KR960043145A - 점유면적의 저감된 패드 배치를 가지는 반도체 기억장치 및 그를 위한 패드 배치 방법 - Google Patents
점유면적의 저감된 패드 배치를 가지는 반도체 기억장치 및 그를 위한 패드 배치 방법 Download PDFInfo
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- KR960043145A KR960043145A KR1019960013507A KR19960013507A KR960043145A KR 960043145 A KR960043145 A KR 960043145A KR 1019960013507 A KR1019960013507 A KR 1019960013507A KR 19960013507 A KR19960013507 A KR 19960013507A KR 960043145 A KR960043145 A KR 960043145A
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Abstract
Description
Claims (20)
- 반도체 칩 상에 십자 형상으로 배치되는 장치 외부의 전기적 접속을 실현하기 위한 복수의 제1의 패드 (PDa-PDp : PA1-PA16 : PDa1-PDa2, PDb1-PDb2 : PL)의 열 및 복수이 제2패드(DPa-DPg : PB1-PB16 : PDc1-PDc2, PDd1, PDd2 : PS)의 열 및 복수의 제2패드(DPa-DPg : PB1-PB16 : PDc1-PDc2, PDd1, PDd2 : PS)의 열을 구비하는 반도체 기억장치.
- 제1항에 있어서 상기 칩상에 걸쳐서 배설되어 각각이 상기 반도체 칩의 제1의 변의 한편 측 또는 다른 편 측에 배치되는 한편 단과, 상기 제1 및 제2의 패드의 사정에 정하게 된 대응의 패드에 접속하는 다른 편 단을 가지는 복수의 리드(FL1a-FL18b)를 더 구비하는 반도체 기억장치.
- 제1항에 있어서, 상기 반도체 칩의 4변에 따라 배설되는 외부리드 단자에 대응하여 배치되어 각각이 상기 4변 중의 어느 것의 변에 배설 되는 한편 단과 상기 제1 및 제2의 패드의 사전에 정하게 된 대응의 패드에 접속되는 다른편 단을 가지는 상기 칩 상에 걸쳐서 연장하여 밸치되는 복수의 리드 FL1a-FL18b : FLa1-FLd4)를 더 구비하는 반도체 기억장치.
- 제1항에 있어서, 상기 복수의 제1의 패드(PDa-PDp)는 데이터를 입출력하기 위한 패트(DQ)를 포함하고, 상기 복수의 제2의 패드(PDa-PDg)는 외부에서 제공되는 제어신호 및 어드레스 신호를 받는 패드(DPa-DPf)를 포함하는 반도체 기억장치.
- 제2항에 있어서, 상기 제1의 변 방향의 중앙부에 배치되는 한편 단을 가지는 리드(FL6a-FL13a, FL6b-FL13b)는 상기 제2의 패드(PB1-PB16 : PDa1-PFa2) 되는 한편 단을 가지는 리드 (FL1a-FL5a, FL14a-FL18a, FL1b-FL5b, FL14b-FL18b)는 상기 제1의 패드(PA1-PA16 : PDc1, PDd1)에 접속되는 반도체 기억장치.
- 제5항에 있어서, 상기 제1의 변 방향과 직교하는 방향에 따라 배치되는 한편 단을 가지는 리드(FLd1, - FLd4 : FLc1-FLc4)는 상기 제1의 패드(PDc2, PDd2)에 접속되는 반도체 기억 장치.
- 제2항에 있어서 상기 제1의 변 방향의 중앙부에 배치되는 한편 단을 가지는 리드(FL6a-FL13a, FL6b-FL13b)는 상기 중앙부에서 단부로 향하여 배치되는 리드가 순차 상기 제2의 중앙영역에 외주부에서 내부로 향하여 배치되는 제2의 패드에 접속 되도록 상기 사전에 정하게 된 대응의 제2의 패드(PB1-PB16)에 접속되는 반도체 기억장치.
- 제1항에 있어서, 상기 제1의 변 방향에 따라 연재하고, 상기 복수의 제2의 패드의 사전에 정하게 된 대응의 패드(PS)과 접속되는 복수의 제1의 리드(Fb)와 상기 복수의 제1의 리드와 다른 층에 배치되어, 상기 제2의 변 방향에 따라 연장하고, 상기 복수의 제1의 패드(PL)의 사전에 정하게 된 대응의 패드와 접속되는 복수의 제2의 리드(Fa)를 더 구비하는 반도체 기억장치.
- 제1항에 있어서, 칩(1)은 십자형의 4부분으로 분할되고, 상기 반도체 메모리 장치는 상기 4부분에 배열되는 복수의 메모리 블록(MB1-MB4)을 더 구비하는 반도체 메모리 장치.
- 제9항에 있어서 상기 칩(1)은 4개의 동일 부분의 십자형으로 분할 되는 반도체 메모리 장치.
- 제9항에 있어서 상기 칩(1)은 상기 복수의 제1패드(PDa-PD1)의 선에 평행인 제1변(LS)과 상기 복수의 제2패드(DPa-DPg)의 선에 평행인 제2변(SS)을 가지고, 제1패드는 대응 메모리 블록에 대응하여 설치되며, 상기 제1변의 방향으로 대응하는 메모리 블록(MB1,MB3)의 중앙 부근에 설치되는 DQ 패드(DQ)를 포함하는 반도체 메모리 장치.
- 제9항에 있어서, 상기 칩(1)은 제1패드(DPa-DPp)의 선에 병행인 제1변(LS)과, 제2패드 (DPa-DPg)의 선에 병행인 제2변(SS)을 가지고, 제1패드는 대응하는 메모리 블록과 데이터 통신하기 위해, 각 메모리 블록 용 소정수의 복수의 DQ 패드 (DQ)를 포함하고, 소젓수의 DQ 패드는 제1변의 방향으로 대응하는 메모리 블록의 중앙에 대해 대칭으로 배열되는 반도체 메모리 장치.
- 제9항에 있어서, 십자형 영영(CHa-CHc)은 메모리 블록은 그위에 형성된 액세스 하는 것을 제어하는 주변회로(5a,5b)를 가지고, 제1패드의 라인과 제2패드의 라인 양쪽의 중앙부분에 위치하고 있는 반도체 메모리 장치.
- 제11항에 있어서, 상기 제1의 변(LS)은 상기 제2의 변(SS)보다 긴 반도체 메모리 장치.
- 제12항에 있어서, 상기 제1의 변(LS)은 상기 제2의 변(SS)보다 긴 반도체 메모리 장치.
- 제1의 변과 제2의 변을 가지는 구형 형상을 가지고, 그의 표면에 적어도 메모리셀의 어레이가 형성되는 반도체 칩(1)과 상기 제2의 변(3)방향에 대해 중앙부에 형성되는 상기 제1의 변 방향에 따라 연장하는 제1의 중앙영역(2)에 배치되는 장치 외부의 전기적 접속을 실현하기 위한 복수의 제1의 패드(PDA)와 상기 제1의 변의 양단부 각각에서, 상기 제2의 변에 따라 배치되는 장치 외부의 전기적 접속을 실현하기 위한 복수의 제2의 패드(PDBa,DPBab)를 구비하는 반도체 기억장치.
- 제16항에 있어서, 상기 칩(1)의 제1의 변(LS)에 배치되는 외부리드 단자에 대응하여 배치되고, 상기 칩 상에 걸쳐서 상기 제2의 변(SS) 방향에 연장하여 배치되어, 상기 복수의 제1패드(PDA)의 사정에 정하게 된 대응의 제1의 패드와 접속되는 복수의 제1의 리드(FLDA)와 상기 제2의 변에 따라 배치되는 외부 리드 단자에 대응하여 배치되고, 상기 복수의 제2의 패드(PDBa, DPBab)의 사전에 정하게 된 대응의 제2의 패드에 접속하는 복수의 제2의 리드(FDa, FDb)를 더 구비하는 반도체 기억장치.
- 제1의 변과 제2의 변(LS, SS)을 가지는 구형형상을 가지고 2의 표면에 적어도 메모리 셀의 어레이(MB1-MB4)가 형성되는 반도체 칩(1)과 상기 제1변의 양 단부에 상기 반도체 칩이 주변 영역(10a,10b) 반도체 칩 상에 상기 제1면의(LS)의 방향에 중앙영역(3)에서 상기 제2변(SS)의 방향에 배치된 장치 외부의 전기적 접속을 실현하기 위한 복수의 패드(PDBa-PDBc)를 구비하는 반도체 기억장치.
- 제18항에 있어서, 상기 제1의 변 방향에 따라 배치되는 외부 핀 단자에 연결 되고, 상기 중앙영역(3)의 패드(PDBC)의 서전에 정하게 된 대응의 패드를 접속하는 복수의 리드(FLDC)를 더 구비하는 반도체 기억장치.
- 상기 제1변과 수직한 제1변(SS) 및 제2변(LS)을 가지는 칩(1)상에 형성된 반도체 장치에 있어서, 제2변에 대해, 중앙부(3)에 제1변의 방향으로 조정되어 배열된 복수의 제1패드(PS : PDBC)와 상기 중앙부와 다른 부(2: 10a,10b)에 제1 및 제2변 중의 어느 하나의 방향으로 배열된 복수의 제2패드(PL : PDBa, PDBc)를 구비하는 반도체 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11435995A JP3494502B2 (ja) | 1995-05-12 | 1995-05-12 | 半導体記憶装置およびそのパッド配置方法 |
JP95-114359 | 1995-05-12 |
Publications (2)
Publication Number | Publication Date |
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KR960043145A true KR960043145A (ko) | 1996-12-23 |
KR100218875B1 KR100218875B1 (ko) | 1999-09-01 |
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KR1019960013507A Expired - Fee Related KR100218875B1 (ko) | 1995-05-12 | 1996-04-29 | 점유면적의 저감된 패드배치를 가지는 반도체기억장치 및 그를 위한 패드배치방법 |
Country Status (3)
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US (1) | US6150728A (ko) |
JP (1) | JP3494502B2 (ko) |
KR (1) | KR100218875B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100254761B1 (ko) * | 1995-11-28 | 2000-05-01 | 다니구찌 이찌로오, 기타오카 다카시 | 효과적으로 배치된 패드를 갖는 반도체장치 |
KR100582622B1 (ko) * | 2001-06-08 | 2006-05-23 | 산요덴키가부시키가이샤 | 화합물 반도체 스위치 회로 장치 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2954165B1 (ja) * | 1998-05-20 | 1999-09-27 | 日本電気アイシーマイコンシステム株式会社 | 半導体装置 |
JP2000100814A (ja) * | 1998-09-18 | 2000-04-07 | Hitachi Ltd | 半導体装置 |
JP3803050B2 (ja) * | 2001-10-29 | 2006-08-02 | 株式会社ルネサステクノロジ | 半導体記憶装置、ダイナミックランダムアクセスメモリおよび半導体装置 |
KR100487918B1 (ko) * | 2002-08-30 | 2005-05-09 | 주식회사 하이닉스반도체 | 불휘발성 강유전체 메모리 장치 |
KR100949878B1 (ko) | 2003-02-06 | 2010-03-25 | 주식회사 하이닉스반도체 | 반도체 장치의 레이아웃 구조 |
JP2004265940A (ja) * | 2003-02-19 | 2004-09-24 | Sony Corp | 半導体装置 |
KR100533977B1 (ko) * | 2004-05-06 | 2005-12-07 | 주식회사 하이닉스반도체 | 셀영역의 면적을 감소시킨 반도체 메모리 장치 |
KR100591764B1 (ko) * | 2004-05-18 | 2006-06-22 | 삼성전자주식회사 | 셀 어레이를 가로질러 배선된 신호라인을 갖는 반도체메모리 장치 |
KR100650767B1 (ko) * | 2005-11-10 | 2006-11-27 | 주식회사 하이닉스반도체 | 패드 재배열 칩과, 그 제조방법 및 패드 재배열 칩을이용한 적층형 패키지 |
JP4693656B2 (ja) * | 2006-03-06 | 2011-06-01 | 株式会社東芝 | 不揮発性半導体記憶装置 |
JP2009200101A (ja) * | 2008-02-19 | 2009-09-03 | Liquid Design Systems:Kk | 半導体チップ及び半導体装置 |
JP2011060909A (ja) * | 2009-09-08 | 2011-03-24 | Elpida Memory Inc | 半導体記憶装置 |
TWI539565B (zh) * | 2014-01-29 | 2016-06-21 | 森富科技股份有限公司 | 記憶體與記憶體球位焊墊之佈局方法 |
TWI792683B (zh) * | 2021-11-17 | 2023-02-11 | 旺宏電子股份有限公司 | 積體電路 |
US11903194B2 (en) | 2021-11-17 | 2024-02-13 | Macronix International Co., Ltd. | Integrated circuit |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0204177A1 (de) * | 1985-05-31 | 1986-12-10 | Siemens Aktiengesellschaft | Anschlussanordnung für einen integrierten Halbleiterschaltkreis |
JPH02132848A (ja) * | 1988-11-14 | 1990-05-22 | Nec Corp | 半導体装置 |
US5285082A (en) * | 1989-11-08 | 1994-02-08 | U.S. Philips Corporation | Integrated test circuits having pads provided along scribe lines |
JPH03230558A (ja) * | 1990-02-05 | 1991-10-14 | Nec Corp | 半導体装置 |
USH1267H (en) * | 1990-07-05 | 1993-12-07 | Boyd Melissa D | Integrated circuit and lead frame assembly |
US5126286A (en) * | 1990-10-05 | 1992-06-30 | Micron Technology, Inc. | Method of manufacturing edge connected semiconductor die |
US5250840A (en) * | 1992-02-24 | 1993-10-05 | Samsung Electronics Co., Ltd. | Semiconductor lead frame with a chip having bonding pads in a cross arrangement |
US5457340A (en) * | 1992-12-07 | 1995-10-10 | Integrated Device Technology, Inc. | Leadframe with power and ground planes |
JPH06302644A (ja) * | 1993-04-15 | 1994-10-28 | Hitachi Ltd | 半導体装置 |
US5545920A (en) * | 1994-09-13 | 1996-08-13 | Texas Instruments Incorporated | Leadframe-over-chip having off-chip conducting leads for increased bond pad connectivity |
-
1995
- 1995-05-12 JP JP11435995A patent/JP3494502B2/ja not_active Expired - Fee Related
-
1996
- 1996-04-29 KR KR1019960013507A patent/KR100218875B1/ko not_active Expired - Fee Related
-
1997
- 1997-05-12 US US08/854,754 patent/US6150728A/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100254761B1 (ko) * | 1995-11-28 | 2000-05-01 | 다니구찌 이찌로오, 기타오카 다카시 | 효과적으로 배치된 패드를 갖는 반도체장치 |
US6469327B1 (en) | 1995-11-28 | 2002-10-22 | Mitsubshi Denki Kabushiki Kaisha | Semiconductor device with efficiently arranged pads |
KR100582622B1 (ko) * | 2001-06-08 | 2006-05-23 | 산요덴키가부시키가이샤 | 화합물 반도체 스위치 회로 장치 |
Also Published As
Publication number | Publication date |
---|---|
US6150728A (en) | 2000-11-21 |
KR100218875B1 (ko) | 1999-09-01 |
JP3494502B2 (ja) | 2004-02-09 |
JPH08316266A (ja) | 1996-11-29 |
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