KR100313512B1 - 파워 온 검출회로 - Google Patents
파워 온 검출회로 Download PDFInfo
- Publication number
- KR100313512B1 KR100313512B1 KR1019990015459A KR19990015459A KR100313512B1 KR 100313512 B1 KR100313512 B1 KR 100313512B1 KR 1019990015459 A KR1019990015459 A KR 1019990015459A KR 19990015459 A KR19990015459 A KR 19990015459A KR 100313512 B1 KR100313512 B1 KR 100313512B1
- Authority
- KR
- South Korea
- Prior art keywords
- power
- power supply
- supply voltage
- mos transistors
- detection signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 claims abstract description 40
- 239000003990 capacitor Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 3
- 230000000630 rising effect Effects 0.000 abstract description 7
- 230000007423 decrease Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 6
- 239000008280 blood Substances 0.000 description 1
- 210000004369 blood Anatomy 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electronic Switches (AREA)
Abstract
Description
Claims (2)
- 제1,제2 피-모스 트랜지스터의 소오스를 공통으로 전원전압(Vdd)에 연결하고, 상기 제1,제2 피-모스 트랜지스터의 게이트를 공통으로 상기 제1피-모스 트랜지스터의 드레인에 연결하며, 상기 제1 피-모스 트랜지스터의 드레인과 순차적으로 게이트와 드레인이 각기 연결된 복수개의 피-모스 트랜지스터를 직렬로 연결하고, 상기 복수개의 피-모스 트랜지스터 중 최하단 피-모스 트랜지스터의 드레인을 접지 및 커패시터의 일측에 공통으로 연결하며, 상기 커패시터의 타측을 상기 제2 피-모스 트랜지스터의 드레인과 공통으로 짝수개의 인버터 체인(Chain)으로 구성된 지연부에 연결하여 구성된 것을 특징으로 하는 파워 온 검출회로.
- 제1항에 있어서, 상기 복수개의 피-모스 트랜지스터의 기판 바이어스는 각각의 소오스와 연결하여 구성된 것을 특징으로 하는 파워 온 검출회로.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019990015459A KR100313512B1 (ko) | 1999-04-29 | 1999-04-29 | 파워 온 검출회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019990015459A KR100313512B1 (ko) | 1999-04-29 | 1999-04-29 | 파워 온 검출회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000067552A KR20000067552A (ko) | 2000-11-25 |
KR100313512B1 true KR100313512B1 (ko) | 2001-11-17 |
Family
ID=19582951
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019990015459A Expired - Fee Related KR100313512B1 (ko) | 1999-04-29 | 1999-04-29 | 파워 온 검출회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100313512B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10469074B2 (en) | 2017-05-19 | 2019-11-05 | Samsung Electronics Co., Ltd. | Power on/off reset circuit and reset signal generating circuit including the same |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100630977B1 (ko) * | 2000-02-18 | 2006-10-04 | 매그나칩 반도체 유한회사 | 파워온 리셋 회로 |
KR101535267B1 (ko) * | 2008-12-01 | 2015-07-09 | 삼성전자주식회사 | 파워-온 검출기, 파워-온 검출기의 동작 방법, 그리고 파워-온 검출기를 포함하는 메모리 장치 |
-
1999
- 1999-04-29 KR KR1019990015459A patent/KR100313512B1/ko not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10469074B2 (en) | 2017-05-19 | 2019-11-05 | Samsung Electronics Co., Ltd. | Power on/off reset circuit and reset signal generating circuit including the same |
Also Published As
Publication number | Publication date |
---|---|
KR20000067552A (ko) | 2000-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19990429 |
|
PA0201 | Request for examination | ||
PG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20010119 Patent event code: PE09021S01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20010927 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20011022 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20011023 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PR1001 | Payment of annual fee |
Payment date: 20040920 Start annual number: 4 End annual number: 4 |
|
FPAY | Annual fee payment |
Payment date: 20050923 Year of fee payment: 5 |
|
PR1001 | Payment of annual fee |
Payment date: 20050923 Start annual number: 5 End annual number: 5 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |