KR102626873B1 - HiPIMS를 이용한 전극 증착 방법 - Google Patents
HiPIMS를 이용한 전극 증착 방법 Download PDFInfo
- Publication number
- KR102626873B1 KR102626873B1 KR1020220059879A KR20220059879A KR102626873B1 KR 102626873 B1 KR102626873 B1 KR 102626873B1 KR 1020220059879 A KR1020220059879 A KR 1020220059879A KR 20220059879 A KR20220059879 A KR 20220059879A KR 102626873 B1 KR102626873 B1 KR 102626873B1
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- hipims
- vacuum chamber
- silver
- power
- vacuum
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- 238000000151 deposition Methods 0.000 title claims abstract description 55
- 239000004332 silver Substances 0.000 claims abstract description 47
- 229910052709 silver Inorganic materials 0.000 claims abstract description 47
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 38
- 230000008021 deposition Effects 0.000 claims abstract description 36
- 239000006223 plastic coating Substances 0.000 claims abstract description 34
- -1 silver ions Chemical class 0.000 claims abstract description 9
- 239000000463 material Substances 0.000 abstract description 32
- 238000005516 engineering process Methods 0.000 abstract description 21
- 230000010355 oscillation Effects 0.000 abstract description 3
- 230000003685 thermal hair damage Effects 0.000 abstract description 3
- 238000004544 sputter deposition Methods 0.000 abstract description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 abstract 2
- 229910002092 carbon dioxide Inorganic materials 0.000 abstract 1
- 239000001569 carbon dioxide Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 description 7
- 230000006378 damage Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 239000013077 target material Substances 0.000 description 5
- 238000004891 communication Methods 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 238000000541 cathodic arc deposition Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000005137 deposition process Methods 0.000 description 3
- 238000000469 dry deposition Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000000168 high power impulse magnetron sputter deposition Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/20—Metallic material, boron or silicon on organic substrates
- C23C14/205—Metallic material, boron or silicon on organic substrates by cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3485—Sputtering using pulsed power to the target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/14—Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3464—Operating strategies
- H01J37/3467—Pulsed operation, e.g. HIPIMS
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (1)
- 불활성 기체의 주입과 진공펌프에 의해 4.0×10-3 torr의 압력범위 및 내부에 존재하는 온도측정기의 기준으로 80℃의 온도범위를 갖는 진공챔버를 포함하며, 플라스틱피도물로 이루어진 전극을 갖는 HiPIMS진공장비를 통해 은(Ag)으로 이루어진 은증착물이 운동에너지를 갖도록 플라스틱피도물의 은타켓에 플라즈마를 형성하여 다수의 은이온을 형성하고, 플라스틱피도물에 전원을 인가하여 은이온의 운동에너지를 증가시키는 (a)단계(S100)와;
상기 (a)단계(S100)에서 상기 HiPIMS진공장비는 진공챔버와, 진공챔버 내부로 가스를 주입하는 스프터장비를 포함하여 구성되며, 상기 HiPIMS진공장비의 진공챔버 내부에 플라스틱피도물의 은타켓에는 (-)전원이 인가되고, 진공챔버에는 (+)전원이 접지되는 구조를 가지며, HiPIMS진공장비는 단독으로 사용되지 않고 외부의 직류전원부로부터 인가된 직류 전원을 제공하는 (c)단계(S300)와;
운동에너지의 충돌을 통해 플라스틱피도물과 은증착물 사이에 접착력을 구현하는 (b)단계(S200)와;
상기 직류전원부에서 제공되는 전압 및 직류를 조절함과 동시에 다양한 형태의 진동패턴을 통해 고출력의 플라즈마 발생을 조절하는 제어부에 의해 진동패턴에 따른 전압 및 전류의 세기를 제어하는 (d)단계(S400)를 포함하며,
상기 직류전원부로부터 플라스틱피도물의 은(Ag)타켓으로 타켓직경은 300mm, 타켓두께는 50mm, HiPIMS 펄스 주파수는 400Hz, HiPIMS 펄스 길이는 100㎲ec, 펄스 피크 전력은 1.0kW, 피도물bias는 -150V, 증착시간은 30s, 증착시 기압은 4.0×10-3 torr, 챔버내 평균 온도는 80℃의 조건을 포함하는 것을 특징으로 하는 HiPIMS를 이용한 전극 증착 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020220059879A KR102626873B1 (ko) | 2021-11-17 | 2022-05-17 | HiPIMS를 이용한 전극 증착 방법 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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KR1020210158131 | 2021-11-17 | ||
KR1020220059879A KR102626873B1 (ko) | 2021-11-17 | 2022-05-17 | HiPIMS를 이용한 전극 증착 방법 |
Related Parent Applications (1)
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KR1020210158131 Division | 2021-11-17 | 2021-11-17 |
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Publication Number | Publication Date |
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KR20230072382A KR20230072382A (ko) | 2023-05-24 |
KR102626873B1 true KR102626873B1 (ko) | 2024-01-17 |
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015003806A1 (de) | 2013-07-09 | 2015-01-15 | Oerlikon Trading Ag, Trübbach | Target zur reaktiven sputter-abscheidung elektrisch-isolierender schichten |
US20190136363A1 (en) | 2016-04-22 | 2019-05-09 | Oerlikon Surface Solutions Ag, Pfäffikon | TICN Having Reduced Growth Defects by Means of HIPIMS |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6440495B1 (en) | 2000-08-03 | 2002-08-27 | Applied Materials, Inc. | Chemical vapor deposition of ruthenium films for metal electrode applications |
KR100719805B1 (ko) | 2005-12-30 | 2007-05-18 | 주식회사 아이피에스 | 전이금속을 첨가한 커패시터 전극 증착 방법 |
-
2022
- 2022-05-17 KR KR1020220059879A patent/KR102626873B1/ko active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015003806A1 (de) | 2013-07-09 | 2015-01-15 | Oerlikon Trading Ag, Trübbach | Target zur reaktiven sputter-abscheidung elektrisch-isolierender schichten |
US20160141157A1 (en) | 2013-07-09 | 2016-05-19 | Oerlikon Surface Solutions Ag, Trübbach | Target for the reactive sputter deposition of electrically insulating layers |
US20190136363A1 (en) | 2016-04-22 | 2019-05-09 | Oerlikon Surface Solutions Ag, Pfäffikon | TICN Having Reduced Growth Defects by Means of HIPIMS |
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KR20230072382A (ko) | 2023-05-24 |
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