[go: up one dir, main page]

JPS57108264A - Operating method for electrostatic adsorbing device - Google Patents

Operating method for electrostatic adsorbing device

Info

Publication number
JPS57108264A
JPS57108264A JP18345880A JP18345880A JPS57108264A JP S57108264 A JPS57108264 A JP S57108264A JP 18345880 A JP18345880 A JP 18345880A JP 18345880 A JP18345880 A JP 18345880A JP S57108264 A JPS57108264 A JP S57108264A
Authority
JP
Japan
Prior art keywords
wafer
adsorbed
insulator
electrodes
electrostatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18345880A
Other languages
Japanese (ja)
Other versions
JPS6311426B2 (en
Inventor
Naomichi Abe
Masanao Itoga
Moritaka Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18345880A priority Critical patent/JPS57108264A/en
Publication of JPS57108264A publication Critical patent/JPS57108264A/en
Publication of JPS6311426B2 publication Critical patent/JPS6311426B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manipulator (AREA)
  • Sheets, Magazines, And Separation Thereof (AREA)
  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)
  • ing And Chemical Polishing (AREA)

Abstract

PURPOSE:To permit detection of an adsorbing and holding state of an object by measuring the change in the electrostatic capacity formed by an object to be adsorbed and electrodes in an electrostatic adsorbing device. CONSTITUTION:A pair of electrodes 13, 14 disposed flatly are insulated with an insulator 2, and, for example, a semiconductor wafer 11 is placed on the insulator 2. When about 1,000-5,000 voltage is applied from a DC power source 15, the wafer 11 contacts firmly with the insulator 12 and is adsorbed and held by this. When AC current is flowed at this time from an AC power source 16, electric current flows in inducing capacity between the wafer 11 and the electrodes 13, 14. The value of the capacity when the wafer 11 is accurately positioned and adsorbed is beforehand measured, and the reading of an ammeter 17 is observed, whereby whether the wafer 11 is accurately positioned, adsorbed and held or not is detected.
JP18345880A 1980-12-24 1980-12-24 Operating method for electrostatic adsorbing device Granted JPS57108264A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18345880A JPS57108264A (en) 1980-12-24 1980-12-24 Operating method for electrostatic adsorbing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18345880A JPS57108264A (en) 1980-12-24 1980-12-24 Operating method for electrostatic adsorbing device

Publications (2)

Publication Number Publication Date
JPS57108264A true JPS57108264A (en) 1982-07-06
JPS6311426B2 JPS6311426B2 (en) 1988-03-14

Family

ID=16136125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18345880A Granted JPS57108264A (en) 1980-12-24 1980-12-24 Operating method for electrostatic adsorbing device

Country Status (1)

Country Link
JP (1) JPS57108264A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59129686A (en) * 1983-01-10 1984-07-26 増田 閃一 Electrostatic type minute body sucker
JPS59129779A (en) * 1983-01-13 1984-07-26 Tokuda Seisakusho Ltd Electrostatic chucking device of sputtering device
JPS59129778A (en) * 1983-01-13 1984-07-26 Tokuda Seisakusho Ltd Sputtering device
US4848536A (en) * 1987-03-31 1989-07-18 Fujitsu Limited Apparatus for transporting an electrically conductive wafer
JP2008015435A (en) * 2006-07-10 2008-01-24 Ricoh Co Ltd Image forming apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5233828U (en) * 1975-08-31 1977-03-10
JPS5279934A (en) * 1975-12-26 1977-07-05 Fuji Xerox Co Ltd Contactless paper detector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5233828U (en) * 1975-08-31 1977-03-10
JPS5279934A (en) * 1975-12-26 1977-07-05 Fuji Xerox Co Ltd Contactless paper detector

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59129686A (en) * 1983-01-10 1984-07-26 増田 閃一 Electrostatic type minute body sucker
JPS59129779A (en) * 1983-01-13 1984-07-26 Tokuda Seisakusho Ltd Electrostatic chucking device of sputtering device
JPS59129778A (en) * 1983-01-13 1984-07-26 Tokuda Seisakusho Ltd Sputtering device
US4848536A (en) * 1987-03-31 1989-07-18 Fujitsu Limited Apparatus for transporting an electrically conductive wafer
JP2008015435A (en) * 2006-07-10 2008-01-24 Ricoh Co Ltd Image forming apparatus

Also Published As

Publication number Publication date
JPS6311426B2 (en) 1988-03-14

Similar Documents

Publication Publication Date Title
JPS5979545A (en) Electrostatic chucking device
DE3266921D1 (en) Test device for indicating an electric voltage and the polarity thereof, and the passage of current through a conductor
EP0309956A3 (en) Method of testing semiconductor elements and apparatus for testing the same
EP0125116A3 (en) Method and instrument for measuring moisture
JPS57108264A (en) Operating method for electrostatic adsorbing device
AR213041A1 (en) TEST DEVICE FOR THE INDICATION OF AN ELECTRICAL VOLTAGE AND / OR ITS POLARITY AND FOR THE INDICATION OF THE PASSING OF CURRENT THROUGH AN ELECTRICAL CONDUCTOR
GB963214A (en) Improved apparatus for and method of determining the values of electrical parameters of a semi-conductor crystal
JPS5717870A (en) Coil turn short circuit detection method of electromagnetic induction device
DE69620263D1 (en) METHOD AND DEVICE FOR TESTING THE INSULATION DEGREE OF THE INSULATION OF AN ELECTRIC CONDUCTOR
JPS564066A (en) Water-tree detection method of rubber/plastic insulated power cable
JPS56162043A (en) Bipolar ion current probe device
JPS5724544A (en) Detection for insulation film defect of semiconductor element
JPS6469901A (en) Interval measuring apparatus
JPS57154069A (en) Measuring device for electric resistance
JPS5611367A (en) Detecting unit and method for degradation of apparatus using zinc oxide element
KR930702671A (en) How to measure the number of dissociable particles in solution
JPS56127773A (en) Etching device
JPS5579474A (en) Concentration detecting method of developer
JPS5768043A (en) Measuring method and device for characteristics of semiconductor wafer
JPH0560745U (en) Electrostatic adsorption device
GB888443A (en) Testing insulating materials
SU1177778A1 (en) Method of determining coordinates of flaws in electric insulation materials
JPS5384686A (en) Power source current measuring method of highly integrated ic
JPS57169665A (en) Detecting method for defective part of electrophotographic sensitive body
JPS56125674A (en) Measuring method of conductor resistance in gas insulating switch