JPS5648237A - Evacuated gaseous phase reactor - Google Patents
Evacuated gaseous phase reactorInfo
- Publication number
- JPS5648237A JPS5648237A JP12503579A JP12503579A JPS5648237A JP S5648237 A JPS5648237 A JP S5648237A JP 12503579 A JP12503579 A JP 12503579A JP 12503579 A JP12503579 A JP 12503579A JP S5648237 A JPS5648237 A JP S5648237A
- Authority
- JP
- Japan
- Prior art keywords
- reaction
- substrate
- susceptor
- uniform
- tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
PURPOSE: To secure a uniform distribution of concentration for the material component in a reaction tube and thus obtain a uniform thickness for the grown film, by increasing the flow speed at the area near the surface of the substrate for the material gas within the reaction tube of the evacuated GVD method.
CONSTITUTION: The epitaxial growth of the semiconductor crystal onto the surface of the semiconductor substrate, the growth of the polycrystalline silicon layer or the gaseous phase reaction method (CVD method) for formation of the SiO2 layer is carried out within the reaction tube 21. The reaction material gas is supplied through the introducing mouth 25 in case when the tube 21 is of vertical type and then exhausted and pressure-reduced through the discharge mouth 26 to be heated up with the resistor 22. Here the outer wall 27 is provided to give a limitation to the gas flow path as if it enclosed the susceptor 23, and thus the reaction gas flows the area enclosed by both the outer wall and the susceptor not to expand over the whole part of the bell-jar. As a result, the reaction progresses on the surface of the substrate to be treated and put on the susceptor 23 to ensure a uniform growing speed over the entire surface of the substrate. Thus a uniform thickness of film and uniform distribution of concentration can be obtained.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12503579A JPS5648237A (en) | 1979-09-28 | 1979-09-28 | Evacuated gaseous phase reactor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12503579A JPS5648237A (en) | 1979-09-28 | 1979-09-28 | Evacuated gaseous phase reactor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5648237A true JPS5648237A (en) | 1981-05-01 |
Family
ID=14900226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12503579A Pending JPS5648237A (en) | 1979-09-28 | 1979-09-28 | Evacuated gaseous phase reactor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5648237A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5956576A (en) * | 1982-08-27 | 1984-04-02 | Yokogawa Hewlett Packard Ltd | Formation of thin film |
US4590024A (en) * | 1984-03-29 | 1986-05-20 | Solavolt International | Silicon deposition process |
US4596208A (en) * | 1984-11-05 | 1986-06-24 | Spire Corporation | CVD reaction chamber |
US4627803A (en) * | 1983-08-31 | 1986-12-09 | Junichi Umetsu | Apparatus for producing polyacetylene film |
US5104690A (en) * | 1990-06-06 | 1992-04-14 | Spire Corporation | CVD thin film compounds |
-
1979
- 1979-09-28 JP JP12503579A patent/JPS5648237A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5956576A (en) * | 1982-08-27 | 1984-04-02 | Yokogawa Hewlett Packard Ltd | Formation of thin film |
US4627803A (en) * | 1983-08-31 | 1986-12-09 | Junichi Umetsu | Apparatus for producing polyacetylene film |
US4590024A (en) * | 1984-03-29 | 1986-05-20 | Solavolt International | Silicon deposition process |
US4596208A (en) * | 1984-11-05 | 1986-06-24 | Spire Corporation | CVD reaction chamber |
US5104690A (en) * | 1990-06-06 | 1992-04-14 | Spire Corporation | CVD thin film compounds |
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