JPH04178003A - Manufacture of dielectric filter and resonance frequency measurement and adjustment method for dielectric resonator used therefor - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for manufacturing a dielectric filter, and particularly relates to a method for measuring and adjusting the resonant frequency of a plurality of dielectric resonators constituting the filter. It is something.

C. Prior Art] In the microwave band, various dielectric filters are used as filters, duplexers, and the like. There are those in which dielectric resonators each formed with an inner conductor and an outer conductor are coupled by capacitance, and those in which multiple resonators are configured within an integrated dielectric block for capacitive and inductive coupling.

Those that capacitively couple individual resonators need to be connected to a capacitor board, etc., and those with a negative shape require coupling adjustment holes to adjust the coupling between the resonators.
No conductor film is formed in this hole. These problems are disadvantageous in manufacturing, such as an increase in the number of parts and an increase in the number of man-hours.

Therefore, a type of dielectric filter has been proposed in which rectangular parallelepiped dielectric resonators are brought into close contact with each other and bonded and bonded. This is because dielectrics 35a, 35a, 35a, 34c, etc.
An exposed portion 35b is formed, and these portions of each resonator are made to face each other and bonded together with solder or the like as shown in FIG. 3('b). Since the exposed dielectrics 35a and 35b face each other, the resonators are coupled by capacitive coupling and inductive coupling, and the amount of coupling can be adjusted by adjusting the position and area.

Since it becomes possible to reduce the coupling, it becomes possible to reduce the size of the resonator, and it also becomes easy to adjust the characteristics of each resonator to match the characteristics as a filter.

[Problem] The resonant frequency of each resonator is adjusted by measuring the resonant frequency and polishing the open end face of the dielectric resonator to adjust it to a predetermined frequency. For this purpose, the dimensions of the dielectric resonator are set to a relatively low resonance frequency, and the resonance frequency is raised to the desired frequency by polishing. A jig connected to a network analyzer is capacitively coupled to the open end face of the dielectric resonator, and the resonant frequency is measured.

After measurement, the jig is removed and the open end surface is polished to make adjustments to increase the resonance frequency.

In this way, the resonant frequency is adjusted while performing measurement and polishing alternately, which requires a very large number of man-hours.

The present invention aims to significantly reduce the number of steps required to adjust the resonance frequency by allowing measurement and polishing to be performed simultaneously.

[Means to solve the problem]

The present invention solves the above problems by measuring the resonant frequency not at the open end face but at the dielectric portion exposed on the side surface, with a measuring jig placed close to the dielectric part.

That is, a method for manufacturing a dielectric filter in which the resonant frequency of a plurality of rectangular parallelepiped dielectric resonators in which dielectric material is exposed from the outer conductor at a part of the outer periphery is adjusted, and the exposed dielectric materials are bonded and bonded so as to face each other. The method is characterized in that a conductor loop connected to a measuring device is placed close to the exposed dielectric of the dielectric resonator, and the resonant frequency is measured by this conductor loop.

In addition, a method for manufacturing a dielectric filter in which the resonant frequency of a plurality of rectangular parallelepiped dielectric resonators in which dielectric material is exposed from the outer conductor at a part of the outer periphery is adjusted, and the exposed dielectric materials are bonded and bonded so as to face each other. , a conductor loop connected to a measuring device is placed close to the exposed dielectric of the dielectric resonator, and while the resonant frequency is measured by this conductor loop,
The feature is that the resonant frequency is adjusted by polishing the open end surface of the dielectric resonator.

The present invention can be used not only as a method for manufacturing filters, but also as a method for measuring and adjusting the resonant frequency of a dielectric resonator.

[Effect]

It is thought that inductive coupling occurs due to the conductor loop placed close to the dielectric exposed on a part of the side surface of the dielectric resonator, that is, a part of the surface on which the outer conductor is formed, so that the resonance state can be measured. However, it is thought that capacitive coupling also occurs, and the detailed principle has not yet been elucidated.

〔Example〕

Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows an embodiment of the present invention (al is a front view, (
b) is a side view.

A dielectric substrate 1) is vertically erected on a substrate 10, and a copper conductor pattern 12 is formed on the surface of the dielectric substrate 1). In this example, the two conductor patterns 12 are formed in a U-shape. The inner conductor of the coaxial cable 13 connected to the network analyzer is connected to one end of each conductor pattern 12, and the other end of the conductor pattern 12 is connected to the outer conductor of the coaxial cable 13 and grounded.

A bottle or the like (not shown) is formed on the substrate 10, and the dielectric resonator 14 is fixed in contact with the dielectric substrate 1). At this time, each of the conductor patterns 12 is connected to the dielectric resonator 1.
It is arranged so as to face the exposed portion of the dielectric material on the side surface of No. 4.

In this state, the measuring device is operated to measure the resonant frequency of the dielectric resonator. The open end surface of the dielectric resonator is polished according to the measured resonance frequency. This polishing can be performed while the dielectric resonator 14 is mounted on the substrate IO and the resonant frequency is being measured. That is, since the measuring jig is not in contact with the upper open end surface and does not protrude from that surface, a polishing tool can be applied to the open end surface in this state.

The size of the dielectric substrate 1) and the conductor pattern 12 formed thereon may be determined depending on the size of the dielectric resonator to be measured. As for the shape of the conductor pattern 12, it is sufficient if it is a conductor loop with at least one turn, and if necessary, it may be formed into a spiral shape and both ends connected to the measurement circuit. In addition, measurement can also be performed without using a dielectric substrate, by simply forming a circular loop 22 with the core tR wire of the coaxial cable 23 and connecting the end to the outer conductor, as shown in Figure 2. It was confirmed that it can be done.

A dielectric filter is obtained by bonding and fixing the outer conductors of a plurality of dielectric resonators each having an adjusted resonance frequency using solder or the like. If necessary, it may be stored in a shield case.

By using the method for measuring the resonant frequency of a dielectric resonator used in the present invention, it is possible to measure the resonant frequencies of most commonly used dielectric TEM resonators. It has been confirmed that when a device having the structure shown in FIG. 1 is used, it is possible to measure frequencies up to about 1.5 GHz.

〔effect〕

According to the present invention, when manufacturing a dielectric filter, it is possible to measure the resonance frequency of each dielectric resonator and simultaneously adjust the resonance frequency by polishing the open end face.

Therefore, there is no need to replace jigs or the like or move the dielectric resonator, making it possible to significantly reduce the number of man-hours.

[Brief explanation of drawings]

Figure 1 (al is a front view of the embodiment of the present invention, Figure 1 (b)
is a side view thereof, and FIG. 2 is a front view of another embodiment of the present invention.
FIG. 3(a) is a perspective view of a dielectric resonator to which the present invention is applied, and FIG. 3 (bl shows a perspective view after assembly. 10...Substrate 1)... ... Dielectric substrate 12 ... Conductor pattern 13.23 ... Coaxial cable 14 ... Dielectric resonator 221. ...Copper wire (core material)

Claims (4)

[Claims] (1) Manufacture of a dielectric filter in which the resonant frequency of multiple rectangular parallelepiped dielectric resonators in which dielectric material is exposed from the outer conductor at a part of the outer periphery is adjusted, and the exposed dielectric materials are bonded and bonded so that they face each other. A method for manufacturing a dielectric filter, the method comprising: arranging a conductor loop connected to a measuring device in close proximity to the exposed dielectric of the dielectric resonator, and measuring the resonant frequency using the conductor loop. (2) Manufacture of a dielectric filter in which the resonant frequency of multiple rectangular parallelepiped dielectric resonators in which the dielectric material is exposed from the outer conductor at a part of the outer periphery is adjusted, and the exposed dielectric materials are bonded and combined so that they face each other. In the method, a conductor loop connected to a measuring device is placed in close proximity to the exposed dielectric of the dielectric resonator, and a resonant frequency is measured by the conductor loop, while
A method for manufacturing a dielectric filter, which comprises polishing an open end surface of a dielectric resonator to adjust a resonant frequency. (3) In a method for measuring the resonant frequency of a rectangular parallelepiped dielectric resonator in which the dielectric is exposed from the outer conductor at a part of the outer periphery, the conductor is connected to the measuring instrument in close proximity to the exposed dielectric of the dielectric resonator. A method for measuring the resonant frequency of a dielectric resonator, comprising arranging a loop and measuring the resonant frequency using the conductor loop. (4) In a method for adjusting the resonant frequency of a dielectric resonator, which measures the resonant frequency of a rectangular parallelepiped dielectric resonator in which the dielectric is exposed from the outer conductor at a part of the outer periphery, and adjusts the resonant frequency by polishing the open end surface. , a conductor loop connected to a measuring device is placed close to the exposed dielectric of the dielectric resonator, and while the resonant frequency is measured by this conductor loop, the open end surface of the dielectric resonator is polished to determine the resonant frequency. A method for adjusting the resonant frequency of a dielectric resonator, the method comprising adjusting the resonant frequency of a dielectric resonator.