JPH08110531A - Active matrix panel - Google Patents

Abstract

(57) [Abstract] [Problem] To inspect all outputs of a driver without extracting a signal with a probe card. A driver circuit and a driver output check circuit are provided at both ends of a data line or a scan line, and an output from the driver circuit is output to a common output terminal via the driver output check circuit, thereby Perform an inspection.

Description

Detailed Description of the Invention

[0001]

TECHNICAL FIELD The present invention relates to an active matrix panel.

In particular, the present invention relates to an active matrix panel with a built-in driver equipped with means for inspecting a driver.

[0003]

2. Description of the Related Art As an example of a conventional active matrix panel with a built-in driver, a reflective type is called "SID (S.
Eye Day) 82 Digest P. 48-49 Yamazaki et al. ”, Or the transparent type“ SID ”
84 Digest P. 316 double-sided ".

FIG. 2 is an example of a circuit diagram of an active matrix panel with a built-in driver in which the M0SFET is opened. Three
A pixel area 1 is composed of data lines 36, 37, 38, scanning lines 39, 40, 41, and pixel transistors 48, 49, 50 provided at their intersections. Each pixel transistor is provided with a pixel electrode, and liquid crystal capacitances between the pixel electrode and the counter electrode 54 are 51, 52 and 53.
32 is an X driver for driving the data lines 36, 37, 38, and 33 is a Y driver for driving the scanning lines 39, 40, 41.

[0005]

However, the above-mentioned conventional technique has the following problems. That is, it is not possible to know whether all outputs of the built-in driver are normal unless the panel state is set.
In order to inspect in the board state, there is a method of extracting all the output signals of the driver 1 with a probe card.
Applying a needle to thousands of pads is extremely difficult.

Therefore, the present invention solves such a problem, and an object of the present invention is to realize an active matrix panel with a built-in driver, which is provided with a circuit capable of checking the output of the driver easily in a substrate state. .

[0007]

An active matrix panel with a built-in driver according to the present invention comprises a one-dimensional array of thin film switching elements, one electrode of each of the switching elements being connected to a scanning line or a data line, and another electrode. An active matrix panel with a built-in driver, wherein at least one electrode is connected to a common electrode.

[0008]

In the active matrix panel with a built-in driver using the above configuration of the present invention, when the driver is operated, signals of all outputs of the driver can be taken out from the common electrode. Therefore, the driver can be easily inspected in the substrate state without assembling the panel.

[0009]

BEST MODE FOR CARRYING OUT THE INVENTION

[Embodiment 1] FIG. 1 is a circuit diagram of an active matrix panel incorporating a driver and its output check circuit according to an embodiment of the present invention. This panel has pixel area 1
And an X driver 2 and its output check circuit 4, and a Y driver 3 and its output check circuit 5. The pixel area includes data lines 6, 7, and 8 and scanning lines 9,
10 and 11 and the pixel transistors 18, 19 and 20 arranged at their intersections. Each pixel transistor is provided with a pixel electrode, and capacitors 21, 22 and 25 via the liquid crystal are formed between the pixel transistor and the counter electrode 24. The X driver 2 has a function of sequentially selecting the data lines 6, 7, and 8 and writing image data. On the other hand, the X driver output check circuit 4 includes switching elements 12, 1
3, 14 and their control inputs 25 and outputs 26. When the X driver is operated in a state where an input signal for closing all the switching elements is put in 25, a signal for one line of image data can be taken out from the output 26. If this signal has a discontinuous point or an abnormal point in the voltage level, it can be known that the operation of the column corresponding to the timing is defective. Y driver 3 also scan lines 9, 10, 1
1 is selected in sequence, but since the output of the driver is binary of high and low, the Y driver check circuit is composed of the switching elements 15, 16 and 17 and their inputs / outputs 27 and 28 which are controlled by this signal. Make up. In this case, while the Y driver is operating, the check circuit also operates, but since the scanning lines do not short, the panel operation is not affected. When checking the Y side, it suffices to input an appropriate signal to the input 27 and confirm that the same signal is output from the output 28.

Next, an example of the configuration of the output check circuit will be given.
A specific inspection method will be described. FIG. 3 is a circuit diagram of the X driver output check circuit. 61 is a pixel array section, 6
2 is an X driver and 63 is a Y driver. The X driver is a shift register using a CM0S clocked inverter and a data line 72, 7 from the video signal VID in accordance with the timing of its outputs 64, 65, 6, 67.
Analog switch 6 to write data to 5,74,75
It consists of 8, 69, 70 and 71. The X driver output check circuit is an N channel transistor 76, 77,
78, 79 and three wirings TX1, TX2, CX. The shift register portion in the X driver may be inspected by confirming that the start pulse XSP appears in the end pulse XEP at a timing delayed by a predetermined number of stages. If the shift register is operating normally, the X driver output check circuit is used to inspect for bit defects. The method will be described with reference to FIG. Same figure XS
P and φX are the voltage waveforms of the start pulse and clock of the shift register, respectively. (A), (b), (c),
(D) is a voltage waveform of the outputs 64 to 67 of each stage of the shift register. When TX1 is set to high and TX2 is set to low level and a signal such as (e) is input to VID, the signal of the data line in the odd column appears in CX as (f).
Conversely, set TX ₁ to low and TX ₂ to high level, and
When a signal such as (g) is input to C, the signal of the data line in the even column appears in CX in the form of (h). This time,
If the voltage waveforms of (f) and (h) are regular, it means that there is no bit defect. If there are irregularities,
The defective address can be known from that timing.

FIG. 5 is a circuit diagram of the Y driver output check circuit. Reference numeral 81 is a pixel area portion, 82 is an X driver, and 83 is a Y driver. The Y driver output check circuit is an N channel type transistor 87, 88, 89.
And two wirings TY and CY. FIG. 6 is a voltage waveform of each part of FIG. YSP and φY correspond to the start pulse and clock of the Y driver, and (a), (b), and (c) correspond to the signals of the scanning lines 84, 85, and 86. The inspection of the shift register section can be confirmed by the end pulse YEP as in the X side. Since the signal level of the scanning line has only two values of high and low, the transistor 87,
88 and 89 are also turned on. For example, when a signal such as (d) is inserted in TY, a signal such as (e) appears in CY.
If this waveform is regular, it means that there are no bit defects.

[Second Embodiment] FIG. 7 is a circuit diagram of an X driver output check circuit showing a second embodiment of the present invention. 101 is a pixel area, 102 is an X driver, 10
Reference numeral 5 is an X driver output check circuit. The difference from the first embodiment is that a CMOS transistor is used, and if TXB is set high and TXL is set low, the output can be checked for a video signal in a wide voltage range.
When the output buffer of the X driver is composed of CMOS, it is better to use this embodiment.

[Embodiment 3] FIG. 8 is a circuit diagram of an active matrix panel with a built-in driver showing a fifth embodiment of the present invention. 111 is a pixel area, 112 is an X driver, 113 is a Y driver, 114 is an X driver one output check circuit, and 115 is a Y driver output check circuit. The feature of the present embodiment is that the output check circuit is composed of an array of diodes. Compared to transistors, it has the advantages of less wiring and less circuit area.

[Embodiment 4] FIG. 9 is a circuit diagram of an active matrix panel with a built-in driver showing a fourth embodiment of the present invention. The feature of this embodiment is that the drivers are arranged symmetrically and redundancy is provided so that one scanning line or data line can be driven by two drivers. That is, in this embodiment, even if there is a driver output defect, if the driver on the opposite side of the same address is normal, the defective part can be cut with a laser repair or the like to obtain a good product. In this embodiment, the correction can be made in this way, so that the yield is significantly improved. 121 is a pixel area, 1
22 and 123 are upper and lower X drivers, 126 and 127 are upper and lower X driver output check circuits, and 124 and 125.
Is the left and right Y drivers, and 126 and 127 are the left and right Y driver output check circuits. The top and bottom, left and right drivers and the check circuit are arranged symmetrically. Further, in this embodiment, since the check circuits are provided above and below and to the left and right of the pixel area, it is possible to check disconnection and shortout in the pixel area, and also to determine the address from the signal timing.

[0015]

As described above, in the active matrix panel with a built-in driver of the present invention, it is possible to efficiently inspect the state of the substrate before the panel is assembled, so that the working time can be shortened and the cost of the product can be reduced. Further, if there is redundancy, it can be corrected, and the yield is greatly improved. That is, it is possible to further reduce the cost. Especially with regard to driver bit defects, it is extremely unlikely that drivers on both sides will be defective at the same time, and most can be corrected.

The active matrix panel with a built-in driver of the present invention is not limited to the driver's check
It is possible to check for defective points in the pixel area. For example, if the data line and the scanning line are short-circuited, the address can be uniquely obtained from the output timing of the check circuit. Further, if the output check circuits are provided on both sides of the pixel area, it is possible to check whether or not the scanning line and the data line are disconnected.

[Brief description of drawings]

FIG. 1 is a circuit diagram of an active matrix panel with a built-in driver.

FIG. 2 is a conventional active matrix panel circuit diagram with a built-in driver.

FIG. 3 is a circuit diagram of an X driver output check circuit.

FIG. 4 is a diagram showing voltage waveforms at various portions in FIG.

FIG. 5 is a circuit diagram of a Y driver output check circuit.

FIG. 6 is a diagram showing voltage waveforms of respective portions in FIG.

FIG. 7 is a circuit diagram of an X driver output check circuit.

FIG. 8 is a circuit diagram of an active matrix panel with a built-in driver.

FIG. 9 is a circuit diagram of an active matrix panel with a built-in driver.

[Explanation of symbols]

4, 103, 114, 126, 127 ... X driver output check circuit 5,115, 128, 129 ... Y driver output check circuit

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[Procedure amendment]

[Submission date] October 11, 1995

[Procedure Amendment 1]

[Document name to be amended] Statement

[Name of item to be amended] Claims

[Correction method] Change

[Correction content]

[Claims]

[Procedure Amendment 2]

[Document name to be amended] Statement

[Name of item to be corrected] 0002

[Correction method] Change

[Correction content]

In particular, it relates to an active matrix panel equipped with a means for inspecting a driver.

[Procedure 3]

[Document name to be amended] Statement

[Correction target item name] 0006

[Correction method] Change

[Correction content]

Therefore, the present invention solves such a problem, and an object of the present invention is to realize an active matrix panel provided with a circuit capable of easily checking the output of a driver in a substrate state.

[Procedure amendment 4]

[Document name to be amended] Statement

[Correction target item name] 0007

[Correction method] Change

[Correction content]

[0007]

The active matrix panel of the present invention comprises a plurality of substrates arranged in a matrix on a substrate.
A number of pixel electrodes and supply data signals to the plurality of pixel electrodes
Scanning lines to the plurality of data lines and the plurality of pixel electrodes.
A plurality of gate lines for supplying a signal and the plurality of data lines
Alternatively, the data line or the gate is connected to both ends of the gate line.
Each driver circuit that supplies output to the
Driver output check circuit connected to the inverter circuit.
The driver output check circuit is the driver circuit.
Switching elements connected to these outputs
And a common input that supplies signals to the plurality of switching elements.
Input terminal and a drive connected to the plurality of switching elements.
It should be equipped with a common output terminal for checking the IVA output.
Characterize .

[Procedure Amendment 5]

[Document name to be amended] Statement

[Correction target item name] 0008

[Correction method] Change

[Correction content]

[0008]

In the active matrix panel using the above structure of the present invention, when the driver is operated, signals of all outputs of the driver can be taken out from the common electrode.
Therefore, the driver can be easily inspected in the substrate state without assembling the panel.

[Procedure correction 6]

[Document name to be amended] Statement

[Correction target item name] 0009

[Correction method] Change

[Correction content]

[Embodiment 4] FIG. 9 is a circuit diagram of an active matrix panel with a built-in driver showing a fourth embodiment of the present invention. The feature of this embodiment is that the drivers are arranged symmetrically and redundancy is provided so that one scanning line or data line can be driven by two drivers. That is, in the present embodiment, even if there is a driver output failure, if the driver on the opposite side of the same address is normal, the defective part can be cut by laser repair or the like to obtain a good product. In this embodiment, the correction can be made in this way, so that the yield is significantly improved. 121 is a pixel area, 1
22 and 123 are upper and lower X drivers, 126 and 127 are upper and lower X driver output check circuits, and 124 and 125.
Is the left and right Y drivers, and 126 and 127 are the left and right Y driver output check circuits. The top and bottom, left and right drivers and the check circuit are arranged symmetrically. Further, in this embodiment, since the check circuits are provided above and below and to the left and right of the pixel area, one of the two driver circuits is provided .
Driver output with the driver circuit output on the other side
By outputting to the output terminal of the force check circuit, it is possible to check for disconnection and shortout in the pixel area, and to determine the address from the signal timing.

[Procedure Amendment 7]

[Document name to be amended] Statement

[Name of item to be corrected] 0015

[Correction method] Change

[Correction content]

[0015]

As described above, in the active matrix panel of the present invention, it is possible to efficiently inspect the state of the substrate before the panel is assembled, so that the working time can be shortened and the cost of the product can be reduced. Further, if there is redundancy, it can be corrected, and the yield is greatly improved.
That is, it is possible to further reduce the cost. Especially with regard to driver bit defects, it is extremely unlikely that drivers on both sides will be defective at the same time, and most can be corrected.

[Procedure Amendment 8]

[Document name to be amended] Statement

[Correction target item name] 0016

[Correction method] Change

[Correction content]

Further, the active matrix panel of the present invention can check not only the driver's check but also the defective portion in the pixel area. For example, if the data line and the scanning line are short-circuited, the address can be uniquely obtained from the output timing of the check circuit. Further, if the output check circuits are provided on both sides of the pixel area, it is possible to check whether or not the scanning line and the data line are disconnected.

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Claims (3)

[Claims] 1. A scanning line group, a data line group, a Y driver integrated circuit for driving the scanning lines, and an X for driving the data lines, which are provided on a substrate made of a semiconductor or an insulator.
A driver integrated circuit, and an active matrix panel with a built-in driver, which is configured to drive a liquid crystal by means of a transistor array provided at the intersection of the scanning line and the data line, comprising a one-dimensional array of thin film switching elements,
An active matrix panel, wherein one electrode of the switching element is connected to the scanning line or the data line, and at least another electrode is connected to a common electrode. 2. An X driver output check circuit comprising: a) a switching element arranged at each output of the X driver, a wiring for controlling the switching element, and a wiring for taking out a signal from the switching element. b) A Y driver output check circuit including a switching element arranged at each output of the Y driver and controlled by the Y driver, a wiring for sending a signal to the switching element, and a wiring for taking out a signal from the switching element. Claim 1 characterized in that it is provided
The active matrix panel described in the item. 3. A) A diode array arranged at each output of the X or Y driver. b) Wiring for taking out the signal of the diode array. (4) The active matrix panel according to claim 1 or 2, wherein an insulating material is used for the substrate, and the switching element is a thin film transistor.