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JPS5622942A - Diffraction grating and its manufacture - Google Patents

Diffraction grating and its manufacture

Info

Publication number
JPS5622942A
JPS5622942A JP9813279A JP9813279A JPS5622942A JP S5622942 A JPS5622942 A JP S5622942A JP 9813279 A JP9813279 A JP 9813279A JP 9813279 A JP9813279 A JP 9813279A JP S5622942 A JPS5622942 A JP S5622942A
Authority
JP
Japan
Prior art keywords
film
substrate
diffraction grating
rays
exposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9813279A
Other languages
Japanese (ja)
Inventor
Yasuhiro Horiike
Shigeru Annami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP9813279A priority Critical patent/JPS5622942A/en
Publication of JPS5622942A publication Critical patent/JPS5622942A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To manufacture a diffraction grating by which strong X-rays can be obtained by selectively removing an insulating film after forming the insulating film on a substrate that permits X-rays to pass through it and then by plating the exposed substrate surface with gold.
CONSTITUTION: After both the sides of Si single crystal substrate 1 of about 100μm are mirror-finished, SiO2 films 2 and 2' are produced by thermal oxidation, etc. Next, Ti is vapor-deposited on film 2 to form film 3, on which resist film 4 is further formed by using photoresist. Resist film 4 is exposed to electron beams, X- rays, etc., and developed to form resist film mask 4". Film 4" is used to pattern Ti film 3 by glow discharge of CF4 gas, forming mask 3". Next, film 2 is etched through reactive ion etching, etc., with CF3 ions to leave film 2". After films 4" and 3" are removed, substrate 1 is dipped in a solution of potassium gold cyanide as a cathode to plate the exposed surface of substrate 1 with gold 5. Thus, the diffraction grating is completed. Instead of striped patterning, coaxial-groove-shaped patterning realizes a diffraction grating of a Fresnel zone plate.
COPYRIGHT: (C)1981,JPO&Japio
JP9813279A 1979-08-02 1979-08-02 Diffraction grating and its manufacture Pending JPS5622942A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9813279A JPS5622942A (en) 1979-08-02 1979-08-02 Diffraction grating and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9813279A JPS5622942A (en) 1979-08-02 1979-08-02 Diffraction grating and its manufacture

Publications (1)

Publication Number Publication Date
JPS5622942A true JPS5622942A (en) 1981-03-04

Family

ID=14211718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9813279A Pending JPS5622942A (en) 1979-08-02 1979-08-02 Diffraction grating and its manufacture

Country Status (1)

Country Link
JP (1) JPS5622942A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58162847A (en) * 1982-03-23 1983-09-27 Nec Corp X-ray topography
US20110168908A1 (en) * 2010-01-08 2011-07-14 Canon Kabushiki Kaisha Microstructure manufacturing method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58162847A (en) * 1982-03-23 1983-09-27 Nec Corp X-ray topography
US20110168908A1 (en) * 2010-01-08 2011-07-14 Canon Kabushiki Kaisha Microstructure manufacturing method
US8895934B2 (en) * 2010-01-08 2014-11-25 Canon Kabushiki Kaisha Microstructure manufacturing method

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