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SE8202683L - Anordning for detektering av sondlege - Google Patents

Anordning for detektering av sondlege

Info

Publication number
SE8202683L
SE8202683L SE8202683A SE8202683A SE8202683L SE 8202683 L SE8202683 L SE 8202683L SE 8202683 A SE8202683 A SE 8202683A SE 8202683 A SE8202683 A SE 8202683A SE 8202683 L SE8202683 L SE 8202683L
Authority
SE
Sweden
Prior art keywords
probe
transducer
workpiece
occurrence
infrared radiation
Prior art date
Application number
SE8202683A
Other languages
English (en)
Inventor
R O Juengel
Original Assignee
Valeron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valeron Corp filed Critical Valeron Corp
Publication of SE8202683L publication Critical patent/SE8202683L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/58—Wireless transmission of information between a sensor or probe and a control or evaluation unit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Electronic Switches (AREA)
SE8202683A 1981-04-30 1982-04-29 Anordning for detektering av sondlege SE8202683L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/259,257 US4401945A (en) 1981-04-30 1981-04-30 Apparatus for detecting the position of a probe relative to a workpiece

Publications (1)

Publication Number Publication Date
SE8202683L true SE8202683L (sv) 1982-10-31

Family

ID=22984216

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8202683A SE8202683L (sv) 1981-04-30 1982-04-29 Anordning for detektering av sondlege

Country Status (12)

Country Link
US (2) US4401945A (sv)
JP (1) JPS57182602A (sv)
AU (1) AU559784B2 (sv)
BE (1) BE892971A (sv)
BR (1) BR8202477A (sv)
CA (1) CA1172334A (sv)
DE (1) DE3213313A1 (sv)
FR (1) FR2505040B1 (sv)
GB (1) GB2097930B (sv)
IT (1) IT1147865B (sv)
MX (1) MX151356A (sv)
SE (1) SE8202683L (sv)

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JPS57113116A (en) * 1980-12-30 1982-07-14 Fanuc Ltd Robot control system
US4779319A (en) * 1981-04-30 1988-10-25 Gte Valeron Corporation Method and apparatus for performing workpiece inspection with a probe
US4978857A (en) * 1981-04-30 1990-12-18 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4670989A (en) * 1981-04-30 1987-06-09 Gte Valeron Corporation Touch probe using microwave transmission
US4401945A (en) * 1981-04-30 1983-08-30 The Valeron Corporation Apparatus for detecting the position of a probe relative to a workpiece
US5065035A (en) * 1981-04-30 1991-11-12 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4510693A (en) * 1982-06-14 1985-04-16 Gte Valeron Corporation Probe with stylus adjustment
US4509266A (en) * 1982-06-14 1985-04-09 Gte Valeron Corporation Touch probe
US4454762A (en) * 1982-06-21 1984-06-19 Federal Products Corporation Measurement system with remote display
US4543859A (en) * 1983-06-14 1985-10-01 Gte Valeron Corporation Probe adjustment tool and method of using same
AU555481B2 (en) * 1983-06-14 1986-09-25 Gte Valeron Corp. Remote measuring apparatus
US4608763A (en) * 1983-06-14 1986-09-02 Gte Valeron Corporation Probe
US4553001A (en) * 1983-12-05 1985-11-12 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4523063A (en) * 1983-12-05 1985-06-11 Gte Valeron Corporation Touch probe having nonconductive contact carriers
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US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
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US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
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US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
US6970634B2 (en) * 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
AU2002327490A1 (en) 2001-08-21 2003-06-30 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US6815963B2 (en) 2002-05-23 2004-11-09 Cascade Microtech, Inc. Probe for testing a device under test
TW567333B (en) * 2002-09-20 2003-12-21 Benq Corp Method for phase matching by detecting magnetic flux
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
DE10312884B4 (de) * 2003-03-22 2014-02-27 Dr. Johannes Heidenhain Gmbh Tastsystem
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
DE112004002554T5 (de) 2003-12-24 2006-11-23 Cascade Microtech, Inc., Beaverton Active wafer probe
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
ITBO20040182A1 (it) * 2004-04-01 2004-07-01 Marposs Spa Sistema e metodo per il controllo di pezzi meccanici, con trasmissioni di segnali via etere
JP4324012B2 (ja) * 2004-05-20 2009-09-02 日立オムロンターミナルソリューションズ株式会社 変位検知装置および変位検知方法
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
KR101157449B1 (ko) 2004-07-07 2012-06-22 캐스케이드 마이크로테크 인코포레이티드 멤브레인 서스펜디드 프로브를 구비한 프로브 헤드
JP2008512680A (ja) 2004-09-13 2008-04-24 カスケード マイクロテック インコーポレイテッド 両面プロービング構造体
US7316313B1 (en) * 2004-10-15 2008-01-08 Juchau Jason R Heated equipment bag
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
DE102005037101A1 (de) * 2005-08-03 2007-02-08 Krones Ag Verfahren und Vorrichtung zur Wandstärkenkontrolle
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN112431299A (zh) * 2020-11-11 2021-03-02 刘战军 一种水管爆裂应急排水装置

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Also Published As

Publication number Publication date
GB2097930A (en) 1982-11-10
US4401945A (en) 1983-08-30
IT1147865B (it) 1986-11-26
CA1172334A (en) 1984-08-07
FR2505040A1 (fr) 1982-11-05
BE892971A (fr) 1982-08-16
JPS57182602A (en) 1982-11-10
BR8202477A (pt) 1983-04-12
MX151356A (es) 1984-11-12
GB2097930B (en) 1985-01-23
JPH0432321B2 (sv) 1992-05-29
AU559784B2 (en) 1987-03-19
AU8282282A (en) 1982-11-04
DE3213313A1 (de) 1982-11-18
IT8248308A0 (it) 1982-04-29
FR2505040B1 (fr) 1986-04-18
DE3213313C2 (sv) 1993-01-21
US4578874A (en) 1986-04-01

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Effective date: 19880429