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JPS5444587A - Flaw inspecting system of transparent objects - Google Patents

Flaw inspecting system of transparent objects

Info

Publication number
JPS5444587A
JPS5444587A JP11140477A JP11140477A JPS5444587A JP S5444587 A JPS5444587 A JP S5444587A JP 11140477 A JP11140477 A JP 11140477A JP 11140477 A JP11140477 A JP 11140477A JP S5444587 A JPS5444587 A JP S5444587A
Authority
JP
Japan
Prior art keywords
rays
flaw
transparent object
outside
transparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11140477A
Other languages
English (en)
Inventor
Shoji Motohashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP11140477A priority Critical patent/JPS5444587A/ja
Publication of JPS5444587A publication Critical patent/JPS5444587A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP11140477A 1977-09-14 1977-09-14 Flaw inspecting system of transparent objects Pending JPS5444587A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11140477A JPS5444587A (en) 1977-09-14 1977-09-14 Flaw inspecting system of transparent objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11140477A JPS5444587A (en) 1977-09-14 1977-09-14 Flaw inspecting system of transparent objects

Publications (1)

Publication Number Publication Date
JPS5444587A true JPS5444587A (en) 1979-04-09

Family

ID=14560285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11140477A Pending JPS5444587A (en) 1977-09-14 1977-09-14 Flaw inspecting system of transparent objects

Country Status (1)

Country Link
JP (1) JPS5444587A (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119446A (ja) * 1985-11-20 1987-05-30 Ratotsuku Syst Eng Kk 結晶欠陥検査方法及びその検査装置
US5196901A (en) * 1991-08-22 1993-03-23 Eos Technologies, Inc. Discriminating surface contamination monitor
US5517301A (en) * 1993-07-27 1996-05-14 Hughes Aircraft Company Apparatus for characterizing an optic
US5790247A (en) * 1995-10-06 1998-08-04 Photon Dynamics, Inc. Technique for determining defect positions in three dimensions in a transparent structure
EP2381246A1 (en) * 2010-04-26 2011-10-26 Becton Dickinson France Device, kit and method for inspection of an article
JP2014224807A (ja) * 2013-04-19 2014-12-04 キリンテクノシステム株式会社 容器の検査方法及び検査装置
JP2021113759A (ja) * 2020-01-20 2021-08-05 日本電産トーソク株式会社 瓶検査装置および瓶検査方法

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119446A (ja) * 1985-11-20 1987-05-30 Ratotsuku Syst Eng Kk 結晶欠陥検査方法及びその検査装置
US5196901A (en) * 1991-08-22 1993-03-23 Eos Technologies, Inc. Discriminating surface contamination monitor
US5517301A (en) * 1993-07-27 1996-05-14 Hughes Aircraft Company Apparatus for characterizing an optic
US5790247A (en) * 1995-10-06 1998-08-04 Photon Dynamics, Inc. Technique for determining defect positions in three dimensions in a transparent structure
EP2381246A1 (en) * 2010-04-26 2011-10-26 Becton Dickinson France Device, kit and method for inspection of an article
WO2011134914A1 (en) * 2010-04-26 2011-11-03 Becton Dickinson France Device, kit and method for inspection of an article
CN102933955A (zh) * 2010-04-26 2013-02-13 贝克顿迪金森法国公司 用于检查物品的装置、成套设备和方法
JP2013527441A (ja) * 2010-04-26 2013-06-27 ベクトン ディキンソン フランス 物品を検査するための装置、キットおよび方法
CN102933955B (zh) * 2010-04-26 2015-06-24 贝克顿迪金森法国公司 一种成套设备和用于检查导光物品的表面的方法
JP2014224807A (ja) * 2013-04-19 2014-12-04 キリンテクノシステム株式会社 容器の検査方法及び検査装置
JP2021113759A (ja) * 2020-01-20 2021-08-05 日本電産トーソク株式会社 瓶検査装置および瓶検査方法

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