KR920021203A - 진공처리장치 - Google Patents
진공처리장치 Download PDFInfo
- Publication number
- KR920021203A KR920021203A KR1019920009321A KR920009321A KR920021203A KR 920021203 A KR920021203 A KR 920021203A KR 1019920009321 A KR1019920009321 A KR 1019920009321A KR 920009321 A KR920009321 A KR 920009321A KR 920021203 A KR920021203 A KR 920021203A
- Authority
- KR
- South Korea
- Prior art keywords
- conveying
- vacuum processing
- processing apparatus
- openings
- stations
- Prior art date
Links
- 238000009489 vacuum treatment Methods 0.000 claims 2
- 238000012856 packing Methods 0.000 claims 1
- 238000007789 sealing Methods 0.000 claims 1
- 238000000967 suction filtration Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract 2
- 230000001143 conditioned effect Effects 0.000 abstract 1
- 238000007740 vapor deposition Methods 0.000 abstract 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J3/00—Processes of utilising sub-atmospheric or super-atmospheric pressure to effect chemical or physical change of matter; Apparatus therefor
- B01J3/04—Pressure vessels, e.g. autoclaves
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
- C23C14/566—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4409—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber characterised by sealing means
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67751—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49998—Work holding
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/51—Plural diverse manufacturing apparatus including means for metal shaping or assembling
- Y10T29/5124—Plural diverse manufacturing apparatus including means for metal shaping or assembling with means to feed work intermittently from one tool station to another
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/51—Plural diverse manufacturing apparatus including means for metal shaping or assembling
- Y10T29/5196—Multiple station with conveyor
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Physical Vapour Deposition (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Chemical Vapour Deposition (AREA)
- Furnace Details (AREA)
- Vaporization, Distillation, Condensation, Sublimation, And Cold Traps (AREA)
- Processing Of Solid Wastes (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
- Manipulator (AREA)
Abstract
Description
Claims (14)
- 적어도 하나의 목적물을 진공처리하는 장치로서, 적어도 하나이상의 목적물용 개구(21,25)가 제공되어 있는 적어도 2개 이상의 스테이션(7,27)과 회전축으로서의 공간축(A) 둘레를 회전할 수 있게 장착되어 구동(1)되며, 적어도 2개 이상의 목적물용 운반부분(19)이 제공되어 있고, 이러한 운반부분(19)이 스테이션(7,27)의 개구(21,25)에서 순차적으로 이동할 수 있는 운반장치(3,5,19,23)및 운반장치들을 개별적으로 개구(21,25) 쪽으로 또는 개구로 부터 이동시키기 위한 구동수단 등이 제공되어 있는 진공처리장치에 있어서, 구동수단이 운반장치(3,5,19,23)에 배치되어 있는 것을 특징으로 하는 진공처리장치.
- 제1항에 있어서, 개구(13,25)의 표면법선(A13, A27)이 공간축(A)에 대하여 평행으로 되어있지 아니한 것을 특징으로 하는 진공처리장치.
- 제2항에 있어서, 운반부분이 공간축(A)에 대하여 축평행으로 또는 방사상으로 전진 또는 후진할 수 있는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제3항중 어느 한 항에 있어서, 개구(21,25)중 하나의 운반장치가 서로 대향하여 배치되어 있고, 이렇한 개구의 표면법선(A13, A27) 방향으로 전진 또는 후진하는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제4항중 어느 한 항에 있어서, 운반장치가 공간축(A)둘레를 회전할 때, 주어진 개구부(Ø≤90°)으로 원추면(31)을 스쳐가는 것을 특징으로 하는 진공처리장치.
- 제5항에 있어서, 개구표면법선(A13, A27) 이 원추면 모선 방향으로 향하여 있는 것을 특징으로 하는 진공처리장치.
- 제6항에 있어서, 개구(13,35)가 원추대원(33)에 따라 배치되어 있는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제7항중 어느 한 항에 있어서, 운반장치(3,5,19,23)에 공간축(A)둘레를 회전할 수 있게 장착되어 있는 적어도 2개의 운반암(5)이 포함되어 있는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제8항중 어느 한 항에 있어서, 스테이션(7,27)이 운반장치(3,5,19,23)를 그안에 들어있는 챔버(K)내로 개구를 거쳐 유입되는 것을 특징으로 하는 진공처리장치.
- 제9항에 있어서, 가스공급장치 또는 흡인여과장치가 스테이션(7,27)중 하나 또는 챔버(K)에 제공되어 있는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제10항중 어느 한 항에 있어서, 적어도 하나 이상의 운반부분에 개구중 적어도 하나를 밀폐시킬 수 있는 패킹(19)이 포함되어 있는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제11항중 어느 한 항에 있어서, 운반부분에 중앙개구가 제공되어 있는 디스크 모양의 목적물의 위치를 정하기 위한 페그와 목적물용의 지지장치 및 방사상으로 작용하는 스트링장치(25,26)가 제공되어 있는 것을 특징으로 하는 진공처리장치.
- 제1항 내지 제12항중 어느 한 항에 의한 장치의 CD 또는 자기 광학적 메모리판 디스크의 처리용으로의 이용.
- 중앙개구가 있는 디스크 모양의 목적물을 진공처리할 때, 이를 지지하기 위한 지지물로서, 지지판(29)에 그 표면 위로 돌출하고, 스프링이 걸려있고, 볼록하게 구부려져 있는 부분(26)이 달린 돌출 페그(22)가 제공되어 있는 것을 특징으로 하는 지지물.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970020286A KR100247599B1 (ko) | 1991-05-31 | 1997-05-23 | 진공 처리 장치용 폐쇄 운반실 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4117969A DE4117969C2 (de) | 1991-05-31 | 1991-05-31 | Vakuumkammer |
DEP4117969.2 | 1991-05-31 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970020286A Division KR100247599B1 (ko) | 1991-05-31 | 1997-05-23 | 진공 처리 장치용 폐쇄 운반실 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920021203A true KR920021203A (ko) | 1992-12-18 |
KR100247597B1 KR100247597B1 (ko) | 2000-03-15 |
Family
ID=6432957
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920009321A KR100247597B1 (ko) | 1991-05-31 | 1992-05-29 | 진공처리장치 |
Country Status (6)
Country | Link |
---|---|
US (3) | US5245736A (ko) |
EP (1) | EP0518109B1 (ko) |
JP (1) | JPH0763612B2 (ko) |
KR (1) | KR100247597B1 (ko) |
AT (1) | ATE162854T1 (ko) |
DE (2) | DE4117969C2 (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4139507A1 (de) * | 1991-02-23 | 1992-08-27 | Bernd Plickert | Montagevorrichtung fuer plattenfoermige elemente |
CH691377A5 (de) * | 1992-10-06 | 2001-07-13 | Unaxis Balzers Ag | Kammeranordnung für den Transport von Werkstücken und deren Verwendung. |
GB2272225B (en) * | 1992-10-06 | 1996-07-17 | Balzers Hochvakuum | A method for masking a workpiece and a vacuum treatment facility |
EP1179611B1 (de) | 1992-10-06 | 2004-09-15 | Unaxis Balzers Aktiengesellschaft | Kammer für den Transport von Werkstücken |
DE4235677C2 (de) * | 1992-10-22 | 1996-10-31 | Balzers Hochvakuum | Vakuumkammer, Vakuumbehandlungsanlage mit einer solchen Kammer sowie Transportverfahren |
US5400317A (en) * | 1993-04-01 | 1995-03-21 | Balzers Aktiengesellschaft | Method of coating a workpiece of a plastic material by a metal layer |
US5730801A (en) * | 1994-08-23 | 1998-03-24 | Applied Materials, Inc. | Compartnetalized substrate processing chamber |
NL1000138C2 (nl) * | 1995-04-13 | 1996-10-15 | Od & Me Bv | Inrichtingen voor het bewerken van een substraat alsmede werkwijze geschikt voor toepassing bij dergelijke inrichtingen. |
US5605574A (en) * | 1995-09-20 | 1997-02-25 | Kabushiki Kaisha Toshiba | Semiconductor wafer support apparatus and method |
DE19715151A1 (de) * | 1997-04-11 | 1998-10-15 | Leybold Systems Gmbh | Verfahren zum Be- und Entladen einer evakuierbaren Behandlungskammer und Handlingsvorrichtung zur Durchführung des Verfahrens |
EP0870850B1 (de) * | 1997-04-11 | 2002-09-18 | Leybold Systems GmbH | Verfahren und Vorrichtung zum Be- und Entladen einer evakuierbaren Behandlungskammer |
DE19720349A1 (de) * | 1997-05-15 | 1998-11-19 | Huels Chemische Werke Ag | Vakuumbehandlungsvorrichtung |
DE29716440U1 (de) * | 1997-09-12 | 1997-12-11 | Balzers Ag, Balzers | Sputterstation |
CH693508A5 (de) * | 1997-09-12 | 2003-09-15 | Unaxis Balzers Ag | Sputterstation. |
US6730194B2 (en) * | 1997-11-05 | 2004-05-04 | Unaxis Balzers Aktiengesellschaft | Method for manufacturing disk-shaped workpieces with a sputter station |
US5944948A (en) * | 1998-04-02 | 1999-08-31 | Centennial Technologies, Inc. | Apparatus for assembling a pair of members |
DE19953949A1 (de) * | 1999-11-09 | 2001-05-17 | Asys Gmbh & Co Kg | Vorrichtung zum Bestücken von Teileträgern für Mikrosysteme |
US6572090B2 (en) * | 2001-03-14 | 2003-06-03 | Thermwood Corporation | Method of positioning articles in predetermined relationships and fixture therefor |
DE10259252B4 (de) * | 2002-12-17 | 2005-06-23 | Asys Automatic Systems Gmbh & Co. Kg | Arbeitseinheit für Reinraumsysteme |
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JPS59182933U (ja) * | 1983-05-23 | 1984-12-06 | 株式会社 デイスコ | ウェーハ装着機 |
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-
1991
- 1991-05-31 DE DE4117969A patent/DE4117969C2/de not_active Expired - Fee Related
-
1992
- 1992-05-25 DE DE59209160T patent/DE59209160D1/de not_active Expired - Lifetime
- 1992-05-25 EP EP92108771A patent/EP0518109B1/de not_active Expired - Lifetime
- 1992-05-25 AT AT92108771T patent/ATE162854T1/de not_active IP Right Cessation
- 1992-05-26 US US07/888,111 patent/US5245736A/en not_active Ceased
- 1992-05-29 KR KR1019920009321A patent/KR100247597B1/ko not_active IP Right Cessation
- 1992-06-01 JP JP4140357A patent/JPH0763612B2/ja not_active Expired - Lifetime
-
1997
- 1997-11-03 US US08/962,776 patent/USRE40191E1/en not_active Expired - Lifetime
-
2000
- 2000-07-19 US US09/619,391 patent/USRE40192E1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0518109B1 (de) | 1998-01-28 |
DE4117969C2 (de) | 2000-11-09 |
DE4117969A1 (de) | 1992-12-03 |
JPH05184903A (ja) | 1993-07-27 |
JPH0763612B2 (ja) | 1995-07-12 |
US5245736A (en) | 1993-09-21 |
ATE162854T1 (de) | 1998-02-15 |
KR100247597B1 (ko) | 2000-03-15 |
USRE40191E1 (en) | 2008-04-01 |
EP0518109A1 (de) | 1992-12-16 |
USRE40192E1 (en) | 2008-04-01 |
DE59209160D1 (de) | 1998-03-05 |
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