JPS6185829A - Transfer resin molding process of semiconductor element - Google Patents
Transfer resin molding process of semiconductor elementInfo
- Publication number
- JPS6185829A JPS6185829A JP20884384A JP20884384A JPS6185829A JP S6185829 A JPS6185829 A JP S6185829A JP 20884384 A JP20884384 A JP 20884384A JP 20884384 A JP20884384 A JP 20884384A JP S6185829 A JPS6185829 A JP S6185829A
- Authority
- JP
- Japan
- Prior art keywords
- cavity
- resin material
- mold
- transfer
- transfer path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/02—Transfer moulding, i.e. transferring the required volume of moulding material by a plunger from a "shot" cavity into a mould cavity
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/26—Moulds
- B29C45/34—Moulds having venting means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
この発明は、リードフレーム上に取付けた半導体素子の
樹脂モールド成形方法の改良に関するものであシ、特に
、半導体素子を1−ヲンヌファモールド金型を用いて樹
脂モールドする成形技術産業の分野において利用される
ものである。Detailed Description of the Invention (Field of Industrial Application) The present invention relates to an improvement in a resin molding method for a semiconductor element mounted on a lead frame. It is used in the field of molding technology industry where resin molding is performed using metal molds.
(従来の技術)
半導体素子のトランスファモールド金型の基本的な構成
例としては、例えば、固定上型と、これに対向配設した
回置・下型と、樹脂材料の供給ポットと、該ポット内の
樹脂材料を63融化させるヒータ及びプランジャーと、
上記両型間に対設した成形用キャビティ部と、該キャビ
ティ内と上記ボットとをi!l!油させるカル部・ラン
ナ部及びゲート部から成る溶融樹脂材料の移送経路等を
配設したものが知られている。 このような従来金型を
用いて′ll:導体素子の樹脂モールド成形を行なう場
合は、リードフレーム上の半導体素子をキャビティ部の
所定位置にセットして両型の型締めを行ない、次に、ポ
ット内に樹脂材料を供給すると共にこれを加熱加圧して
溶融化し、次に、この溶融樹脂材料を移送経路を通して
キャビティ内に加圧注入し、これにより半導体素子を樹
脂モールド成形するものである。(Prior Art) A basic configuration example of a transfer mold mold for a semiconductor device includes, for example, a fixed upper mold, a rotation/lower mold disposed opposite to the fixed upper mold, a resin material supply pot, and the pot. a heater and a plunger for melting the resin material inside;
The molding cavity portion provided oppositely between the molds, and the inside of the cavity and the bot are connected to each other by i! l! It is known to have a transfer path for molten resin material consisting of a cull section for oil, a runner section, and a gate section. When performing resin molding of a conductive element using such a conventional mold, the semiconductor element on the lead frame is set in a predetermined position in the cavity, both molds are clamped, and then, A resin material is supplied into the pot and heated and pressurized to melt it, and then the molten resin material is injected under pressure into the cavity through a transfer path, thereby molding a semiconductor element with the resin.
ところで、上記型線後の金型におけるポット・移送経路
及びキャビティ部には空気が残溜しており、この残溜空
気がキャビティ内において溶融樹脂材料中に混入した場
合は、その成形樹脂体の内部或は外表面にボイド(気泡
)或はピンホール若しくは欠損部を形成して、これが半
導体成形品の耐水(湿)性及び信頼性を低下させると共
にその外観を損う等の弊害を生ずるものである0、 と
こ作
ろが、従来の上記残溜空気の排出用は、キャビテへ
イ側へ加圧移送する溶融樹脂材料の流れをfll用する
ものであるため、プランツヤ−による樹脂材料の加圧力
を必要以上に高めたり、樹脂材料の使用量を所要量以上
に用いなければならないといった間Iがあると共に、溶
融樹脂材料の加圧移送時に移送経路内の残溜空気が該樹
脂材料中に巻き込まれてこれがキャビティ内に注入され
るのを確実に防止することができないといった問題があ
り、従って、金型の全体的な耐久性を低下させると共に
、樹脂材料の有効利用率を低下させ、更には、高品質の
半導体成形品を確実に成形することができない等の欠点
を有するものであった。By the way, air remains in the pot, transfer path, and cavity of the mold after the mold line, and if this residual air gets mixed into the molten resin material in the cavity, the molded resin body will be damaged. Items that form voids (bubbles), pinholes, or missing parts on the internal or external surface, which cause adverse effects such as lowering the water resistance (moisture) and reliability of semiconductor molded products and impairing their appearance. However, in the conventional method for discharging the residual air, the flow of the molten resin material transferred under pressure to the cavity side is fully used, so the pressurizing force of the resin material by the planter is In addition to increasing the amount of resin material more than necessary or using more resin material than necessary, residual air in the transfer path may become entangled in the resin material when the molten resin material is transferred under pressure. There is a problem that it is not possible to reliably prevent this from being injected into the cavity, which reduces the overall durability of the mold, reduces the effective utilization rate of the resin material, and furthermore However, this method has drawbacks such as inability to reliably mold high-quality semiconductor molded products.
(発明が解決しようとする問題点)
本発明は、トランスファモールド金型における溶融四指
材料の移送経路とキャビティ内に残溜する空気を効率良
く外部に排出して、該残溜空気が溶融樹脂材料中に混入
するのを確実に防止することKよって、上記残溜空気の
混入に起因する上述したような従来の問題点を解消する
ことを目的とするものである。(Problems to be Solved by the Invention) The present invention efficiently exhausts the air remaining in the transfer path of the molten four-fingered material and the cavity in the transfer mold mold to the outside, so that the remaining air is removed from the molten resin. The object of this invention is to reliably prevent the residual air from being mixed into the material, thereby solving the above-mentioned conventional problems caused by the mixing of the residual air.
また、本発明は、使用する樹脂材料の有効利用率の向上
と、使用する金型の全体的な酌久性の向上をも図ること
を目的とするものである。Further, the present invention aims to improve the effective utilization rate of the resin material used and the overall durability of the mold used.
(問題点を解決するための手段)
本発明に係る半導体素子のトランスファ樹脂モールド成
形方法は、対向配設し九両型のキャビティ部に半導体素
子を取付けたリードフレームをセットして該両型の型合
せをするトランスファモールド金型の製経工程を行ない
、次に、金型ボット内への樹脂材料供給工程を行ない、
次に、該ポット内の樹脂材料を加熱・加圧して溶融化す
る樹脂材料の溶融化工程を行ない、次に、ポ/)内の溶
r、J樹脂材料を金型のカル部・ランナ部・ゲート部か
ら成る移送経路を通して成形キャビティ内に加圧注入す
る溶融樹脂材料の加圧移送工程を行なうと共に、この加
圧移送工程と同時に、上記移送経路におけるランナ部か
ら該経路中の残溜空気を、外部に吸引排除する移送経路
内のバキューム工程及び上記キャビティに連通させたエ
アベントから該キャビティ内の残溜空気を外部に吸引排
除するキャビティ内のバキューム工程を行ない、次に、
上記移送経路の経路終端部側を閉じて溶融樹脂材料上記
移送経路を開放すると共に両型を型開きして半導体樹脂
モールド成形品を外部へ取出す型開工程を行なうことを
特徴とするものである。(Means for Solving the Problems) A transfer resin molding method for a semiconductor element according to the present invention involves setting a lead frame on which a semiconductor element is mounted in a cavity of a nine-car type, which are arranged facing each other. Perform the warping process of the transfer mold mold for mold matching, then perform the resin material supply process into the mold bot,
Next, a resin material melting process is performed in which the resin material in the pot is heated and pressurized to melt it, and then the melted resin material in the pot is transferred to the cull part and runner part of the mold.・A pressurized transfer process is carried out to inject the molten resin material into the molding cavity through the transfer path consisting of the gate section, and at the same time, the residual air in the transfer path is removed from the runner section in the transfer path. A vacuum process is performed in the transfer path to suck and remove the air to the outside, and a vacuum process is performed in the cavity to suck and remove the remaining air in the cavity to the outside from an air vent communicated with the cavity, and then,
The present invention is characterized in that a mold opening step is performed in which the terminal end of the transfer path is closed to open the molten resin material transfer path, and both molds are opened to take out the semiconductor resin molded product to the outside. .
(作 用)
従って、本発明方法においては、移送経路とキャビティ
内に残溜する空気の排除が効率良く、且つ、確実に行な
われるので、キャビティ情1に加、■移送される溶融樹
脂材料中に上記Q溜空気が混入することがないのである
。(Function) Therefore, in the method of the present invention, since the air remaining in the transfer path and the cavity is efficiently and reliably removed, in addition to the cavity condition 1, the molten resin material being transferred is This prevents the above-mentioned Q accumulated air from being mixed in.
また、上記移送経路の経路終端部側の8閉工程により、
溶融樹脂材料の外部流出作用が防止されることから、該
経路のゲート部を通してキャビティ内に加圧注入される
浴@樹脂材魁の加圧注入作用が、夫々均等な条件下で行
なわれることになるものである。In addition, due to the 8 closing process on the route end side of the transfer route,
Since the flow of the molten resin material to the outside is prevented, the pressurized injection of the bath @resin material into the cavity through the gate part of the path is performed under equal conditions. It is what it is.
(実 施 例) 次に、本発明方法を実施例図に基づいて説明する。(Example) Next, the method of the present invention will be explained based on examples.
第1図及び第2図は、本発明方法を使用する場合に用い
られるトランスファモールド金型の要部を示しており、
該金型は、固定上型1と、該上型lに対向配設した可動
下型2と、上型1側に配設した樹脂材料3の供給用lノ
ド4と、該ボット4に嵌合させた樹脂材料加圧用グラン
ジャー5と上下両型l・2間に対設した成形用キャビテ
ィ6・・・6と、上記下型2のパーティングラインP−
L面に配設した上記キャビティ6・・・6とボット4と
を連通させるカル部71 ・ランナ部7□及びゲート部
7.から成る溶融樹脂材料の移送経路7と、ボット4内
の樹脂材料加熱用のヒータ及びキャビティ6・・・6と
移送経路7内にて成形される樹脂成形体のエジェクター
機構(図示なし)等から構成されている。FIGS. 1 and 2 show the main parts of a transfer mold mold used when using the method of the present invention,
The mold consists of a fixed upper mold 1, a movable lower mold 2 arranged opposite to the upper mold 1, a nozzle 4 for supplying resin material 3 arranged on the upper mold 1 side, and a mold fitted into the bot 4. The grunger 5 for pressurizing the combined resin material, the molding cavities 6...6 provided oppositely between the upper and lower molds 1 and 2, and the parting line P- of the lower mold 2.
A cull portion 71 that communicates the cavities 6...6 disposed on the L surface with the bot 4, a runner portion 7□, and a gate portion 7. a transfer path 7 for the molten resin material, a heater for heating the resin material in the bot 4, a cavity 6...6, an ejector mechanism (not shown) for the resin molded body molded in the transfer path 7, etc. It is configured.
また、上記移送経路7の経路終端部74には、真空源(
図示なし)側と連結させた吸気(バキーーム用)経路8
が連通開口されると共に、該吸気経路の連通開口8、よ
りもボット4側となる経路終端部7.(ランナ部7 )
には、該ボット4備1と吸気経路の連通開口部81 と
を連通又は遅閉するヌトンバ一様構9が配設されており
、該ヌトノパ一様構は、溶融樹脂材料のストッパー9□
と、該ストッパーを経路終端部7.ン(対して進退させ
る油(空)圧装置92とから構成されている。Further, a vacuum source (
Intake (for Bakeem) route 8 connected to the (not shown) side
is opened for communication, and the end portion 7 of the intake path is located closer to the bot 4 than the communication opening 8 of the intake path. (Runner section 7)
is provided with a nutonba uniform structure 9 that communicates or closes the intake passage communication opening 81 slowly.
and the stopper at the end of the path 7. (a hydraulic (pneumatic) device 92 that moves the engine forward and backward relative to the engine).
更に、キャビティ6・・・6部には、第2図に示すよう
に、該キャピテイ6と真空源(図示なし)側とを連結さ
せたエアベント(吸気経路)loが連通開口されると共
に、該エアベン)10の連通開口部10.よシも上記真
空源側となる位置には、該キャビティ6と該真空源側と
を連通又は遮閉させるヌトンパー機構11が配設されて
おシ、該ヌトノバー機構は、溶融樹脂材料のストッパー
11゜と、該ストッパーをエアベント10に対して進退
させる油(空)圧装置(図示なし)とから構成されてい
る。Furthermore, as shown in FIG. 2, an air vent (intake path) lo connecting the cavity 6 and a vacuum source (not shown) is opened in the cavity 6... air vent) 10 communication opening 10. Also, at a position on the vacuum source side, there is provided a nutoper mechanism 11 for communicating or closing the cavity 6 and the vacuum source side. and a hydraulic (pneumatic) device (not shown) that moves the stopper forward and backward with respect to the air vent 10.
なお、図中符号は、両型1・2のパーティングパ
ラインP−Lに配設されたシール部材を示すものである
。Note that the reference numerals in the drawings indicate sealing members disposed on the parting line P-L of both dies 1 and 2.
上記した金型を用いて半導体素子の樹脂モールド成形を
行なう場合は、まず、キャビティ6・・・6部の所定位
置に半導体素子を取付けたリードフレームをセットして
型締めを行ない、次に、ボット4内に樹脂材料3を供給
し、次K、該材料3をヒータにて所要温度にまで加熱す
ると共に、第3図に示すよ5に、プランジャー5により
加圧して溶融化し、次に、1ランジヤー5を更に降下さ
せて溶融樹脂材料3□をキャビティ6・・・6g!Iへ
加圧移送する。また、上記材料31の加圧移送と同時K
、真空源を作動させて、移送経路7とキャビティ6・・
・6内の残溜空気を、吸気経路8とエアベン)10を通
して夫々外部へ強制的に吸引排除して該移送経路7とキ
ャビティ6・・・6内を真空状態とする。When performing resin molding of a semiconductor element using the above-mentioned mold, first, a lead frame with a semiconductor element attached thereto is set in a predetermined position in the cavity 6...6, and the mold is clamped. A resin material 3 is supplied into the bot 4, and then the material 3 is heated to a required temperature with a heater and melted by applying pressure with a plunger 5 as shown in FIG. , 1 langeer 5 is further lowered and molten resin material 3□ is poured into cavity 6...6g! Transfer to I under pressure. In addition, at the same time as pressurized transfer of the material 31,
, activate the vacuum source to remove the transfer path 7 and the cavity 6...
- The remaining air in the transfer path 7 and the cavities 6 . . . 6 are forcibly sucked and removed to the outside through the intake path 8 and the air vent 10, respectively, to create a vacuum state in the transfer path 7 and the cavities 6...6.
次に、ストッパ一様Li4の油(空)圧装置aff(9
g)t−i動じて、そのストッパー9.・t l、によ
り上記吸気経路8及びエアベン)10の連館開口部81
・10□とボット4側及びキャビティ6側とを遮閉し
、この状態で、第4図に示すように、プランジャー5の
加圧力によシ溶融樹脂材料31を移送経路7を通してキ
ャビティ6・・・6内に加圧注入し、更に、所要時間経
過後に、ストッパー9+・11.を元の位置に復動させ
ると共に型開きをしてエジェクター機構により半導体樹
脂モールド成形品及び移送経路7内等に成形されるコー
ルトスフグを両型1・2間に取出せばよいのである。Next, the stopper uniform Li4 hydraulic (pneumatic) device aff (9
g) Ti move, its stopper 9.・t l, the above-mentioned intake path 8 and air vent) 10's continuous opening 81
・10□ is closed off from the bot 4 side and the cavity 6 side, and in this state, as shown in FIG. ... 6 under pressure, and after the required time has elapsed, stoppers 9+ and 11. All that is required is to move the mold back to the original position, open the mold, and take out the semiconductor resin molded product and the cold puffer fish molded in the transfer path 7 and the like between the molds 1 and 2 using the ejector mechanism.
なお、上記したプランジャー5の下降は、溶融樹脂材料
3Iが力p部71に充填されたとき(第3図に示す状態
)に一時的にその下動を中止させて、移送経路7とキャ
ビティ6・・・6内の上記したパキーーム工程をよシ確
実に行なうようにしてもよい。 また、上記バキューム
工程は、プランジャー5が完全に下降されるまで(第4
図)継続して行なうことが好ましい。Note that the downward movement of the plunger 5 described above temporarily stops the downward movement when the molten resin material 3I is filled into the force p part 71 (the state shown in FIG. 3), and the transfer path 7 and the cavity are The above-described pachyme steps in steps 6...6 may be performed more reliably. Further, the vacuum step is continued until the plunger 5 is completely lowered (the fourth step).
Figure) It is preferable to continue.
上記した実施例においては、移送経路7とキャビティ6
・・・6内を真空状態に維持することができるので・溶
融樹脂材料中に残溜空気が混入するのを効率良く、且つ
、確実に防止し得て、キャビティ6・・・6内で成形さ
れる半導体樹脂モールド成形体の内部或は外表面に、上
記Gf4空気に起因するボイド或はピンホール若しくは
欠損部が形成されるのを確実に防止することができるも
のである。In the embodiment described above, the transfer path 7 and the cavity 6
... Since the inside of the cavity 6 can be maintained in a vacuum state, it is possible to efficiently and reliably prevent residual air from entering the molten resin material, and the molding inside the cavity 6 ... 6 can be carried out. It is possible to reliably prevent the formation of voids, pinholes, or defects caused by the above-mentioned Gf4 air on the inner or outer surface of the semiconductor resin molded body.
史に、上記した作用・効果に加えて、m融榛脂材料3□
の外部流出防止により、ゲート7、全通してキャビティ
6・・・6内に注入される該材料3゜の加圧注入条件の
均等化による樹脂モールド成形体の均−及び高品質化を
図ることができると共に、樹脂材料の使用量減少及び有
効利用率の向上を図ることができ、更には、樹脂材料3
(3,)Ic対するプランジャー5の加圧力を一定に維
持し得て、成形金型の耐久性向上を図ることができる等
の効果を奏するものである。In addition to the above-mentioned actions and effects, m-fusion resin material 3□
To achieve uniformity and high quality of the resin molded product by equalizing the pressurized injection conditions of 3° of the material injected into the cavities 6...6 through the gate 7 and through the gate 7 by preventing the material from flowing out to the outside. At the same time, it is possible to reduce the amount of resin material used and improve the effective utilization rate.
(3,) The pressing force of the plunger 5 against Ic can be maintained constant, and the durability of the molding die can be improved.
(発明の効果)
本発明方法によれば、加圧移送するml1Ata脂材料
中に金型内の残溜空気が混入しないので、半導体樹脂モ
ールド成形体の内部或は外表面にボイド或はピンホール
若しくは欠損部が形成されることがなく、従って、半導
体成形品の耐水(湿)性及び信頼性を著しく向上するこ
とができると共に、外観に優れた半導体成形品を成形す
ることができる大きな効果を奏するものである。 また
、キャビティ内への溶融樹脂材料の加圧注入条件の均等
化、及び、該材料の加圧カー走化による半導体成形品の
高品質化と樹脂材料の有効利用率の向上、及び、成形金
型の耐久性向上を因ることができるので、前述した従来
方法における問題点を確実に解消できる優れた効果を奏
するものである。(Effects of the Invention) According to the method of the present invention, residual air in the mold is not mixed into the ml1Ata fat material transferred under pressure, so that no voids or pinholes are formed inside or on the outer surface of the semiconductor resin molded product. Otherwise, no defects are formed, and therefore, the water resistance (humidity) and reliability of semiconductor molded products can be significantly improved, and semiconductor molded products with excellent appearance can be molded. It is something to play. In addition, it is possible to equalize the pressurized injection conditions of the molten resin material into the cavity, to improve the quality of semiconductor molded products and to improve the effective utilization rate of the resin material by applying pressure to the material, and to improve the effective utilization rate of the resin material. Since the durability of the mold can be improved, the above-mentioned problems of the conventional method can be reliably solved, which is an excellent effect.
図は本発明方法の実施例を示すものであり、第1図は半
導体素子のトランスファモールド金型の要部を示す一部
切欠縦断面図、第2図はそのキャビティ部の一部切欠平
面図、第3図及び第4図はいずれも不発明方法の作用説
明図である。
1・・・上型、 2−・・下型、 3・・・樹脂材料、
31 ・・・溶−樹脂材料、 4・・・ポット、 5
・・・プランジャー、 6・・・キャビティ、 7・・
・移送経路、 7I・・・カル部、 7□・・・ラ
ンナ部、7□−・・ゲート部、 74−・・経路終端部
、 8・・・吸気経路、 9・・・スト−ツバ−94構
、 10−・・エアベント、 11・・・ヌトノバ
ー機構。
特許出願人 長 1)道 男
【−]
代理人弁理士 岩 木 方 予 −2」・、−と
り
第1図
第2図
第3図
第4図The figures show an embodiment of the method of the present invention, in which Fig. 1 is a partially cutaway longitudinal cross-sectional view showing the main parts of a transfer mold mold for a semiconductor element, and Fig. 2 is a partially cutaway plan view of the cavity part thereof. , FIG. 3, and FIG. 4 are all explanatory diagrams of the operation of the uninvented method. 1... Upper mold, 2-... Lower mold, 3... Resin material,
31... Molten resin material, 4... Pot, 5
... Plunger, 6... Cavity, 7...
・Transfer route, 7I...Cull part, 7□...Runner part, 7□-...Gate part, 74-...Route end part, 8...Intake route, 9...Stock tube 94 structures, 10-... air vent, 11... Nutnover mechanism. Patent Applicant Long 1) Michio [-] Representative Patent Attorney Iwaki Kata -2''・, -Tori Figure 1 Figure 2 Figure 3 Figure 4
Claims (1)
たリードフレームをセットして該両型の型合せをするト
ランスファモールド金型の型締工程を行ない、次に、金
型ポット内への樹脂材料供給工程を行ない、次に、該ポ
ット内の樹脂材料を加熱・加圧して溶融化する樹脂材料
の溶融化工程を行ない、次に、ポット内の溶融樹脂材料
を金型のカル部・ランナ部・ゲート部から成る移送経路
を通して成形キャビティ内に加圧注入する溶融樹脂材料
の加圧移送工程を行なうと共に、この加圧移送工程と同
時に、上記移送経路におけるランナ部から該経路中の残
溜空気を外部に吸引排除する移送経路内のバキューム工
程及び上記キャビティに連通させたエアベントから該キ
ャビティ内の残溜空気を外部に吸引排除するキャビティ
内のバキューム工程を行ない、次に、上記移送経路の経
路終端部側を閉じて溶融樹脂材料の外部流出を防止する
移送経路の遮閉工程を行ない、更に、所要の樹脂モール
ド成形時間経過後に上記移送経路を開放すると共に両型
を型開きして半導体樹脂モールド成形品を外部へ取出す
型開工程を行なうことを特徴とする半導体素子のトラン
スファ樹脂モールド成形方法。A lead frame with a semiconductor element attached is set in the cavities of both molds arranged facing each other, and a mold clamping process of the transfer mold mold is performed to match the two molds. Next, resin is poured into the mold pot. A material supply process is performed, and then a resin material melting process is performed in which the resin material in the pot is melted by heating and pressure. A pressurized transfer process is carried out to inject the molten resin material under pressure into the molding cavity through a transfer path consisting of a runner section and a gate section. A vacuum process is performed in the transfer path to suck and remove air to the outside, and a vacuum process is performed in the cavity to suck and remove residual air in the cavity to the outside from an air vent communicated with the cavity, and then the transfer path is vacuumed. The transfer path is closed by closing the end of the path to prevent the molten resin material from flowing out. Furthermore, after the required resin molding time has elapsed, the transfer path is opened and both molds are opened to form the semiconductor. A transfer resin molding method for a semiconductor element, characterized by performing a mold opening process to take out a resin molded product to the outside.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20884384A JPS6185829A (en) | 1984-10-03 | 1984-10-03 | Transfer resin molding process of semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20884384A JPS6185829A (en) | 1984-10-03 | 1984-10-03 | Transfer resin molding process of semiconductor element |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6185829A true JPS6185829A (en) | 1986-05-01 |
JPH0418464B2 JPH0418464B2 (en) | 1992-03-27 |
Family
ID=16563019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20884384A Granted JPS6185829A (en) | 1984-10-03 | 1984-10-03 | Transfer resin molding process of semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6185829A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS637638A (en) * | 1986-06-27 | 1988-01-13 | Mitsubishi Electric Corp | Manufacture of resin sealed semiconductor |
FR2615037A1 (en) * | 1987-05-06 | 1988-11-10 | Radiotechnique Compelec | PROCESS AND MOLD FOR ENCAPSULATION OF A SEMICONDUCTOR DEVICE BY RESIN INJECTION |
JPWO2008093511A1 (en) * | 2007-01-30 | 2010-05-20 | コニカミノルタオプト株式会社 | Optical element molding apparatus and optical element molding method |
EP2474401A3 (en) * | 2011-01-11 | 2012-10-24 | Apic Yamada Corporation | Method of resin molding and resin molding apparatus |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5868940A (en) * | 1981-10-20 | 1983-04-25 | Oki Electric Ind Co Ltd | Transfer molding press for plastic molded type semiconductor |
JPS58155727A (en) * | 1982-03-10 | 1983-09-16 | Mitsubishi Electric Corp | Mold for resin sealing of semiconductor device |
JPS5911232A (en) * | 1982-07-12 | 1984-01-20 | Hitachi Ltd | Resin sealing method |
-
1984
- 1984-10-03 JP JP20884384A patent/JPS6185829A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5868940A (en) * | 1981-10-20 | 1983-04-25 | Oki Electric Ind Co Ltd | Transfer molding press for plastic molded type semiconductor |
JPS58155727A (en) * | 1982-03-10 | 1983-09-16 | Mitsubishi Electric Corp | Mold for resin sealing of semiconductor device |
JPS5911232A (en) * | 1982-07-12 | 1984-01-20 | Hitachi Ltd | Resin sealing method |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS637638A (en) * | 1986-06-27 | 1988-01-13 | Mitsubishi Electric Corp | Manufacture of resin sealed semiconductor |
FR2615037A1 (en) * | 1987-05-06 | 1988-11-10 | Radiotechnique Compelec | PROCESS AND MOLD FOR ENCAPSULATION OF A SEMICONDUCTOR DEVICE BY RESIN INJECTION |
JPWO2008093511A1 (en) * | 2007-01-30 | 2010-05-20 | コニカミノルタオプト株式会社 | Optical element molding apparatus and optical element molding method |
EP2474401A3 (en) * | 2011-01-11 | 2012-10-24 | Apic Yamada Corporation | Method of resin molding and resin molding apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPH0418464B2 (en) | 1992-03-27 |
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