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JPS6437870A - Solid-state image sensing device and manufacture thereof - Google Patents

Solid-state image sensing device and manufacture thereof

Info

Publication number
JPS6437870A
JPS6437870A JP62194656A JP19465687A JPS6437870A JP S6437870 A JPS6437870 A JP S6437870A JP 62194656 A JP62194656 A JP 62194656A JP 19465687 A JP19465687 A JP 19465687A JP S6437870 A JPS6437870 A JP S6437870A
Authority
JP
Japan
Prior art keywords
silicon
glass substrate
sensing device
image sensing
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62194656A
Other languages
Japanese (ja)
Inventor
Hideaki Oka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP62194656A priority Critical patent/JPS6437870A/en
Publication of JPS6437870A publication Critical patent/JPS6437870A/en
Pending legal-status Critical Current

Links

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

PURPOSE:To form a high performance FET, a scanning circuit, etc., onto a low cost glass substrate having a low distortion spot through a low temperature process, and to manufacture an image sensing device easily by forming an silicon layer onto the glass substrate for the solid-state image sensing device, changing silicon into a polycrystal through heat treatment and shaping a gate insulating film. CONSTITUTION:An silicon layer 102 is formed onto a glass substrate 101 through a specified method, the silicon layer 102 is thermally treated at approximately 500-700 deg.C and amorphous silicon or microcrystalline silicon is turned into polycrystalline silicon, a polycrystalline silicon layer 102' is formed, and a pattern is formed. A gate electrode 103 is formed through a predetermined method at a low temperature of 650 deg.C or less, a gate electrode 104 is formed, and source-drain regions 105 are shaped through ion implantation, using the electrode 104 as a mask. An inter-layer insulating film 106, a lower transparent electrode 107, a photoconductive layer 108, etc., are formed through a prescribed method in succession. A material having a distortion point of 700 deg.C or less is employed as the glass substrate 101.
JP62194656A 1987-08-04 1987-08-04 Solid-state image sensing device and manufacture thereof Pending JPS6437870A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62194656A JPS6437870A (en) 1987-08-04 1987-08-04 Solid-state image sensing device and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62194656A JPS6437870A (en) 1987-08-04 1987-08-04 Solid-state image sensing device and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS6437870A true JPS6437870A (en) 1989-02-08

Family

ID=16328135

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62194656A Pending JPS6437870A (en) 1987-08-04 1987-08-04 Solid-state image sensing device and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS6437870A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5255279A (en) * 1990-05-09 1993-10-19 Sharp Kabushiki Kaisha Semiconductor laser device, and a method for producing a compound semiconductor device including the semiconductor laser device
EP0589713A2 (en) * 1992-09-25 1994-03-30 Sharp Kabushiki Kaisha A thin film semiconductor device and a method for producing the same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5255279A (en) * 1990-05-09 1993-10-19 Sharp Kabushiki Kaisha Semiconductor laser device, and a method for producing a compound semiconductor device including the semiconductor laser device
US5360762A (en) * 1990-05-09 1994-11-01 Sharp Kabushiki Kaisha Semiconductor laser device, and a method for producing a compound semiconductor device including the semiconductor laser device
EP0589713A2 (en) * 1992-09-25 1994-03-30 Sharp Kabushiki Kaisha A thin film semiconductor device and a method for producing the same
EP0589713A3 (en) * 1992-09-25 1994-09-21 Sharp Kk A thin film semiconductor device and a method for producing the same
US5707746A (en) * 1992-09-25 1998-01-13 Sharp Kabushiki Kaisha Thin film transistor device with advanced characteristics by improved matching between a glass substrate and a silicon nitride layer
US6013310A (en) * 1992-09-25 2000-01-11 Sharp Kabushiki Kaisha Method for producing a thin film semiconductor device

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