SG11201405431TA - Method and apparatus for manufacturing semiconductor device - Google Patents
Method and apparatus for manufacturing semiconductor deviceInfo
- Publication number
- SG11201405431TA SG11201405431TA SG11201405431TA SG11201405431TA SG11201405431TA SG 11201405431T A SG11201405431T A SG 11201405431TA SG 11201405431T A SG11201405431T A SG 11201405431TA SG 11201405431T A SG11201405431T A SG 11201405431TA SG 11201405431T A SG11201405431T A SG 11201405431TA
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor device
- manufacturing semiconductor
- manufacturing
- semiconductor
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B37/00—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
- B32B37/0046—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by constructional aspects of the apparatus
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/0036—Heat treatment
- B32B38/004—Heat treatment by physically contacting the layers, e.g. by the use of heated platens or rollers
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- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
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- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15787—Ceramics, e.g. crystalline carbides, nitrides or oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15788—Glasses, e.g. amorphous oxides, nitrides or fluorides
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Thermal Sciences (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2012050094 | 2012-03-07 | ||
PCT/JP2013/054096 WO2013133015A1 (ja) | 2012-03-07 | 2013-02-20 | 半導体装置の製造方法および半導体装置の製造装置 |
Publications (1)
Publication Number | Publication Date |
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SG11201405431TA true SG11201405431TA (en) | 2014-10-30 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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SG11201405431TA SG11201405431TA (en) | 2012-03-07 | 2013-02-20 | Method and apparatus for manufacturing semiconductor device |
Country Status (8)
Country | Link |
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US (1) | US20150050778A1 (ja) |
JP (1) | JPWO2013133015A1 (ja) |
KR (1) | KR20140140042A (ja) |
CN (1) | CN104145328A (ja) |
PH (1) | PH12014501961A1 (ja) |
SG (1) | SG11201405431TA (ja) |
TW (1) | TW201347054A (ja) |
WO (1) | WO2013133015A1 (ja) |
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JP5876000B2 (ja) * | 2012-06-11 | 2016-03-02 | 株式会社新川 | ボンディング装置およびボンディング方法 |
KR101435459B1 (ko) * | 2014-03-26 | 2014-08-28 | 실리콘밸리(주) | 접착제를 이용하여 금속 박판을 적층한 반도체 검사 패드 및 제조방법 |
CH708932B1 (en) * | 2013-12-09 | 2017-04-13 | Besi Switzerland Ag | Downholder for holding down the substrate locations of a substrate for the purpose of mounting semiconductor components. |
JP2016009850A (ja) * | 2014-06-26 | 2016-01-18 | 東レエンジニアリング株式会社 | 実装装置および実装方法 |
TW201705368A (zh) * | 2015-03-30 | 2017-02-01 | Toray Eng Co Ltd | 半導體裝置之製造方法、半導體安裝裝置及以半導體裝置之製造方法所製造之記憶體裝置 |
JP6483500B2 (ja) * | 2015-03-31 | 2019-03-13 | デクセリアルズ株式会社 | 半導体装置の製造方法 |
JP6438340B2 (ja) * | 2015-04-08 | 2018-12-12 | 積水化学工業株式会社 | 半導体接合用接着フィルム及び半導体装置の製造方法 |
JP2018515908A (ja) * | 2015-04-10 | 2018-06-14 | エーファウ・グループ・エー・タルナー・ゲーエムベーハー | 2つの基板をボンディングするための基板ホルダおよび方法 |
KR102341750B1 (ko) | 2015-06-30 | 2021-12-23 | 삼성전자주식회사 | 반도체 패키지 및 이의 제조 방법 |
JP6544146B2 (ja) * | 2015-08-27 | 2019-07-17 | 日立化成株式会社 | 半導体装置及びそれを製造する方法 |
JP6819140B2 (ja) * | 2015-08-28 | 2021-01-27 | 昭和電工マテリアルズ株式会社 | 緩衝シート用低溶剤型組成物、低溶剤型緩衝シート、電子部品装置の製造方法及び電子部品装置 |
CN108352333B (zh) | 2015-10-29 | 2021-07-20 | 昭和电工材料株式会社 | 半导体用粘接剂、半导体装置以及制造该半导体装置的方法 |
WO2017077958A1 (ja) * | 2015-11-04 | 2017-05-11 | リンテック株式会社 | 半導体装置の製造方法 |
CN105428263A (zh) * | 2015-12-16 | 2016-03-23 | 南通富士通微电子股份有限公司 | 半导体封装方法 |
JP6690308B2 (ja) * | 2016-03-08 | 2020-04-28 | 日立化成株式会社 | 半導体装置を製造する方法 |
JP6613194B2 (ja) * | 2016-03-30 | 2019-11-27 | 東レエンジニアリング株式会社 | 半導体装置の製造方法及び製造装置 |
JP6688543B2 (ja) * | 2016-03-30 | 2020-04-28 | 東レエンジニアリング株式会社 | 半導体装置の製造方法及び半導体装置の製造装置 |
JP6477971B2 (ja) | 2016-05-09 | 2019-03-06 | 日立化成株式会社 | 半導体装置の製造方法 |
JP6316873B2 (ja) * | 2016-05-31 | 2018-04-25 | 株式会社新川 | ダイの実装方法 |
KR102521881B1 (ko) * | 2016-06-15 | 2023-04-18 | 삼성전자주식회사 | 반도체 소자 및 이의 제조 방법 |
US20180005916A1 (en) * | 2016-06-30 | 2018-01-04 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor structure and manufacturing method thereof |
US11347146B2 (en) * | 2016-09-09 | 2022-05-31 | Toray Industries, Inc. | Resin composition |
JP2018060836A (ja) * | 2016-09-30 | 2018-04-12 | デクセリアルズ株式会社 | 半導体装置の製造方法 |
JP6789791B2 (ja) * | 2016-12-13 | 2020-11-25 | 東レエンジニアリング株式会社 | 半導体装置の製造装置および製造方法 |
CN110249413A (zh) * | 2017-01-31 | 2019-09-17 | 株式会社新川 | 半导体芯片的安装装置及安装方法 |
TWI692044B (zh) * | 2017-05-29 | 2020-04-21 | 日商新川股份有限公司 | 封裝裝置以及半導體裝置的製造方法 |
KR102012237B1 (ko) * | 2017-11-24 | 2019-08-21 | 한국기계연구원 | 마이크로 소자 어레이 전사방법 |
WO2019107395A1 (ja) * | 2017-12-01 | 2019-06-06 | 株式会社新川 | 実装装置 |
JP7023700B2 (ja) * | 2017-12-18 | 2022-02-22 | 東レエンジニアリング株式会社 | 実装装置及び実装方法 |
CN111937500A (zh) * | 2018-04-04 | 2020-11-13 | 住友电工印刷电路株式会社 | 柔性印刷线路板用覆膜以及柔性印刷线路板 |
CN109003907B (zh) * | 2018-08-06 | 2021-10-19 | 中芯集成电路(宁波)有限公司 | 封装方法 |
TWI669794B (zh) * | 2018-09-27 | 2019-08-21 | 頎邦科技股份有限公司 | 基板與晶片之壓合步驟及其壓合裝置 |
US11309278B2 (en) * | 2018-10-29 | 2022-04-19 | Applied Materials, Inc. | Methods for bonding substrates |
TWI774936B (zh) * | 2019-03-08 | 2022-08-21 | 台灣愛司帝科技股份有限公司 | 承載結構及承載設備 |
WO2020203724A1 (ja) * | 2019-03-29 | 2020-10-08 | 株式会社村田製作所 | 樹脂多層基板、および樹脂多層基板の製造方法 |
TWI743726B (zh) * | 2019-04-15 | 2021-10-21 | 日商新川股份有限公司 | 封裝裝置 |
US10854530B1 (en) * | 2019-07-31 | 2020-12-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Heat dissipation structures |
JP7083795B2 (ja) * | 2019-10-08 | 2022-06-13 | 東レエンジニアリング株式会社 | 実装装置および実装方法 |
CN114585684A (zh) * | 2019-10-24 | 2022-06-03 | 松下知识产权经营株式会社 | 密封用树脂组合物及半导体装置 |
CN113556882B (zh) * | 2020-04-23 | 2022-08-16 | 鹏鼎控股(深圳)股份有限公司 | 透明电路板的制作方法以及透明电路板 |
KR20220005724A (ko) * | 2020-07-07 | 2022-01-14 | 주식회사 프로텍 | 가압식 구리 필러 기판 본딩 방법 |
US12191276B2 (en) * | 2020-07-16 | 2025-01-07 | Shinkawa Ltd. | Mounting apparatus |
WO2022209978A1 (ja) * | 2021-03-30 | 2022-10-06 | 三井金属鉱業株式会社 | 多層基板の製造方法及び配線基板 |
CN113130336A (zh) * | 2021-04-16 | 2021-07-16 | 中国电子科技集团公司第二十四研究所 | 一种基板预植Au凸点的倒装焊工艺方法 |
JPWO2024009498A1 (ja) * | 2022-07-08 | 2024-01-11 | ||
CN118136525B (zh) * | 2024-05-08 | 2024-07-23 | 日月新半导体(威海)有限公司 | 一种半导体封装结构及其制备方法 |
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JP4297984B2 (ja) * | 1994-02-17 | 2009-07-15 | 日立化成工業株式会社 | 異方導電フィルム圧着装置 |
JP3326382B2 (ja) * | 1998-03-26 | 2002-09-24 | 松下電器産業株式会社 | 半導体装置の製造方法 |
JP2001237268A (ja) * | 2000-02-22 | 2001-08-31 | Nec Corp | 半導体素子の実装方法及び製造装置 |
JP4684502B2 (ja) * | 2001-09-27 | 2011-05-18 | 日東電工株式会社 | 導電接続方法及びそれに用いる離型シート |
JP2004319823A (ja) * | 2003-04-17 | 2004-11-11 | Sumitomo Bakelite Co Ltd | 半導体用接着フィルム、半導体装置、及び半導体装置の製造方法。 |
JP4449325B2 (ja) * | 2003-04-17 | 2010-04-14 | 住友ベークライト株式会社 | 半導体用接着フィルム、半導体装置、及び半導体装置の製造方法。 |
JP4254650B2 (ja) * | 2004-08-02 | 2009-04-15 | セイコーエプソン株式会社 | 半導体装置の実装装置及び実装方法 |
JP2006066625A (ja) * | 2004-08-26 | 2006-03-09 | Nec Corp | ベアチップ実装装置、ベアチップ実装方法及びシート |
JP2006229124A (ja) * | 2005-02-21 | 2006-08-31 | Canon Inc | Icチップの接続方法および接続構造 |
JP5024117B2 (ja) * | 2007-10-09 | 2012-09-12 | 日立化成工業株式会社 | 回路部材の実装方法 |
JP5646899B2 (ja) * | 2010-07-26 | 2014-12-24 | 新光電気工業株式会社 | 電子部品実装装置及び電子部品の実装方法 |
-
2013
- 2013-02-20 WO PCT/JP2013/054096 patent/WO2013133015A1/ja active Application Filing
- 2013-02-20 SG SG11201405431TA patent/SG11201405431TA/en unknown
- 2013-02-20 CN CN201380012563.6A patent/CN104145328A/zh active Pending
- 2013-02-20 KR KR1020147026562A patent/KR20140140042A/ko not_active Withdrawn
- 2013-02-20 US US14/383,494 patent/US20150050778A1/en not_active Abandoned
- 2013-02-20 JP JP2013510817A patent/JPWO2013133015A1/ja active Pending
- 2013-03-06 TW TW102107761A patent/TW201347054A/zh unknown
-
2014
- 2014-09-01 PH PH12014501961A patent/PH12014501961A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR20140140042A (ko) | 2014-12-08 |
PH12014501961A1 (en) | 2014-11-24 |
JPWO2013133015A1 (ja) | 2015-07-30 |
WO2013133015A1 (ja) | 2013-09-12 |
US20150050778A1 (en) | 2015-02-19 |
CN104145328A (zh) | 2014-11-12 |
TW201347054A (zh) | 2013-11-16 |
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