KR102467683B1 - 반사 방지 필름, 해당 반사 방지 필름을 사용한 표시 장치, 및 반사 방지 필름의 선택 방법 - Google Patents
반사 방지 필름, 해당 반사 방지 필름을 사용한 표시 장치, 및 반사 방지 필름의 선택 방법 Download PDFInfo
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Abstract
<조건 (1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도로 샘플에 광을 입사시켰을 때, 해당 입사광의 정반사광의 시감 반사율 Y값이 0.50% 이하이다.
Description
Claims (12)
- 투명 기재 상에 고굴절률층 및 저굴절률층을 갖는 반사 방지 필름이며, 해당 반사 방지 필름은, 반사 방지 필름의 투명 기재의 고굴절률층측과는 반대측의 면에 투명 점착제를 통하여 흑색판을 접합한 샘플로부터 측정한 시감 반사율 Y값, Lab 표색계의 a*값 및 b*값이 하기 조건 (1)을 충족함과 함께, 하기 조건 (2-1) 및 하기 조건 (3-1) 중 적어도 어느 것을 충족하는, 반사 방지 필름.
<조건 (1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도로 샘플에 광을 입사시켰을 때, 해당 입사광의 정반사광의 시감 반사율 Y값이 0.20% 이하이다.
<조건 (2-1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도부터 45도까지 5도 간격으로 샘플에 광을 입사시키고, 해당 입사광의 정반사광의 Lab 표색계의 a*값 및 b*값을 측정하고, 각 입사각에 있어서의 a*값의 절댓값 및 b*값의 절댓값의 합(S)을 산출하였을 때, 해당 합의 최솟값(Smin)을 나타내는 입사각 x1(도)이 20도≤x1≤30도이다.
<조건 (3-1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도부터 45도까지 5도 간격으로 샘플에 광을 입사시키고, 해당 입사광의 정반사광의 Lab 표색계의 a*값 및 b*값을 측정하고, 각 입사각에 있어서의 a*값 및 b*값의 제곱합의 평방근을 산출하고, 또한 하기 식 (A)로부터, 각 측정 사이의 a*값 및 b*값의 제곱합의 평방근의 기울기를 산출하였을 때, 해당 기울기가 음에서 양으로 변하는 변곡점을 나타내는 각도 x2(도)가 25도≤x2≤40도이다.
(식 중, 「n」은 1 내지 8의 정수를 나타냄) - 제1항 또는 제2항에 있어서, 상기 투명 기재와 상기 고굴절률층의 사이에 하드 코팅층을 갖고 이루어지는, 반사 방지 필름.
- 표시 소자 상에, 제1항 또는 제2항에 기재된 반사 방지 필름을 해당 반사 방지 필름의 투명 기재측이 표시 소자측을 향하도록 배치하여 이루어지는, 표시 장치.
- 제9항에 있어서, 표시 소자 상에 터치 패널을 갖고, 해당 터치 패널 상에, 상기 반사 방지 필름을 배치하여 이루어지는, 표시 장치.
- 제9항에 있어서, 상기 표시 소자의 화소수가 3840×2160 픽셀 이상인, 표시 장치.
- 투명 기재 상에 고굴절률층 및 저굴절률층을 갖고 이루어지는 반사 방지 필름의 투명 기재의 고굴절률층측과는 반대측의 면에 투명 점착제를 통하여 흑색판을 접합한 샘플을 제작하고, 해당 샘플로부터 측정한 시감 반사율 Y값, 그리고 Lab 표색계의 a*값 및 b*값이 하기 조건 (1)을 충족함과 함께, 하기 조건 (2-1) 및 하기 조건 (3-1) 중 적어도 어느 것을 충족할 것을 판정 조건으로 하는, 반사 방지 필름의 선택 방법.
<조건 (1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도로 샘플에 광을 입사시켰을 때, 해당 입사광의 정반사광의 시감 반사율 Y값이 0.20% 이하이다.
<조건 (2-1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도부터 45도까지 5도 간격으로 샘플에 광을 입사시키고, 해당 입사광의 정반사광의 Lab 표색계의 a*값 및 b*값을 측정하고, 각 입사각에 있어서의 a*값의 절댓값 및 b*값의 절댓값의 합(S)을 산출하였을 때, 해당 합의 최솟값(Smin)을 나타내는 입사각 x1(도)이 20도≤x1≤30도이다.
<조건 (3-1)>
샘플의 저굴절률층측의 표면에 대하여 수직으로 입사하는 광의 입사각을 0도로 하여, 입사각 5도부터 45도까지 5도 간격으로 샘플에 광을 입사시키고, 해당 입사광의 정반사광의 Lab 표색계의 a*값 및 b*값을 측정하고, 각 입사각에 있어서의 a*값 및 b*값의 제곱합의 평방근을 산출하고, 또한 하기 식 (A)로부터, 각 측정 사이의 a*값 및 b*값의 제곱합의 평방근의 기울기를 산출하였을 때, 해당 기울기가 음에서 양으로 변하는 변곡점을 나타내는 각도 x2(도)가 25도≤x2≤40도이다.
(식 중, 「n」은 1 내지 8의 정수를 나타냄)
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