KR0145641B1 - 반도체 집적 회로 장치 - Google Patents
반도체 집적 회로 장치Info
- Publication number
- KR0145641B1 KR0145641B1 KR1019940036868A KR19940036868A KR0145641B1 KR 0145641 B1 KR0145641 B1 KR 0145641B1 KR 1019940036868 A KR1019940036868 A KR 1019940036868A KR 19940036868 A KR19940036868 A KR 19940036868A KR 0145641 B1 KR0145641 B1 KR 0145641B1
- Authority
- KR
- South Korea
- Prior art keywords
- carrier board
- electrodes
- integrated circuit
- semiconductor
- circuit device
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/49105—Connecting at different heights
- H01L2224/49109—Connecting at different heights outside the semiconductor or solid-state body
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15153—Shape the die mounting substrate comprising a recess for hosting the device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/15165—Monolayer substrate
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15312—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (11)
- 반도체 집적 회로 장치에 있어서, 내부에 복수개의 반도체 소자와 상기 반도체 소자에 접속된 복수개의 본딩패드를 구비하는 하나 이상의 IC 칩과, 복수개의 상부 전극을 장착하는 상부면과, 복수개의 하부 전극을 장착하는 하부 면과, 내부에 형성되어 각 상기 상부 전극을 대응되는 하나의 상기 하부 전극에 접속하는 제1 배선을 구비하는 캐리어 보드와, 복수개의 내부 전극을 장착하는 내부 표면과, 복수개의 외부 전극을 장착하는 외부 표면과, 각 상기 내부 전극을 대응되는 하나의 상기 외부 전극에 접속하는 제2 배선을 구비하는 패키지 용기를 포함하고, 상기 상부 전극의 적어도 한부분을 대응되는 하나의 본딩패드에 본딩 와이어로 접속시키고, 상기 반도체 칩을 상기 상부면에 고정시키며, 각 상기 하부 전극을 대응되는 하나의 상기 내부 전극에 접착을 하여 상기 캐리어 보드를 상기 패키지 용기에 고정시키는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 하부전극을 상기 캐리어 보드의 하부 면상에 행렬로 배열시키는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제2항에 있어서, 상기 상부전극을 상기 상부면상이 하나 이상의 로우에 배열시키는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 본딩 와이어는 금속 세선인 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 캐리어 보드는 적층된 복수개의 수지층을 포함하는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 캐리어 보드는 적층된 복수개의 세라믹층을 포함하는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 패키지 용기와 함께 상기 IC 칩 및 상기 캐리어 보드를 봉하는 캡을 추가로 포함하는 것을 특징으로 하는 반도체 회로 장치.
- 제1항에 있어서, 상기 각 하부전극의 본딩은 납땜에 의해서 이루어지는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 하나 이상의 반도체 칩은 복수개의 반도체 칩을 포함하는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 각 하부 전극의 본딩은 도전성 수지에 의해서 이루어지는 것을 특징으로 하는 반도체 집적 회로 장치.
- 제1항에 있어서, 상기 IC 칩은 상기 캐리어 보드의 상부면에 다이 본딩되는 것을 특징으로 하는 반도체 집적 회로 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33215893A JPH07193164A (ja) | 1993-12-27 | 1993-12-27 | 半導体集積回路装置 |
JP93-332158 | 1993-12-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950021298A KR950021298A (ko) | 1995-07-26 |
KR0145641B1 true KR0145641B1 (ko) | 1998-11-02 |
Family
ID=18251805
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940036868A KR0145641B1 (ko) | 1993-12-27 | 1994-12-26 | 반도체 집적 회로 장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5506448A (ko) |
JP (1) | JPH07193164A (ko) |
KR (1) | KR0145641B1 (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5744752A (en) * | 1995-06-05 | 1998-04-28 | International Business Machines Corporation | Hermetic thin film metallized sealband for SCM and MCM-D modules |
US5739584A (en) * | 1995-06-07 | 1998-04-14 | Lsi Logic Corporation | Multiple pin die package |
CN1094717C (zh) * | 1995-11-16 | 2002-11-20 | 松下电器产业株式会社 | 印刷电路板的安装体 |
US6433411B1 (en) * | 2000-05-22 | 2002-08-13 | Agere Systems Guardian Corp. | Packaging micromechanical devices |
JP2002204053A (ja) * | 2001-01-04 | 2002-07-19 | Mitsubishi Electric Corp | 回路実装方法、回路実装基板及び半導体装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4417392A (en) * | 1980-05-15 | 1983-11-29 | Cts Corporation | Process of making multi-layer ceramic package |
JPH0756887B2 (ja) * | 1988-04-04 | 1995-06-14 | 株式会社日立製作所 | 半導体パッケージ及びそれを用いたコンピュータ |
JP2772001B2 (ja) * | 1988-11-28 | 1998-07-02 | 株式会社日立製作所 | 半導体装置 |
JPH02165675A (ja) * | 1988-12-20 | 1990-06-26 | Konica Corp | イメージセンサー |
JP3055960B2 (ja) * | 1991-04-15 | 2000-06-26 | 株式会社日立製作所 | 半導体装置の製造方法 |
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1993
- 1993-12-27 JP JP33215893A patent/JPH07193164A/ja active Pending
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1994
- 1994-12-22 US US08/361,970 patent/US5506448A/en not_active Expired - Fee Related
- 1994-12-26 KR KR1019940036868A patent/KR0145641B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US5506448A (en) | 1996-04-09 |
KR950021298A (ko) | 1995-07-26 |
JPH07193164A (ja) | 1995-07-28 |
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