SG50782A1 - Liquid crystal display panel inspection device and methods for manufacturing same - Google Patents
Liquid crystal display panel inspection device and methods for manufacturing sameInfo
- Publication number
- SG50782A1 SG50782A1 SG1996011934A SG1996011934A SG50782A1 SG 50782 A1 SG50782 A1 SG 50782A1 SG 1996011934 A SG1996011934 A SG 1996011934A SG 1996011934 A SG1996011934 A SG 1996011934A SG 50782 A1 SG50782 A1 SG 50782A1
- Authority
- SG
- Singapore
- Prior art keywords
- methods
- liquid crystal
- crystal display
- display panel
- inspection device
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title 1
- 239000004973 liquid crystal related substance Substances 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13452—Conductors connecting driver circuitry and terminals of panels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/7076—Coupling devices for connection between PCB and component, e.g. display
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S345/00—Computer graphics processing and selective visual display systems
- Y10S345/904—Display with fail/safe testing feature
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7242298A JP3001182B2 (en) | 1995-08-29 | 1995-08-29 | Liquid crystal panel inspection apparatus and method of manufacturing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
SG50782A1 true SG50782A1 (en) | 1998-07-20 |
Family
ID=17087158
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1996011934A SG50782A1 (en) | 1995-08-29 | 1996-07-11 | Liquid crystal display panel inspection device and methods for manufacturing same |
Country Status (7)
Country | Link |
---|---|
US (1) | US5933018A (en) |
JP (1) | JP3001182B2 (en) |
KR (1) | KR100217965B1 (en) |
CN (1) | CN1154967C (en) |
MY (1) | MY118454A (en) |
SG (1) | SG50782A1 (en) |
TW (1) | TW448328B (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7368924B2 (en) | 1993-04-30 | 2008-05-06 | International Business Machines Corporation | Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
US7282945B1 (en) | 1996-09-13 | 2007-10-16 | International Business Machines Corporation | Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof |
DE69734158T2 (en) | 1996-09-13 | 2006-06-22 | International Business Machines Corp. | TEST HEAD STRUCTURE WITH SEVERAL ISOLATED TIPS |
JP2000502812A (en) | 1996-09-13 | 2000-03-07 | インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン | Integrated compliant probe for wafer-level test and burn-in |
JPH11305202A (en) * | 1998-04-17 | 1999-11-05 | Asahi Optical Co Ltd | Liquid crystal panel holding mechanism |
US6971750B1 (en) * | 1998-12-28 | 2005-12-06 | Canon Kabushiki Kaisha | Projection display apparatus |
US6547586B2 (en) * | 2001-05-14 | 2003-04-15 | Delphi Technologies, Inc. | Sealed electrical distribution center |
NZ532235A (en) * | 2001-09-14 | 2005-11-25 | American Panel Corp | Visual display testing, optimization and harmonization method and system |
JP3681692B2 (en) * | 2002-02-20 | 2005-08-10 | 東北パイオニア株式会社 | Electronics |
US7179512B2 (en) * | 2002-05-14 | 2007-02-20 | Fujitsu Limited | Liquid crystal display and manufacturing method of same |
US7330583B2 (en) * | 2002-08-19 | 2008-02-12 | Photon Dynamics, Inc. | Integrated visual imaging and electronic sensing inspection systems |
CN100526902C (en) * | 2003-03-25 | 2009-08-12 | 株式会社半导体能源研究所 | Circuit for inspecting semiconductor device and inspecting method |
CN100504417C (en) * | 2003-08-05 | 2009-06-24 | 奇美电子股份有限公司 | Multifunctional detection machine platform of liquid crystal display panel and detection method thereof |
WO2005034166A1 (en) * | 2003-10-01 | 2005-04-14 | Matsushita Electric Industrial Co., Ltd. | Lighting inspection device for display panel and display panel producing method |
JP4412143B2 (en) * | 2004-01-14 | 2010-02-10 | セイコーエプソン株式会社 | Manufacturing method of inspection jig |
US8436632B2 (en) * | 2008-06-27 | 2013-05-07 | American Panel Corporation | System and method for optimizing LCD displays |
CN104252057B (en) * | 2014-09-23 | 2017-07-18 | 合肥鑫晟光电科技有限公司 | A kind of device checked for lighting and lighting inspection system |
CN106681075B (en) * | 2017-03-23 | 2019-05-28 | 京东方科技集团股份有限公司 | Display panel, array substrate and its manufacturing method, detection circuit |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3832632A (en) * | 1971-11-22 | 1974-08-27 | F Ardezzone | Multi-point probe head assembly |
US4019798A (en) * | 1976-03-24 | 1977-04-26 | Owens-Illinois, Inc. | Flexible electrical circuit connections |
US4419626A (en) * | 1981-08-25 | 1983-12-06 | Daymarc Corporation | Broad band contactor assembly for testing integrated circuit devices |
GB2124010B (en) * | 1982-07-13 | 1986-06-18 | Sharp Kk | Structure and method of connecting terminals of matrix display units |
US4766371A (en) * | 1982-07-24 | 1988-08-23 | Risho Kogyo Co., Ltd. | Test board for semiconductor packages |
DE3245521C2 (en) * | 1982-12-09 | 1986-05-07 | Preh, Elektrofeinmechanische Werke Jakob Preh Nachf. Gmbh & Co, 8740 Bad Neustadt | Multipole edge connector strip |
JPS62280889A (en) * | 1986-05-30 | 1987-12-05 | シャープ株式会社 | Planar type display unit |
US4943768A (en) * | 1986-12-12 | 1990-07-24 | Mitsubishi Denki Kabushiki Kaisha | Testing device for electrical circuit boards |
EP0331282B1 (en) * | 1988-03-01 | 1993-10-13 | Hewlett-Packard Company | Membrane-based ic test probe with precisely positioned contacts |
US4871964A (en) * | 1988-04-12 | 1989-10-03 | G. G. B. Industries, Inc. | Integrated circuit probing apparatus |
US4899099A (en) * | 1988-05-19 | 1990-02-06 | Augat Inc. | Flex dot wafer probe |
US4938702A (en) * | 1989-09-22 | 1990-07-03 | Key Tronic Corporation | Connector clamp for attaching flat electrical conductor leads to printed wiring boards |
GB2239744B (en) * | 1989-11-07 | 1994-03-16 | Sharp Kk | Tester head |
US5209671A (en) * | 1991-03-28 | 1993-05-11 | Sharp Kabushiki Kaisha | Electric connection structure between circuit boards |
US5304922A (en) * | 1991-08-26 | 1994-04-19 | Hughes Aircraft Company | Electrical circuit with resilient gasket support for raised connection features |
JPH05323352A (en) * | 1992-05-20 | 1993-12-07 | Rohm Co Ltd | Liquid crystal display device |
US5378982A (en) * | 1993-02-25 | 1995-01-03 | Hughes Aircraft Company | Test probe for panel having an overlying protective member adjacent panel contacts |
JP3442137B2 (en) * | 1993-12-17 | 2003-09-02 | 日本発条株式会社 | Conductive contact unit |
TW345625B (en) * | 1994-05-13 | 1998-11-21 | Sharp Kk | Device and method for manufacturing display device |
TW307934B (en) * | 1995-04-20 | 1997-06-11 | Enporasu Kk |
-
1995
- 1995-08-29 JP JP7242298A patent/JP3001182B2/en not_active Expired - Fee Related
-
1996
- 1996-07-08 US US08/677,726 patent/US5933018A/en not_active Expired - Lifetime
- 1996-07-11 TW TW085108428A patent/TW448328B/en not_active IP Right Cessation
- 1996-07-11 SG SG1996011934A patent/SG50782A1/en unknown
- 1996-07-25 KR KR1019960030492A patent/KR100217965B1/en not_active IP Right Cessation
- 1996-08-15 MY MYPI96003354A patent/MY118454A/en unknown
- 1996-08-29 CN CNB961117699A patent/CN1154967C/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0961461A (en) | 1997-03-07 |
CN1149167A (en) | 1997-05-07 |
KR970011941A (en) | 1997-03-27 |
TW448328B (en) | 2001-08-01 |
JP3001182B2 (en) | 2000-01-24 |
US5933018A (en) | 1999-08-03 |
KR100217965B1 (en) | 1999-09-01 |
CN1154967C (en) | 2004-06-23 |
MY118454A (en) | 2004-11-30 |
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