JPS55117233A - Semiconductor device and manufacturing thereof - Google Patents
Semiconductor device and manufacturing thereofInfo
- Publication number
- JPS55117233A JPS55117233A JP2371179A JP2371179A JPS55117233A JP S55117233 A JPS55117233 A JP S55117233A JP 2371179 A JP2371179 A JP 2371179A JP 2371179 A JP2371179 A JP 2371179A JP S55117233 A JPS55117233 A JP S55117233A
- Authority
- JP
- Japan
- Prior art keywords
- impurity
- semiconductor device
- diffused
- diffused layer
- covalent bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
- H10D62/834—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge further characterised by the dopants
-
- H10P32/1404—
-
- H10P32/171—
Landscapes
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To eliminate strain or dislocation and obtain a semiconductor device of good electric properties, by using Ge and an impurity having covalent bonding smaller than the covalent bonding radius of Si to produce a diffused layer on an Si substrate. CONSTITUTION:A diffused layer 12 is produced in a surface part of an Si substrate 11. A protective film 14 is coated on a doped layer 13 on the diffused layer 12 to prevent an impurity from being diffused out. A semiconductor device 10 is thus manufactured. A mixture of Ge and an impurity such as P or B having a smaller convalent bonding radius than Si is used for the diffused layer 12 depending on an electroconductive type to be obtained. The ratio of the diffused quantity of the impurity to that of the Ge in the diffused layer 12 is prescribed at 1.30 or less. The atom bonding radius is made uniform by the impurity of smaller covalent bonding radius and the Ge of larger covalent bonding radius. This results in making the semiconductor device undefective.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2371179A JPS55117233A (en) | 1979-03-01 | 1979-03-01 | Semiconductor device and manufacturing thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2371179A JPS55117233A (en) | 1979-03-01 | 1979-03-01 | Semiconductor device and manufacturing thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55117233A true JPS55117233A (en) | 1980-09-09 |
Family
ID=12117921
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2371179A Pending JPS55117233A (en) | 1979-03-01 | 1979-03-01 | Semiconductor device and manufacturing thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55117233A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5095358A (en) * | 1990-04-18 | 1992-03-10 | National Semiconductor Corporation | Application of electronic properties of germanium to inhibit n-type or p-type diffusion in silicon |
| US5142641A (en) * | 1988-03-23 | 1992-08-25 | Fujitsu Limited | CMOS structure for eliminating latch-up of parasitic thyristor |
-
1979
- 1979-03-01 JP JP2371179A patent/JPS55117233A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5142641A (en) * | 1988-03-23 | 1992-08-25 | Fujitsu Limited | CMOS structure for eliminating latch-up of parasitic thyristor |
| US5095358A (en) * | 1990-04-18 | 1992-03-10 | National Semiconductor Corporation | Application of electronic properties of germanium to inhibit n-type or p-type diffusion in silicon |
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