KR100846078B1 - 방위계 - Google Patents
방위계 Download PDFInfo
- Publication number
- KR100846078B1 KR100846078B1 KR1020037015068A KR20037015068A KR100846078B1 KR 100846078 B1 KR100846078 B1 KR 100846078B1 KR 1020037015068 A KR1020037015068 A KR 1020037015068A KR 20037015068 A KR20037015068 A KR 20037015068A KR 100846078 B1 KR100846078 B1 KR 100846078B1
- Authority
- KR
- South Korea
- Prior art keywords
- magnetic field
- magnetoresistive element
- applying
- magnetoresistive
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C17/00—Compasses; Devices for ascertaining true or magnetic north for navigation or surveying purposes
- G01C17/02—Magnetic compasses
- G01C17/28—Electromagnetic compasses
- G01C17/30—Earth-inductor compasses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Remote Sensing (AREA)
- Radar, Positioning & Navigation (AREA)
- General Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geology (AREA)
- Electromagnetism (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
Abstract
Description
Claims (8)
- 직교하는 2축에 관해서 대칭 형상을 이루도록 권회하되, 서로 대향하는 2개의 변으로 이루어지는 변의 쌍을 2개 가지도록 사각형 형상으로 권회한 사각형 형상의 평면 코일과,상기 평면 코일의 면에 평행하게 배치된 2군의 박막 자기 저항 효과 소자군을 포함하되, 상기 2군의 박막 자기 저항 효과 소자군 중 1군이 상기 평면 코일의 하나의 변의 쌍의 서로 대향하는 변 각각에 2개씩 변에 교차하도록 배치한 자기 저항 효과 소자를 전기적으로 접속하여 MR 브리지를 구성하는 동시에, 상기 2군의 박막 자기 저항 효과 소자군 중 다른 1군이 상기 평면 코일의 다른 하나의 변의 쌍의 서로 대향하는 변 각각에 2개씩 변에 교차하도록 배치한 자기 저항 효과 소자를 전기적으로 접속하여 MR 브리지를 구성하여, 지자기(地磁氣)의 직교 2성분을 검지하여 출력하고, 출력치로부터 방위 정보를 얻도록 구성되며,상기 평면 코일에 소정 방향의 전류를 흘려 상기 자기 저항 효과 소자의 자화가 포화하는 이상의 자계를 인가한 후, 이와는 역방향의 일정한 바이어스 자계를 인가하고, 다음으로 상기 소정 방향과는 역방향으로 자기 저항 효과 소자의 자화가 포화하는 이상의 자계를 인가한 후, 이와는 역방향의 일정한 바이어스 자계를 인가하는 수단과, 상기 바이어스 자계 인가에 맞추어 박막 자기 저항 효과 소자군에 자계 측정 전류를 흘리는 수단을 구비한, 방위계.
- 제 1 항에 있어서,전원 전압을 인가하여 자기 저항 효과 소자의 자화가 포화하는 이상의 자계를 인가하는 경우에, 사전에 해당 전원으로부터의 전류를 분류하여 충전해 둔 콘덴서 전하에 의한 방전 전압을 중첩하여 상기 평면 코일에 전압을 인가하는 회로 구성으로 한, 방위계.
- 제 1 항에 있어서,각 자기 저항 효과 소자의 긴 변 방향과 교차하는 사각형 형상의 평면 코일의 각 변이 이루는 각도 β가, sinβ×cosβ≠0이 되는 것으로, 자기 저항 효과 소자의 인가 자계에 대한 전기 저항치 변화가 극소가 되는 근방의 인가 자계 특성을 이용하는, 방위계.
- 제 3 항에 있어서,상기 사각형 형상의 평면 코일의 변 각각에 2개의 자기 저항 효과 소자가 배치될 때, 동일 변에 배치되는 2개의 자기 저항 효과 소자의 긴 변 방향끼리는 서로 직교하도록 구성된 방위계.
- 제 3 항에 있어서,상기 β가 약 45도, 약 135도, 약 225도 혹은 약 315도 중 어느 하나인, 방위계.
- 제 2 항에 있어서,각 자기 저항 효과 소자에 대해서, 상기 자기 저항 효과 소자 긴 변 방향이 각 변과 교차하는 각도의 격차가 ±5°이내인, 방위계.
- 제 1 항에 있어서,지자기의 직교 2성분을 각각 검지하여 출력하고, 출력치로부터 방위 정보를 얻는 것에 있어서, 양의 방향으로 바이어스를 인가하여 얻은 출력과 음의 방향으로 바이어스를 인가하여 얻은 출력의 차이를 출력하는 회로를 부가한, 방위계.
- 제 1 항에 있어서,상기 평면 코일에 소정 방향의 전류를 흘려 상기 자기 저항 효과 소자의 자화가 포화하는 이상의 자계를 인가한 후, 이와는 역방향의 일정한 바이어스 자계를 인가하여 자계를 측정하여 출력을 얻고, 다음으로 상기 소정 방향과는 역방향으로 자기 저항 효과 소자의 자화가 포화하는 이상의 자계를 인가한 후, 이와는 역방향의 일정한 바이어스 자계를 인가하여 자계를 측정하여 출력을 얻는 것을 2회 이상 행하여, 이들 출력치로부터 방위 정보를 얻는 것으로 한, 방위계.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2001-00153068 | 2001-05-22 | ||
JP2001153068A JP4006674B2 (ja) | 2001-05-22 | 2001-05-22 | 方位計 |
PCT/JP2002/004909 WO2002095330A1 (fr) | 2001-05-22 | 2002-05-21 | Mesureur d'azimut |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040008183A KR20040008183A (ko) | 2004-01-28 |
KR100846078B1 true KR100846078B1 (ko) | 2008-07-14 |
Family
ID=18997645
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020037015068A Expired - Fee Related KR100846078B1 (ko) | 2001-05-22 | 2002-05-21 | 방위계 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6826842B2 (ko) |
EP (1) | EP1394508B1 (ko) |
JP (1) | JP4006674B2 (ko) |
KR (1) | KR100846078B1 (ko) |
CN (1) | CN100367001C (ko) |
CA (1) | CA2447711C (ko) |
WO (1) | WO2002095330A1 (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004279363A (ja) * | 2003-03-19 | 2004-10-07 | Casio Comput Co Ltd | 方位センサ付電子機器及びプログラム |
JP2005114489A (ja) * | 2003-10-06 | 2005-04-28 | Citizen Electronics Co Ltd | 磁気方位検出装置 |
US7436184B2 (en) | 2005-03-15 | 2008-10-14 | Pathfinder Energy Services, Inc. | Well logging apparatus for obtaining azimuthally sensitive formation resistivity measurements |
US7414405B2 (en) | 2005-08-02 | 2008-08-19 | Pathfinder Energy Services, Inc. | Measurement tool for obtaining tool face on a rotating drill collar |
JP4302089B2 (ja) * | 2005-10-19 | 2009-07-22 | 三菱重工業株式会社 | クランクケース一体型シリンダブロック |
JP4904052B2 (ja) * | 2005-12-27 | 2012-03-28 | アルプス電気株式会社 | 磁気方位検出装置 |
JP4632142B2 (ja) * | 2006-05-17 | 2011-02-16 | 日立金属株式会社 | 2軸磁界センサ |
JP2008192645A (ja) * | 2007-01-31 | 2008-08-21 | Tdk Corp | 薄膜磁気デバイスおよびその製造方法 |
KR100887952B1 (ko) * | 2007-07-10 | 2009-03-11 | (주)애니캐스팅 | 이동통신 단말기용 슬라이드 장치 |
US7558675B2 (en) | 2007-07-25 | 2009-07-07 | Smith International, Inc. | Probablistic imaging with azimuthally sensitive MWD/LWD sensors |
US8600115B2 (en) | 2010-06-10 | 2013-12-03 | Schlumberger Technology Corporation | Borehole image reconstruction using inversion and tool spatial sensitivity functions |
US9658360B2 (en) | 2010-12-03 | 2017-05-23 | Schlumberger Technology Corporation | High resolution LWD imaging |
IT1403409B1 (it) * | 2010-12-20 | 2013-10-17 | St Microelectronics Srl | Circuito di polarizzazione per un sensore di campo magnetico, e relativo metodo di polarizzazione |
IT1403433B1 (it) | 2010-12-27 | 2013-10-17 | St Microelectronics Srl | Sensore magnetoresistivo con capacita' parassita ridotta, e metodo |
IT1403434B1 (it) * | 2010-12-27 | 2013-10-17 | St Microelectronics Srl | Sensore di campo magnetico avente elementi magnetoresistivi anisotropi, con disposizione perfezionata di relativi elementi di magnetizzazione |
JP2012173206A (ja) | 2011-02-23 | 2012-09-10 | Yamanashi Nippon Denki Kk | 磁気センサ及びその製造方法 |
DE102011080050B4 (de) * | 2011-07-28 | 2014-10-23 | Horst Siedle Gmbh & Co. Kg | Elektrische Schaltung, insbesondere für einen Umdrehungszähler |
US9372242B2 (en) * | 2012-05-11 | 2016-06-21 | Memsic, Inc. | Magnetometer with angled set/reset coil |
US11294003B2 (en) | 2016-03-23 | 2022-04-05 | Analog Devices International Unlimited Company | Magnetic field detector |
DE102017129346A1 (de) * | 2016-12-13 | 2018-06-14 | Infineon Technologies Ag | Magnetsensorschaltungen und -systeme und Verfahren zum Bilden von Magnetsensorschaltungen |
WO2018173590A1 (ja) * | 2017-03-23 | 2018-09-27 | 日本電産株式会社 | 磁気センサユニット及びそれを用いた磁界方向検出方法 |
US10739165B2 (en) | 2017-07-05 | 2020-08-11 | Analog Devices Global | Magnetic field sensor |
CN107631722B (zh) * | 2017-09-08 | 2021-01-08 | 维沃移动通信有限公司 | 一种电子罗盘的校准方法和移动终端 |
CN109061528B (zh) * | 2018-08-02 | 2020-08-18 | 华中科技大学 | 一种基于巨磁阻抗效应的三轴平面化磁传感器 |
JP7024811B2 (ja) * | 2019-12-11 | 2022-02-24 | Tdk株式会社 | 磁場検出装置および電流検出装置 |
Citations (1)
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JPH06174471A (ja) * | 1992-12-10 | 1994-06-24 | Casio Comput Co Ltd | 電子式方位計 |
Family Cites Families (19)
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CA1126818A (en) * | 1978-03-27 | 1982-06-29 | Hiroyuki Ohkubo | Apparatus for sensing an external magnetic field |
IT1211140B (it) * | 1980-12-09 | 1989-09-29 | Sony Corp | Dispositivo commutatore a sensore magnetico. |
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JP3316689B2 (ja) * | 1992-03-03 | 2002-08-19 | カシオ計算機株式会社 | 電子式方位計 |
JPH05322575A (ja) * | 1992-05-18 | 1993-12-07 | Casio Comput Co Ltd | 電子式方位計 |
US5435070A (en) * | 1993-07-26 | 1995-07-25 | Honeywell Inc. | Simplified compass with multiple segment display capability |
US5831431A (en) * | 1994-01-31 | 1998-11-03 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Miniaturized coil arrangement made by planar technology, for the detection of ferromagnetic materials |
JP2655106B2 (ja) * | 1994-12-07 | 1997-09-17 | 日本電気株式会社 | 磁気抵抗センサ |
JPH08201061A (ja) * | 1995-01-31 | 1996-08-09 | Shimadzu Corp | 薄膜磁気センサ |
JPH08233576A (ja) * | 1995-02-28 | 1996-09-13 | Sony Corp | 磁気センサ |
JP3277752B2 (ja) * | 1995-05-10 | 2002-04-22 | 松下電器産業株式会社 | 方位センサ |
JPH09311167A (ja) * | 1996-05-22 | 1997-12-02 | Sumitomo Metal Mining Co Ltd | 磁気・磁気方位センサ及び磁気・磁気方位測定方法 |
US6166539A (en) * | 1996-10-30 | 2000-12-26 | Regents Of The University Of Minnesota | Magnetoresistance sensor having minimal hysteresis problems |
EP0855599A3 (de) * | 1997-01-24 | 2001-05-02 | Siemens Aktiengesellschaft | Elektronischer Kompass |
EP1052519B1 (fr) * | 1999-05-12 | 2005-06-01 | Asulab S.A. | Capteur magnétique réalisé sur un substrat semiconducteur |
DE69925573T2 (de) * | 1999-05-12 | 2006-04-27 | Asulab S.A. | Magnetischer F?hler hergestellt auf einem halbleitenden Substrat |
JP3573100B2 (ja) * | 2001-02-06 | 2004-10-06 | 日立金属株式会社 | 方位計及び方位の測定方法 |
-
2001
- 2001-05-22 JP JP2001153068A patent/JP4006674B2/ja not_active Expired - Fee Related
-
2002
- 2002-05-21 CA CA002447711A patent/CA2447711C/en not_active Expired - Fee Related
- 2002-05-21 CN CNB028090357A patent/CN100367001C/zh not_active Expired - Fee Related
- 2002-05-21 WO PCT/JP2002/004909 patent/WO2002095330A1/ja active Application Filing
- 2002-05-21 EP EP02726449A patent/EP1394508B1/en not_active Expired - Lifetime
- 2002-05-21 KR KR1020037015068A patent/KR100846078B1/ko not_active Expired - Fee Related
- 2002-05-21 US US10/474,131 patent/US6826842B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06174471A (ja) * | 1992-12-10 | 1994-06-24 | Casio Comput Co Ltd | 電子式方位計 |
Also Published As
Publication number | Publication date |
---|---|
EP1394508B1 (en) | 2011-09-14 |
CA2447711A1 (en) | 2002-11-28 |
JP4006674B2 (ja) | 2007-11-14 |
CN1531642A (zh) | 2004-09-22 |
US20040111906A1 (en) | 2004-06-17 |
KR20040008183A (ko) | 2004-01-28 |
US6826842B2 (en) | 2004-12-07 |
CA2447711C (en) | 2009-04-28 |
EP1394508A4 (en) | 2008-09-10 |
WO2002095330A1 (fr) | 2002-11-28 |
EP1394508A1 (en) | 2004-03-03 |
JP2002350136A (ja) | 2002-12-04 |
CN100367001C (zh) | 2008-02-06 |
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