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JPS6459327A - Active device - Google Patents

Active device

Info

Publication number
JPS6459327A
JPS6459327A JP62217667A JP21766787A JPS6459327A JP S6459327 A JPS6459327 A JP S6459327A JP 62217667 A JP62217667 A JP 62217667A JP 21766787 A JP21766787 A JP 21766787A JP S6459327 A JPS6459327 A JP S6459327A
Authority
JP
Japan
Prior art keywords
material layer
ferroelectric material
electrodes
electrode
inverted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62217667A
Other languages
Japanese (ja)
Other versions
JP2715415B2 (en
Inventor
Takashi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP62217667A priority Critical patent/JP2715415B2/en
Publication of JPS6459327A publication Critical patent/JPS6459327A/en
Application granted granted Critical
Publication of JP2715415B2 publication Critical patent/JP2715415B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Liquid Crystal (AREA)

Abstract

PURPOSE:To prevent crosstalk and to obtain a sharp image having a high contrast by providing a ferroelectric material layer formed between a 1st and 2nd electrodes and specifying the distance between the 1st electrode and the 2nd electrode to >=2 kinds. CONSTITUTION:The 2nd electrode 15 is provided on a substrate 12; the ferroelectric material layer 14 is formed on the 2nd electrode 15 and the 1st electrode 13 is provided on the ferroelectric material layer 14. The film thickness dF of the ferroelectric material layer 14 is shorter than the parallel spacings (x)-(z) between the 1st and 2nd electrodes 13, 15 and the insulating substrate 12. Setting of voltage in such a manner that the polarization is inverted in the direction dF of the short distance between the 1st and 2nd electrodes 13 and 15 and is not inverted in the directions (x)-(z) is, therefore possible at the time of inverting the spontaneous polarization of the ferroelectric material layer 14 held between the two electrodes 13 and 15 by impressing the voltage between the 1st and 2nd electrodes 13 and 15. Only the beta region acts as the active layer of the active device if the dF, (x)-(z) voltages are set in such a manner. Since the spontaneous polarization of the ferroelectric material layer in the (x)-(z) directions is not inverted, the generation of the crosstalk is prevented and the high-grade display is obtd.
JP62217667A 1987-08-31 1987-08-31 Active device Expired - Lifetime JP2715415B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62217667A JP2715415B2 (en) 1987-08-31 1987-08-31 Active device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62217667A JP2715415B2 (en) 1987-08-31 1987-08-31 Active device

Publications (2)

Publication Number Publication Date
JPS6459327A true JPS6459327A (en) 1989-03-07
JP2715415B2 JP2715415B2 (en) 1998-02-18

Family

ID=16707831

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62217667A Expired - Lifetime JP2715415B2 (en) 1987-08-31 1987-08-31 Active device

Country Status (1)

Country Link
JP (1) JP2715415B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6181403B1 (en) 1992-06-30 2001-01-30 Semiconductor Energy Laboratory Co., Ltd. Electro-optical device
US6693696B1 (en) 1992-06-30 2004-02-17 Semiconductor Energy Laboratory Co., Ltd. Electro-optical device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54155795A (en) * 1978-05-30 1979-12-08 Seiko Instr & Electronics Ltd Electro-optical display unit
JPS62153890A (en) * 1985-12-27 1987-07-08 コニカ株式会社 Element for active matrix

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54155795A (en) * 1978-05-30 1979-12-08 Seiko Instr & Electronics Ltd Electro-optical display unit
JPS62153890A (en) * 1985-12-27 1987-07-08 コニカ株式会社 Element for active matrix

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6181403B1 (en) 1992-06-30 2001-01-30 Semiconductor Energy Laboratory Co., Ltd. Electro-optical device
US6693696B1 (en) 1992-06-30 2004-02-17 Semiconductor Energy Laboratory Co., Ltd. Electro-optical device
US7567320B2 (en) 1992-06-30 2009-07-28 Semiconductor Energy Laboratory Co., Ltd. Electro-optical device with liquid crystal

Also Published As

Publication number Publication date
JP2715415B2 (en) 1998-02-18

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term