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其中於上述純化步驟之前,利用風力篩選將上述接著劑組成物中所含之膠著防止劑集塵。 The method for producing an adhesive composition for replenishing a wafer and a support of the wafer according to claim 3, wherein the anti-adhesion agent contained in the adhesive composition is used by wind filtering before the purifying step. Dust collection. 如請求項3之用於使晶圓與該晶圓的支撐體接著之接著劑組成物的製造方法,其中於上述純化步驟之前,以使形成上述接著劑組成物之樹脂浸漬於溶液中之狀態,進行超音波洗淨後,上述接著劑組成物中含有自含該樹脂溶液之溶液取出之樹脂。 A method for producing a composition for replenishing a wafer and a support of the wafer according to claim 3, wherein the resin forming the adhesive composition is immersed in a solution before the purification step After the ultrasonic cleaning, the above-mentioned adhesive composition contains a resin taken out from the solution containing the resin solution. 一種用於使晶圓與該晶圓的支撐體接著之接著劑組成物,其特徵為源自膠著防止劑之金屬成分之含量相對於總固體重量為10ppb以上2ppm以下。 A composition for bonding a wafer to a support of the wafer, characterized in that the content of the metal component derived from the adhesion preventing agent is 10 ppb or more and 2 ppm or less based on the total solid weight. 如請求項8之用於使晶圓與該晶圓的支撐體接著之接著劑組成物,其中上述晶圓係與上述支撐體接著後供給於電極形成步驟。 The adhesive composition for requesting the wafer and the support of the wafer, wherein the wafer system and the support are subsequently supplied to the electrode forming step. 如請求項8或9之用於使晶圓與該晶圓的支撐體接著之接著劑組成物,其包含烴樹脂。 The adhesive composition for interposing the wafer and the support of the wafer, as in claim 8 or 9, comprises a hydrocarbon resin. 如請求項8~10中任一項之用於使晶圓與該晶圓的支撐體接著之接著劑組成物,其包含彈性體。 The adhesive composition for causing the wafer and the support of the wafer to be followed by an adhesive composition according to any one of claims 8 to 10, which comprises an elastomer. 一種接著薄膜,其特徵為在薄膜上形成由如請求項8~11中任一項之用於使晶圓與該晶圓的支撐體接著之接著劑組成物所成之接著層。 An adhesive film characterized by forming an adhesive layer formed on the film by the adhesive composition for adhering the wafer to the support of the wafer according to any one of claims 8 to 11.
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