KR970003276A - 반도체메모리소자의 전기휴즈셀 - Google Patents
반도체메모리소자의 전기휴즈셀 Download PDFInfo
- Publication number
- KR970003276A KR970003276A KR1019950018971A KR19950018971A KR970003276A KR 970003276 A KR970003276 A KR 970003276A KR 1019950018971 A KR1019950018971 A KR 1019950018971A KR 19950018971 A KR19950018971 A KR 19950018971A KR 970003276 A KR970003276 A KR 970003276A
- Authority
- KR
- South Korea
- Prior art keywords
- conductive type
- electric fuse
- semiconductor substrate
- conductive
- diffusion region
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/525—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections
- H01L23/5256—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections comprising fuses, i.e. connections having their state changed from conductive to non-conductive
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Fuses (AREA)
Abstract
Description
Claims (5)
- 제1도전형의 반도체기판에 형성된 전기휴즈셀에 있어서, 상기 반도체기판과는 제2도전형의 웰에 의해 격리된 제1도전형의 웰과, 상기 제1도전형의 웰내에서 서로 소정거리로 이격되어 형성된 제2도전형의 제1 및 제2확산영역과,상기 반도체기판의 상부에 형성되고 상기 제1확산영역에 연결된 도전층을 구비함을 특징으로 하는 전기휴즈셀.
- 제1도전형의 반도체기판에 형성된 전기휴즈셀에 있어서, 상기 반도체기판과는 제2도전형의 웰에 의해 격리된 제1도전형의 웰과, 상기 제1도전형의 웰내에서 서로 소정거리로 이격되어 형성된 제2도전형의 제1 및 제2확산영역과,상기 제1확산영역내에 형성된 제1도전형의 확산영역과, 상기 반도체기판의 상부에 형성되고 상기 제1도전형의 확산영역에연결된 도전층을 구비함을 특징으로 하는 전기휴즈셀.
- 전기휴즈회로에 있어서, 전원과 출력터미널사이에 연결되고 제어신호에 게이트가 접속된 부하트랜지스터와, 상기 출력터미널에 각각 연결된 복수개의 휴즈들과, 상기 휴즈들의 각각에 에미터가 연결된 복수개의 제1바이폴라트랜지스터들과, 상기 제1바이폴라트랜지스터들의 베이스와 컬렉터에 컬렉터와 베이스가 각각 연결된 복수개의 제2바이폴라트랜지스터들과, 상기 제1바이폴라트랜지스터들의 베이스에 드레인이 각각 연결되고 제1전압들의 각각에 게이트가 연결되고상기 제2바이폴라트랜지스터들의 에미터와 함께 접지전압에 소오스가 연결된 복수개의 제1선택트랜지스터들을 구비함을특징으로 하는 전기휴즈 회로.
- 제3항에 있어서, 상기 제1바이폴라트랜지스터들의 각 에미터와 소오스라인 사이에 채널이 연결되고 제2전압들의 각각에 게이트가 연결된 복수개의 제2선택트랜지스터들을 구비함을 특징으로 하는 전기 휴즈회로.
- 전기휴즈에 있어서, 전압단자에 접속되는 컨택영역을 포함하는 컨택패턴의 폭이 절단위치를 포함하는 휴징패턴의 폭보다 적어도 넓고, 상기 컨택패턴과 상기 휴징패턴이 상기 절단위치에서 서로 접하는 각도가 85∼95°임을 특징으로 하는 전기휴즈.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950018971A KR0157345B1 (ko) | 1995-06-30 | 1995-06-30 | 반도체 메모리 소자의 전기 휴즈셀 |
US08/670,506 US5661323A (en) | 1995-06-30 | 1996-06-27 | Integrated circuit fuse programming and reading circuits |
JP17114596A JP3662351B2 (ja) | 1995-06-30 | 1996-07-01 | 半導体装置のヒューズ素子 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950018971A KR0157345B1 (ko) | 1995-06-30 | 1995-06-30 | 반도체 메모리 소자의 전기 휴즈셀 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970003276A true KR970003276A (ko) | 1997-01-28 |
KR0157345B1 KR0157345B1 (ko) | 1998-12-01 |
Family
ID=19419375
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950018971A KR0157345B1 (ko) | 1995-06-30 | 1995-06-30 | 반도체 메모리 소자의 전기 휴즈셀 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5661323A (ko) |
JP (1) | JP3662351B2 (ko) |
KR (1) | KR0157345B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101148509B1 (ko) * | 2003-12-19 | 2012-05-22 | 길슨, 인크. | 액체 크로마토그래피 자동 샘플 충전 기구 및 방법 |
Families Citing this family (37)
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US6188239B1 (en) | 1996-08-12 | 2001-02-13 | Micron Technology, Inc. | Semiconductor programmable test arrangement such as an antifuse to ID circuit having common access switches and/or common programming switches |
US5859562A (en) * | 1996-12-24 | 1999-01-12 | Actel Corporation | Programming circuit for antifuses using bipolar and SCR devices |
US5976917A (en) | 1998-01-29 | 1999-11-02 | Micron Technology, Inc. | Integrated circuitry fuse forming methods, integrated circuitry programming methods, and related integrated circuitry |
TW462123B (en) * | 1998-03-10 | 2001-11-01 | United Microelectronics Corp | Layout design of electrostatic discharge protection device |
JP2000173291A (ja) * | 1998-12-03 | 2000-06-23 | Oki Electric Ind Co Ltd | 半導体記憶装置 |
US20070190751A1 (en) * | 1999-03-29 | 2007-08-16 | Marr Kenneth W | Semiconductor fuses and methods for fabricating and programming the same |
US6323534B1 (en) | 1999-04-16 | 2001-11-27 | Micron Technology, Inc. | Fuse for use in a semiconductor device |
US6292422B1 (en) | 1999-12-22 | 2001-09-18 | Texas Instruments Incorporated | Read/write protected electrical fuse |
JP3526446B2 (ja) * | 2000-06-09 | 2004-05-17 | 株式会社東芝 | フューズプログラム回路 |
US6495901B2 (en) * | 2001-01-30 | 2002-12-17 | Infineon Technologies Ag | Multi-level fuse structure |
US6910366B2 (en) * | 2001-08-24 | 2005-06-28 | Endress + Hauser Flowtec Ag | Viscometer |
EP1309002B1 (en) * | 2001-11-06 | 2012-01-11 | Yamaha Corporation | Semiconductor device having fuse and its manufacturing method |
US20040038458A1 (en) * | 2002-08-23 | 2004-02-26 | Marr Kenneth W. | Semiconductor fuses, semiconductor devices containing the same, and methods of making and using the same |
DE102004005129B4 (de) * | 2004-02-02 | 2018-09-27 | Snaptrack, Inc. | Bauelement mit empfindlichen Bauelementstrukturen und Verfahren zur Herstellung |
US7098721B2 (en) * | 2004-09-01 | 2006-08-29 | International Business Machines Corporation | Low voltage programmable eFuse with differential sensing scheme |
US7824327B2 (en) * | 2005-04-12 | 2010-11-02 | Tyco Healthcare Group Llp | Optical trocar with scope holding assembly |
US7242239B2 (en) * | 2005-06-07 | 2007-07-10 | International Business Machines Corporation | Programming and determining state of electrical fuse using field effect transistor having multiple conduction states |
JP2007004887A (ja) * | 2005-06-23 | 2007-01-11 | Toshiba Corp | 半導体記憶装置 |
JP4701034B2 (ja) * | 2005-08-02 | 2011-06-15 | パナソニック株式会社 | 半導体装置 |
WO2007027607A2 (en) * | 2005-08-31 | 2007-03-08 | International Business Machines Corporation | Random access electrically programmable-e-fuse rom |
JP2008042108A (ja) * | 2006-08-10 | 2008-02-21 | Hitachi Ltd | 半導体装置 |
JP5137408B2 (ja) * | 2007-02-05 | 2013-02-06 | パナソニック株式会社 | 電気ヒューズ回路 |
KR100845407B1 (ko) * | 2007-02-16 | 2008-07-10 | 매그나칩 반도체 유한회사 | 원-타임-프로그래머블 셀 및 이를 구비하는 otp 메모리 |
US8223575B2 (en) * | 2007-03-08 | 2012-07-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multi-level electrical fuse using one programming device |
TWI378336B (en) * | 2007-08-24 | 2012-12-01 | Richtek Technology Corp | Trimmer circuit and method |
US7432755B1 (en) * | 2007-12-03 | 2008-10-07 | International Business Machines Corporation | Programming current stabilized electrical fuse programming circuit and method |
JP2009177044A (ja) * | 2008-01-28 | 2009-08-06 | Panasonic Corp | 電気ヒューズ回路 |
US10600902B2 (en) * | 2008-02-13 | 2020-03-24 | Vishay SIliconix, LLC | Self-repairing field effect transisitor |
US7804701B2 (en) * | 2008-02-29 | 2010-09-28 | Freescale Semiconductor, Inc. | Method of programming a memory having electrically programmable fuses |
US8154942B1 (en) * | 2008-11-17 | 2012-04-10 | Altera Corporation | Integrated circuits with fuse programming and sensing circuitry |
US8669806B2 (en) * | 2012-03-05 | 2014-03-11 | Robert Newton Rountree | Low voltage antifuse programming circuit and method |
US9269899B1 (en) * | 2015-02-05 | 2016-02-23 | Micron Technology, Inc. | Electronic device, memory cell, and method of flowing electric current |
US9455222B1 (en) * | 2015-12-18 | 2016-09-27 | Texas Instruments Incorporated | IC having failsafe fuse on field dielectric |
DE102016115939B4 (de) * | 2016-08-26 | 2021-05-27 | Infineon Technologies Ag | Einmal programmierbare Speicherzelle und Speicheranordnung |
US11322497B1 (en) | 2021-02-10 | 2022-05-03 | Globalfoundries U.S. Inc. | Electronic fuse (e-fuse) cells integrated with bipolar device |
US11881274B2 (en) * | 2021-11-15 | 2024-01-23 | Ememory Technology Inc. | Program control circuit for antifuse-type one time programming memory cell array |
US20240074167A1 (en) * | 2022-08-25 | 2024-02-29 | Globalfoundries U.S. Inc. | Electrically programmable fuse over lateral bipolar transistor |
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NL8002634A (nl) * | 1980-05-08 | 1981-12-01 | Philips Nv | Programmeerbare halfgeleiderinrichting en werkwijze ter vervaardiging daarvan. |
JPS5846174B2 (ja) * | 1981-03-03 | 1983-10-14 | 株式会社東芝 | 半導体集積回路 |
JPS59105354A (ja) * | 1982-12-09 | 1984-06-18 | Toshiba Corp | 半導体装置 |
JPH0451561A (ja) * | 1990-06-19 | 1992-02-20 | Seiko Epson Corp | 半導体装置 |
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US5471163A (en) * | 1993-11-16 | 1995-11-28 | Hewlett-Packard Company | Tab circuit fusible links for disconnection or encoding information |
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US5622892A (en) * | 1994-06-10 | 1997-04-22 | International Business Machines Corporation | Method of making a self cooling electrically programmable fuse |
US5552338A (en) * | 1994-09-26 | 1996-09-03 | Intel Corporation | Method of using latchup current to blow a fuse in an integrated circuit |
-
1995
- 1995-06-30 KR KR1019950018971A patent/KR0157345B1/ko not_active IP Right Cessation
-
1996
- 1996-06-27 US US08/670,506 patent/US5661323A/en not_active Expired - Lifetime
- 1996-07-01 JP JP17114596A patent/JP3662351B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101148509B1 (ko) * | 2003-12-19 | 2012-05-22 | 길슨, 인크. | 액체 크로마토그래피 자동 샘플 충전 기구 및 방법 |
Also Published As
Publication number | Publication date |
---|---|
JP3662351B2 (ja) | 2005-06-22 |
KR0157345B1 (ko) | 1998-12-01 |
US5661323A (en) | 1997-08-26 |
JPH0917878A (ja) | 1997-01-17 |
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