JPS5444587A - Flaw inspecting system of transparent objects - Google Patents
Flaw inspecting system of transparent objectsInfo
- Publication number
- JPS5444587A JPS5444587A JP11140477A JP11140477A JPS5444587A JP S5444587 A JPS5444587 A JP S5444587A JP 11140477 A JP11140477 A JP 11140477A JP 11140477 A JP11140477 A JP 11140477A JP S5444587 A JPS5444587 A JP S5444587A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- flaw
- transparent object
- outside
- transparent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To make possible the solution of the point of problems of defective detection by radiating rays from the section of a transparent object, picking up the light leaking to the outside by causing irregular reflection with the flaw of the transparent object with a TV camera and electrically detecting the flaw. CONSTITUTION:A reflecting mirror 2 for generating parallel rays mounted with a light source 3 is installed to the end part of the transparent object 1 to be examined. The refractive index of the object 1 is larger than 1 and the light emitted form its inside makes total reflection at angled below critical angle and does not go to the outside. The rays from the light source 3 advances like a path 7 unless there are no bubbles 6 or the like. However, if there is an air bubble 6 in the object 1, it gives a disturbance to the rays passing the inside of the transparent object 1 and therefore irregularly reflected rays 10, 11 are produced in the portion of the air bubble 6. These exceed the critical angle and leak to the outside of the object 1. The reflected rays 10, 11 having leaked are picked up by a TV camera 12 and the driving signal of a detecting signal relay is detected with a slice circuit and monomulti circuit, thus the flaw of the transparent object which had hitherto been judged through visual inspection may be electrically detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11140477A JPS5444587A (en) | 1977-09-14 | 1977-09-14 | Flaw inspecting system of transparent objects |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11140477A JPS5444587A (en) | 1977-09-14 | 1977-09-14 | Flaw inspecting system of transparent objects |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5444587A true JPS5444587A (en) | 1979-04-09 |
Family
ID=14560285
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11140477A Pending JPS5444587A (en) | 1977-09-14 | 1977-09-14 | Flaw inspecting system of transparent objects |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5444587A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62119446A (en) * | 1985-11-20 | 1987-05-30 | Ratotsuku Syst Eng Kk | Method and apparatus for inspecting defect in crystal |
| US5196901A (en) * | 1991-08-22 | 1993-03-23 | Eos Technologies, Inc. | Discriminating surface contamination monitor |
| US5517301A (en) * | 1993-07-27 | 1996-05-14 | Hughes Aircraft Company | Apparatus for characterizing an optic |
| US5790247A (en) * | 1995-10-06 | 1998-08-04 | Photon Dynamics, Inc. | Technique for determining defect positions in three dimensions in a transparent structure |
| EP2381246A1 (en) * | 2010-04-26 | 2011-10-26 | Becton Dickinson France | Device, kit and method for inspection of an article |
| JP2014224807A (en) * | 2013-04-19 | 2014-12-04 | キリンテクノシステム株式会社 | Container inspection method and container inspection device |
| JP2021113759A (en) * | 2020-01-20 | 2021-08-05 | 日本電産トーソク株式会社 | Bottle inspection device and bottle inspection method |
-
1977
- 1977-09-14 JP JP11140477A patent/JPS5444587A/en active Pending
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62119446A (en) * | 1985-11-20 | 1987-05-30 | Ratotsuku Syst Eng Kk | Method and apparatus for inspecting defect in crystal |
| US5196901A (en) * | 1991-08-22 | 1993-03-23 | Eos Technologies, Inc. | Discriminating surface contamination monitor |
| US5517301A (en) * | 1993-07-27 | 1996-05-14 | Hughes Aircraft Company | Apparatus for characterizing an optic |
| US5790247A (en) * | 1995-10-06 | 1998-08-04 | Photon Dynamics, Inc. | Technique for determining defect positions in three dimensions in a transparent structure |
| EP2381246A1 (en) * | 2010-04-26 | 2011-10-26 | Becton Dickinson France | Device, kit and method for inspection of an article |
| WO2011134914A1 (en) * | 2010-04-26 | 2011-11-03 | Becton Dickinson France | Device, kit and method for inspection of an article |
| CN102933955A (en) * | 2010-04-26 | 2013-02-13 | 贝克顿迪金森法国公司 | Device, kit and method for inspection of an article |
| JP2013527441A (en) * | 2010-04-26 | 2013-06-27 | ベクトン ディキンソン フランス | Apparatus, kit and method for inspecting articles |
| CN102933955B (en) * | 2010-04-26 | 2015-06-24 | 贝克顿迪金森法国公司 | Device, kit and method for inspection of an article |
| JP2014224807A (en) * | 2013-04-19 | 2014-12-04 | キリンテクノシステム株式会社 | Container inspection method and container inspection device |
| JP2021113759A (en) * | 2020-01-20 | 2021-08-05 | 日本電産トーソク株式会社 | Bottle inspection device and bottle inspection method |
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