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JPS6461019A - Manufacture of compound semiconductor device - Google Patents

Manufacture of compound semiconductor device

Info

Publication number
JPS6461019A
JPS6461019A JP21942787A JP21942787A JPS6461019A JP S6461019 A JPS6461019 A JP S6461019A JP 21942787 A JP21942787 A JP 21942787A JP 21942787 A JP21942787 A JP 21942787A JP S6461019 A JPS6461019 A JP S6461019A
Authority
JP
Japan
Prior art keywords
film
gaas
electrode
breakdown
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21942787A
Other languages
Japanese (ja)
Inventor
Sakae Hojo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP21942787A priority Critical patent/JPS6461019A/en
Publication of JPS6461019A publication Critical patent/JPS6461019A/en
Pending legal-status Critical Current

Links

Landscapes

  • Formation Of Insulating Films (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To reduce the stress concentration of a GaAs surface and to eliminate the breakdown of a GaAs crystal by forming a protective film formed on the upper face of a gate electrode of a silicon nitride film and a film made of a material having larger thermal expansion coefficient than that of gallium arsenide. CONSTITUTION:A GaAs operating layer 3 is formed on the surface of a GaAs substrate 5. Tungsten is so deposited on the substrate 5 as to cover the film 3. A Schottky gate electrode 1 is formed by patterning. With the electrode 1 as a mask n<+> type layers 4a, 4b are formed. Then, a source electrode 2a and a drain electrode 2b are formed. Thereafter, it is covered with an SiN film 6a by a sputtering method as a first layer insulating film. Further, it is covered with a TiSi film 6b by a sputtering method as a second layer insulating film. A second layer metal film 7 is formed on the electrodes 1, 2a, 2b. Then, a stress on the GaAs surface under the edge of the electrode 1 is reduced, and the breakdown of the GaAs crystal does not occur.
JP21942787A 1987-09-01 1987-09-01 Manufacture of compound semiconductor device Pending JPS6461019A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21942787A JPS6461019A (en) 1987-09-01 1987-09-01 Manufacture of compound semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21942787A JPS6461019A (en) 1987-09-01 1987-09-01 Manufacture of compound semiconductor device

Publications (1)

Publication Number Publication Date
JPS6461019A true JPS6461019A (en) 1989-03-08

Family

ID=16735225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21942787A Pending JPS6461019A (en) 1987-09-01 1987-09-01 Manufacture of compound semiconductor device

Country Status (1)

Country Link
JP (1) JPS6461019A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9789991B2 (en) 2013-08-28 2017-10-17 Avery Dennison Corporation Reactor plate assembly and brush anvil for use in conjunction therewith
US9792839B2 (en) 2010-12-23 2017-10-17 Avery Dennison Corporation Wide filament fastener and stock

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6257255A (en) * 1985-09-06 1987-03-12 Agency Of Ind Science & Technol Manufacture of compound semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6257255A (en) * 1985-09-06 1987-03-12 Agency Of Ind Science & Technol Manufacture of compound semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9792839B2 (en) 2010-12-23 2017-10-17 Avery Dennison Corporation Wide filament fastener and stock
US9789991B2 (en) 2013-08-28 2017-10-17 Avery Dennison Corporation Reactor plate assembly and brush anvil for use in conjunction therewith

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