SU725048A1 - Arrangement for measuring dynamic parameters of microcircuits - Google Patents

Description

one

The invention relates to electrical measuring equipment and can be used to measure the dynamic parameters of microcircuits.

Devices are known that contain a test signal generator, a reference delay driver, a programmer, a comparison unit, a matching element, a threshold element, and a registration element 1.

A disadvantage of the known devices is the low measurement accuracy.

The closest to the invention to the technical essence is a device for measuring the dynamic parameters of microcircuits, containing the elements AND-NOT, the mounting element OR-NOT, an odd number of series-connected inverters, a paraphase element, a switch and keys 2.

The disadvantage of this device is also low measurement accuracy. In addition, it takes considerable time to measure with this device.

The purpose of the invention is to improve the accuracy and reduce the measurement time.

This goal is achieved by the fact that in a known device containing a circuit of an odd number of series-connected inverters, the output of which is

connected to the input of the paraphase element, which inverts the output of which through the switch is connected to the first inputs of the first and second elements of NAND, the second

the inputs of which, respectively, are connected via the first and second keys to the common bus of the device, the non-inverting output of the paraphase O element is connected to the input of the monitored element, the inverting output of this element to the third input of the second AND-NOT element, while the outputs of the first and second AND-NOT elements are connected with the inputs of the mounting element OR-, a controllable delay element, a block, is introduced. indications and. control unit. At the same time, the input of the controllable delay element is connected to the output of the mounting element OR NOT, and the output is connected to the input of a series of connected inverters, the output of the last of which is connected to the input of the control unit, the output of which is connected to the input of the display unit and the control input of the controlled element delays.

The drawing shows a block diagram of the device.

The device contains AND-1, 2 elements, an indication unit 3, an OR-NOT 4 mounting element, a controllable delay element 5, a control unit 6, a chain of sequentially connected inverters 7, a paraphase element 8, a switch 9 and keys 10, p; -

The device works as follows. , Nachm-measurements of dynamic 5:, -diameters. the monitored element 12 proceeds with the initial setting of the repetition period of pulses To of the device, which is a ring generator. To do this, the key 10 is closed, the non-switch 9 is set to the upper position, and the controllable delay element 5 is set to the maximum delay mode using the control unit 6.

Measurement of the delay time for the propagation of information igp when the monitored element 12 is turned on is carried out with the open key 10. In this case, the elements AND-NO 1, 2 and the mounting element OR-NOT 4 respond to the negative 20 front of the signal from the output of the monitored element and the positive edge of the signal from the inverting output of the paraphase element 8. Thus, the device half of the pulse repetition period 25 is closed through the controlled element 12 and half of the pulse repetition period - its min, resulting in a period of The number of pulses in the device increases .30

Since the pulse repetition period became longer than Go, the control unit 6 generates control pulses that switch the controllable delay element 5 until the initial pulse repetition period of 7 ° is set in the device 35. The display unit 3 counts the control pulses and outputs the measurement result of 4 ° in digital form.

Similarly, measurement of the propagation delay time occurs.

 turning off the controlled element 12 with the only difference that in this case the key 11 is closed, and the switch 9 is set to the lower position. In this case, the element AND-NOT 1 and the mounting element OR-NOT 4 react to the negative edge of the signal from the inverting high

stroke of the paraphase element 8 and on the positive edge of the signal from the output of the controlled element.

The device automates the measurement process with high accuracy of the dynamic / microcircuit parameters.

The device can be used both as a separate instrument for measuring dynamic parameters and as a unit for automatic classifiers of integrated circuits.

Claims (2)

1. USSR author's certificate number 505972, cl. G 01R 31/28, 1973 (prototype). 2. Chip Dynamic Parameters Meter, dash. SCHI2.702.000SHE, 1973 (prototype).