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KR100833477B1 - 소형 석영칩 공진파라미터 자동 선택 분리장치 - Google Patents

소형 석영칩 공진파라미터 자동 선택 분리장치 Download PDF

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Publication number
KR100833477B1
KR100833477B1 KR1020070010938A KR20070010938A KR100833477B1 KR 100833477 B1 KR100833477 B1 KR 100833477B1 KR 1020070010938 A KR1020070010938 A KR 1020070010938A KR 20070010938 A KR20070010938 A KR 20070010938A KR 100833477 B1 KR100833477 B1 KR 100833477B1
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KR
South Korea
Prior art keywords
chip
suction head
track
quartz chip
webcam
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020070010938A
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English (en)
Korean (ko)
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KR20080011030A (ko
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상리
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상리
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Publication of KR20080011030A publication Critical patent/KR20080011030A/ko
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Publication of KR100833477B1 publication Critical patent/KR100833477B1/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02—Analysing fluids
    • G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/14—Picture signal circuitry for video frequency region
    • H04N5/21—Circuitry for suppressing or minimising disturbance, e.g. moiré or halo

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Sorting Of Articles (AREA)
KR1020070010938A 2006-07-28 2007-02-02 소형 석영칩 공진파라미터 자동 선택 분리장치 Expired - Fee Related KR100833477B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN200620122879.8 2006-07-28
CNU2006201228798U CN200939436Y (zh) 2006-07-28 2006-07-28 小型石英晶片谐振参数自动选分装置

Publications (2)

Publication Number Publication Date
KR20080011030A KR20080011030A (ko) 2008-01-31
KR100833477B1 true KR100833477B1 (ko) 2008-05-29

Family

ID=38745626

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070010938A Expired - Fee Related KR100833477B1 (ko) 2006-07-28 2007-02-02 소형 석영칩 공진파라미터 자동 선택 분리장치

Country Status (2)

Country Link
KR (1) KR100833477B1 (zh)
CN (1) CN200939436Y (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102500554A (zh) * 2011-10-12 2012-06-20 浙江大学台州研究院 一种晶片全自动目检机
CN110002176B (zh) * 2018-12-17 2023-12-22 浙江大学台州研究院 一种石英晶片的散播式送料装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05341491A (ja) * 1992-06-04 1993-12-24 Asahi Optical Co Ltd マスクフィルムの欠陥検査及び修正装置
KR20020085266A (ko) * 2001-05-07 2002-11-16 삼성전자 주식회사 전지 검사장치
KR20030010442A (ko) * 2001-07-25 2003-02-05 가부시키가이샤 휴모 라보라토리 극박 수정편 측정 분류장치

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05341491A (ja) * 1992-06-04 1993-12-24 Asahi Optical Co Ltd マスクフィルムの欠陥検査及び修正装置
KR20020085266A (ko) * 2001-05-07 2002-11-16 삼성전자 주식회사 전지 검사장치
KR20030010442A (ko) * 2001-07-25 2003-02-05 가부시키가이샤 휴모 라보라토리 극박 수정편 측정 분류장치

Also Published As

Publication number Publication date
JP3133507U (ja) 2007-07-12
CN200939436Y (zh) 2007-08-29
KR20080011030A (ko) 2008-01-31

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