JPH0430576Y2 - - Google Patents
Info
- Publication number
- JPH0430576Y2 JPH0430576Y2 JP17965885U JP17965885U JPH0430576Y2 JP H0430576 Y2 JPH0430576 Y2 JP H0430576Y2 JP 17965885 U JP17965885 U JP 17965885U JP 17965885 U JP17965885 U JP 17965885U JP H0430576 Y2 JPH0430576 Y2 JP H0430576Y2
- Authority
- JP
- Japan
- Prior art keywords
- mirror
- sample
- rotating
- angle
- incident light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 24
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000007791 dehumidification Methods 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Landscapes
- Mechanical Optical Scanning Systems (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【考案の詳細な説明】
考案の目的
産業上の利用分野
本考案は、集光させた光をサンプル又は光学部
品等に入射角を変化させながら入射し測定を行な
う反射測定やATR測定で用いる光学系に関し、
特にサンプル又は光学部品等を移動することな
く、最小限の回転鏡を回転させるだけで簡単且つ
確実に入出射角を変化可能な入出射角可変式光学
系に関するものである。[Detailed description of the invention] Purpose of the invention Industrial application field This invention is an optical system used in reflection measurement and ATR measurement, in which focused light is incident on a sample or optical component while changing the angle of incidence. Regarding the system,
In particular, the present invention relates to a variable incident/exit angle optical system that can easily and reliably change the incident/exit angle by simply rotating a minimum number of rotating mirrors without moving the sample or optical components.
従来技術
入出射角可変型のATR測定従来使われている
光学系の代表例を第1,2図に示す。第1図にお
いて、M1〜M4は平面鏡、Sはサンプル、I〓は入
射光、I〓〓は出射光で、サンプルSへの入射角を
変えるためには、平面鏡M1,M3が回転され、平
面鏡M2,M4及びサンプルSが平行移動されて、
光路が実線から点線へと変更される。Conventional technology Figures 1 and 2 show typical examples of conventionally used optical systems for ATR measurement with variable input and output angles. In Fig. 1, M 1 to M 4 are plane mirrors, S is the sample, I〓 is the incident light, and I〓 is the output light. In order to change the angle of incidence on the sample S, the plane mirrors M 1 and M 3 are The plane mirrors M 2 , M 4 and the sample S are rotated, and the plane mirrors M 2 and M 4 and the sample S are translated,
The optical path is changed from a solid line to a dotted line.
第2図において、M1〜M3は平面鏡、Pは半円
柱のプリズム、I〓,I〓〓は入,出射光で、この光学
系では平面鏡M3の回転に合わせ、平面鏡M1,
M2をM1′,M2′更にはM1″,M2″へと移動するこ
とによつてプリズムPへの入射角が変えられる。
又この系ではプリズムPも回転されて光路を合わ
せるようになつており、反射回数は1回である。 In Fig. 2, M 1 to M 3 are plane mirrors, P is a semi-cylindrical prism, I〓, I〓〓 are input and output lights, and in this optical system, as the plane mirror M 3 rotates, the plane mirrors M 1 ,
By moving M 2 to M 1 ′, M 2 ′, and further to M 1 ″ and M 2 ″, the angle of incidence on the prism P can be changed.
In this system, the prism P is also rotated to match the optical path, and the number of reflections is one.
考案が解決しようとする問題点
上記のような従来の入出射角可変式光学系で
は、複数の光学部品やサンプルを同時に移動させ
たり回転するのに機械的リンク機構が通常使われ
ている。しかし、リンク機構を用いた光学系で
は、部品や組立が複雑になり、コスト高を招く
他、その取付けのためベース部に長窓が設けら
れ、ガスシールを行ないにくかつた。また、複雑
さ故に寸法を小さくできないため、光学系全体を
試料室内に収めるには試料室のスペースを大きく
取らなければならないという欠点もあつた。Problems to be Solved by the Invention In conventional optical systems with variable entrance and exit angles as described above, a mechanical linkage mechanism is usually used to simultaneously move and rotate multiple optical components and samples. However, in an optical system using a link mechanism, the parts and assembly become complicated, resulting in high costs.In addition, a long window is provided in the base portion for attachment, making it difficult to perform a gas seal. Furthermore, because the dimensions cannot be reduced due to the complexity, there is also the drawback that a large space must be taken up in the sample chamber in order to accommodate the entire optical system within the sample chamber.
従つて本考案の目的は、上記従来方式の欠点を
克服し、簡単且つコンパクトで、確実に動作し、
しかも試料室内のガスパージ、除湿を可能とする
入出射角可変式光学系を提供することにある。 Therefore, the purpose of the present invention is to overcome the drawbacks of the above-mentioned conventional methods, to be simple and compact, to operate reliably,
Moreover, it is an object of the present invention to provide an optical system with variable entrance and exit angles that enables gas purging and dehumidification in the sample chamber.
考案の構成
問題点を解決するための手段
上記目的を達成するため、本考案による入出射
角可変式光学系は、楕円鏡を固定して設け、該楕
円鏡の一方の焦点上に回転鏡を配置し、他方の焦
点上にサンプル又は光学部品等を配置し、上記回
転鏡の回転によつて入射光を楕円鏡面上で移動さ
せ、サンプル又は光学部品等に入る角度を変化せ
しめることを特徴とするものである。Means for Solving the Constituent Problems of the Invention In order to achieve the above object, the variable entrance/exit angle optical system of the present invention includes a fixed elliptical mirror and a rotating mirror on one focal point of the elliptical mirror. and placing a sample or an optical component on the other focal point, and by rotating the rotating mirror, the incident light is moved on the elliptical mirror surface to change the angle at which it enters the sample or the optical component. It is something to do.
実施例
以下まず本考案による入出射角可変式光学系の
基本構成を第3図を参照して説明する。Embodiment First, the basic configuration of the variable incidence/output angle optical system according to the present invention will be explained with reference to FIG.
図中1が楕円鏡で固定して配置され、2つの焦
点F1,F2を有する。2焦点のうち一方の焦点F2
上に、該焦点を通る鉛直線を軸として回転可能に
鏡2が配置され、他方の焦点F1上にサンプル又
はプリズム等の光学部品、図示例ではサンプルS
が配置される。入射光I〓は回転鏡2で反射され、
楕円鏡1を経てサンプルSに入る。 In the figure, an elliptical mirror 1 is fixedly arranged and has two focal points F 1 and F 2 . One of the two focal points F 2
A mirror 2 is disposed above the focal point so as to be rotatable about a vertical line passing through the focal point, and a sample or an optical component such as a prism, in the illustrated example, a sample S is placed above the other focal point F1 .
is placed. The incident light I〓 is reflected by the rotating mirror 2,
It enters the sample S through the elliptical mirror 1.
ここで回転鏡2を反時計回りに回転すると、入
射光は楕円鏡1の楕円面上に沿つて移動するが、
楕円の特性上楕円鏡で反射された光は必ず焦点
F1つまりサンプルS上に集光する。そして、入
射光が楕円面上に沿つて移動するにつれ、サンプ
ルSへの入射角が変化する。すなわち、1枚の回
転鏡2を回転させるだけで、入射角を任意に可変
できる。尚、鏡2の回転部分に目盛を付けておけ
ば、サンプルへの入射角が読取り可能である。 When the rotating mirror 2 is rotated counterclockwise, the incident light moves along the elliptical surface of the elliptical mirror 1.
Due to the characteristics of an ellipse, the light reflected by an elliptical mirror is always at the focal point.
The light is focused on F1 , that is, the sample S. Then, as the incident light moves along the elliptical surface, the angle of incidence on the sample S changes. That is, by simply rotating one rotary mirror 2, the angle of incidence can be arbitrarily varied. Note that if a scale is provided on the rotating portion of the mirror 2, the angle of incidence on the sample can be read.
次に、本考案を具体的に実施した例を第4図に
ついて説明する。 Next, a concrete example of implementing the present invention will be described with reference to FIG.
図中10は分光器等の光学ベース、11は試料
室の外壁で、この外壁で囲まれた空間内に本考案
の光学系が配置される。つまり、第1,2楕円鏡
12,13が固定して対面配置され、第1,2鏡
14,15が上記回転鏡2と同じく回転可能に配
置されている。第1回転鏡14が第1楕円鏡12
の一方の焦点F1上に位置する一方、第2回転鏡
15が第2楕円鏡13の一方の焦点F2′上に位置
する。 In the figure, 10 is an optical base such as a spectrometer, 11 is an outer wall of a sample chamber, and the optical system of the present invention is placed in a space surrounded by this outer wall. That is, the first and second elliptical mirrors 12 and 13 are fixedly arranged facing each other, and the first and second mirrors 14 and 15 are arranged rotatably like the rotating mirror 2 described above. The first rotating mirror 14 is the first elliptical mirror 12
The second rotating mirror 15 is located on one focal point F 1 of the second elliptical mirror 13 , while the second rotating mirror 15 is located on one focal point F 2 ' of the second elliptical mirror 13 .
一対の対面楕円鏡12,13の間にプリズムP
が配置され、プリズムPの入射面が第1楕円鏡1
2の他方の焦点F1上に、プリズムPの出射面が
第2楕円鏡13の他方の焦点F1′上にそれぞれ位
置する。第1,2回転鏡14,15は回転台1
6,17上に取り付けられ、それぞれ角度可変レ
バー18,19を介し駆動カム20,21によつ
て所望に連動回転される。 A prism P between a pair of facing elliptical mirrors 12 and 13
is arranged, and the entrance surface of the prism P is the first elliptical mirror 1.
The output surface of the prism P is located on the other focal point F 1 ' of the second elliptical mirror 13 , respectively. The first and second rotating mirrors 14 and 15 are the rotating table 1
6 and 17, and are rotated as desired by drive cams 20 and 21 via variable angle levers 18 and 19, respectively.
入射光I〓は第1回転鏡14と第1楕円鏡12を
経てプリズムPの入射面に入り、出射光I〓〓はプ
リズムPの出射面から第2楕円鏡13と第2回転
鏡15を経て取り出される。第1,2回転鏡1
4,15は回転台16,17を連動回転させるこ
とによつて、プリズムPへの入射角が可変である
と共に、出射光を一定の方向に取り出すことがで
きる。 The incident light I〓 enters the entrance surface of the prism P through the first rotating mirror 14 and the first elliptical mirror 12, and the outgoing light I〓 passes from the exit surface of the prism P to the second elliptical mirror 13 and the second rotating mirror 15. It is then taken out. 1st and 2nd rotating mirror 1
By rotating rotating tables 16 and 17 in conjunction with each other, the angle of incidence on the prism P can be varied, and the emitted light can be extracted in a fixed direction.
考案の効果
以上述べたように、本考案によれば、最小限の
回転をさせるだけで入射角を変えられ、複雑なレ
バー機構を必要としないため、構成が簡単で且つ
コンパクトな入出射角可変式光学系が得られる。
従つて、狭い試料室への組込みが可能になる他、
長窓を必要としないためガスシールが容易とな
り、試料室内のガスパージ、除湿もより容易に行
なえる。組立や調整が簡単になり、コストダウン
も可能なのは勿論である。Effects of the invention As described above, according to the present invention, the incident angle can be changed with a minimum amount of rotation, and a complicated lever mechanism is not required. A formula optical system is obtained.
Therefore, in addition to being able to be installed in a narrow sample chamber,
Since a long window is not required, gas sealing is easy, and gas purging and dehumidification inside the sample chamber can be performed more easily. Of course, assembly and adjustment become easier, and costs can be reduced.
第1,2図は従来の入出射角可変式光学系を示
す図、第3図は本考案の基本構成を示す図、第4
図は本考案を具体的に実施した入出射角可変式光
学系を示す図である。
1,12,13……楕円鏡、2,14,15…
…回転鏡、16〜21……回転手段、S……サン
プル、P……プリズム、11……試料室外壁。
Figures 1 and 2 are diagrams showing a conventional variable input/output angle optical system, Figure 3 is a diagram showing the basic configuration of the present invention, and Figure 4 is a diagram showing the basic configuration of the present invention.
The figure shows a variable input/output angle optical system that specifically implements the present invention. 1, 12, 13...Elliptical mirror, 2, 14, 15...
...Rotating mirror, 16-21... Rotating means, S... Sample, P... Prism, 11... Sample chamber outer wall.
Claims (1)
の焦点上にサンプルを配置し、上記回転鏡の回転
によつて入射光を楕円鏡面上で移動させ、固定位
置のサンプルに入る入射光の角度を変化せしめる
ことを特徴とした入射光可変光学測定装置。 A rotating mirror is placed on one focal point of the elliptical mirror, a sample is placed on the other focal point, and the incident light is moved on the elliptical mirror surface by the rotation of the rotating mirror, and the incident light enters the sample at a fixed position. An incident light variable optical measuring device characterized by changing the angle of the incident light.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17965885U JPH0430576Y2 (en) | 1985-11-21 | 1985-11-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17965885U JPH0430576Y2 (en) | 1985-11-21 | 1985-11-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6286546U JPS6286546U (en) | 1987-06-02 |
JPH0430576Y2 true JPH0430576Y2 (en) | 1992-07-23 |
Family
ID=31122907
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17965885U Expired JPH0430576Y2 (en) | 1985-11-21 | 1985-11-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0430576Y2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002174591A (en) * | 2000-12-07 | 2002-06-21 | Jasco Corp | Total reflection measuring device |
JP6029684B2 (en) * | 2011-12-31 | 2016-11-24 | ジェイ・エイ・ウーラム・カンパニー・インコーポレイテッドJ.A.Woollam Co.,Inc. | Terahertz ellipsometer system and method of use thereof |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS48146U (en) * | 1971-05-24 | 1973-01-05 | ||
JPS597922A (en) * | 1982-07-07 | 1984-01-17 | Hitachi Ltd | Light beam printer |
-
1985
- 1985-11-21 JP JP17965885U patent/JPH0430576Y2/ja not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS48146U (en) * | 1971-05-24 | 1973-01-05 | ||
JPS597922A (en) * | 1982-07-07 | 1984-01-17 | Hitachi Ltd | Light beam printer |
Also Published As
Publication number | Publication date |
---|---|
JPS6286546U (en) | 1987-06-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3491366A (en) | Variable angle attachment for infrared reflection spectroscopy | |
US5106196A (en) | Single adjustment specular reflection accessory for spectroscopy | |
JP2004294136A (en) | X-ray diffraction device | |
JP3468623B2 (en) | Optical system switching device for X-ray diffractometer | |
JPH0248054B2 (en) | ||
CN102359818A (en) | Infrared spectrum interferometer and infrared spectrometer employing interferometer | |
US3837726A (en) | Camera for making holograms | |
JPH0430576Y2 (en) | ||
US5262845A (en) | Optical accessory for variable angle reflection spectroscopy | |
JPS6258140A (en) | Optical analyzer | |
US4676652A (en) | Multiple pass optical system | |
US10444140B1 (en) | Theta-theta sample positioning stage with application to sample mapping using reflectometer, spectrophotometer or ellipsometer system | |
US4461017A (en) | Fluorescent X-ray device | |
JP4120050B2 (en) | Optical property detector | |
JPH0518686Y2 (en) | ||
US4490041A (en) | Device for applying radiation at adjustable angles | |
US7177025B2 (en) | Measuring specular reflectance of a sample | |
JP2002372456A (en) | Ir spectrophotometer | |
JP3098806B2 (en) | X-ray spectrometer and EXAFS measurement device | |
GB2091900A (en) | Device for applying radiation at adjustable angles, monochromators | |
JP2654990B2 (en) | Schlieren device | |
JPH03235910A (en) | Infrared microscope | |
US2256103A (en) | Optical projecting apparatus | |
JPH0612335B2 (en) | Optical system of spectrocolorimeter | |
JPS63215923A (en) | Auxiliary apparatus for spectrophotometer |