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KR910020420A - 온도검출회로 - Google Patents

온도검출회로 Download PDF

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Publication number
KR910020420A
KR910020420A KR1019910008153A KR910008153A KR910020420A KR 910020420 A KR910020420 A KR 910020420A KR 1019910008153 A KR1019910008153 A KR 1019910008153A KR 910008153 A KR910008153 A KR 910008153A KR 910020420 A KR910020420 A KR 910020420A
Authority
KR
South Korea
Prior art keywords
current
detection circuit
temperature detection
source
supplies
Prior art date
Application number
KR1019910008153A
Other languages
English (en)
Other versions
KR930006304B1 (ko
Inventor
히토시 기노시타
마사루 하시모토
Original Assignee
아오이 죠이치
가부시키가이샤 도시바
다케다이 마사다카
도시바 마이크로 일렉트로닉스 가부시키가이샤
오시마 고타로
도시바 오디오·비디오 엔지니어링 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 아오이 죠이치, 가부시키가이샤 도시바, 다케다이 마사다카, 도시바 마이크로 일렉트로닉스 가부시키가이샤, 오시마 고타로, 도시바 오디오·비디오 엔지니어링 가부시키가이샤 filed Critical 아오이 죠이치
Publication of KR910020420A publication Critical patent/KR910020420A/ko
Application granted granted Critical
Publication of KR930006304B1 publication Critical patent/KR930006304B1/ko

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is DC
    • G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
    • G01K7/14—Arrangements for modifying the output characteristic, e.g. linearising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K3/00—Thermometers giving results other than momentary value of temperature
    • G01K3/005—Circuits arrangements for indicating a predetermined temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Nonlinear Science (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Amplifiers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Of Electrical Variables (AREA)

Abstract

내용 없음

Description

온도검출회로
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 온도검출회로의 1실시 예를 나타낸 회로도, 제2도는 제1도의 회로의 온도 검출 특성을 나타낸 특성도.

Claims (2)

  1. 밴드갭형 전압원의 밴드갭 전압에 관계하는 정(正)의 온도계수를 갖는 전류를 공급하는 제1전류원 (Q3)과, 0또는 부(負)의 온도계수를 갖는 전류를 공급하는 제2전류원 (Q8,Q9) 및, 이들 2개의 전류원의 전류량을 비교해서 전류량의 대소관계를 검출하는 비교회로 (Q5∼ Q7, Q10, Q11)를 구비한 것을 특징으로 하는 온도 검출회로.
  2. 제1항에 있어서, 상기 비교회로 ( Q5∼Q7, Q10, Q11)는 2개의 전류원의 전류량이 소정의 값으로 된 때를 검출해서 상기 제2전류원 (Q8, Q9)의 전류량을 변화시키도록 된 것을 특징으로 하는 온도 검출회로.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910008153A 1990-05-24 1991-05-20 온도검출회로 KR930006304B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP02134940 1990-05-24
JP2134940A JP2598154B2 (ja) 1990-05-24 1990-05-24 温度検出回路
JP134940 1990-05-24

Publications (2)

Publication Number Publication Date
KR910020420A true KR910020420A (ko) 1991-12-20
KR930006304B1 KR930006304B1 (ko) 1993-07-12

Family

ID=15140115

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910008153A KR930006304B1 (ko) 1990-05-24 1991-05-20 온도검출회로

Country Status (5)

Country Link
US (1) US5149199A (ko)
EP (1) EP0458332B1 (ko)
JP (1) JP2598154B2 (ko)
KR (1) KR930006304B1 (ko)
DE (1) DE69124138T2 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101489104B1 (ko) * 2010-10-04 2015-02-02 가부시키가이샤 리코 전기 소자

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CA2066929C (en) * 1991-08-09 1996-10-01 Katsuji Kimura Temperature sensor circuit and constant-current circuit
US5359236A (en) * 1993-05-25 1994-10-25 Harris Corporation Integrated circuit thermal sensor
JP2540753B2 (ja) * 1993-09-01 1996-10-09 日本電気株式会社 過熱検出回路
US7216064B1 (en) 1993-09-21 2007-05-08 Intel Corporation Method and apparatus for programmable thermal sensor for an integrated circuit
US5394078A (en) * 1993-10-26 1995-02-28 Analog Devices, Inc. Two terminal temperature transducer having circuitry which controls the entire operating current to be linearly proportional with temperature
JP3348576B2 (ja) * 1995-11-10 2002-11-20 ソニー株式会社 温度検出装置、これを搭載した半導体素子およびこれを用いたオートフォーカスシステム
US6055489A (en) * 1997-04-15 2000-04-25 Intel Corporation Temperature measurement and compensation scheme
JP3338632B2 (ja) * 1997-05-15 2002-10-28 モトローラ株式会社 温度検出回路
US6363490B1 (en) 1999-03-30 2002-03-26 Intel Corporation Method and apparatus for monitoring the temperature of a processor
US6789037B2 (en) * 1999-03-30 2004-09-07 Intel Corporation Methods and apparatus for thermal management of an integrated circuit die
US6393374B1 (en) 1999-03-30 2002-05-21 Intel Corporation Programmable thermal management of an integrated circuit die
EP1081477B1 (en) * 1999-08-31 2006-10-18 STMicroelectronics S.r.l. CMOS Temperature sensor
GB2355552A (en) 1999-10-20 2001-04-25 Ericsson Telefon Ab L M Electronic circuit for supplying a reference current
US7263567B1 (en) 2000-09-25 2007-08-28 Intel Corporation Method and apparatus for lowering the die temperature of a microprocessor and maintaining the temperature below the die burn out
KR100772594B1 (ko) * 2001-06-30 2007-11-02 매그나칩 반도체 유한회사 온도 센서
US6679628B2 (en) * 2001-08-14 2004-01-20 Schneider Automation Inc. Solid state temperature measuring device and method
US6735546B2 (en) * 2001-08-31 2004-05-11 Matrix Semiconductor, Inc. Memory device and method for temperature-based control over write and/or read operations
US6724665B2 (en) * 2001-08-31 2004-04-20 Matrix Semiconductor, Inc. Memory device and method for selectable sub-array activation
GB2425419B (en) 2002-10-01 2007-05-02 Wolfson Microelectronics Plc Temperature sensing apparatus and methods
JP2004146576A (ja) * 2002-10-24 2004-05-20 Renesas Technology Corp 半導体温度測定回路
US6954394B2 (en) * 2002-11-27 2005-10-11 Matrix Semiconductor, Inc. Integrated circuit and method for selecting a set of memory-cell-layer-dependent or temperature-dependent operating conditions
FR2857456B1 (fr) * 2003-07-07 2006-01-13 St Microelectronics Sa Cellule de detection de temperature et procede de determination du seuil de detection d'une telle cellule
US7057958B2 (en) * 2003-09-30 2006-06-06 Sandisk Corporation Method and system for temperature compensation for memory cells with temperature-dependent behavior
US7218570B2 (en) * 2004-12-17 2007-05-15 Sandisk 3D Llc Apparatus and method for memory operations using address-dependent conditions
US7332952B2 (en) * 2005-11-23 2008-02-19 Standard Microsystems Corporation Accurate temperature measurement method for low beta transistors
US7283414B1 (en) 2006-05-24 2007-10-16 Sandisk 3D Llc Method for improving the precision of a temperature-sensor circuit
US7896545B2 (en) * 2008-03-19 2011-03-01 Micron Technology, Inc. Apparatus and methods for temperature calibration and sensing
KR102533348B1 (ko) * 2018-01-24 2023-05-19 삼성전자주식회사 온도 감지 장치 및 온도-전압 변환기
JP7167396B2 (ja) * 2018-11-16 2022-11-09 ミネベアミツミ株式会社 湿度検出装置及び故障判定方法
JP7173661B2 (ja) * 2018-11-16 2022-11-16 ミネベアミツミ株式会社 湿度検出装置
US11460428B2 (en) 2018-11-16 2022-10-04 Minebea Mitsumi Inc. Humidity detecting device and method of determining malfunction

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US4350904A (en) * 1980-09-22 1982-09-21 Bell Telephone Laboratories, Incorporated Current source with modified temperature coefficient
JPS58221507A (ja) * 1982-06-18 1983-12-23 Toshiba Corp トランジスタ回路
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101489104B1 (ko) * 2010-10-04 2015-02-02 가부시키가이샤 리코 전기 소자

Also Published As

Publication number Publication date
JP2598154B2 (ja) 1997-04-09
DE69124138T2 (de) 1997-06-05
EP0458332A2 (en) 1991-11-27
EP0458332A3 (en) 1992-07-22
JPH0430609A (ja) 1992-02-03
EP0458332B1 (en) 1997-01-15
KR930006304B1 (ko) 1993-07-12
US5149199A (en) 1992-09-22
DE69124138D1 (de) 1997-02-27

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