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KR970703035A - 병렬 블럭 기입 동작을 사용하여 메모리 회로를 테스팅하기 위한 방법 및 장치(A Method and Apparatus for Testing a Memory Circuit with Parallel Block Write Operation) - Google Patents

병렬 블럭 기입 동작을 사용하여 메모리 회로를 테스팅하기 위한 방법 및 장치(A Method and Apparatus for Testing a Memory Circuit with Parallel Block Write Operation)

Info

Publication number
KR970703035A
KR970703035A KR1019960706116A KR19960706116A KR970703035A KR 970703035 A KR970703035 A KR 970703035A KR 1019960706116 A KR1019960706116 A KR 1019960706116A KR 19960706116 A KR19960706116 A KR 19960706116A KR 970703035 A KR970703035 A KR 970703035A
Authority
KR
South Korea
Prior art keywords
data bit
test data
arrays
test
block write
Prior art date
Application number
KR1019960706116A
Other languages
English (en)
Other versions
KR100336951B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR970703035A publication Critical patent/KR970703035A/ko
Application granted granted Critical
Publication of KR100336951B1 publication Critical patent/KR100336951B1/ko

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C29/28—Dependent multiple arrays, e.g. multi-bit arrays

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
KR1019960706116A 1994-04-29 1995-04-28 병렬블럭기입동작을사용하여메모리회로를테스팅하기위한방법및장치 KR100336951B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US23559194A 1994-04-29 1994-04-29
US08/235,591 1994-04-29
PCT/GB1995/000978 WO1995030227A1 (en) 1994-04-29 1995-04-28 A method and apparatus for testing a memory circuit with parallel block write operation

Publications (2)

Publication Number Publication Date
KR970703035A true KR970703035A (ko) 1997-06-10
KR100336951B1 KR100336951B1 (ko) 2002-10-09

Family

ID=22886151

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960706116A KR100336951B1 (ko) 1994-04-29 1995-04-28 병렬블럭기입동작을사용하여메모리회로를테스팅하기위한방법및장치

Country Status (6)

Country Link
US (1) US5740179A (ko)
EP (1) EP0757837B1 (ko)
KR (1) KR100336951B1 (ko)
AT (1) ATE173111T1 (ko)
DE (1) DE69505806T2 (ko)
WO (1) WO1995030227A1 (ko)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6560669B1 (en) * 1998-05-19 2003-05-06 Micron Technology, Inc. Double data rate synchronous memory with block-write
US6658610B1 (en) 2000-09-25 2003-12-02 International Business Machines Corporation Compilable address magnitude comparator for memory array self-testing
US6640296B2 (en) * 2002-03-07 2003-10-28 Nokia Corporation Data processing method and device for parallel stride access
KR100564033B1 (ko) * 2003-12-05 2006-03-23 삼성전자주식회사 단일 버퍼 선택 입력 단자를 가지는 반도체 메모리 및반도체 메모리 테스트 방법
US7246280B2 (en) * 2004-03-23 2007-07-17 Samsung Electronics Co., Ltd. Memory module with parallel testing
KR100673694B1 (ko) * 2005-10-10 2007-01-24 주식회사 하이닉스반도체 저전력 소비형 칼럼 디코더를 가지는 반도체 메모리 장치및 그 리드 동작 방법
US8832508B2 (en) * 2010-11-18 2014-09-09 Advanced Micro Devices, Inc. Apparatus and methods for testing writability and readability of memory cell arrays

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62170094A (ja) * 1986-01-21 1987-07-27 Mitsubishi Electric Corp 半導体記憶回路
JPS6337894A (ja) * 1986-07-30 1988-02-18 Mitsubishi Electric Corp ランダムアクセスメモリ
US4817058A (en) * 1987-05-21 1989-03-28 Texas Instruments Incorporated Multiple input/output read/write memory having a multiple-cycle write mask
KR910001744A (ko) * 1988-06-14 1991-01-31 미다 가쓰시게 반도체 기억장치
JPH02146199A (ja) * 1988-11-28 1990-06-05 Mitsubishi Electric Corp 半導体記憶装置のテスト回路
KR920001082B1 (ko) * 1989-06-13 1992-02-01 삼성전자 주식회사 반도체 메모리장치에 있어서 메모리 테스트용 멀티바이트 광역 병렬 라이트회로
JP2717712B2 (ja) * 1989-08-18 1998-02-25 三菱電機株式会社 半導体記憶装置
JP2831767B2 (ja) * 1990-01-10 1998-12-02 株式会社アドバンテスト 半導体メモリ試験装置
US5138619A (en) * 1990-02-15 1992-08-11 National Semiconductor Corporation Built-in self test for integrated circuit memory
US5228000A (en) * 1990-08-02 1993-07-13 Mitsubishi Denki Kabushiki Kaisha Test circuit of semiconductor memory device
JPH0676598A (ja) * 1992-08-28 1994-03-18 Mitsubishi Electric Corp 半導体記憶装置
JP3293935B2 (ja) * 1993-03-12 2002-06-17 株式会社東芝 並列ビットテストモード内蔵半導体メモリ

Also Published As

Publication number Publication date
DE69505806D1 (de) 1998-12-10
US5740179A (en) 1998-04-14
KR100336951B1 (ko) 2002-10-09
EP0757837A1 (en) 1997-02-12
EP0757837B1 (en) 1998-11-04
DE69505806T2 (de) 1999-05-12
ATE173111T1 (de) 1998-11-15
WO1995030227A1 (en) 1995-11-09

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