JPH0424831A - Test device - Google Patents

Abstract

PURPOSE:To attain an automatic test with omission of a series of input of operations by filing the input/output data of normal states according to a prescribed input/output pattern, taking successively the operation input data out of a normal data file to input them, and at the same time comparing the informed input/output data with the normal data to decide the propriety of the input/output data. CONSTITUTION:The input/output data of the normal state are stored in a normal data file 26 according to a prescribed input pattern. When an input request is given from the processing part of a test subject device, a data input part 23 takes successively the operation input data 35b out of the file 26 and inputs them to the input/output part of a processor. The processing part carries out the prescribed processing based on the input pattern and at the same time informs the input/output part of the output data on the processing result, etc. Then a check part 24 logs the input/output data 36 which are transferred be tween the processing part and the input/output part and compares the data 36 with the normal data 37 stored in the file 26 for decision of the propriety of the data 36. Thus various types of operation tests can be automatically carried out.

Description

[Detailed Description of the Invention] [Summary] The present invention relates to a testing device, and aims to perform automatic testing by omitting a series of operation inputs, and includes an input/output section, an input request output section, and an input/output section that outputs an input request. A testing device for a processing device, comprising a processing unit that processes a series of operation input data inputted through the input/output unit according to an input pattern, and notifies the input/output unit of corresponding output data,
A normal data file in which the input/output data in a normal state exchanged between the processing unit and the input/output unit is arranged and stored based on a predetermined input pattern, and the input request notified via the input/output unit. a data input section that sequentially extracts the operation input data from the normal data file and inputs it to the input/output section according to the operation input data; A check section is provided to compare with the corresponding normal data in the file, the input/output data in the normal state is filed in accordance with a predetermined input pattern, and the operation input data is sequentially retrieved and inputted from the normal data, and notification is sent. The input/output data thus obtained is compared with the normal data to determine pass/fail.

[Industrial application field]

The present invention relates to improvements in testing equipment.

In devices such as PO8 terminal devices that perform processing according to operations, functional tests are performed using various combinations of operations as test patterns.

However, due to the diversification of functions in recent years, the number of test patterns is increasing, and if tests are performed manually as in the past, an extremely large number of test man-hours are required.

In addition, whenever the specifications of existing equipment are changed,
Operational testing must be performed from the beginning, and it takes time to make changes.

For this reason, there is a need for a test device that reduces the number of operational test man-hours.

[Conventional technology]

For example, in a POS terminal device equipped with a scanner, in addition to the scanner, a numeric keypad for inputting product code, price, quantity, etc.
A plurality of function keys for instructing cancel, repeat, total, etc. are provided, and transaction processing is performed in accordance with the combination and input order of these keys.

When testing the functionality of this PO3 terminal device, test patterns are created with various combinations of the order of these operations, and according to this test pattern, a staff member enters data using a scanner or keyboard, and the data is displayed, for example. Processing results and expected values (total amount, printing results,
error messages, etc.) to determine pass/fail.

[Problem to be solved by the invention]

Conventional testing methods involve performing operations according to test patterns and visually comparing output processing results with expected values to determine pass/fail. However, when the number of test patterns increases, a large amount of testing man-hours is required. .

Additionally, when there is a change in the specifications of existing equipment, all tests must be performed from the beginning each time, which poses the problem of poor work efficiency.

SUMMARY OF THE INVENTION In view of the above problems, an object of the present invention is to provide a simple test device that automatically tests a device that performs processing in response to an operation.

[Means to solve the problem]

In Fig. 1, a diagram of the principle of the present invention, 26 is a normal data file, which contains normal state input/output data (input requests, operation manual data 35b) exchanged between the processing unit and the input/output unit of the test target processing equipment. , output data, etc.) arranged based on a predetermined input pattern. 23 is a data input section, which inputs operation input data from the normal data file 26 in response to an input request notified via the input/output section. 35b is sequentially extracted and input to the input/output section, and 24 is a check section that logs the input/output data 36 exchanged based on the input of the operation input data 35b and compares it with normal data 37.

[Effect]

When the input request is output from the processing unit of the device under test, the data input unit 23 sequentially extracts the operation input data 35b from the normal data file 26 and inputs it to the input/output unit of the processing device.

As a result, the input/output section inputs the operation input data 35b to the processing section, and the processing section performs predetermined processing according to the input pattern, and notifies the input/output section of output data such as processing results.

The check unit 24 logs the input/output data 36 exchanged between the processing unit and the input/output unit, compares it with the normal data 37 stored in the normal data file 26, and determines whether it is good or bad based on the match/mismatch. judge.

Note that the normal data file 26 may be created by logging the progress of tests based on actual operations, or may be created manually by arranging operation input data and expected output data.

As described above, since the operation input data 35b is retrieved and inputted from the normal data file 26 corresponding to the test pattern, there is no need for manual operation, and since the processing results are also compared with the normal data 37, visual judgment is necessary. Therefore, various operational tests can be performed automatically.

〔Example〕

Embodiments of the present invention will be described in detail with reference to the drawings.

In this embodiment, a PO3 terminal device is used as an example of a device to be tested, and a test device is shown which also has a function of logging normal data 37 using a personal computer equipped with an external storage device.

FIG. 2 is a configuration diagram of one embodiment, FIG. 3 is a flowchart of normal data log processing, and FIG. 4 is a flowchart of automatic test processing. In Figure 2, 1 is the PO3 to be tested.
The terminal device is composed of a main body section 1a and an input/output section 1b. Then, an input/output management control section 6 and a transfer section 10 are added with a function of exchanging data with the test device 20.
is provided.

The main unit 1a includes an application program 2 (corresponding to the processing unit) that performs transaction processing based on operation input data,
It is composed of a system control section 3 that controls the entire POS terminal device, and a DMA control section 4 that exchanges data with the input/output section 1b.

Among the above, the application program 2 outputs an input request when it is possible to accept input, receives the input operation input data and performs a predetermined process, and also outputs the processing result by, for example, inputting a total key press. Output.

The input/output unit 1b includes a keyboard 8 consisting of a numeric keypad, function keys, etc., a scanner 9, an input control unit 7 that controls input thereof, a display unit (not shown), and an input/output unit that manages and controls these input/output devices. A transfer unit 10 that exchanges data between the management control unit 6 and the test device 20
, a DMA that exchanges data with the main unit 1a.
Consists of III control section 5 etc.

Here, in the log mode, the input/output management control section 6 inputs operation input data 35a from the keyboard 8 etc. to the main body section 1b.
At the same time, the input/output data 36 (input requests, output data, operation input data 35a) exchanged with the application program 2 is transferred to the test device 20, and when in test mode, the input/output data 36 (input request, output data, operation input data 35a) exchanged with the application program 2 is The operation input data 35b is output to the main body section 1b, and the input/output data 36 is output to the test device 20.

20 is a test device, which includes an automatic test control section 21, an input section 25,
Normal data file 26. It is composed of an external storage device for storing a control data file 27, a test data file 28, etc., a display section 29, a printer 30, etc.

Further, in the automatic test control section 21, 22 is a log section, which logs the input/output data 36 output from the PO3 terminal device in the normal data file 26 when in the log mode, and notifies you when in the test mode. The input/output data 36 resulting from the test is logged to the test data file 28.

Reference numeral 23 denotes a data input unit, which sequentially extracts operation input data 35b from the normal data file 26 and outputs it to the PO3 terminal device 1 when an input request is output.

24 is a check unit that compares the corresponding data between the test data file 28 and the normal data file 26, and determines whether there is a match or not.
The quality is determined based on the discrepancy, and the determination result is output to the display unit 29 or printer 30.

26 is a normal data file, which contains input/output data of multiple test patterns in normal states (hereinafter referred to as normal data 37).
As shown in FIG. 1, input requests according to the test pattern, combinations of operation input data 35b, output data, etc. are arranged in the order of occurrence.

Reference numeral 27 denotes a control data file, which is created in correspondence with the test pattern, and is created by inputting control data for referring to the normal data 37 from the input unit 25.

28 is a test data file in which input/output data 36 output from the input/output management control section 6 is logged in the test mode.

The control data specifies the address of the normal data 37, the number of repetitions of each operation input data 35b, etc.
7 can be created.

The following processes are performed by the test device having the above configuration and the POS device to be tested.

(Normal data log) Figure 3 shows the log processing for creating normal data 37 for one test pattern.
3. After connecting the test device 20 to the device 1 and setting the log mode by operating the input unit 25, a test is performed by operation.

(1) First, the processing unit 2 outputs an input request.

(2) As a result, the input/output management control unit 6
The input request data is output to the testing device 20 via 0.

(3) When the operator inputs an operation according to the test pattern, the input/output management control section 6 transfers the operation input data 35a to the main body section 1a and the test device 20.

Thereby, the processing unit 2 receives the operation input data 35a, and outputs the next input request if the input is not completed, such as by pressing the total key.

(4) In the above process, the log section 22 of the test device 20
is the transferred input request data and operation input data 35a.
, if there is output data, the output data is arranged in the order of occurrence and stored in the normal data file 26 as normal data 37.

The above operations and logs are performed for multiple test patterns.

(5) The operator inputs control data from the input unit 25 and creates a control data file 27 corresponding to the test pattern.

Through the above steps, the normal data file 26 and the control data file 28 are created.

Note that the logging function of the normal data 27 is not particularly necessary for the test device, and it goes without saying that a separately created file may be loaded into an external storage device and used.

(Automatic test processing) See Figure 4 Operate the input unit 25 to set the test mode.

(1) When the input request is output, the input/output management control unit 6 sends the input request data to the testing device 20.

(2) Accordingly, the data input unit 23 extracts the operation input data 35b from the normal data file 26 based on the control data, and sends it to the PO3 terminal device 1 to be tested.

(3) The input/output management control section 6 transfers the received operation input data 35b to the main body section 1a and the test device 20, and if there is output data, transfers it to the test bag [20].

(4) The log unit 22 logs input/output data 36 such as input request data, operation data 35b, and output data to the test data file 2B.

When the input and all associated processing for one test pattern are completed, the process moves to the next test pattern.

(5) When the operation input and logging of all test patterns are completed, the check section 24 extracts the normal data 37 from the normal data file 26 based on the control data, compares it with the contents of the test data file 28, and if - If it is good or does not match, it is judged as defective and the test result is output to the display unit 29 or printer 30.

As described above (from the normal data 37, the operation input data 35
b can be input, and pass/fail is determined by comparing this normal data 37 with logged input/output data 36, making it possible to automate functional tests with various input patterns.

In addition, in the above example, the test device 20 is
Although we have shown an example in which the external storage device is configured in the device to be tested, it is of course possible to incorporate it into the device if the device is equipped with an external storage device.

〔Effect of the invention〕

As explained above, the present invention provides a test device that does not require any operational input for testing, and can perform tests in a short time even if there are a huge number of test patterns, and even if specifications change. Since it can be applied to conventional functional tests, it has great effects such as improving the efficiency of modification work.

[Brief explanation of drawings]

Fig. 1 is a principle diagram of the present invention, Fig. 2 is a configuration diagram of an embodiment,
FIG. 3 is a flowchart of normal data log processing, and FIG. 4 is a flowchart of automatic test processing. In the figure, 1 is the PO3 terminal device of the device under test, 1a is the main unit, 1b is the input/output unit, 2 is the application program, 3 is the system control unit, 4 and 5 are the DMA control units, and 6 is the input/output management control unit. , 7 is an input control unit, 8 is a keyboard, 9
1 is a scanner, 10 is a transfer unit, 20 is a test device, 21 is an automatic test control unit, 22 is a log unit, 23 is a data input unit, 2
4 is a check section, 25 is an input section, 26 is a normal data file, 27 is a control data file, 28 is a test data file, 29 is a display section, 30 is a printer, 35a is operation input data input from an input device, 35b 36 is the operation input data input from the test device, the input/output data,
37 is normal data. Figure Figure Figure Self (ujlJ Rifuro Satoko Lochat Map

Claims (1)

[Scope of Claims] An input/output unit that outputs an input request, processes a series of operation input data input via the input/output unit according to an input pattern, and sends corresponding output data to the input/output unit. A testing device for a processing device, comprising a processing unit that notifies the input/output unit, the input/output data in a normal state exchanged between the processing unit and the input/output unit being arranged and stored based on a predetermined input pattern. The operation input data (35b) is sent from the normal data file (26) in response to the input request notified via the input/output unit.
) is sequentially extracted and inputted to the input/output section (
23), and a checking unit (24) that logs the input/output data (36) exchanged based on the input of the operation input data (35b) and compares it with the corresponding normal data (37) of the normal data file (26). ), file the input/output data in the normal state according to a predetermined input pattern, and sequentially extract and input the operation input data (35b) from the normal data (37), and input the input/output data that has been notified. A test device characterized in that output data (36) and the normal data (37) are compared to determine quality.