JPS5480183A - Measurement reference tool for ultrasonic flaw detection - Google Patents
Measurement reference tool for ultrasonic flaw detectionInfo
- Publication number
- JPS5480183A JPS5480183A JP14797877A JP14797877A JPS5480183A JP S5480183 A JPS5480183 A JP S5480183A JP 14797877 A JP14797877 A JP 14797877A JP 14797877 A JP14797877 A JP 14797877A JP S5480183 A JPS5480183 A JP S5480183A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- holes
- face
- measurement
- incident point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
PURPOSE: To measure the incident point in the circumferential direction of pipe and the bending angle accurately, by providing internal bent grooves and through- holes in the face and back of a disc having the same curvature as the contact face of the probe with the shoe, and reflecting ultrasonic beam from the probe.
CONSTITUTION: In the face and back of a disc having roughly the same curvature as the pipe and made of the same material are provided internal bent grooves U1, U2 for measuring the incident point, and corresponding straight grooves C1, C2, and also provided are notch 10 and holes d3 to d5. And the notch surface of the notch part 10 composed into a reflecting plane R. Furthermore, measurement direction lines S1 to S5 are drawn from the measuring points i1 to i5 in the circumference of the face and back towards the internal bent grooves U1, U2 and holes d3 to d5 so as to prevent the inspector from making mistake in the flaw detection direction. In the measurement of incident point, the probe is moved in the cirvumferential direction in the vicinity of measuring point i1 when the beam path is short, or in the vicinity of i2 when it is long, and the position of the highest reflection is selected by U1 or U2. In the measurement of bending angles of 45°, 60°, and 90°, the probe is moved to i3 to i5 respectively, and the light is reflected by the plane R, then the position of the highest reflected waves from holes d3 to d5 is selected.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14797877A JPS5480183A (en) | 1977-12-09 | 1977-12-09 | Measurement reference tool for ultrasonic flaw detection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14797877A JPS5480183A (en) | 1977-12-09 | 1977-12-09 | Measurement reference tool for ultrasonic flaw detection |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5480183A true JPS5480183A (en) | 1979-06-26 |
Family
ID=15442392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14797877A Pending JPS5480183A (en) | 1977-12-09 | 1977-12-09 | Measurement reference tool for ultrasonic flaw detection |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5480183A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1990013024A1 (en) * | 1989-04-19 | 1990-11-01 | Companhia Siderurgica Paulista - Cosipa | Calibration standard for measuring surface cracks by ultrasound and method |
CN102980947A (en) * | 2011-08-23 | 2013-03-20 | 奥林巴斯Ndt公司 | A system and method suitable for calibrating a phased array system configured to inspect square bars |
-
1977
- 1977-12-09 JP JP14797877A patent/JPS5480183A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1990013024A1 (en) * | 1989-04-19 | 1990-11-01 | Companhia Siderurgica Paulista - Cosipa | Calibration standard for measuring surface cracks by ultrasound and method |
CN102980947A (en) * | 2011-08-23 | 2013-03-20 | 奥林巴斯Ndt公司 | A system and method suitable for calibrating a phased array system configured to inspect square bars |
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