JPS56112758A - Insulated gate type semiconductor device and manufacture thereof - Google Patents
Insulated gate type semiconductor device and manufacture thereofInfo
- Publication number
- JPS56112758A JPS56112758A JP1487680A JP1487680A JPS56112758A JP S56112758 A JPS56112758 A JP S56112758A JP 1487680 A JP1487680 A JP 1487680A JP 1487680 A JP1487680 A JP 1487680A JP S56112758 A JPS56112758 A JP S56112758A
- Authority
- JP
- Japan
- Prior art keywords
- aluminum
- substrate
- films
- oxide film
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract 5
- 229910052782 aluminium Inorganic materials 0.000 abstract 5
- 239000000758 substrate Substances 0.000 abstract 5
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 abstract 2
- 239000012535 impurity Substances 0.000 abstract 2
- 150000002500 ions Chemical class 0.000 abstract 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 abstract 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 229920002120 photoresistant polymer Polymers 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
PURPOSE:To form a source and a drain by self-alignment in the semiconductor device by forming an extremely thin aluminum oxide film on the side surfaces of an aluminum gate electrode on an insulating film of a semiconductor substrate and injecting conductivity determining impurity ions into the substrate with the electrode as a mask. CONSTITUTION:Aluminum films 13, 14 becoming aluminum gate electrodes are formed on a P type silicon substrate 8 having a field oxide film 11 and a gate oxide film 12. With the aluminum film and photoresist films 15, 16 as masks the oxide film 12 is etched, and a part of the surface of the substrate is exposed. At this time sulfuric acid of approx. 1% is added to the etchant, and aluminum oxide films 17, 18 having a thickness of 1,000Angstrom are formed on the side surfaces of the films 13, 14 respectively. N type impurity ions such as P, Sb or the like are injected on the surface of the exposed substrate, and N type source and drain regions 19, 20 are formed. Thus, an extremely thin aluminum gate electrode is formed by a low temperature treatment with preferable reproducibility in a self-aligned MISFET.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1487680A JPS56112758A (en) | 1980-02-12 | 1980-02-12 | Insulated gate type semiconductor device and manufacture thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1487680A JPS56112758A (en) | 1980-02-12 | 1980-02-12 | Insulated gate type semiconductor device and manufacture thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56112758A true JPS56112758A (en) | 1981-09-05 |
Family
ID=11873207
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1487680A Pending JPS56112758A (en) | 1980-02-12 | 1980-02-12 | Insulated gate type semiconductor device and manufacture thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56112758A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11168212A (en) * | 1997-12-02 | 1999-06-22 | Tadahiro Omi | Semiconductor device |
JP2007036116A (en) * | 2005-07-29 | 2007-02-08 | Renesas Technology Corp | Semiconductor device manufacturing method |
-
1980
- 1980-02-12 JP JP1487680A patent/JPS56112758A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11168212A (en) * | 1997-12-02 | 1999-06-22 | Tadahiro Omi | Semiconductor device |
JP2007036116A (en) * | 2005-07-29 | 2007-02-08 | Renesas Technology Corp | Semiconductor device manufacturing method |
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