KR870011696A - 전원전압강하회로 - Google Patents
전원전압강하회로 Download PDFInfo
- Publication number
- KR870011696A KR870011696A KR870005455A KR870005455A KR870011696A KR 870011696 A KR870011696 A KR 870011696A KR 870005455 A KR870005455 A KR 870005455A KR 870005455 A KR870005455 A KR 870005455A KR 870011696 A KR870011696 A KR 870011696A
- Authority
- KR
- South Korea
- Prior art keywords
- power supply
- supply voltage
- mis transistor
- external power
- voltage drop
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is DC
- G05F1/462—Regulating voltage or current wherein the variable actually regulated by the final control device is DC as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
- G05F1/465—Internal voltage generators for integrated circuits, e.g. step down generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
- H10D89/819—Bias arrangements for gate electrodes of FETs, e.g. RC networks or voltage partitioning circuits
Landscapes
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
- Control Of Electrical Variables (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Amplifiers (AREA)
- Dram (AREA)
Abstract
Description
Claims (1)
- 외부전원전압이 공급되는 전원단자(VDD)와 출력선(L1,L2), 상기 전원단자(VDD)와 출력선(L1)에 각각 접속되는 드레인과 소오스 및 절연게이트를 갖추고서 외부전원전압을 강화시켜주는 n채널 MIS트랜지스터(T1), 이 MIS트랜지스터(T1)의 챈널로 작용하는 표면영역을 갖추고서 MIS트랜지스터(T1)의 소오스와 같은 전위로 설정되도록 접속되는 반도체본체 및 소정치보다 높은 외부전원전압하에서 이 외부전원적압보다 낮은 정전압을 MIS트랜지스터(T1)의 절연게이트에 공급해주게 되는 정전압발생회로(52,54)로 구성된 것을 특징으로 하는 전원전압강하회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP126339 | 1986-05-31 | ||
JP61-126339 | 1986-05-31 | ||
JP61126339A JPH083766B2 (ja) | 1986-05-31 | 1986-05-31 | 半導体集積回路の電源電圧降下回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR870011696A true KR870011696A (ko) | 1987-12-26 |
KR900004725B1 KR900004725B1 (ko) | 1990-07-05 |
Family
ID=14932724
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019870005455A KR900004725B1 (ko) | 1986-05-31 | 1987-05-30 | 전원전압 강하회로 |
Country Status (5)
Country | Link |
---|---|
US (1) | US4868483A (ko) |
EP (1) | EP0248381B1 (ko) |
JP (1) | JPH083766B2 (ko) |
KR (1) | KR900004725B1 (ko) |
DE (1) | DE3775279D1 (ko) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2759969B2 (ja) * | 1988-07-29 | 1998-05-28 | ソニー株式会社 | 内部降圧回路 |
KR910007740B1 (ko) * | 1989-05-02 | 1991-09-30 | 삼성전자 주식회사 | 비트라인 안정화를 위한 전원전압 추적회로 |
US4952863A (en) * | 1989-12-20 | 1990-08-28 | International Business Machines Corporation | Voltage regulator with power boost system |
NL9001017A (nl) * | 1990-04-27 | 1991-11-18 | Philips Nv | Bufferschakeling. |
KR930009148B1 (ko) * | 1990-09-29 | 1993-09-23 | 삼성전자 주식회사 | 전원전압 조정회로 |
US5144223A (en) * | 1991-03-12 | 1992-09-01 | Mosaid, Inc. | Bandgap voltage generator |
JP2647276B2 (ja) * | 1991-04-30 | 1997-08-27 | 株式会社東芝 | 定電位発生用半導体装置 |
KR940003406B1 (ko) * | 1991-06-12 | 1994-04-21 | 삼성전자 주식회사 | 내부 전원전압 발생회로 |
KR930008886B1 (ko) * | 1991-08-19 | 1993-09-16 | 삼성전자 주식회사 | 전기적으로 프로그램 할 수 있는 내부전원 발생회로 |
KR940008286B1 (ko) * | 1991-08-19 | 1994-09-09 | 삼성전자 주식회사 | 내부전원발생회로 |
US5177431A (en) * | 1991-09-25 | 1993-01-05 | Astec International Ltd. | Linear programming circuit for adjustable output voltage power converters |
US5266886A (en) * | 1992-10-23 | 1993-11-30 | Intel Corporation | CMOS power supply voltage limiter |
JP3304539B2 (ja) * | 1993-08-31 | 2002-07-22 | 富士通株式会社 | 基準電圧発生回路 |
US5506496A (en) * | 1994-10-20 | 1996-04-09 | Siliconix Incorporated | Output control circuit for a voltage regulator |
JP3592423B2 (ja) * | 1996-01-26 | 2004-11-24 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
JP3234153B2 (ja) * | 1996-04-19 | 2001-12-04 | 株式会社東芝 | 半導体装置 |
JPH10145194A (ja) * | 1996-11-13 | 1998-05-29 | Sharp Corp | 電圧比較器 |
EP1177490A1 (en) * | 1999-12-21 | 2002-02-06 | Koninklijke Philips Electronics N.V. | Voltage regulator provided with a current limiter |
US7733165B2 (en) * | 2007-02-27 | 2010-06-08 | Infineon Technologies Ag | Circuit arrangement with interference protection |
FR2918518B1 (fr) * | 2007-07-02 | 2009-09-25 | St Microelectronics Sa | Dispositif et procede de controle des interrupteurs d'alimentation |
US20100283445A1 (en) * | 2009-02-18 | 2010-11-11 | Freescale Semiconductor, Inc. | Integrated circuit having low power mode voltage regulator |
US8319548B2 (en) * | 2009-02-18 | 2012-11-27 | Freescale Semiconductor, Inc. | Integrated circuit having low power mode voltage regulator |
US8400819B2 (en) * | 2010-02-26 | 2013-03-19 | Freescale Semiconductor, Inc. | Integrated circuit having variable memory array power supply voltage |
US9035629B2 (en) | 2011-04-29 | 2015-05-19 | Freescale Semiconductor, Inc. | Voltage regulator with different inverting gain stages |
RU2487392C2 (ru) * | 2011-07-08 | 2013-07-10 | Открытое акционерное общество "Информационные спутниковые системы" имени академика М.Ф. Решетнева" | Резервированный стабилизатор напряжения на мдп-транзисторах |
US9019005B2 (en) * | 2012-06-28 | 2015-04-28 | Infineon Technologies Ag | Voltage regulating circuit |
US10879898B2 (en) | 2018-01-23 | 2020-12-29 | Samsung Electronics Co., Ltd. | Power gating circuit for holding data in logic block |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5515512A (en) * | 1978-07-19 | 1980-02-02 | Hitachi Ltd | Constant voltage output circuit |
US4585955B1 (en) * | 1982-12-15 | 2000-11-21 | Tokyo Shibaura Electric Co | Internally regulated power voltage circuit for mis semiconductor integrated circuit |
JPS59218042A (ja) * | 1983-05-26 | 1984-12-08 | Toshiba Corp | 半導体集積回路 |
JPS60521A (ja) * | 1983-06-15 | 1985-01-05 | Mitsubishi Electric Corp | 電流制限保護回路 |
JPH0697558B2 (ja) * | 1983-06-27 | 1994-11-30 | 株式会社東芝 | 半導体集積回路 |
GB2146808B (en) * | 1983-09-15 | 1986-11-12 | Ferranti Plc | Constant voltage circuits |
JPH0772852B2 (ja) * | 1984-01-26 | 1995-08-02 | 株式会社東芝 | サブミクロン半導体lsiのチップ内電源変換回路 |
JP2592234B2 (ja) * | 1985-08-16 | 1997-03-19 | 富士通株式会社 | 半導体装置 |
-
1986
- 1986-05-31 JP JP61126339A patent/JPH083766B2/ja not_active Expired - Lifetime
-
1987
- 1987-05-29 US US07/055,548 patent/US4868483A/en not_active Expired - Lifetime
- 1987-05-30 KR KR1019870005455A patent/KR900004725B1/ko not_active IP Right Cessation
- 1987-06-01 DE DE8787107898T patent/DE3775279D1/de not_active Expired - Lifetime
- 1987-06-01 EP EP87107898A patent/EP0248381B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0248381B1 (en) | 1991-12-18 |
JPH083766B2 (ja) | 1996-01-17 |
DE3775279D1 (de) | 1992-01-30 |
KR900004725B1 (ko) | 1990-07-05 |
US4868483A (en) | 1989-09-19 |
EP0248381A1 (en) | 1987-12-09 |
JPS62282316A (ja) | 1987-12-08 |
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Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19870530 |
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PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19870530 Comment text: Request for Examination of Application |
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PG1501 | Laying open of application | ||
G160 | Decision to publish patent application | ||
PG1605 | Publication of application before grant of patent |
Comment text: Decision on Publication of Application Patent event code: PG16051S01I Patent event date: 19900531 |
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E701 | Decision to grant or registration of patent right | ||
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